CN208334560U - A kind of APD component dynamic checkout unit - Google Patents
A kind of APD component dynamic checkout unit Download PDFInfo
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- CN208334560U CN208334560U CN201820954618.5U CN201820954618U CN208334560U CN 208334560 U CN208334560 U CN 208334560U CN 201820954618 U CN201820954618 U CN 201820954618U CN 208334560 U CN208334560 U CN 208334560U
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Abstract
The utility model discloses a kind of APD component dynamic checkout units, can test the parameter of a variety of APD components as far as possible, meet the production test demand of APD component.The APD component dynamic checkout unit includes: tunable light source module, for providing test optical signal for avalanche photodide APD；Variable bias module is connect with the input terminal of the APD, is used for the APD output voltage signal；Adjustment module is exported, is connect with the output end of the APD, for adjusting the range value of the output signal of the APD and adjusting the gain of the APD；Test module is connect with the APD, in the case where the parameter of the test optical signal for being inputted in the APD, test export the APD the first operating voltage and the APD first operating voltage minimum detectable power.
Description
Technical field
The utility model relates to circuit testing technology fields, and in particular to a kind of APD component dynamic checkout unit.
Background technique
Avalanche photodide (Avalanche Photo Diode, APD) component is because can be realized pulsed laser characteristics
It measures and is widely used in the high-speed optoelectronic systems such as high speed optical fiber communication, weak light detection, laser ranging.
Primary Component of the APD component as high-speed optoelectronic systems, the index parameter of APD component, such as operating voltage, detection
The accuracy of power etc. affects the work of high-speed optoelectronic systems.And different APD enter avalanche process needed for voltage range
It is wider, and the index parameter of APD is with environment, for example, temperature variation and change, even if APD work under constant voltage, with
The variation of temperature, the index parameter of APD, such as gain be also varied.Currently, the test for APD component relies primarily on
Overseas equipment, test parameter rely only on equipment fixed setting, and there are the incomplete problems of test parameter, it is difficult to meet
APD component production test demand.
Utility model content
The utility model provides a kind of APD component dynamic checkout unit, can test the ginseng of a variety of APD components as far as possible
Number, meets the production test demand of APD component.
In order to solve the above technical problems, the utility model provides a kind of APD component dynamic checkout unit, the test device packet
It includes:
Tunable light source module, for providing test optical signal for avalanche photodide APD；
Variable bias module is connect with the input terminal of the APD, is used for the APD output voltage signal；
Adjustment module is exported, is connect with the output end of the APD, the range value of the output signal for adjusting the APD
And adjust the gain of the APD；
The case where test module is connect with the APD, the parameter of the test optical signal for inputting in the APD
Under, the first operating voltage for exporting the APD and the APD are tested in the minimum detectable function of first operating voltage
Rate.
Optionally, the tunable light source module includes:
Background radiant, for providing bias light for the APD；
Laser light source, for providing the test optical signal for the APD, wherein the laser light source is also used to adjust
Wavelength, frequency and the pulsewidth of the laser of the test light signal designation.
Optionally, the tunable light source module further include:
Illuminometer, for being connect with the background radiant, for demarcating the bias light of the background radiant offer
Illumination range.
Optionally, the tunable light source module further include:
Optical attenuator is connect with the laser light source, for adjusting the test optical signal of the laser light source output
Optical power；
Illuminator, the optical signal for exporting to the optical attenuator are homogenized and are exposed to the optical signal after homogenizing
The photosensitive area of the APD；
Light power meter is connect with the APD, for testing the optical power for exposing to the photosensitive area of the APD.
Optionally, the hot spot that the illuminator forms the photosensitive area that the optical signal after described homogenize exposes to the APD
Area is greater than or equal to 15m2。
Optionally, the hot spot that the illuminator forms the photosensitive area that the optical signal after described homogenize exposes to the APD
Uniformity be greater than or equal to 90%.
Optionally, the variable bias module includes:
High voltage power supply, wherein the output voltage of the high voltage power supply is located within the scope of 0-600V, and output circuit is less than or waits
In 10mA；
Low-tension supply, wherein the output voltage of the low-tension supply is located within the scope of 0-30V, exports the maximum value of electric current
For 500mA.
Optionally, the output adjustment module is amplifying circuit, wherein the amplifying circuit adjusts the output of the APD
The stepping of the gain of signal is 0.1dB, and the output noise voltage of the amplifying circuit is less than or equal to 100mV.
In the utility model embodiment, the test optical signal for inputting APD to be tested is adjustable, that is, tests the strong of optical signal
Degree or size are adjustable, and make the test voltage for inputting APD also adjustable by variable bias module, are adjusted by output
Module makes the range value of the output signal of APD and gain also adjustable.In test, the output of adjustable tunable light source module
Or the output of variable bias module, that is, the input parameter of APD is adjusted, to test in the case where different input parameters, the of APD
One operating voltage, it can be understood as the minimum detectable power of optimum operating voltage and APD in the first operating voltage.Also
Be tested in the utility model embodiment APD test parameter be it is adjustable, be not fixed setting, can test as far as possible more
The parameter of kind APD component, meets the production test demand of APD component.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of APD component dynamic checkout unit provided by the embodiment of the utility model.
Specific embodiment
For the purpose of this utility model, technical solution and advantage is more clearly understood, below in conjunction with the utility model
The technical solution in the utility model embodiment is clearly and completely described in attached drawing in embodiment, it is clear that institute
The embodiment of description is only a part of embodiment of the utility model, rather than whole embodiments.It is practical based on this
Embodiment in novel, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment is fallen within the protection scope of the utility model.In the absence of conflict, the embodiment in the utility model and
Feature in embodiment can mutual any combination.
Currently, the test for APD component relies primarily on overseas equipment, test parameter relies only on equipment fixed setting
, there are the incomplete problems of test parameter, it is difficult to meet APD component production test demand.
In consideration of it, the utility model embodiment provides a kind of APD component dynamic checkout unit, the utility model embodiment
In, the test optical signal for inputting APD to be tested is adjustable, that is, the intensity or size of test optical signal are adjustable and logical
Crossing variable bias module makes the test voltage for inputting APD also adjustable, makes the output signal of APD by output adjustment module
Range value and gain are also adjustable.In test, the output of adjustable tunable light source module or the output of variable bias module, i.e.,
The input parameter of APD is adjusted, to test the first operating voltage of APD, it can be understood as most in the case where different input parameters
The minimum detectable power of good operating voltage and APD in the first operating voltage.Namely in the utility model embodiment, survey
Examination APD test parameter be it is adjustable, be not fixed setting, the parameter of a variety of APD components can be tested as far as possible, meet APD
The production test demand of component.
Technical solution provided by the embodiment of the utility model is introduced with reference to the accompanying drawings of the specification.
Referring to Figure 1, the utility model embodiment provides a kind of APD component dynamic checkout unit, which can
To include tunable light source module 10, variable bias module 20, output adjustment module 30 and test module 40.Wherein, tunable optical
Source module 10 can be used for providing test optical signal for APD.Variable bias module 20 is connect with the input terminal of APD, can be used for
To APD output voltage signal.Output adjustment module 30 is connect with the output end of APD, can be used for adjusting the output signal of APD
Range value and the gain for adjusting APD.Test module 40 is connect with APD, can be used for the parameter in the APD test optical signal inputted
In the case where, the first operating voltage for exporting APD and APD are tested in the minimum detectable power of the first operating voltage.
The input parameter of input APD is usually required when testing APD, the output parameter of APD may include optical signal, work
Voltage etc..In the utility model embodiment, tunable light source module 10 can be used for providing test optical signal for APD.This is practical new
Type embodiment is intended to so that the test parameter for testing APD is adjustable, rather than is fixed setting.
In consideration of it, tunable light source module 10 may include background radiant 101 and laser light source in possible embodiment
102.Background radiant 101 can be used for providing bias light for APD.The wavelength for the bias light that background radiant 101 can provide
Covering visible light is near infrared band, and intensity of illumination is adjustable in 0~50000 lumen, can be needed needed for being arranged according to test
Bias light illumination.Background radiant 101 can be connect with illuminometer 103, demarcate background radiant by illuminometer 103
The illumination range of 101 bias lights provided, that is, illuminometer 103 may be implemented to change the back that background radiant 101 provides
The intensity of scape light to reach the intensity of illumination for changing APD to be tested, rather than is fixed intensity of illumination, as far as possible test light
According to the influence of the different output parameters to APD of intensity.
Laser light source 102 can be used for providing test optical signal for APD, wherein laser light source 102 is also used to adjust test
Wavelength, frequency and the pulsewidth of the laser of optical signal instruction.According to the characteristic of APD, in possible embodiment, laser light source
The wavelength of the laser of the test light signal designation of 102 outputs can be 905nm, 1064nm or 1550nm, can when testing APD
To select one of wavelength, or from a kind of wavelength switch to another wavelength.The test optical signal that laser light source 102 exports
Frequency be located within the scope of 100~100000Hz, when testing APD, test light can be adjusted within the scope of 100~100000Hz
The frequency of signal.The pulsewidth for the test optical signal that laser light source 102 exports is located within the scope of 20~500ns, when testing APD,
The pulsewidth of test optical signal can be adjusted within the scope of 20~500ns.When specific test, needed for being arranged according to testing requirement
Light source parameters, such as wavelength, frequency or the pulsewidth of test optical signal.
In possible embodiment, tunable light source module 10 can also include the optical attenuator connecting with laser light source 102
104, illuminator 105 and light power meter 106.Wherein it is possible to the light function of the test optical signal for adjusting the output of laser light source 102
Rate.The optical signal that laser light source 102 exports after optical attenuator 104, can by illuminator 105, illuminator 105 for pair
The optical signal that optical attenuator 104 exports is homogenized and the optical signal after homogenizing is exposed to the photosensitive area of APD.Light power meter
106 connect with APD, for testing the optical power for exposing to the photosensitive area of APD, when testing APD to change, more control to fine granularity
The parameter of system input APD.
Specifically, illuminator 105 by the optical signal after homogenizing expose to APD photosensitive area formed facula area be greater than or
Equal to 15m2, the uniformity for the hot spot that the photosensitive area that the optical signal after homogenizing exposes to APD is formed is greater than or waited by illuminator 105
In 90%, meet testing requirement to input parameter as far as possible.
It needs to input the input parameter of APD when testing APD in addition to optical signal, further includes operating voltage etc..Possible reality
It applies in mode, variable bias module 20 provided by the embodiment of the utility model may include high voltage power supply and low-voltage module, wherein
High voltage power supply can be single channel, and output voltage is located within the scope of 0-600V, and output circuit is less than or equal to the power supply of 10mA.
When testing APD, the ripple peak-to-peak value 10mV of the voltage of high voltage power supply output can be with step-by-step adjustment output voltage, the step of fine tuning
Into can be 0.1V, the stepping of coarse adjustment can be 1V, and the voltage value of output can be automatically adjusted according to different test process.It is low
Voltage source can be binary channels, and output voltage is located within the scope of 0-30V, and the maximum value for exporting electric current is the power supply of 500mA, defeated
Voltage value out can be automatically adjusted according to different test process.
In possible embodiment, output adjustment module 30 is amplifying circuit, wherein the output of amplifying circuit adjusting APD
The stepping of the gain of signal is 0.1dB, and the output noise voltage of amplifying circuit is less than or equal to 100mV, so that test module
40 can determine the index parameter of APD according to the output parameter of the APD of adjusting.
Test module 40 is connect with APD, for testing the index of APD in the case where APD inputs different input parameters
Parameter, such as operating voltage, probe power, responsiveness, rise time etc..
Specifically, it is based on structural schematic diagram shown in FIG. 1, the index parameter that test module 40 tests APD mainly includes such as
Under it is several:
1, optimum operating voltage point: corresponding environmental light applications are obtained by the way that background luminous intensity is arranged, are set in such circumstances
Surely the pulse parameter of optical signal is tested, then measures the relationship of APD component net gain and bias under specified false alarm rate, maximum net gain
Corresponding bias is the optimum operating voltage point of snowslide pipe.
2, responsiveness: the optical power being radiated on tested detector assembly is measured by light power meter 106, passes through oscillograph
The adjustable output module i.e. output voltage of amplifying circuit is measured, is then calculated by formula.
3, the rise time: the optical power being radiated on APD component is measured by light power meter 106, passes through oscilloscope measurement
The rise time of the output voltage signal of adjustable output module, that is, amplifying circuit.
4, noise equivalent power NEP: pass through the defeated of adjustable output module, that is, amplifying circuit under measurement non-illuminated conditions
Noise voltage out is calculated in conjunction with the impulse response degree measured.
5, minimum detectable power: the minimum irradiation laser signal peak power when detection probability 99% of APD is measured.
Specifically, the testing process of the index parameter of the test of test module 40 APD is as follows:
A, the measurement of optimum operating voltage point
The light pulse amplitude of input test optical signal is determined first: measuring optical system input light function with light power meter 106
Rate calculates the optical power for being irradiated to measured device by 104 attenuation multiple of optical attenuator.Then APD to be measured is plugged, is adjusted
Bias is raised to 200V by variable bias module 20, then regulated attenuator, makes FAR reading in 1-30P/S.Attenuation at this time
TO claims initial preset to decay.At this moment gain amplifier (63-TO) is to be increased using amplifier required by the APD without multiplication noise
Benefit.Pulse is set by pulse, regulated attenuator makes the impulse amplitude on the oscillograph connecting with attenuator be restored to 0.8V
Left and right, writes down attenuation Txo, then the gain of APD at this time are as follows: Go=Txo-To (dB)." O " mode is set by pulse, is decayed
Device is transferred to To+1dB.It adjusts variable bias module 20 to increase bias, until when FAR reading maintains 40-60P/S.It is appropriate to increase
After attenuation, then pulse is set as pulse.Regulated attenuator makes impulse amplitude on oscillograph be restored to 0.8V, writes down
Decaying Tx1 at this time, at this time G1 be are as follows: G1=TX1-To (db), due to increasing the preset decaying gain of amplifier (reduce)
And make the net gain of system then are as follows: Gp1=Tx1- (To+1) (dB).
It repeats as above operation and measures preset decaying are as follows: To+2dB, To+3dB ... APD's under the conditions of To+7dB etc. is each
Corresponding bias and attenuation Tx2, Tx2 ..., Tx7. can then find out a gain G n=Txn-To (dB) of corresponding conditions APD
With net gain value Gpn=Txn- (To+n) (dB).Make the relation curve of net gain and bias, bias corresponding to maximum net gain
The as best operating point Vopt of snowslide pipe.
B, responsiveness, the measurement of rise time
After best operating point Vopt measurement, bias is transferred to the optimal bias Vopt of APD.Regulated attenuator makes to show
Amplitude (0.8V) when wave-shape amplitude is restored to measurement standard pipe on wave device, it is tested for writing down the rise time tr of waveform at this time
The rise time of device.Decaying reading at this time is write down, photosensitive area peak optical powers Pout is irradiated to, by this value in decibel conversion table
In find corresponding yield value GR, the response under best operating point can be found out by substituting into formula Ropt=0.8/ (Pout × GR)
Degree.
C, the measurement of noise equivalent power NEP
After best operating point Vopt, responsiveness Ropt measurement, by milivoltmeter probe cable and adjustable output module
Output end connection, " pulse mode " is switched into reset, attenuator is transferred to initial preset pad value To, and adjusting bias voltage arrives
200 volts, noise voltage value is read from milivoltmeter.As previously shown, this voltage indicates the noise contribution Vnx of amplifier.
Bias is raised to best effort bias Vopt, then reads noise voltage value from milivoltmeter, this value is APD and amplification
Total output noise Vn of device.APD contribution noise be are as follows:The noise equivalent power NEP of APD are as follows:
In above formula, Vn indicates that the overall noise voltage (volt) of snowslide pipe and amplifier, Vnx indicate the noise point of amplifier contribution
Amount, Ropt indicate the best responsiveness of snowslide pipe, and RL indicates that snowslide pipe load resistance, GV indicate that the gain of amplifier is 63-To
(dB), corresponding amplification factor can be found by decibel table, B indicates system bandwidth.
In conclusion the test optical signal for inputting APD to be tested is adjustable, that is, tests in the utility model embodiment
The intensity or size of optical signal are adjustable, and make the test voltage for inputting APD also adjustable by variable bias module, lead to
Cross output adjustment module make APD output signal range value and gain it is also adjustable.In test, adjustable tunable light source
The output of module or the output of variable bias module adjust the input parameter of APD, with test the different input parameters the case where
Under, the first operating voltage of APD, it can be understood as the minimum detectable of optimum operating voltage and APD in the first operating voltage
Power.Namely in the utility model embodiment, it is not fixed setting, Ke Yijin that it is adjustable for, which testing the test parameter of APD,
The parameter for trying a variety of APD components is measured, the production test demand of APD component is met.
Above are merely preferred embodiments of the utility model, it is noted that above-mentioned preferred embodiment should not regard
For limitations of the present invention, the protection scope of the utility model should be defined by the scope defined by the claims..For
For those skilled in the art, without departing from the spirit and scope of the utility model, it can also make several
Improvements and modifications, these improvements and modifications also should be regarded as the protection scope of the utility model.
Claims (8)
1. a kind of APD component dynamic checkout unit characterized by comprising
Tunable light source module, for providing test optical signal for avalanche photodide APD；
Variable bias module is connect with the input terminal of the APD, is used for the APD output voltage signal；
Adjustment module is exported, is connect with the output end of the APD, for adjusting the range value and tune of the output signal of the APD
Save the gain of the APD；
Test module is connect with the APD, in the case where the parameter of the test optical signal for inputting in the APD, is surveyed
Examination export the APD the first operating voltage and the APD first operating voltage minimum detectable power.
2. device as described in claim 1, which is characterized in that the tunable light source module includes:
Background radiant, for providing bias light for the APD；
Laser light source, for providing the test optical signal for the APD, wherein the laser light source is also used to adjust described
Wavelength, frequency and the pulsewidth of the laser of test light signal designation.
3. device as claimed in claim 2, which is characterized in that the tunable light source module further include:
Illuminometer, for being connect with the background radiant, for demarcating the light for the bias light that the background radiant provides
Illumination range.
4. device as claimed in claim 3, which is characterized in that the tunable light source module further include:
Optical attenuator is connect with the laser light source, the light of the test optical signal for adjusting the laser light source output
Power；
Illuminator, the optical signal for exporting to the optical attenuator are homogenized and are exposed to the optical signal after homogenizing described
The photosensitive area of APD；
Light power meter is connect with the APD, for testing the optical power for exposing to the photosensitive area of the APD.
5. device as claimed in claim 4, which is characterized in that the optical signal after described homogenize is exposed to institute by the illuminator
The facula area for stating the photosensitive area formation of APD is greater than or equal to 15m2。
6. device as claimed in claim 4, which is characterized in that the optical signal after described homogenize is exposed to institute by the illuminator
The uniformity for stating the hot spot of the photosensitive area formation of APD is greater than or equal to 90%.
7. the device as described in claim 1-6 is any, which is characterized in that the variable bias module includes:
High voltage power supply, wherein the output voltage of the high voltage power supply is located within the scope of 0-600V, and output circuit is less than or equal to
10mA；
Low-tension supply, wherein the output voltage of the low-tension supply is located within the scope of 0-30V, and the maximum value for exporting electric current is
500mA。
8. device as claimed in claim 7, which is characterized in that the output adjustment module is amplifying circuit, wherein described to put
The stepping that big circuit adjusts the gain of the output signal of the APD is 0.1dB, and the output noise voltage of the amplifying circuit is less than
Or it is equal to 100mV.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201820954618.5U CN208334560U (en) | 2018-06-20 | 2018-06-20 | A kind of APD component dynamic checkout unit |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820954618.5U CN208334560U (en) | 2018-06-20 | 2018-06-20 | A kind of APD component dynamic checkout unit |
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| CN208334560U true CN208334560U (en) | 2019-01-04 |
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| CN201820954618.5U Expired - Fee Related CN208334560U (en) | 2018-06-20 | 2018-06-20 | A kind of APD component dynamic checkout unit |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110726919A (en) * | 2019-10-25 | 2020-01-24 | 中国电子科技集团公司第四十四研究所 | Array APD photoelectric parameter testing system |
| CN112461506A (en) * | 2021-01-28 | 2021-03-09 | 深圳市迅特通信技术股份有限公司 | Automatic test circuit for multipath APD and PIN light receiving device |
| CN113447750A (en) * | 2021-08-31 | 2021-09-28 | 深圳市力子光电科技有限公司 | Optical device test circuit |
| CN113589093A (en) * | 2021-09-30 | 2021-11-02 | 武汉普赛斯电子技术有限公司 | Drive test device and method for APD device |
| WO2022022693A1 (en) * | 2020-07-31 | 2022-02-03 | 中兴通讯股份有限公司 | Apd performance test method and apparatus for optical module, and optical network and medium |
| CN114994643A (en) * | 2022-07-18 | 2022-09-02 | 四川吉埃智能科技有限公司 | APD bias voltage adjusting method and circuit in laser ranging |
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2018
- 2018-06-20 CN CN201820954618.5U patent/CN208334560U/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110726919A (en) * | 2019-10-25 | 2020-01-24 | 中国电子科技集团公司第四十四研究所 | Array APD photoelectric parameter testing system |
| CN110726919B (en) * | 2019-10-25 | 2021-10-26 | 中国电子科技集团公司第四十四研究所 | Array APD photoelectric parameter testing system |
| WO2022022693A1 (en) * | 2020-07-31 | 2022-02-03 | 中兴通讯股份有限公司 | Apd performance test method and apparatus for optical module, and optical network and medium |
| CN112461506A (en) * | 2021-01-28 | 2021-03-09 | 深圳市迅特通信技术股份有限公司 | Automatic test circuit for multipath APD and PIN light receiving device |
| CN112461506B (en) * | 2021-01-28 | 2021-06-08 | 深圳市迅特通信技术股份有限公司 | Automatic test circuit for multipath APD and PIN light receiving device |
| CN113447750A (en) * | 2021-08-31 | 2021-09-28 | 深圳市力子光电科技有限公司 | Optical device test circuit |
| CN113447750B (en) * | 2021-08-31 | 2022-03-08 | 深圳市力子光电科技有限公司 | Optical device test circuit |
| CN113589093A (en) * | 2021-09-30 | 2021-11-02 | 武汉普赛斯电子技术有限公司 | Drive test device and method for APD device |
| CN113589093B (en) * | 2021-09-30 | 2021-12-28 | 武汉普赛斯电子技术有限公司 | Drive test device and method for APD device |
| CN114994643A (en) * | 2022-07-18 | 2022-09-02 | 四川吉埃智能科技有限公司 | APD bias voltage adjusting method and circuit in laser ranging |
| CN114994643B (en) * | 2022-07-18 | 2022-11-15 | 四川吉埃智能科技有限公司 | APD bias voltage adjusting method and circuit in laser ranging |
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