CN208661884U - A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device - Google Patents
A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device Download PDFInfo
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- CN208661884U CN208661884U CN201821463213.8U CN201821463213U CN208661884U CN 208661884 U CN208661884 U CN 208661884U CN 201821463213 U CN201821463213 U CN 201821463213U CN 208661884 U CN208661884 U CN 208661884U
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- sample stage
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- scraping blade
- swivel
- decaying
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Abstract
The utility model relates to a kind of decaying In situ ATR-FTIR instrument sample stage cleaning devices, and cleaning mechanism and nozzle mechanism are installed on ATR component；Nozzle mechanism includes spray head, detergent container and pumps pump, and detergent container is for containing detergent, and the liquid feeding end for pumping pump is connected in detergent container by pipeline, and the outlet end for pumping pump is connected by pipeline with spray head, and spray head is arranged towards sample stage；The cleaning mechanism includes scraping blade, flexible scraping arm and electro-swivel, one end of flexible scraping arm is fixed on ATR component, the other end of the flexible scraping arm is connected to above scraping blade by electro-swivel, and the lower section of the scraping blade is in contact with sample stage upper surface；It states single-chip microcontroller and drives scraping blade rotation to scrape sample stage for controlling cleaning mechanism jet cleaning agent and control electro-swivel on sample stage, guarantee that each fluid sample testing result does not influence each other, and operate and realize automation, liberate the both hands of experimenter.
Description
Technical field
The utility model relates to infrared spectrometer cleaning applications more particularly to a kind of decaying In situ ATR-FTIR instrument samples
Platform cleaning device.
Background technique
When carrying out infrared detection, fluid sample is directly dripped on decaying In situ ATR-FTIR instrument sample stage, utilize ATR
Component detects fluid sample spectrum, and before carrying out fluid sample detection next time, it needs manually to utilize cotton progress sample stage
Wiping still retains last time on sample stage after wiping and detects left fluid sample, needs to wait and leave sample on sample stage
Natural air drying is detected using the fluid sample that blower can just carry out next time after air-dried, and not only time-consuming and dynamic for this generic operation
Make cumbersome.It is detected next time if the sample left on sample stage is not cleaned out completely, will affect and examine next time
The experimental data of survey causes large error to experimental result.
Utility model content
For this reason, it may be necessary to a kind of decaying In situ ATR-FTIR instrument sample stage cleaning device be provided, to solve sample stage cleaning
Difficult problem.
To achieve the above object, a kind of decaying In situ ATR-FTIR instrument sample stage cleaning device is inventor provided, is wrapped
Sample stage and ATR component are included, the ATR component is set to the top of sample stage for the sample on test sample platform, including
Cleaning mechanism, nozzle mechanism, power supply and single-chip microcontroller, the cleaning mechanism and nozzle mechanism are installed on ATR component；
The nozzle mechanism includes spray head, detergent container and pumps pump, and the detergent container is for containing washing
Agent, the liquid feeding end for pumping pump are connected in detergent container by pipeline, and the outlet end for pumping pump passes through pipeline and spray head
It is connected, the spray head is arranged towards sample stage, the detergent container and pumps pump and is both secured on ATR component；It is described
Cleaning mechanism includes that scraping blade, flexible scraping arm and electro-swivel, one end of the flexible scraping arm are fixed on ATR component,
The other end of the flexible scraping arm is connected to above scraping blade by electro-swivel, and the shape of the scraping blade is strip, and
The length of scraping blade is more than or equal to the diameter of sample stage, and the lower section of the scraping blade is in contact with sample stage upper surface；
The power supply and single-chip microcontroller are both secured on ATR component, and the single-chip microcontroller is for controlling cleaning mechanism to sample stage
Upper jet cleaning agent and control electro-swivel drive scraping blade rotation to scrape sample stage, and the power supply and single-chip microcontroller are powered
Connection, the single-chip microcontroller with pump pump and electro-swivel is electrically connected.
Further, the flexible scraping arm is cylinder or hydraulic cylinder, the flexible scraping arm and monolithic mechatronics.
Further, the flexible scraping arm is connected to the center position of scraping blade by electro-swivel.
Further, it is detachably connected between the electro-swivel and scraping blade.
Further, the spray head is high-pressure atomization spray head.
Further, the material of the scraping blade is silica gel or rubber material.
It is different from the prior art, above-mentioned technical proposal has the advantages that the decaying In situ ATR-FTIR instrument sample stage
Detergent is uniformly ejected on sample stage by cleaning device using nozzle mechanism, and cleaning mechanism is recycled to wipe sample stage
Cleaning, so that the residual liquid sample on sample stage be cleaned out, guarantees that each fluid sample testing result does not influence each other,
And automation is realized in operation, liberates the both hands of experimenter.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram for In situ ATR-FTIR instrument sample stage cleaning device of decaying of the present embodiment；
Fig. 2 is a kind of circuit theory of the flexible scraping arm of decaying In situ ATR-FTIR instrument sample stage cleaning device of the present embodiment
Figure；
Fig. 3 is that a kind of decaying In situ ATR-FTIR instrument sample stage cleaning device single-chip microcontroller of the present embodiment controls electronic rotation
The circuit diagram of connector.
Description of symbols:
1, sample stage；
2, ATR component；
31, spray head；
32, detergent container；
33, pump is pumped；
41, scraping blade；
42, stretch scraping arm；
43, electro-swivel.
Specific embodiment
Technology contents, construction feature, the objects and the effects for detailed description technical solution, below in conjunction with specific reality
It applies example and attached drawing is cooperated to be explained in detail.
Fig. 1, Fig. 2 and Fig. 3 are please referred to, the utility model provides a kind of decaying In situ ATR-FTIR instrument sample stage cleaning
Device, including sample stage 1 and ATR component 2, ATR component refer to the decaying total reflection of decaying In situ ATR-FTIR analyzer
Component, the full name in English of ATR component are as follows: Attenuated Total Reflectance, the ATR component are set to sample stage
Top for the sample on test sample platform.The sample stage is usually by thallium bromide/thallium iodide, zinc selenide, selenium/silicon/arsenic
Change the materials such as glass or germanium to be made, the working principle of the decaying In situ ATR-FTIR instrument sample stage is: be issued from light source red
Outer light projects on the small specimen surface of refractive index again by the big crystal of refractive index, when the angle of incidence is larger than a critical angle, incident
Light will generate total reflection.Infrared light is to be penetrated into specimen surface to return again to surface after certain depth, in this process, examination
Sample is absorbed in incident light frequency region by selection, intensity of reflected light weakens, and is generated and is absorbed similar spectrogram with projection,
To obtain the structural information of sample surface layer organic principle.
The decaying In situ ATR-FTIR instrument sample stage cleaning device includes cleaning mechanism, nozzle mechanism, power supply and list
Piece machine, cleaning mechanism are to the device left fluid sample and realize automated cleaning on sample stage, and nozzle mechanism is to realize automatically
By the device on cleaning agent spraying to sample stage, the cleaning mechanism and nozzle mechanism are installed on ATR component.
The nozzle mechanism includes spray head 31, detergent container 32 and pumps pump 33, and the detergent container is for containing
Detergent is filled, the liquid feeding end for pumping pump is connected in detergent container by pipeline, and the outlet end for pumping pump passes through pipeline
It is connected with spray head, the spray head is arranged towards sample stage, the detergent container and pumps pump and is both secured to ATR component
On.Detergent in detergent container is sent by pumping pumping to spray head, and detergent sprays from spray head to sample stage, washing
Liquid outlet is offered on agent container, the liquid feeding end for pumping pump is plugged at the liquid outlet of detergent container by pipeline, detergent
Detergent in container is pumped to by the liquid outlet opened up on detergent container to be pumped in pump, defeated by the outlet end for pumping pump
It is sent at spray head, towards on sample stage, detergent is ejected on sample stage spray head from spray head, is carried out to the sample on sample stage clear
It is clean.
In the present embodiment, the ingredient of the detergent is ethyl alcohol or acetone, since fluid sample to be detected is normal
It is more stable under temperature state, it is not easy to chemically react with ethyl alcohol or acetone, but fluid sample to be detected is under normal temperature state
It can be dissolved in ethyl alcohol or acetone, and ethyl alcohol and acetone have stronger volatility, when ethyl alcohol and acetone are from detergent
It is pumped in container after pumping send and be ejected on sample stage, is dissolved in fluid sample in ethyl alcohol or acetone with ethyl alcohol or acetone
Volatility is pulled away.
The cleaning mechanism includes scraping blade 41, flexible scraping arm 42 and electro-swivel 43, scraping blade edge on sample stage
Sample stage surface rotation scrape, detergent of the accelerating jetting on sample stage is evenly distributed on sample stage after scraping blade scrapes
On, detergent carrying of liquids sample volatilization, to achieve the purpose that clean sample stage.Electro-swivel drives scraping blade in sample
Rotation scrapes on platform, detergent uniformly can either be applied to sample stage everywhere, and can speed up detergent volatilization and take away liquid
Sample.One end of the flexible scraping arm is fixed on ATR component, and the other end of the flexible scraping arm is connected by electro-swivel
It is connected to above scraping blade, the lower section of the scraping blade is in contact with sample stage upper surface.Flexible scraping arm is scalable, need to sample stage into
When scraping, scraping blade is butted on above sample stage row by flexible scraping arm elongation, and after cleaning, the scraping arm that stretches, which is shunk, to be risen, scraping blade from
Sample stage is opened, user can carry out fluid sample detection next time.
The shape of the scraping blade is strip, and the length of scraping blade is more than or equal to the diameter of sample stage, scraping blade and sample stage
When upper surface is in contact, for scraping blade under the drive of electro-swivel, rotation scrapes sample stage, and scraping blade rotary course is formed by
It scrapes region and sample stage is completely covered, to can be cleaned everywhere in sample stage in place.In more preferred embodiment, described
Flexible scraping arm is connected to the center position of scraping blade by electro-swivel, i.e., flexible scraping arm is connected to by electro-swivel
The position of scraping blade is corresponding with the geometric center position of sample stage, region, that is, sample stage region that scraping blade rotation scrapes.
The power supply and single-chip microcontroller are both secured on ATR component, and the power supply is single-chip microcontroller, electro-swivel and pumping
Pump is sent to provide kinetic energy, the power supply can directly be the power supply of ATR component.In certain preferred embodiments, power supply with
And single-chip microcontroller is both secured in the shell of ATR component.The single-chip microcontroller is for controlling cleaning mechanism jet cleaning on sample stage
Agent and control electro-swivel drive scraping blade rotation to scrape sample stage, have in the single-chip microcontroller for controlling nozzle mechanism
Jet cleaning agent and scraping blade rotation scrape the program of sample stage.The power supply with single-chip microcontroller for being electrically connected, the single-chip microcontroller with
Pump and electro-swivel electrical connection are pumped, single-chip microcontroller is pumped by pumping in control nozzle mechanism will be in detergent container
Detergent is pumped to being ejected on sample stage at spray head, and single-chip microcontroller is controlled by the electro-swivel in control cleaning mechanism
Scraping blade rotates wiping on sample stage.
The decaying In situ ATR-FTIR instrument sample stage cleaning device further includes switch, and the switch is electrically connected to a power source,
The decaying In situ ATR-FTIR instrument sample stage cleaning device when in use, experimenter complete fluid sample detection after,
Switch is opened, the decaying In situ ATR-FTIR instrument sample stage cleaning device is started, single-chip microcontroller controls nozzle mechanism to sample stage
Upper jet cleaning agent, the flexible scraping arm for then controlling cleaning mechanism, which is extended to scraping blade, is butted on sample stage, then controls electronic rotation
Connector rotation, scraping blade wipe sample stage surface under the drive of electro-swivel, stop electro-swivel, complete
Then the wiping work of sample stage controls flexible scraping arm and shrinks back initial position, a cleaning is completed, experimental work personnel
New fluid sample can be titrated on sample stage carries out next round sample detection.
In certain preferred embodiments, the flexible scraping arm is electric cylinders, the flexible scraping arm and monolithic mechatronics.It is single
Have in piece machine for controlling the flexible program of flexible scraping arm, single-chip microcontroller realizes scraping blade and sample by controlling the flexible of flexible scraping arm
Whether the contact of sample platform.After the detection to fluid sample is completed, the direction that single-chip microcontroller controls flexible scraping arm towards sample stage is stretched
Length, until scraping blade stops after arriving to sample stage, after scraping blade is completed to clean to sample stage, single-chip microcontroller controls flexible scraping arm court and sample
The opposite direction of platform is shunk, and scraping blade leaves sample stage, and experiment operator can instill sample detection next time on sample stage
Liquid is worked with carrying out infrared liquid sample detection next time, and Fig. 2 is to control the flexible circuit diagram of electric cylinders.In other realities
It applies in example, the flexible scraping arm is also possible to cylinder or hydraulic cylinder.
The model of the single-chip microcontroller are as follows: AT89C51.
In certain preferred embodiments, the flexible scraping arm is connected to the center position of scraping blade by electro-swivel
It sets, is around being formed by cleaning region with the rotation of the junction of electro-swivel by scraping blade: with scraping blade and electro-swivel
Junction is the center of circle, and the half of scraping blade length value is the round cleaning region that radius of a circle is constituted.The circle cleans region
It is corresponding with sample stage position, and the area in round cleaning region is identical as the area of sample stage.
In certain preferred embodiments, it is detachably connected between the electro-swivel and scraping blade, the scraping blade
Top offers scraping blade connecting hole, and the lower end of the electro-swivel offers connector connecting hole, scraping blade connecting hole and connector
It is connected between connecting hole by connector.
In certain preferred embodiments, the spray head is high-pressure atomization spray head, the beneficial effect is that, detergent is in height
It is uniformly injected on sample stage after being atomized in the state of pressure, enhances the cleaning effect to sample stage.
In certain preferred embodiments, the material of the scraping blade be silica gel perhaps rubber material by silica gel or rubber
Manufactured scraping blade is less likely to occur the phenomenon that shake in scraping process, and the material is soft for silica gel and rubber, in scraping process
Sample stage upper surface will not be damaged.
It should be noted that being not intended to limit although the various embodiments described above have been described herein
The scope of patent protection of the utility model.Therefore, based on the innovative idea of the utility model, embodiment described herein is carried out
Change and modification or equivalent structure or equivalent flow shift made based on the specification and figures of the utility model, directly
Or above technical scheme is used in other related technical areas indirectly, it is included in the protection model of the utility model patent
Within enclosing.
Claims (6)
1. a kind of decaying In situ ATR-FTIR instrument sample stage cleaning device, including sample stage and ATR component, the ATR group
Part is set to the top of sample stage for the sample on test sample platform, it is characterised in that: including cleaning mechanism, nozzle mechanism,
Power supply and single-chip microcontroller, the cleaning mechanism and nozzle mechanism are installed on ATR component；
The nozzle mechanism includes spray head, detergent container and pumps pump, and the detergent container is for containing detergent, institute
It states and pumps the liquid feeding end of pump and be connected in detergent container by pipeline, the outlet end for pumping pump is connected by pipeline with spray head
It connects, the spray head is arranged towards sample stage, the detergent container and pumps pump and is both secured on ATR component；The cleaning
Mechanism includes scraping blade, flexible scraping arm and electro-swivel, and one end of the flexible scraping arm is fixed on ATR component, described
The other end of flexible scraping arm is connected to above scraping blade by electro-swivel, and the shape of the scraping blade is strip, and scraping blade
Length be more than or equal to sample stage diameter, the lower section of the scraping blade is in contact with sample stage upper surface；
The power supply and single-chip microcontroller are both secured on ATR component, and the single-chip microcontroller is sprayed for controlling cleaning mechanism on sample stage
Penetrate detergent and control electro-swivel drive scraping blade rotation to scrape sample stage, the power supply with single-chip microcontroller for being electrically connected,
The single-chip microcontroller with pump pump and electro-swivel is electrically connected.
2. decaying In situ ATR-FTIR instrument sample stage cleaning device according to claim 1, it is characterised in that: described to stretch
Contracting scraping arm is electric cylinders, the flexible scraping arm and monolithic mechatronics.
3. decaying In situ ATR-FTIR instrument sample stage cleaning device according to claim 1, it is characterised in that: described to stretch
Contracting scraping arm is connected to the center position of scraping blade by electro-swivel.
4. decaying In situ ATR-FTIR instrument sample stage cleaning device according to claim 1, it is characterised in that: the electricity
It is detachably connected between dynamic rotary joint and scraping blade.
5. decaying In situ ATR-FTIR instrument sample stage cleaning device according to claim 1, it is characterised in that: the spray
Head is high-pressure atomization spray head.
6. decaying In situ ATR-FTIR instrument sample stage cleaning device according to claim 1, it is characterised in that: described to scrape
The material of piece is silica gel or rubber material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821463213.8U CN208661884U (en) | 2018-09-07 | 2018-09-07 | A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821463213.8U CN208661884U (en) | 2018-09-07 | 2018-09-07 | A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device |
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| Publication Number | Publication Date |
|---|---|
| CN208661884U true CN208661884U (en) | 2019-03-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821463213.8U Expired - Fee Related CN208661884U (en) | 2018-09-07 | 2018-09-07 | A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108816869A (en) * | 2018-09-07 | 2018-11-16 | 福建师范大学 | A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device |
-
2018
- 2018-09-07 CN CN201821463213.8U patent/CN208661884U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108816869A (en) * | 2018-09-07 | 2018-11-16 | 福建师范大学 | A kind of decaying In situ ATR-FTIR instrument sample stage cleaning device |
| CN108816869B (en) * | 2018-09-07 | 2023-10-13 | 福建师范大学 | Sample stage cleaning device for attenuated total reflection infrared spectrometer |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190329 Termination date: 20210907 |
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| CF01 | Termination of patent right due to non-payment of annual fee |