CN208921831U - A kind of k-factor test device - Google Patents
A kind of k-factor test device Download PDFInfo
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- CN208921831U CN208921831U CN201821625897.7U CN201821625897U CN208921831U CN 208921831 U CN208921831 U CN 208921831U CN 201821625897 U CN201821625897 U CN 201821625897U CN 208921831 U CN208921831 U CN 208921831U
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- factor test
- constant temperature
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Abstract
The utility model discloses a kind of k-factor test devices, including constant temperature high-temperature cabinet, the burn-in board being mounted on inside constant temperature high-temperature cabinet, the k-factor test machine being fixed at the top of constant temperature high-temperature cabinet, the industrial personal computer being fixed at the top of k-factor test box, the keyboard and mouse station being mounted at the top of industrial personal computer and the display screen being fixed on keyboard and mouse station, burn-in board is equipped with multiple independent detection stations, the docking golden finger docked with burn-in board is equipped in constant temperature high-temperature cabinet, on the docking gold finger lead to the pinboard of k-factor test machine, the k-factor test machine connects industrial personal computer by signal wire, each station is Kelvin's test mode cabling in the burn-in board.The utility model structure is simple, easy to operate, and use cost is low, and multiple independent detection stations are designed in burn-in board, and it can be simultaneously to multiple device real-time measurement k-factors, work efficiency is high, it is uniform to test environment temperature, and Vf is measured by Kelvin's mode, keeps data more accurate.
Description
Technical field
The utility model relates to a kind of device detection equipment more particularly to a kind of k-factor test devices.
Background technique
Since modern circuit design requires higher and higher, temperature of the circuit design engineer to each component, power
It is proposed new requirement, in this case, binding test work, it has been found that more and more diode production enterprises pair
K-factor, that is, temperature coefficient measurement of product proposes requirement.
The k-factor of diode it be used to indicate the variation feelings of diode conducting voltage Vf under the conditions of PN junction temperature is raised
Condition.From the investigation and understanding to enterprise it can be found that most enterprises are not to be well understood by for this parameter, dedicated survey
Measuring appratus is more expensive and rare numbers, only a small number of Taiwan investment factories have specially purchased survey of the equipment for the parameter from Taiwan
Amount, so that the parameter of product is also promoting its rival to K system in face of the stronger competitiveness this point of client Shi You
Several measurements has stronger demand.Through overtesting it can be found that the junction temperature of diode with its conducting voltage is in a linear relationship
, ratio can be indicated with K.Due to can not directly measure diode internal temperature, in actual test, can only pass through
Change environment temperature, the situation of change of junction temperature simulated with the variation of environment temperature, by under multiple temperature spots to conducting voltage
Measure, it was therefore concluded that the conducting voltage of diode and the temperature of PN junction inversely:
K=| (V2-V1)/(T2-T1) |.
The shortcomings that prior art: the k-factor test device data sampling speed of routine is slow and not intuitive enough on the market at present,
Measurable amount is few, and environment temperature is not balanced enough, influences test effect etc..
Utility model content
The utility model in order to solve above-mentioned defect existing in the prior art and deficiency, provide it is a kind of easy to operate,
Can be simultaneously to multiple device real-time measurement k-factors, work efficiency is high, and test environment temperature is uniform, and passes through Kelvin's mode
Vf is measured, the more accurate K coefficient testing device of data is made.
The technical solution of the utility model includes: a kind of k-factor test device, including constant temperature high-temperature cabinet, it is mounted on constant temperature high temperature
Burn-in board inside case, the k-factor test machine being fixed at the top of constant temperature high-temperature cabinet, the industry control being fixed at the top of k-factor test box
Machine, the keyboard and mouse station being mounted at the top of industrial personal computer and the display screen being fixed on keyboard and mouse station, the aging
Plate is equipped with multiple independent detection stations, and the docking golden finger docked with burn-in board is equipped in the constant temperature high-temperature cabinet, described right
It connects on gold finger lead to the pinboard of k-factor test machine, the k-factor test machine connects industrial personal computer by signal wire, described
Each station is Kelvin's test mode cabling in burn-in board.
The utility model structure is simple, easy to operate using docking golden finger docking burn-in board and constant temperature high-temperature cabinet, uses
It is at low cost, and multiple independent detection stations are designed in burn-in board, it can be simultaneously to multiple device real-time measurement k-factors, work
High-efficient, test environment temperature is uniform, and measures Vf by Kelvin's mode, keeps data more accurate.
Preferably, there are 12 independent detection stations in the burn-in board, device under test is inserted in always according to slide plate silk-screen direction
Change on plate.
This kind of structure facilitates the installation of device under test, it is ensured that the installation stability and test accuracy of device under test.
Preferably, the constant temperature high-temperature cabinet is equipped with constant temperature high temperature chamber door and constant temperature high-temperature cabinet operation panel.
The convenient operation to constant temperature high-temperature cabinet of this kind of structure.
Preferably, the display screen is mounted on keyboard and mouse station by display/panel bracket, the display/panel bracket
It is rotatably connected on keyboard and mouse station.
This kind of structure ensures the degree of firmly installing of display screen, at the same can rotation display screen appropriate direction, it is convenient from
Content in multiple angle observation display screens.
The utility model structure is simple, easy to operate using docking golden finger docking burn-in board and constant temperature high-temperature cabinet, uses
It is at low cost, and multiple independent detection stations are designed in burn-in board, it can be simultaneously to multiple device real-time measurement k-factors, work
High-efficient, test environment temperature is uniform, and measures Vf by Kelvin's mode, keeps data more accurate.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the utility model；
Fig. 2 is the line graph in the utility model between each component；
1. constant temperature high-temperature cabinet in figure, 2. burn-in boards, 3.K coefficient tester, 4. keyboard and mouse stations, 5. display screens, 6.
Constant temperature high temperature chamber door, 7. industrial personal computers, 8. constant temperature high-temperature cabinet operation panels, 9. device under test, 10. display/panel brackets.
Specific embodiment
The utility model is described in further detail with reference to the accompanying drawing, but is not that model is protected to the utility model
The limitation enclosed.
As illustrated in fig. 1 and 2, a kind of k-factor test device, including constant temperature high-temperature cabinet 1, be mounted on inside constant temperature high-temperature cabinet 1
Burn-in board 2, be fixed on the top of constant temperature high-temperature cabinet 1 k-factor test machine 3, be fixed on the industrial personal computer at 3 top of k-factor test box
7, the display screen 5 for being mounted on the keyboard and mouse station 4 at 7 top of industrial personal computer and being fixed on keyboard and mouse station 4.Burn-in board
2 are equipped with 12 independent detection stations, are equipped with the docking golden finger docked with burn-in board 2 in constant temperature high-temperature cabinet 1, dock golden hand
On index wire to the pinboard of k-factor test machine 3, k-factor test machine 3 connects industrial personal computer 7 by signal wire, every in burn-in board 2
A station is Kelvin's test mode cabling.Device under test 9 is inserted in burn-in board 2 according to slide plate silk-screen direction.Constant temperature high temperature
Case 1 is equipped with constant temperature high temperature chamber door 6 and constant temperature high-temperature cabinet operation panel 8.Display screen 5 is mounted on keyboard by display/panel bracket 10
On mouse operation platform 4, display/panel bracket 10 is rotatably connected on keyboard and mouse station 4.
When the utility model is used, there are 12 stations in designed burn-in board, by device under test according to carrying out slide plate silk-screen
Direction is plugged, and is put into constant temperature high-temperature cabinet, on the gold finger lead docked with burn-in board to k-factor test machine pinboard, aging
Each station is Kelvin's test mode cabling on plate, makes the Vf measured more accurate in this way.It is mentioned by industrial control computer
Before set parameter, control miniature constant temperature high-temperature test chamber by communication, settable multiple temperature spots and each temperature spot
Then residence time allows the AD of k-factor test machine high speed to acquire and carries out in real time to device after chamber temperature is constant
Vf sampling gives data to industrial personal computer.
The advantages of the utility model:
1. using Kelvin's four-wire measurement VF, it is more accurate to obtain numerical value；
2. real-time detection stores and automatically generates chart, curve is not afraid of loss of data and data are intuitively easy to analyze；
3. multi-serial ports communication, real-time detection only just measure VF when temperature is invariable, data, which have more, to be said
Take power and accurate dynamics；
4. can test simultaneously multiple devices, meet engineer's demand.
Constant temperature high-temperature cabinet in the utility model, k-factor test machine, industrial personal computer and be market buying conventional components, respectively
Connection between component is also conventional connection, therefore is not stated carefully.
Claims (4)
1. a kind of k-factor test device including constant temperature high-temperature cabinet, the burn-in board being mounted on inside constant temperature high-temperature cabinet, is fixed on perseverance
K-factor test machine at the top of warm high-temperature cabinet, the industrial personal computer being fixed at the top of k-factor test box, the key being mounted at the top of industrial personal computer
Disk mouse operation platform and the display screen being fixed on keyboard and mouse station, it is characterised in that: the burn-in board is equipped with multiple
Independent detection station, the constant temperature high-temperature cabinet is interior to be equipped with the docking golden finger docked with burn-in board, the docking gold finger lead
Onto the pinboard of k-factor test machine, the k-factor test machine connects industrial personal computer by signal wire, each in the burn-in board
Station is Kelvin's test mode cabling.
2. a kind of k-factor test device according to claim 1, it is characterised in that: there is 12 independences in the burn-in board
Detection station, device under test are inserted in burn-in board according to slide plate silk-screen direction.
3. a kind of k-factor test device according to claim 1, it is characterised in that: the constant temperature high-temperature cabinet is equipped with perseverance
Warm high temperature chamber door and constant temperature high-temperature cabinet operation panel.
4. a kind of k-factor test device according to claim 1, it is characterised in that: the display screen passes through display screen branch
Frame is mounted on keyboard and mouse station, and the display/panel bracket is rotatably connected on keyboard and mouse station.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821625897.7U CN208921831U (en) | 2018-10-08 | 2018-10-08 | A kind of k-factor test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821625897.7U CN208921831U (en) | 2018-10-08 | 2018-10-08 | A kind of k-factor test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208921831U true CN208921831U (en) | 2019-05-31 |
Family
ID=66708425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821625897.7U Active CN208921831U (en) | 2018-10-08 | 2018-10-08 | A kind of k-factor test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208921831U (en) |
-
2018
- 2018-10-08 CN CN201821625897.7U patent/CN208921831U/en active Active
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