CN215933995U - Coaxial connector - Google Patents

Coaxial connector Download PDF

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Publication number
CN215933995U
CN215933995U CN202122104605.3U CN202122104605U CN215933995U CN 215933995 U CN215933995 U CN 215933995U CN 202122104605 U CN202122104605 U CN 202122104605U CN 215933995 U CN215933995 U CN 215933995U
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CN
China
Prior art keywords
probe
coaxial
connector
shielding layer
shell
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Active
Application number
CN202122104605.3U
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Chinese (zh)
Inventor
侯燕兵
张俊
王强
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Suzhou Fatedi Technology Co ltd
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FTdevice Technology Suzhou Co Ltd
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Priority to CN202122104605.3U priority Critical patent/CN215933995U/en
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Abstract

The utility model discloses a coaxial connector, which comprises a board card connector, a board card connector and a board card connector, wherein the board card connector is suitable for being matched and connected with a corresponding board on a testing machine; the coaxial probe connector comprises a probe group connected with a main board of the testing machine, wherein the probe group consists of a plurality of coaxial probes and a plurality of common probes, and the coaxial probes and the common probes are alternately arranged; and one end of the connecting wire is connected with the board card connector, and the other end of the connecting wire is connected with the coaxial probe connector. The coaxial probe is adopted, the shielding layer and the shielding shell are added, the shielding effect of the connector in the signal transmission process is greatly improved, and the loss in the signal transmission process is reduced, so that the probe set realizes the transmission of high-speed signals when the probe set is connected and conducted on a main board of a testing machine. The problem of current conventional chip test machine connector can't satisfy the signal transmission function of high speed, low loss, high signal shielding is solved.

Description

Coaxial connector
Technical Field
The utility model belongs to the technical field of chip testing, and particularly relates to a coaxial connector for signal transmission between a board card and a mainboard of a chip testing machine.
Background
With the development of 5G technology, the corresponding traditional chip test can not meet the test requirements of 5G corresponding chips on high speed and low loss, and the bandwidth loss of 6Ghz, which is the basic requirement of the corresponding 5G test, should not be more than 5 db. The conventional tester connector is far from meeting the requirements of the test technology corresponding to the technical innovation of signal transmission, that is, the conventional tester connector has a low speed and cannot meet the requirements of the test technology corresponding to 5G signal transmission.
SUMMERY OF THE UTILITY MODEL
In view of the above technical problems, the present invention aims to: the utility model provides a coaxial connector has adopted coaxial probe, has increased shielding layer and shielding shell, has improved the connector shielding effect in signal transmission process greatly, reduces the loss in the signal transmission process to make the probe group lie in the transmission of realization high-speed signal when the test machine mainboard connection switches on. The problem of current conventional chip test machine connector can't satisfy the signal transmission function of high speed, low loss, high signal shielding is solved.
The technical scheme of the utility model is as follows:
an object of the present invention is to provide a coaxial connector including:
the board card connector is suitable for being matched and connected with a corresponding board on the testing machine;
the coaxial probe connector comprises a probe group connected with a main board of the testing machine, wherein the probe group consists of a plurality of coaxial probes and a plurality of common probes, and the coaxial probes and the common probes are alternately arranged;
and one end of the connecting wire is connected with the board card connector, and the other end of the connecting wire is connected with the coaxial probe connector.
Optionally, the coaxial probe comprises:
a probe body;
the probe shielding layer is coaxially sleeved on the periphery of the probe body, and the probe head part of the probe body is exposed out of the probe shielding layer;
and the probe metal shielding shell is coaxially sleeved on the periphery of the probe shielding layer.
Optionally, the probe shielding layer is made of a polytetrafluoroethylene material.
Optionally, the length of the probe body in the probe shielding layer is smaller than that of the probe shielding layer, and the length of the probe metal shielding shell is larger than that of the probe shielding layer.
Optionally, the coaxial probes are arranged in an array, and the common probes are arranged in an array.
Optionally, the coaxial probe connector further includes:
and the shell assembly is arranged on the periphery of the probe group, and the probe head of the probe group is exposed out of the shell assembly.
Optionally, the housing assembly comprises:
an insulating bracket disposed toward one end connected to the connection line;
the supporting plate is arranged at one end of the insulating bracket, which is far away from the connecting line, and a plurality of first through holes for the probe set to be inserted and fixed are formed in the supporting plate;
the shell is connected to one end, far away from the insulating bracket, of the supporting plate, and a plurality of second through holes for the probe set to be inserted and fixed are formed in the shell;
the cover plate is arranged at one end of the shell, which is far away from the supporting plate, and a plurality of third through holes for the probe group to be inserted and fixed are formed in the cover plate;
the first through holes, the second through holes and the third through holes are coaxially arranged in a one-to-one correspondence manner;
the probe metal shielding shell is arranged in the first through hole, the second through hole and the third through hole in a penetrating mode, and the probe shielding layer is arranged in the portion, located in the second through hole and the third through hole, of the probe metal shielding shell in a penetrating mode.
Optionally, still include coupling assembling, coupling assembling includes the connecting piece and sets up on bracket, layer board, casing and the apron with connecting piece matched with cooperation portion.
Optionally, the connecting piece is a pin, and the matching portion is a pin hole.
Optionally, the housing assembly is further provided with a screw hole, and the coaxial connector is adapted to be inserted into the screw hole through a screw and locked on the metal panel at a position corresponding to the testing machine.
Compared with the prior art, the utility model has the advantages that:
according to the coaxial connector, the coaxial probes are added in the probe set, and the shielding layer and the shielding shell are added on the basis of the common probes, so that the shielding effect of the connector in the signal transmission process is greatly improved, the loss in the signal transmission process is reduced, and the probe set realizes the transmission of high-speed signals when the mainboard of the tester is connected and conducted. The problem of current conventional chip test machine connector can't satisfy the signal transmission function of high speed, low loss, high signal shielding is solved.
Drawings
The utility model is further described with reference to the following figures and examples:
fig. 1 is a perspective view of a coaxial connector according to an embodiment of the present invention;
fig. 2 is a disassembled structure diagram of the coaxial probe connector of the coaxial connector according to the embodiment of the utility model;
fig. 3 is a cross-sectional view of a coaxial connector according to an embodiment of the present invention.
Wherein: 1. a board card connector; 2. a coaxial probe connector; 21. an insulating bracket; 22. a support plate; 23. a housing; 24. a probe set; 241. a coaxial probe; 2410. a probe body; 2411. a probe shielding layer; 2412. a probe metal shielding case; 242. a common probe; 25. a cover plate; 3. and connecting the wires.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings in conjunction with the following detailed description. It should be understood that the description is intended to be exemplary only, and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
Example (b):
as shown in fig. 1 to fig. 3, a coaxial connector according to an embodiment of the present invention includes a board connector 1, a coaxial probe connector 2, and a connection line 3. The board card connector 1 is suitable for being connected with a corresponding board on a testing machine in a matching mode. One end of the connecting wire 3 is connected with the board card connector 1, and the other end is connected with the coaxial probe connector 2, so as to realize the electrical connection between the board card connector 1 and the coaxial probe connector 2, and for the existing conventional connecting wire 3, for example, the connecting wire 3 is similar to the connecting wire 3 for connecting a computer host and a display, the detailed description and the limitation are not made on the specific structure and the working principle. The coaxial probe connector 2 includes a probe group 24 connected to the tester main board, and the probe group 24 is composed of a plurality of coaxial probes 241 and a plurality of common probes 242 (i.e., probes that are conventional in connectors on the market), and the coaxial probes 241 and the common probes 242 are alternately arranged.
Specifically, as shown in fig. 2 and 3, the coaxial probe connector 2 includes a probe group 24 and a housing assembly disposed on the outer periphery of the probe group 24. The probe heads of the probe sets 24 are exposed to the outside of the housing assembly.
As shown in fig. 3, the coaxial probe 241 includes a probe body 2410, which is the same as the normal probe 242, i.e., the probe body 2410 is also the normal probe 242, a probe shielding layer 2411 and a probe metal shielding shell 2412. The probe shielding layer 2411 is coaxially sleeved on the periphery of the probe body 2410, and the probe head of the probe body 2410 is exposed out of the probe shielding layer 2411. The probe metal shielding shell 2412 is coaxially sleeved on the periphery of the probe shielding layer 2411. More specifically, the length of the probe body 2410 inside the probe shielding layer 2411 is smaller than the length of the probe shielding layer 2411, and the length of the probe metal shielding shell 2412 is larger than the length of the probe shielding layer 2411. It should be noted that, in this embodiment, the probe shielding layer 2411 is made of teflon, that is, polytetrafluoroethylene, and the teflon has a relatively small dielectric constant and an excellent shielding effect in the signal transmission process. The probe metal shielding case 2412 is made of brass.
As shown in fig. 2 and 3, the housing assembly includes an insulating bracket 21, a support plate 22, a housing 23, a cover plate 25, and a connecting assembly. The insulating bracket 21, the pallet 22, the case 23, and the cover plate 25 are stacked and fixed in the left-right direction as shown in fig. 2. The insulating bracket 21 is square plate-shaped, hollow in the middle, and is arranged towards one end connected with the connecting wire 3. The supporting plate 22 is square and is arranged at one end of the insulating bracket 21 far away from the connecting wire 3, and a plurality of first through holes for the probe group 24 to be inserted and fixed are specifically round through holes formed in the supporting plate 22. The shell 23 is a T-shaped shell and is connected to one end of the supporting plate 22 far away from the insulating bracket 21, and the shell 23 is provided with a plurality of second through holes for the probe group 24 to be inserted and fixed. The cover plate 25 is square and is disposed at one end of the housing 23 away from the supporting plate 22, and the cover plate 25 is provided with a plurality of third through holes for the probe set 24 to be inserted and fixed. The first through hole, the second through hole and the third through hole are coaxially arranged in a one-to-one correspondence manner. The probe metal shielding shell 2412 is arranged in the first through hole, the second through hole and the third through hole in a penetrating manner, and the probe shielding layer 2411 is arranged in the part, in the second through hole and the third through hole, of the probe metal shielding shell 2412 in a penetrating manner. The connecting assembly comprises connecting elements (not shown) and cooperating parts (not shown) provided on the carrier, the carrier plate 22, the housing 23 and the cover plate 25, in particular around the periphery, for cooperation with the connecting elements. In this embodiment, the connecting member is a pin, and the fitting portion is a pin hole. Alternatively, the connecting member may be a screw, and the fitting portion may be a screw hole. In this embodiment, the insulating holder 21 is made of a polyetherimide material.
In some preferred embodiments, several coaxial probes 241 are arranged in an array. Specifically, a common probe 242 is disposed between any two adjacent coaxial probes 241, and the coaxial probes 241 and the common probe 242 are alternately disposed as shown in fig. 3. Therefore, a plurality of the common probes 242 are also arranged in an array.
In some preferred embodiments, the housing assembly further defines screw holes (not shown), and the coaxial connector is adapted to be screwed into the screw holes to lock onto a metal panel (not shown) at a corresponding position of the testing machine. As shown in fig. 2, the insulating bracket 21, the support plate 22, the housing 23, and the cover plate 25 are provided with coaxial screw holes at their peripheral edges, and screws are sequentially inserted through the screw holes provided at the peripheral edges of the insulating bracket 21, the support plate 22, the housing 23, and the cover plate 25, which are stacked and fixed in the left-to-right direction shown in fig. 2, and fixed to a metal panel (not shown) at a position corresponding to the testing machine.
It is to be understood that the above-described embodiments of the present invention are merely illustrative of or explaining the principles of the utility model and are not to be construed as limiting the utility model. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such variations and modifications as fall within the scope and boundaries of the appended claims or the equivalents of such scope and boundaries.

Claims (9)

1. A coaxial connector, comprising:
the board card connector (1) is suitable for being matched and connected with a corresponding board on the testing machine;
the coaxial probe connector (2) comprises a probe group (24) connected with a tester mainboard, wherein the probe group (24) consists of a plurality of coaxial probes (241) and a plurality of common probes (242), and the coaxial probes (241) and the common probes (242) are alternately arranged;
one end of the connecting wire (3) is connected with the board card connector (1), and the other end of the connecting wire (3) is connected with the coaxial probe connector (2);
the coaxial probe (241) comprises:
a probe body (2410);
the probe shielding layer (2411) is coaxially sleeved on the periphery of the probe body (2410), and the probe head part of the probe body (2410) is exposed out of the probe shielding layer (2411);
the probe metal shielding shell (2412) is coaxially sleeved on the periphery of the probe shielding layer (2411).
2. The coaxial connector of claim 1, wherein the probe shielding layer (2411) is made of a polytetrafluoroethylene material.
3. The coaxial connector of claim 1, wherein the probe body (2410) is located within the probe shielding layer (2411) for a length less than a length of the probe shielding layer (2411), and the probe metal shielding housing (2412) is located for a length greater than the length of the probe shielding layer (2411).
4. The coaxial connector of claim 1, wherein a plurality of the coaxial probes (241) are arranged in an array, and a plurality of the common probes (242) are arranged in an array.
5. The coaxial connector according to claim 1, wherein the coaxial probe connector (2) further comprises:
a shell assembly arranged on the periphery of the probe group (24), wherein the probe head of the probe group (24) is exposed out of the shell assembly.
6. The coaxial connector of claim 5, wherein the housing assembly comprises:
an insulating bracket (21) provided toward one end connected to the connection wire (3);
the supporting plate (22) is arranged at one end, far away from the connecting wire (3), of the insulating bracket (21), and is provided with a plurality of first through holes for the probe set (24) to be inserted and fixed;
the shell (23) is connected to one end, far away from the insulating bracket (21), of the supporting plate (22), and a plurality of second through holes for the probe group (24) to be inserted and fixed are formed in the shell;
the cover plate (25) is arranged at one end of the shell (23) far away from the supporting plate (22), and is provided with a plurality of third through holes for the probe group (24) to be inserted and fixed;
the first through holes, the second through holes and the third through holes are coaxially arranged in a one-to-one correspondence manner;
the probe metal shielding shell (2412) is arranged in the first through hole, the second through hole and the third through hole in a penetrating mode, and the probe shielding layer (2411) is arranged in the part, located in the second through hole and the third through hole, of the probe metal shielding shell (2412) in a penetrating mode.
7. The coaxial connector of claim 6, further comprising a connecting assembly including a connecting member and mating portions provided on the bracket, the carrier plate (22), the housing (23) and the cover plate (25) to mate with the connecting member.
8. The coaxial connector of claim 7, wherein the connecting member is a pin and the mating portion is a pin hole.
9. The coaxial connector of any one of claims 5-8, wherein the housing assembly further defines a screw hole, and the coaxial connector is adapted to be screwed into the screw hole and locked to the metal panel at a corresponding position of the testing machine.
CN202122104605.3U 2021-09-02 2021-09-02 Coaxial connector Active CN215933995U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202122104605.3U CN215933995U (en) 2021-09-02 2021-09-02 Coaxial connector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202122104605.3U CN215933995U (en) 2021-09-02 2021-09-02 Coaxial connector

Publications (1)

Publication Number Publication Date
CN215933995U true CN215933995U (en) 2022-03-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202122104605.3U Active CN215933995U (en) 2021-09-02 2021-09-02 Coaxial connector

Country Status (1)

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CN (1) CN215933995U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116203293A (en) * 2023-05-04 2023-06-02 法特迪精密科技(苏州)有限公司 High-frequency coaxial probe tower and test probe hole

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116203293A (en) * 2023-05-04 2023-06-02 法特迪精密科技(苏州)有限公司 High-frequency coaxial probe tower and test probe hole

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CP03 Change of name, title or address

Address after: No. 200 Xingpu Road, Industrial Park, Suzhou City, Jiangsu Province, 215000, 5 # 101, 102, 201, 202

Patentee after: Suzhou Fatedi Technology Co.,Ltd.

Country or region after: China

Address before: No. 200 Xingpu Road, Industrial Park, Suzhou City, Jiangsu Province, 215000, 5 # 101, 102, 201, 202

Patentee before: FTDEVICE TECHNOLOGY (SUZHOU) CO.,LTD.

Country or region before: China

CP03 Change of name, title or address