CN209417328U - A kind of photonic crystal of pair of Defect Modes reflectivity enhancing - Google Patents

A kind of photonic crystal of pair of Defect Modes reflectivity enhancing Download PDF

Info

Publication number
CN209417328U
CN209417328U CN201920245931.6U CN201920245931U CN209417328U CN 209417328 U CN209417328 U CN 209417328U CN 201920245931 U CN201920245931 U CN 201920245931U CN 209417328 U CN209417328 U CN 209417328U
Authority
CN
China
Prior art keywords
layer
defect
photonic crystal
dielectric layer
dielectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201920245931.6U
Other languages
Chinese (zh)
Inventor
钟东
文杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hubei University of Science and Technology
Original Assignee
Hubei University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hubei University of Science and Technology filed Critical Hubei University of Science and Technology
Priority to CN201920245931.6U priority Critical patent/CN209417328U/en
Application granted granted Critical
Publication of CN209417328U publication Critical patent/CN209417328U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The utility model provides the photonic crystal of a kind of pair of Defect Modes reflectivity enhancing, belongs to field of photoelectric technology.A kind of photonic crystal of high reflectance, this photonic crystal include the first dielectric layer, the second dielectric layer, defect layer and graphene layer, and defect layer is located at the middle part of electron crystal;The regularity of distribution of first dielectric layer and the second dielectric layer are as follows: the two sides of defect layer have been alternately arranged several first dielectric layers and several second dielectric layers, and two lateral surfaces of photonic crystal are the first dielectric layer, the two sides close to defect layer are the second dielectric layer;Graphene layer is embedded in defect layer.The utility model has many advantages, such as can be by the way that graphene to be doped in the defect layer of photonic crystal, to improve Defect Modes reflectivity, cause reflection coefficient phase acute variation and the big lateral displacement of the reflected beams.

Description

A kind of photonic crystal of pair of Defect Modes reflectivity enhancing
Technical field
The utility model belongs to photoelectricity technical field, is related to the photonic crystal of a kind of pair of Defect Modes reflectivity enhancing.
Background technique
There are band gap for energy band in photonic crystal.When illumination is mapped on photonic crystal, if the frequency of light is located at band gap Interior, then it will not penetrate photonic crystal by light, light beam will be totally reflected.But if defect is added in the photonic crystal Layer, then there are a Defect Modes in the band gap of energy band.When the frequency of incident light is equal to the frequency of Defect Modes, light beam is by areflexia All by photonic crystal, reflectivity at this time is zero, therefore Defect Modes is also called Transmission Modes.The energy of Defect Modes mainly divides For cloth in defect layer, the Energy distribution of the center of defect layer is most strong.Extend from defect layer center to photonic crystal both sides, lacks The Energy distribution for falling into mould exponentially decays.
The lateral displacement of the reflected beams can be widely applied to high sensor and photoswitch etc..But usual situation Under, the lateral displacement of the reflected beams is smaller, generally with regard to several wavelength or tens wavelength, therefore to the cross for experimentally detecting light beam Very big difficulty is brought to displacement and practical application.People enhance the lateral displacement of the reflected beams by a variety of methods, such as Biggish lateral displacement is realized using the band gap edge of photonic crystal, weak loss material and graphene etc..
The lateral displacement of the reflected beams is proportional to reflection coefficient phase to the derivative of wave vector, since the reflectivity of Defect Modes is Zero, there is uncertainty in the reflection coefficient phase of Defect Modes, therefore there may be biggish lateral positions for the reflected beams of Defect Modes It moves.But for the photonic crystal of no gain and loss, the reflectivity of Defect Modes is zero, even if there is biggish transverse direction at this time Displacement, but be actually also meaningless.
Utility model content
The purpose of this utility model is aiming at the above problems existing in the prior art, to provide a kind of photon of high reflectance Crystal, technical problem to be solved in the utility model be how by the way that graphene is doped in the defect layer of photonic crystal, To improve reflectivity.
The purpose of this utility model can be realized by the following technical scheme: a kind of photonic crystal of high reflectance, special Sign is that this photonic crystal includes the first dielectric layer, the second dielectric layer, defect layer and graphene layer, the defect layer position In the middle part of electron crystal;The regularity of distribution of first dielectric layer and the second dielectric layer are as follows: the two sides of the defect layer Several first dielectric layers and several second dielectric layers are alternately arranged, and two lateral surfaces of photonic crystal are that the first electricity is situated between Matter layer, the two sides close to defect layer are the second dielectric layer;The graphene layer is embedded in defect layer.
Dielectric layer one and dielectric layer two can be the common dielectric in this field, such as magnesium fluoride, zinc sulphide.
Graphene is doped in the defect layer of photonic crystal by we, using the weak loss of graphene, weakens photonic crystal To the transmissivity of Defect Modes, to improve the reflectivity of light beam.Meanwhile the weak loss of graphene can also cause reflection coefficient phase Change dramatically.It is proportional to reflection coefficient phase change rate according to the reflected beams lateral displacement, is lacked when the incident frequencies of light are located at When falling near mould, the available biggish lateral displacement of the reflected beams.
The refractive index of first dielectric layer, the second dielectric layer and defect layer is respectively na=1.38, nb=2.35 and nc= 2.35, the thickness of the first dielectric layer, the second dielectric layer and defect layer is respectively da=0.281 μm, db=0.165 μm and dc =0.33 μm.Incident ray is denoted as 1, reflection light is denoted as 2, and transmitted ray is denoted as 3.By reflection light relative to incidence point Lateral displacement is denoted as Δ.
Single-layer graphene is entrained in the centre of defect layer, that is, is located at 0 position of z-axis of photonic crystal.Single-layer graphene The two-dimensional material for disregarding thickness, surface conductivity can be described with nine fort formula (Kuboformula), it is as follows:
Wherein, fd=1/ (1+exp [(ε-μc)/(kBIt T is)]) Fermi-Dirac statistics, ε is particle energy, μcIt is graphite Alkene chemical potential (is also called fermi level EF)), T is temperature, and e is elementary charge, and τ is momentum relaration time, kBIt is Boltzmann Constant.
Graphene layer is regarded as with certain thickness dielectric, it is this to wait efficacious prescriptions when equivalent thickness is lower than 1nm Method is negligible to the influence for calculating reflectivity and transmissivity.We take graphene layer with a thickness of 0.34nm.Graphene Effective dielectric constant be εg=1+i σgη0/(kdg), wherein k is incident wave vector, η0It is vacuum impedance.Temperature takes T=27 DEG C, moves Measure relaxation time τ=0.5ps, μc=0.15eV.
Total is (AB)NCGC(BA)N(it is assumed that the first dielectric layer be A, the second dielectric layer be B, defect layer C, Graphene layer is G), wherein Bragg period number N=5.
If incident light is TM wave, propagated along z-axis.The electromagnetic field at each layer of dielectric both ends can be contacted by transmission matrix Get up.For example, the electromagnetic field at l layers of dielectric both ends can be got up by following relationship
Wherein, MlIt is l layers of transmission matrix, wherein ηll00)1/2/(εl-sin2θ)1/2,θ is the incidence angle of light, is set as θ=20 ° here.The transmission matrix of whole system is
Wherein n is total number of plies of structure.Reflection coefficient is
Wherein η1N+1=(ε00)1/2(1-sin2θ)1/2, the respectively impedance of incidence end and exit end, reflectivity R =rr*.The band gap of photonic crystal is ωgap=4 ω0arcsin│(nb-na)/(nb+na)│2/ π, wherein ω0=2 π c/ λ0, λ0= 1.55μm。
If undoped with graphene layer, it can be seen that reflectivity is the function of incident light frequency.There are one among reflectance spectrum A band gap, the light in this band gap will all be reflected.But the reflectivity of the position * Defect Modes is zero, Defect Modes Light will be transmitted all, therefore also be Transmission Modes.
According to the relationship of the lateral displacement of the reflected beams and reflection coefficient phase
It is recognised that the lateral displacement of the reflected beams near Defect Modes is larger.But reflectivity at this moment is smaller, because Graphene is doped in defect layer by we for this, obtains biggish reflectivity.
After doped graphene layer, the reflectivity of the position * Defect Modes is not zero, R=0.212.Phase at Defect Modes does not have There is jump, but changes more violent.Therefore, available reflectivity is not zero, and has the reflected light of relatively larger transverse displacement again Beam.
When incident light frequency is located at Defect Modes, the lateral displacement of the reflected beams is maximum, and maximum value is Δ=124 λ.
The advantages of the utility model: the doped graphene in Defect Photonic Crystal can greatly improve the reflection of Defect Modes Rate, in present case, the maximum reflectivity of Defect Modes can reach R=0.212;It can make the lateral displacement maximum value of the reflected beams Reach 124 λ, improves a magnitude than the lateral displacement in general structure.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of this electron crystal.
Fig. 2 is the reflectivity and reflection coefficient phase of the Defect Modes undoped with graphene.
Fig. 3 is the reflectivity and reflection coefficient phase of the Defect Modes of doped graphene.
Fig. 4 is the lateral displacement of the reflected beams in the Defect Photonic Crystal of doped graphene.
In figure, A, the first dielectric layer;B, the second dielectric layer;C, defect layer;G, graphene layer.
Specific embodiment
It is specific embodiment of the utility model and in conjunction with attached drawing below, the technical solution of the utility model is made further Description, but the utility model is not limited to these examples.
This photonic crystal includes the first dielectric layer A, the second dielectric layer B, defect layer C and graphene layer G, defect layer C Positioned at the middle part of electron crystal;The regularity of distribution of first dielectric layer A and the second dielectric layer B are as follows: the two sides of defect layer C replace Several first dielectric layer A and several second dielectric layer B are arranged with, and two lateral surfaces of photonic crystal are the first dielectric Layer A, the two sides close to defect layer C are the second dielectric layer B;Graphene layer G is embedded in defect layer C.
As shown in Figure 1, the refractive index of the first dielectric layer A, the second dielectric layer B and defect layer C is respectively na=1.38, nb=2.35 and ncThe d that the thickness of=2.35, the first dielectric layer A, the second dielectric layer B and defect layer C are respectivelya= 0.281, db=0.165 and dc=0.33 μm.Incident ray is 1, reflection light 2, transmitted ray 3.Reflection light relative to There are the displacements of a transverse direction for incidence point.
Graphene is entrained in the centre of defect layer, i.e. the 0 of z-axis position.Graphene is the two-dimensional material of not thickness, Surface conductivity can be described with nine fort formula (Kuboformula), it is as follows:
Wherein, fd=1/ (1+exp [(ε-μc)/(kBIt T is)]) Fermi-Dirac statistics, ε is particle energy, μcIt is graphite Alkene chemical potential (is also called fermi level EF)), T is temperature, and e is elementary charge, and τ is momentum relaration time, kBIt is Boltzmann Constant.
Graphene is regarded as with certain thickness dielectric, when equivalent thickness is lower than 1nm, this equivalent method It is negligible to the influence for calculating reflectivity and transmissivity.Here we take graphene with a thickness of 0.34nm.Graphene Effective dielectric constant be εg=1+i σgη0/(kdg), wherein k is incident wave vector, η0It is vacuum impedance.Temperature takes T=27 DEG C, moves Measure relaxation time τ=0.5ps, μc=0.15eV.
Total is (AB)NCGC(BA)N, wherein Bragg period number N=5.
If incident light is TM wave, propagated along z-axis.The electromagnetic field at each layer of dielectric both ends can be contacted by transmission matrix Get up.For example, the electromagnetic field at l layers of dielectric both ends can be got up by following relationship
Wherein MlIt is l layers of transmission matrix, wherein ηll00)1/2/(εl-sin2θ)1/2,θ is the incidence angle of light, is set as θ=20 ° here.The transmission matrix of whole system is
Wherein n is total number of plies of structure.Reflection coefficient is
Wherein η1N+1=(ε00)1/2(1-sin2θ)1/2, the respectively impedance of incidence end and exit end, reflectivity R =rr*.The band gap of photonic crystal is ωgap=4 ω0arcsin│(nb-na)/(nb+na)│2/ π, wherein ω0=2 π c/ λ0, λ0= 1.55μm。
(a) is the reflectivity of Defect Modes in the Defect Photonic Crystal undoped with graphene in Fig. 2.It can be seen that reflectivity It is the function of incident light frequency.There are a band gap among reflectance spectrum, and the light in this band gap will all be reflected.But It is that the reflectivity of the position * Defect Modes is zero, the light of Defect Modes will be transmitted all, therefore also be Transmission Modes.It is by reflection Number is write as the form of indexWhereinIt is the phase of reflection coefficient.(b) is undoped with graphene in Fig. 2 The reflection coefficient phase of Defect Modes in Defect Photonic Crystal, it can be seen that have the phase hit of a π at Defect Modes position.Cause Reflectivity for Defect Modes is zero, therefore there are the phases of reflection coefficient there is uncertainty.Meanwhile near Defect Modes, instead It is more violent to penetrate coefficient phase variation.According to the relationship of the lateral displacement of the reflected beams and reflection coefficient phase
It is recognised that the lateral displacement of the reflected beams near Defect Modes is larger.But reflectivity at this moment is smaller, because Graphene is doped in defect layer by we for this, obtains biggish reflectivity.
Fig. 3 (a) is the reflectivity of Defect Modes in the Defect Photonic Crystal of doped graphene.It can be seen that the position * defect The reflectivity of mould is not zero, in present case, the maximum reflectivity R=0.212 of Defect Modes.Fig. 3 (b) is lacking for doped graphene Fall into the reflection coefficient phase of Defect Modes in photonic crystal.It can be seen that the phase at Defect Modes does not jump, but variation is compared Acutely, therefore available reflectivity is not zero, and the reflected beams with relatively larger transverse displacement.
Fig. 4 is the lateral displacement of the reflected beams in the Defect Photonic Crystal of doped graphene.It can be seen that when incident optical frequency When rate is located at Defect Modes, the lateral displacement of the reflected beams is maximum, and maximum value is Δ=124 λ.
So visible: the doped graphene in Defect Photonic Crystal can greatly improve the reflectivity of Defect Modes, present case In, the maximum reflectivity of Defect Modes can reach R=0.212;The lateral displacement maximum value of the reflected beams can be made to reach 124 λ, than Lateral displacement in general structure improves a magnitude.
The specific embodiments described herein are merely examples of the spirit of the present invention.The utility model institute Belonging to those skilled in the art can make various modifications or additions to the described embodiments or using similar Mode substitute, but without departing from the spirit of the present application or beyond the scope of the appended claims.

Claims (2)

1. the photonic crystal of a kind of pair of Defect Modes reflectivity enhancing, which is characterized in that this photonic crystal includes the first dielectric layer (A), the second dielectric layer (B), defect layer (C) and graphene layer (G), the defect layer (C) are located at the middle part of electron crystal;Institute State the regularity of distribution of the first dielectric layer (A) and the second dielectric layer (B) are as follows: the two sides of the defect layer (C) have been alternately arranged Several first dielectric layers (A) and several second dielectric layers (B), and two lateral surfaces of photonic crystal are the first dielectric layer It (A), is the second dielectric layer (B) close to the two sides of defect layer (C);The graphene layer (G) is embedded in defect layer (C).
2. the photonic crystal of a kind of pair of Defect Modes reflectivity enhancing according to claim 1, which is characterized in that the first dielectric The refractive index of layer (A), the second dielectric layer (B) and defect layer (C) is respectively na=1.38, nb=2.35 and nc=2.35, first The thickness of dielectric layer (A), the second dielectric layer (B) and defect layer (C) is respectively da=0.281 μm, db=0.165 μm and dc =0.33 μm.
CN201920245931.6U 2019-02-27 2019-02-27 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing Expired - Fee Related CN209417328U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920245931.6U CN209417328U (en) 2019-02-27 2019-02-27 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920245931.6U CN209417328U (en) 2019-02-27 2019-02-27 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing

Publications (1)

Publication Number Publication Date
CN209417328U true CN209417328U (en) 2019-09-20

Family

ID=67944933

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920245931.6U Expired - Fee Related CN209417328U (en) 2019-02-27 2019-02-27 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing

Country Status (1)

Country Link
CN (1) CN209417328U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109669227A (en) * 2019-02-27 2019-04-23 湖北科技学院 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109669227A (en) * 2019-02-27 2019-04-23 湖北科技学院 A kind of photonic crystal of pair of Defect Modes reflectivity enhancing
CN109669227B (en) * 2019-02-27 2024-04-05 湖北科技学院 Photonic crystal with enhanced reflectivity to defect mode

Similar Documents

Publication Publication Date Title
Aly et al. Theoretical study of hybrid multifunctional one-dimensional photonic crystal as a flexible blood sugar sensor
Fang et al. Polarization‐independent multiband metamaterials absorber by fundamental cavity mode of multilayer microstructure
Anopchenko et al. Field-effect tunable and broadband epsilon-near-zero perfect absorbers with deep subwavelength thickness
Wang et al. The investigation of an LSPR refractive index sensor based on periodic gold nanorings array
Maas et al. Experimental realization of an epsilon-near-zero metamaterial at visible wavelengths
An et al. Quasi-D-shaped optical fiber plasmonic refractive index sensor
Binfeng et al. Fano resonances in a plasmonic waveguide system composed of stub coupled with a square cavity resonator
Shabat et al. Design and analysis of multilayer waveguides containing nanoparticles for solar cells
Hu et al. Diamagnetic response of metallic photonic crystals at infrared and visible frequencies
CN209417328U (en) A kind of photonic crystal of pair of Defect Modes reflectivity enhancing
Lu et al. Coupling between surface plasmon polariton and planar waveguide modes in the biosensor based on metal–insulator–metal/planar waveguide structure
Jiang et al. Ultra-sensitive biosensor with hybrid coupling between molybdenum disulfide thin film and photonic waveguide mode
CN109669227A (en) A kind of photonic crystal of pair of Defect Modes reflectivity enhancing
Luo et al. Long-range surface plasmon resonance sensor based on side-polished D-shaped hexagonal structure photonic crystal fiber with the buffer layer of magnesium fluoride
Song et al. Enhanced spin Hall effect of light in the PT-symmetric trilayer structure containing epsilon-near-zero materials
CN215296471U (en) High-sensitivity optical wavelength sensor based on Gus-Hansen displacement
Jiang et al. Colloidal self-assembly based ultrathin metasurface for perfect absorption across the entire visible spectrum
Yin et al. Highly twisted M-line of a vortex beam due to the coupling of ultrahigh-order modes
Li et al. Double-layer chiral system with induced circular dichroism by near-field coupling
Yang et al. High-sensitivity three-core photonic crystal fiber sensor based on surface plasmon resonance with gold film coatings
Lu et al. Black phosphorus/waveguide terahertz plasmonic structure for ultrasensitive tunable gas sensing
Xiong et al. I-shaped stack configuration for multi-purpose splitter
Du et al. Mid-infrared refractive index photonic crystal fiber sensor based on surface plasmon resonance for ultra-high sensitivity
Xiao et al. Significantly enhanced sensitivity using a gold aperture arrays-dielectric hybrid structure in optical fiber sensor
CN215297721U (en) Photonic crystal capable of realizing large negative Gus-Hansen displacement

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190920

CF01 Termination of patent right due to non-payment of annual fee