CN209829634U - Testing device for embedded power supply - Google Patents
Testing device for embedded power supply Download PDFInfo
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- CN209829634U CN209829634U CN201920573715.4U CN201920573715U CN209829634U CN 209829634 U CN209829634 U CN 209829634U CN 201920573715 U CN201920573715 U CN 201920573715U CN 209829634 U CN209829634 U CN 209829634U
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- power supply
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- belt
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- testing
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Abstract
The utility model provides a testing arrangement of embedded power, include feeding belt, ejection of compact belt and locate feeding belt with test station and transport manipulator between the ejection of compact belt, transport manipulator is used for conveying to feeding belt's power transport extremely test station tests and transport it extremely again after the test is qualified on the ejection of compact belt. The above structure is adopted in the utility model, the transport manipulator tests on carrying the automatic transport of power on the feeding belt to the test station, after the power supply test is qualified, the transport manipulator can carry this test qualified power to the discharging belt promptly and receive the material with being sent to material collecting device, then can test in time with the power transport of waiting to line up on the feeding belt to the test station, thereby realize the seamless butt joint of test and waiting and reduce the stand-by time of test station, and then further improve efficiency of software testing.
Description
[ technical field ] A method for producing a semiconductor device
The utility model relates to a testing arrangement of embedded power.
[ background of the invention ]
The embedded power supply needs to be tested and checked after being assembled, the power supply needs to be manually carried to a testing station for testing and checking when the power supply is tested, and therefore the traditional method is troublesome and labor-consuming and is not beneficial to improving the production efficiency.
[ Utility model ] content
The to-be-solved technical problem of the utility model is to provide a testing arrangement of embedded power that can improve production efficiency.
The purpose of the utility model is realized like this:
the utility model provides a testing arrangement of embedded power, includes feeding belt, ejection of compact belt and locates feeding belt with test station and transport manipulator between the ejection of compact belt, transport manipulator is used for conveying the conveying to feeding belt's power is to test station tests and transport it again to after the test is qualified on the ejection of compact belt.
The above structure is adopted in the utility model, the transport manipulator tests on carrying the automatic transport of power on the feeding belt to the test station, after the power supply test is qualified, the transport manipulator can carry this test qualified power to the discharging belt promptly and receive the material with being sent to material collecting device, then can test in time with the power transport of waiting to line up on the feeding belt to the test station, thereby realize the seamless butt joint of test and waiting and reduce the stand-by time of test station, and then further improve efficiency of software testing.
According to the testing device for the embedded power supply, the two sides of the feeding belt are respectively provided with the first baffle and the second baffle for limiting the power supply, the first baffle is provided with the movable stop block which is used for sensing whether the power supply is sent to the infrared sensor on the feeding belt and can movably extend out relative to the first baffle for blocking the power supply, and the second baffle is provided with the cylinder for pushing the power supply to the first baffle for positioning the power supply. When the infrared sensor senses that the power is transmitted on the feeding belt, the movable stop block stretches out to stop the power to continue to be transmitted backwards, meanwhile, the feeding belt stops transmitting, the power is pushed by the cylinder towards the first stop plate, and therefore the power is positioned to wait for the test in a queue and the power is convenient to be grabbed and transported by the transporting manipulator.
As above testing arrangement of embedded power, the transport manipulator includes and sets up and strides along the X axle direction and establish correspondingly feeding belt with first slide between the ejection of compact belt, set up and can follow along the Y axle direction first slide gliding second slide, set up and can follow along the Z axle direction the gliding third slide of second slide and locate third slide lower extreme can slide from top to bottom and be used for absorbing the vacuum suction disc of power relatively it, consequently the transport manipulator can realize 3 linkages and through vacuum suction disc with the power transport between feeding belt, test station and ejection of compact belt.
According to the testing device for the embedded power supply, the testing station is provided with the component for testing the power supply and the pushing component for pushing the power supply to the testing component so that the power supply is electrically connected with the testing component, and after the carrying manipulator carries the power supply to the testing station, the pushing component pushes the power supply to the testing component so that the power supply is correspondingly electrically connected with the testing component to test the power supply.
According to the testing device for the embedded power supply, the second baffle is provided with the adjusting component used for adjusting the distance between the second baffle and the first baffle, the adjusting component comprises the adjusting guide rod, the fixed guide seat and the locking component used for locking the adjusting guide rod on the fixed guide seat, the adjusting guide rod penetrates through the fixed guide seat and is fixedly connected with the second baffle, the distance between the second baffle and the first baffle can be adjusted by loosening the locking component, so that the second baffle can be adapted to power supplies with different sizes, and the adaptability is strong.
[ description of the drawings ]
The following detailed description of embodiments of the present invention is provided with reference to the accompanying drawings, in which:
fig. 1 is a schematic structural view of the present invention;
fig. 2 is a schematic structural view of the feeding belt of the present invention;
fig. 3 is a schematic structural diagram of the testing station of the present invention;
fig. 4 is a schematic structural view of the carrying manipulator of the present invention.
[ detailed description ] embodiments
A testing device for an embedded power supply comprises a feeding belt 11, a discharging belt 12, a testing station 13 and a carrying manipulator 14, wherein the testing station 13 and the carrying manipulator 14 are arranged between the feeding belt 11 and the discharging belt 12, and the carrying manipulator 14 is used for carrying a power supply 10 transmitted to the feeding belt 11 to the testing station 13 for testing and carrying the power supply to the discharging belt 12 after the testing is qualified.
The two sides of the feeding belt 11 are respectively provided with a first baffle plate 111 and a second baffle plate 112 for limiting the power supply 10, the first baffle plate 111 is provided with an infrared sensor 113 for sensing whether the power supply 10 is sent to the feeding belt 11 or not and a movable stop 114 which can movably extend relative to the first baffle plate 111 for stopping the power supply 10, the second baffle plate 112 is provided with a cylinder 115 for pushing the power supply 10 to the first baffle plate 111 for positioning the power supply 10, the feeding belt 11 and the discharging belt 12 are respectively provided with a driving motor for driving the feeding belt 11 and the discharging belt 12 to transmit, and one side of the discharging belt 12 is also provided with a corresponding infrared sensor 113 for detecting the power supply 10 conveyed from the testing station and starting the discharging belt 12 to send the power supply 10 out.
The carrying manipulator 14 comprises a first slide carriage 141 arranged along the X-axis direction and straddling between the corresponding feeding belt 11 and the discharging belt 12, a second slide carriage 142 arranged along the Y-axis direction and capable of sliding along the first slide carriage 141, a third slide carriage 143 arranged along the Z-axis direction and capable of sliding along the second slide carriage 142, and a vacuum suction tray 144 arranged at the lower end of the third slide carriage 143 and capable of sliding up and down relative to the third slide carriage and used for sucking the power supply 10, the first slide carriage 141 is provided with a first motor for driving the second slide carriage 142 to slide along the first slide carriage 141, the second slide carriage 142 is provided with a second motor for driving the third slide carriage 143 to slide along the second slide carriage 142, the third slide carriage 143 is provided with a third motor for driving the vacuum material sucking disc 144 thereon to slide up and down along the third slide carriage 143, and the vacuum material sucking disc 144 is provided with a vacuum device for vacuumizing the vacuum material sucking disc so that the vacuum material sucking disc can suck the power source 10 and carry the power source to a corresponding position.
The test station 13 is provided with a test component 131 for testing the power supply 10 and a pushing component 132 for pushing the power supply 10 to the test component 131 so that the power supply 10 is electrically connected with the test component 131, the test component 131 is provided with a slot into which a circuit board of the power supply 10 is inserted, the pushing component 132 is provided with a power socket for inserting the power supply 10 and providing a test power supply for the power supply, and when the pushing component 132 pushes the power supply 10 to the test component 131, the power socket is inserted into the power supply 10 and the circuit board of the power supply 10 is inserted into the slot for testing.
The second baffle plate 112 is provided with an adjusting assembly 116 for adjusting the distance between the second baffle plate and the first baffle plate 111, the adjusting assembly 116 comprises an adjusting guide rod 117, a fixed guide seat 118 and a locking member 119 for locking the adjusting guide rod 117 on the fixed guide seat 118, the adjusting guide rod 117 penetrates through the fixed guide seat 118 and is fixedly connected with the second baffle plate 112, in order to further improve the adaptability, the carrying manipulator 14 can be provided with a code scanner for scanning the two-dimensional code labeled on the power supply 10 to determine the type of the currently tested power supply 10 and determine the specific item to be tested.
The utility model discloses during the use, when there is the power of waiting in line on the feeding belt 11 when no power 10 tests on test station 13, transport manipulator 14 tests the power transport on the feeding belt 11 to test station 13 immediately, this moment this feeding belt 11 front end can continue to its transfer power source 10, accomplish the test to the power and confirm qualified back (report to the police promptly if the test is unqualified and scrap and press the reset button of this corresponding test station so that it puts into work again with the suggestion staff and take away in order to make it), transport manipulator 14 receives the material with being sent to material collecting device on being about to this test qualified power transport to corresponding ejection of compact belt 12. Therefore, the testing device realizes seamless butt joint of testing and waiting and reduces the standby time of the testing station 13, thereby further improving the testing efficiency.
Claims (5)
1. The utility model provides a testing arrangement of embedded power, its characterized in that includes feeding belt (11), ejection of compact belt (12) and locates feeding belt (11) with test station (13) and transport manipulator (14) between ejection of compact belt (12), transport manipulator (14) are used for conveying to feeding belt (11) power (10) transport extremely test station (13) test and transport it again to after the test is qualified on ejection of compact belt (12).
2. The testing device of the embedded power supply according to claim 1, wherein a first baffle (111) and a second baffle (112) are respectively arranged on two sides of the feeding belt (11) for limiting the power supply (10), the first baffle (111) is provided with an infrared sensor (113) for sensing whether the power supply (10) is fed onto the feeding belt (11) and a movable stopper (114) which can movably extend relative to the first baffle (111) for stopping the power supply (10), and the second baffle (112) is provided with a cylinder (115) for pushing the power supply (10) to the first baffle (111) for positioning the power supply (10).
3. The testing device for the embedded power supply according to claim 1, wherein the carrying manipulator (14) comprises a first slide carriage (141) arranged along the X-axis direction and straddling between the corresponding feeding belt (11) and the discharging belt (12), a second slide carriage (142) arranged along the Y-axis direction and sliding along the first slide carriage (141), a third slide carriage (143) arranged along the Z-axis direction and sliding along the second slide carriage (142), and a vacuum suction tray (144) arranged at the lower end of the third slide carriage (143) and sliding up and down relative to the third slide carriage and sucking the power supply (10).
4. The testing device of the embedded power supply according to claim 1, wherein the testing station (13) is provided with a testing component (131) for testing the power supply (10) and a pushing component (132) for pushing the power supply (10) to the testing component (131) so that the power supply (10) is electrically connected with the testing component (131).
5. The testing device for the embedded power supply according to claim 2, wherein the second baffle (112) is provided with an adjusting assembly (116) for adjusting a distance between the second baffle and the first baffle (111), the adjusting assembly (116) comprises an adjusting guide rod (117), a fixed guide seat (118) and a locking member (119) for locking the adjusting guide rod (117) on the fixed guide seat (118), and the adjusting guide rod (117) penetrates through the fixed guide seat (118) and is fixedly connected with the second baffle (112).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920573715.4U CN209829634U (en) | 2019-04-24 | 2019-04-24 | Testing device for embedded power supply |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920573715.4U CN209829634U (en) | 2019-04-24 | 2019-04-24 | Testing device for embedded power supply |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209829634U true CN209829634U (en) | 2019-12-24 |
Family
ID=68914111
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920573715.4U Active CN209829634U (en) | 2019-04-24 | 2019-04-24 | Testing device for embedded power supply |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209829634U (en) |
-
2019
- 2019-04-24 CN CN201920573715.4U patent/CN209829634U/en active Active
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