CN209784511U - Based on43Device for measuring weak high-frequency alternating magnetic field by Ca + ions - Google Patents

Based on43Device for measuring weak high-frequency alternating magnetic field by Ca + ions Download PDF

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CN209784511U
CN209784511U CN201920331862.0U CN201920331862U CN209784511U CN 209784511 U CN209784511 U CN 209784511U CN 201920331862 U CN201920331862 U CN 201920331862U CN 209784511 U CN209784511 U CN 209784511U
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interface
magnetic field
vacuum chamber
laser
ion trap
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李加冲
周飞
章嘉伟
熊飞雷
冯芒
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Wuhan Institute of Physics and Mathematics of CAS
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Wuhan Institute of Physics and Mathematics of CAS
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Abstract

the utility model discloses a based on43Ca+The device for measuring weak high-frequency alternating magnetic field by using ions comprises a vacuum chamber, a linear ion trap arranged in the vacuum chamber and a magnetic field measuring device43Ca atomic furnace, the last circumference evenly distributed of vacuum chamber has first CF63 interface, second CF63 interface, third CF63 interface, fourth CF63 interface, fifth CF63 interface, sixth CF63 interface, seventh CF63 interface and eighth CF63 interface, the central point of first CF63 interface-eighth CF63 interface is located same distribution circumference, the top surface of vacuum chamber is provided with first CF200 interface, the bottom surface of vacuum chamber is provided with second CF200 interface, the utility model discloses a very accurate measurement to weak alternating magnetic field has been realized; to magnetic fieldThe spatial resolution of the optical fiber can reach 33 nanometers; the process is carried out at room temperature without a low-temperature device.

Description

Based on43Ca+Device for measuring weak high-frequency alternating magnetic field by ions
Technical Field
the utility model relates to an ion trap magnetometer experiment field, concretely relates to based on43Ca+The device for measuring the weak high-frequency alternating magnetic field by the ions is suitable for precisely measuring the very weak high-frequency alternating magnetic field in a room temperature environment.
Background
In the last century, the introduction of quantum mechanics has led to a revolution in the art, and some important utility models, such as lasers, semiconductors, etc., have had profound effects on human life. By the end of the last century, the development of quantum information science and technology has brought about a second quantum technology revolution. As an important component of the second quantum revolution, the quantum precision measurement technology based on quantum state and quantum manipulation technology can measure basic physical quantities such as time, displacement, angular velocity, and the like more accurately than the previous measurement technology.
Magnetic induction is a measure of the strength of a magnetic field. Measuring magnetic induction with high accuracy is a symbol of state science and technology level. It is a rather difficult matter to perform a precise measurement on a weak alternating magnetic field compared to a precise measurement on a static magnetic field. The utility model is based on imprisoning single43Ca+The ion trap system of ions is used as a magnetometer for measuring the alternating magnetic field with high precision.
The utility model discloses in, the whole system of ion trap is in the room temperature, only needs to utilize laser to carry out energy dissipation and reach refrigerated effect to the ion. Because the whole system is in an ultrahigh vacuum state, ions can be stably placed in an electromagnetic potential well for a long time, and can be controlled by laser with high precision. Therefore, the quantum system is simple in structure, clean in environment and mature in technology, and is very suitable for being used as a measuring device.
For the43Ca+Ions such as microscopic particles having magnetic moment are externally modulated by a static magnetic field43Ca+Energy level splitting and weak generation of ionsthe frequency of the alternating magnetic field is matched. Meanwhile, the weak magnetic field enables the system to oscillate between different magnetic eigenstates (called as "Lato oscillation" for short). By measuring the frequency of the ratiometric oscillation, the magnitude of the alternating magnetic field can be detected. The utility model discloses a suitable work area suppresses because the resonance signal that the small shake of biasing magnetostatic field caused is skew, guarantees that this scheme can normally work under the nonideal condition.
SUMMERY OF THE UTILITY MODEL
The object of the present invention is to solve the above problems of the prior art by providing a device based on43Ca+the device for measuring weak high-frequency alternating magnetic field by ions realizes the precise measurement of weak alternating magnetic field signals.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
Based on43Ca+The device for measuring weak high-frequency alternating magnetic field by using ions comprises a vacuum chamber, a linear ion trap arranged in the vacuum chamber and a magnetic field measuring device43A Ca atomic furnace, a Ca-containing gas reactor,
The first CF63 interface, the second CF63 interface, the third CF63 interface, the fourth CF63 interface, the fifth CF63 interface, the sixth CF63 interface, the seventh CF63 interface and the eighth CF63 interface are uniformly distributed on the upper circumference of the vacuum chamber, the central points of the first CF63 interface to the eighth CF63 interface are positioned on the same distribution circumference, the first CF200 interface is arranged on the top surface of the vacuum chamber, the second CF200 interface is arranged on the bottom surface of the vacuum chamber,
A light-transmitting window for transmitting photoionization laser to the center of the linear ion trap is arranged on the first CF63 interface; the fifth CF63 interface is provided with a light-passing window for the incident Doppler cooling laser and the back pumping laser to the center of the linear ion trap, the first CF63 interface and the fifth CF63 interface are respectively provided with a magnetic field coil,
The sixth CF63 interface is provided with a light pass window for incident doppler cooled laser and back pumped laser to the center of the linear ion trap,
The eighth CF63 interface is provided with a light transmission window for transmitting the state detection laser, the state preparation laser, the qubit operation microwave I and the qubit operation microwave II to the center of the linear ion trap,
The second CF63 interface and the seventh CF63 interface each have a detection window for detecting fluorescence emitted by the caged ions,
The detection window is installed at the fourth CF63 interface, and the third CF63 interface is respectively connected with the sublimation pump, the vacuum gauge, the vacuum angle valve and the ion pump through a six-way vacuum connector.
The linear ion trap comprises a ceramic fixing frame, and a direct current electrode, a radio frequency electrode and a micro-motion compensation electrode which are fixed on the ceramic fixing frame, wherein the ceramic fixing frame is fixed on the first CF200 interface, and an ion trapping area generated by the linear ion trap is positioned in the center of the linear ion trap and in the center of a vacuum chamber.
The first CF200 interface is provided with a first CF40 interface, the first CF40 interface is provided with a radio-frequency feed-through connected with a radio-frequency electrode, the first CF200 interface is provided with a first CF16 interface, the first CF16 interface is provided with a direct-current feed-through, the direct-current feed-through on the first CF16 interface is respectively connected with the direct-current electrode and the micro-motion compensation electrode, the first CF200 interface is further provided with an upper additional CF40 interface which forms an included angle of 60 degrees with the horizontal plane and is used for incident sideband cooling laser, the second CF200 interface is provided with a second CF40 interface and a second CF16 interface, and the second CF16 interface is provided with a second CF16 interface which forms an included angle of 60 degrees with the horizontal plane and is used for incident43The Ca atomic furnace is connected with a direct current feed-through.
Compared with the prior art, the utility model, as follows beneficial effect:
1. the very precise measurement of the weak alternating magnetic field is realized;
2. the spatial resolution of the magnetic field can reach 33 nanometers;
3. the process is carried out at room temperature without a low-temperature device.
Drawings
FIG. 1 is a schematic view of the overall structure of the device of the present invention;
FIG. 2 is a schematic top view of the apparatus of the present invention;
FIG. 3 is a schematic side view of the vacuum chamber;
Fig. 4 is a schematic perspective view of the linear ion trap of the present invention;
FIG. 5 shows a view of the present invention43Ca+A schematic diagram of an ion energy level structure;
FIG. 6 shows the present invention43Ca+The splitting and transition schematic diagram of the ion energy level ground state under the static magnetic field;
FIG. 7 shows the amplitude B of the alternating magnetic field to be measuredgand the frequency v of the alternating magnetic field to be measuredgA schematic diagram of the relationship of (1);
FIG. 8 shows the measurement sensitivity and the frequency v of the alternating magnetic field to be measuredgSchematic diagram of the relationship of (1).
in the figure: 1-vacuum chamber; 2-a linear ion trap; 3-43A Ca atomic furnace; 4-a magnetic field coil; 5-a light-transmitting window; 6-detection window; 7-first CF200 interface; 8-second CF200 interface; 9-first CF16 interface; 10-second CF16 interface; 11-a direct current feed-through; 12-first CF40 interface; 13-radio frequency feed-through; 14-second CF40 interface; 15-extra CF40 interface; 16-lower additional CF40 interface; 17-a sublimation pump; 18-a vacuum gauge; 19-vacuum angle valve; 20-six-way vacuum connector; 21-an ion pump; 22-a radio frequency electrode; 23-a direct current electrode; 24-ceramic fixing frame; 25-micro motion compensation electrodes; 26-a threaded hole; 27-direct current electrode aperture; 28-ceramic support frame.
Detailed Description
to facilitate the understanding and practice of the present invention for those skilled in the art, the following detailed description of the present invention is provided in connection with the accompanying drawings and it is to be understood that the present invention has been described by way of illustration and example only and is not intended to be limiting.
Example 1:
as shown in fig. 1-4, based on43Ca+The device for measuring weak high-frequency alternating magnetic field by ions comprises a vacuum chamber 1, a linear ion trap 2 arranged in the vacuum chamber 1 and a magnetic field generator43Ca atomic furnace 3. The linear ion trap 2 comprises a radio frequency electrode 22, a direct current electrode 23 and a ceramic fixing frame 24.
first CF63 interface A, second CF63 interface B, third CF63 interface C, fourth CF63 interface D, fifth CF63 interface E, sixth CF63 interface F, seventh CF63 interface G and eighth CF63 interface H (respectively marked as A, B, C, D, E, F, G, H and distributed along the circumference in the anticlockwise direction in FIG. 2) are uniformly distributed on the upper circumference of the vacuum chamber 1, the central points of the first CF63 interface to the eighth CF63 interface are located on the same distribution circumference, the top surface of the vacuum chamber 1 is provided with a first CF200 interface 7, and the bottom surface of the vacuum chamber 1 is provided with a second CF200 interface 8.
The first CF200 interface 7 is provided with a first CF40 interface 12 and a first CF16 interface 9, the second CF200 interface 8 is provided with a second CF40 interface 14 and a second CF16 interface 10, the first CF200 interface 7 is further welded with two upper extra CF40 interfaces 15 which form an included angle of 60 degrees with the horizontal plane, and the second CF200 interface 8 is further welded with two lower extra CF40 interfaces 16 which form an included angle of 60 degrees with the horizontal plane.
A light-transmitting window 5 for transmitting photoionization laser to the center of the linear ion trap 2 is arranged on the first CF63 interface A; the fifth CF63 interface E is provided with a light transmission window 5 for transmitting doppler cooling laser and back pumping laser to the center of the linear ion trap 2, and the first CF63 interface a and the fifth CF63 interface E are respectively provided with a magnetic field coil 4.
The sixth CF63 interface F is provided with a light transmission window 5 for incident doppler cooled laser and back pumped laser to the center of the linear ion trap 2.
The eighth CF63 interface H is provided with a light transmission window 5 for incident state detection laser, state preparation laser and two qubit manipulation microwaves (microwave I, microwave II) to the center of the linear ion trap 2.
The second CF63 interface B and the seventh CF63 interface G are each equipped with a detection window 6 for detecting fluorescence emitted by the caged ions.
The fourth CF63 interface D mounts the detection window 6, and the third CF63 interface is connected to the sublimation pump 17, the vacuum gauge 18, the vacuum angle valve 19, and the ion pump 21, respectively, through the six-way vacuum connector 20.
The vacuum chamber 1 maintains the vacuum degree in the vacuum chamber 1 at 8.0 × 10-9Pa or so.
The vacuum chamber 1 is of a regular octagonal decahedron structure, eight CF63 interfaces (A-H) are respectively arranged at the centers of eight surfaces of the vacuum chamber 1 which are uniformly distributed along the same circumference, and the circle center of the distributed circumference is superposed with the center of the vacuum chamber 1 and the center of the linear ion trap 2 and is set as a coordinate origin.
The connecting line of the central point of the first CF63 interface A and the central point of the fifth CF63 interface E passes through the origin of coordinates, the straight line where the connecting line of the central point of the first CF63 interface A and the central point of the fifth CF63 interface E is located is the Z axis, the positive direction of the Z axis is from the central point of the fifth CF63 interface E to the central point of the first CF63 interface A, and the positive direction of the Z axis is the light passing direction of the direct current electrode small hole 27.
The connecting line of the central point of the third CF63 interface C and the central point of the seventh CF63 interface G passes through the coordinate origin, the straight line where the connecting line of the central point of the third CF63 interface C and the central point of the seventh CF63 interface G is located is the Y axis, the direction from the central point of the seventh CF63 interface G to the central point of the third CF63 interface C is the positive direction of the Y axis, and the Y axis is perpendicular to the Z axis.
The connecting line of the central point of the second CF63 interface B and the central point of the sixth CF63 interface F passes through the coordinate origin, the connecting line of the central point of the second CF63 interface B and the central point of the sixth CF63 interface F forms an angle of 45 degrees with the Z axis,
The line connecting the center point of the fourth CF63 interface D and the center point of the eighth CF63 interface H passes through the coordinate origin and is perpendicular to the line connecting the center point of the second CF63 interface B and the center point of the sixth CF63 interface F.
the top surface of the vacuum chamber 1 is provided with a first CF200 interface 7, the bottom surface of the vacuum chamber 1 is provided with a second CF200 interface 8, a straight line where a connecting line of a central point of the first CF200 interface 7 and a central point of the second CF200 interface 8 is located is an X axis, a direction from the central point of the second CF200 interface 8 to the central point of the first CF200 interface 7 is an X axis positive direction, and the X axis passes through a coordinate origin and is perpendicular to a Y axis and a Z axis.
a first CF40 interface 12 is arranged on the first CF200 interface 7, a radio frequency feed-through 13 is arranged on the first CF40 interface 12, a first CF16 interface 9 is arranged on the first CF200 interface 7, a direct current feed-through 11 is arranged on the first CF16 interface 9 and is used for connecting an external voltage source and providing voltage for the direct current electrode 23 and the four micro-motion compensation electrodes 25, two additional CF40 interfaces 15 are arranged on the first CF200 interface 7, a light-transmitting window 5 for incidence is arranged on the additional CF40 interfaces 15, and one of the light-transmitting windows is used for incidenceCooling the laser at the side band; the second CF200 interface 8 is provided with a second CF40 interface 14 for connecting a getter pump, the second CF200 interface 8 is provided with a second CF16 interface 10, and the second CF16 interface 10 is provided with a direct current feed-through 11 for connecting a getter pump43The Ca atomic furnace 3 is loaded with current and is also provided with two lower additional CF40 interfaces 16 on which light-passing windows 5 for laser incidence are mounted.
light-passing windows 5 for passing laser light are respectively installed on a first CF63 interface A and a fifth CF63 interface E, a sixth CF63 interface F and an eighth CF63 interface H, wherein the light-passing window 5 on the first CF63 interface A is used for inputting twice photoionization laser, the light-passing window 5 on the fifth CF63 interface E is used for inputting back-pumped laser and Z-direction Doppler cooling laser, the light-passing window 5 on the sixth CF63 interface F is used for inputting Doppler cooling laser and back-pumped laser, the light-passing window 5 on the eighth CF63 interface H is used for inputting state detection laser, state preparation laser and two microwaves (microwave I and microwave II), the detection windows 6 for detecting the internal condition of the vacuum chamber 1 are respectively installed on the second CF63 interface B, the fourth CF63 interface D and the seventh CF63 interface G, and the third CF63 interface C is connected with the six-way vacuum connector 20.
The linear ion trap 2 includes two dc electrodes 23, four rf electrodes 22 (including a first rf electrode a, a second rf electrode b, a third rf electrode c, and a fourth rf electrode d, where the first rf electrode a and the third rf electrode c are in phase, and the second rf electrode b and the fourth rf electrode are in phase and have a pi phase difference with the first rf electrode a and the third rf electrode c), four micro-motion compensation electrodes 25, and a ceramic fixing frame 24. Wherein two direct current electrodes 23, four radio frequency electrodes 22(a-d) and four micro-motion compensation electrodes 25 are all fixed on a ceramic fixing frame 24, the ceramic fixing frame 24 is fixed on the first CF200 interface 7 by 4 threaded holes 26 with the diameter of 3 mm on the ceramic fixing frame 24 and utilizing screws of M3, the linear ion trap 2 generates an ion trapping area through the two direct current electrodes 23, the four radio frequency electrodes 22 and the four micro-motion compensation electrodes 25, the ion trapping area is positioned in the center of the linear ion trap 2 and in the central area of the vacuum chamber 1, the radio frequency electrodes 22 are connected with an external radio frequency source through radio frequency leads and radio frequency feedthroughs 13, the direct current electrodes 23, the four radio frequency electrodes 22(a-d) and the four micro-motion23 and the micro-motion compensation electrode 25 are connected with a direct current feed-through 11 on the first CF16 interface 9 through a lead, and the direct current feed-through 11 on the first CF16 interface 9 is connected with an external power supply through a filter circuit.43The Ca atomic furnace 3 is fixed on the second CF200 interface 8 through a ceramic support frame 28 and is positioned right below the center of the linear ion trap 2. External current is loaded to the second CF16 through the dc feedthrough 11 on interface 1043Ca atomic furnace 3 for generating atomic gas of43Ca+Provides a prerequisite.
Example 2
Using the base described in example 143Ca+The device for measuring weak high-frequency alternating magnetic field by ions is based on43Ca+The method for measuring weak high-frequency alternating magnetic field by ions is as follows:
The alternating magnetic field to be measured is assumed to have the following form: b isg(t)=Bgcos(2πvgt) the alternating magnetic field to be measured is in the X direction, where vgIs known, t is a time variable, and the amplitude B of the alternating magnetic field to be measuredgIs to be measured. Five wavelengths of laser were used in the experiment, 375nm (photoionization), 423nm (photoionization), 397nm (doppler cooling), 866 (back pump), 854nm (back pump), 729nm (sideband cooling, state preparation, state detection) and two microwaves I, II (qubit operation).
Step 1, pair43The Ca atomic furnace 3 is electrified and heated to generate calcium atom steam, and the calcium atom steam diffuses to the center of the linear ion trap 2.
step 2, vertically incident photoionization lasers (375nm and 423nm) from a light transmission window 5 of a first CF63 interface A are incident to the center of the linear ion trap 2, and the photoionization lasers43Ca atom interaction to generate a calcium ion with one valence electron (43Ca+)。
And 3, loading radio frequency electric signals on the four radio frequency electrodes 22 by the radio frequency source, wherein the frequency range of the radio frequency electric signals is 20-30 MHz, and the input power range is 4-5W. The range of the DC voltage loaded by the DC voltage source on the 2 DC electrodes 23 is 100-120V. The trapping electric field generated on the RF electrode 22 and the DC control electric field generated on the DC electrode 23The combined action of the fields generates an ion trapping region in the linear ion trap 2, which traps the ions generated in the above step43Ca+. Is imprisoned43Ca+Not only simultaneously irradiated by Doppler cooling laser (397nm) and back-pumping laser (866nm, 854nm) simultaneously incident on a light-passing window 5 (vertical direction) of a fifth CF63 interface E and a light-passing window 5 (vertical direction) of a sixth CF63 interface F, but also acted by a compensation direct current control electric field loaded on the linear ion trap 2, wherein the compensation direct current control electric field is generated by direct current voltage on the micro-motion compensation electrode 25 and is used for leading the compensation direct current control electric field to be used for controlling the back-pumping laser to be applied to the micro-motion compensation electrode 2543Ca+push to the center of the ion trapping region of the linear ion trap 2 and make43Ca+Cooling to below 1 mK.
Step 4,43Ca+After the cooling is carried out and the laser enters a Lamb-Dick region (namely, the cooling is carried out to be less than 1 mK), one of two additional CF40 interfaces 15 additionally welded on the first CF200 interface is selected, sideband cooling laser 729nm vertically incident to the center of the ion trapping confinement region from a light-transmitting window 5 on the interface is acted simultaneously with back pump laser (854nm and 866nm) vertically incident to the center of the ion trapping confinement region from a light-transmitting window 5 on the fifth CF63 interface E, and the effect of the back pump laser is achieved43Ca+The sidebands are cooled.
Step 5, the state detection laser and the state preparation laser vertically incident to the center of the ion trapping and confining area from the light-transmitting window 5 of the eighth CF63 interface H act simultaneously with the back pump lasers (854nm and 866nm) vertically incident to the center of the ion trapping and confining area from the light-transmitting window 5 of the fifth CF63 interface E, so that the laser can be used for detecting the state of the ion trapping and confining area43Ca+Preparation of initial form to S1/2State.
step 6,43Ca+The ion energy levels will exhibit zeeman splitting under a static magnetic field, see figure 5. The utility model only needs to consider43Ca+The ground state of the electronic energy level of the ion, see fig. 6. To make the alternating magnetic field to be measured and43Ca+The transition resonance of energy levels | 1, + > and |0, + > can determine the magnetic induction intensity B (applied along the Z direction) of the static magnetic field required to be applied by the field coil 4 installed through the first CF63 interface A and the fifth CF63 interface E and the frequency v of the alternating magnetic field to be measuredgThe relationship of (1) is:
Wherein the magnetic induction B of the static magnetic field to be applied is in gauss (G), the frequency is in megahertz (MHz), and β is 2.86965 × 10-4MHz/G, x is a dimensionless parameter proportional to the static magnetic field induction and x is B/1151.131, Ehf3225.6082864 MHz represents the energy of the ultra-fine cleave. The magnetic induction B of the static magnetic field to be applied can be obtained by changing the current applied to the field coil 4.
Step 7, injecting qubits from the light-passing window 5 of the eighth CF63 interface H to operate microwaves I and II to the ion trapping region, wherein the frequency v of the microwaves IIand frequency v of microwave IIIIRespectively as follows:
In this case, the two beams of microwave energy are such that43Ca+ground state of energy level |0, - > is respectively associated with energy levels | -1, + >, |0, +>Resonance transitions, i.e., transitions I and II in fig. 6, occur.
Step 8, adjusting the amplitude of the microwave I and the amplitude of the microwave II to ensure that43Ca+Ground state of energy level |0, - > is respectively associated with energy level | -1, +>、|0,+>Resonance transition occurs, and Rabi frequencies of the resonance transition are all omega. Ω is to satisfy the following condition: b/277.307 > omega > omegagWherein Ω isgThe Rabi oscillation frequency between states |0, + > and | > is set. For a specific operation, Ω may be selected to be 4/10. I. Amplitude time function B of microwave corresponding to II transitionI(t)、BII(t) evolution over time is set as BI(t)=BIcos(2πνIt),BII(t)=-BIIcos(2πνIIt), the directions are all X directions. Thus, it can be found from ΩAmplitude B of corresponding microwave IIAmplitude B of microwave IIII
where x is B/1151.131, Ω is Mrad/s, and the calculated magnetic field is G.
The above microwaves I and II, resulting in43Ca+Ion is in state |0 +>And | B > in a simple oscillation, i.e. Rabi oscillation, in which
Step 9, detecting laser (729nm) by utilizing the state of vertical incidence from the light-transmitting window 5 of the eighth CF63 interface H and pump-back laser (854nm, 866nm) of vertical incidence from the light-transmitting window 5 of the fifth CF63 interface E, and measuring43Ca+At energy level |0 +>Population probabilities derived over time. After a period of measurement, state |0, +can be measured>And | B>the Rabi oscillation curve is used for calculating the Rabi oscillation frequency of the target, which isAccording to the following relation
Calculate Bg
As shown in fig. 7, at a frequency v of the alternating magnetic field to be measuredgIn the range of 0-390MHz, the amplitude B of the alternating magnetic field to be measured can be measured according to the stepsgin the range of μ T magnitude. The sensitivity of the measurement is defined asAssumed to be observableThe time of Rabi oscillation is Tgthen they satisfy
Wherein the sensitivity isHas a unit ofTgThe units are s and x is a parameter we have defined previously. By using the relationship between x and the signal frequency, it is possible to determineAnd vgFIG. 8 shows the relationship of (1). If the duration T of the Rabi oscillation can be ensuredgUp to the order of seconds, measurement sensitivityCan achieve the purpose ofFor a specific measurement, since the time of the Rabi oscillation can be selected according to the actual situation, the sensitivityCan pass throughThen divided byThus obtaining the product.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications, additions and substitutions for the specific embodiments described herein may be made by those skilled in the art without departing from the spirit of the invention or exceeding the scope of the invention as defined in the accompanying claims.

Claims (3)

1. Based on43Ca+The device for measuring weak high-frequency alternating magnetic field by ions comprises a vacuum chamber (1) and is characterized by also comprising a linear ion trap (2) and a linear ion trap (2) which are arranged in the vacuum chamber (1)43a Ca atomic furnace (3),
The vacuum chamber (1) is circumferentially and uniformly distributed with a first CF63 interface (A), a second CF63 interface (B), a third CF63 interface (C), a fourth CF63 interface (D), a fifth CF63 interface (E), a sixth CF63 interface (F), a seventh CF63 interface (G) and an eighth CF63 interface (H), the central points of the first CF63 interface (A) to the eighth CF63 interface (H) are positioned on the same distribution circumference, the top surface of the vacuum chamber (1) is provided with a first CF200 interface (7), the bottom surface of the vacuum chamber (1) is provided with a second CF200 interface (8),
A light-passing window used for incident photoionization laser to the center of the linear ion trap (2) is arranged on the first CF63 interface (A); a light-passing window for transmitting Doppler cooling laser and back pumping laser to the center of the linear ion trap (2) is arranged on the fifth CF63 interface (E), the first CF63 interface (A) and the fifth CF63 interface (E) are respectively provided with a magnetic field coil (4),
The sixth CF63 interface (F) is provided with a light transmission window for the incident doppler cooled laser and the back pumped laser to the center of the linear ion trap (2),
the eighth CF63 interface (H) is provided with a light transmission window for transmitting the state detection laser, the state preparation laser, the qubit operation microwave I and the qubit operation microwave II to the center of the linear ion trap (2),
The second CF63 interface (B) and the seventh CF63 interface (G) are both provided with detection windows (6) for detecting fluorescence emitted by the caged ions,
the fourth CF63 interface (D) is provided with a detection window (6), and the third CF63 interface (C) is respectively connected with the sublimation pump (17), the vacuum gauge (18), the vacuum angle valve (19) and the ion pump (21) through a six-way vacuum connector (20).
2. The method according to claim 143Ca+The device for ion measurement of weak high-frequency alternating magnetic field is characterized in thatThe linear ion trap (2) comprises a ceramic fixing frame (24), a direct current electrode (23), a radio frequency electrode (22) and a micro-motion compensation electrode (25), wherein the direct current electrode, the radio frequency electrode and the micro-motion compensation electrode are fixed on the ceramic fixing frame (24), the ceramic fixing frame (24) is fixed on the first CF200 interface (7), and an ion trapping and restraining area generated by the linear ion trap (2) is located in the center of the linear ion trap (2) and in the center of the vacuum chamber (1).
3. The method according to claim 243Ca+The device for measuring the weak high-frequency alternating magnetic field by ions is characterized in that a first CF40 interface (12) is arranged on a first CF200 interface (7), a radio-frequency feed-through (13) is installed on a first CF40 interface (12), the radio-frequency feed-through (13) is connected with a radio-frequency electrode (22), a first CF16 interface (9) is arranged on the first CF200 interface (7), a direct-current feed-through (11) is installed on a first CF16 interface (9), the direct-current feed-through (11) on the first CF16 interface (9) is respectively connected with a direct-current electrode (23) and a micro-motion compensation electrode (25), an upper additional CF40 interface (15) which forms an included angle of 60 degrees with the horizontal plane and is used for incident sideband cooling laser is further arranged on the first CF200 interface (7), a second CF40 interface (14) and a second CF16 interface (10) are arranged on a second CF16 interface (10), and a second CF16 interface (10) is installed on the second CF16 interface (43A direct current feed-through (11) connected with the Ca atomic furnace (3).
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109814049A (en) * 2019-03-15 2019-05-28 中国科学院武汉物理与数学研究所 It is based on43Ca+The device and method of the faint high-frequency alternating magnetic field of measuring ion

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109814049A (en) * 2019-03-15 2019-05-28 中国科学院武汉物理与数学研究所 It is based on43Ca+The device and method of the faint high-frequency alternating magnetic field of measuring ion
CN109814049B (en) * 2019-03-15 2024-02-27 中国科学院精密测量科学与技术创新研究院 Based on 43 Ca + Device and method for measuring weak high-frequency alternating magnetic field by ions

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