CN208654263U - A kind of test cabinet - Google Patents
A kind of test cabinet Download PDFInfo
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- CN208654263U CN208654263U CN201821202269.8U CN201821202269U CN208654263U CN 208654263 U CN208654263 U CN 208654263U CN 201821202269 U CN201821202269 U CN 201821202269U CN 208654263 U CN208654263 U CN 208654263U
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Abstract
The utility model relates to a kind of test cabinets, including test box, fixed plate, connecting plate, heat shields and top plate, fixed plate lid is located at test box upper end, the upper surface of fixed plate is equipped with thimble substrate, and the lower surface of fixed plate is equipped with the first pinboard, is equipped with guide rod respectively at the surrounding corner of fixed plate, connecting plate is set in the middle part of guide rod, and move up and down along guide rod, connecting plate is equipped with multiple modules to be tested, and multiple modular spacings to be tested are arranged on connecting plate；Thimble substrate is electrically connected with the first pinboard, the electrical connection of the first pinboard external host.The test cabinet of the utility model, it can make when connecting plate moves downwardly to lowermost end, all modules to be tested are electrically connected with thimble substrate automatically simultaneously, instant noodles batch operation, it is easy to operate, substantially increase testing efficiency, and after testing, moving upwards by connecting plate can be realized all modules to be tested and disconnect automatically.
Description
Technical field
The utility model relates to automatic measurement technique field more particularly to a kind of test cabinets.
Background technique
The test of module class product at present is placed on trial product to be measured on test tote cart, then will be each to be measured
Trial product connects (including power supply signal and/or test signal) one by one, but under this mode of operation efficiency is very low, and hold
Easily occur contacting unstable phenomenon.Also, existing module class test equipment is mostly to realize single product aging, replaces product
When need to purchase or make again test turnover vehicle device.And occupancy volume is larger, all makes in economy and utilization of area rate
At bigger waste.
Utility model content
Technical problem to be solved in the utility model is in view of the above shortcomings of the prior art, to provide a kind of test machine
Cabinet.
The technical solution that the utility model solves above-mentioned technical problem is as follows: a kind of test cabinet, including upper end opening
Test box, fixed plate, connecting plate, heat shields and top plate, the fixed plate lid are located at the test box upper end, the fixation
The upper surface of plate is equipped with thimble substrate, and the lower surface of the fixed plate is equipped with the first pinboard, the surrounding corner of the fixed plate
Place is respectively equipped with guide rod, is set in the middle part of the corresponding guide rod at the surrounding corner of the connecting plate respectively, and
It moves up and down along the guide rod, the connecting plate is equipped with multiple modules to be tested, the heat shields and the company
The side of fishplate bar is rotatablely connected, and the heat shields can turn to and cover module to be tested, and the top plate is led by described
Be set to the top of the connecting plate to bar support, and at the surrounding corner of the top plate respectively with the corresponding guide rod
Top is fixedly connected, and multiple modular spacings to be tested are arranged on the connecting plate；The thimble substrate and first switching
Plate electrical connection, the first pinboard external host electrical connection, and when the connecting plate moves downwardly to lowermost end, needed
Test module is electrically connected with the thimble substrate.
The beneficial effects of the utility model are: the test cabinet of the utility model, by the connecting plate in the guiding
It moves up and down, can make when the connecting plate moves downwardly to lowermost end on bar, all modules to be tested while and thimble
Substrate is electrically connected automatically, instant noodles batch operation, easy to operate, substantially increases testing efficiency, and after test, is passed through
Connecting plate, which moves upwards, can be realized all modules to be tested and disconnects automatically.
Based on the above technical solution, the utility model can also do following improvement:
Further, the connecting plate includes positioning plate and plugboard, the positioning plate is located at the top of the plugboard, and
The middle part of the corresponding guide rod is set at the surrounding corner of the two respectively, and can be transported up and down along the guide rod
Dynamic, the positioning plate is equipped with multiple bayonets to match with module to be tested, and module one-to-one correspondence to be tested is connected to described
In bayonet, the first opening being passed down through for module to be tested, institute are equipped on the positioning plate with the bayonet corresponding position
The upper surface for stating plugboard is equipped with the multiple plug sockets to match with module to be tested, and the lower surface of the plugboard is equipped with second
Pinboard, all plug sockets are electrically connected with second pinboard, when the positioning plate moves downward and drives described
When plugboard moves to lowermost end, the attachment base of module to be tested is electrically connected with the corresponding plug socket just, and described second
Pinboard is electrically connected with the thimble substrate just, and the side of the heat shields and the positioning plate is rotatablely connected, and can
Cover module to be tested.
The beneficial effect of above-mentioned further scheme is: can be by the fixed one-to-one correspondence of module to be tested by the positioning plate
Ground is arranged in bayonet, and when the positioning plate moves downward and the plugboard is driven to move to lowermost end, die trial to be measured
Block is electrically connected with the corresponding plug socket just, and instant noodles batch operation is easy to operate, substantially increases ageing efficiency, and
And for different modules to be tested before aging starts or after, can be by by the positioning plate and the plugboard point
From being convenient for changing corresponding trial product to be measured, plug socket and pinboard, to realize to different product aging, enhance entire
The versatility of equipment.
Further, the positioning plate is equipped with multiple first pallets and and a pair identical as first tray number
Card adapter plate on first pallet should be set, first tray both slid is arranged on the positioning plate, and can with it is corresponding
The card adapter plate extracted out together from the side of the positioning plate, each first pallet is equipped with multiple bayonets, and described
The second opening that corresponding bayonet is downwardly into for the module to be tested is equipped in card adapter plate with the bayonet corresponding position, when
When first pallet is pushed completely into from the side of the positioning plate, the positioning plate passes through the connection in module to be tested just
Module to be tested is fixed in the corresponding bayonet by seat.
The beneficial effect of above-mentioned further scheme is: module to be tested can be connected to the first pallet by the bayonet
On, it is cooperated by the card adapter plate and the first pallet, module to be tested can be fixed on to the bayonet of first pallet
It is interior, improve module to be tested to the splicing stability of plug socket, when the positioning plate being avoided to move downward, module to be tested is from right
Prolapse upwards in the buckle answered cause module to be tested can not be with corresponding plug socket grafting, and then can not normal aging；
In addition, corresponding multiple modules to be tested can also be extracted out from the side of the positioning plate together by first pallet,
It is convenient to treat test product batch operation with after aging before ageing, greatly improve ageing efficiency.
Further, being additionally provided at least one second pallet on the positioning plate, second pallet is arranged described first
Between pallet and the positioning plate, and each second pallet is equipped at least one described first pallet, second support
Disk first is slidably arranged on the positioning plate, and can be together with first pallet being disposed thereon from the positioning plate
Side or other side extraction, second pallet are open equipped with third corresponding with second opening.
The beneficial effect of above-mentioned further scheme is: can will be described in described be disposed thereon by second pallet
First pallet is extracted out from the side of the positioning plate or the other side together, is convenient for changing the first different pallets together with setting the
Card adapter plate on one pallet, so that convenient carry out burn-in test to different modules to be tested, it is easy to operate, it is convenient and practical.
Further, the upper surface of the positioning plate, which is equipped with even number first, drives cylinder, the first driving cylinder is symmetrical
Be arranged on the positioning plate, and the output end of the first driving cylinder be passed down through after the positioning plate elongation to it is described
Plugboard abuts, to drive the positioning plate to move up and down along the guide rod, and when the first driving cylinder drives institute
When stating positioning plate and moving downwardly to lowermost end, module to be tested sequentially passes through the second opening, bayonet, third opening and first and opens
It is electrically connected after mouthful with the corresponding plug socket, second built-up circuit is electrically connected with the thimble substrate.
The beneficial effect of above-mentioned further scheme is: the positioning plate can be driven to go up and down by the first driving cylinder
Movement is very convenient to realize module to be tested and the autopatching of corresponding plug socket or be automatically separated, and grafting precision
Higher, connective stability is good.
Further, the plugboard is equipped with multiple pinboards and at least one third pallet, on each pinboard
Equipped with plug socket described at least one, each third pallet is equipped at least one described pinboard, the third pallet
It is slidably arranged on the plugboard, and can be together with the pinboard being disposed thereon from the side of the plugboard or another
Side extraction.
The beneficial effect of above-mentioned further scheme is: the grafting that can will be disposed thereon by the third pallet
Disk is extracted out from the side of the pinboard or the other side together, facilitates plug socket described in batch replacement and the second built-up circuit, with
Meet the testing requirement of different modules to be tested, operating efficiency is high.
It corresponds and is detected on the corresponding plug socket with the plug socket and be further, the third pallet is equipped with
The no switch for being plugged with module to be tested.
Whether the beneficial effect of above-mentioned further scheme is: can be plugged with each bayonet of real-time detection by the switch
Module to be tested controls module energization starting to be tested according to the signal of the switch output convenient for external host, so as to complete
At test, automatic identification is safe and efficient, energy saving.
Further, first pallet, the side of the second pallet and third pallet and/or the other side are equipped with knob.
The beneficial effect of above-mentioned further scheme is: being facilitated by the way that the knob is arranged by first pallet, the second support
Disk and the extraction of third pallet, and replace the module to be tested being disposed thereon or plug socket.
Further, the lower surface of the fixed plate, which is equipped with even number second, drives cylinder, the second driving cylinder is symmetrical
Be arranged in the fixed plate, and the output end of the second driving cylinder be upward through after the fixed plate elongation to it is described
Plugboard abuts, to drive the plugboard to move up and down along the guide rod, and when the plugboard is upward from lowermost end
When movement, second pinboard is disconnected with the thimble substrate as plugboard is separated with the fixed plate.
The beneficial effect of above-mentioned further scheme is: can drive the pinboard by the way that the second driving cylinder is arranged
Move up and down along the guide rod, and when the pinboard is moved upwards from lowermost end, second pinboard with it is described
Thimble substrate is disconnected as pinboard is separated with the fixed plate, convenient for replacing corresponding plug socket after aging
With the second built-up circuit.
Further, the upper surface edge of the fixed plate is equipped at least a pair of of grating sensor.
The beneficial effect of above-mentioned further scheme is: light curtain is formed by the grating sensor, when there is object to block light
When curtain, output signal is fed back to external host by the grating sensor, and external host is by controlling the first driving cylinder
The lifting of cylinder is driven to realize pinch resistant functionality with second.
Detailed description of the invention
Fig. 1 is the test cabinet structural schematic diagram of the utility model；
Fig. 2 is the superstructure schematic diagram of the test cabinet of the utility model.
In attached drawing, parts list represented by the reference numerals are as follows:
101, test box, 102, fixed plate, 103, top plate, 104, thimble substrate, 105, idler wheel, 106, guide rod, 107,
Positioning plate, 108, pinboard, 109, card adapter plate, the 110, first pallet, the 111, second pallet, the 112, first driving cylinder, 113,
Pinboard, 114, third pallet, the 115, second driving cylinder, 116, heat shields, 117, switch, 118, grating sensor,
119, it shakes hands.
Specific embodiment
The principles of the present invention and feature are described below in conjunction with attached drawing, example is served only for explaining that this is practical
It is novel, it is not intended to limit the scope of the utility model.
As depicted in figs. 1 and 2, a kind of test cabinet, test box 101, fixed plate 102, connecting plate including upper end opening,
Heat shields 116 and top plate 103, the fixed plate 102 lid are located at 101 upper end of test box, the fixed plate 102 it is upper
Surface is equipped with thimble substrate 104, and the lower surface of the fixed plate 102 is equipped with the first pinboard, the surrounding of the fixed plate 102
Edge is respectively equipped with guide rod 106, is set in the corresponding guide rod 106 at the surrounding corner of the connecting plate respectively
Middle part, and move up and down along the guide rod 106, the connecting plate is equipped with multiple modules to be tested, and the heating is anti-
The side of shield 116 and the connecting plate is rotatablely connected, and the heat shields 116 can turn to and cover module to be tested,
The top plate 103 is set to the top of the connecting plate, and the surrounding of the top plate 103 by the guide rod 106 support
It is fixedly connected respectively with the top of the corresponding guide rod 106 at angle, multiple modular spacings to be tested are arranged in the connection
On plate；The thimble substrate 104 is electrically connected with first pinboard, the first pinboard external host electrical connection, and is worked as
When the connecting plate moves downwardly to lowermost end, all modules to be tested are electrically connected with the thimble substrate 104.
The test cabinet of the utility model is moved up and down on the guide rod by the connecting plate, can to work as
When the connecting plate moves downwardly to lowermost end, all modules to be tested are electrically connected with thimble substrate automatically simultaneously, instant noodles batch
Amount operation, it is easy to operate, testing efficiency is substantially increased, and after test, moving upwards by connecting plate be can be realized
All modules to be tested disconnect automatically.
In the embodiments of the present invention, the connecting plate includes positioning plate 107 and plugboard 108, the positioning plate
107 are located at the top of the plugboard 108, and are set in the corresponding guide rod 106 at the surrounding corner of the two respectively
Middle part, and can moving up and down along the guide rod 106, the positioning plate 107 are equipped with multiple with module phase to be tested
The bayonet matched, module to be tested one-to-one correspondence are connected in the bayonet, on the positioning plate 107 with the bayonet corresponding position
Place is equipped with the first opening being passed down through for module to be tested, and the upper surface of the plugboard 108 is equipped with and module phase to be tested
Matched multiple plug sockets, the lower surface of the plugboard 108 are equipped with the second pinboard, and all plug sockets are with described the
The electrical connection of two pinboards, it is to be measured when the positioning plate 107 moves downward and the plugboard 108 is driven to move to lowermost end
The attachment base of die trial block is electrically connected with the corresponding plug socket just, second pinboard just with the thimble substrate
The side of 104 electrical connections, the heat shields 116 and the positioning plate 107 is rotatablely connected, and can cover module to be tested.
Module to be tested fixation can be arranged in bayonet correspondingly by the positioning plate 107, and described
When positioning plate 107 moves downward and the plugboard 108 is driven to move to lowermost end, module to be tested just with it is corresponding described
Plug socket electrical connection, instant noodles batch operation is easy to operate, substantially increases ageing efficiency, and for different to be tested
Module before aging starts or after, can be convenient for changing by separating the positioning plate 107 with the plugboard 108
Corresponding trial product to be measured, plug socket and pinboard enhance the general of whole equipment to realize to different product aging
Property.
Preferably, on the basis of the above embodiments, the positioning plate 107 be equipped with multiple first pallets 110 and with
First pallet, 110 quantity is identical and the card adapter plate that is arranged in a one-to-one correspondence on first pallet 110, first support
Disk 110 is slidably arranged on the positioning plate 107, and can be with the corresponding card adapter plate 109 together from the positioning plate 107
Side extraction, each first pallet 110 are equipped with multiple bayonets, and position corresponding with the bayonet in the card adapter plate 109
The place of setting is equipped with the second opening that corresponding bayonet is downwardly into for the module to be tested, when first pallet 110 is from described fixed
The side of position plate 107 is when being pushed completely into, and the positioning plate 107 is just by the attachment base in module to be tested by module to be tested
It is fixed in the corresponding bayonet.
Module to be tested can be connected on the first pallet 110 by the bayonet, pass through the card adapter plate 109 and
One pallet 110 cooperates, and module to be tested can be fixed in the bayonet of first pallet 110, improve die trial to be measured
Block is to the splicing stability of plug socket, and when the positioning plate 107 being avoided to move downward, module to be tested is from the corresponding buckle
Interior prolapse upwards cause module to be tested can not be with corresponding plug socket grafting, and then can not normal aging；In addition, passing through institute
Stating the first pallet 110 can also extract corresponding multiple modules to be tested out from the side of the positioning plate 107 together, conveniently exist
Before aging and test product batch operation is treated after aging, greatly improves ageing efficiency.
Preferably, multiple bayonets are disposed in an evenly spaced relation on first pallet 110, and are in array distribution, in this way
So that module to be tested is also in array distribution when being inserted on first pallet 110, between each module to be tested of guarantee mutually not
Interference, and reserve enough heat-dissipating spaces.
It is highly preferred that on the basis of the above embodiments, at least one second pallet is additionally provided on the positioning plate 107
111, second pallet 111 is arranged between first pallet 110 and the positioning plate 107, and each second support
Disk 111 is equipped at least one described first pallet 110, and second pallet 111 first is slidably arranged in the positioning plate 107
On, and can be extracted out together from the side of the positioning plate 107 or the other side with first pallet 110 being disposed thereon, institute
The second pallet 111 is stated to be open equipped with third corresponding with second opening.
It can be by first pallet 110 being disposed thereon together from described fixed by second pallet 111
The side of position plate 107 or other side extraction, are convenient for changing the first different pallets 110 together with being arranged on the first pallet 110
Card adapter plate 109, so that convenient carry out burn-in test to different modules to be tested, it is easy to operate, it is convenient and practical.
It is to be herein pointed out if needing the same die trial to be measured of aging after the completion of a batch module aging to be tested
When block, at this time, it is only necessary to by first pallet 110 together with multiple modules to be tested being disposed thereon together from the positioning
The side of plate 107 is extracted out, and new module to be tested, card adapter plate that no replacement is required 109 and the first pallet 110 are then replaced with.If
After the completion of a batch module aging to be tested, when needing aging another kind module to be tested, at this time, it may be necessary to by second pallet
111, the first pallet 110 being arranged on the second pallet 111 and the module to be tested being arranged on the first pallet 110 together from
The side of the positioning plate 107 is extracted out, is first replaced card adapter plate 109 and the first pallet 110, is then replaced with new die trial to be measured again
Block.
In addition, the two sides of each first pallet 110 are arranged on second pallet 111 by sliding rail, often
The two sides of a second pallet 111 are arranged on the positioning plate 107 by sliding rail, this is the prior art, this implementation
Example middle part is being discussed in detail.
In the embodiments of the present invention, the upper surface of the positioning plate 107 is equipped with even number first and drives cylinder
112, the first driving cylinder 112 is symmetricly set on the positioning plate 107, and the output of the first driving cylinder 112
Elongation with the plugboard 108 to abutting after end is passed down through the positioning plate 107, to drive the positioning plate 107 along institute
The up and down motion of guide rod 106 is stated, and when the first driving cylinder 112 drives the positioning plate 107 to move downwardly to and most bottom
When end, module to be tested respectively corresponds and the first pallet after sequentially passing through the second opening, bayonet, third opening and the first opening
110, the second pallet 111 and positioning plate 107 are electrically connected with the corresponding plug socket, second built-up circuit and the thimble
Substrate 104 is electrically connected.
107 elevating movement of positioning plate can be driven to realize module to be tested by the first driving cylinder 112
With the autopatching of corresponding plug socket or be automatically separated, very convenient, and grafting precision is higher, connective stability is good.
In practice, in order to improve 107 plate face utilization rate of positioning plate, the first driving cylinder 112 is arranged described fixed
At the side edge of position plate 107, and the middle position of positioning plate 107 is reserved and is used for second pallet 111, it in this way can be with
More modules to be tested are set on second pallet 111, and not only structure is beautiful, and each burn-in test is to be tested
Module number is relatively more.
In the embodiments of the present invention, the plugboard 108 is equipped with multiple pinboards 113 and at least one third
Pallet 114, each pinboard 113 are equipped at least one described plug socket, and each third pallet 114 is equipped with extremely
A few pinboard 113, the third pallet 114 are slidably arranged on the plugboard 108, and can be disposed thereon
The pinboard 113 extracted out together from the side of the plugboard 108 or the other side.
It can be by the pinboard 113 being disposed thereon together from the plugboard 108 by the third pallet 114
Side or other side extraction, facilitate plug socket described in batch replacement and the second built-up circuit, to meet different modules to be tested
Testing requirement, operating efficiency is high.
It is to be herein pointed out if needing the same die trial to be measured of aging after the completion of a batch module aging to be tested
When block, at this point, without being replaced to the pinboard 113 and third pallet 114, it only need to be after changing new module to be tested
The positioning plate 107 is driven to move downward, until the module to be tested is electrically connected with the plug socket.If a batch to
After the completion of test module aging, when needing aging another kind module to be tested, at this point, 109 He of card adapter plate on positioning plate 107
After first pallet 110 is replaced, then the fishplate bar 113, third pallet 114 and the second built-up circuit replaced together, finally
Replace with new module to be tested.
Preferably, on the basis of the above embodiments, the position of the pinboard 113 is located on the third pallet 114
Place is correspondingly provided with for detecting the switch 117 for whether being plugged with module to be tested at the pinboard 113, and the switch 117 with
External host electrical connection.It whether can be plugged with module to be tested with each bayonet of real-time detection by the switch 117, convenient for outer
Portion's host, which controls the module to be tested and is powered, to be started, and automatic identification is safe and efficient, energy saving.Here, the switch 117
Select the test probe of model KG-300K.
Preferably, on the basis of the above embodiments, first pallet 110, the second pallet 111 and third pallet 114
Side and/or the other side be equipped with knob 119.Facilitated by the way that the knob 119 is arranged by first pallet 110, second
Pallet 111 and third pallet 114 are extracted out, and replace the module to be tested being disposed thereon or plug socket.
Preferably, the heat shields 116 can turn to the module to be tested covered on the positioning plate 107 completely,
Specifically, the heat shields 116, which are can turn to, covers second pallet 111, is arranged on second pallet 111
The first pallet 110 and the module to be tested that is arranged on first pallet 110, the hot-air of external heat pump output
It is passed through in the heat shields 116 by pipeline, and temperature sensor is cooperated to control the temperature in heat shields 116
In suitable range, this process is the prior art, its specific implementation that details are not described herein again.
Preferably, the bottom surrounding of the test box 101 further respectively has idler wheel 105.It can by the way that the idler wheel 105 is arranged
To facilitate the movement of entire test cabinet.
In the embodiments of the present invention, the lower surface of the fixed plate 102 is equipped with even number second and drives cylinder
115, the second driving cylinder 115 is symmetricly set in the fixed plate 102, and the output of the second driving cylinder 115
Elongation with the plugboard 108 to abutting after end is upward through the fixed plate 102, to drive the plugboard 108 along institute
State the up and down motion of guide rod 106, and when the plugboard 108 is moved upwards from lowermost end, second pinboard with it is described
Thimble substrate 104 is disconnected as plugboard 108 is separated with the fixed plate 102.
The plugboard 108 can be driven along about 106 guide rod by the way that the second driving cylinder 115 is arranged
Movement, and when the plugboard 108 is moved upwards from lowermost end, second pinboard and the thimble substrate 104 with
Plugboard 108 is separated with the fixed plate 102 and is disconnected, convenient for replacing corresponding plug socket and second after aging
Built-up circuit.
It should be noted that when the plugboard 108 moves downwardly to lowermost end, being needed in the embodiments of the present invention
Will by it is described first driving cylinder 115 drive the power of the plugboard 108 downwards so that on the plugboard 108 second
Pinboard is contacted with the thimble substrate 104, until the thimble on the thimble substrate 104 is fully inserted into second pinboard
Pad, i.e., described second pinboard is electrically connected with the thimble substrate 104.
It should be noted that the signal that the first pinboard exports thimble substrate 104 is defeated in the embodiments of the present invention
Out to external host, the second pinboard goes out the signal that plugboard 108 exports to be defeated by thimble substrate 104, first pinboard
It is the prior art with the second pinboard, for different modules to be tested, the switching for selecting module interface to be tested to match
Plate does not do any restriction here.
Preferably, the upper surface edge of the fixed plate 102 is equipped at least a pair of of grating sensor 118, the grating
Sensor 118 is electrically connected with external host.Light curtain is formed by the grating sensor 118, when having object (hand or other obstacles
Object) when blocking light curtain, output signal is fed back to external host by the grating sensor 118, and external host passes through described in control
First driving cylinder 115 and second drives the lifting of cylinder 115 to realize pinch resistant functionality.The fixed plate is illustrated only in Fig. 1
The case where two edges of 102 wherein a sides are respectively equipped with grating sensor 118.
The above is only the preferred embodiment of the present invention, is not intended to limit the utility model, all practical at this
Within novel spirit and principle, any modification, equivalent replacement, improvement and so on should be included in the guarantor of the utility model
Within the scope of shield.
Claims (10)
1. a kind of test cabinet, it is characterised in that: test box (101), fixed plate (102), connecting plate including upper end opening plus
Thermal shield (116) and top plate (103), fixed plate (102) lid are located at the test box (101) upper end, the fixed plate
(102) upper surface is equipped with thimble substrate (104), and the lower surface of the fixed plate (102) is equipped with the first pinboard, the fixation
It is equipped with guide rod (106), is set in respectively at the surrounding corner of the connecting plate corresponding respectively at the surrounding corner of plate (102)
The middle part of the guide rod (106), and along the guide rod (106) move up and down, the connecting plate be equipped with it is multiple to
The side of test module, the heat shields (116) and the connecting plate is rotatablely connected, and the heat shields (116)
It can turn to and covers module to be tested, the top plate (103) is set to the connecting plate by the guide rod (106) support
Top, and be fixedly connected respectively with the top of the corresponding guide rod (106) at the surrounding corner of the top plate (103), it is more
A modular spacing to be tested is arranged on the connecting plate；
The thimble substrate (104) is electrically connected with first pinboard, the first pinboard external host electrical connection, and works as
When the connecting plate moves downwardly to lowermost end, all modules to be tested are electrically connected with the thimble substrate (104).
2. test cabinet according to claim 1, it is characterised in that: the connecting plate includes positioning plate (107) and plugboard
(108), the positioning plate (107) is located at the top of the plugboard (108), and is set in respectively at the surrounding corner of the two pair
The middle part for the guide rod (106) answered, and can move up and down along the guide rod (106), on the positioning plate (107)
Equipped with multiple bayonets to match with module to be tested, module one-to-one correspondence to be tested is connected in the bayonet, the positioning
The first opening being passed down through for module to be tested, the plugboard are equipped on plate (107) with the bayonet corresponding position
(108) upper surface is equipped with multiple plug sockets for matching with module to be tested, and the lower surface of the plugboard (108) is equipped with the
Two pinboards, all plug sockets are electrically connected with second pinboard, when the positioning plate (107) moves downward and drives
When moving the plugboard (108) and moving to lowermost end, the attachment base of module to be tested is electrically connected with the corresponding plug socket just
It connects, second pinboard is electrically connected with the thimble substrate (104) just, the heat shields (116) and the positioning
The side of plate (107) is rotatablely connected, and can cover module to be tested.
3. test cabinet according to claim 2, it is characterised in that: the positioning plate (107) is equipped with multiple first pallets
(110) and clamping that is identical as the first pallet (110) quantity and being arranged in a one-to-one correspondence on first pallet (110)
Plate, first pallet (110) are slidably arranged on the positioning plate (107), and can be with the corresponding card adapter plate (109) one
It is extracted out with from the side of the positioning plate (107), each first pallet (110) is equipped with multiple bayonets, and the clamping
The second opening that corresponding bayonet is downwardly into for the module to be tested is equipped on plate (109) with the bayonet corresponding position,
When first pallet (110) is pushed completely into from the side of the positioning plate (107), the positioning plate (107) passes through just
Module to be tested is fixed in the corresponding bayonet by the attachment base in module to be tested.
4. test cabinet according to claim 3, it is characterised in that: be additionally provided on the positioning plate (107) at least one
Two pallets (111), second pallet (111) are arranged between first pallet (110) and the positioning plate (107), and
Each second pallet (111) is equipped at least one described first pallet (110), and second pallet (111) first is sliding
It is dynamic to be arranged on the positioning plate (107), and can be with first pallet (110) that is disposed thereon together from the positioning plate
(107) side or other side extraction, second pallet (111) is open equipped with third corresponding with second opening.
5. test cabinet according to claim 4, it is characterised in that: the upper surface of the positioning plate (107) is equipped with even number
First driving cylinder (112), first driving cylinder (112) are symmetricly set on the positioning plate (107), and described first
Driving cylinder (112) output end be passed down through the positioning plate (107) extend afterwards extremely abutted with the plugboard (108), with
The positioning plate (107) is driven to move up and down along the guide rod (106), and when the first driving cylinder (112) driving
When the positioning plate (107) moves downwardly to lowermost end, module to be tested sequentially passes through the second opening, bayonet, third opening
It is electrically connected with after the first opening with the corresponding plug socket, second built-up circuit is electrically connected with the thimble substrate (104)
It connects.
6. test cabinet according to claim 4, it is characterised in that: the plugboard (108) is equipped with multiple pinboards
(113) and at least one third pallet (114), each pinboard (113) are equipped at least one described plug socket, each
The third pallet (114) is equipped at least one described pinboard (113), and the third pallet (114) is slidably arranged in institute
It states on plugboard (108), and can be with the pinboard (113) that is disposed thereon together from the side of the plugboard (108)
Or other side extraction.
7. test cabinet according to claim 6, it is characterised in that: the third pallet (114) is equipped with and the grafting
Seat corresponds and detects the switch (117) for whether being plugged with module to be tested on the corresponding plug socket.
8. test cabinet according to claim 6, it is characterised in that: first pallet (110), the second pallet (111) and
The side and/or the other side of third pallet (114) are equipped with knob (119).
9. test cabinet according to claim 2, it is characterised in that: the lower surface of the fixed plate (102) is equipped with even number
Second driving cylinder (115), second driving cylinder (115) are symmetricly set on the fixed plate (102), and described second
Driving cylinder (115) output end be upward through the fixed plate (102) extend afterwards extremely abutted with the plugboard (108), with
Drive the plugboard (108) along the guide rod (106) move up and down, and when the plugboard (108) from lowermost end to
When upper movement, second pinboard and the thimble substrate (104) are with plugboard (108) and the fixed plate (102) point
From and disconnect.
10. any one of -9 test cabinet according to claim 1, it is characterised in that: the upper surface side of the fixed plate (102)
At least a pair of of grating sensor (118) is equipped at angle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821202269.8U CN208654263U (en) | 2018-07-27 | 2018-07-27 | A kind of test cabinet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821202269.8U CN208654263U (en) | 2018-07-27 | 2018-07-27 | A kind of test cabinet |
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| Publication Number | Publication Date |
|---|---|
| CN208654263U true CN208654263U (en) | 2019-03-26 |
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ID=65787298
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821202269.8U Active CN208654263U (en) | 2018-07-27 | 2018-07-27 | A kind of test cabinet |
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| Country | Link |
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| CN (1) | CN208654263U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108761256A (en) * | 2018-07-27 | 2018-11-06 | 南斗六星系统集成有限公司 | A kind of test cabinet |
| CN110297282A (en) * | 2019-08-06 | 2019-10-01 | 深圳面元智能科技有限公司 | Seismic exploration equipment tester |
-
2018
- 2018-07-27 CN CN201821202269.8U patent/CN208654263U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108761256A (en) * | 2018-07-27 | 2018-11-06 | 南斗六星系统集成有限公司 | A kind of test cabinet |
| CN110297282A (en) * | 2019-08-06 | 2019-10-01 | 深圳面元智能科技有限公司 | Seismic exploration equipment tester |
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