CN209606540U - Electronic component temperature comprehensive testing device - Google Patents

Electronic component temperature comprehensive testing device Download PDF

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Publication number
CN209606540U
CN209606540U CN201920229792.8U CN201920229792U CN209606540U CN 209606540 U CN209606540 U CN 209606540U CN 201920229792 U CN201920229792 U CN 201920229792U CN 209606540 U CN209606540 U CN 209606540U
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China
Prior art keywords
electronic component
test
board
main platform
temperature
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CN201920229792.8U
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Chinese (zh)
Inventor
周书宇
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
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Abstract

The utility model relates to the technical field of electronic component manufacturing and discloses an electronic component temperature comprehensive testing device, which comprises a testing frame, a testing board, a heating component and a testing component, wherein the testing frame is provided with a main platform, the testing board is arranged on the main platform, and the testing board is provided with an installation area for installing electronic components; the heating assembly is fixedly arranged below the main platform, corresponds to the mounting area in position and is used for heating the electronic components in the mounting area; the test assembly is connected with the test board and used for detecting the temperature value of the electronic component on the test board in real time. The heating element who will be used for carrying out the heating to electronic components fixes the below at the main platform of test jig, can directly heat the electronic components who surveys in the inboard of survey on the main platform, and then carries out temperature rise test and overheat protection test, and whole process does not need the manual work to grip the heating element heating, has reduced the error that manual operation brought.

Description

The temperature integrated test device of electronic component
Technical field
The utility model relates to electronic component manufacturing technology field more particularly to a kind of temperature integrated surveys of electronic component Trial assembly is set.
Background technique
Include that temperature rise test and overheating protection are tested in the temperature integrated test of electronic component, is that electronic component must be surveyed Project.Temperature rise test refers to the degree of heat and state that detection device works under full load condition, and logger temperature rise process is simultaneously Matched curve, the basic reference for board temperature design.Overheating protection test is the device detected in the course of work, improves it The defencive function that temperature and while reaching a certain value start, needs to obtain its overheating protection point and protection curve, the function be in order to When the temperature is excessively high, output can be closed in time, and load circuit is damaged to avoid because of high temperature, is caused the accident.
Currently, existing test method is tested in temperature rise are as follows: the device of tape test is welded in homemade test board, device is made Part is operated at full capacity, and is carried out temperature measurement using infrared radiation thermometer or thermocouple and moisture recorder over time, is passed through The artificial current measurement temperature of continual reading, and confirm the degree of heat and state of its work, stop until temperature is relatively stable Only measure.Overheating protection tests existing test method are as follows: under device full load situation, in the bottom of test board device under test Manual mode Mobile hot air rifle is heated, and using infrared radiation thermometer or passes through thermocouple and moisture recorder reading device surface Temperature read real time temperature at once when device carries out overheating protection state, that is, obtain the overheating protection temperature of device.
It requires to introduce a large amount of manual operation in both the above test item, efficiency is lower, grasps at high temperature for a long time Make to be easy error, and the heating of manual operation heat gun is extremely inconvenient in overheating protection test, it is a large amount of artificial indefinite to introduce Factor also needs two people to cooperate under normal circumstances, and heating is more simple and crude with thermometric mode, and there are biggish errors.
In addition, there are also a kind of testing schemes at present, using the higher high/low temperature experimental box of precision, mainly pass through whole plate Heating obtains test temperature, and when experiment needs to consider the resistance to temperature value of other devices, there are more limitation, and thermocycling Case is mostly desktop type, and volume is larger, and adaptation board is few, mobile inconvenient and at high cost.
Utility model content
The purpose of the utility model embodiment is: providing a kind of temperature integrated test device of electronic component, structure Simply, testing efficiency is high, and precision is quasi-.
For this purpose, the utility model embodiment uses following technical scheme:
A kind of temperature integrated test device of electronic component is provided, comprising:
Testing jig, the testing jig are equipped with main platform;
Test board is mounted on the main platform, and the test board is equipped with the installing zone for installing electronic component;
Heating component is fixed at below the main platform, and corresponding with the installation zone position, for the peace The electronic component in dress area is heated;
Test suite is connect with the test board, for detecting the electronics member device on the test board in real time The temperature value of part.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, it is provided on the main platform for solid The locating part of the fixed test board.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the locating part is positive stop spring plate, institute The one end for stating positive stop spring plate is fixed, and the test board is pushed against on the main platform by the other end.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the test suite includes temperature sensing Device, temperature acquisition equipment and oscillograph, the temperature sensor are separately connected the test board and the temperature acquisition equipment, The temperature acquisition equipment connects the oscillograph.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, it is provided with below the main platform auxiliary Platform is helped, the heating component is arranged on the assistance platform.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the heating component include heat gun and Heat gun fixture, the heat gun fixture are fixed on the assistance platform, and the heat gun can by the heat gun fixture Dismantling connection.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the main platform is far from the heating group The side of part is provided with cover board, has the accommodating chamber for accommodating the test board between the cover board and the main platform.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the cover board is hinged on the main platform On, the cover board can rotate around articulated position and be selectively located at closed position and open position, when the cover board is positioned at described When closed position, the test board is enclosed in the accommodating chamber by the cover board, when the cover board is located at open position, institute It is exposed to state test board.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the cover board is transparent cover plate.
As a kind of preferred embodiment of the temperature integrated test device of electronic component, the testing jig is equipped with easy to carry Handle.
Having the beneficial effect that for the utility model embodiment will be used to fix the heating component that electronic component heats In the lower section of the main platform of testing jig, directly the electronic component in the test board on main platform can be heated, in turn Temperature rise test and overheating protection test are carried out, whole process does not need manually to hold heating component heating, significantly reduces people Work operates bring error, and main platform can be supported test board, also not need artificial fixation, and it is difficult to reduce operation Degree, improves detection speed and precision.
Detailed description of the invention
The utility model is described in further detail below according to drawings and examples.
Fig. 1 is the stereoscopic schematic diagram of the temperature integrated test device of electronic component of the utility model.
In figure:
1, testing jig;11, main platform;12, positive stop spring plate;13, assistance platform;14, cover board;15, handle;2, test board; 3, heating component;31, heat gun;32, heat gun fixture;4, electronic component;5, the first terminals subgroup;6, the second terminals Subgroup;7, p-wire.
Specific embodiment
The technical issues of to solve the utility model, the technical solution of use and the technical effect that reaches are clearer, It is described in further detail below in conjunction with technical solution of the attached drawing to the utility model embodiment, it is clear that described reality Applying example is only the utility model a part of the embodiment, instead of all the embodiments.Based on the embodiments of the present invention, It is practical new to belong to this for those skilled in the art's every other embodiment obtained without creative efforts The range of type protection.
In the description of the present invention, unless otherwise clearly defined and limited, term " connected ", " connection ", " Gu It is fixed " it shall be understood in a broad sense, for example, it may be being fixedly connected, it may be a detachable connection, or integral;It can be mechanical connect It connects, is also possible to be electrically connected;It can be directly connected, can also can be in two elements indirectly connected through an intermediary The interaction relationship of the connection in portion or two elements.For the ordinary skill in the art, it can be managed with concrete condition Solve the concrete meaning of above-mentioned term in the present invention.
In the present invention unless specifically defined or limited otherwise, fisrt feature the "upper" of second feature or it "lower" may include that the first and second features directly contact, and also may include that the first and second features are not direct contacts but lead to Cross the other characterisation contact between them.Moreover, fisrt feature includes above the second feature " above ", " above " and " above " One feature is right above second feature and oblique upper, or is merely representative of first feature horizontal height higher than second feature.First is special Sign is directly below and diagonally below the second feature including fisrt feature under the second feature " below ", " below " and " below ", or only Indicate that first feature horizontal height is less than second feature.
As shown in Figure 1, the temperature integrated test device of electronic component provided by the embodiment of the utility model, is used for electricity Sub- component 4 carries out temperature rise test and overheating protection test automatically, and the temperature integrated test device of electronic component includes testing jig 1, test board 2, heating component 3 and test suite, wherein testing jig 1 is equipped with main platform 11, and test board 2 is mounted on main platform 11 On, test board 2 is equipped with the installing zone for installing electronic component 4, and heating component 3 is fixed at main 11 lower section of platform, And it is corresponding with installation zone position, for being heated to the electronic component 4 in installing zone;Test suite is connect with test board 2, For detecting the temperature value of the electronic component 4 on test board 2 in real time.By be used to heat electronic component 4 Heating component 3 is fixed on the lower section of the main platform 11 of testing jig 1, can be directly to the electronics in the test board 2 on main platform 11 Component 4 is heated, and then carries out temperature rise test and overheating protection test, and whole process does not need manually to hold heating component 3 heating, significantly reduce manual operation bring error, and main platform 11 can be supported test board 2, also be not required to It manually to fix, reduce operation difficulty, improve detection speed and precision.
In the present embodiment, test suite includes including temperature sensor, temperature acquisition equipment and oscillograph, and temperature passes Sensor is separately connected test board 2 and temperature acquisition equipment, and temperature acquisition equipment connects oscillograph.Temperature sensor can be in real time Detect the temperature of electronic component 4, and temperature acquisition equipment can be acquired the temperature of temperature sensor detected And it is fitted temperature curve, oscillograph can detecte electric signal when triggering overheating protection, convenient for detecting electronics at this time The temperature of component 4, and then realize accurate overheating protection test.Preferably, temperature sensor is high sampling rate thermocouple, this Thermocouple measuring temperature, temperature acquisition is fast, and interval time is short, can effectively promote the accuracy of test.
Optionally, two groups of connecting terminals, respectively the first terminals subgroup 5 and the second terminals are provided on main platform 11 Subgroup 6, the first terminals subgroup 5 and the second terminals subgroup 6 are electrically connected test board 2, with the electronics member device on test board 2 Part 4 is electrically connected.First terminals subgroup 5 connects positive pole and input signal end, and the second 6 groups of terminals subgroup connection power supply is negative Pole and output signal line, output signal line connecting test component.By the way that integrated terminals subgroup is arranged, can replace crisscross multiple Miscellaneous line, it is only necessary to which several p-wires 7 can be realized signal transmission and conduct, and reduce by test device bring error.
In a preferred embodiment of the utility model, the limit for fixing test board 2 is provided on main platform 11 Position part.By the way that locating part is arranged, test board 2 can be fixed on to the designated position of main platform 11, prevent test board 2 from detecting It is mobile that position occurs in journey, promotes detection accuracy.
Optionally, locating part is positive stop spring plate 12, and one end of positive stop spring plate 12 is fixed, and test board 2 is pushed against by the other end On main platform 11.The elastic force that positive stop spring plate 12 can use itself compresses test board 2, to realize to test board 2 It is fixed.
In the present embodiment, test board 2 is square, and there are four positive stop spring plate 12, four limit bullets for setting on main platform 11 Piece 12 sets up the corner location in test board 2 separately.
Optionally, 12 one end of positive stop spring plate opens up fixation hole, and stop screw passes through fixation hole and is fixed on positive stop spring plate 12 On main platform 11, positive stop spring plate 12 can be rotated along the axis of stop screw, this design can will limit bullet when installing test board 2 The rotation of piece 12 prevents positive stop spring plate 12 from stopping to test board 2 to other positions.
In other embodiments, it can also be concavely provided with installation cavity in main platform 11, test board 2 is arranged in installation cavity. Installation cavity be can use to 2 position restriction of test board, reduce dismounting difficulty.It is of course also possible to use positive stop spring plate 12 and installation The structure of chamber combination promotes limit effect to the position restriction of test board 2.
In another preferred embodiment of the utility model, the installing zone that test board 2 is corresponded on main platform 11 is opened up There are through-hole, the heating of 3 face through-hole of heating component.This design can reduce thermal loss when heating component 3 heats, and then be promoted Heating efficiency.
Shape of through holes is unlimited, can be round, rectangular or polygon, it is only necessary to which the size of through-hole is greater than the ruler of installing zone It is very little, it is convenient for homogeneous heating, while the size of through-hole will design the size less than test board 2, to reduce the fixed difficult of test board 2 Degree.
In another preferred embodiment of the utility model, the lower section of main platform 11 is provided with assistance platform 13, adds Hot component 3 is arranged on assistance platform 13.
In the present embodiment, heating component 3 includes heat gun 31 and heat gun fixture 32, and heat gun fixture 32 is fixed on auxiliary It helps on platform 13, heat gun 31 is detachably connected by heat gun fixture 32.Heat gun 31 detachably connects with heat gun fixture 32 It connects, can according to need and replace different heat guns 31, promote the temperature integrated test device of electronic component of the utility model Versatility.
Optionally, heat gun 31 can move along the vertical direction, and selectivity is close or far from main platform 11.This design can be with Heat gun 31 is conveniently adjusted at a distance from main platform 11, guarantees suitable heating distance, promotes the accuracy of test.
In one embodiment, main platform 11 is provided with cover board 14 far from the side of heating component 3, cover board 14 and main platform 11 it Between have accommodate test board 2 accommodating chamber.By the way that cover board 14 is arranged, the accommodating chamber formed between cover board 14 and main platform 11 can be with A closed test environment is provided for test board 2, makes to measure the use environment closer to electronic component 4, and then promoted The accuracy of data.
Optionally, cover board 14 is hinged on main platform 11, and cover board 14 can rotate around articulated position and be selectively located at closure Position and open position, when cover board 14 is located at closed position, test board 2 is enclosed in accommodating chamber by cover board 14, when cover board 14 When positioned at open position, test board 2 is exposed.The cover board 14 of radial type can reduce operation in order to the opening and closing of cover board 14 Difficulty.
For the ease of the test process inside observation, cover board 14 can be designed as transparent cover plate.
In another embodiment, testing jig 1 is equipped with handle 15 easy to carry.It can be in order to entire by setting handle 15 The movement of test device.
Optionally, wheel is arranged in the bottom of testing jig 1.By the way that wheel is arranged, test device movement can be pushed directly on, more Add it is easy to remove, while in order to prevent test device it is mobile in place after move again, or move during the test It is dynamic, brake is provided on wheel.
For testing current limiting switch device, overheating protection test is carried out to it, the course of work is as follows:
Step S10, current limiting switch device is welded on test board 2;
Step S20, cover board 14 is opened, is installed on the heat gun fixture 32 on heat gun 31 to assistance platform 13;
Step S30, the temperature integrated test device of entire electronic component is placed into and is easily attached power supply and test suite Position;
Step S40, fixed using four positive stop spring plates 12 by test board 2;
Step S50, positive pole and power cathode access the terminals subgroup on main platform 11, wiring by p-wire 7 Terminal group connecting test plate 2 and test suite;
Step S60, cover board 14 is closed, heat gun 31 is opened, heat gun 31 carries out the current limiting switch device on test board 2 Heating, to carry out overheating protection test.
In the description of this article, it is to be understood that term " on ", "lower", " right side ", etc. orientation or positional relationships be based on Orientation or positional relationship shown in the drawings is merely for convenience of description and simplification and operates, rather than the dress of indication or suggestion meaning It sets or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as to the utility model Limitation.In addition, term " first ", " second ", are only used to distinguish between description, have no special meaning.
In the description of this specification, the description of reference term " embodiment ", " example " etc. means to combine the embodiment Or example particular features, structures, materials, or characteristics described are contained at least one embodiment or example of the utility model In.In the present specification, schematic expression of the above terms may not refer to the same embodiment or example.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped Containing an independent technical solution, this narrating mode of specification be only be to understand device, those skilled in the art should It considers the specification as a whole, the technical solutions in the embodiments can also be appropriately combined, and forming those skilled in the art can With the other embodiments of understanding.
Technical principle of the utility model has been described above with reference to specific embodiments.These descriptions are intended merely to explain this reality With novel principle, and it cannot be construed to the limitation to scope of protection of the utility model in any way.Based on the explanation herein, Those skilled in the art, which does not need to pay for creative labor, can associate with other specific implementation modes of this utility model, These modes are fallen within the protection scope of the utility model.

Claims (10)

1. a kind of temperature integrated test device of electronic component characterized by comprising
Testing jig, the testing jig are equipped with main platform;
Test board is mounted on the main platform, and the test board is equipped with the installing zone for installing electronic component;
Heating component is fixed at below the main platform, and corresponding with the installation zone position, for the installing zone The interior electronic component is heated;
Test suite is connect with the test board, for detecting the electronic component on the test board in real time Temperature value.
2. the temperature integrated test device of electronic component according to claim 1, which is characterized in that set on the main platform It is equipped with the locating part for fixing the test board.
3. the temperature integrated test device of electronic component according to claim 2, which is characterized in that the locating part is limited Position elastic slice, one end of the positive stop spring plate are fixed, and the test board is pushed against on the main platform by the other end.
4. the temperature integrated test device of electronic component according to claim 1, which is characterized in that the test suite packet Temperature sensor, temperature acquisition equipment and oscillograph are included, the temperature sensor is separately connected the test board and the temperature Degree acquisition equipment, the temperature acquisition equipment connect the oscillograph.
5. the temperature integrated test device of electronic component according to claim 1, which is characterized in that under the main platform Side is provided with assistance platform, and the heating component is arranged on the assistance platform.
6. the temperature integrated test device of electronic component according to claim 5, which is characterized in that the heating component packet Heat gun and heat gun fixture are included, the heat gun fixture is fixed on the assistance platform, and the heat gun passes through the heat Air pressure gun fixture is detachably connected.
7. the temperature integrated test device of electronic component according to any one of claims 1 to 6, which is characterized in that described Main platform is provided with cover board far from the side of the heating component, has between the cover board and the main platform and accommodates the survey The accommodating chamber of test plate (panel).
8. the temperature integrated test device of electronic component according to claim 7, which is characterized in that the cover board is hinged on On the main platform, the cover board can rotate around articulated position and be selectively located at closed position and open position, when the lid When plate is located at the closed position, the test board is enclosed in the accommodating chamber by the cover board, is beaten when the cover board is located at When open position, the test board is exposed.
9. the temperature integrated test device of electronic component according to claim 8, the cover board is transparent cover plate.
10. the temperature integrated test device of electronic component according to any one of claims 1 to 6, which is characterized in that described Testing jig is equipped with handle easy to carry.
CN201920229792.8U 2019-02-20 2019-02-20 Electronic component temperature comprehensive testing device Active CN209606540U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920229792.8U CN209606540U (en) 2019-02-20 2019-02-20 Electronic component temperature comprehensive testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920229792.8U CN209606540U (en) 2019-02-20 2019-02-20 Electronic component temperature comprehensive testing device

Publications (1)

Publication Number Publication Date
CN209606540U true CN209606540U (en) 2019-11-08

Family

ID=68402907

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920229792.8U Active CN209606540U (en) 2019-02-20 2019-02-20 Electronic component temperature comprehensive testing device

Country Status (1)

Country Link
CN (1) CN209606540U (en)

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