CN209542785U - A kind of test device of radio circuit - Google Patents
A kind of test device of radio circuit Download PDFInfo
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- CN209542785U CN209542785U CN201822276190.6U CN201822276190U CN209542785U CN 209542785 U CN209542785 U CN 209542785U CN 201822276190 U CN201822276190 U CN 201822276190U CN 209542785 U CN209542785 U CN 209542785U
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- bearing column
- radio circuit
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Abstract
A kind of test device of radio circuit mainly includes microscope carrier, elevating mechanism, adjustment mechanism and pedestal.Wherein, microscope carrier is for placing radio circuit；Elevating mechanism includes vertically disposed Bearing column and the test board with Bearing column clearance fit, test board is located at the top of microscope carrier and is vertically moved up or down along Bearing column, test board is equipped with SMA high frequency connectors, and SMA high frequency connectors are used to the radio circuit being connected to a test equipment；Adjustment mechanism is set to the top of Bearing column, is connect by a connecting rod with test board, for adjusting the lifting position of test board；Microscope carrier and Bearing column are each attached on pedestal.Contact condition of this test device due to controlling SMA high frequency connectors and radio circuit by elevating mechanism and adjustment mechanism, so that the test process of radio circuit is simplified, the inconvenient situation of previous soldered wires is avoided, conducive to the testing efficiency for improving radio circuit.
Description
Technical field
The present invention relates to radio circuits, and in particular to a kind of test device of radio circuit.
Background technique
It is different from common low-frequency channel in the characteristic of electronic technology field, radio circuit, main cause is in high frequency item
Under part, the characteristic of circuit is different under low frequency condition, and the influence of stray capacitance and stray inductance to circuit is very big, wherein spuious
Inductance is present in conducting wire connection and the existing internal self-induction of component itself, stray capacitance be present between the conductor of circuit and
Between component and ground.
In general, radio circuit can have skin effect at work, unlike direct current, electric current exists under DC condition
It is flowed in entire conductor, and electric current is flowed in conductive surface under high frequency condition, as a result, the AC resistance of high frequency is greater than
D.C. resistance.In addition, another problem of radio circuit is electromagnetic radiation effect, with the increase of frequency, circuit can become one
At this moment a radiator between circuit, can generate various coupling effects between circuit and external environment, thus can draw many
Interference problem, these problems are often unimportant under low-frequency channel.
Just because of the particularity of radio circuit, so that can not be using the general of sonde-type when testing radio circuit
Logical test device.For example, when testing radio frequency circuit board using probe in tooling there is impedance mismatch, probe in one
Test can shorten the length of test cable line shielding stratum reticulare, improve the impedance of entire test macro, cause test result inaccurate；
There is shield effectiveness difference in the two, probe test can inevitably shorten shielding stratum reticulare, cause part signal by outer
Boundary's interference also results in test result inaccuracy so that the shield effectiveness of entire test macro weakens.Therefore, sonde-type is utilized
There are the insecure drawbacks of test result when test device tests radio circuit.
Currently, when industrially testing radio circuit, often by radio frequency electrical by the way of radio-frequency cable welding
Road is connected to test equipment, enhances the anti-interference ability in radio circuit and signals transmission with this, improves radio frequency electrical
The stablizing effect of road test process.But this test situation there is also some problems: (1) weldering of welding equipment radio-frequency joint cable
A minimum of 3 thermal histories of disk, i.e. welding equipment radio-frequency joint cable remove radio-frequency joint cable, welding component, so repeatedly hot
Impact can have an impact the pad on radio circuit, if any misoperation, will cause peeling around Pad off or pad
Phenomenon；(2) it needs to carry out 3 operations to the welding of the same solder joint, increases working hour, constrain the test of radio circuit
Efficiency is unfavorable for the circuit test requirement of scale.
Summary of the invention
The present invention solves the technical problem of it is how reliable, easily radio circuit is tested.On solving
Technical problem is stated, this application provides a kind of test devices of radio circuit, comprising:
Microscope carrier, for placing radio circuit；
Elevating mechanism, the test board including vertically disposed Bearing column and with the Bearing column clearance fit, the test
Plate is located at the top of the microscope carrier and is vertically moved up or down along the Bearing column, and the test board is equipped with SMA high frequency connectors,
The SMA high frequency connectors are used to the radio circuit being connected to a test equipment；
Adjustment mechanism, the adjustment mechanism are set to the top of the Bearing column, connect with the test board, for adjusting
The lifting position of the test board.
The test device further includes pedestal, and the microscope carrier is fixed at the upper surface of the pedestal；The elevator
The Bearing column of structure has multiple, is fixed on the upper surface of the pedestal side by side, the test board is matched with each Bearing intercolumniation gap
It closes.
The test board is equipped with multiple bearings for being separately adapted to each Bearing column, and the test board passes through each
The bearing and each Bearing column carry out clearance fit.
The elevating mechanism further includes fixed frame, and the fixed frame is connect with the top of each Bearing column, for pair
The top of each Bearing column is fixed.
The adjustment mechanism is quick clamp hand, and the quick clamp hand is fixed on the fixed frame, and with the test board
It is flexibly connected, adjusts the lifting position of the test board by rotating the quick clamp hand.
The quick clamp hand includes support base, motion bar, pivot and connecting rod, and the support base is fixed on the fixed frame
On, one end of the interlude of the motion bar and the support seat hinge, the motion bar passes through the pivot and the connecting rod
One end carry out hinged, the other end of the connecting rod is flexibly connected with the test board, and the other end of the motion bar is set
There is grip part, user is by pressing the grip part to adjust the lifting position of the test board.
The SMA high frequency connectors include SMA-KF measuring head, and one end of the SMA-KF measuring head is equipped with double ended probes,
Each probe is respectively used to be contacted with the communications pins of the radio circuit and grounding pin, the SMA-KF test
The other end of head is equipped with SMA interface, and the SMA interface is for connecting high frequency cable.
The SMA high frequency connectors include two SMA-KF measuring heads, and two SMA-KF measuring heads are solid side by side
It is scheduled on the test board, so that the double ended probes of each SMA-KF measuring head extends and be more than the following table of the test board
Face, so that the SMA interface of each SMA-KF measuring head extends and be more than the upper surface of the test board.
The microscope carrier uses insulating materials, and surface is equipped with the card slot for being adapted to the radio circuit.
The test board uses acrylic material.
The beneficial effect of the application is:
It mainly include microscope carrier, elevating mechanism, adjustment machine according to a kind of test device of radio circuit of above-described embodiment
Structure and pedestal.Wherein, microscope carrier is for placing radio circuit；Elevating mechanism include vertically disposed Bearing column and with Bearing intercolumniation gap
The test board of cooperation, test board are located at the top of microscope carrier and are vertically moved up or down along Bearing column, and test board connects equipped with SMA high frequency
Device is connect, SMA high frequency connectors are used to the radio circuit being connected to a test equipment；Adjustment mechanism is set to the top of Bearing column
End, is connect, for adjusting the lifting position of test board with test board by a connecting rod；Microscope carrier and Bearing column are each attached to pedestal
On.In a first aspect, due to controlling contact shape of the SMA high frequency connectors with radio circuit by elevating mechanism and adjustment mechanism
State avoids the inconvenient situation of previous soldered wires so that the test process of radio circuit is simplified, and is conducive to improve radio frequency electrical
The testing efficiency on road；Second aspect, since the SMA high frequency connectors on test board use SMA-KF measuring head, so that test
The shielding stratum reticulare of head is suitable with inner conductor length, will not improve the impedance of measuring head and radio circuit, is conducive to improve radio circuit
Test quality；The third aspect, when due to using SMA high frequency connectors, so that the communication between radio circuit and test equipment
Signal has obtained good shielding, can be avoided as much as external environment and go to the interference effect of signal of communication, is conducive to guarantee
Consistency between test result and the test result for welding coaxial cable.
Detailed description of the invention
Fig. 1 is a kind of perspective view of the test device of embodiment；
Fig. 2 is a kind of front view of the test device of embodiment；
Fig. 3 is the front view of SMA-KF measuring head；
Fig. 4 is the bottom view of SMA-KF measuring head.
Specific embodiment
Below by specific embodiment combination attached drawing, invention is further described in detail.Wherein different embodiments
Middle similar component uses associated similar element numbers.In the following embodiments, many datail descriptions be in order to
The application is better understood.However, those skilled in the art can recognize without lifting an eyebrow, part of feature
It is dispensed, or can be substituted by other elements, material, method in varied situations.In some cases, this Shen
Please it is relevant it is some operation there is no in the description show or describe, this is the core in order to avoid the application by mistake
More descriptions are flooded, and to those skilled in the art, these relevant operations, which are described in detail, not to be necessary, they
Relevant operation can be completely understood according to the general technology knowledge of description and this field in specification.
It is formed respectively in addition, feature described in this description, operation or feature can combine in any suitable way
Kind embodiment.Meanwhile each step in method description or movement can also can be aobvious and easy according to those skilled in the art institute
The mode carry out sequence exchange or adjustment seen.Therefore, the various sequences in the description and the appended drawings are intended merely to clearly describe a certain
A embodiment is not meant to be necessary sequence, and wherein some sequentially must comply with unless otherwise indicated.
It is herein component institute serialization number itself, such as " first ", " second " etc., is only used for distinguishing described object,
Without any sequence or art-recognized meanings.And " connection ", " connection " described in the application, unless otherwise instructed, include directly and
It is indirectly connected with (connection).
Fig. 1 and Fig. 2 are please referred to, the application discloses a kind of test device of radio circuit, mainly includes microscope carrier 1, lifting
Mechanism 2, adjustment mechanism 3 will illustrate respectively below.
Microscope carrier 1 is for placing radio circuit D0.In one embodiment, microscope carrier 1 use insulating materials, not with radio frequency electrical
Road D0 generates electrostatic induction；In addition, the surface of microscope carrier 1 is equipped with the card slot 11 for being adapted to radio circuit D0, so that radio circuit D0
It can rest easily on microscope carrier 1.
Elevating mechanism 2 includes vertically disposed Bearing column 24 and the test board 22 with 24 clearance fit of Bearing column, the test
Plate 22 is located at the top of microscope carrier 1, and is vertically moved up or down along Bearing column 24；Test board 22 is equipped with SMA high frequency connectors 21,
SMA high frequency connectors 21 are used to for radio circuit D0 being connected to a test equipment (unmarked in figure).
It should be noted that Bearing column is the partials of bearing, that is, bearing, it is a kind of heavy in contemporary mechanical equipment
Components are wanted, its major function is to support mechanical rotary body, reduces the coefficient of friction in its motion process, and guarantee its revolution
Precision.
In one embodiment, it is detailed in Fig. 2, which further includes pedestal 4, and microscope carrier 1 is fixed at the upper table of pedestal 4
Face, the Bearing column 24 of elevating mechanism have multiple (such as two Bearing columns in Fig. 2), are fixed on the upper surface of pedestal 4 side by side, survey
Test plate (panel) 22 and each Bearing column clearance fit.
Further, see that Fig. 2, test board 22 are equipped with multiple bearings 23 for being separately adapted to each Bearing column, test board
22 carry out clearance fit with each Bearing column 24 by each bearing 23.
Further, elevating mechanism further includes fixed frame 25, which connect with the top of each Bearing column 24, is used
It is fixed in the top to each Bearing column 24.
Adjustment mechanism 3 is set to the top of Bearing column 24, is connect by a connecting rod 32 with test board 23, for adjusting test
The lifting position of plate 22.
In the present embodiment, adjustment mechanism 3 is quick clamp hand, which is fixed on fixed frame 25, and with test
The connecting rod 32 connected on plate 22 is flexibly connected, the lifting position for adjusting test board 22 by rotating the quick clamp hand.
In one embodiment, it is detailed in Fig. 2, quick clamp hand includes support base 31, motion bar 34, pivot 33 and connecting rod
32, support base 31 is fixed on fixed frame 25, and the interlude and support base 31 of motion bar 34 are hinged, and one end of motion bar 34 passes through
One end of pivot 33 and connecting rod 32 carries out hingedly, and the other end of connecting rod 32 is flexibly connected with test board 22, in addition, motion bar
34 other end is equipped with grip part, and user is by pressing the grip part to adjust the lifting position of test board 22.
Further, connecting rod 32 passes through an inner thread sleeve and a hold assembly and 22 carry out activity company of test board
Connect, can fracturing connecting rods 32 and test board 22 when needed, enable a user to replacement and be suitable for another radio circuit
Test board.
In the present embodiment, Fig. 3 and Fig. 4 are please referred to, the SMA high frequency connectors 21 being arranged on test board 22 include SMA-KF
Measuring head, the SMA-KF measuring head include ontology 211 and fixing piece 215, and one end of ontology 211 is equipped with double ended probes (such as 212 Hes
Shown in 213), each probe is respectively used to be contacted (wherein, probe with the communications pins of radio circuit D0 and grounding pin
212 mainly contact with communications pins, and probe 213 is mainly contacted with grounding pin)；The ontology 211 of SMA-KF measuring head it is another
End is equipped with SMA interface 214, and the SMA interface 214 is for connecting high frequency cable.In addition, the fixing piece 215 of SMA-KF measuring head is logical
Two through-holes 2151 and test board 22 crossed thereon carry out screw connection.
It should be noted that SMA interface is a kind of widely used small-sized threaded connection device, it has bandwidth, property
It can excellent, highly reliable, service life length feature.SMA interface is suitable for microwave equipment and digital communication system, is mainly used to connect high frequency
Cable or microstrip line.Currently, SMA interface is there are mainly two types of form, the SMA of standard is " external screw thread+hole ", or " internal screw thread+needle ",
Reversed polarity RP-SMA is " external screw thread+needle ", or is " internal screw thread+hole ".In the present embodiment, not to the concrete form of SMA interface
It is defined.
In one embodiment, it is detailed in Fig. 1 and Fig. 2, SMA high frequency connectors include two SMA-KF measuring heads 21, and two
A SMA-KF measuring head 21 is fixed on side by side on test board 22, so that the double ended probes of each SMA-KF measuring head extends and is more than
The lower surface of test board 22, so that the SMA interface of each SMA-KF measuring head 21 extends and be more than the upper surface of test board 22；Such as
This, can facilitate user to be attached the test equipment corresponding with radio circuit D0 of SMA interface 214 by high frequency cable, also side
Just user contacts probe (212,213) to the respective pins of radio circuit D0 when pressing motion bar 34.
In the present embodiment, test board 22 can use acrylic material, in this way, may make test board 22 both with transparent
Effect, it may have anti-static effect carries out the test job of radio circuit D0 convenient for user.
Use above specific case is illustrated the present invention, is merely used to help understand the present invention, not to limit
The system present invention.For those skilled in the art, according to the thought of the present invention, can also make several simple
It deduces, deform or replaces.
Claims (10)
1. a kind of test device of radio circuit characterized by comprising
Microscope carrier, for placing radio circuit；
Elevating mechanism, the test board including vertically disposed Bearing column and with the Bearing column clearance fit, the test board position
In the microscope carrier top and be vertically moved up or down along the Bearing column, the test board be equipped with SMA high frequency connectors, it is described
SMA high frequency connectors are used to the radio circuit being connected to a test equipment；
Adjustment mechanism, the adjustment mechanism are set to the top of the Bearing column, connect with the test board, described for adjusting
The lifting position of test board.
2. test device as described in claim 1, which is characterized in that further include pedestal, the microscope carrier is fixed at the bottom
The upper surface of seat；The Bearing column of the elevating mechanism has multiple, is fixed on the upper surface of the pedestal side by side, the test board with
Each Bearing column clearance fit.
3. test device as claimed in claim 2, which is characterized in that the test board be equipped with it is multiple be separately adapted to it is each
The bearing of the Bearing column, the test board carry out clearance fit by each bearing and each Bearing column.
4. test device as claimed in claim 2, which is characterized in that the elevating mechanism further includes fixed frame, the fixation
Frame is connect with the top of each Bearing column, is fixed for the top to each Bearing column.
5. test device as claimed in claim 4, which is characterized in that the adjustment mechanism is quick clamp hand, the quick folder
Hand is fixed on the fixed frame, and is flexibly connected with the test board, by rotating the quick clamp hand to adjust
State the lifting position of test board.
6. test device as claimed in claim 5, which is characterized in that the quick clamp hand includes support base, motion bar, pivot
And connecting rod, the support base are fixed on the fixed frame, the interlude of the motion bar and the support seat hinge, the work
One end of lever carried out by one end of the pivot and the connecting rod it is hinged, the other end of the connecting rod and the test board into
Row is flexibly connected, and the other end of the motion bar is equipped with grip part, and user is by pressing the grip part to adjust the test
The lifting position of plate.
7. test device as described in claim 1, which is characterized in that the SMA high frequency connectors include SMA-KF measuring head,
One end of the SMA-KF measuring head is equipped with double ended probes, and each probe is respectively used to draw with the communication of the radio circuit
Foot and grounding pin are contacted, and the other end of the SMA-KF measuring head is equipped with SMA interface, and the SMA interface is for connecting
High frequency cable.
8. test device as claimed in claim 4, which is characterized in that the SMA high frequency connectors include two SMA-
KF measuring head, two SMA-KF measuring heads are fixed on side by side on the test board, so that each SMA-KF measuring head
Double ended probes extend and be more than the test board lower surface so that the SMA interface of each SMA-KF measuring head extends
It and is more than the upper surface of the test board.
9. such as the described in any item test devices of claim 1-8, which is characterized in that the microscope carrier uses insulating materials, surface
Equipped with the card slot for being adapted to the radio circuit.
10. such as the described in any item test devices of claim 1-8, which is characterized in that the test board uses acrylic material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822276190.6U CN209542785U (en) | 2018-12-29 | 2018-12-29 | A kind of test device of radio circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822276190.6U CN209542785U (en) | 2018-12-29 | 2018-12-29 | A kind of test device of radio circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209542785U true CN209542785U (en) | 2019-10-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822276190.6U Active CN209542785U (en) | 2018-12-29 | 2018-12-29 | A kind of test device of radio circuit |
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|---|---|
| CN (1) | CN209542785U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398768A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Automatic change power semiconductor device test fixture |
-
2018
- 2018-12-29 CN CN201822276190.6U patent/CN209542785U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111398768A (en) * | 2020-04-14 | 2020-07-10 | 西安易恩电气科技有限公司 | Automatic change power semiconductor device test fixture |
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