CN209764955U - measuring probe - Google Patents
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- CN209764955U CN209764955U CN201920145039.0U CN201920145039U CN209764955U CN 209764955 U CN209764955 U CN 209764955U CN 201920145039 U CN201920145039 U CN 201920145039U CN 209764955 U CN209764955 U CN 209764955U
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Abstract
The application relates to a measuring probe, which comprises a fixed box, a power supply device, an electric field sensor, a magnetic field sensor, an information processing device and a shielding layer. The power supply device is arranged in the fixed box and used for providing electric energy for the measuring probe. The electric field sensor is used for collecting the electric field intensity of the low-frequency electromagnetic field near field and generating electric field intensity information. The magnetic field sensor is used for collecting the magnetic induction intensity of the low-frequency electromagnetic field near field and generating magnetic induction intensity information. The information processing device is used for processing the electric field intensity information and the magnetic induction intensity information and generating result information. The shielding layer is used for preventing the power supply device and the information processing device from interfering with the electric field sensor and the magnetic field sensor. The measuring probe provided by the application can solve the problem that the low-frequency electromagnetic field near field measurement in the traditional scheme has large measurement error.
Description
Technical Field
The application relates to the technical field of electromagnetic field measurement, in particular to a measuring probe.
Background
The low-frequency electromagnetic field generally refers to an electromagnetic field with the frequency of 1Hz-100kHz, and the electric field and the magnetic field of the low-frequency electromagnetic field are independent and need to be measured respectively. The near-field measurement of the low-frequency electromagnetic field refers to measurement at a place close to a low-frequency electromagnetic field source, and the field intensity of the near-field of the low-frequency electromagnetic field is in inverse proportion to the distance between a test point and the electromagnetic field source, so that the field intensity of the near-field of the low-frequency electromagnetic field changes violently along with the change of the spatial distance. The size of the electromagnetic field probe and the position of the sensors in the probe have a significant impact on the accuracy of the electromagnetic field measurements.
the existing commonly used low-frequency electromagnetic field measuring probe is a three-axis omnidirectional electric field and magnetic field integrated suspension type probe, and is used for simultaneously testing a low-frequency electric field and a low-frequency magnetic field, an electric field sensor usually adopts a double-sided capacitor plate, and a magnetic field sensor adopts a coil. Because the field intensity is inversely proportional to the distance between a measuring point and a source, when a near field is measured, the electromagnetic field intensity of a near field area changes greatly along with the change of the distance from a radiation source, and the size of a probe and the deviation of the position of a probe sensor relative to the center of the probe can cause that an actual measured value has great deviation from the measured value of an expected measuring point. The conventional low-frequency electromagnetic field measuring probe has the problems that the centers of three orthogonal electric field plates are not coincident and are not coincident with the physical center of the probe, and the centers of three orthogonal magnetic field coils are also not coincident, so that the total field intensity measured by the three orthogonal electric field plates is the total field intensity at the position where the center of the probe is not located. The total field intensity synthesized by the field intensities in different directions at the central points of the three electric field or magnetic field sensors is greatly different from the actual field intensity at the center of the probe, and the accuracy of measuring the near field by using the probe is difficult to ensure
therefore, the problem of large measurement value error of the low-frequency electromagnetic field near-field measurement in the traditional scheme is solved.
SUMMERY OF THE UTILITY MODEL
Therefore, a measuring probe is needed to be provided for solving the problem that the low-frequency electromagnetic field measuring probe in the traditional scheme has large measuring error.
A measurement probe for application in the near field of low frequency electromagnetic fields, comprising:
a fixing box;
The power supply device is arranged inside the fixed box and used for supplying electric energy to the measuring probe;
each electric field sensor is arranged on each surface of the fixed box, and the six electric field sensors are symmetrically arranged relative to the center of the fixed box and are used for collecting the electric field intensity of the low-frequency electromagnetic field near field and generating electric field intensity information;
The six magnetic field sensors are symmetrically arranged relative to the center of the fixed box and are used for collecting the magnetic induction intensity of a low-frequency electromagnetic field near field and generating magnetic induction intensity information;
The information processing device is arranged in the fixed box, is electrically connected with the electric field sensor and the magnetic field sensor and is in signal connection with the electric field sensor and the magnetic field sensor, and is used for processing the electric field intensity information and the magnetic induction intensity information and generating result information;
The shielding layer, set up in the inside of fixed box, just the shielding layer inboard is provided with power supply unit with information processing device, the outside is provided with electric field sensor with magnetic field sensor, the shielding layer ground connection sets up, is used for avoiding power supply unit with information processing device disturbs electric field sensor or magnetic field sensor.
The application provides a measuring probe includes fixed box, power supply unit, electric field sensor, magnetic field sensor, information processing device and shielding layer. The electric field sensor can measure the electric field intensity of three different axial directions in a low-frequency electromagnetic field near-field space and generate electric field intensity information of the three different axial directions. The magnetic field sensor can measure the magnetic induction intensity of three different axial directions in the low-frequency electromagnetic field near-field space and generate the magnetic induction intensity information of the three different axial directions. The electric field sensor and the magnetic field sensor can transmit the electric field strength information and the magnetic induction information to the information processing device, and the information processing device processes the electric field strength information and the magnetic induction information to generate result information. The electric field sensor with the setting of magnetic field sensor can make the result information be the electric field strength information and the magnetic induction intensity information at measuring probe center, and the setting of shielding layer can avoid power supply unit with information processing device disturbs electric field sensor or magnetic field sensor, thereby guarantees measuring probe is at low frequency electromagnetic field near field measurement's data accuracy. The measuring probe provided by the application can solve the problem that a low-frequency electromagnetic field measuring probe in a traditional scheme is large in measuring error.
In one embodiment, each of the electric field sensors comprises:
The outer electric field polar plate is laid on the outer surface of the fixed box, is in signal connection with the information processing device and is used for collecting the electric field intensity of the low-frequency electromagnetic field near field;
And the inner electric field polar plate is laid on the inner surface of the fixed box, is grounded and is in signal connection with the information processing device.
In one embodiment, the magnetic field sensor comprises a multi-turn coil disposed on an inner surface and an outer surface of the retention cartridge and disposed embedded within the retention cartridge.
In one embodiment, the information processing apparatus includes:
The analog circuit board is arranged on the inner side of the shielding layer and is used for processing the electric field strength information and the magnetic induction strength information and generating a digital signal corresponding to the voltage of the electric field and the magnetic field;
and the digital circuit board is arranged on the inner side of the shielding layer and is used for carrying out digital algorithm processing on the digital signal and outputting result information.
In one embodiment, the analog circuit board is provided with:
The electric field conditioning circuit is used for carrying out signal flattening processing on the electric field intensity information and generating a first electric field voltage signal;
The magnetic field conditioning circuit is used for carrying out signal planarization processing on the magnetic induction intensity information and generating a first magnetic field voltage signal;
The analog switch is used for switching the first electric field voltage signal and the first magnetic field voltage signal and transmitting the switched signals in each axial direction one by one;
The variable gain amplifier is used for receiving the switched signal, carrying out gain adjustment on the switched signal and generating a second electric field voltage signal and a second magnetic field voltage signal;
The anti-aliasing filter is used for filtering the second electric field voltage signal and the second magnetic field voltage signal and generating a near-field electric field voltage signal and a near-field magnetic field voltage signal;
And the analog-to-digital converter is used for converting the near-field electric field voltage signal and the near-field magnetic field voltage signal to generate a digital signal.
in one embodiment, the digital circuit board is provided with:
and the data processing unit is used for processing and correcting the digital signal and generating result information.
In one embodiment, the digital circuit board is further provided with:
And the control unit is used for controlling the analog switch and the variable gain amplifier to operate.
In one embodiment, a support rod is further disposed between the fixing box and the shielding layer.
In one embodiment, the electric field sensor and the magnetic field sensor are further connected with a charging interface.
in one embodiment, an information transmission device is further disposed on the measurement probe, and the information transmission device is electrically connected and in signal connection with the information processing device, and is configured to transmit the result information to a terminal device.
In summary, the electric field sensor provided by the present application comprises the outer electric field polar plate and the inner electric field polar plate, and the magnetic field sensor comprises a multi-turn coil. Each magnetic field sensor with every electric field sensor set up in the same face of fixed box, consequently be in same axial electric field sensor with magnetic field sensor can accurately gather the electric field strength information and the magnetic induction intensity information of low frequency electromagnetic field near field. The information processing apparatus includes an analog circuit board and a digital circuit board. The analog circuit board comprises an electric field conditioning circuit, a magnetic field conditioning circuit, an analog switch, a variable gain amplifier and an anti-aliasing filter. The digital circuit board further comprises an analog-to-digital converter and a data processing unit. Therefore, the electric field strength information and the magnetic induction strength information are converted into digital signals by the analog-to-digital converter after being subjected to flattening processing, signal switching and sending, gain adjustment and filtering processing, and the digital signals are processed and corrected by the data processing unit, so that result information is generated. And the result information is the electric field intensity and the magnetic induction intensity of the low-frequency electromagnetic field near-field measuring point. The application provides still be provided with control unit and information transmission device on the measurement probe, the control unit is steerable the operation of simulation circuit board, information transmission device can with the data processing unit generates result information send is to the terminal, makes things convenient for operating personnel to look over. In conclusion, the measuring probe provided by the application can accurately measure the electric field intensity and the magnetic induction intensity of the low-frequency electromagnetic field near field, and solves the problem that the error of the low-frequency electromagnetic field near field measurement in the traditional scheme is large.
Drawings
fig. 1 is a schematic structural diagram of a measurement probe according to an embodiment of the present application.
Fig. 2 is a schematic structural diagram of a measurement probe according to another embodiment of the present application.
Fig. 3 is a schematic flow chart of a measurement method according to an embodiment of the present application.
fig. 4 is a schematic flow chart of a measurement method according to another embodiment of the present application.
Fig. 5 is a schematic flow chart of a measurement method according to another embodiment of the present application.
Description of reference numerals:
Measuring probe 10
Securing box 100
Power supply device 200
Electric field sensor 300
outer electric field plate 310
Inner electric field plate 320
magnetic field sensor 400
Information processing apparatus 500
Analog circuit board 510
Electric field conditioning circuit 511
Magnetic field conditioning circuit 512
Analog switch 513
Variable gain amplifier 514
anti-aliasing filter 515
analog-to-digital converter 516
Digital circuit board 520
Data processing unit 521
Control unit 522
shielding layer 600
Support rod 20
Charging interface 30
Information transmission device 40
Detailed Description
The problem that there is the measured value error big to low frequency electromagnetic field near field measurement in the traditional scheme, consequently this application provides a measuring probe to reduce electric field strength and the magnetic induction intensity measuring error of low frequency electromagnetic field near field.
in order to make the objects, technical solutions and advantages of the present application more apparent, the following describes the measurement probe of the present application in further detail by way of embodiments and with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
the numbering of the components as such, e.g., "first", "second", etc., is used herein only to distinguish the objects as described, and does not have any sequential or technical meaning. The term "connected" and "coupled" when used in this application, unless otherwise indicated, includes both direct and indirect connections (couplings). In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations or positional relationships based on those shown in the drawings, and are used only for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus, are not to be considered as limiting the present application.
in this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
Referring to fig. 1, the present application provides a measuring probe 10, which can be applied to a low-frequency electromagnetic field near field, and includes a fixing case 100, a power supply device 200, an electric field sensor 300, a magnetic field sensor 400, an information processing device 500, and a shielding layer 600.
The fixing box 100 is a box body with a hollow interior, specifically, the box body may be spherical, columnar or other shapes, and specifically, the box body may be selected according to actual needs, which is not limited in the present application. Preferably, the fixing box 100 may be a cube having a hollow inside, including six faces. A plurality of circuits are provided on the fixing case 100 to facilitate electrical connection between the power supply device 200, the electric field sensor 300, the magnetic field sensor 400, the information processing device 500, and the shielding layer 600. Preferably, each surface of the fixing box 100 is formed by stacking PCB (Printed circuit board), and the size, number and shape of the PCB included in each surface may be selected according to actual needs, which is not limited in this application.
The power supply device 200 is disposed inside the fixing box 100, and is used for supplying electric power to the measuring probe 10. The power supply device 200 may be a battery, a lithium battery, a dry battery, or other batteries as long as it can supply power to the measuring probe 10. The method can be selected according to actual needs, and the method is not limited in the application. The position of the power supply device 200 inside the fixing box 100 can be selected according to actual needs as long as the measurement accuracy of the electric field sensor 300 and the magnetic field sensor 400 is not affected. The specific position can be selected according to actual needs, and the application is not limited.
Every electric field sensor set up 300 in every face of fixed box, and six electric field sensor 300 for the central symmetry of fixed box 100 sets up for gather the electric field strength of low frequency electromagnetic field near field, and generate electric field strength information. The electric field sensor 300 is configured to acquire electric field intensity of the low-frequency electromagnetic field near field in each axial direction in a three-dimensional space, where it should be noted that each axial direction is three axial directions perpendicular to each other. The electric field sensor 300 may be a double-sided electric field plate formed by spreading copper on the inner and outer surfaces of the fixing case 100. The size and the shape of the double-sided electric field polar plate can be selected according to actual needs, and the application is not limited. The electric field sensor 300 may also be other devices capable of measuring the electric field intensity, as long as the electric field intensity can be measured, and the application is not limited thereto.
Preferably, the electric field sensor 300 is a double-sided electric field plate. It should be noted that one electric field sensor 300 includes all electric field plates disposed on one surface of the fixed box 100. Preferably, the fixing box 100 is a cube. The cube includes three sets of faces, wherein one set of faces includes two faces symmetrically arranged in parallel with respect to the center of the cassette 100. One surface of the fixing box 100 is provided with one electric field sensor 300, that is, three groups of electric field sensors 300 are arranged on the fixing box 100, and one group of electric field sensors 300 is used for measuring the electric field strength of one axial direction in the low-frequency electromagnetic field near-field space. Specifically, the center of the measurement probe 10 is defined as an origin in a mathematical three-dimensional coordinate system. Then, two electric field sensors 300 in a group of the electric field sensors 300 are symmetrically arranged with respect to the origin, so that the two electric field sensors 300 can measure the average value of the electric field intensity of the near-field low-frequency magnetic field in one axial direction. It is understood that the electric field sensors 300 may not be disposed on the surface of the fixing box 100, and the shape of the fixing box 100 does not affect the measuring direction of each set of the electric field sensors 300 in the three-dimensional space, as long as the electric field sensors 300 can respectively measure the electric field intensity of the low-frequency electromagnetic field in different axial directions in the near-field space. The number of the electric field sensors 300 is an even number, and is defined as at least six.
every magnetic field sensor 400 set up in every face of fixed box 100, six magnetic field sensor 400 for the centrosymmetric setting of fixed box 100 for gather the magnetic induction of low frequency electromagnetic field near field, and generate magnetic induction information. The type of the magnetic field sensor 400 can be selected according to actual needs, and is not limited in this application. Preferably, the magnetic field sensor 400 may be a magnetic field coil, and specifically, the magnetic field sensor 400 is formed by a coil formed by wiring a plurality of turns on the fixing box 100, and the number of turns of the coil may be selected according to actual needs, which is not limited in this application.
it should be noted that one of the magnetic field sensors 400 includes all coils disposed on one surface of the fixed box 100. Preferably, the fixing box 100 is a cube including three sets of faces, wherein one set of faces includes two faces symmetrically arranged in parallel with respect to the center of the fixing box 100. Then, one magnetic field sensor 400 is disposed on one surface of the fixed box 100, that is, three sets of the magnetic field sensors 400 are disposed on the fixed box 100, and one set of the magnetic field sensors 400 measures magnetic induction in one axial direction in the low-frequency electromagnetic field near-field space. Specifically, the center of the measurement probe 10 is defined as an origin in a mathematical three-dimensional coordinate system. Then, two magnetic field sensors of the set of magnetic field sensors 400 are symmetrically disposed with respect to the origin, so that the two magnetic field sensors 400 can measure the average value of the magnetic induction intensity of the near-field low-frequency magnetic field in one axial direction. It is understood that the magnetic field sensors 400 may not be disposed on the surface of the fixing box 100, and the shape of the fixing box 100 does not affect the position setting of each set of the magnetic field sensors 400, as long as the magnetic field sensors 400 can respectively measure the magnetic induction intensities of the low-frequency electromagnetic field in different axial directions perpendicular to the near field. The number of magnetic field sensors 400 is an even number, defining at least six.
The information processing device 500 is disposed inside the fixing case 100, and is electrically and signal-connected to the electric field sensor 300 and the magnetic field sensor 400, for processing the electric field strength information and the magnetic induction information and generating result information. The processing of the electric field strength information and the magnetic induction information by the information processing apparatus 500 includes performing algorithm processing after conditioning, amplifying, filtering, and analog-to-digital converting the electric field strength information and the magnetic induction information.
After conditioning, amplifying, filtering and analog-to-digital converting the electric field strength information, if a pair of electric field strength information for the X axis is represented as E x1 and E x2, a pair of electric field strength information for the Y axis is represented as E y1 and E y2, and a pair of electric field strength information for the Z axis is represented as E z1 and E z2.
further, the information processing apparatus 500 performs arithmetic processing. The algorithm processing refers to performing the following operation programs:
And E is the electric field intensity of the low-frequency electromagnetic field near-field measuring point, namely the result information of the electric field intensity output by the measuring probe.
In this embodiment, the number of the magnetic field sensors 400 is six, and the magnetic induction information in three mutually perpendicular axial directions in the three-dimensional space is measured, the information processing apparatus 500 conditions, amplifies, filters, and performs analog-to-digital conversion on the magnetic induction information, and if a pair of electric field strength information for the X-axis direction is represented as H x1 and H x2, a pair of electric field strength information for the Y-axis direction is represented as H y1 and H y2, and a pair of electric field strength information for the Z-axis direction is represented as H z1 and H z2.
Further, the information processing apparatus 500 performs arithmetic processing. The algorithm processing refers to performing the following operation programs:
and H is the magnetic induction intensity of the low-frequency electromagnetic field near-field measuring point, namely the result information of the magnetic induction intensity output by the measuring probe.
The shielding layer 600 is disposed inside the fixing box 100, the power supply device 200 and the information processing device 500 are disposed inside the shielding layer 600, the electric field sensor 300 and the magnetic field sensor 400 are disposed outside the shielding layer 600, and the shielding layer 600 is grounded and disposed to avoid interference between the power supply device 200 and the information processing device 500 and interference between the electric field sensor 300 and the magnetic field sensor 400. The shielding layer 600 is a metal shielding layer, and the specific material composition of the shielding layer 600 may be selected according to actual needs, which is not limited in the present application. The shape of the shielding layer 600 is required to match the shape of the fixing box 100, and only a lead access is left on the shielding layer 600. The lead lines refer to connection wires between the power supply device 200 and the electric field sensor 300, and the magnetic field sensor 400. The lead wire further includes a connection wire between the information processing device 500 and the electric field sensor 300, and the magnetic field sensor 400. The volume and size of the shielding layer 600 can be selected according to actual needs, as long as the anti-interference function can be realized, and specifically, the volume and size can be selected according to actual needs, which is not limited in the present application.
In summary, the measurement probe 10 provided in this embodiment includes the fixing box 100, the power supply device 200, the electric field sensor 300, the magnetic field sensor 400, the information processing device 500, and the shielding layer 600. The fixing case 100 is provided with a circuit so that the power supply device 200 and the information processing device 500 are electrically and signal-connected to the electric field sensor 300 and the magnetic field sensor 400, respectively. The power supply device 200 can supply power to the information processing device 500. The electric field sensor 300 can collect electric field intensity of low-frequency electromagnetic field near fields in all axial directions perpendicular to each other in a three-dimensional space and generate electric field intensity information. The magnetic field sensor 400 can acquire the magnetic induction intensity of the low-frequency electromagnetic field near field in each axial direction perpendicular to each other in the three-dimensional space and generate the magnetic induction intensity information. The information processing apparatus 500 may process the electric field strength information and the magnetic induction information and generate the result information. The result information is the electric field intensity and the magnetic induction intensity at the central point of the measuring probe 10 when the measuring probe is located at the measuring position. The measuring probe 10 provided by the application can solve the problem that the measurement error of the low-frequency electromagnetic field near-field measurement in the traditional scheme is large.
Referring to fig. 1 and 2, in one embodiment of the present application, each of the electric field sensors 300 includes an outer electric field plate 310 and an inner electric field plate 320. The outer electric field plate 310 is laid on the outer surface of the fixing box 100, and is electrically connected and signal-connected with the information processing device 500, and is used for collecting the electric field intensity of the low-frequency electromagnetic field near field. The outer electric field plate 310 is an electric field plate formed by spreading copper on the outer surface of the fixing box 100, and the size and shape of the outer electric field plate 310 can be selected according to actual needs, which is not limited in the present application. The outer electric field plate 310 is in signal connection with the information processing device 500, so that the collected electric field strength information can be transmitted to the information processing device 500, and the information processing device 500 processes the information to generate the result information of the electric field strength. The inner electric field plate 320 is laid on the inner surface of the fixing box 100, and the inner electric field plate 320 is grounded and is in signal connection with the information processing device 500. Therefore, the information processing device 500 can simultaneously acquire the electric field intensity signals collected by the outer electric field plate 310 and the inner electric field plate 320. The inner side electric field plate 320 is formed by spreading copper on the inner surface of the fixing box 100, and the size and shape of the inner side electric field plate 310 may be selected according to actual needs, which is not limited in this application.
The electric field sensor 300 provided by the present embodiment includes the outer electric field plate 310 and the inner electric field plate 320. The outer electric field plate 310 and the inner electric field plate 320 are both laid on the fixing box 100 and are in signal connection with the information processing device 500. Therefore, the information processing apparatus 500 can receive the electric field strength signals collected by the outer electric field plate 310 and the inner electric field plate 320, and the information processing apparatus 500 can more accurately measure the electric field strength of the measurement point, thereby reducing errors occurring in the measurement process.
Referring to fig. 1, in one embodiment of the present application, the magnetic field sensor 400 includes a multi-turn coil disposed on the inner and outer surfaces of the stationary box 100 and embedded inside the stationary box 100. Specifically, each surface of the fixing box 100 is formed by stacking a plurality of circuit boards, and each circuit board is provided with a plurality of turns of coils. The number of the superimposed layers of the circuit board can be selected according to actual needs, and the application is not limited. One magnetic field sensor 400 and one electric field sensor 300 are disposed on one surface of the set box 100. When the electric field sensor 300 measures the electric field strength of the low-frequency electromagnetic field in one axial direction, the magnetic field sensors 400 located on the same plane can simultaneously measure the magnetic induction strength of the low-frequency electromagnetic field in the same axial direction. The number of coils in the magnetic field sensor 400 can be selected according to actual needs, and is not limited in this application. In this embodiment, each of the magnetic field sensors 400 and each of the electric field sensors 300 are disposed on the same surface of the fixing box 100, so that the magnetic field sensors 400 and the electric field sensors 300 can simultaneously measure the field strength in the same axial direction of the space without position deviation. The magnetic field sensor 400 may select a multi-turn coil to make the measurement of the measurement probe 10 more accurate, thereby reducing measurement errors.
Referring to fig. 1 and 2, in an embodiment of the present application, the information processing apparatus 500 includes an analog circuit board 510 and a digital circuit board 520.
The analog circuit board 510 is disposed inside the shielding layer 600, and is configured to process the electric field strength information and the magnetic induction strength information, and generate a digital signal corresponding to the voltage of the electric field and the magnetic field. Specifically, the analog circuit board 510 is provided with an electric field conditioning circuit 511, a magnetic field conditioning circuit 512, an analog switch 513, a variable gain amplifier 514, an anti-aliasing filter 515, and an analog-to-digital converter 516.
The electric field conditioning circuit 511 is configured to perform information flattening processing on the electric field strength information and generate a first electric field voltage signal. The electric field conditioning circuit 511 is equivalent to an integrating circuit, and is used for balancing the problem of uneven signals caused by the frequency range in the process of collecting the electric field intensity of the electric field sensor 300. It will be appreciated that the measurement probe 10 includes twelve electric field plates, six each of the outer 310 and inner 320 electric field plates. The first electric field voltage signal comprises an electric field voltage signal collected by each of the twelve electric field plates.
The magnetic field conditioning circuit 512 is configured to perform signal planarization on the magnetic induction intensity information and generate a first magnetic field voltage signal. The magnetic field conditioning circuit 512 is equivalent to a differentiating circuit, and is used to balance the problem of uneven signal caused by the frequency range of the magnetic field sensor 400 during the process of acquiring magnetic induction. It is understood that the measuring probe 10 comprises six magnetic field sensors 400, and the first magnetic field voltage signal comprises the magnetic field voltage signal collected by each of the six magnetic field sensors 400.
The analog switch 513 is configured to switch signals acquired by the electric field sensor 300 and the magnetic field sensor 400, and send the switched signals one by one in each axial direction. The kind of the analog switch 513 may be selected according to actual needs, and is not limited in this application. The variable gain amplifier 514 is configured to receive the switched signal, perform gain adjustment on the switched signal, and generate a second electric field voltage signal and a second magnetic field voltage signal. The variable gain amplifier 514 allows the second electric field voltage signal and the second magnetic field voltage signal to be more adaptable to the signal processing procedure of the digital circuit board 520. The kind of the variable gain amplifier 514 can be selected according to actual needs, and is not limited in this application. The anti-aliasing filter 515 performs filtering processing on the second electric field voltage signal and the second magnetic field voltage signal, and generates a near-field electric field voltage signal and a near-field magnetic field voltage signal. The anti-aliasing filter 515 is generally a low-pass filter, and may be selected according to actual needs, which is not limited in this application. The anti-aliasing filter 515 functions to make the signal cleaner and facilitate accurate data acquisition by the digital circuit board 520. The analog-to-digital converter 516 is configured to convert the near-field electric field voltage signal and the near-field magnetic field voltage signal to generate a digital signal. The analog-to-digital converter 516 is a sixteen-bit analog-to-digital converter, which can be specifically selected according to actual needs, and is not limited in this application.
the digital circuit board 520 is disposed inside the shielding layer 600, and is configured to perform mathematical algorithm processing on the digital signal and output result information. The digital signal refers to AD sampling data of the electric and magnetic fields. Specifically, the digital circuit board 520 is provided with a data processing unit 521. The data processing unit 521 is used for processing and modifying the digital signal and generating result information. The digital processing unit 522 processes the digital signal as follows:
If the pair of electric field strength information for the X-axis direction is represented as E x1 and E x2, the pair of electric field strength information for the Y-axis direction is represented as E y1 and E y2, and the pair of electric field strength information for the Z-axis direction is represented as E z1 and E z2, then the data processing unit 521 performs arithmetic processing.
and E is the electric field intensity of the low-frequency electromagnetic field near-field measuring point, namely the result information of the electric field intensity output by the measuring probe.
If a pair of electric field strength information for the X axis direction is represented as H x1 and H x2, a pair of electric field strength information for the Y axis direction is represented as H y1 and H y2, and a pair of electric field strength information for the Z axis direction is represented as H z1 and H z2.
the digital processing unit 522 then performs arithmetic processing. The algorithm processing refers to performing the following operation programs:
and H is the magnetic induction intensity of the low-frequency electromagnetic field near-field measuring point, namely the result information of the magnetic induction intensity output by the measuring probe.
in summary, the information processing apparatus 500 provided in this embodiment includes the analog circuit board 510 and the digital circuit board 520. The analog circuit board 510 includes the electric field conditioning circuit 511, the magnetic field conditioning circuit 512, the analog switch 513, the variable gain amplifier 514, the anti-aliasing filter 515, and the analog-to-digital converter 516. The digital circuit board 520 includes the data processing unit 521. The electric field conditioning circuit 511, the magnetic field conditioning circuit 512, the analog switch 513, the variable gain amplifier 514 and the anti-aliasing filter 515 can make the electric field strength information and the magnetic induction strength information purer and more stable, so that the analog-to-digital converter 516 converts an analog signal into a digital signal, and the data processing unit 521 can perform accurate operation. The information processing device 500 provided in this embodiment can accurately calculate the electric field strength and the magnetic induction strength of the low-frequency electromagnetic field near field, thereby improving the measurement accuracy of the measurement probe 10.
Referring to fig. 1 to 2, in an embodiment of the present application, a support rod 20 is further disposed between the fixing box 100 and the shielding layer 600. The support rods 20 serve to prevent the magnetic field sensor 400 from contacting the shield layer 600. It is understood that, since the electric field sensor 300 and the magnetic field sensor 400 are disposed on the same surface of the fixing case 100, the design of the supporting rod 20 may also prevent the electric field sensor 300 from contacting the shielding layer 600. The material of the support rod 20 can be selected according to actual needs, and the shape of the support rod 20 can be selected, for example, a stud or other shapes, which is not limited in this application. The support rod 20 may fix the shielding layer 600 in the fixing box 100, which may improve the structural stability of the measuring probe 10. When the support rod 20 is made of a metal material, the support rod needs to be grounded, and the grounded arrangement means that the support rod 20 is electrically connected with the ground.
The support rod 20 can keep a certain distance, such as a distance of 1cm, between the magnetic field sensor 400 and the shielding layer 600, so as to avoid measurement errors caused by the influence of the grounding arrangement of the shielding layer 600 on the magnetic field sensor 400. The design of the supporting rod 20 can improve the measurement accuracy of the electric field sensor 300 and the magnetic field sensor 400, and ensure that the shielding layer 600 and the information processing device 500 arranged in the shielding layer 600 operate normally and are not interfered.
Referring to fig. 2, in an embodiment of the present application, a control unit 522 is further disposed on the digital circuit board 520, and the control unit 522 is configured to control the operations of the analog switch 513 and the variable gain amplifier 514. Specifically, the control unit 522 may control the operation of the analog switch 513 according to the test time, for example, control the analog switch 513 to perform signal switching, such as switching to an electric field mode to obtain the electric field strength information of the measurement point or switching to a magnetic field mode to obtain the magnetic induction strength information of the measurement point. The control unit 522 can also control the operation of the variable gain amplifier 514 according to the digital signal, and specifically, an operator can control the amplification degree of the signal by the variable gain amplifier 514 through the control unit 522. In this embodiment, the design of the control unit 522 can increase the flexibility of the measuring probe 10, so that the measuring probe 10 can be conveniently controlled by an operator, thereby enhancing the practicability of the measuring probe 10.
Referring to fig. 2, in an embodiment of the present application, the electric field sensor 300 and the magnetic field sensor 400 are further connected to a charging interface 30. The charging interface 30 is used to electrically connect the power supply device 200, so that the power supply device 200 provides power for the electric field sensor 300 and the magnetic field sensor 400. The charging interface 30 may be disposed on the shielding layer 600, or may be disposed outside or inside the shielding layer 600, and only an access hole for a lead is left on the shielding layer 600. The type of the charging interface 30 may be selected according to actual needs, as long as the power supply device 200 can provide electric energy for the electric field sensor 300 and the magnetic field sensor 400, which is not limited in this application.
Referring to fig. 2, in an embodiment of the present application, an information transmission device 40 is further disposed on the measurement probe 10, and the information transmission device 40 is electrically connected and in signal connection with the information processing device 500, and is configured to transmit the result information to a terminal device. Specifically, the information transmission device 40 is disposed on the shielding layer 600, and is electrically and signal-connected to the data processing unit 521. Accordingly, the information transmission apparatus 40 can acquire the result information from the data processing unit 521 and transmit the result information to a terminal device. The information transmission device 40 may be a micro antenna, an optical fiber, or other information transmission device, as long as the information transmission function can be realized, which may be specifically selected according to actual situations, and the present application is not limited thereto. The information transmission device 40 provided in this embodiment can facilitate the staff to check and monitor the result information, and also facilitate the staff to find whether the measurement probe 10 is faulty or not in time, or whether an abnormality occurs at the measurement point of the low-frequency electromagnetic field near field. The arrangement of the information transmission device 40 can therefore improve the safety of the measuring probe 10 and increase the practicability of the measuring probe 10.
In summary, the electric field sensor 300 provided by the present application includes the outer electric field plate 310 and the inner electric field plate 320, and the magnetic field sensor 400 includes a multi-turn coil. The electric field sensor 300 and the magnetic field sensor 400 can accurately acquire electric field strength information and magnetic induction information of a low-frequency electromagnetic field near field. The information processing apparatus 500 includes the analog circuit board 510 and the digital circuit board 520. The analog circuit board 510 in turn comprises the electric field conditioning circuit 511, the magnetic field conditioning circuit 512, the analog switch 513, the variable gain amplifier 514, the anti-aliasing filter 515, and the analog-to-digital converter 516. The digital circuit board 520 in turn comprises the data processing unit 521. Therefore, the electric field strength information and the magnetic induction strength information are subjected to flattening processing, signal switching and transmission, gain adjustment, and filtering processing, and then are converted into digital signals by the analog-to-digital converter, and the digital signals are processed and corrected by the data processing unit 521, so that result information is generated. And the result information is the electric field intensity and the magnetic induction intensity of the low-frequency electromagnetic field near-field measuring point. The application provides still be provided with control unit 522 and information transmission device 40 on the measuring probe 10, control unit 522 is steerable analog circuit board 510 moves, information transmission device 40 can with the data processing unit 521 generates result information sends to the terminal, makes things convenient for operating personnel to look over. In conclusion, the measuring probe 10 provided by the application can accurately measure the electric field intensity and the magnetic induction intensity of the low-frequency electromagnetic field near field, and solves the problem of large error in the low-frequency electromagnetic field near field measurement in the conventional scheme.
Referring to fig. 3, an embodiment of the present application further provides a method for measuring using the measurement probe 10, the method being applied to a low-frequency electromagnetic field near field, and including:
s100, measuring electric field intensities in three different axial directions of a near field space, and generating electric field intensity information;
S200, measuring magnetic induction intensities in three different axial directions of a near-field space, and generating magnetic induction intensity information;
and S300, processing the electric field intensity information and the magnetic induction intensity information to generate result information.
In S100, the electric field sensor 300 is used to collect the electric field strength near the low-frequency electromagnetic field and generate electric field strength information. In step S200, the magnetic field sensor 400 is used to collect magnetic induction near the low-frequency electromagnetic field and generate magnetic induction information. In S300, the information processing device 500 processes the electric field strength information and the magnetic induction information to generate result information. In the method for measuring using the measuring probe 10 provided in this embodiment, the electric field sensor 300 and the magnetic field sensor 400 are disposed on the same surface of the fixing box 100, and the electric field strength information and the magnetic induction strength information of three different axial directions of the low-frequency electromagnetic field near-field space can be measured at the same time. And the power supply device 200 and the information processing device 500 do not interfere with the normal operation of the electric field sensor 300 and the magnetic field sensor 400, so that the electric field strength and the magnetic induction strength of the low-frequency electromagnetic field near field can be accurately measured. The method provided by the embodiment can solve the problem of large measurement error in the low-frequency electromagnetic field near-field measurement in the conventional scheme.
referring to fig. 4 and 5, in an embodiment of the present application, the S300 includes:
S310, adjusting the electric field intensity information and the magnetic induction intensity information, and generating a near-field electric field voltage signal and a near-field magnetic field voltage signal;
S320, converting the near-field electric field voltage signal and the near-field magnetic field voltage signal into digital signals;
s330, processing and correcting the digital signal, and outputting result information.
Wherein the S310 includes:
s311, performing signal flattening processing on the electric field intensity information and generating a first electric field voltage signal;
S312, switching the electric field voltage signals and sending the switched signals one by one through each axis;
S313, receiving the switched signal, performing gain adjustment on the switched signal, and generating a second electric field voltage signal;
S314, performing filtering processing on the second electric field voltage signal and the second magnetic field voltage signal, and generating a near-field electric field voltage signal and a near-field magnetic field voltage signal.
In S310, in S311, the electric field intensity information is subjected to signal flattening processing by the electric field conditioning circuit 511, and a first electric field voltage signal is generated. The electric field conditioning circuit 511 is equivalent to an integrating circuit, and is used for balancing the problem of uneven signals caused by the frequency range in the process of collecting the electric field intensity of the electric field sensor 300. The measuring probe 10 includes twelve electric field plates, wherein the number of the outer electric field plates 310 and the number of the inner electric field plates 320 are six. The first electric field voltage signal comprises an electric field voltage signal collected by each of the twelve electric field plates.
S321 is to switch the signals collected by the electric field sensor 300 through the analog switch 513, and transmit the switched signals in each axial direction one by one. The operator can control the analog switch 513 to switch signals through the control unit 522.
The step S313 is to receive the switched signal through the variable gain amplifier 514, perform gain adjustment on the switched signal, and generate a second electric field voltage signal. So that the second electric field voltage signal and the second magnetic field voltage signal are more suitable for the signal processing procedure of the digital circuit board 520.
the step S314 is to perform filtering processing on the second electric field voltage signal and the second magnetic field voltage signal through the anti-aliasing filter 515, and generate a near-field electric field voltage signal and a near-field magnetic field voltage signal. The S314 may make the signal more pure, so as to facilitate accurate data acquisition by the digital circuit board 520.
In step S320, the analog-to-digital converter 516 converts the near-field electric field voltage signal and the near-field magnetic field voltage signal to generate a digital signal. The S330 is to process and modify the digital signal through the data processing unit 521, and generate result information.
the method provided by this embodiment includes step S310, adjusting the electric field strength information and the magnetic induction strength information, and generating a near-field electric field voltage signal and a near-field magnetic field voltage signal; the S320, converting the near-field electric field voltage signal and the near-field magnetic field voltage signal into digital signals; and the step S330, processing and correcting the digital signal, and outputting result information. The method can perform flattening processing, one-by-one sending, gain adjustment and filtering processing on the electric field strength information measured by the electric field sensor 300, and further perform analog-to-digital conversion and data calculation processing, so that the electric field strength data of the low-frequency electromagnetic field near field measured by the measuring probe 10 is more accurate and has smaller error.
In summary, the measurement probe 10 provided by the present application can solve the problem of large error in the low frequency electromagnetic field near field measurement in the conventional scheme.
the technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A measurement probe applicable to a low frequency electromagnetic field near field, comprising:
A stationary box (100);
The power supply device (200) is arranged inside the fixed box (100) and is used for supplying electric energy to the measuring probe (10);
the electric field sensors (300) are arranged on each surface of the fixed box (100), and the six electric field sensors (300) are symmetrically arranged relative to the center of the fixed box (100) and are used for collecting the electric field intensity of a low-frequency electromagnetic field near field and generating electric field intensity information;
The magnetic field sensors (400) are arranged on each surface of the fixed box (100), and the six magnetic field sensors (400) are symmetrically arranged relative to the center of the fixed box (100) and are used for acquiring the magnetic induction intensity of a low-frequency electromagnetic field near field and generating magnetic induction intensity information;
An information processing device (500) disposed inside the fixing case (100), electrically and signal-connected to the electric field sensor (300) and the magnetic field sensor (400), for processing the electric field strength information and the magnetic induction intensity information and generating result information;
Shielding layer (600), set up in the inside of fixed box (100), just shielding layer (600) inboard is provided with power supply unit (200) with information processing apparatus (500), the outside is provided with electric field sensor (300) with magnetic field sensor (400), shielding layer (600) ground connection sets up, is used for avoiding power supply unit (200) with information processing apparatus (500) interference electric field sensor (300) or magnetic field sensor (400).
2. the measurement probe according to claim 1, wherein each of the electric field sensors (300) comprises:
The outer electric field polar plate (310) is laid on the outer surface of the fixed box (100), is in signal connection with the information processing device (500), and is used for collecting the electric field intensity of the low-frequency electromagnetic field near field;
And the inner electric field polar plate (320) is laid on the inner surface of the fixed box (100), and the inner electric field polar plate (320) is grounded and is in signal connection with the information processing device (500).
3. The measurement probe according to claim 2, wherein the magnetic field sensor (400) comprises a multi-turn coil provided on the inner and outer surfaces of the fixture box (100) and embedded inside the fixture box (100).
4. the measurement probe according to claim 1, wherein the information processing device (500) comprises:
The analog circuit board (510) is arranged on the inner side of the shielding layer (600) and is used for processing the electric field intensity information and the magnetic induction intensity information and generating a digital signal corresponding to the voltage of the electric field and the magnetic field;
and the digital circuit board (520) is arranged on the inner side of the shielding layer (600) and is used for carrying out digital algorithm processing on the digital signal and outputting result information.
5. The measurement probe according to claim 4, wherein the analog circuit board (510) has disposed thereon:
An electric field conditioning circuit (511) for performing signal flattening processing on the electric field strength information and generating a first electric field voltage signal;
The magnetic field conditioning circuit (512) is used for carrying out signal flattening processing on the magnetic induction intensity information and generating a first magnetic field voltage signal;
the analog switch (513) is used for switching the first electric field voltage signal and the first magnetic field voltage signal and sending the switched signals in each axial direction one by one;
A variable gain amplifier (514) for receiving the switched signal, gain adjusting the switched signal, and generating a second electric field voltage signal and a second magnetic field voltage signal;
An anti-aliasing filter (515) that performs filtering processing on the second electric field voltage signal and the second magnetic field voltage signal and generates a near-field electric field voltage signal and a near-field magnetic field voltage signal;
and the analog-to-digital converter (516) is used for converting the near-field electric field voltage signal and the near-field magnetic field voltage signal to generate a digital signal.
6. the measurement probe according to claim 5, wherein the digital circuit board (520) has disposed thereon:
A data processing unit (521) for processing and modifying the digital signal and generating result information.
7. The measurement probe according to claim 6, wherein the digital circuit board (520) further has disposed thereon:
A control unit (522) for controlling the operation of the analog switch (513) and the variable gain amplifier (514).
8. the measurement probe according to claim 1, wherein a support bar (20) is further provided between the fixing case (100) and the shielding layer (600).
9. The measurement probe according to claim 1, wherein a charging interface (30) is further connected to the electric field sensor (300) and the magnetic field sensor (400).
10. The measurement probe according to claim 1, characterized in that an information transmission device (40) is further provided on the measurement probe (10), the information transmission device (40) being electrically and signal connected with the information processing device (500) for transmitting the result information to a terminal device.
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| CN201920145039.0U CN209764955U (en) | 2019-01-28 | 2019-01-28 | measuring probe |
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| CN201920145039.0U CN209764955U (en) | 2019-01-28 | 2019-01-28 | measuring probe |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109856466A (en) * | 2019-01-28 | 2019-06-07 | 深圳供电局有限公司 | measuring probe and measuring method thereof |
| CN112698111A (en) * | 2020-12-14 | 2021-04-23 | 佛山科学技术学院 | Movable three-dimensional electromagnetic field measuring device |
| WO2022196573A1 (en) * | 2021-03-15 | 2022-09-22 | パナソニックＩｐマネジメント株式会社 | Measurement device and measurement method |
| JP7515090B2 (en) | 2021-03-15 | 2024-07-12 | パナソニックＩｐマネジメント株式会社 | Measuring device and measuring method |
-
2019
- 2019-01-28 CN CN201920145039.0U patent/CN209764955U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109856466A (en) * | 2019-01-28 | 2019-06-07 | 深圳供电局有限公司 | measuring probe and measuring method thereof |
| CN112698111A (en) * | 2020-12-14 | 2021-04-23 | 佛山科学技术学院 | Movable three-dimensional electromagnetic field measuring device |
| CN112698111B (en) * | 2020-12-14 | 2023-09-26 | 佛山科学技术学院 | Movable three-dimensional electromagnetic field measuring device |
| WO2022196573A1 (en) * | 2021-03-15 | 2022-09-22 | パナソニックＩｐマネジメント株式会社 | Measurement device and measurement method |
| JP7515090B2 (en) | 2021-03-15 | 2024-07-12 | パナソニックＩｐマネジメント株式会社 | Measuring device and measuring method |
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