CN209542773U - A kind of apparatus for testing chip - Google Patents
A kind of apparatus for testing chip Download PDFInfo
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- CN209542773U CN209542773U CN201821792106.XU CN201821792106U CN209542773U CN 209542773 U CN209542773 U CN 209542773U CN 201821792106 U CN201821792106 U CN 201821792106U CN 209542773 U CN209542773 U CN 209542773U
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Abstract
The utility model discloses a kind of apparatus for testing chip, chip testing pedestal is installed on chip testing plate, chip is drawn pin by chip testing pedestal, and microcontroller connects each pin of chip by chip testing pedestal；It further include power circuit, OSC frequency amplifying circuit, divider circuit, A/D converter circuit, SD card storage circuit, TFT color screen display circuit on chip testing plate.For the chip of different encapsulation, it is only necessary to which chip can be tested by making new chip testing pedestal.The apparatus for testing chip of the utility model, debugging cycle are short, it is only necessary to and one month or so, for the chip of different encapsulation, it is only necessary to make new test fixture, for annual output in 5,000,000 products below, testing cost is low.
Description
Technical field
The utility model belongs to chip testing field more particularly to a kind of apparatus for testing chip.
Background technique
Semicon industry is quickly grown, and chip testing is have to pass through the link before chip application, chip testing
To pursue reliable, low cost, high efficiency as target.The machine for testing sensor in factory at present is the large size of external production mostly
Tester table, this board need to debug just to be able to achieve for 6~10 months and accurately test chip before testing chip；Debugging week
Phase is long, and sensor renewal rate is fast above current consumption electron-like.Every kind of chip needs to make exclusive guide shaft, vibration plate, suction nozzle,
These special accessories are only used for a kind of chip, if fruit chip has replaced encapsulation, then needing to remake these accessories, generation
High price is expensive.Testing cost height is debugged, it is at high cost for year shipment amount is less than 5,000,000 products.
Utility model content
Goal of the invention: in view of the above problems, the utility model proposes a kind of apparatus for testing chip, debugging cycle is short, only needs
One month or so is taken, for the chip of different encapsulation, it is only necessary to new test fixture is made, for annual output 5,000,000
Product below, testing cost are low.
Technical solution: to realize above-mentioned purpose of design, the technical scheme adopted by the utility model is a kind of chip testing
Device, including chip testing plate, chip testing pedestal, microcontroller；Chip testing pedestal, chip are installed on chip testing plate
Pin is drawn by chip testing pedestal, microcontroller connects each pin of chip by chip testing pedestal；Chip testing plate
On further include that power circuit, OSC frequency amplifying circuit, divider circuit, A/D converter circuit, SD card storage circuit, TFT color screen are aobvious
Show circuit；Chip is connected to OSC frequency amplifying circuit by chip testing pedestal, is connected to divider circuit, frequency divider electricity
Road is connected to microcontroller；Chip is connected to A/D converter circuit by chip testing pedestal, is connected to microcontroller；Microcontroller
Device connects SD card storage circuit and TFT color screen display circuit simultaneously；Power circuit is powered to each circuit.
Further, chip is connected to OSC frequency amplifying circuit by chip testing pedestal, and chip interior OSC frequency is defeated
It is amplified out to be connected to divider circuit, OSC frequency is divided to more than ten KHz, while by triangular wave and is transformed into square wave, then
Connection microcontroller is acquired chip interior OSC frequency.
Further, chip is connected to A/D converter circuit by chip testing pedestal, the LED drive current of chip interior and
Standby current flows through the resistance in circuit, is transformed into voltage, A/D converter circuit collection voltages, to measure chip interior
The size of current of LED drive current and standby current.
Further, the OSC frequency amplifying circuit includes amplification chip, and 2 feet of the amplification chip pass through resistance R1
Ground connection, 2 feet pass through 6 foot of resistance R2 connection simultaneously, and 6 feet are grounded by capacitor C4, and 4 feet are directly grounded, and 3 feet pass through resistance R3 and electricity
Hold C1 ground connection, 7 feet connect 5V voltage, while by being grounded after capacitor C2 and capacitor C3 parallel connection.
Further, the A/D converter circuit includes converter, and 1 foot of converter connects 3.3V voltage, passes through simultaneously
It is grounded after capacitor C1 and capacitor C2 are in parallel；2 feet and 3 feet are grounded simultaneously, and 5 feet pass through 6 foot of capacitor C3 connection；9 feet, 11 feet and 12 feet
It is grounded simultaneously；10 feet and 13 feet connect 5.3V voltage, while by being grounded after capacitor C4 and capacitor C5 parallel connection.
The utility model has the advantages that the apparatus for testing chip and method of the utility model, debugging cycle are short, it is only necessary to one month or so,
For the chip of different encapsulation, it is only necessary to make new test fixture, for annual output in 5,000,000 products below, survey
It tries at low cost.
Detailed description of the invention
Fig. 1 is the apparatus for testing chip schematic diagram of the utility model；
Fig. 2 is the circuit diagram of OSC frequency amplifying circuit；
Fig. 3 is the circuit diagram of A/D converter circuit.
Specific embodiment
The technical solution of the utility model is further described with reference to the accompanying drawings and examples.
Apparatus for testing chip described in the utility model as shown in Figure 1 includes chip testing plate, chip testing pedestal, micro-control
Device processed, development board, host computer；Chip testing pedestal is installed, chip passes through chip testing pedestal for pin on chip testing plate
It draws, microcontroller connects each pin of chip by chip testing pedestal；Chip testing plate is separately connected development board and host computer,
Development board passes through serial line interface and chip testing board communications, host computer Labview to chip testing plate input signal, host computer
It is tested.
It further include power circuit, OSC frequency amplification electricity in addition to chip testing pedestal and microcontroller on chip testing plate
Road, divider circuit, A/D converter circuit, SD card storage circuit, TFT color screen display circuit.Chip is connected to OSC frequency by pedestal
Rate amplifying circuit, is connected to divider circuit, and divider circuit is connected to microcontroller.Chip is connected to AD by pedestal and turns
Circuit is changed, microcontroller is connected to.Microcontroller connects SD card storage circuit and TFT color screen display circuit simultaneously.
Chip is connected to OSC frequency amplifying circuit by pedestal, and the signal of chip interior OSC rate-adaptive pacemaker is amplified again
It is connected to divider circuit, OSC frequency is divided to more than ten KHz, while triangular wave is transformed into square wave, reconnects microcontroller
Chip interior OSC frequency is acquired.
Chip is connected to A/D converter circuit by pedestal, and the LED drive current and standby current of chip interior flow through circuit
In resistance, be transformed into voltage, voltage can be collected by A/D converter circuit, so as to measure chip interior LED drive
The current value size of streaming current and standby current.
The utility model microcontroller selects STM32, and it is a low that STM32F103VCT6, which is ARM Cortex-M3 kernel,
The high performance risc microcontroller of cost integrates various High performance industrial interconnection type standard interfaces, mainly includes timer, AD mould
Number conversion, DA digital-to-analogue conversion, CAN bus, dma bus；With 6-12 clock cycle, it can be achieved that quick nested interrupt, and it is soft
Part has perfect compatibility, is adapted to various control circuit.
Test board is chronically at operating status, it is desirable to provide stable power supply supply.The power circuit of system have 6.5V,
Totally 4 kinds of 5.3V, 5V, 3.3V.ADP3336 is a high-precision, and the power conversion chip of low noise selects two ADP3336 will
12V voltage drops to 6.5V, 5.3V.LM2596 is a 3A electric current output buck switching mode integrated voltage-stabilized chip, it includes fixation
Frequency oscillator (150KHZ) and benchmark voltage-stablizer (1.23v), and there is perfect protection circuit, current limit, Thermal shutdown electricity
Road etc..Only need few peripheral components that can constitute efficient voltage regulator circuit using the device.Use LM2596 will above test board
12V power supply is converted into 5V voltage, powers to test board device.AMS1117 is a efficient linear voltage-stablizer, is mainly used for postposition
Pressure stabilizing.Test board selects AMS1117 that 5V voltage is converted into 3.3V and powers to chip and microcontroller.
Chip interior OSC rate-adaptive pacemaker amplitude is the triangular wave of 200mV, this voltage magnitude frequency divider can't detect.
OPAx365 is the sensor amplification chip of a high-speed cruising (50MHz gain bandwidth), selects this chip by the OSC of 3MHz
Waveform amplifies, and amplified waveform is enable to be collected by frequency divider.
As shown in Fig. 2, OSC frequency amplifying circuit, including amplification chip OPA365 and several peripheral circuits.Amplification chip
2 feet are grounded by resistance R1, and R1 size can be 1k；2 feet pass through 6 foot of resistance R2 connection simultaneously, and 6 feet pass through capacitor C4 simultaneously and connect
Ground.4 feet are directly grounded, and 3 feet are grounded by resistance R3 and capacitor C1.7 feet connect 5V voltage, while simultaneously by capacitor C2 and capacitor C3
It is grounded after connection.
D type flip flop, which is one, has memory function, and tool is that composition is a variety of there are two the information recording device of stable state
Important element circuit in the basic logic unit and Digital Logical Circuits of sequence circuit.SN74LVC1G175 is a D touching
Device is sent out, the end CLK frequency is twice of the end Q frequency, and SN74LVC1G175 connections multiple in this way can realize the effect of frequency dividing.
The output of chip OSC is a frequency probably in the triangular wave of 3MHz, using multiple SN74LVC1G175 connections, may be implemented by
OSC frequency frequency dividing is transformed to square wave to more than ten KHz, while by triangular wave, facilitates acquisition of the microcontroller to frequency.
The LED drive current of chip interior is probably in 10mA or so, and standby current is in 1uA or so.ADS1231 is a essence
Close 24 analog-digital converters (ADC).It is switched by 24 Deltasigma modulators of accurate three rank and bridge power, ADS1231 is
Bridge type magnetic sensor application including weighing apparatus, stress meter and load cell provides a complete front end solutions.
ADS1231 is connected using bridge circuit, can measure small voltage, and LED drive current and chip standby current flow through in circuit
Resistance, be transformed into voltage, voltage can be collected by ADS1231 converter, so as to measure the current value in circuit
Size.
As shown in figure 3, A/D converter circuit, including converter and several peripheral circuits.1 foot of converter chip connects
3.3V voltage, while by being grounded after capacitor C1 and capacitor C2 parallel connection.2 feet and 3 feet are grounded simultaneously, and 5 feet pass through capacitor C3 connection 6
Foot.9 feet, 11 feet and 12 feet are grounded simultaneously.10 feet and 13 feet of converter chip connect 5.3V voltage, at the same by capacitor C4 and
It is grounded after capacitor C5 is in parallel.
SD storage card is a kind of memory device of new generation based on semiconductor fast-flash memory device, since it is small in size, data
Transmission speed is fast, the excellent characteristic such as hot-swappable, by widely in using on mancarried device.Some test datas of chip
It is very important information, is a kind of record to chip quality, so storage chip test information is extremely important.Test board is set
SD card storage circuit is counted, transplanting FAT file system carries out the read-write of test data on microcontroller.
TFT screen is widely used in information Industry Quick Development, is mainly used in mobile phone, the visual electricity of middle and high end
The fields such as words, portable V CD, tablet computer.Test board selects 1.8 cun of TFT color screens of 160*120, for the version of display chip
This number, the test information such as calibration value.
The utility model shortens the debug time of board, is suitable for the rapid product that updates, and is suitable for annual output and exists
5000000 chip testings below, testing cost are low.
Claims (5)
1. a kind of apparatus for testing chip, which is characterized in that including chip testing plate, chip testing pedestal, microcontroller；Chip is surveyed
Chip testing pedestal is installed, chip is drawn pin by chip testing pedestal, and microcontroller passes through chip testing on test plate (panel)
Pedestal connects each pin of chip；
It further include power circuit, OSC frequency amplifying circuit, divider circuit, A/D converter circuit, SD card storage on chip testing plate
Circuit, TFT color screen display circuit；Chip is connected to OSC frequency amplifying circuit by chip testing pedestal, is connected to frequency divider
Circuit, divider circuit are connected to microcontroller；Chip is connected to A/D converter circuit by chip testing pedestal, is connected to micro-
Controller；Microcontroller connects SD card storage circuit and TFT color screen display circuit simultaneously；Power circuit is powered to each circuit.
2. apparatus for testing chip according to claim 1, which is characterized in that chip is connected to by chip testing pedestal
OSC frequency amplifying circuit, chip interior OSC rate-adaptive pacemaker is amplified to be connected to divider circuit, and OSC frequency frequency dividing is arrived
More than ten KHz, while triangular wave is transformed into square wave, it reconnects microcontroller and chip interior OSC frequency is acquired.
3. apparatus for testing chip according to claim 1, which is characterized in that chip is connected to AD by chip testing pedestal
Conversion circuit, the LED drive current and standby current of chip interior flow through the resistance in circuit, are transformed into voltage, AD conversion electricity
Road collection voltages, to measure the LED drive current of chip interior and the size of current of standby current.
4. apparatus for testing chip according to claim 1, it is characterised in that: the OSC frequency amplifying circuit includes amplification
2 feet of chip, the amplification chip are grounded by resistance R1, and 2 feet pass through 6 foot of resistance R2 connection simultaneously, and 6 feet are connect by capacitor C4
Ground, 4 feet are directly grounded, and 3 feet are grounded by resistance R3 and capacitor C1, and 7 feet connect 5V voltage, while simultaneously by capacitor C2 and capacitor C3
It is grounded after connection.
5. apparatus for testing chip according to claim 1, it is characterised in that: the A/D converter circuit includes converter,
1 foot of converter connects 3.3V voltage, while by being grounded after capacitor C1 and capacitor C2 parallel connection；2 feet and 3 feet are grounded simultaneously, 5 feet
Pass through 6 foot of capacitor C3 connection；9 feet, 11 feet and 12 feet are grounded simultaneously；10 feet and 13 feet connect 5.3V voltage, while passing through capacitor C4
It is grounded with after capacitor C5 parallel connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821792106.XU CN209542773U (en) | 2018-11-01 | 2018-11-01 | A kind of apparatus for testing chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821792106.XU CN209542773U (en) | 2018-11-01 | 2018-11-01 | A kind of apparatus for testing chip |
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| CN209542773U true CN209542773U (en) | 2019-10-25 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111913471A (en) * | 2020-07-21 | 2020-11-10 | 北京京瀚禹电子工程技术有限公司 | Testing device |
-
2018
- 2018-11-01 CN CN201821792106.XU patent/CN209542773U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111913471A (en) * | 2020-07-21 | 2020-11-10 | 北京京瀚禹电子工程技术有限公司 | Testing device |
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