CN209390016U - A kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter - Google Patents
A kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter Download PDFInfo
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- CN209390016U CN209390016U CN201920195158.7U CN201920195158U CN209390016U CN 209390016 U CN209390016 U CN 209390016U CN 201920195158 U CN201920195158 U CN 201920195158U CN 209390016 U CN209390016 U CN 209390016U
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- top board
- plug
- lower platen
- groups
- crystal silicon
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The utility model relates to solar battery single chip tester technical fields, specifically a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter, including test machine and testboard, four groups of jacks are provided on the test machine, the testboard is electrically connected with connected structure by conducting wire, the connected structure is by top board, lower platen and plug composition, four groups of arc slots are equidistantly provided on the top board and lower platen, the top board both ends are symmetrically arranged with snap-gauge, the pushing board ends are symmetrically arranged with card slot, the arc trench bottom of the lower platen is provided centrally with screw hole, fastening screw is bolted in the screw hole.The utility model changes into jack by the structure that the original screw of test machine is pressed wiring, corresponding plug is arranged to testboard external connection test thread end simultaneously, and plug is fixed by top board and lower platen, can quickly realize the conversion connection of front and back when to crystal silicon solar double-side cell parameter testing.
Description
Technical field
The utility model relates to solar battery single chip tester technical field, it is brilliant to be conducive to test for specifically one kind
The attachment device of silicon solar double-side cell parameter.
Background technique
As solar battery in the market is constantly efficient, occupation rate is continuously improved double-side cell in the market, double
Face battery enables the two-sided rate of PECR crystal silicon battery to reach 85%, N-type crystal silicon electricity in the cost for not increasing special process
The two-sided rate in pond can reach 90%, and the application of double-side cell can make component mention effect 10%-15%.But battery is carried on the back currently on the market
The parameter in face carries out regular requirement not yet, many manufacturers be all the power at the back side is sold in a manner of giving, but after
It is certain to be standardized requirement to rear surface of solar cell parameter.
Monolithic iv test machine currently on the market can only survey the positive parameter of crystal silicon battery under normal circumstances, double for testing
The parameter of face cell backside is more troublesome, needs to open test machine rear cabinet, carries out unloading screw thread-changing operation, i.e., V+ and V-
It mutually changes, I+ with I- phase is changed.
Utility model content
In order to make up the above deficiency, the utility model provides one kind and is conducive to test crystal silicon solar double-side cell parameter
Attachment device, to solve the problems in above-mentioned background technique.
The technical solution of the utility model is: a kind of connection dress for being conducive to test crystal silicon solar double-side cell parameter
It sets, including test machine and testboard, successively spaced set has four groups of jacks for the test machine front end, and the testboard is by leading
Line is electrically connected with connected structure, and the connected structure is made of top board, lower platen and plug, the plug by conducting wire with
Testboard is electrically connected, and four groups of arc slots are equidistantly provided on the top board and lower platen and arc slot and plug coincide and be arranged, institute
State top board both ends and be symmetrically arranged with snap-gauge, the pushing board ends are symmetrically arranged with card slot, the top board and lower platen it
Between be clamped by snap-gauge and card slot, the arc trench bottom of the lower platen is provided centrally with screw hole, fastening is bolted in the screw hole
Screw.
This setting
1. the test of crystal silicon solar double-side cell can be fast implemented, the utility model by by traditional test machine with
The conducting wire connected between testboard changes into both ends, and is plugged in together, after testing crystal silicon solar double-side cell front,
It only needs to pull the plug out of the socket to rotate 180 degree, the back side can be tested.
2. can interweave to avoid the confusion of plug, the utility model is successively fixed plug by top board and lower platen,
It can interlock to avoid plug wires, it is not easy to use.
Preferably, four groups of jacks being arranged on the test machine are successively electrically connected to inside test machine from left to right
SOL V+ line, SOL i+ line, SOL i- line and SOL V- line.
Preferably, between the spacing between jack center axis described in four groups and the arc groove center axis of top board and lower platen
Spacing is identical.
This setting ensure that four groups of plugs can correspond and be plugged in four groups of jacks.
Preferably, the plug is provided with four groups and correspondence is pressed together in arc slot, and plug described in four groups is followed successively by No.1 and inserts
Head, No. two plugs, No. three plugs and No. four plugs.
Preferably, fitting is provided with Sign Board at the corresponding four groups of arc slots in the top board upper surface.
This setting Sign Board is for being identified No.1 plug, No. two plugs, No. three plugs and No. four plugs, to match
Four groups of jacks are closed, are avoided when to crystal silicon solar double-side cell front and back parameter testing, grafting mistake.
Detailed description of the invention
In order to illustrate the embodiment of the utility model or the technical proposal in the existing technology more clearly, below will be to embodiment
Or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
It is some embodiments of the utility model, for those of ordinary skill in the art, before not making the creative labor property
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the utility model schematic perspective view；
Fig. 2 is the utility model connected structure schematic diagram；
Fig. 3 is the utility model connected structure explosive view.
In figure: 1, test machine；2, testboard；3, jack；4, connected structure；5, top board；6, lower platen；7, plug；71,
No.1 plug；72, No. two plugs；73, No. three plugs；74, No. four plugs；8, arc slot；9, snap-gauge；10, card slot；11, screw hole；
12, fastening screw；13, Sign Board.
Specific embodiment
The utility model is further illustrated in the following with reference to the drawings and specific embodiments.
With reference to Fig. 1-3 it is found that a kind of connection dress for being conducive to test crystal silicon solar double-side cell parameter of the utility model
It sets, including test machine 1 and testboard 2, successively spaced set has four groups of jacks 3, the testboard 2 for 1 front end of test machine
It is electrically connected with connected structure 4 by conducting wire, the connected structure 4 is made of top board 5, lower platen 6 and plug 7, described to insert
First 7 are electrically connected by conducting wire and testboard 2, are equidistantly provided with four groups of arc slots 8 and arc slot 8 on the top board 5 and lower platen 6
It coincide and is arranged with plug 7,5 both ends of top board are symmetrically arranged with snap-gauge 9, and 6 both ends of lower platen are symmetrically arranged with card slot
10, it is clamped between the top board 5 and lower platen 6 by snap-gauge 9 and card slot 10,8 bottom centre of Hu Cao of the lower platen 6 sets
It is equipped with screw hole 11, is bolted with fastening screw 12 in the screw hole 11.
Specifically, four groups of jacks 3 being arranged on the test machine 1 are successively electrically connected to inside test machine 1 from left to right
SOL V+ line, SOL i+ line, SOL i- line and SOL V- line.
Specifically, 8 central axis of arc slot of spacing between 3 central axis of jack described in four groups and top board 5 and lower platen 6 it
Between spacing it is identical.
Specifically, the plug 7 is provided with four groups and correspondence is pressed together in arc slot 8, plug 7 described in four groups is followed successively by No.1
The plug 73 of plug 72, three of plug 71, two and No. four plugs 74.
Specifically, fitting is provided with Sign Board 13 at the corresponding four groups of arc slots 8 in 5 upper surface of top board.
The present embodiment is when implementing, when to the front parameter testing of crystal silicon solar double-side cell, by arranging batteries
On testboard 2, then by the plug 7 on connected structure 4, according to the plug 73 and four of plug 72, three of No.1 plug 71, two
Number plug 74, which is corresponding in turn to, to be connected with the jack 3 of SOL V+ line, SOL i+ line, SOL i- line and SOL V- line and carries out grafting, i.e.,
Battery front side parameter can be tested；After testing battery front side parameter, it is only necessary to extract four groups of plugs 7, then according to
The plug 73 of plug 72, three of No.1 plug 71, two and No. four plugs 74 be corresponding in turn to be connected with SOL V- line, SOL i- line,
The jack 3 of SOL i+ line and SOL V+ line carries out grafting, i.e., connected structure 4 is rotated 180 degree, again insertable into jack 3
Cell backside parameter is tested.
The advantages of basic principles and main features and the utility model of the utility model have been shown and described above.Current row
The technical staff of industry is described in above embodiments and description it should be appreciated that the present utility model is not limited to the above embodiments
Only illustrate the principles of the present invention, on the premise of not departing from the spirit and scope of the utility model, the utility model is also
It will have various changes and improvements, these various changes and improvements fall within the scope of the claimed invention.The utility model
Claimed range is defined by the appending claims and its equivalent thereof.
Claims (5)
1. a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter, including test machine (1) and testboard
(2), it is characterised in that: successively spaced set has four groups of jacks (3) for test machine (1) front end, and the testboard (2) passes through
Conducting wire is electrically connected with connected structure (4), and the connected structure (4) is made of top board (5), lower platen (6) and plug (7),
The plug (7) is electrically connected by conducting wire and testboard (2), is equidistantly provided with four on the top board (5) and lower platen (6)
Group arc slot (8) and arc slot (8) and plug (7), which coincide, to be arranged, and top board (5) both ends are symmetrically arranged with snap-gauge (9), under described
Pressing plate (6) both ends are symmetrically arranged with card slot (10), pass through snap-gauge (9) and card slot between the top board (5) and lower platen (6)
(10) it is clamped, arc slot (8) bottom centre of the lower platen (6) is provided with screw hole (11), is bolted in the screw hole (11) tight
Gu screw (12).
2. a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter described in accordance with the claim 1, special
Sign is: four groups of jacks (3) being arranged on the test machine (1) are successively electrically connected to test machine (1) inside from left to right
SOL V+ line, SOL i+ line, SOL i- line and SOL V- line.
3. a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter described in accordance with the claim 1, special
Sign is: arc slot (8) central axis of spacing between jack described in four groups (3) central axis and top board (5) and lower platen (6) it
Between spacing it is identical.
4. a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter described in accordance with the claim 1, special
Sign is: the plug (7) is provided with four groups and the corresponding arc slot (8) that is pressed together on is interior, and plug described in four groups (7) is followed successively by No.1 and inserts
Head (71), No. two plugs (72), No. three plugs (73) and No. four plugs (74).
5. a kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter described in accordance with the claim 1, special
Sign is: fitting is provided with Sign Board (13) at the corresponding four groups of arc slots (8) in top board (5) upper surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920195158.7U CN209390016U (en) | 2019-02-14 | 2019-02-14 | A kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920195158.7U CN209390016U (en) | 2019-02-14 | 2019-02-14 | A kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209390016U true CN209390016U (en) | 2019-09-13 |
Family
ID=67854321
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201920195158.7U Expired - Fee Related CN209390016U (en) | 2019-02-14 | 2019-02-14 | A kind of attachment device for being conducive to test crystal silicon solar double-side cell parameter |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN209390016U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112986867A (en) * | 2021-02-25 | 2021-06-18 | 保定腾远电力科技有限公司 | Transformer winding deformation tester |
-
2019
- 2019-02-14 CN CN201920195158.7U patent/CN209390016U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112986867A (en) * | 2021-02-25 | 2021-06-18 | 保定腾远电力科技有限公司 | Transformer winding deformation tester |
| CN112986867B (en) * | 2021-02-25 | 2022-05-03 | 保定腾远电力科技有限公司 | Transformer winding deformation tester |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190913 Termination date: 20200214 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |