CN208571600U - A kind of high voltage testing device current sampling protection circuit - Google Patents
A kind of high voltage testing device current sampling protection circuit Download PDFInfo
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- CN208571600U CN208571600U CN201821322398.0U CN201821322398U CN208571600U CN 208571600 U CN208571600 U CN 208571600U CN 201821322398 U CN201821322398 U CN 201821322398U CN 208571600 U CN208571600 U CN 208571600U
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Abstract
The utility model relates to a kind of high voltage testing device current samplings to protect circuit; introduce completely new circuit structure design; constitute the input terminal protecting circuit and anti-surge circuit of transport and placing device N1B; can not only prevent wherein transport and placing device N1B be damaged; and it is breakdown or have arcing to can be avoided sample; surge current phenomenon is avoided the occurrence of, in practical application, can effectively ensure that the circuit in electric current input circuit is not damaged.
Description
Technical field
The utility model relates to a kind of high voltage testing device current samplings to protect circuit, belong to Hi-pot test protection technique neck
Domain.
Background technique
Hi-pot test refers to that various high and low voltage electrical equipment devices, the voltage endurance capability of insulating materials and insulation system is surveyed
Examination.The basic theory of Hi-pot test is that a product is exposed under the environment of very severe, as fruit product can be this
Normal condition can also be maintained under rugged environment, so that it may which determination works under normal environment, also can centainly maintain
Normal situation.Different products has different technical specifications, is substantially that a high voltage is added in production in Hi-pot test
Tested on product, this voltage have to last for one section as defined in the time.If a spare part is before the deadline, leakage electricity
Stream is also kept within the limits prescribed, so that it may it is very safe to determine that this spare part operates under normal circumstances.
The high voltage testing device of the prior art, it is breakdown or have arcing to will appear sample during practice, can go out
Existing surge current phenomenon, damages the circuit of electric current input circuit.
Utility model content
The technical problem to be solved by the utility model is to provide a kind of designs of introducing brand new, can effectively improve electricity
The high voltage testing device current sampling of road protecting effect protects circuit.
In order to solve the above-mentioned technical problem the utility model uses following technical scheme: the utility model devises a kind of high
Pressure tester current sampling protects circuit, including transport and placing device N1B, 3rd resistor R3, the 4th resistance R4 and the 5th resistance R5,
In, the voltage output end of current sampling protection circuit dock respectively the output end of transport and placing device N1B, the 5th resistance R5 wherein one
End;The negative input three of the other end of 5th resistance R5, wherein one end of the 4th resistance R4 and transport and placing device N1B is opposite
It connects;The other end of 4th resistance R4 is grounded;Wherein one end of the electrode input end docking 3rd resistor R3 of transport and placing device N1B;
It is characterized by also including first resistor R1, current-limiting resistance R01, first capacitor C1, second capacitor C2, TVS transient states
Inhibit diode D01, discharge tube D02, inductance coil L1;
Wherein, wherein one end three of the other end of 3rd resistor R3, wherein one end of first resistor R1, current-limiting resistance R01
Person is connected to each other;The other end of current-limiting resistance R01, wherein one end of TVS Transient Suppression Diode D01, first capacitor C1 are wherein
One end, inductance coil L1 wherein one end be connected to each other;The other end of inductance coil L1, the second capacitor C2 wherein one end,
Wherein one end of discharge tube D02, the sampling end of current sampling protection circuit are connected to each other;The other end, the TVS of first resistor R1
The other end of Transient Suppression Diode D01, the other end of first capacitor C1, the other end of the second capacitor C2, discharge tube D02 it is another
One end is connected to each other, and is grounded.
A kind of optimal technical scheme as the utility model: further including second resistance R2, third capacitor C3, the first pressure stabilizing
Diode D1, the second zener diode D2;
Wherein, the other end of 3rd resistor R3, the cathode of the first zener diode D1, third capacitor C3 wherein one end,
Wherein one end of second resistance R2 is connected to each other;The second zener diode D2 of anode docking of first zener diode D1 is just
Pole, the cathode ground connection of the second zener diode D2;The other end of second resistance R2, wherein one end of first resistor R1, current limliting electricity
Wherein one end three of resistance R01 is connected to each other;The other end of third capacitor C3, the other end of first resistor R1, TVS transient state inhibit two
The other end phase of the other end of pole pipe D01, the other end of first capacitor C1, the other end of the second capacitor C2, discharge tube D02
Docking, and be grounded.
A kind of high voltage testing device current sampling protection circuit described in the utility model is using above technical scheme and existing skill
Art is compared, and is had following technical effect that high voltage testing device current sampling designed by the utility model protects circuit, can not only be prevented
Wherein transport and placing device N1B is damaged, and it is breakdown or have arcing to can be avoided sample, avoids the occurrence of surge current phenomenon,
In practical application, it can effectively ensure that the circuit in electric current input circuit is not damaged.
Detailed description of the invention
Fig. 1 is the schematic diagram of the utility model design high voltage testing device current sampling protection circuit.
Specific embodiment
Specific embodiment of the present utility model is described in further detail with reference to the accompanying drawings of the specification.
As shown in Figure 1, the utility model devises a kind of high voltage testing device current sampling protection circuit, including transport and placing device
N1B, 3rd resistor R3, the 4th resistance R4 and the 5th resistance R5, wherein current sampling protects the voltage output end of circuit right respectively
Connect the output end of transport and placing device N1B, wherein one end of the 5th resistance R5;The other end of 5th resistance R5, the 4th resistance R4 are wherein
The negative input three of one end and transport and placing device N1B are connected to each other;The other end of 4th resistance R4 is grounded;Transport and placing device N1B is just
Wherein one end of pole input terminal docking 3rd resistor R3.
It further include first resistor R1, second resistance R2, current-limiting resistance R01, first capacitor C1, the second capacitor C2, third electricity
Hold C3, the first zener diode D1, second zener diode D2, TVS Transient Suppression Diode D01, discharge tube D02, inductor wire
Enclose L1;Wherein, the other end of 3rd resistor R3, the cathode of the first zener diode D1, wherein one end of third capacitor C3, second
Wherein one end of resistance R2 is connected to each other;The anode of the second zener diode D2 of anode docking of first zener diode D1,
The cathode of second zener diode D2 is grounded;The other end of second resistance R2, wherein one end of first resistor R1, current-limiting resistance
Wherein one end three of R01 is connected to each other;The other end of current-limiting resistance R01, wherein one end of TVS Transient Suppression Diode D01,
Wherein one end of one capacitor C1, wherein one end of inductance coil L1 are connected to each other;The other end of inductance coil L1, the second capacitor
Wherein one end of C2, wherein one end of discharge tube D02, current sampling protect the sampling end of circuit to be connected to each other;Third capacitor
The other end of C3, the other end of first resistor R1, the other end of TVS Transient Suppression Diode D01, first capacitor C1 it is another
End, the other end of the second capacitor C2, discharge tube D02 the other end be connected to each other, and be grounded.
Above-mentioned designed high voltage testing device current sampling is protected into circuit, is applied in reality, second resistance R2, third
The input terminal protecting circuit of capacitor C3, the first zener diode D1, the second zener diode D2 diode composition transport and placing device N1B,
To prevent amplifier from damaging;Meanwhile it TVS Transient Suppression Diode D01, inductance coil L1, first capacitor C1, the second capacitor C2, putting
Fulgurite D02 forms anti-surge circuit, and it is breakdown or have arcing to can be avoided sample, avoids the occurrence of surge current phenomenon,
In practical application, it can effectively ensure that the circuit in electric current input circuit is not damaged.The moment when load is broken down by high-voltage
It releases high current and forms surge current, a part is absorbed by first capacitor C1, the second capacitor C2, due to inductance coil L1's
Effect, as shown in Figure 1, Ua current potential rises simultaneously, when being greater than discharge tube D02 threshold value, discharge tube D02 discharges over the ground, at this time
TVS Transient Suppression Diode D01 plays position-limiting action, and Ub current potential will be clamped down in control range, so, after increasing this circuit, have
Effect protects leakage current input circuit.
The embodiments of the present invention is explained in detail above in conjunction with attached drawing, but the utility model is not limited to
Above embodiment can also not depart from the utility model within the knowledge of a person skilled in the art
It is made a variety of changes under the premise of objective.
Claims (2)
1. a kind of high voltage testing device current sampling protects circuit, including transport and placing device N1B, 3rd resistor R3, the 4th resistance R4 and the
Five resistance R5, wherein the voltage output end of current sampling protection circuit docks the output end of transport and placing device N1B, the 5th resistance respectively
Wherein one end of R5;The cathode of the other end of 5th resistance R5, wherein one end of the 4th resistance R4 and transport and placing device N1B inputs
End three is connected to each other;The other end of 4th resistance R4 is grounded;The electrode input end docking 3rd resistor R3 of transport and placing device N1B is wherein
One end;
It is characterized by also including first resistor R1, current-limiting resistance R01, first capacitor C1, second capacitor C2, TVS transient states to inhibit
Diode D01, discharge tube D02, inductance coil L1;
Wherein, wherein one end three's phase of the other end of 3rd resistor R3, wherein one end of first resistor R1, current-limiting resistance R01
Docking;The other end of current-limiting resistance R01, wherein one end of TVS Transient Suppression Diode D01, first capacitor C1 wherein one end,
Wherein one end of inductance coil L1 is connected to each other;The other end of inductance coil L1, wherein one end of the second capacitor C2, discharge tube
Wherein one end of D02, the sampling end of current sampling protection circuit are connected to each other;The other end of first resistor R1, the suppression of TVS transient state
The other end of diode D01 processed, the other end of first capacitor C1, the other end of the second capacitor C2, discharge tube D02 the other end six
Person is connected to each other, and is grounded.
2. a kind of high voltage testing device current sampling protects circuit according to claim 1, it is characterised in that: further include the second electricity
Hinder R2, third capacitor C3, the first zener diode D1, the second zener diode D2;
Wherein, the other end of 3rd resistor R3, the cathode of the first zener diode D1, wherein one end of third capacitor C3, second
Wherein one end of resistance R2 is connected to each other;The anode of the second zener diode D2 of anode docking of first zener diode D1,
The cathode of second zener diode D2 is grounded;The other end of second resistance R2, wherein one end of first resistor R1, current-limiting resistance
Wherein one end three of R01 is connected to each other;The other end of third capacitor C3, the other end of first resistor R1, TVS transient state inhibit two poles
The other end, the other end of first capacitor C1, the other end of the second capacitor C2, the other end of discharge tube D02 of pipe D01 is opposite
It connects, and is grounded.
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CN201821322398.0U CN208571600U (en) | 2018-08-16 | 2018-08-16 | A kind of high voltage testing device current sampling protection circuit |
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CN201821322398.0U CN208571600U (en) | 2018-08-16 | 2018-08-16 | A kind of high voltage testing device current sampling protection circuit |
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CN208571600U true CN208571600U (en) | 2019-03-01 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111474399A (en) * | 2020-05-19 | 2020-07-31 | 深圳淇诺科技有限公司 | High-voltage side large-current precise sampling conversion circuit |
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2018
- 2018-08-16 CN CN201821322398.0U patent/CN208571600U/en active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111474399A (en) * | 2020-05-19 | 2020-07-31 | 深圳淇诺科技有限公司 | High-voltage side large-current precise sampling conversion circuit |
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