CN209471156U - Contact contacts device - Google Patents

Abstract

The utility model provides a kind of contact contact device, including mounting base, the guide rail being fixedly mounted in the mounting base and the slide block assembly being slidably connected with the guide rail, the bottom of the slide block assembly is equipped with probe unit, the slide block assembly can slide between the first location and the second location along the guide rail, in the first position, element to be tested can be placed in the mounting base, in the second position, the probe unit is contacted with the contact for the element to be tested being placed in the mounting base.Contact contact device provided by the utility model is cooperated by sliding block, sliding rail drives probe unit directly to contact with the contact of electronic component, solve the problems, such as abnormity, structure is complicated, the contact of electronic component with abnormity FPCB (c-type, Z-type etc.) can not engaged test, raising testing efficiency；The utility model structure is simple, easy to operate, applied widely.

Description

Contact contacts device

Technical field

The utility model relates to electronic component the field of test technology, contact device more particularly to a kind of contact.

Background technique

Electronic component, which is tested, contacts device usually using contact, tests component for the contact of component to be connected Properties, the various performance parameters such as on-off, resistance value, electric current, voltage including component internal wiring.

Accelerate since electronic component updates iteration speed, volume is increasingly compact, structure becomes increasingly complex, existing probe Direct contact scheme has been unable to satisfy testing requirement in some products.With the increasing of abnormity, complicated electronic component More, especially the contact FPCB with polymorphic structure, spaces compact, probe cannot directly contact contact, to the test of component Problems are brought, difficulty of test increases.

Utility model content

The purpose of this utility model is at least to solve one of drawbacks described above and deficiency, which is by the following technical programs It realizes.

The utility model provides a kind of contact contact device, including mounting base, is fixedly mounted in the mounting base Guide rail and the slide block assembly being slidably connected with the guide rail, the bottom of the slide block assembly are equipped with probe unit, the cunning Block assembly can slide between the first location and the second location along the guide rail, in the first position, element energy to be tested Enough be placed in the mounting base, in the second position, the probe unit be placed in the mounting base it is described to The contact of testing element contacts.

Further, the guide rail includes the first guide rail relatively disposed in parallel and the second guide rail, the slide block assembly peace Between first guide rail and second guide rail, it is equipped with and the cunning on first guide rail and second guide rail The track groove of block assembly cooperation.

Further, the slide block assembly includes sliding block, sliding axle and the contact pressure for installing the probe unit Connecting plate is closed, the sliding axle runs through the both side surface of the sliding block respectively and described in first guide rail and second guide rail Track groove is slidably matched, and the contact pressing connecting plate is mounted on the bottom of the sliding block.

Further, the sliding rail of the track groove include from top to bottom successively transition connect arc-shaped the It one orbital segment, the second orbital segment diagonally downward, horizontal third orbital segment and is more tilted towards than second orbital segment Under the 4th orbital segment.

Further, the top of the track groove is equipped with the first limiting slot, and the bottom of the track groove is equipped with the second limit Slot.

It further, further include the elastic component that the side of the slide block assembly is set, one end of the elastic component and institute Mounting base connection is stated, the other end of the elastic component is connected with the slide block.

Further, the elastic component is tension spring, and the telescopic direction of the tension spring is identical as the glide direction of the sliding block.

Further, one end of the tension spring is connect by the first tension spring pulling plate with the mounting base, the tension spring it is another One end is connected with the slide block by the second tension spring pulling plate, the tie point that described one end of the tension spring is connect with the mounting base Height lower than the height of tie point that the other end of the tension spring is connected with the slide block.

Further, the probe unit is PCB contact, and the PCB contact is pasted onto the bottom of the contact pressing connecting plate Portion.

It further, further include the cushion being arranged in the mounting base, the cushion is pasted onto the mounting base On, for buffering the element to be tested.

The advantages of the utility model, is as follows:

(1) contact contact device provided by the utility model is cooperated by sliding block, sliding rail drives detecting element and electricity The contact of sub- component directly contacts, solve abnormity, structure is complicated, the electronic component with abnormity FPCB (c-type, Z-type etc.) Contact can not engaged test the problem of, improve testing efficiency；

(2) structure that the utility model is cooperated using slide block assembly and sliding rail, structure is simple, easy to operate, it is only necessary to operate Contact contact can be realized in the sliding of slide block assembly.

Detailed description of the invention

By reading the following detailed description of the preferred embodiment, various other advantages and benefits are common for this field Technical staff will become clear.The drawings are only for the purpose of illustrating a preferred embodiment, and is not considered as practical to this Novel limitation.And throughout the drawings, the same reference numbers will be used to refer to the same parts.

Fig. 1 is the structural schematic diagram that contact provided by the embodiment of the utility model contacts device；

Fig. 2 is the enlarged structure schematic diagram of encircled portion in Fig. 1；

Fig. 3 is the structural schematic diagram for the other direction that contact provided by the embodiment of the utility model contacts device；

Fig. 4 is the structural schematic diagram for the slide block assembly that contact provided by the embodiment of the utility model contacts device；

Fig. 5 is the decomposition diagram for the slide block assembly that contact provided by the embodiment of the utility model contacts device；

Fig. 6 is the structural schematic diagram for the mounting base that contact provided by the embodiment of the utility model contacts device；

Fig. 7 is the motion profile figure for the slide block assembly that contact provided by the embodiment of the utility model contacts device；

Appended drawing reference is as follows in figure:

The contact 10- element 101- to be tested

1- mounting base the first placement space of 11-

12- the second placement space 13- location hole

2- guide rail the first guide rail of 21-

22- the second guide rail 23- track groove

231- the first orbital segment the second orbital segment of 232-

The 4th orbital segment of 233- third orbital segment 234-

235- the first limiting slot the second limiting slot of 236-

3- slide block assembly 31- sliding block

311- operation portion 312- mounting portion

The contact sliding axle 33- 32- presses connecting plate

331- mounting groove 332- trench structure

4- probe unit 5- tension spring

61- the first tension spring pulling plate 62- the second tension spring pulling plate

611- the first tension spring the second tension spring of hole 621- hole

71- the first bolt the second bolt of 72-

The 4th bolt of 73- third bolt 74-

8- cushion

Specific embodiment

The illustrative embodiments of the disclosure are more fully described below with reference to accompanying drawings.Although showing this public affairs in attached drawing The illustrative embodiments opened, it being understood, however, that may be realized in various forms the disclosure without the reality that should be illustrated here The mode of applying is limited.It is to be able to thoroughly understand the disclosure on the contrary, providing these embodiments, and can be by this public affairs The range opened is fully disclosed to those skilled in the art.

Although can be described in the text using term first, second, third, etc. multiple element, component, region, layer and/ Or section, still, these component, assembly units, region, layer and/or section should not be limited by these terms.These terms can be only For a component, assembly unit, region, layer or section are distinguished with another region, layer or section.Unless context clearly refers to Out, do not implied that when otherwise the term and other numerical terms of such as " first ", " second " etc use in the text sequence or Person's order.Therefore, first element discussed below, component, region, layer or section are in the introduction for not departing from example embodiment In the case of can be referred to as second element, component, region, layer or section.

For ease of description, an element as illustrated in the diagram can be described use space relativeness term in the text Either feature is relative to another element or the relationship of feature, these relativeness terms are, for example, " inside ", " outside ", " interior Side ", " outside ", " following ", " lower section ", " above ", " top " etc..This spatial correlation term is intended to include removing to retouch in figure The different direction of device in use or operation except the orientation drawn.For example, being retouched if the device in figure is overturn State for " below other elements or feature " either the element " below other elements or feature " will then be orientated " Above other elements or feature " either " above other elements or feature ".Therefore, exemplary term " in ... lower section " can To include in orientation upper and under.In addition device can be oriented and (be rotated by 90 ° or in other directions) and used herein Spatial correlation descriptor correspondingly explains.

Fig. 1 to Fig. 6 shows the schematic diagram for the contact contact device that embodiment according to the present utility model provides.Such as figure 1 to shown in Fig. 6, and contact device in contact provided by the utility model includes mounting base 1, the guide rail being fixedly mounted in mounting base 12 And the slide block assembly 3 being slidably connected with guide rail 2, the bottom of slide block assembly 3 are equipped with probe unit 4, slide block assembly 3 being capable of edge Guide rail 2 slides between first position (highest point position) and the second position (lowest point), in first position, member to be tested Part 10 can be placed in mounting base 1, in the second position, probe unit 4 and the element to be tested 10 that is placed in mounting base 1 Contact 101 contacts.Element 10 to be tested is illustrated by taking c-type FPCB (flexible printed circuit board) as an example in present embodiment, Contact 101 is at c-type end.

Specifically, mounting base 1 is equipped with for installing the first placement space 11 of guide rail 2 and for placing member to be detected Second placement space 12 of part 10.Guide rail 2 is positioned in the first placement space 11 by positioning pin, and by the first bolt 71 with Mounting base 1 is fixedly connected, and the first placement space 11 is equipped with the location hole 13 with detent fit.

Guide rail 2 includes longitudinally opposed first guide rail 21 disposed in parallel and the second guide rail 22, and slide block assembly 3 is arranged first Between guide rail 21 and the second guide rail 22.The side of first guide rail 21 and the second guide rail 22 is equipped with inclined track groove 23, sliding block Component 3 can be slided along the sliding rail of track groove 23, when slide block assembly 3 slides into minimum point, be mounted on slide block assembly 3 The probe unit 4 of bottom can be pressed with the contact 101 of element 10 to be tested and be contacted.

In preferred implementation, the first guide rail 21 and the second guide rail 22 are L-type structure, including horizontally disposed transverse slat and vertical The vertical plate of setting, track groove 23 are provided on vertical plate, and transverse slat is fixed in mounting base 1 by the first bolt 71.

Slide block assembly 3 includes that sliding block 31, sliding axle 32 and the contact for installing probe unit 4 press connecting plate 33, sliding Moving axis 32 is mounted on the side of sliding block 31, and through the both side surface of sliding block 31 respectively with the first guide rail 21 and the second guide rail 22 Track groove 23 is slidably matched, and contact pressing connecting plate 33 is fixedly mounted on the bottom of sliding block 31, probe unit 4 by the second bolt 72 It is mounted on the bottom of contact pressing connecting plate 33.

Sliding block 31 is T-type structure, including operation portion 311 and the mounting portion extended in the bottom of operation portion 311 to two sides 312, the through-hole matched with sliding axle 32 is offered on mounting portion 312.To guarantee that cooperation is firm, sliding block 31 and sliding axle 32 it Between fixed by viscose glue close-fitting.

Contact pressing connecting plate 33 is equipped with the mounting groove 331 for installing probe unit 4 and connects with element 10 to be tested The trench structure 332 connect, trench structure 332 extend outwardly along the interconnecting piece with sliding block 31, and mounting groove 331 is arranged in trench structure 332 bottom, element 10 to be tested can be placed in trench structure 332, and the c-type contact 101 of element 10 to be tested can be with The probe unit 4 being mounted in mounting groove 331 contacts.In specific implementation, probe unit 4 is PCB contact, by viscose glue by PCB Contact is adhesively fixed on mounting groove 331.

Particularly, as shown in Fig. 2, the sliding rail of track groove 23 is the track of substantial inclination, including from top to bottom Successively the first orbital segment 231, the second orbital segment 232, third orbital segment 233 and the 4th orbital segment 234 of transition connection.First Orbital segment 231 is the arc track of semicircle shape, and the top of arc track is equipped with limiting section, limiting section and the first orbital segment 231 The first limiting slot 235 is cooperatively formed, sliding axle 32 can be limited in the first limiting slot 235；Second orbital segment 232 is inclination Downward rectilinear orbit, this section of track is longer, prepares for the decline of test, and sliding block 31 drives the inclination decline of probe unit 4 to lean on Nearly element 10 to be tested；Third orbital segment 233 is horizontal rail, and sliding block 31 drives trench structure 332 when this section of track is mobile It is moved horizontally to position corresponding with element 10 to be tested, the partial insertion of the element to be tested 10 comprising contact 101 is installed In slot 331；4th orbital segment 234 is rectilinear orbit diagonally downward, to push test phase, the slope of the 4th orbital segment 234 Greater than the slope of the second orbital segment 232, it can be contacted for contact and biggish pressure, also, the bottom of the 4th orbital segment 234 are provided The second limiting slot 236 equipped with spill when sliding axle 32 slides into least significant end, can be fixed in the second limiting slot 236 In, at this point, probe unit 4 and the contact of element 10 to be tested are pressed into contact with.Four sections of different orbital segments, existing tilting section are set There is horizontal segment again, and the slope of tilting section is different, and sliding block 31 can be made to drive the contact of probe unit 4 and element 10 to be tested 101 Dock With Precision Positions simultaneously contact.

Contact contact device further includes the elastic component that the side of sliding block 31 is arranged in, such as tension spring 5, and the setting of tension spring 5 is being leaned on One end of the side of nearly 4th orbital segment 234, tension spring 5 is connect with mounting base 1, and the other end of tension spring 5 is connect with sliding block 31.

Tension spring 5 connect respectively by tension spring pulling plate with mounting base 1 and sliding block 31, and one end of the first tension spring pulling plate 61 passes through the Three bolts 73 are fixedly mounted in mounting base 1, and the other end of the first tension spring pulling plate 61 is equipped with connect with one end of tension spring 5 first Tension spring hole 611；One end of second tension spring pulling plate 62 is fixedly mounted on sliding block 31 by the 4th bolt 74, the second tension spring pulling plate 62 The other end be equipped with the second tension spring hole 621 for connecting with the other end of tension spring 5.

The height of sliding block 31 is higher than the height of mounting base 1, i.e. the height of the tie point of one end that connect with sliding block 31 of tension spring 5 The height of the tie point of the one end being connect with mounting base 1 higher than tension spring 5, so that inclination (flexible) direction of tension spring 5 and sliding block 31 Glide direction (inclined direction of track groove 23) it is identical, under the action of 5 pulling force of tension spring, tension spring 5 is able to drive sliding axle 32 Sliding rail along track groove 23 slides into the 4th orbital segment 234 from the first orbital segment 231 (highest point position) of track groove 23 (lowest point).

When assembly, first sliding block 31, sliding axle 32 and contact the pressing assembly of connecting plate 33 are structure as a whole, constitute sliding block group Part 3.Secondly, the first guide rail 21 is fixedly mounted in mounting base 1, then the one end for being assemblied in integrated sliding axle 32 is packed into the In the track groove 23 of one guide rail 21, the second guide rail 22 worked good with the other end of sliding axle 32 is fixed on mounting base 1 later On；Finally, installing tension spring 5 by tension spring pulling plate.Sliding axle 32 is slidably connected in a manner of clearance fit with track groove 23.

To prevent pressure excessive, element 10 to be tested is damaged, for placing the second placement space 12 of element 10 to be tested It is additionally provided with cushion 8, cushion 8 is pasted onto the second placement space 12.

The working principle of the utility model is as follows:

As shown in Figure 1 to Figure 3, corresponding since the sliding rail of track groove 23 is divided into four sections, according to the sliding of sliding block 31 The test process of element 10 to be tested can be divided into four stages as shown in Figure 7 by track.

Firstly, pushing the upper end of sliding block 31, sliding axle 32 can be slided along power thrusts in the track groove 23 of guide rail 2 and be driven Contact pressing connecting plate 33 and probe unit 4 are moved along track groove 23, are pushed sliding block 31 to the highest point of track groove 23 and are mentioned upwards It draws, sliding axle 32 is articulated in the first limiting slot 235 of the vertex end of track groove 23.This stage is that the highest point of test is stopped The only stage prepares for test.

Secondly, element 10 to be tested is put well by scheduled position, in present embodiment, element 10 to be tested is placed on slot At type structure 332, sliding block 31 is unclamped, under the pulling force effect of tension spring 5, slide block assembly 3 resets and moves to downwards along sliding rail The minimum point of track groove 23, and limit in the second limiting slot 236, element 10 to be tested is compressed, realizes contact engaged test.

When sliding block 31 slides down to the second orbital segment 232, for the decline preparation stage of test, sliding block 31 is with movable contact The trench structure 332 for pressing connecting plate 33 is close to element 10 to be tested；When sliding block 31 slides into third orbital segment 233, to survey The insertion stage of examination cooperates with element 10 to be tested at this point, sliding block 31 drives trench structure 332 to move horizontally, makes member to be tested Part 10 is placed on the corresponding position of trench structure 332, prepares contact contact；When sliding block 31 slides into four orbital segments 234, it is The pushing test phase of test, the 4th orbital segment 234 are that sliding block 31 provides a steeper lower pressure, enable probe unit 4 It is enough to be contacted with the pressing of contact 101.

In specific implementation, the motion profile of sliding block 31 is not limited to above-mentioned track, can basis progress herein according to actual needs Editor realizes hardware and software platform, the standardization of test.

Contact contact device provided by the utility model is cooperated by sliding block, sliding rail drives detecting element and electronics member The contact of device directly contacts, and solves that abnormity, structure is complicated, the touching of electronic component with abnormity FPCB (c-type, Z-type etc.) Point can not engaged test the problem of, improve testing efficiency；The structure cooperated using slide block assembly and sliding rail, structure is simple, operation It is convenient, it is only necessary to which that contact contact can be realized in the sliding for operating slide block assembly；The utility model is applicable not only to electronic component Test, applies also for crimping, hot melt, pressure maintaining of electronic component etc., applied widely.

The preferable specific embodiment of the above, only the utility model, but the protection scope of the utility model is not It is confined to this, anyone skilled in the art within the technical scope disclosed by the utility model, can readily occur in Change or replacement, should be covered within the scope of the utility model.Therefore, the protection scope of the utility model should be with Subject to the scope of protection of the claims.

Claims (10)

1. a kind of contact contacts device, which is characterized in that including mounting base, the guide rail being fixedly mounted in the mounting base and The slide block assembly being slidably connected with the guide rail, the bottom of the slide block assembly are equipped with probe unit, the slide block assembly energy Enough to slide between the first location and the second location along the guide rail, in the first position, element to be tested be can be placed at In the mounting base, in the second position, the probe unit and the element to be tested being placed in the mounting base Contact contact.

2. contact according to claim 1 contacts device, which is characterized in that the guide rail includes relatively disposed in parallel the One guide rail and the second guide rail, the slide block assembly are mounted between first guide rail and second guide rail, and described first leads The track groove with slide block assembly cooperation is equipped on rail and second guide rail.

3. contact according to claim 2 contacts device, which is characterized in that the slide block assembly includes sliding block, sliding axle And contact for installing the probe unit presses connecting plate, the sliding axle through the sliding block both side surface respectively with The track groove of first guide rail and second guide rail is slidably matched, and the contact pressing connecting plate is mounted on the sliding block Bottom.

4. contact according to claim 2 contacts device, which is characterized in that the sliding rail of the track groove includes from top Portion is to bottom the first arc-shaped orbital segment that successively transition connects, the second orbital segment diagonally downward, horizontal third track Section and the 4th orbital segment than second orbital segment more diagonally downward.

5. contact according to claim 2 contacts device, which is characterized in that the top of the track groove is equipped with the first limit The bottom of slot, the track groove is equipped with the second limiting slot.

6. contact according to claim 3 contacts device, which is characterized in that further include one that the slide block assembly is arranged in The elastic component of side, one end of the elastic component are connect with the mounting base, and the other end of the elastic component is connected with the slide block.

7. contact according to claim 6 contacts device, which is characterized in that the elastic component is tension spring, the tension spring Telescopic direction is identical as the glide direction of the sliding block.

8. contact according to claim 7 contacts device, which is characterized in that drawn by the first tension spring one end of the tension spring Plate is connect with the mounting base, and the other end of the tension spring is connected with the slide block by the second tension spring pulling plate, the tension spring The height for the tie point that described one end is connect with the mounting base is connected with the slide block lower than the other end of the tension spring Tie point height.

9. contact according to claim 3 contacts device, which is characterized in that the probe unit is PCB contact, described PCB contact is pasted onto the bottom of the contact pressing connecting plate.

10. contact according to claim 1 contacts device, which is characterized in that further include being arranged in the mounting base Cushion, the cushion are pasted onto the mounting base, for buffering the element to be tested.