CN209310947U - A kind of LED chip pulse junction temperature measurement device - Google Patents
A kind of LED chip pulse junction temperature measurement device Download PDFInfo
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- CN209310947U CN209310947U CN201821682100.7U CN201821682100U CN209310947U CN 209310947 U CN209310947 U CN 209310947U CN 201821682100 U CN201821682100 U CN 201821682100U CN 209310947 U CN209310947 U CN 209310947U
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- led chip
- test instrument
- pulse
- junction temperature
- transient test
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Abstract
The utility model discloses a kind of LED chip pulse junction temperature measurement devices, including hot transient test instrument, impulse controller and PC control terminal, hot transient test instrument includes large driven current density heating line and tiny current measurement route, impulse controller includes the pulse power and relay, the coil and the pulse power of relay are electrically connected, the normal opened contact of relay is connected to the electrode line road of large driven current density heating line, and hot transient test instrument and the pulse power pass through RS232 serial port data line and the control connection of PC control terminal respectively；Large driven current density partial cut can be simulated actual use scene of the LED chip under pulse working mode by the hot transient test instrument of PC control terminal synchronously control and impulse controller by it, with the junction temperature and thermal resistance that may be implemented in measurement LED chip under pulse, the advantages of obtaining true junction temperature and thermal resistance of the LED chip under pulse, providing accurate reference for design.
Description
Technical field
The utility model belongs to LED chip junction temperature measurement technical field, and in particular to a kind of analog LED actual use field
Scape is realized measures the junction temperature of LED chip and the measuring device of thermal resistance under pulse.
Background technique
Measurement LED junction temperature test method authoritative compared with thermal resistance is researched and developed using Mentor Graphics company at present
The hot transient test instrument as shown in Fig. 1 of manufacture passes through high current source A1 fever test LED chip first and is heated to heat
Balance, is then shut off high current source A1, and the voltage change of LED chip cooling procedure is measured under the conditions of Weak current source A2, is obtained
To complete cooling curve；The test device can only measure junction temperature and thermal resistance of the LED chip under thermostabilization, not be capable of measuring
Junction temperature and thermal resistance of the LED chip under pulse, cause test result not precisely, there are problems that reliability and durability, can not
LED chip is constrained in high-efficient energy-saving environment friendly lighting area using accurately design reference is provided under pulse for LED chip
It is widely applied.
Summary of the invention
In view of the deficiencies of the prior art, the utility model is intended to provide a kind of realization of analog and surveys under pulse usage scenario
Measure the junction temperature of LED chip and the LED chip pulse junction temperature measurement device of thermal resistance.
To achieve the above objectives, the present invention adopts the following technical solutions:
A kind of LED chip pulse junction temperature measurement device, including hot transient test instrument, impulse controller and PC control terminal, heat
Transient test instrument includes large driven current density heating line and tiny current measurement route, impulse controller include the pulse power and
Relay, coil and the pulse power electrical connection of relay, the normal opened contact of relay are connected to large driven current density heating line
Electrode line road, hot transient test instrument and the pulse power pass through RS232 serial port data line and the control connection of PC control terminal respectively.
The utility model has the following beneficial effects:
A kind of LED chip pulse junction temperature measurement device of the utility model, it is attached on the basis of existing hot transient test instrument
It adds and sets impulse controller and PC control terminal, the coil of its relay of impulse controller and the pulse power of impulse controller are electrically connected
It connects, the normal opened contact of relay is connected to the electrode line road of the large driven current density heating line of hot transient test instrument, hot transient state
Tester and the pulse power pass through RS232 serial port data line and the control connection of PC control terminal respectively；In the junction temperature of measurement LED chip
When with thermal resistance, for measuring, large driven current density heating line exports high current and uses tiny current measurement circuit output Weak current
It, can be by the hot transient test instrument of PC control terminal synchronously control and impulse controller large driven current density part in driving LED heating
Actual use scene of the cutting simulation LED chip under pulse, impulse controller can control pulse number and width, measurement data
Acquisition and processing are completed by hot transient test instrument, and the junction temperature and thermal resistance of LED is exported by hot transient test instrument；It is realized with analog
The junction temperature and thermal resistance that LED chip is measured under pulse usage scenario, obtain true junction temperature of the LED chip under pulse working mode
With thermal resistance, for design accurate reference value is provided the advantages of.
Detailed description of the invention
Fig. 1 is the circuit diagram of the hot transient test instrument of existing LED junction temperature and thermal resistance measurement；
Fig. 2 is a kind of simple principle figure of LED chip pulse junction temperature measurement device of the utility model.
In figure: 1, hot transient test instrument；2, impulse controller；3, PC control terminal；11, large driven current density heating line；12,
Tiny current measurement route；21, the pulse power；22, relay；22a, coil；22b, normal opened contact；30, RS232 serial data
Line.
Specific embodiment
With reference to the accompanying drawing and specific embodiment, the utility model will be further described, in order to become apparent from geography
Solve the technical idea of the requires of the utility model protection.
A kind of LED chip pulse junction temperature measurement device of the utility model as shown in Figure 2, including hot transient test instrument 1, pulse
Controller 2 and PC control terminal 3, hot transient test instrument 1 include large driven current density heating line 11 and tiny current measurement route
12, impulse controller 2 includes the pulse power 21 and relay 22, and the coil 22a and the pulse power 21 of relay 22 are electrically connected, after
The normal opened contact 22b of electric appliance 22 is connected to the electrode line road of large driven current density heating line 11, hot transient test instrument 1 and pulse
Power supply 21 passes through RS232 serial port data line 30 and the control connection of PC control terminal 3 respectively.
The utility model LED chip pulse junction temperature measurement device is added on the basis of existing hot transient test instrument 1 and is set
Set impulse controller 2 and PC control terminal 3, the coil 22a of its relay 22 of impulse controller 2 and the pulse electricity of impulse controller 2
Source 21 is electrically connected, and the normal opened contact 22b of relay 22 is being connected to the large driven current density heating line 11 of hot transient test instrument 1 just
Polar curve road, hot transient test instrument 1 and the pulse power 21 are connected by RS232 serial port data line 30 and the control of PC control terminal 3 respectively
It connects；When measuring the junction temperature and thermal resistance of LED chip, tiny current measurement route 12 exports Weak current and is used to measure, high current
Driving heating line 11 exports high current for driving LED to heat, and can pass through the hot transient test instrument 1 of 3 synchronously control of PC control terminal
Actual use scene with impulse controller 2 large driven current density partial cut simulation LED chip under pulse, impulse controller
2 controllable pulse numbers and width, measurement data acquisition and processing are completed by hot transient test instrument 1, the junction temperature and thermal resistance of LED by
Hot transient test instrument 1 exports；The junction temperature and thermal resistance for measuring LED chip under pulse usage scenario are realized with analog, are obtained
True junction temperature and thermal resistance of the LED chip under pulse, to design the advantages of providing accurate reference value.
For those skilled in the art, it can make other each according to the above description of the technical scheme and ideas
Kind is corresponding to be changed and deforms, and all these change and deform the guarantor that all should belong to the utility model claims
Within the scope of shield.
Claims (1)
1. a kind of LED chip pulse junction temperature measurement device, including hot transient test instrument (1), hot transient test instrument (1) includes big
Electric current drives heating line (11) and tiny current measurement route (12), it is characterised in that: further includes impulse controller (2) and PC
Control terminal (3), impulse controller (2) include the pulse power (21) and relay (22), the coil (22a) and arteries and veins of relay (22)
Power supply (21) electrical connection is rushed, the normal opened contact (22b) of relay (22) is connected to the anode of large driven current density heating line (11)
On route, hot transient test instrument (1) and the pulse power (21) pass through RS232 serial port data line (30) and PC control terminal (3) respectively
Control connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821682100.7U CN209310947U (en) | 2018-10-17 | 2018-10-17 | A kind of LED chip pulse junction temperature measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821682100.7U CN209310947U (en) | 2018-10-17 | 2018-10-17 | A kind of LED chip pulse junction temperature measurement device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209310947U true CN209310947U (en) | 2019-08-27 |
Family
ID=67671021
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821682100.7U Active CN209310947U (en) | 2018-10-17 | 2018-10-17 | A kind of LED chip pulse junction temperature measurement device |
Country Status (1)
| Country | Link |
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| CN (1) | CN209310947U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114200287A (en) * | 2021-12-06 | 2022-03-18 | 广东利扬芯片测试股份有限公司 | Pulse waveform processing circuit of dTof chip |
-
2018
- 2018-10-17 CN CN201821682100.7U patent/CN209310947U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114200287A (en) * | 2021-12-06 | 2022-03-18 | 广东利扬芯片测试股份有限公司 | Pulse waveform processing circuit of dTof chip |
| CN114200287B (en) * | 2021-12-06 | 2024-03-29 | 广东利扬芯片测试股份有限公司 | Pulse waveform processing circuit of dTof chip |
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