CN208478302U - Cell slice test device - Google Patents

Cell slice test device Download PDF

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Publication number
CN208478302U
CN208478302U CN201821173403.6U CN201821173403U CN208478302U CN 208478302 U CN208478302 U CN 208478302U CN 201821173403 U CN201821173403 U CN 201821173403U CN 208478302 U CN208478302 U CN 208478302U
Authority
CN
China
Prior art keywords
electro
conductive glass
test device
cell slice
slice test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201821173403.6U
Other languages
Chinese (zh)
Inventor
杨冰
刘恩华
费正洪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Funing Atlas Sunshine Power Technology Co ltd
Canadian Solar Inc
Original Assignee
CSI GCL Solar Manufacturing Yancheng Co Ltd
Atlas Sunshine Power Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSI GCL Solar Manufacturing Yancheng Co Ltd, Atlas Sunshine Power Group Co Ltd filed Critical CSI GCL Solar Manufacturing Yancheng Co Ltd
Priority to CN201821173403.6U priority Critical patent/CN208478302U/en
Application granted granted Critical
Publication of CN208478302U publication Critical patent/CN208478302U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model provides a kind of cell slice test device, including testboard, probe unit and the vacuum suction pipe connecting with testboard.Testboard includes the support portion of inner hollow and is used to place the electro-conductive glass of sample to be tested on support portion.Electro-conductive glass is equipped with several vacuum absorption holes.For the cell slice test device by replacing gold-plated table top with electro-conductive glass, the electric conductivity of electro-conductive glass is constant, and testboard reduces the reflectivity of light;When carrying out double-side cell front or back side spectral response measurement, electro-conductive glass can be directed through by the light that cell piece absorbs, utilization will not be again reflected and influence practical photoresponse value, improve test accuracy;And electro-conductive glass is lower than the cost of gold-plated table top, reduces production cost.

Description

Cell slice test device
Technical field
The utility model relates to photovoltaic art more particularly to a kind of cell slice test devices.
Background technique
Spectral responsivity characterizes the ability power that cell piece converts optical signals into electric signal, is the important ginseng of cell piece One of number index.Refering to Figure 1,100 ' of cell slice test device used at present, including 10 ' of metal support base, it is used for 40 ' of vacuum suction pipe for placing 20 ' of gold-plated table top, 30 ' of probe unit of sample to be tested and being connect with 10 ' of metal support base.
It is reflective tight since gold-plated 20 ' reflectivity of table top is high when double-side cell carries out front or back side spectral response measurement Weight, not by cell piece absorb light can be reflected back cell piece back or front again, be re-used, will cause test value compared with Practical higher, there are errors.
In view of this, it is necessary to a kind of improved cell slice test device is designed, to solve the above problems.
Utility model content
The purpose of this utility model is to provide a kind of cell slice test devices for reducing cost, improving test accuracy.
To realize above-mentioned purpose of utility model, the utility model provides a kind of cell slice test device, including testboard, Probe unit and the vacuum suction pipe being connect with the testboard;The testboard includes the support portion of inner hollow and is set to For placing the electro-conductive glass of sample to be tested on the support portion;The electro-conductive glass is equipped with several vacuum absorption holes.
The electro-conductive glass is in terrace with edge structure setting as a further improvement of the utility model,;It is set on the support portion There is accommodating chamber corresponding with the shape of the electro-conductive glass, so that the electro-conductive glass is embedded in the accommodating chamber.
The upper surface of the support portion is equipped with for limiting the sample to be tested as a further improvement of the utility model, The positioning strip of position.
The probe unit includes height-adjustable probe support and setting as a further improvement of the utility model, Probe on the probe support.
The electro-conductive glass is by magnetically controlled sputter method in transparent glass base as a further improvement of the utility model, The transparent electro-conductive glass that body surface wheat flour obtains for indium tin oxide films.
The terrace with edge structure is square terrace with edge as a further improvement of the utility model, under the side length of upper surface is greater than The side length on surface.
Several vacuum absorption holes are uniformly distributed in the electro-conductive glass as a further improvement of the utility model, On.
Several vacuum absorption holes arrangement annular in shape as a further improvement of the utility model,.
The material of the support portion is black plastic as a further improvement of the utility model,.
The beneficial effects of the utility model are: the cell slice test device of the utility model is by replacing plating with electro-conductive glass The electric conductivity in gold stand face, electro-conductive glass is constant, and testboard reduces the reflectivity of light;Carry out double-side cell front or back side spectrum When response test, electro-conductive glass can be directed through by the light that cell piece absorbs, utilization will not be again reflected and influenced practical Photoresponse value, improves test accuracy;And electro-conductive glass is lower than the cost of gold-plated table top, reduces production cost.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of existing cell slice test device.
Fig. 2 is the structural schematic diagram of the utility model cell slice test device.
Fig. 3 is the structural schematic diagram of testboard in Fig. 2.
Fig. 4 is the cross-sectional view of electro-conductive glass in Fig. 3.
Fig. 5 is the structural schematic diagram of support portion in Fig. 3.
Specific embodiment
In order to keep the purpose of this utility model, technical solution and advantage clearer, with reference to the accompanying drawing and it is embodied The utility model is described in detail in example.
It please refers to shown in Fig. 2 to Fig. 5, a kind of cell slice test device 100, for the spectral response measurement of cell piece, packet Include testboard 1, probe unit 2 and the vacuum suction pipe 3 connecting with testboard 1;Vacuum suction pipe 3 is for aspirating testboard 1 Interior air is the sample to be tested being placed on testboard 1 stabilization to be adsorbed on testboard 1.
Testboard 1 includes the support portion 11 of inner hollow and is used to place the conductive glass of sample to be tested on support portion 11 Glass 12.Electro-conductive glass 12 is to prepare the ITO that indium tin oxide films obtain in transparent glass matrix surface by magnetically controlled sputter method Transparent conducting glass has good conductive property, reflectivity is low, translucency is good.In this way, carrying out cell piece spectral response When test, not by cell piece absorb light can transmitted through electro-conductive glass 12, will not be reflected by electro-conductive glass 12 and be gradually resorbed and Test value is influenced, test accuracy is improved;Compared to traditional 20 ' of gold-plated table top, production cost is reduced.
Electro-conductive glass 12 is equipped with several vacuum absorption holes 121, and vacuum absorption holes 121 are used for vacuum suction sample to be tested. In the present embodiment, vacuum absorption holes 121 are annular in shape is uniformly distributed on electro-conductive glass 12.It should be noted that vacuum Arrangement mode, shape, size and the quantity of adsorption hole 121 can need to be configured according to actual product design, This is not limited.
In the present embodiment, electro-conductive glass 12 is in square terrace with edge structure setting, and the side length of upper surface is greater than lower surface Side length, that is, electro-conductive glass 12 is wide at the top and narrow at the bottom;Support portion 11 is arranged in a rectangular parallelepiped shape, and upper surface is equipped with being used for for upward projection Limit the receiving of the positioning strip 111 and the prism-frustum-shaped corresponding with the shape of electro-conductive glass 12 being recessed inwardly of sample to be tested position Chamber 112;Electro-conductive glass 12 is embedded in accommodating chamber 112 and is contained in accommodating chamber 112 with stabilization.Particularly, the height of accommodating chamber 112 is big In the thickness of electro-conductive glass 12;In this way, being formed in support portion 11 close when electro-conductive glass 12 is stablized and is contained in accommodating chamber 112 Closed chamber room (not labeled), vacuum suction pipe 3 aspirate the indoor air of closed chamber, so that sample to be tested passes through vacuum absorption holes 121 It is adsorbed on electro-conductive glass 12.Preferably, 11 material of support portion is black plastic, and in test process, 11 inside of support portion is quite In a darkroom, the back side approximation of sample to be tested is unglazed, further reduced test error.It should be noted that electro-conductive glass 12 can be arrangeds with the size of support portion 11 according to the size of sample to be tested, the not limitation herein of the size of the two.
Probe unit 2 includes can the probe support 21 that direction is adjusted up and down and the probe being set on probe support 21 22.In test process, probe support 21 drives probe 22 mobile so that probe 22 compresses sample to be tested and is electrically connected to test sample Product and external equipment.
In conclusion the cell slice test device 100 of the utility model is by replacing gold-plated table top with electro-conductive glass 12 The electric conductivity of 20 ', electro-conductive glass 12 are constant, and the reflectivity of 1 pair of light of testboard reduces;Carry out double-side cell front or back side spectrum When response test, electro-conductive glass 12 can be directed through by the light that cell piece absorbs, utilization will not be again reflected and influenced real Border photoresponse value, improves test accuracy;And electro-conductive glass 12 is lower than the cost of gold-plated 20 ' of table top, reduces production cost.
Above embodiments are merely intended for describing the technical solutions of the present application, but not for limiting the present application, although referring to preferred embodiment pair The utility model is described in detail, those skilled in the art should understand that, it can be to the technology of the utility model Scheme is modified or replaced equivalently, without departing from the spirit and scope of the technical scheme of the present invention.

Claims (9)

1. a kind of cell slice test device, including testboard, probe unit and the vacuum suction pipe being connect with the testboard; It is characterized by: the testboard includes the support portion of inner hollow and is used to place sample to be tested on the support portion Electro-conductive glass;The electro-conductive glass is equipped with several vacuum absorption holes.
2. cell slice test device according to claim 1, it is characterised in that: the electro-conductive glass is set in terrace with edge structure It sets;The support portion is equipped with accommodating chamber corresponding with the shape of the electro-conductive glass, so that the electro-conductive glass is embedded in institute State accommodating chamber.
3. cell slice test device according to claim 1, it is characterised in that: the upper surface of the support portion is equipped with and is used for Limit the positioning strip of the sample to be tested position.
4. cell slice test device according to claim 1, it is characterised in that: the probe unit includes adjustable height Probe support and the probe that is set on the probe support.
5. cell slice test device according to claim 1, it is characterised in that: the electro-conductive glass is to pass through magnetron sputtering Method prepares the transparent electro-conductive glass that indium tin oxide films obtain in transparent glass matrix surface.
6. cell slice test device according to claim 2, it is characterised in that: the terrace with edge structure is square terrace with edge, thereon The side length on surface is greater than the side length of lower surface.
7. cell slice test device according to claim 1, it is characterised in that: several vacuum absorption holes are uniformly distributed In on the electro-conductive glass.
8. cell slice test device according to claim 7, it is characterised in that: several vacuum absorption holes are annular in shape Arrangement.
9. cell slice test device according to claim 1, it is characterised in that: the material of the support portion is black modeling Material.
CN201821173403.6U 2018-07-23 2018-07-23 Cell slice test device Expired - Fee Related CN208478302U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821173403.6U CN208478302U (en) 2018-07-23 2018-07-23 Cell slice test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821173403.6U CN208478302U (en) 2018-07-23 2018-07-23 Cell slice test device

Publications (1)

Publication Number Publication Date
CN208478302U true CN208478302U (en) 2019-02-05

Family

ID=65207902

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821173403.6U Expired - Fee Related CN208478302U (en) 2018-07-23 2018-07-23 Cell slice test device

Country Status (1)

Country Link
CN (1) CN208478302U (en)

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Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: No.88, Xiexin Avenue, Funing Economic Development Zone, Yancheng City, Jiangsu Province

Patentee after: Funing atlas sunshine Power Technology Co.,Ltd.

Patentee after: Atlas sunshine Power Group Co.,Ltd.

Address before: No.88, Xiexin Avenue, Funing Economic Development Zone, Yancheng City, Jiangsu Province

Patentee before: CSI-GCL SOLAR MANUFACTURING (YANCHENG) Co.,Ltd.

Patentee before: CSI SOLAR POWER GROUP Co.,Ltd.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190205

Termination date: 20210723