CN209802464U - piezoelectric quartz wafer detection device - Google Patents

piezoelectric quartz wafer detection device Download PDF

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Publication number
CN209802464U
CN209802464U CN201920798244.7U CN201920798244U CN209802464U CN 209802464 U CN209802464 U CN 209802464U CN 201920798244 U CN201920798244 U CN 201920798244U CN 209802464 U CN209802464 U CN 209802464U
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China
Prior art keywords
push
quartz wafer
clamping groove
charge amplifier
digital display
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Active
Application number
CN201920798244.7U
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Chinese (zh)
Inventor
刘刚
周伟
朱敬朝
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Nanjing Lijia Sensing Technology Co Ltd
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Nanjing Lijia Sensing Technology Co Ltd
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Priority to CN201920798244.7U priority Critical patent/CN209802464U/en
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  • Force Measurement Appropriate To Specific Purposes (AREA)

Abstract

The utility model discloses a piezoelectric quartz crystal wafer detection device, which comprises a quartz crystal wafer clamping groove, a manual pressing device, an upper electrode, a lower electrode, a charge amplifier connecting wire, a digital display type quasi-static charge amplifier and a digital display type push-pull force meter; the quartz crystal wafer clamping groove comprises a bottom plate and a top plate which is positioned above the bottom plate and can move up and down, a lower electrode is arranged on the top surface of the bottom plate, an upper electrode is arranged on the bottom surface of the top plate, the upper electrode and the lower electrode are connected with a digital display type quasi-static charge amplifier through a charge amplifier connecting wire, and a piezoelectric quartz crystal wafer is arranged between the upper electrode and the lower electrode; the manual pressing device is arranged above the top plate of the quartz wafer clamping groove; the digital display type push-pull dynamometer is arranged below the bottom plate of the quartz wafer clamping groove. The utility model discloses can be used to screen and match quartz plate group before english weighing sensor production, can promote quartz plate's uniformity and reliability by a wide margin to improve the quality of sensor precision and product.

Description

piezoelectric quartz wafer detection device
Technical Field
The utility model belongs to the technical field of measure piezoelectricity electric charge device, concretely relates to piezoelectricity quartz wafer detection device.
Background
The quartz weighing sensor is one of force sensors, quartz plates are directly placed in a cavity in the production process of the existing quartz weighing sensor, and the accuracy of the sensor is seriously influenced by the fact that output charges are inevitably unbalanced under the condition that a single piezoelectric quartz wafer is not screened.
SUMMERY OF THE UTILITY MODEL
utility model purpose: the utility model discloses aim at screening and matching quartz plate group before realizing quartz weighing sensor production to promote quartz wafer's uniformity and reliability.
In order to achieve the above purpose, the utility model adopts the following technical scheme: a piezoelectric quartz wafer detection device comprises a quartz wafer clamping groove, a manual pressing device, an upper electrode, a lower electrode, a charge amplifier connecting wire, a digital display type quasi-static charge amplifier and a digital display type push-pull dynamometer;
The quartz crystal wafer clamping groove comprises a bottom plate and a top plate which is positioned above the bottom plate and can move up and down, a lower electrode is arranged on the top surface of the bottom plate, an upper electrode is arranged on the bottom surface of the top plate, the upper electrode and the lower electrode are connected with a digital display type quasi-static charge amplifier through a charge amplifier connecting wire, and a piezoelectric quartz crystal wafer is arranged between the upper electrode and the lower electrode;
the manual pressing device is arranged above the top plate of the quartz wafer clamping groove;
The digital display type push-pull dynamometer is arranged below the bottom plate of the quartz wafer clamping groove.
Further, the quartz wafer clamping groove further comprises a side plate, the bottom plate is fixed to the lower portion of the side plate, a sliding groove is formed in the upper portion of the side plate, and one side of the top plate is embedded into the sliding groove and can slide up and down along the sliding groove.
Furthermore, the manual pressing device comprises a handle and a pressing rod, the handle is fixed at the upper end of the pressing rod, and the lower end of the pressing rod is in contact with the top surface of the top plate of the clamping groove of the quartz wafer.
Furthermore, the digital display type push-pull force comprises a push-pull force meter display and a push-pull force meter body, a test head of the push-pull force meter body is in contact with the bottom surface of the bottom plate of the quartz wafer clamping groove, and the output end of the push-pull force meter body is connected with the push-pull force meter display through a push-pull force meter connecting wire.
Further, the charge amplifier connecting line is a coaxial cable.
furthermore, the push-pull dynamometer connecting wire is a USB connecting wire.
Has the advantages that: the utility model provides a piezoelectricity quartz wafer detection device adopts the draw-in groove to carry out the quartz piece location, makes the quartz piece take place piezoelectric effect through pressure effect and produces the electric charge, combines quasi-static charge amplifier and digital display push-pull dynamometer to screen and divide into groups the quartz piece to promote quartz wafer's uniformity and reliability, thereby improve the quality of sensor precision and product.
Drawings
FIG. 1 is a schematic structural view of a piezoelectric quartz wafer inspection device according to the present invention;
FIG. 2 is a schematic structural diagram of a quartz wafer card slot;
FIG. 3 is a schematic view of the structure of the manual hold-down device;
in fig. 1: 1-a piezoelectric quartz wafer; 2-quartz wafer card slot; 3-manual pressing down the device; 4-an upper electrode; 5-a lower electrode; 6-charge amplifier connection line; 7-digital display quasi-static charge amplifier; 8-connecting line of the push-pull dynamometer; 9-push-pull dynamometer display; 10-a push-pull dynamometer body;
In fig. 2: 201-a top plate; 202-side plate; 203-a backplane;
In fig. 3: 301-a handle; 302-pressure lever.
The specific implementation mode is as follows:
The present invention will be further explained with reference to the accompanying drawings.
as shown in fig. 1 and 2, the utility model discloses a piezoelectric quartz crystal wafer detection device, including quartz crystal wafer draw-in groove 2, manual push down device 3, last electrode 4, bottom electrode 5, charge amplifier connecting wire 6, digital display formula quasi-static charge amplifier 7 and digital display formula push-pull dynamometer.
The quartz wafer cassette slot 2 includes a bottom plate 203 and a top plate 201 which is located above the bottom plate 203 and can move up and down. Preferably, the quartz wafer clamping groove 2 further comprises a side plate 202, the bottom plate 203 is fixed at the lower part of the side plate, a sliding groove is arranged at the upper part of the side plate 202, and one side of the top plate 201 is embedded into the sliding groove and can slide up and down along the sliding groove. The bottom plate 203 is provided with a bottom electrode 5 on the top surface, the top plate 201 is provided with a top electrode 4 on the bottom surface, the top electrode 4 and the bottom electrode 5 are connected with a digital display type quasi-static charge amplifier 7 through a charge amplifier connecting wire 6, in this embodiment, the charge amplifier connecting wire 6 is a coaxial cable. The piezoelectric quartz wafer 1 is disposed between the upper electrode 4 and the lower electrode 5.
as shown in fig. 1 and 3, the manual hold-down device 3 is disposed above the top plate 201 of the quartz wafer chuck slot 2. The manual pressing device 3 comprises a handle 301 and a pressing rod 302, wherein the handle 301 is fixed at the upper end of the pressing rod 302, and the lower end of the pressing rod 302 is contacted with the top surface of the top plate 201 of the quartz wafer clamping groove 2.
As shown in fig. 1, the digital display type push-pull force meter is disposed below the bottom plate 203 of the quartz wafer card slot 2. The digital display type push-pull force comprises a push-pull force meter display 9 and a push-pull force meter body 10, a testing head of the push-pull force meter body 10 is in contact with the bottom surface of a bottom plate 203 of the quartz wafer clamping groove 2, and the output end of the push-pull force meter body 10 is connected with the push-pull force meter display 9 through a push-pull force meter connecting wire 8. In this embodiment, the push-pull dynamometer connection line 8 is a USB connection line.
When the piezoelectric quartz crystal clamping groove is used, the handle 301 is pressed downwards, the lower end of the pressing rod 302 applies pressure to the top plate 201 of the quartz crystal clamping groove 2, the top plate 201 moves downwards, the electrode plates and the upper surface and the lower surface of the piezoelectric quartz crystal 1 are respectively in close contact with the upper electrode 4 and the lower electrode 5, and the piezoelectric quartz crystal 1 generates a piezoelectric effect under the action of the pressure to generate electric charges; the generated electric charges are output through the upper electrode 4 and the lower electrode 5; the upper electrode 4 and the lower electrode 5 are connected with the input end of a digital display quasi-static charge amplifier 7 through a charge amplifier connecting wire 6, and charge values are displayed in the display area of the amplifier. Meanwhile, the bottom plate 203 of the quartz wafer clamping groove 2 transmits the pressure to the test head of the push-pull dynamometer body 10, the push-pull dynamometer body 10 displays the sensed pressure value through the push-pull dynamometer display 9, and the quartz wafer is calculated and screened according to data displayed by the charge amplifier and the push-pull dynamometer.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.

Claims (6)

1. A piezoelectric quartz wafer detection device is characterized in that: the device comprises a quartz wafer clamping groove (2), a manual pressing device (3), an upper electrode (4), a lower electrode (5), a charge amplifier connecting wire (6), a digital display type quasi-static charge amplifier (7) and a digital display type push-pull dynamometer;
The quartz crystal wafer clamping groove (2) comprises a bottom plate (203) and a top plate (201) which is positioned above the bottom plate (203) and can move up and down, a lower electrode (5) is arranged on the top surface of the bottom plate (203), an upper electrode (4) is arranged on the bottom surface of the top plate (201), the upper electrode (4) and the lower electrode (5) are connected with a digital display type quasi-static charge amplifier (7) through a charge amplifier connecting wire (6), and the piezoelectric quartz crystal wafer (1) is arranged between the upper electrode (4) and the lower electrode (5);
The manual pressing device (3) is arranged above a top plate (201) of the quartz wafer clamping groove (2);
The digital display type push-pull force meter is arranged below a bottom plate (203) of the quartz wafer clamping groove (2).
2. A piezoelectric quartz wafer inspection apparatus as claimed in claim 1, wherein: the quartz wafer clamping groove (2) further comprises a side plate (202), the bottom plate (203) is fixed to the lower portion of the side plate, a sliding groove is formed in the upper portion of the side plate (202), and one side of the top plate (201) is embedded into the sliding groove and can slide up and down along the sliding groove.
3. A piezoelectric quartz wafer inspection apparatus according to claim 1 or 2, wherein: the manual pressing device (3) comprises a handle (301) and a pressing rod (302), the handle (301) is fixed at the upper end of the pressing rod (302), and the lower end of the pressing rod (302) is in contact with the top surface of a top plate (201) of the quartz wafer clamping groove (2).
4. A piezoelectric quartz wafer inspection apparatus as claimed in claim 3, wherein: the digital display type push-pull force comprises a push-pull force meter display (9) and a push-pull force meter body (10), a test head of the push-pull force meter body (10) is in contact with the bottom surface of a bottom plate (203) of the quartz wafer clamping groove (2), and the output end of the push-pull force meter body (10) is connected with the push-pull force meter display (9) through a push-pull force meter connecting wire (8).
5. A piezoelectric quartz wafer inspection apparatus as claimed in claim 4, wherein: the charge amplifier connecting wire (6) is a coaxial cable.
6. A piezoelectric quartz wafer inspection apparatus as claimed in claim 5, wherein: the push-pull dynamometer connecting wire (8) is a USB connecting wire.
CN201920798244.7U 2019-05-30 2019-05-30 piezoelectric quartz wafer detection device Active CN209802464U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920798244.7U CN209802464U (en) 2019-05-30 2019-05-30 piezoelectric quartz wafer detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920798244.7U CN209802464U (en) 2019-05-30 2019-05-30 piezoelectric quartz wafer detection device

Publications (1)

Publication Number Publication Date
CN209802464U true CN209802464U (en) 2019-12-17

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920798244.7U Active CN209802464U (en) 2019-05-30 2019-05-30 piezoelectric quartz wafer detection device

Country Status (1)

Country Link
CN (1) CN209802464U (en)

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