CN205103347U - IC -card simulation tests system - Google Patents
IC -card simulation tests system Download PDFInfo
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- CN205103347U CN205103347U CN201520909859.4U CN201520909859U CN205103347U CN 205103347 U CN205103347 U CN 205103347U CN 201520909859 U CN201520909859 U CN 201520909859U CN 205103347 U CN205103347 U CN 205103347U
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Abstract
The utility model discloses a IC -card simulation tests system, including IC -card card reader, IC -card emulation testing arrangement, first PC and second PC, the IC -card card reader includes first singlechip and IC -card seat, and IC -card emulation testing arrangement includes second single -chip microcomputer, and first PC is connected with the IC -card seat through first singlechip, and the IC -card seat is connected with second single -chip microcomputer, and second single -chip microcomputer is connected with the second PC, second single -chip microcomputer's a data input output is connected with the reset signal of IC -card seat end, and second single -chip microcomputer's the 2nd data input output and the data input output of IC -card seat are connected. The utility model discloses simple structure, low price, medium -sized and small enterprises that the specially adapted is numerous.
Description
Technical field
The utility model relates to IC-card technical field of measurement and test, particularly relates to a kind of IC-card simulated testing system.
Background technology
When developing card reader, need to carry out read and write access to the IC-card in card reader, to detect IC-card card reader, therefore need special equipment to simulate IC-card, current domestic this conventional kind equipment is import equipment substantially, although function is comparatively complete, expensive, the market price of equipment, substantially more than 100,000 yuan, is a huge expense concerning numerous medium-sized and small enterprises.
Utility model content
The purpose of this utility model is to overcome the deficiencies in the prior art, provides a kind of IC-card simulated testing system, with low cost, structure is simple.
The purpose of this utility model is achieved through the following technical solutions: a kind of IC-card simulated testing system, comprise IC-card card reader, IC-card simulation testing device, the first PC and the second PC, IC-card card reader comprises the first single-chip microcomputer and IC-card seat, IC-card simulation testing device comprises second singlechip, first PC is connected with IC-card seat by the first single-chip microcomputer, IC-card seat is connected with second singlechip, and second singlechip is connected with the second PC.
Described IC-card simulation testing device also comprises the first crystal oscillating circuit and the second crystal oscillating circuit.
Described first crystal oscillating circuit comprises the first crystal oscillator, the first electric capacity and the second electric capacity, the two ends of the first crystal oscillator are connected with the external oscillator input end of second singlechip and external oscillator output terminal respectively, the first end ground connection of the first electric capacity, the external oscillator input end of the second termination single-chip microcomputer of the first electric capacity, the first end ground connection of the second electric capacity, the external oscillator output terminal of the second termination second singlechip of the second electric capacity.
Described second crystal oscillating circuit comprises the second crystal oscillator, 3rd electric capacity, 4th electric capacity, first resistance and the second resistance, one end of second crystal oscillator is connected with the LSE oscillator input of second singlechip by the first resistance, the other end of the second crystal oscillator is connected with the LSE oscillator output end of second singlechip by the second resistance, the first end ground connection of the 3rd electric capacity, second end of the 3rd electric capacity is connected with the LSE oscillator input of second singlechip by the first resistance, the first end ground connection of the 4th electric capacity, second end of the 4th electric capacity is connected with the LSE oscillator output end of second singlechip by the second resistance.
First data input/output terminal of described second singlechip is connected with the reset signal end of IC-card seat, and the second data input/output terminal of second singlechip is connected with the data input/output terminal of IC-card seat.
Described IC-card simulation testing device also comprises reset circuit, reset circuit comprises the 5th electric capacity, the 3rd resistance and the first switch, the reset terminal of one termination second singlechip of the 5th electric capacity, the other end ground connection of the 5th electric capacity, one termination external power source of the 3rd resistance, the other end of the 3rd resistance connects the reset terminal of single-chip microcomputer, the first switch and the 5th Capacitance parallel connection.
Described IC-card simulation testing device also comprises USB and turns serial port circuit, and USB turns serial port circuit and comprises MINI-USB interface, PL2303HX chip, the 4th resistance, the 5th resistance, the 6th resistance, the 7th resistance, the 6th electric capacity, the 7th electric capacity, the 8th electric capacity, the 9th electric capacity, the tenth electric capacity, the 11 electric capacity and the 3rd crystal oscillator.
The power end of described MINI-USB interface connects 5V power supply by the 4th resistance, the earth terminal ground connection of MINI-USB interface, the D-signal end of MINI-USB interface is connected with the D-signal end of PL2303HX chip by the 5th resistance, and the D+ signal end of MINI-USB interface is connected with the D+ signal end of PL2303HX chip by the 6th resistance.
The D+ signal end of described MINI-USB interface is connected with the power output end of PL2303HX chip by the 7th resistance, and the power output end of PL2303HX chip is by the 6th capacity earth, the 7th electric capacity and the 6th Capacitance parallel connection.
The USB power source termination 5V power supply of described PL2303HX chip, the USB power source end of PL2303HX chip is connected with the USB earth terminal of PL2303HX chip by the 8th electric capacity, the USB earth terminal ground connection of PL2303HX chip.
The two ends of described 3rd crystal oscillator are connected with the crystal oscillator input end of PL2303HX chip and the crystal oscillator output terminal of PL2303HX chip respectively, one end ground connection of the 9th electric capacity, the crystal oscillator input end of another termination PL2303HX chip of the 9th electric capacity, one end ground connection of the tenth electric capacity, the crystal oscillator output terminal of another termination PL2303HX chip of the tenth electric capacity.
The RS232 power supply termination 3.3V power supply of described PL2303HX chip, the RS232 earth terminal ground connection of PL2303HX chip, the RS232 power end of PL2303HX chip is connected with the RS232 earth terminal of PL2303HX chip by the 11 electric capacity.
The serial data input end of described PL2303HX chip is connected with the 3rd data input/output terminal of second singlechip, and the serial data output terminal of PL2303HX chip is connected with the 4th data input/output terminal of single-chip microcomputer.
Described IC-card simulation testing device also comprises multiple status display circuit, status display circuit comprises light emitting diode and the 8th resistance, the plus earth of light emitting diode, the anode of light emitting diode is connected with the 5th data input output ports of second singlechip by the 8th resistance.
Described first single-chip microcomputer and second singlechip are STM32 series monolithic.
The beneficial effects of the utility model are:
(1) the utility model structure is simple, and low price, is specially adapted to numerous medium-sized and small enterprises;
(2) turn serial port circuit by USB in the utility model, IC-card simulation testing device can be connected on PC;
(3) be provided with condition indication circuit in the utility model, can show the different test results of IC-card simulation testing device, convenient operation person gets information about test result.
Accompanying drawing explanation
Fig. 1 is the structured flowchart of a kind of IC-card simulated testing system of the utility model;
Fig. 2 is the circuit diagram of IC-card simulation testing device in the utility model;
Fig. 3 is the circuit diagram that in the utility model, USB turns serial port circuit.
Embodiment
Below in conjunction with accompanying drawing, the technical solution of the utility model is described in further detail, but protection domain of the present utility model is not limited to the following stated.
As shown in Figure 1, Figure 2 and Figure 3, a kind of IC-card simulated testing system, comprise IC-card card reader, IC-card simulation testing device, the first PC and the second PC, IC-card card reader comprises the first single-chip microcomputer and IC-card seat, IC-card simulation testing device comprises second singlechip, first PC is connected with IC-card seat by the first single-chip microcomputer, and IC-card seat is connected with second singlechip, and second singlechip is connected with the second PC.
Described IC-card simulation testing device also comprises the first crystal oscillating circuit and the second crystal oscillating circuit.
Described first crystal oscillating circuit comprises the first crystal oscillator, the first electric capacity and the second electric capacity, the two ends of the first crystal oscillator are connected with the external oscillator input end of second singlechip and external oscillator output terminal respectively, the first end ground connection of the first electric capacity, the external oscillator input end of the second termination single-chip microcomputer of the first electric capacity, the first end ground connection of the second electric capacity, the external oscillator output terminal of the second termination second singlechip of the second electric capacity.
Described second crystal oscillating circuit comprises the second crystal oscillator, 3rd electric capacity, 4th electric capacity, first resistance and the second resistance, one end of second crystal oscillator is connected with the LSE oscillator input of second singlechip by the first resistance, the other end of the second crystal oscillator is connected with the LSE oscillator output end of second singlechip by the second resistance, the first end ground connection of the 3rd electric capacity, second end of the 3rd electric capacity is connected with the LSE oscillator input of second singlechip by the first resistance, the first end ground connection of the 4th electric capacity, second end of the 4th electric capacity is connected with the LSE oscillator output end of second singlechip by the second resistance.
First data input/output terminal of described second singlechip is connected with the reset signal end of IC-card seat, and the second data input/output terminal of second singlechip is connected with the data input/output terminal of IC-card seat.
Described IC-card simulation testing device also comprises reset circuit, reset circuit comprises the 5th electric capacity, the 3rd resistance and the first switch, the reset terminal of one termination second singlechip of the 5th electric capacity, the other end ground connection of the 5th electric capacity, one termination external power source of the 3rd resistance, the other end of the 3rd resistance connects the reset terminal of single-chip microcomputer, the first switch and the 5th Capacitance parallel connection.
Described IC-card simulation testing device also comprises USB and turns serial port circuit, and USB turns serial port circuit and comprises MINI-USB interface, PL2303HX chip, the 4th resistance, the 5th resistance, the 6th resistance, the 7th resistance, the 6th electric capacity, the 7th electric capacity, the 8th electric capacity, the 9th electric capacity, the tenth electric capacity, the 11 electric capacity and the 3rd crystal oscillator.
The power end of described MINI-USB interface connects 5V power supply by the 4th resistance, the earth terminal ground connection of MINI-USB interface, the D-signal end of MINI-USB interface is connected with the D-signal end of PL2303HX chip by the 5th resistance, and the D+ signal end of MINI-USB interface is connected with the D+ signal end of PL2303HX chip by the 6th resistance.
The D+ signal end of described MINI-USB interface is connected with the power output end of PL2303HX chip by the 7th resistance, and the power output end of PL2303HX chip is by the 6th capacity earth, the 7th electric capacity and the 6th Capacitance parallel connection.
The USB power source termination 5V power supply of described PL2303HX chip, the USB power source end of PL2303HX chip is connected with the USB earth terminal of PL2303HX chip by the 8th electric capacity, the USB earth terminal ground connection of PL2303HX chip.
The two ends of described 3rd crystal oscillator are connected with the crystal oscillator input end of PL2303HX chip and the crystal oscillator output terminal of PL2303HX chip respectively, one end ground connection of the 9th electric capacity, the crystal oscillator input end of another termination PL2303HX chip of the 9th electric capacity, one end ground connection of the tenth electric capacity, the crystal oscillator output terminal of another termination PL2303HX chip of the tenth electric capacity.
The RS232 power supply termination 3.3V power supply of described PL2303HX chip, the RS232 earth terminal ground connection of PL2303HX chip, the RS232 power end of PL2303HX chip is connected with the RS232 earth terminal of PL2303HX chip by the 11 electric capacity.
The serial data input end of described PL2303HX chip is connected with the 3rd data input/output terminal of second singlechip, and the serial data output terminal of PL2303HX chip is connected with the 4th data input/output terminal of single-chip microcomputer.
Described IC-card simulation testing device also comprises multiple status display circuit, status display circuit comprises light emitting diode and the 8th resistance, the plus earth of light emitting diode, the anode of light emitting diode is connected with the 5th data input output ports of second singlechip by the 8th resistance.
Described first single-chip microcomputer and second singlechip are STM32 series monolithic.
Claims (5)
1. an IC-card simulated testing system, it is characterized in that: comprise IC-card card reader, IC-card simulation testing device, the first PC and the second PC, IC-card card reader comprises the first single-chip microcomputer and IC-card seat, IC-card simulation testing device comprises second singlechip, first PC is connected with IC-card seat by the first single-chip microcomputer, IC-card seat is connected with second singlechip, and second singlechip is connected with the second PC;
Described IC-card simulation testing device also comprises the first crystal oscillating circuit and the second crystal oscillating circuit;
Described first crystal oscillating circuit comprises the first crystal oscillator, the first electric capacity and the second electric capacity, the two ends of the first crystal oscillator are connected with the external oscillator input end of second singlechip and external oscillator output terminal respectively, the first end ground connection of the first electric capacity, the external oscillator input end of the second termination single-chip microcomputer of the first electric capacity, the first end ground connection of the second electric capacity, the external oscillator output terminal of the second termination second singlechip of the second electric capacity;
Described second crystal oscillating circuit comprises the second crystal oscillator, 3rd electric capacity, 4th electric capacity, first resistance and the second resistance, one end of second crystal oscillator is connected with the LSE oscillator input of second singlechip by the first resistance, the other end of the second crystal oscillator is connected with the LSE oscillator output end of second singlechip by the second resistance, the first end ground connection of the 3rd electric capacity, second end of the 3rd electric capacity is connected with the LSE oscillator input of second singlechip by the first resistance, the first end ground connection of the 4th electric capacity, second end of the 4th electric capacity is connected with the LSE oscillator output end of second singlechip by the second resistance,
First data input/output terminal of described second singlechip is connected with the reset signal end of IC-card seat, and the second data input/output terminal of second singlechip is connected with the data input/output terminal of IC-card seat.
2. a kind of IC-card simulated testing system according to claim 1, it is characterized in that: described IC-card simulation testing device also comprises reset circuit, reset circuit comprises the 5th electric capacity, the 3rd resistance and the first switch, the reset terminal of one termination second singlechip of the 5th electric capacity, the other end ground connection of the 5th electric capacity, one termination external power source of the 3rd resistance, the other end of the 3rd resistance connects the reset terminal of single-chip microcomputer, the first switch and the 5th Capacitance parallel connection.
3. a kind of IC-card simulated testing system according to claim 1, it is characterized in that: described IC-card simulation testing device also comprises USB and turns serial port circuit, USB turns serial port circuit and comprises MINI-USB interface, PL2303HX chip, the 4th resistance, the 5th resistance, the 6th resistance, the 7th resistance, the 6th electric capacity, the 7th electric capacity, the 8th electric capacity, the 9th electric capacity, the tenth electric capacity, the 11 electric capacity and the 3rd crystal oscillator;
The power end of described MINI-USB interface connects 5V power supply by the 4th resistance, the earth terminal ground connection of MINI-USB interface, the D-signal end of MINI-USB interface is connected with the D-signal end of PL2303HX chip by the 5th resistance, and the D+ signal end of MINI-USB interface is connected with the D+ signal end of PL2303HX chip by the 6th resistance;
The D+ signal end of described MINI-USB interface is connected with the power output end of PL2303HX chip by the 7th resistance, and the power output end of PL2303HX chip passes through the 6th capacity earth, the 7th electric capacity and the 6th Capacitance parallel connection;
The USB power source termination 5V power supply of described PL2303HX chip, the USB power source end of PL2303HX chip is connected with the USB earth terminal of PL2303HX chip by the 8th electric capacity, the USB earth terminal ground connection of PL2303HX chip;
The two ends of described 3rd crystal oscillator are connected with the crystal oscillator input end of PL2303HX chip and the crystal oscillator output terminal of PL2303HX chip respectively, one end ground connection of the 9th electric capacity, the crystal oscillator input end of another termination PL2303HX chip of the 9th electric capacity, one end ground connection of the tenth electric capacity, the crystal oscillator output terminal of another termination PL2303HX chip of the tenth electric capacity;
The RS232 power supply termination 3.3V power supply of described PL2303HX chip, the RS232 earth terminal ground connection of PL2303HX chip, the RS232 power end of PL2303HX chip is connected with the RS232 earth terminal of PL2303HX chip by the 11 electric capacity;
The serial data input end of described PL2303HX chip is connected with the 3rd data input/output terminal of second singlechip, and the serial data output terminal of PL2303HX chip is connected with the 4th data input/output terminal of single-chip microcomputer.
4. a kind of IC-card simulated testing system according to claim 1, it is characterized in that: described IC-card simulation testing device also comprises multiple status display circuit, status display circuit comprises light emitting diode and the 8th resistance, the plus earth of light emitting diode, the anode of light emitting diode is connected with the 5th data input output ports of second singlechip by the 8th resistance.
5. a kind of IC-card simulated testing system according to claim 4, is characterized in that: described first single-chip microcomputer and second singlechip are STM32 series monolithic.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520909859.4U CN205103347U (en) | 2015-11-16 | 2015-11-16 | IC -card simulation tests system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520909859.4U CN205103347U (en) | 2015-11-16 | 2015-11-16 | IC -card simulation tests system |
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| CN205103347U true CN205103347U (en) | 2016-03-23 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110175481A (en) * | 2019-06-25 | 2019-08-27 | 深圳市亿道信息股份有限公司 | Card reader control system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110175481A (en) * | 2019-06-25 | 2019-08-27 | 深圳市亿道信息股份有限公司 | Card reader control system |
| CN110175481B (en) * | 2019-06-25 | 2023-11-17 | 深圳市亿道信息股份有限公司 | Card reader control system |
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