CN209264249U - A kind of test of light source device - Google Patents

A kind of test of light source device Download PDF

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Publication number
CN209264249U
CN209264249U CN201822254457.1U CN201822254457U CN209264249U CN 209264249 U CN209264249 U CN 209264249U CN 201822254457 U CN201822254457 U CN 201822254457U CN 209264249 U CN209264249 U CN 209264249U
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China
Prior art keywords
light
light source
test
guide plate
light guide
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CN201822254457.1U
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Chinese (zh)
Inventor
疏达
李�远
石勤坡
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Benewake Beijing Co Ltd
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Benewake Beijing Co Ltd
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Abstract

This application involves optical testing art more particularly to a kind of test of light source devices, and this application discloses a kind of test of light source devices, including light source to be measured, light guide plate, photoreceptor, test circuit, and the light source to be measured is for emitting light;The light guide plate is each to uniform light for converting incident light to;The photoreceptor is for converting optical signals to electric signal;The test circuit is used for according to electric signal measurement light source parameters.The application receives incident light using light guide plate, the light of concentration is become the uniform light of all directions, then the photoreceptor by being fixed on the fixed position of light guide plate receives.Light guide plate will emit the evenly dispersed degree of light and be the same to each light source, therefore the proportionality coefficient of power can be determined by demarcating, and calculate peak power further according to coefficient.The embodiment of the present application structure is simple, and only light guide plate need to be placed on light source optical path, need not be aligned light source, easy to operate, the adjustment needed is few.

Description

A kind of test of light source device
Technical field
This application involves laser radar the field of test technology more particularly to a kind of test of light source device and test methods.
Background technique
In laser radar production, in order to improve the production efficiency, need to carry out modular assembly to assemble preceding test, light source is made For the core component of laser radar, detection is carried out to it and is even more important.
The laser radar industry emerging as one, current test form unified method and apparatus not yet, generally It is all that the parameter tested as needed voluntarily carries out part transformation with existing equipment for testing.
Light source due to being related to optics, test get up it is more relative complex, at present testing tool mainly have photoelectric probe, Light power meter etc..These equipment need to be directed at Laser emission light beam when testing to measure, since most light probes are photosensitive Transmitting light must all be placed in test process and receive in window by window very little, generally less than 1mm, the laser otherwise measured Peak power can inaccuracy.And the window the big more is readily incorporated ambient light interference.Therefore to testing tool in test process Alignment becomes most time-consuming process.
Accordingly, it is desirable to provide a kind of test operation is simple, time-consuming few test of light source device.
Utility model content
The embodiment of the present application is to propose a kind of test of light source device, solve it is of the existing technology complicated for operation, it is time-consuming Long problem.
For this purpose, the present patent application embodiment uses following technical scheme:
On the one hand, a kind of test of light source device, including light source to be measured, light guide plate, photoreceptor, test circuit,
The light source to be measured is for emitting light;
The light guide plate is each to uniform light for converting incident light to;
The photoreceptor is for converting optical signals to electric signal;
The test circuit is used for according to electric signal measurement light source parameters.
In a kind of possible embodiment, the photoreceptor is arranged at the top of light guide plate, bottom or shady face.
In a kind of possible embodiment, the test of light source device, further includes light-guiding pillar, the light-guiding pillar with Light guide plate is arranged in same optical path, is used for incident light directing light guide plate.
In a kind of possible embodiment, the light-guiding pillar is one or more, and light-guiding pillar and light source to be measured are one by one It is corresponding.
In a kind of possible embodiment, described light-guiding pillar one end and light-guiding pillar are in close contact.
In a kind of possible embodiment, the light-guiding pillar material is polymethyl methacrylate, light guide plate material For polymethyl methacrylate or polycarbonate or polystyrene.
In a kind of possible embodiment, the light source to be measured has lens, described light-guiding pillar one end and lens It matches, and diameter is greater than light lens diameter.
In a kind of possible embodiment, the light source to be measured is Laser emission mould group or semiconductor laser.
In a kind of possible embodiment, the photoreceptor is photoelectric probe or photodiode or avalanche optoelectronic two Pole pipe.
In a kind of possible embodiment, the test circuit further include peak detection circuit, pulsewidth test circuit, High-speed AD, for detecting peak power, pulsewidth and the optical pulse intensity time used in peak power from 10% to 90%.
The embodiment of the present application receives incident light by using light guide plate, and the light of concentration is become the uniform light of all directions Line, then the photoreceptor by being fixed on the fixed position of light guide plate receive.Light guide plate will emit the evenly dispersed degree of light to each light Source is the same, therefore the proportionality coefficient of power can be determined by demarcating, and calculates peak power further according to coefficient.
The embodiment of the present application structure is simple, and only light guide plate need to be placed on light source optical path, easy to operate, needs Adjustment is few.
Detailed description of the invention
Fig. 1 is the schematic diagram of the embodiment of the present application.
Fig. 2 is that the embodiment of the present application installs the schematic diagram after light-guiding pillar additional.
Fig. 3 is the schematic diagram that the embodiment of the present application has multiple light-guiding pillars.
Fig. 4 is the schematic diagram that the embodiment of the present application light source to be measured has lens.
In figure: 1, light guide plate;2, photoreceptor;3, circuit is tested;4, light-guiding pillar;5, light source to be measured.
Specific embodiment
Further illustrate the technical solution of the application below with reference to the accompanying drawings and specific embodiments.
It should be noted that in the absence of conflict, the features in the embodiments and the embodiments of the present application can phase Mutually combination.The application is described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
In order to make those skilled in the art more fully understand application scheme, below in conjunction in the embodiment of the present application Attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is only The embodiment of the application a part, instead of all the embodiments.Based on the embodiment in the application, ordinary skill people Member's every other embodiment obtained without making creative work, all should belong to the model of the application protection It encloses.
It should be noted that the description and claims of this application and term " first " in above-mentioned attached drawing, " Two " etc. be to be used to distinguish similar objects, without being used to describe a particular order or precedence order.It should be understood that using in this way Data be interchangeable under appropriate circumstances, so as to embodiments herein described herein.In addition, term " includes " and " tool Have " and their any deformation, it is intended that cover it is non-exclusive include, for example, containing a series of steps or units Process, method, device, product or equipment those of are not necessarily limited to be clearly listed step or unit, but may include without clear Other step or units listing to Chu or intrinsic for these process, methods, product or equipment.
The embodiment of the present application.
As shown in Figure 1, a kind of test of light source device, including light source to be measured 5, light guide plate 1, photoreceptor 2, test circuit 3, institute The light source to be measured 5 stated is for emitting light;The light guide plate 1 is each to uniform light for converting incident light to;The sense Light device 2 is for converting optical signals to electric signal;The test circuit 3 is used for according to electric signal measurement light source parameters.It is described Light guide plate 1 be PMMA light guide plate, (PS) light guide plate or polycarbonate (PC) light guide plate can also be selected as needed.The sense Light device 2 is photoelectric probe or photodiode or avalanche photodide.
Incident light is received by using light guide plate 1, the light of concentration is become into the uniform light of all directions, then by being fixed on The photoreceptor 2 of the fixed position of light guide plate 1 receives.Light guide plate 1 will emit the evenly dispersed degree of light and be just as to each light source , therefore can determine that the light splitting of photoreceptor receiving unit accounts for the ratio of entire incident optical power by experimental calibration, further according to than Example calculates peak power.Experimental calibration is to irradiate light guide plate 1 using the light source of a constant power, and photoreceptor 2 obtains a measurement Power, the ratio for measuring power and constant power is that photoreceptor receiving unit is divided the ratio for accounting for entire incident optical power.
The setting of photoreceptor 2 is in 1 top of light guide plate, bottom or shady face.
Any one side in light guide plate in addition to receiving plane can be set in photoreceptor 2.
As shown in Fig. 2, the test of light source device, may also include light-guiding pillar 4, the light-guiding pillar 4 is set with light guide plate 1 It sets in same optical path, is used for incident light directing light guide plate 1.
The setting of light-guiding pillar 4 is to reduce light loss in order to which incident light is all oriented to light guide plate.If direct irradiation may Hot spot dispersion, part light is not in 1 range of receiving of light guide plate.
As shown in Figure 3, it is sometimes desirable to while multiple light sources are measured, multiple light-guiding pillars 4 can be set, multiple light-guiding pillars 4 are right Answer multiple light sources to be measured 5.
Due to the effect of light guide plate 1, each the luminous of light source 5 to be measured is evenly dispersed, therefore light source 5 to be measured is being led Position on tabula rasa 1 is not also strict with, therefore multiple light-guiding pillars 4 can be placed on one piece of light guide plate 1, multiple to test Light source 5 to be measured, test circuit 3 successively triggers each light source to be measured 5 and shines when test, and obtains signal from photoreceptor 2, and then locate Reason calculates the parameter of each light source to be measured.This method is used in mass production, and such as welding is completed but is not carried out The mode of laser group PCBA of scoreboard is tested.
Wherein described light-guiding pillar one end and light guide plate are in close contact, and are prevented light from spreading from gap, are caused measurement result not Accurately.
The light-guiding pillar material is polymethyl methacrylate, light guide plate material is polymethyl methacrylate or poly- carbon Acid esters or polystyrene.
As shown in Figure 4, it is sometimes desirable to which the light source to be measured 5 with optical system is detected.Optical system includes lens 6 With the lens barrel 5 for placing lens 6, described 4 one end of light-guiding pillar is matched with lens 6, and diameter is greater than 6 diameter of lens.
The diameter of light-guiding pillar 4 is greater than equal to 6 diameter of lens at this time, and transmitting light is all imported light guide plate 1 as far as possible, And cooperates with lens 6, including be bonded in curvature, to reduce the reflection of the light in gap.It is qualified for no optics system testing Emitting mould train, in addition being tested again after optical system, it can be found that the defective products in its optical system.
In order to improve detection efficiency, multiple light-guiding pillars 4 can be placed on one piece of light guide plate 1, to test multiple band optics The light source to be measured 5 of system.Test circuit successively triggers each light source to be measured 5 and shines when test, and receives the signal of photoreceptor 2, Processing is calculated plus the light source parameters to be measured after optical system, is found the problem.
The photoreceptor is photoelectric probe or photodiode or avalanche photodide.
The test circuit further includes peak detection circuit, pulsewidth test circuit, high-speed AD, for detecting peak work Rate, pulsewidth and the optical pulse intensity time used in peak power from 10% to 90%.
Wherein peak detection circuit, pulsewidth test circuit, high-speed AD are the prior art.
Describe the technical principle of the application in conjunction with specific embodiments above.These descriptions are intended merely to explain the application's Principle, and it cannot be construed to the limitation to the application protection scope in any way.Based on the explanation herein, the technology of this field Personnel do not need to pay for creative labor the other specific embodiments that can associate the application, these modes are fallen within Within the protection scope of the application.

Claims (10)

1. a kind of test of light source device, which is characterized in that including light source to be measured, light guide plate, photoreceptor, circuit is tested,
The light source to be measured is for emitting light;
The light guide plate is each to uniform light for converting incident light to;
The photoreceptor is for converting optical signals to electric signal;
The test circuit is used for according to electric signal measurement light source parameters.
2. test of light source device according to claim 1, which is characterized in that the photoreceptor is arranged on light guide plate top Portion, bottom or shady face.
3. test of light source device according to claim 1 or 2, which is characterized in that it further include light-guiding pillar, the light-guiding pillar It is arranged in same optical path with light guide plate, is used for incident light directing light guide plate.
4. test of light source device according to claim 3, which is characterized in that the light-guiding pillar is one or more, is led Light beam and light source to be measured correspond.
5. test of light source device according to claim 4, which is characterized in that described light-guiding pillar one end and light guide plate is close Contact.
6. test of light source device according to claim 5, which is characterized in that the light-guiding pillar material is polymethyl Sour methyl esters, light guide plate material are polymethyl methacrylate or polycarbonate or polystyrene.
7. test of light source device according to claim 6, which is characterized in that the light source to be measured has lens, described Light-guiding pillar one end matched with lens, and diameter be greater than light lens diameter.
8. test of light source device according to claim 7, which is characterized in that the light source to be measured is Laser emission mould group Or semiconductor laser.
9. test of light source device according to claim 8, which is characterized in that the photoreceptor is photoelectric probe or photoelectricity Diode or avalanche photodide.
10. test of light source device according to claim 1, which is characterized in that the test circuit further includes peak value inspection Slowdown monitoring circuit, pulsewidth test circuit, high-speed AD, for detecting peak power, pulsewidth and the optical pulse intensity peak work from 10% to 90% Time used in rate.
CN201822254457.1U 2018-12-29 2018-12-29 A kind of test of light source device Active CN209264249U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201822254457.1U CN209264249U (en) 2018-12-29 2018-12-29 A kind of test of light source device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201822254457.1U CN209264249U (en) 2018-12-29 2018-12-29 A kind of test of light source device

Publications (1)

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CN209264249U true CN209264249U (en) 2019-08-16

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114071126A (en) * 2021-11-08 2022-02-18 Oppo广东移动通信有限公司 Testing equipment, testing method and testing device based on imaging system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114071126A (en) * 2021-11-08 2022-02-18 Oppo广东移动通信有限公司 Testing equipment, testing method and testing device based on imaging system

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