CN209028151U - Semiconductor laser ageing experimental rig - Google Patents
Semiconductor laser ageing experimental rig Download PDFInfo
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- CN209028151U CN209028151U CN201821778991.6U CN201821778991U CN209028151U CN 209028151 U CN209028151 U CN 209028151U CN 201821778991 U CN201821778991 U CN 201821778991U CN 209028151 U CN209028151 U CN 209028151U
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- circuit board
- measured device
- heating member
- semiconductor laser
- experimental rig
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to semiconductor laser fields, more particularly, to a kind of semiconductor laser ageing experimental rig.Semiconductor laser ageing experimental rig includes: air bell, locating piece, temperature sensor, heating member and circuit board；The open end of air bell is arranged in circuit board, the inside of air bell is arranged in locating piece, heating member is arranged in one end of the separate circuit board of locating piece, and one end of the remotely located part of heating member is for placing measured device, and temperature sensing and heating member are and circuit board electrical connection；Temperature sensor is used to detect the temperature information of measured device, and the temperature information of measured device is passed to circuit board, and circuit board controls the calorific value of heating member according to the temperature information of measured device, so that measured device reaches preset temperature.To the temperature being accurately controlled when measured device test.The technical issues of can not accurately being monitored for the temperature of each measured device exists in the prior art to alleviate.
Description
Technical field
The utility model relates to semiconductor laser fields, test more particularly, to a kind of semiconductor laser ageing
Device.
Background technique
With the development of society and being constantly progressive for science and technology, semiconductor laser is because having small in size, light-weight, conversion effect
The advantages that rate is high, good reliability and be widely used in optic communication, information storage, medical treatment, light sensing and light-pumped solid state laser
With the fields such as fiber amplifier.In above-mentioned application field, the service life be ensure its application be an a crucial factor, and
It is related to the principal element that can be commercialized.
The most effective service life wire examination method of semiconductor laser is to carry out electrical ageing test, is exactly to see at a certain current
Device is examined to export in aging period.The ageing process of semiconductor laser determine to a certain extent product durability, can
By property, and aging device used in aging just play the role of to product it is key.Since semiconductor laser is in energization aging
There is heating problem in the process, fever affects the ageing process of entire semiconductor laser to a certain extent, if aging
The self-heating issues that cannot consider laser in the process just will affect life assessment test as a result, influencing the use of device.Thus
The ageing test apparatus of semiconductor laser is most important to the service life examination of laser.
Currently, usually carrying out the degradation of semiconductor kistributed-feedback laser using baking oven or fixture, each measured device can not be directed to
Temperature accurately monitored.
Utility model content
The purpose of this utility model is to provide a kind of semiconductor laser ageing experimental rig, to alleviate the prior art
It is middle to there is technical issues that not carrying out accurately for the temperature of each measured device.
A kind of semiconductor laser ageing experimental rig provided by the utility model, comprising: air bell, locating piece, temperature
Sensor, heating member and circuit board；
The open end of the air bell is arranged in the circuit board, and the inside of the air bell is arranged in the locating piece,
The heating member be arranged in the locating piece far from the circuit board one end, the heating member far from the locating piece one
End for placing measured device, the temperature sensing and heating member with the circuit board electrical connection；
The temperature sensor is used to detect the temperature information of the measured device, and the temperature of the measured device is believed
Breath passes to the circuit board, and the circuit board controls the fever of the heating member according to the temperature information of the measured device
Amount, so that the measured device reaches preset temperature.
Further, the semiconductor laser ageing experimental rig further includes heat-conducting piece；
The heat-conducting piece is arranged between the heating member and the measured device, and the heat-conducting piece is used for the heating
The even heat that part generates is transmitted on the measured device.
Further, the heat-conducting piece is provided with the first groove, the temperature sensing close to one end of the measured device
Device is arranged in first groove.
Further, the second groove is provided on the inside of the locating piece, second groove is for accommodating connector, institute
Connector is stated for connecting the measured device with the circuit board.
Further, multiple first pin holes and multiple second are respectively arranged on the heat-conducting piece and the connector to insert
Pin hole, multiple first pin holes and multiple second pin holes are arranged in a one-to-one correspondence, the contact pin on the measured device
It is connect across first pin holes and second pin holes with the circuit board.
Further, the top of the air bell is provided with the opening in trumpet type, along the air bell far from the electricity
The diameter in the direction of road plate, the opening is gradually reduced.
Further, the measured device is arranged in the opening far from one end of the heating member.
Further, the open end of the air bell is provided with outwardly extending chimb, and installation is provided on the chimb
Hole is provided with the through-hole with mounting hole cooperation on the circuit board.
Further, adding thermal resistance route and heat input electrode are provided on the heating member；
The heat input electrode is used for and circuit board electrical connection, the heat input electrode also with adding thermal resistance connection,
So that the heating member fever.
Further, multiple second pin holes are evenly distributed on the connector.
A kind of semiconductor laser ageing experimental rig provided by the utility model, comprising: air bell, locating piece, temperature
Sensor, heating member and circuit board；The open end of the air bell is arranged in the circuit board, and the locating piece is arranged described
One end far from the circuit board of the locating piece is arranged in the inside of air bell, the heating member, and the heating member is separate
One end of the locating piece for placing measured device, the temperature sensing and heating member with the circuit board electrical connection；Institute
Temperature sensor is stated for detecting the temperature information of the measured device, and the temperature information of the measured device is passed into institute
Circuit board is stated, the circuit board controls the calorific value of the heating member according to the temperature information of the measured device, so that described
Measured device reaches preset temperature.Using above-mentioned scheme, measured device is arranged in the top of heating member, and temperature sensing
Device is able to detect the temperature of measured device, when in use, can first make measured device heating power, temperature sensor detection at this time by
The temperature information of device to be surveyed, and sends the temperature information of measured device to circuit board, circuit board controls the fever of heating member, and
Measured device is heated, so that measured device reaches preset temperature, thus when being accurately controlled measured device test
Temperature.The technical issues of can not accurately being monitored for the temperature of each measured device exists in the prior art to alleviate.
Detailed description of the invention
It, below will be right in order to illustrate more clearly of specific embodiment of the present invention or technical solution in the prior art
Specific embodiment or attached drawing needed to be used in the description of the prior art are briefly described, it should be apparent that, it is described below
In attached drawing be that some embodiments of the utility model are not paying creativeness for those of ordinary skill in the art
Under the premise of labour, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of semi-cutaway of semiconductor laser ageing experimental rig provided by the embodiment of the utility model；
Fig. 2 is a kind of top view of semiconductor laser ageing experimental rig provided by the embodiment of the utility model；
Fig. 3 is that a kind of structure of semiconductor laser ageing experimental rig heat-conducting piece provided by the embodiment of the utility model is shown
It is intended to；
Fig. 4 be it is provided by the embodiment of the utility model can a kind of structure of semiconductor laser ageing experimental rig heating member
Schematic diagram.
Icon: 100- air bell；200- locating piece；300- temperature sensor；400- heating member；500- circuit board；600-
Measured device；700- heat-conducting piece；800- connector；110- mounting hole；120- opening；410- adding thermal resistance route；420- heat is defeated
Enter electrode；The first groove of 710-；The first pin holes of 720-.
Specific embodiment
The technical solution of the utility model is clearly and completely described below in conjunction with attached drawing, it is clear that described
Embodiment is the utility model a part of the embodiment, instead of all the embodiments.Based on the embodiments of the present invention, originally
Field those of ordinary skill every other embodiment obtained without making creative work belongs to practical
Novel protected range.
In the description of the present invention, it should be noted that such as occur term " center ", "upper", "lower", " left side ",
" right side ", "vertical", "horizontal", "inner", "outside" etc., indicated by orientation or positional relationship be orientation based on the figure or
Positional relationship is merely for convenience of describing the present invention and simplifying the description, rather than the device or member of indication or suggestion meaning
Part must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as limiting the present invention.
In addition, such as there is term " first ", " second ", " third " are used for description purposes only, be not understood to indicate or imply opposite
Importance.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, such as there is term
" installation ", " connected ", " connection " shall be understood in a broad sense, for example, it may be fixedly connected, may be a detachable connection or one
Connect to body；It can be mechanical connection, be also possible to be electrically connected；It can be directly connected, it can also be indirect by intermediary
It is connected, can be the connection inside two elements.For the ordinary skill in the art, on being understood with concrete condition
State the concrete meaning of term in the present invention.
Fig. 1 is a kind of semi-cutaway of semiconductor laser ageing experimental rig provided by the embodiment of the utility model.Such as Fig. 1
It is shown, a kind of semiconductor laser ageing experimental rig provided by the utility model, comprising: air bell 100, locating piece 200, temperature
Spend sensor 300, heating member 400 and circuit board 500；
120 end of opening of the air bell 100 is arranged in the circuit board 500, and the locating piece 200 is arranged in the gas
The inside of stream cover 100, one end far from the circuit board 500 of the locating piece 200 is arranged in the heating member 400, described
For placing measured device 600, the temperature sensing and heating member 400 are equal for the one end of heating member 400 far from the locating piece 200
It is electrically connected with the circuit board 500；
The temperature sensor 300 is used to detect the temperature information of the measured device 600, and by the measured device
600 temperature information passes to the circuit board 500, and the circuit board 500 is according to the temperature information control of the measured device 600
The calorific value of the heating member 400 is made, so that the measured device 600 reaches preset temperature.
Wherein, preset temperature is required temperature when measured device 600 is tested, and when test, required temperature was 85 °.
Locating piece 200 and air bell 100 are annular, and circuit board 500 is PCB circuit board 500.
Wherein, the material of air bell 100 is any one of Teflon plastics, plastics, metal, ceramics or glass material system
At.
A kind of semiconductor laser ageing experimental rig provided by the utility model, comprising: air bell 100, locating piece
200, temperature sensor 300, heating member 400 and circuit board 500；The opening of the air bell 100 is arranged in the circuit board 500
The inside of the air bell 100 is arranged in 120 ends, the locating piece 200, and the heating member 400 is arranged in the locating piece 200
One end far from the circuit board 500, the one end of the heating member 400 far from the locating piece 200 is for placing tested device
Part 600, the temperature sensing and heating member 400 are electrically connected with the circuit board 500；The temperature sensor 300 is for examining
The temperature information of the measured device 600 is surveyed, and the temperature information of the measured device 600 is passed into the circuit board 500,
The circuit board 500 controls the calorific value of the heating member 400 according to the temperature information of the measured device 600, so that described
Measured device 600 reaches preset temperature.Using above-mentioned scheme, measured device 600 is arranged in the top of heating member 400,
And temperature sensor 300 is able to detect the temperature of measured device 600, when in use, can first make 600 heating power of measured device,
Temperature sensor 300 detects the temperature information of measured device 600 at this time, and sends the temperature information of measured device 600 to electricity
Road plate 500, circuit board 500 control the fever of heating member 400, and heat to measured device 600, so that measured device 600
Reach preset temperature, to be accurately controlled temperature when measured device 600 is tested.Being existed in the prior art with alleviation can not
The technical issues of accurately being monitored for the temperature of each measured device 600.
Fig. 3 is that a kind of structure of semiconductor laser ageing experimental rig heat-conducting piece provided by the embodiment of the utility model is shown
It is intended to.As shown in figure 3, on the basis of the above embodiments, further, the semiconductor laser ageing experimental rig also wraps
Include heat-conducting piece 700；
The heat-conducting piece 700 is arranged between the heating member 400 and the measured device 600, and the heat-conducting piece 700 is used
It is transmitted on the measured device 600 in the even heat for generating the heating member 400.
Wherein, heat-conducting piece 700 be i.e. hot plate, hot plate use aluminum alloy material, can also be used other high-termal conductivity metal,
Alloy or ceramic material are made.
In the present embodiment, heat-conducting piece 700 is provided between heating member 400 and measured device 600, heat-conducting piece 700 can
The heat generated on heating member 400 is absorbed, and makes the distribution heat-conducting piece 700 of the even heat generated on heating member 400, so that
Measured device 600 is heated evenly.
On the basis of the above embodiments, further, the heat-conducting piece 700 is close to one end of the measured device 600
It is provided with the first groove 710, the temperature sensor 300 is arranged in first groove 710.
In the present embodiment, it is provided with the first groove 710 for mounting temperature sensor 300 on heat-conducting piece 700, first
The setting of groove 710 can be such that temperature sensor 300 is easily mounted in whole device, and be able to detect measured device
600 temperature.
On the basis of the above embodiments, further, the inside of the locating piece 200 is provided with the second groove, described
Second groove is for accommodating connector 800, and the connector 800 is for connecting the measured device 600 and the circuit board 500
It connects.
Wherein, connector 800 is preferably TO socket, and TO socket can be suitable for different types of measured device 600.
In the present embodiment, the second groove for accommodating connector 800 is provided on locating piece 200, connector 800 is arranged
In the second groove, and the upper end of connector 800 is used for and heating member 400 abuts, and the setting of connector 800 is for making tested device
Part 600 is directly connect with circuit board 500, to improve the levels of precision of test.
On the basis of the above embodiments, further, it is respectively set on the heat-conducting piece 700 and the connector 800
There are multiple first pin holes 720 and multiple second pin holes, multiple first pin holes 720 and multiple second pin holes
It is arranged in a one-to-one correspondence, the contact pin on the measured device 600 passes through first pin holes 720 and second pin holes and institute
State the connection of circuit board 500.
Further, multiple second pin holes are evenly distributed on the connector 800.
In the present embodiment, the first pin holes 720 and the second pin holes are respectively arranged in heat-conducting piece 700 and connector 800,
First pin holes 720 and the second pin holes are correspondingly arranged, so that the contact pin of measured device 600 can pass through the second pin holes and the
One pin holes 720 are conductively connected with circuit board 500, and such measured device 600 can generate heat, and are not needed to tested
Device 600 is attached other power supplys.
On the basis of the above embodiments, further, the top of the air bell is provided with the opening in trumpet type
120, the diameter in the direction along the air bell far from the circuit board 500, the opening 120 is gradually reduced.
Further, one end setting of the measured device 600 far from the heating member 400 is in the opening 120.
In the present embodiment, the top end opening 120 of air bell, and being open 120 is in trumpet type, the opening 120 of trumpet type is to remote
Direction from circuit board 500 extends, and measured device 600 does not extend to the outside of opening 120, can both protect measured device in this way
600, the stability of 600 temperature of measured device is influenced prevented also from room air flow-disturbing.
Fig. 2 is a kind of top view of semiconductor laser ageing experimental rig provided by the embodiment of the utility model.Such as Fig. 2
Shown, on the basis of the above embodiments, further, 120 end of opening of the air bell is provided with outwardly extending chimb,
It is provided with mounting hole 110 on the chimb, the through-hole with the mounting hole 110 cooperation is provided on the circuit board 500.
In the present embodiment, it is provided with by being provided with mounting hole 110 on the chimb of air bell, and on circuit board 500
The through-hole cooperated with mounting hole 110, bolt passes through mounting hole 110 and through-hole and nut cooperates, so that air bell and circuit board 500
It is cooperatively connected.
Fig. 4 be it is provided by the embodiment of the utility model can a kind of structure of semiconductor laser ageing experimental rig heating member
Schematic diagram.As shown in figure 4, on the basis of the above embodiments, further, being provided with adding thermal resistance on the heating member 400
Route 410 and heat input electrode 420；
The heat input electrode 420 is used for and circuit board 500 is electrically connected, and the heat input electrode 420 is gone back and adding thermal resistance
Route 410 connects, so that the heating member 400 generates heat.
Wherein, heating member 400 uses Kapton substrate flexible.
Adding thermal resistance route 410 be it is multiple, multiple adding thermal resistance routes 410 are uniformly distributed, so that heating member 400 generates heat
It is even.
In the present embodiment, heat input electrode 420 and circuit board 500 are connected, heat input electrode 420 also with adding thermal resistance route
410 connections, so as to make heating member 400 generate heat.
Finally, it should be noted that the above various embodiments is only to illustrate the technical solution of the utility model, rather than it is limited
System；Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should
Understand: it is still possible to modify the technical solutions described in the foregoing embodiments, or to some or all of
Technical characteristic is equivalently replaced；And these are modified or replaceed, it does not separate the essence of the corresponding technical solution, and this is practical new
The range of each embodiment technical solution of type.
Claims (10)
1. a kind of semiconductor laser ageing experimental rig characterized by comprising air bell, locating piece, temperature sensor,
Heating member and circuit board；
The open end of the air bell is arranged in the circuit board, and the inside of the air bell is arranged in the locating piece, described
One end far from the circuit board of the locating piece is arranged in heating member, and the heating member is used far from one end of the locating piece
In placing measured device, the temperature sensing and heating member with the circuit board electrical connection；
The temperature sensor is used to detect the temperature information of the measured device, and the temperature information of the measured device is passed
The circuit board is passed, the circuit board controls the calorific value of the heating member according to the temperature information of the measured device, with
The measured device is set to reach preset temperature.
2. semiconductor laser ageing experimental rig according to claim 1, which is characterized in that the semiconductor laser
Ageing test apparatus further includes heat-conducting piece；
The heat-conducting piece is arranged between the heating member and the measured device, and the heat-conducting piece is for producing the heating member
Raw even heat is transmitted on the measured device.
3. semiconductor laser ageing experimental rig according to claim 2, which is characterized in that the heat-conducting piece is close to institute
The one end for stating measured device is provided with the first groove, and the temperature sensor is arranged in first groove.
4. semiconductor laser ageing experimental rig according to claim 3, which is characterized in that the inside of the locating piece
It is provided with the second groove, for accommodating connector, the connector is used for the measured device and described second groove
Circuit board connection.
5. semiconductor laser ageing experimental rig according to claim 4, which is characterized in that the heat-conducting piece and described
It is respectively arranged with multiple first pin holes and multiple second pin holes on connector, multiple first pin holes and multiple described
Second pin holes are arranged in a one-to-one correspondence, and the contact pin on the measured device passes through first pin holes and second pin holes
It is connect with the circuit board.
6. semiconductor laser ageing experimental rig according to claim 1-5, which is characterized in that the air-flow
The top of cover is provided with the opening in trumpet type, the direction along the air bell far from the circuit board, the diameter of the opening
It is gradually reduced.
7. semiconductor laser ageing experimental rig according to claim 6, which is characterized in that the measured device is separate
One end setting of the heating member is in the opening.
8. semiconductor laser ageing experimental rig according to claim 1, which is characterized in that the opening of the air bell
End is provided with outwardly extending chimb, and mounting hole is provided on the chimb, is provided on the circuit board and the mounting hole
The through-hole of cooperation.
9. semiconductor laser ageing experimental rig according to claim 1, which is characterized in that be arranged on the heating member
There are adding thermal resistance route and heat input electrode；
The heat input electrode is used for and circuit board electrical connection, the heat input electrode also with adding thermal resistance connection so that
The heating member fever.
10. semiconductor laser ageing experimental rig according to claim 5, which is characterized in that multiple described second insert
Pin hole is evenly distributed on the connector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821778991.6U CN209028151U (en) | 2018-10-30 | 2018-10-30 | Semiconductor laser ageing experimental rig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821778991.6U CN209028151U (en) | 2018-10-30 | 2018-10-30 | Semiconductor laser ageing experimental rig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN209028151U true CN209028151U (en) | 2019-06-25 |
Family
ID=66907709
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821778991.6U Active CN209028151U (en) | 2018-10-30 | 2018-10-30 | Semiconductor laser ageing experimental rig |
Country Status (1)
| Country | Link |
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| CN (1) | CN209028151U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345873A (en) * | 2020-12-04 | 2021-02-09 | 苏州长光华芯光电技术股份有限公司 | Semiconductor laser low-temperature aging test device and low-temperature aging test method |
-
2018
- 2018-10-30 CN CN201821778991.6U patent/CN209028151U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112345873A (en) * | 2020-12-04 | 2021-02-09 | 苏州长光华芯光电技术股份有限公司 | Semiconductor laser low-temperature aging test device and low-temperature aging test method |
| CN112345873B (en) * | 2020-12-04 | 2023-08-01 | 苏州长光华芯光电技术股份有限公司 | Semiconductor laser low-temperature aging test device and low-temperature aging test method |
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