CN208766291U - A kind of direct current transient state step source test device and system - Google Patents

Abstract

This application discloses a kind of direct current transient state step source test device and systems, comprising: primary processor, fpga chip, DAC chip, ADC chip, linear power amplifier, high-accuracy current divider and direct current instrument transformer；Primary processor, fpga chip, DAC chip, linear power amplifier, high-accuracy current divider and ADC chip are sequentially connected electrically；Direct current instrument transformer is electrically connected with linear power amplifier；ADC chip is also electrically connected with fpga chip.Solves the link circuit that existing direct current instrument transformer transient state step source test needs to disconnect In situ DC mutual inductor body sensors and acquisition unit, it is easy to influence the external circuit framework and operation stability of equipment, there are security risks, and the technical issues of can not really reflect response condition of the direct current instrument transformer to an electrical quantity Spline smoothing.

Description

A kind of direct current transient state step source test device and system

Technical field

This application involves power system and automation technology more particularly to a kind of direct current transient state step source test dresses It sets and system.

Background technique

Transient state step response is measured when primary system electrical quantity changes, and direct current instrument transformer reacts original signal And the important parameter index restored, it is the important leverage of the correct reliability service of DC control system, to the work of DC transmission system Journey has practiced extreme influence.Direct current instrument transformer carries out factory at home and the experimental condition of on-site test is very deficient, and one As only carried out factory testing test, and mainly the stable state accuracy of direct current is tested, is lacked to the transient state of mutual inductor Technology is realized in step response research and corresponding high current high-performance measured power source.In engineer application, to direct current instrument transformer rank Jump response rise time, overshoot, the indexs such as steady time that become have and are distinctly claimed, but due to lacking available transient state step signal Source, this test are not carried out really unanimously, and existing test method is not comprehensive enough.Therefore, the rank of researching DC mutual inductor It jumps onto liter, overshoot and stablize the steps performance indicators such as time, develop amplitude high bandwidth and the excellent direct current step of transient state index Emulation testing power source establishes the emulation test system of complete reliable direct current instrument transformer step response, is that direct current is mutual at this stage There is an urgent need to the significant concern of research points for sensor testing field.

In the stage that direct current instrument transformer on-the-spot test is implemented, generally in conditions permit, by disconnecting In situ DC The link circuit of the acquisition unit of mutual inductor ontology sensing head and direct current instrument transformer, it is single from acquisition using conventional signal generator First signal input front end applies step small voltage signal, exports digital sampled signal after A/D is converted, and is entered by combining unit straight Calibration equipment is flowed, realizes the local transient test process to direct current instrument transformer.But this method needs to change actual sampling Circuit connection may will affect the external circuit framework and operation stability of existing device, and there are security risks, unsuitable at the scene Carry out, direct current instrument transformer can not reflected really to primary electrical comprising direct current instrument transformer ontology especially in test macro Measure the response condition of Spline smoothing.

Utility model content

The embodiment of the present application provides a kind of direct current transient state step source test device and system, and it is mutual to solve existing direct current The link circuit for needing to disconnect In situ DC mutual inductor body sensors and acquisition unit is tested in sensor transient state step source, is easy shadow The external circuit framework and operation stability of equipment are rung, there are security risks, and can not really reflect direct current instrument transformer to primary The technical issues of response condition of electrical quantity Spline smoothing.

In view of this, the application first aspect provides a kind of direct current transient state step source test device, described device includes: Primary processor, fpga chip, DAC chip, ADC chip, linear power amplifier, high-accuracy current divider and direct current instrument transformer；

The primary processor, the fpga chip, the DAC chip, the linear power amplifier, the high-precision point Stream device and the ADC chip are sequentially connected electrically；

The direct current instrument transformer is electrically connected with the linear power amplifier；

The ADC chip is also electrically connected with the fpga chip.

Preferably, the primary processor is MPC8247 embedded microprocessor.

Preferably, the fpga chip is XC3S1500 chip.

Preferably, the DAC chip is AD5683R chip.

Preferably, the ADC chip is AD7690 chip.

Preferably, the linear power amplifier uses push-pull circuit.

The application second aspect provides a kind of direct current transient state step source test macro, including signal generator and aforementioned any A kind of test device；

The signal generator is electrically connected with the test device.

Preferably, the signal generator is signal source or host computer.

Preferably, the test macro, further includes: tester；

The tester is electrically connected with the direct current instrument transformer.

Preferably, the tester is frequency spectrograph.

As can be seen from the above technical solutions, the application has the following advantages:

A kind of direct current transient state step source test device provided by the present application, comprising: primary processor, fpga chip, DAC core Piece, ADC chip, linear power amplifier, high-accuracy current divider and direct current instrument transformer；Primary processor, fpga chip, DAC chip, Linear power amplifier, high-accuracy current divider and ADC chip are sequentially connected electrically；Direct current instrument transformer and linear power amplifier electricity Connection；ADC chip is also electrically connected with FPGA chip.Device provided by the present application is not required to when carrying out direct current instrument transformer test The link circuit for disconnecting the acquisition unit of direct current instrument transformer ontology sensing head and direct current instrument transformer, individually to direct current instrument transformer Acquisition unit applies voltage, but direct current instrument transformer is treated as an entirety, can directly pass through direct current transient state step source test dress It sets the small signal of input step to test direct current instrument transformer, since the small signal of the step of input passes through primary processor, FPGA core The processing of piece, DAC chip and linear power amplifier, and by the feedback effect of high-accuracy current divider and ADC chip, so that The direct current transient state step source signal that final test obtains is truer, and direct current instrument transformer can be realized and become to an electrical quantity step The signal testing of change.It solves existing direct current instrument transformer transient state step source test and needs to disconnect In situ DC mutual inductor ontology biography The link circuit of sensor and acquisition unit is easy to influence the external circuit framework and operation stability of equipment, there are security risk, And the technical issues of can not really reflecting response condition of the direct current instrument transformer to an electrical quantity Spline smoothing.

Detailed description of the invention

Technical solution in ord to more clearly illustrate embodiments of the present application, below will be to required use in embodiment description Attached drawing be briefly described, it should be apparent that, the drawings in the following description are only some examples of the present application, for this For the those of ordinary skill of field, without any creative labor, it can also be obtained according to these attached drawings other Attached drawing.

Fig. 1 is a kind of structural schematic diagram of direct current transient state step source test device provided by the present application；

Fig. 2 is a kind of structural schematic diagram of direct current transient state step source test macro provided by the present application；

Fig. 3 is the circuit diagram of linear power amplifier provided by the present application.

Specific embodiment

In order to make those skilled in the art more fully understand application scheme, below in conjunction in the embodiment of the present application Attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is only this A part of the embodiment of application, instead of all the embodiments.Based on the embodiment in the application, those of ordinary skill in the art Every other embodiment obtained without making creative work, shall fall in the protection scope of this application.

In order to make it easy to understand, a referring to Fig. 1, a kind of reality of direct current transient state step source test device provided by the present application Apply example, comprising: primary processor 1, fpga chip 2, DAC chip 3, ADC chip 6, linear power amplifier 4, high-accuracy current divider 5 With direct current instrument transformer 7；

Primary processor 1, fpga chip 2, DAC chip 3, linear power amplifier 4, high-accuracy current divider 5 and ADC chip 6 It is sequentially connected electrically；

Direct current instrument transformer 7 is electrically connected with linear power amplifier 4；

ADC chip 6 is also electrically connected with fpga chip 2.

It is mutual in order to reduce direct current in 7 on-the-spot test implementation phase of direct current instrument transformer it should be noted that in the prior art Influence of 7 ontology of sensor to direct current step signal, needs to disconnect 7 ontology sensing head of direct current instrument transformer and direct current instrument transformer 7 acquires The link circuit of unit applies step small voltage signal from acquisition unit signal input front end using conventional signal generator, Digital sampled signal is exported after A/D is converted, direct current calibration equipment is entered by combining unit, realizes the part to direct current instrument transformer Transient test process.This method for disconnecting mutual inductor home loop, may influence whether the external circuit framework of equipment and set The stability of received shipment row, there are security risks.The direct current transient state step source test device provided in the embodiment of the present application, including master Processor 1, fpga chip 2, DAC chip 3, ADC chip 6, linear power amplifier 4, high-accuracy current divider 5 and direct current instrument transformer 7, directly the small signal of direct current transient state step source test device input step can test direct current instrument transformer 7, do not need to break The link circuit for opening the acquisition unit of 7 ontology sensing head of direct current instrument transformer and direct current instrument transformer 7, can be realized direct current instrument transformer 7 To the signal testing of an electrical quantity Spline smoothing.

Device provided by the present application does not need to disconnect 7 ontology of direct current instrument transformer biography when carrying out direct current instrument transformer test Feel the link circuit of the acquisition unit of head and direct current instrument transformer 7, voltage individually is applied to the acquisition unit of direct current instrument transformer 7, and It is that direct current instrument transformer 7 can directly be passed through into the small signal pair of direct current transient state step source test device input step as an entirety Direct current instrument transformer 7 is tested, since the small signal of the step of input passes through primary processor 1, fpga chip 2, DAC chip 3 and line Property power amplifier processing, and by high-accuracy current divider 5 and ADC chip 6 feedback effect so that final test obtains Direct current transient state step source signal it is truer, direct current instrument transformer can be realized, the signal of electrical quantity Spline smoothing is surveyed Examination.It solves existing direct current instrument transformer transient state step source test and needs to disconnect In situ DC mutual inductor body sensors and acquisition The link circuit of unit is easy to influence the external circuit framework and operation stability of equipment, and there are security risks, and can not be true The technical issues of reflecting response condition of the direct current instrument transformer to an electrical quantity Spline smoothing.

Another embodiment of a kind of direct current transient state step source test device provided by the present application, in the base of previous embodiment On plinth:

Further, primary processor 1 is MPC8247 embedded microprocessor.

It should be noted that MPC8247 embedded microprocessor includes the kernel based on PowerPC MPC603e, With a communication process kernel CPM, double-core design has powerful processing capacity and higher integrated level, reduces the group of system At expense, the design of circuit board is simplified, power consumption is reduced.

Further, fpga chip 2 is XC3S1500 chip.

It should be noted that XC3S1500 chip, includes 1,500,000 system doors, 32 special multipliers, 4 numbers Clock management module, logical resource is abundant, and the speed of service is fast.FPGA utilizes accurate capability of sequential control, completes Ethernet Media access control sublayer design, the Interface design of media access control sublayer and ethernet controller, ethernet data acceptance, the control of DAC, A/D data Acquisition, is completed at the same time high-speed serial data reception and switching value receives.

Further, DAC chip 3 is AD5683R chip.

It should be noted that AD5683R chip is a 16 single channel converters, relative accuracy is ± 2LSBINL, Built-in 2ppm/ DEG C of 2.5V reference voltage source；It, can be in smaller electricity using section 8 pin MSOP of space-efficient 2mm × 2mm encapsulation Realize more functions in the plate space of road, the total non-alignment error of 2mV is not necessarily to initial calibration or adjustment；4kV HBM ESD is specified Value, realizes system robustness.

Further, ADC chip 6 is AD7690 chip.

It should be noted that AD7690 chip has the difference ADC of 1.5LSB INL, 400k SPS index, difference is defeated Enter characteristic with stronger interference free performance.

Further, linear power amplifier 4 uses push-pull circuit.

It should be noted that linear power amplifier 4 uses push-pull circuit, for maximum output current up to 600A, stable state is defeated Precision is better than 0.2% out.As shown in figure 3, the high-power low interference power supply of power module cooperation is real with high precision for power amplifier Existing, input terminal uses heterogeneous equilibrium incoming line, reduces power amplifier common-mode noise shadow under electric system strong interference environment It rings, intergrade uses super low null shift, and ultra-low temperature drift amplifier guarantees that DC precision, output stage cooperate high-precision using MOS power device It spends the noninductive inspection leakage resistance of Low Drift Temperature and completes high current conversion, and design steering engine Thermal protection, overload protection guarantee system safety.

In order to make it easy to understand, referring to Fig. 2, a kind of direct current transient state step source test macro provided by the present application, including letter Number generator 8 and any one test device above-mentioned；

Signal generator 8 is electrically connected with test device.

It should be noted that signal generator 8 is electrically connected with the primary processor 1 of test device, by signal generator 8 to Test device provides the small signal of step.

Further, signal generator 8 is signal source or host computer.

It should be noted that signal generator 8 can be signal source, such as: Luo De signal source, Agilent signal source, signal Generator 8 is also possible to host computer, provides the small signal of step to test device by configuration software from host computer.

Further, test macro, further includes: tester 9；

Tester 9 is electrically connected with direct current instrument transformer 7.

It should be noted that the output end in direct current instrument transformer 7 can connect tester, for direct current instrument transformer 7 Direct current step signal detected.

Further, tester 9 is frequency spectrograph.

It should be noted that tester 9 can be frequency spectrograph, such as: Luo De frequency spectrograph, Agilent frequency spectrograph.

It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description, The specific work process of device and unit, can refer to corresponding processes in the foregoing method embodiment, and details are not described herein.

The above, above embodiments are only to illustrate the technical solution of the application, rather than its limitations；Although referring to before Embodiment is stated the application is described in detail, those skilled in the art should understand that: it still can be to preceding Technical solution documented by each embodiment is stated to modify or equivalent replacement of some of the technical features；And these It modifies or replaces, the spirit and scope of each embodiment technical solution of the application that it does not separate the essence of the corresponding technical solution.

Claims (10)

1. a kind of direct current transient state step source test device characterized by comprising primary processor, fpga chip, DAC chip, ADC chip, linear power amplifier, high-accuracy current divider and direct current instrument transformer；

The primary processor, the fpga chip, the DAC chip, the linear power amplifier, the high-accuracy current divider It is sequentially connected electrically with the ADC chip；

The direct current instrument transformer is electrically connected with the linear power amplifier；

The ADC chip is also electrically connected with the fpga chip.

2. direct current transient state step source according to claim 1 test device, which is characterized in that the primary processor is MPC8247 embedded microprocessor.

3. direct current transient state step source according to claim 1 test device, which is characterized in that the fpga chip is XC3S1500 chip.

4. direct current transient state step source according to claim 1 test device, which is characterized in that the DAC chip is AD5683R chip.

5. direct current transient state step source according to claim 1 test device, which is characterized in that the ADC chip is AD7690 chip.

6. direct current transient state step source according to claim 1 test device, which is characterized in that the linear power amplifier Using push-pull circuit.

7. a kind of direct current transient state step source test macro characterized by comprising appoint in signal generator and claim 1 to 6 Test device described in meaning one；

The signal generator is electrically connected with the test device.

8. direct current transient state step source according to claim 7 test macro, which is characterized in that the signal generator is letter Number source or host computer.

9. direct current transient state step source according to claim 8 test macro, which is characterized in that the test macro is also wrapped It includes: tester；

The tester is electrically connected with the direct current instrument transformer.

10. direct current transient state step source according to claim 9 test macro, which is characterized in that the tester is frequency spectrum Instrument.