CN209000547U - A kind of PCIE SSD circuit breaking test device - Google Patents

A kind of PCIE SSD circuit breaking test device Download PDF

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Publication number
CN209000547U
CN209000547U CN201821889898.2U CN201821889898U CN209000547U CN 209000547 U CN209000547 U CN 209000547U CN 201821889898 U CN201821889898 U CN 201821889898U CN 209000547 U CN209000547 U CN 209000547U
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China
Prior art keywords
relay
power supply
diode
switch
pcie ssd
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Active
Application number
CN201821889898.2U
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Chinese (zh)
Inventor
程敬同
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SHENZHEN JIEHE TECHNOLOGY Co Ltd
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SHENZHEN JIEHE TECHNOLOGY Co Ltd
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Priority to CN201821889898.2U priority Critical patent/CN209000547U/en
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Abstract

The utility model relates to a kind of PCIE SSD circuit breaking test devices, including relay, relay power supply module, relay driving module and the test computer for being equipped with PCIE SSD, the power input of the test computer is connected with switch one end of the relay, the switch other end of the relay is connected with the relay power supply module, the relay driving module includes the switch element being connected with the coil output of the relay and the controller that is connected with the switch element, the relay power supply module includes power supply side, first diode and first capacitor, the anode of the first diode is connected with the switch other end of the power supply side and the relay simultaneously, the first end of the first capacitor simultaneously with the cathode of the first diode and the coil of the relay Input terminal is connected, the second end ground connection of the first capacitor.The utility model structure is simple, easy to use, and manufacturing cost is low, and scalability is strong.

Description

A kind of PCIE SSD circuit breaking test device
Technical field
The utility model relates to store apparatus field, in particular to a kind of PCIE SSD circuit breaking test device.
Background technique
The stability of SSD solid state hard disk manufactured hard disk with solid-state electronic storage chip array, SSD solid state hard disk determines Its write-in and the safety for reading data information.Power failure test is in one in solid state hard disk stability test scheme is important Hold, and traditional PCIE solid state hard disk power failure test is the special equipment made by major companies such as serialtek, Quarch, Dynamic then thousands of dollars even tens of thousands of dollars differ, complicated for operation, function locking, and scalability is poor.
Utility model content
In order to solve the above technical problems, the utility model provides a kind of PCIE SSD circuit breaking test device, structure is simple, makes With conveniently, manufacturing cost is low, and scalability is strong, has preferable PCIE SSD power failure test accuracy.
The technical solution adopted in the utility model is: a kind of PCIE SSD circuit breaking test device is provided, including relay, after The power supply of electric power supply module, relay driving module and the test computer for being equipped with PCIE SSD, the test computer is defeated Enter end to be connected with switch one end of the relay, the switch other end of the relay and the relay power supply module phase Even, the relay driving module includes the switch element being connected with the coil output of the relay and first with the switch The connected controller of part, the relay power supply module include power supply side, first diode and first capacitor, and described first The anode of diode is connected with the switch other end of the power supply side and the relay simultaneously, the first capacitor First end is connected with the coil input end of the cathode of the first diode and the relay simultaneously, the first capacitor Second end ground connection.
It further include reversed with the coil of the relay in PCIE SSD circuit breaking test device described in the utility model Second diode in parallel, the switch element are NPN type triode, the base stage of the NPN type triode and the controller Connection, the collector of the NPN type triode connect the anode of second diode, the emitter of the NPN type triode Ground connection.
In PCIE SSD circuit breaking test device described in the utility model, the controller is STC89C52RC monolithic Machine.
It further include connecting with the coil of the relay in PCIE SSD circuit breaking test device described in the utility model Indicator light.
It further include the USB being connected with the controller in PCIE SSD circuit breaking test device described in the utility model Interface module.
PCIE SSD circuit breaking test device structure provided by the utility model is simple, and easy to use, manufacturing cost is low;Pass through Relay power supply module, relay driving module provide the stability and reliability of test circuit significantly, avoid voltage not The case where surely test data being caused to malfunction, substantially increase the accuracy of test data;Multichannel extension can be carried out, while to multiple PCIE SSD is tested, flexible operation, and scalability is strong.
Detailed description of the invention
Below in conjunction with accompanying drawings and embodiments, the utility model is described in further detail, in attached drawing:
Fig. 1 is the electrical block diagram of the utility model embodiment.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and implementation Example, the present invention will be further described in detail.It should be appreciated that specific embodiment described herein is only used to explain The utility model is not used to limit the utility model.
As shown in Figure 1, PCIE SSD circuit breaking test device provided by the embodiment of the utility model, including relay, relay Device power supply module, relay driving module and the test computer 1 for being equipped with PCIE SSD, wherein the power supply of test computer 1 is defeated Enter end to be connected with one end switch S of relay, the switch S other end of relay is connected with relay power supply module, relay Drive module includes the switch element being connected with the coil J output end of relay and the controller 2 being connected with switch element, relay Device power supply module includes power supply side VCC, first diode D1 and first capacitor C1, the anode of first diode D1 simultaneously with Power supply side VCC is connected with the switch S other end of relay, the first end of first capacitor C1 simultaneously with first diode D1 Cathode be connected with the coil J input terminal of relay, the second end of first capacitor C1 ground connection.When specifically used, controller 2 It is powered and is powered off a period of time every set time control switch element, is divided into 3-10 seconds between power-off time as being powered every time, When switch element is powered, the coil J of relay is powered, and the switch S of relay is driven to be attracted.Power supply side VCC for after Passing through first diode D1 while the switch S power supply of electric appliance is first capacitor C1 charging, when first capacitor C1 both end voltage reaches It is the supplying power for input end of the coil J of relay after to the pick-up voltage of relay, after the switch S of relay is attracted, is equipped with The test computer 1 of PCIE SSD obtains electric carry out normal operating condition.When the input terminal voltage VCC of the switch S of relay drops suddenly When low, the characteristic that cannot be mutated using capacitor both end voltage still can maintain the pick-up voltage of relay, and at this time the 1st The cathode voltage of pole pipe D1 is lower than cathode voltage, first diode D1 cut-off, therefore first capacitor C1 is the coil J's of relay Supplying power for input end, the switch S of relay continues to keep attracting state, so as to avoid during the test, due to voltage instability Lead to the input terminal voltage of relay switch reduces suddenly, makes relay coil electricity shortage and causes relay switch power down Situation avoids the case where voltage instability causes test data to malfunction, and substantially increases the accuracy of test data.
Further, circuit breaking test device provided in this embodiment further includes with the coil J reverse parallel connection of relay Two diode D2, the switch element use NPN type triode Q, and the base stage of NPN type triode Q is connect with controller 2, NPN type The collector of triode Q connects the anode of the second diode D2, the emitter ground connection of NPN type triode.NPN type triode Q's Base stage is connected after receiving control signal, at this time the just extremely low level of the second diode D2, for relay coil J provide it is logical Electric channel, the coil J energization generation galvanomagnetic-effect of relay is to drive the switch S of relay to be attracted, the second diode D2 For freewheeling diode, the back-emf for preventing the switch S of relay from generating when disconnecting damages component.It is provided in this embodiment Circuit breaking test device further includes the indicator light when the circuit of relay coil is connected with the concatenated indicator light 3 of the coil J of relay 3 light, and make user that can clearly view whether equipment tests normally.The present embodiment further includes and controller 2 Connected usb interface module 4 makes user that can connect the USB interface of control computer, controls in order to pass through by usb interface module 4 Computer processed is modified the control program of controller 2, is more flexible test device and scalability.Control in the present embodiment Device 2 processed uses STC89C52RC single-chip microcontroller, and STC89C52RC single-chip microcontroller is a kind of low-power consumption, 8 8-digit microcontroller of high-performance CMOS, Four tunnel input and output can be connected, relay, relay power supply module in the present embodiment, relay driving module are correspondingly provided with four Set, controller 2 four tunnels output be separately connected four relays after be connected with four test computers, thus make the present embodiment provides Circuit breaking test device can the test computers simultaneously to four equipped with PCIE SSD test.
The embodiments of the present invention are described in conjunction with attached drawing above, but the utility model is not limited to The specific embodiment stated, the above mentioned embodiment is only schematical, rather than restrictive, this field it is common Technical staff is not departing from the utility model aims and scope of the claimed protection situation under the enlightenment of the utility model Under, many forms can be also made, these are belonged within the protection of the utility model.

Claims (5)

1. a kind of PCIE SSD circuit breaking test device, which is characterized in that driven including relay, relay power supply module, relay Dynamic model block and the test computer for being equipped with PCIE SSD, the power input of the test computer and the switch of the relay One end is connected, and the switch other end of the relay is connected with the relay power supply module, the relay driving module Including the switch element being connected with the coil output of the relay and the controller being connected with the switch element, it is described after Electric power supply module includes power supply side, first diode and first capacitor, the anode of the first diode simultaneously with institute It states power supply side to be connected with the switch other end of the relay, the first end of the first capacitor is simultaneously with described first The cathode of diode is connected with the coil input end of the relay, the second end ground connection of the first capacitor.
2. PCIE SSD circuit breaking test device according to claim 1, which is characterized in that further include and the relay Second diode of coil reverse parallel connection, the switch element are NPN type triode, the base stage of the NPN type triode and institute Controller connection is stated, the collector of the NPN type triode connects the anode of second diode, the NPN type triode Emitter ground connection.
3. PCIE SSD circuit breaking test device according to claim 1, which is characterized in that the controller is STC89C52RC single-chip microcontroller.
4. PCIE SSD circuit breaking test device according to claim 1, which is characterized in that further include and the relay The concatenated indicator light of coil.
5. PCIE SSD circuit breaking test device according to claim 3, which is characterized in that further include and the controller phase Usb interface module even.
CN201821889898.2U 2018-11-16 2018-11-16 A kind of PCIE SSD circuit breaking test device Active CN209000547U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821889898.2U CN209000547U (en) 2018-11-16 2018-11-16 A kind of PCIE SSD circuit breaking test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821889898.2U CN209000547U (en) 2018-11-16 2018-11-16 A kind of PCIE SSD circuit breaking test device

Publications (1)

Publication Number Publication Date
CN209000547U true CN209000547U (en) 2019-06-18

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821889898.2U Active CN209000547U (en) 2018-11-16 2018-11-16 A kind of PCIE SSD circuit breaking test device

Country Status (1)

Country Link
CN (1) CN209000547U (en)

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