CN209348686U - A kind of electronic information engineering discipline testing stand - Google Patents

A kind of electronic information engineering discipline testing stand Download PDF

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Publication number
CN209348686U
CN209348686U CN201920008126.1U CN201920008126U CN209348686U CN 209348686 U CN209348686 U CN 209348686U CN 201920008126 U CN201920008126 U CN 201920008126U CN 209348686 U CN209348686 U CN 209348686U
Authority
CN
China
Prior art keywords
testing stand
information engineering
electronics
timing module
microcontroller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201920008126.1U
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Chinese (zh)
Inventor
许晨
常玉燕
石启飞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Vocational And Technological College
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Suzhou Vocational And Technological College
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to CN201920008126.1U priority Critical patent/CN209348686U/en
Application granted granted Critical
Publication of CN209348686U publication Critical patent/CN209348686U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model provides a kind of electronic information engineering discipline testing stand, including Electronics and Information Engineering testing stand and timing module B;The timing module A and the timing module B that the interruption monitoring box house is provided with the microcontroller and is connected with the microcontroller moderate electrical.When Electronics and Information Engineering testing stand powers on, at interval of 20min, to Electronics and Information Engineering testing stand, whether there is or not users to detect by set interruption monitoring cabinet for the utility model, when someone uses Electronics and Information Engineering testing stand, as long as pressing reset button in the 20s time set by timing module B, microcontroller will control timing module B and LED lamp bead is closed, and reset timing module A, audible and visible alarm is issued using the control audible-visual alarm lamp starting of Electronics and Information Engineering testing stand microcontroller when unmanned, to remind administrative staff's Current electronic information engineering testing stand is unmanned in the case where powering on to use, need to close this Electronics and Information Engineering testing stand.

Description

A kind of electronic information engineering discipline testing stand
Technical field
The utility model belongs to Electronics and Information Engineering testing stand technical field, more specifically, in particular to a kind of electronics Information engineering specialty testing stand.
Background technique
Electronics and Information Engineering is that the state-of-the-art technologies such as an appliance computer carry out electronic information control and information processing Subject, the acquisition and processing of main research information, the design of electronic equipment and information system, exploitation, using and it is integrated.E-mail Ceasing Engineering Speciality with testing stand is the commonly used equipment for carrying out teaching.
Based on above-mentioned, the inventors discovered that, if the user of service of Electronics and Information Engineering testing stand after use, Forget to break powering on for Electronics and Information Engineering testing stand, it will Electronics and Information Engineering testing stand is caused to consume electric power money always Source, and accelerate the aging of Electronics and Information Engineering testing stand in the working condition powered on for a long time, shorten electronic information work The service life of journey testing stand, and if, because Electronics and Information Engineering testing stand uses, be bound to generate certain heat in summer Amount is easy to cause Electronics and Information Engineering testing stand when equipment internal heat accumulative to a certain extent, is easy to appear overheat the phenomenon that It breaks down.
Then, in view of this, being studied improvement for existing structure and missing, it is special to provide a kind of Electronics and Information Engineering Industry testing stand, to achieve the purpose that with more more practical value.
Utility model content
In order to solve the above-mentioned technical problem, the utility model provides a kind of electronic information engineering discipline testing stand, with solution Certainly if the user of service of Electronics and Information Engineering testing stand forgets to break powering on for Electronics and Information Engineering testing stand, it will lead It sends a telegraph sub-information engineering test platform and consumes electric power resource always, and accelerate electronics in the working condition powered on for a long time The service life of Electronics and Information Engineering testing stand is shortened in the aging of information engineering testing stand, and if in summer, because of e-mail It ceases engineering test platform to use, is bound to generate certain heat, when equipment internal heat adds up to a certain extent, to be easy to appear The phenomenon of heat is easy to cause Electronics and Information Engineering testing stand to break down problem.
The purpose and effect of the utility model electronic information engineering discipline testing stand, are reached by technological means in detail below At:
A kind of electronic information engineering discipline testing stand, including Electronics and Information Engineering testing stand, tapped blind hole, interruption monitoring Cabinet, connecting rod, reset button, audible-visual alarm lamp, conducting wire A, conducting wire B, silica gel strip, circular through hole, LED lamp bead, screw, micro-control Device, timing module A and timing module B processed;The Electronics and Information Engineering testing stand desk body left side passes through two connecting rods Weldering is fixedly connected with the interruption monitoring cabinet;The interruption monitoring cabinet passes through a conducting wire B and the electronics Electronic test equipment moderate electrical is connected in information engineering testing stand;The interruption monitoring box house is provided with the micro-control Device processed and the timing module A and the timing module B being connected with the microcontroller moderate electrical;The timing module The timing parameter value that A is set is 20min;The timing parameter value that the timing module B is set is 20s;The interruption monitors cabinet Top end face is embedded to be equipped with the audible-visual alarm lamp being connected with the microcontroller moderate electrical, and the interruption monitoring case Body front end face is embedded to be equipped with the reset button being connected with the microcontroller moderate electrical;The Electronics and Information Engineering The tapped blind hole at one is offered at left and right sides of testing stand desk body front end face.
Further, the Electronics and Information Engineering testing stand desk body front end face is provided with the silica gel strip, and described It is embedded on silica gel strip and the conducting wire A being connected with the microcontroller moderate electrical is installed.
Further, the circular through hole at one is offered at left and right sides of the silica gel strip, and described round logical at two Spacing between hole is consistent with the spacing between tapped blind hole described at two.
Further, it is worn in the circular through hole at two and is connected to the screw, and the screw thread is connected to In the tapped blind hole, therefore before the silica gel strip is fixedly mounted on the Electronics and Information Engineering testing stand desk body by two screws On end face.
Further, it is evenly distributed to embed altogether on the silica gel strip front end face and is equipped with 15 by the conducting wire A With the LED lamp bead of the microcontroller moderate electrical.
Compared with prior art, the utility model has the following beneficial effects:
When Electronics and Information Engineering testing stand powers on, the utility model by set interruption monitor cabinet at interval of Whether there is or not users to detect to Electronics and Information Engineering testing stand by 20min, when someone uses Electronics and Information Engineering testing stand, only Reset button is pressed in the 20s time set by timing module B, microcontroller will control timing module B and LED lamp bead It closes, and resets timing module A, use Electronics and Information Engineering testing stand microcontroller control audible-visual alarm lamp starting hair when unmanned Audible and visible alarm out is needed with reminding administrative staff's Current electronic information engineering testing stand is unmanned in the case where powering on to use Close this Electronics and Information Engineering testing stand.
Detailed description of the invention
Fig. 1 is the schematic view of the front view of the utility model.
Fig. 2 is that silica gel strip removes state flowering structure schematic diagram in Fig. 1 of the utility model.
Fig. 3 is the silica gel strip structural schematic diagram of the utility model.
Fig. 4 is the system block diagram of the utility model.
In figure, the corresponding relationship of component names and accompanying drawing number are as follows:
1- Electronics and Information Engineering testing stand, 101- tapped blind hole, 2- interruption monitoring cabinet, 3- connecting rod, 4- reset button, 5- audible-visual alarm lamp, 6- conducting wire A, 7- conducting wire B, 8- silica gel strip, 801- circular through hole, 9-LED lamp bead, 10- screw, 11- micro-control Device processed, 12- timing module A, 13- timing module B.
Specific embodiment
The embodiments of the present invention is described in further detail with reference to the accompanying drawings and examples.Following embodiment For illustrating the utility model, but cannot be used to limit the scope of the utility model.
In the description of the present invention, unless otherwise indicated, the meaning of " plurality " is two or more;Term The orientation of the instructions such as "upper", "lower", "left", "right", "inner", "outside", " front end ", " rear end ", " head ", " tail portion " or position are closed System is to be based on the orientation or positional relationship shown in the drawings, and is merely for convenience of describing the present invention and simplifying the description, rather than The device or element of indication or suggestion meaning must have a particular orientation, be constructed and operated in a specific orientation, therefore cannot It is construed as a limitation of the present invention.In addition, term " first ", " second ", " third " etc. are used for description purposes only, and cannot It is interpreted as indication or suggestion relative importance.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " phase Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected;It can To be mechanical connection, it is also possible to be electrically connected;It can be directly connected, it can also be indirectly connected through an intermediary.For this For the those of ordinary skill in field, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
Embodiment:
As shown in attached drawing 1 to attached drawing 4:
The utility model provides a kind of electronic information engineering discipline testing stand, including Electronics and Information Engineering testing stand 1, spiral shell Line blind hole 101, interruption monitoring cabinet 2, connecting rod 3, reset button 4, audible-visual alarm lamp 5, conducting wire A6, conducting wire B7, silica gel strip 8, Circular through hole 801, LED lamp bead 9, screw 10, microcontroller 11, timing module A12 and timing module B13;The electronic information 1 desk body left side of engineering test platform is fixedly connected with the interruption by two welderings of connecting rod 3 and monitors cabinet 2;Institute It is common by a conducting wire B7 and electronic test equipment in the Electronics and Information Engineering testing stand 1 to state interruption monitoring cabinet 2 It is electrically connected;Interruption monitoring cabinet 2 be internally provided with the microcontroller 11 and with the common electricity of the microcontroller 11 The timing module A12 and the timing module B13 that property is connected;The timing parameter value that the timing module A12 is set as 20min;The timing parameter value that the timing module B13 is set is 20s;Interruption monitoring 2 top end face of cabinet is embedded to be equipped with The audible-visual alarm lamp 5 being connected with 11 moderate electrical of microcontroller, and interruption monitoring 2 front end face of cabinet is embedded The reset button 4 being connected with 11 moderate electrical of microcontroller is installed;1 table of Electronics and Information Engineering testing stand The tapped blind hole 101 at one is offered at left and right sides of body front end face;11 model of microcontroller uses ARM.
Wherein, the 1 desk body front end face of Electronics and Information Engineering testing stand is provided with the silica gel strip 8, and the silicon It is embedded in adhesive tape 8 and the conducting wire A6 being connected with 11 moderate electrical of microcontroller is installed.
Wherein, 8 left and right sides of silica gel strip offers the circular through hole 801 at one, and described round logical at two Spacing between hole 801 is consistent with the spacing between tapped blind hole 101 described at two.
Wherein, it is worn in the circular through hole 801 at two and is connected to the screw 10, and the screw 10 is threadedly coupled In the tapped blind hole 101, therefore the silica gel strip 8 is fixedly mounted on the Electronics and Information Engineering test by two screws 10 On 1 desk body front end face of platform.
Wherein, be evenly distributed on 8 front end face of silica gel strip altogether embed be equipped with 15 by the conducting wire A6 with The LED lamp bead 9 of 11 moderate electrical of microcontroller.
The specifically used mode and effect of the present embodiment:
In use, when Electronics and Information Engineering testing stand 1 powers on, because interruption monitoring cabinet 2 passes through a conducting wire B7 is connected with electronic test equipment moderate electrical in Electronics and Information Engineering testing stand 1, therefore when Electronics and Information Engineering testing stand 1 connects Behind energization source, one is all the electrical component offer power supply in interruption monitoring cabinet 2;Electrical component in interruption monitoring cabinet 2 connects Behind energization source, timing module A12 starts timing, and after reaching 20min set by timing module A12, timing module A12 is to micro- Controller 11 transmits signal, and microcontroller 11 controls the starting of LED lamp bead 9 and issues light, while microcontroller 11 controls timing mould Block B13 starting, when the user of service using Electronics and Information Engineering testing stand 1 presses in the 20s time set by timing module B13 Reset button 4 is pressed, reset button 4 transmits signal to microcontroller 11, and microcontroller 11 controls timing module B13 and LED lamp bead 9 It closes, and resets timing module A12, when the user of service using Electronics and Information Engineering testing stand 1 is not set by the timing module B13 In the fixed 20s time when pressing reset button 4, timing module B13 transmits signal, 11 control sound of microcontroller to microcontroller 11 The starting of light alarm lamp 5 issues audible and visible alarm, to remind this Electronics and Information Engineering of administrative staff testing stand 1 the case where powering on Lower unmanned use, needs to close this Electronics and Information Engineering testing stand 1.
The embodiments of the present invention are given for the purpose of illustration and description, and are not exhaustively or to incite somebody to action The utility model is limited to disclosed form.Many modifications and variations are aobvious and easy for the ordinary skill in the art See.Embodiment was chosen and described in order to better illustrate the principle and practical application of the utility model, and makes this field Those of ordinary skill it will be appreciated that the utility model to designing various embodiments suitable for specific applications with various modifications.

Claims (5)

1. a kind of electronic information engineering discipline testing stand, it is characterised in that: the electronic information engineering discipline includes with testing stand Electronics and Information Engineering testing stand, interruption monitoring cabinet, connecting rod, reset button, audible-visual alarm lamp, conducting wire A, is led at tapped blind hole Line B, silica gel strip, circular through hole, LED lamp bead, screw, microcontroller, timing module A and timing module B;The electronic information work Journey testing stand desk body left side is fixedly connected with the interruption by two connecting rod welderings and monitors cabinet;The interruption Monitoring cabinet is connected by a conducting wire B with electronic test equipment moderate electrical in the Electronics and Information Engineering testing stand It connects;Interruption monitoring box house is provided with the microcontroller and described in being connected with the microcontroller moderate electrical The timing module A and timing module B;The timing parameter value that the timing module A is set is 20min;The timing module B is set Fixed timing parameter value is 20s;The interruption monitoring cabinet top end face is embedded to be equipped with and the microcontroller moderate electrical phase The audible-visual alarm lamp of connection, and interruption monitoring cabinet front end face is embedded and is equipped with and the microcontroller moderate electrical The reset button being connected;It is offered at left and right sides of the Electronics and Information Engineering testing stand desk body front end face described at one Tapped blind hole.
2. electronic information engineering discipline testing stand as described in claim 1, it is characterised in that: the Electronics and Information Engineering test Table body front end face is provided with the silica gel strip, and on the silica gel strip embed be equipped with one it is general with the microcontroller The conducting wire A that powered is connected.
3. electronic information engineering discipline testing stand as described in claim 1, it is characterised in that: at left and right sides of the silica gel strip Offer the circular through hole at one, and at the spacing and two at two between the circular through hole between the tapped blind hole between Away from consistent.
4. electronic information engineering discipline testing stand as described in claim 1, it is characterised in that: at two in the circular through hole It wears and is connected to the screw, and the screw thread is connected in the tapped blind hole, therefore the silica gel strip passes through two spiral shells Silk is fixedly mounted on the Electronics and Information Engineering testing stand desk body front end face.
5. electronic information engineering discipline testing stand as described in claim 1, it is characterised in that: be on the silica gel strip front end face It is uniformly distributed to embed altogether and 15 LED lamp beads by the conducting wire A and the microcontroller moderate electrical is installed.
CN201920008126.1U 2019-01-03 2019-01-03 A kind of electronic information engineering discipline testing stand Expired - Fee Related CN209348686U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201920008126.1U CN209348686U (en) 2019-01-03 2019-01-03 A kind of electronic information engineering discipline testing stand

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201920008126.1U CN209348686U (en) 2019-01-03 2019-01-03 A kind of electronic information engineering discipline testing stand

Publications (1)

Publication Number Publication Date
CN209348686U true CN209348686U (en) 2019-09-06

Family

ID=67801398

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201920008126.1U Expired - Fee Related CN209348686U (en) 2019-01-03 2019-01-03 A kind of electronic information engineering discipline testing stand

Country Status (1)

Country Link
CN (1) CN209348686U (en)

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GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190906

Termination date: 20200103