CN209878949U - SMT semi-finished product test board - Google Patents
SMT semi-finished product test board Download PDFInfo
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- CN209878949U CN209878949U CN201920580091.9U CN201920580091U CN209878949U CN 209878949 U CN209878949 U CN 209878949U CN 201920580091 U CN201920580091 U CN 201920580091U CN 209878949 U CN209878949 U CN 209878949U
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Abstract
The utility model relates to an SMT semi-finished product test bench, which comprises a test bench frame, wherein a test needle bed is arranged on the test bench frame; the test needle bed comprises a needle plate and a test circuit board connected with the needle plate; the test bench is provided with a control panel, an output interface and a pressing mechanism; the pressing mechanism is used for tightly fixing the measured plate on the needle bed; the control panel and the output interface are connected to the test circuit board. The SMT semi-finished product test board adopts a universal test rack and replaceable test needle beds, so that the development risk is reduced to the maximum extent, and the development cost and the development period are reduced; the test needle bed is convenient to replace, has a forced air cooling function and can cool the board card to be tested; the method is suitable for testing the semi-finished products of the multi-series PC104CPU modules, and has universality.
Description
Technical Field
The utility model belongs to the technical field of the SMT production line detects, particularly, for a SMT semi-manufactured goods testboard.
Background
With the rapid development of the electronic industry, the production efficiency, quality control and cost of electronic manufacturing enterprises determine the competitiveness of the enterprises; with the development of IC packaging towards high integration, high performance, multiple leads and narrow pitch, it has promoted the wide application of SMT (surface mount technology) technology in high-end electronic products, and the SMT technology enters a fast and good development phase under the drive of high-end products such as communications.
In the detection stage of the SMT production line, the existing probe test has high manufacturing cost, huge equipment and no operability on the general production line, is suitable for research and development and scientific research, can only test the relative on-off and resistance value data of the static board card by the flying probe test, and has no guidance on production. In view of this, the present invention is especially provided.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a solve not enough among the above-mentioned prior art, provide a new SMT semi-manufactured goods testboard, do benefit to and improve SMT semi-manufactured goods production efficiency of software testing.
In order to solve the technical problem, the utility model adopts the following basic concept:
a SMT semi-finished product test bench comprises a test bench frame, wherein a test needle bed is arranged on the test bench frame; the test needle bed comprises a needle plate and a test circuit board connected with the needle plate; the test bench is provided with a control panel, an output interface and a pressing mechanism; the pressing mechanism is used for fixing the measured plate on the needle bed; the control panel and the output interface are connected to the test circuit board.
Furthermore, in the SMT semi-finished product test bench, the test bench includes a pedestal, the pedestal is a stable support body with an accommodating cavity inside, an operation panel is obliquely arranged on the front portion of the pedestal, and an output interface is arranged on the side face of the pedestal.
Furthermore, in the SMT semi-finished product test bench, an alarm, a nixie tube, an indicator light, a reset button and a start-up button are arranged on the operation panel; the output interface includes a VGA interface and a PS2 interface.
Furthermore, in the SMT semi-finished product test bench, the test bench further comprises a supporting plate, the supporting plate is arranged at the top of the pedestal, the supporting plate is a hollow frame, and the hollow part vertically corresponds to the needle bed.
Furthermore, in the SMT semi-finished product test bench, the pressing mechanism comprises a rack, and the rack is arranged on the pedestal and positioned on one side of the supporting plate; the top of the rack is provided with a pressing handle which is mechanically connected with the top end of the pressing rod and can drive the pressing rod to vertically move by pressing down or lifting up the pressing handle; the bottom of the pressure lever is connected with a horizontal pressure plate, and the pressure plate vertically corresponds to the supporting plate.
Furthermore, in the SMT semi-finished product test bench, a plurality of press bars are arranged at the bottom of the press plate.
Furthermore, in the SMT semi-manufactured goods testboard, the test circuit board includes a carrier plate, and the carrier plate is provided with a processor, and a DEBUG display unit, a bus extension network unit and a power protection circuit unit that are electrically connected with the processor.
Furthermore, in the SMT semi-manufactured goods testboard, the power protection circuit unit includes a power input interface resistance detection circuit and a power-on overcurrent protection circuit.
Further, in the SMT semi-finished product test board, the DEBUG display unit is a PC104 bus extension DEBUG display circuit, which includes a bidirectional transceiver connected through an ISA bus network, and is configured to acquire a detection signal of a board to be tested and input the detection signal to the processor after level conversion.
Further, in the SMT semi-finished product testing station, the bus extension network unit includes a PC104 bus extension network chip, and is used for testing a PC104 bus of the board under test.
After the technical scheme is adopted, compared with the prior art, the utility model following beneficial effect has:
the SMT finished product test board adopts a universal test rack and replaceable test needle beds, so that the development risk is reduced to the maximum extent, and the development cost and the development period are reduced; the test needle bed is convenient to replace, has a forced air cooling function and can cool the board card to be tested; the method is suitable for testing the semi-finished products of the multi-series PC104CPU modules, and has universality.
Drawings
FIG. 1 is a schematic structural diagram of an SMT semi-finished product test bench of the present invention;
FIG. 2 is a schematic view of the needle bed and the pressing mechanism of the present invention;
FIG. 3 is a schematic view of the structure of the pallet shown in FIG. 1;
FIG. 4 is a logic block diagram of the SMT semi-finished product testing table of the present invention during the testing process;
FIG. 5 is a schematic diagram of a power input interface resistance detection circuit on the test circuit board of FIG. 1;
FIG. 6 is a schematic diagram of a power-on over-current protection circuit on the test circuit board of FIG. 1
In the figure:
1-a test bench; 2-needle bed; 3-a pedestal; 4-a supporting plate; 5-a frame; 6-a pressing handle; 7-an operating panel; 8-an output interface; 9-a handle; 10-upper cover; 11-a pressure bar; 12-a platen; 13-pressing a rod; 14-a needle plate; 15-testing the circuit board; 16-a probe; 17-board under test
Detailed Description
The invention will be further described with reference to the accompanying drawings and specific embodiments to assist understanding of the invention.
The utility model provides a semi-manufactured goods testboard of SMT, includes test bench 1, and the device has test needle bed 2 on the testboard frame, the utility model provides an in the embodiment, it is preferred, the test needle bed is removable setting to in the adaptation different boards card that is surveyed, then furthest's reduction electronic product's development risk reduces development cost and development cycle.
Specifically, as shown in fig. 1, SMT semi-manufactured goods test bench 1 includes pedestal 3, sets up layer board 4, frame 5 and compresses tightly handle 6 on the pedestal 3, the utility model provides a specific embodiment, testboard frame material is black electric board, and pedestal peripheral dimension is 320MM 380MM 420MM, and the layer board size is 150MM 200 MM.
Pedestal 3 is the steady support body that has the holding cavity inside, subtracts heavy and does benefit to the circuit and walks the line. The front part of the pedestal 3 is obliquely provided with an operation panel 7 which forms an oblique angle of 30 degrees with the horizontal direction so as to control the operation; an alarm, a nixie tube, an indicator light, a reset button, a starting button and the like are arranged on the operation panel 7, and corresponding testing and monitoring operations are carried out; the side surface of the pedestal 3 is provided with an output interface 8, such as a VGA/PS2 interface and the like, so that tests can be conducted on a CRT display interface, a keyboard and mouse interface and the like of a board to be tested; a switching power supply (not marked in the figure) with the output of +12V and +5V is arranged in the pedestal 3, and the mains supply of 220V is used for supplying power; the test circuit board is connected with the control panel, the VGA interface, the PS2 interface, the USB interface and other output interfaces and the switching power supply through connecting cables. The side of the pedestal 3 is provided with a handle 9 which is beneficial to moving.
The testing needle bed is fixed on the upper part of the testing pedestal 3 through screws, as shown in fig. 2, wherein the testing needle bed 2 comprises a testing needle plate 14 and a testing circuit board 15 positioned below the testing needle plate 14, and the testing needle plate 14 is connected with the testing circuit board 15 in a manner of directly welding a probe 16; the test circuit board 15 is provided with a connection socket (not shown) for electrically connecting with electronic devices (such as an operation panel, an output interface, a power supply and the like) on the test bench 1, all circuit control of the test bench is realized through the test circuit board 15, and an axial flow fan (not shown) is installed in the central area of the needle plate 14 so as to radiate heat to the board 17 to be tested during long-time testing.
Preferably, the top of the pedestal 3 is provided with an upper cover 10, the upper cover 10 is a hollow cover body, and the hollow part corresponds to the needle bed 2, so that the test of the tested plate 17 is facilitated; the needle bed can be replaced by opening the upper cover 10.
As shown in fig. 2 and 3, the top of the pedestal 3 is provided with the support plate 4, the support plate 4 is a support for placing a measured plate and is a hollow frame, and the hollow part vertically corresponds to the needle bed; the rack 5 is arranged on one side of the supporting plate 4; the top of the frame 5 is provided with the pressing handle 6, the pressing handle 6 is mechanically connected with the top end of the pressing rod 11, and the pressing rod 11 can be driven to vertically move by pressing down or lifting up the pressing handle 6. The bottom of the pressure lever 11 is connected with a horizontal pressure plate 12, the pressure plate 12 vertically corresponds to the supporting plate 4, and a plurality of pressure rods 13 are arranged at the bottom of the pressure plate 12; when the device works, a tested plate is arranged on the supporting plate 4, the pressing handle 6 is pressed downwards to drive the pressing rod 11 to descend, the pressing rod 13 of the pressing plate 12 abuts against the tested plate 17 to enable the testing point of the tested plate 17 to be in contact with the probe 16 of the needle bed 2, the circuit is communicated, the tested plate 17 is powered and signals are led out, and the testing circuit is controlled by the operation panel 7 to test the tested plate 17.
The utility model discloses this finished product testboard of SMT is particularly useful for PC104CPU semi-manufactured goods module tests such as CM4060, LX3060, possesses general preliminary screening function, has again and can realize carrying out the basis function to confirming model PC104CPU module and test through changing the needle bed.
In one embodiment of the present invention, as shown in fig. 4-6, the test circuit board includes a carrier board, and the carrier board is provided with a processor, a DEBUG display unit, a bus extension network unit and a power protection circuit unit. The DEBUG display unit is a PC104 bus expansion DEBUG display circuit and comprises a bidirectional transceiver connected through an ISA bus network (comprising ISA _ SD [7:0], SA _ SA [9:0], ISA _ RSTDRV and ISA _ LOW #); acquiring a detection signal of a detected plate, performing level conversion through a bidirectional transceiver, and inputting the detection signal into the processor for processing so as to read 80 port information when the detected plate is subjected to power-on self-test; the information read by the processor is displayed through a DEBUG display nixie tube connected with the SPI bus and positioned on the operation panel. As preferred embodiment, the utility model discloses in chip SN74LVC4245 is kept apart in the adoption of two-way transceiver, and the commonality is good, is convenient for realize the suitable for to multiple board under test.
The bus extension network unit comprises a PC104 bus extension network chip used for testing the PC104 bus of the tested board; in this embodiment, an ethernet controller I82551 chip is preferably adopted, and is connected to the board under test through the PCI + bus, so as to expand a network, and directly perform a self-test on the inside of the network on the board under test, thereby achieving the purpose of testing the PC104 bus.
The power-on button, the reset button and the like on the operation panel control and transmit corresponding signals to the processor, so that the power-on work and the reset of the tested board are realized, and the indicator light on the operation panel displays the power-on or reset. In the detection process of the detected plate, related sound prompt is carried out through an alarm (namely a buzzer) on the panel.
During testing, the test probe is communicated with the tested board to output corresponding VGA and PS/2 signals through the output interface of the pedestal, so that whether the VGA and PS/2 signals of the tested board are normally output or not can be conveniently detected.
The power supply protection circuit unit comprises a power supply input interface resistance detection circuit and a starting-up overcurrent protection circuit; wherein
The power input interface resistance detection circuit is used for detecting the +5VSB power supply of the detected plate; specifically, the detection circuit comprises a first operational amplifier U8A and a second operational amplifier U8B, wherein a diode D1 and a protective resistor R17 which are connected in series are arranged between a +5V power supply of the detection circuit and a +5VSB power supply of a detected board, then the diode D1 and the protective resistor R17 are connected to the non-inverting input end of the first operational amplifier U8A, and the non-inverting input end is connected with a filter capacitor C32 in series and is grounded; the reverse input end of the first operational amplifier U8A is connected with the output end, and a resistor R74 is arranged between the two ends and grounded; the positive and negative power terminals of the first operational amplifier U8A are respectively connected with +5V voltage and ground; the output end of the first operational amplifier U8A is connected with the non-inverting input end of the second operational amplifier U8B, and the inverting input end of the second operational amplifier U8B is connected with a +5V power supply and the ground through a voltage division resistor R18 and a voltage division resistor R19 respectively; the output end of the second operational amplifier U8B is connected to the gate of the second MOS transistor Q2, the source of the second MOS transistor is grounded, the drain is connected to the +3.3V power supply through the resistor R20 (the +3.3V power supply for the peripheral power supply is provided by the power supply chip IC _ LM 1117-3.3), and outputs a signal CPLD _ PWR _ VSB to the processor. The first operational amplifier U8A and the second operational amplifier U8B are preferably LM324 type, but are not limited thereto. After the tested plate is communicated with (namely is contacted with the needle bed probe) the needle bed test circuit board, whether the input resistance of the power input interface of the tested plate is normal or not can be automatically judged, and the buzzer can prompt when the input resistance is abnormal.
The start-up over-current protection circuit comprises a first MOS tube Q1 serving as an electronic switch; the source electrode of the first MOS tube is connected with +5V power supply, and the grid electrode of the first MOS tube is connected with a third MOS tube Q10 to receive a power supply starting signal PS _ ON; the drain electrode of the first MOS tube Q1 is connected with a power supply +5VSB of the board to be detected through a self-on-off fuse F1, and is connected with a voltage monitoring chip through voltage dividing resistors R23 and R22, and the voltage monitoring chip outputs a monitoring signal CPLD _ VCC5VSB to the processor. When the device works, the first MOS tube Q1 controls the +5VSB power supply of a tested board through the self-on-off fuse F1, the +5VSB voltage is detected, and the first MOS tube Q1 is cut off through the CPLD when the voltage monitoring chip detects that the voltage is abnormal, so that the purpose of overcurrent protection is achieved. Preferably, the first MOS transistor electronic switch in this embodiment preferably adopts an IRF7416PMOS transistor, and is sensitive to reaction; the voltage monitoring chip adopts a chip MAX 16052. Based on the circuit, in the test process, whether the input current of the power supply of the tested board is normal or not can be automatically judged after the power supply is started, the buzzer can prompt when the input current is abnormal, and meanwhile, the power supply protection circuit cuts off the power supply.
The utility model provides a test circuit can be used for judging whether normal product state is come to PC104CPU module semi-manufactured goods feeder ear static resistance monitoring, judges whether normal product power-on operating condition through the monitoring to PC104CPU module semi-manufactured goods power-on electric current; monitoring whether the working state of the board card is normal or not through a DEBUG display function and a RESET function in the starting process of the semi-finished product of the PC104CPU module; whether the basic state of the PC104 bus is normal is judged by monitoring and displaying the port of the PC104 bus 80 of the semi-finished product of the PC104CPU module; carrying an i82551 network through a PC04+ bus on a semi-finished product of a CPU module of the PC104, performing a sending and receiving test, and preliminarily monitoring whether the basic state of the PC104+ bus is normal; the existing method and test software can be reused to test whether the function is normal or not by leading out probes to the PS/2 port of the semi-finished product of the PC104CPU module and the VGA display port. Because the semi-manufactured goods of PC104CPU module have standard locating hole and the same PC04 bus, consequently the utility model discloses applicable test of series products, the commonality is better, does benefit to and improves product detection efficiency.
The SMT finished product test board adopts a universal test rack and replaceable test needle beds, so that the development risk is reduced to the maximum extent, and the development cost and the development period are reduced; the test needle bed is convenient to replace, has a forced air cooling function and can cool the board card to be tested; the method is suitable for testing the semi-finished products of the multi-series PC104CPU modules, and has universality.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (10)
1. A Surface Mount Technology (SMT) semi-finished product test board is characterized by comprising a test rack, wherein a test needle bed is arranged on the test rack; the test needle bed comprises a needle plate and a test circuit board connected with the needle plate; the test bench is provided with a control panel, an output interface and a pressing mechanism; the pressing mechanism is used for fixing the tested plate on the needle bed; the control panel is electrically connected with the output interface and the test circuit board.
2. An SMT according to claim 1, wherein the test bench comprises a base, the base is a support body having a receiving cavity therein, a front portion of the base is sloped and is provided with an operating panel, and a side surface of the base is provided with an output interface.
3. An SMT according to claim 2, wherein the operation panel is provided with an alarm, a nixie tube, an indicator light, a reset button and a start button; the output interface comprises a VGA interface and/or a PS2 interface and/or a USB interface.
4. An SMT according to claim 2, wherein the test bench further comprises a pallet disposed on top of the table base, the pallet being a hollow frame, the hollow portion vertically corresponding to the needle beds.
5. An SMT according to claim 4, wherein the pressing mechanism includes a rack disposed on the pedestal on one side of the pallet; the top of the rack is provided with a pressing handle which is mechanically connected with the top end of the rack and can drive the pressing rod to vertically move by pressing down or lifting up the pressing handle; the bottom of the pressure lever is connected with a horizontal pressure plate, and the pressure plate vertically corresponds to the supporting plate.
6. An SMT according to claim 5, wherein a plurality of press bars are disposed on a bottom of the press plate.
7. An SMT according to claim 1, wherein the test circuit board includes a carrier board, a processor is disposed on the carrier board, and a DEBUG display unit, a bus extension network unit, and a power protection circuit unit electrically connected to the processor.
8. An SMT according to claim 7, wherein the power protection circuit unit includes a power input interface resistance detection circuit and a power-on over-current protection circuit.
9. An SMT according to claim 7, wherein the DEBUG display unit is a PC104 bus extension DEBUG display circuit that includes a bi-directional transceiver connected via an ISA bus network for obtaining the test signals of the board under test and for level-shifting the signals for input to the processor.
10. An SMT according to claim 7, wherein the bus extension network unit comprises a PC104 bus extension network chip for testing a PC104 bus of the board under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920580091.9U CN209878949U (en) | 2019-04-25 | 2019-04-25 | SMT semi-finished product test board |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920580091.9U CN209878949U (en) | 2019-04-25 | 2019-04-25 | SMT semi-finished product test board |
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| Publication Number | Publication Date |
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| CN209878949U true CN209878949U (en) | 2019-12-31 |
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| CN201920580091.9U Active CN209878949U (en) | 2019-04-25 | 2019-04-25 | SMT semi-finished product test board |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021142690A1 (en) * | 2020-01-16 | 2021-07-22 | 深圳市蓝眼科技有限公司 | Automatic value measurement machine |
| CN117214692A (en) * | 2023-04-28 | 2023-12-12 | 东莞市小强电子科技有限公司 | Multifunctional electric performance testing system and testing process for brushless motor |
-
2019
- 2019-04-25 CN CN201920580091.9U patent/CN209878949U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021142690A1 (en) * | 2020-01-16 | 2021-07-22 | 深圳市蓝眼科技有限公司 | Automatic value measurement machine |
| CN117214692A (en) * | 2023-04-28 | 2023-12-12 | 东莞市小强电子科技有限公司 | Multifunctional electric performance testing system and testing process for brushless motor |
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