CN208314025U - A kind of device of high current grading system Universal test clamping apparatus - Google Patents
A kind of device of high current grading system Universal test clamping apparatus Download PDFInfo
- Publication number
- CN208314025U CN208314025U CN201820998774.1U CN201820998774U CN208314025U CN 208314025 U CN208314025 U CN 208314025U CN 201820998774 U CN201820998774 U CN 201820998774U CN 208314025 U CN208314025 U CN 208314025U
- Authority
- CN
- China
- Prior art keywords
- high current
- grading system
- fixture
- clamping apparatus
- fine copper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The utility model relates to a kind of device of high current grading system Universal test clamping apparatus, including bakelite plate, lower layer of the T-type fine copper block as fixture is set on bakelite plate；Upper layer of the top setting rectangle fine copper block of the "-" part of T-type fine copper block as fixture；Butterfly screw rod covers in the upper layer of fixture, the hole of lower layer；Upper layer, lower layer's fixture butterfly screw rod on spring is set.The device of the high current grading system Universal test clamping apparatus clamps the connecting line of test product using two pieces of copper billets, contact is good, impedance is small, occur the situations such as current anomaly caused by avoiding because of poor contact in test process, and the production of the device of the high current grading system Universal test clamping apparatus is so that the connection of p-wire becomes neat, specification, the case where avoiding test wiring error generation.
Description
Technical field
The utility model belongs to electrotechnics field more particularly to a kind of device of high current grading system Universal test clamping apparatus.
Background technique
High current (50A-150A) grading system that many companies use at present, when connecting product test, without exclusive clamps
Tool, it is general to be attached product and grading system by the way of the twisted connection of strand wire, often occur during the test
The phenomenon that current anomaly and wiring error, causes test result inaccurate, need to retest, and retest cause the time and
Waste in cost.
In conclusion problem of the existing technology is: connected by the way of twisted connection high current grading system and by
Product is surveyed, test result inaccuracy, need to make Special-purpose testing jig to solve the problems, such as this frequent occurrence.
Summary of the invention
In view of the problems of the existing technology, the utility model provides a kind of high current grading system Universal test clamping apparatus
Device.
The utility model is realized in this way
The utility model has the advantages and positive effects of: for the first time, from test result, the high current grading system is logical
The connecting line of test product is clamped using two pieces of copper billets with the device of test fixture, contact impedance is small, and measuring accuracy can be from original
± 5% promoted arrive ± 1%, greatly promote the accuracy of test result；Moreover after using this test fixture, before test
Connection preparation only needs can be completed for 30 seconds, and the 5 minutes comparison of former needs, only needs for original 10% time can be complete
At saving 90% time cost.
Detailed description of the invention
Fig. 1 and Fig. 2 is the structure of the device of high current grading system Universal test clamping apparatus provided by the embodiment of the utility model
Schematic diagram；
In figure: 1, bakelite plate；2, T-type fine copper block；3, spring；4, butterfly screw rod；5, rectangle fine copper block.
Specific embodiment
For the invention, features and effects that can further appreciate that the utility model, the following examples are hereby given, and cooperates
Detailed description are as follows for attached drawing.
It is explained in detail below with reference to structure of the Fig. 1 and Fig. 2 to the utility model.
The device of the high current grading system Universal test clamping apparatus includes bakelite plate 1, and setting T-type fine copper block 2 is made on bakelite plate 1
For the lower layer of fixture；Upper layer of the top setting rectangle fine copper block 5 of the "-" part of T-type fine copper block 2 as fixture；Butterfly spiral shell
4 sets of bar in the drilling of 5 fixture of T-type fine copper block 2 and rectangle fine copper block；Between T-type fine copper block 2 and rectangle fine copper block 5
Spring 3 is set on butterfly screw rod 4.
The utility model can also use following technical measures:
The T-type fine copper block 2 is uniformly mounted on bakelite plate 1 by the principle for being two-by-two one group.
Three overhead turn holes of the T-type fine copper block 2.
The bakelite plate 1 and 2 turn hole corresponding position turn hole of T-type fine copper block simultaneously install nut.
The 5 both ends turn hole of rectangle fine copper block.
Before grading system test product, by the p-wire top end substring of grading system on butterfly screw rod 4, and butterfly
Screw rod 4 is mounted in the hole location of the part " I " of T-type fine copper block 2；The connecting line of test product is clipped in T-type fine copper block 2 and rectangular
Butterfly screw rod 4 is tightened in the centre of shape fine copper block 5, and two pieces of fine copper blocks are after screw rod is tightened, to the connecting line of test product
Clamping power is not easily to fall off in 2Kgf or more, and contact impedance is less than 0.1m Ω, will not impact to test, it is ensured that it is surveyed
The confidence level of test result.The device of the high current grading system Universal test clamping apparatus includes: one piece of rectangular bakelite plate, Yi Jiyou
The fixture that two pieces of copper billet, two springs, three butterfly screw rods etc. by drilling collectively constitute.T-shape fine copper block is placed on
The top of bakelite plate, and in the top positioning through hole of 3 head of T-shape fine copper block to install screw rod (position can refer to attached drawing 2),
Lower layer of this device as fixture；It is prominent in butterfly screw rod two butterfly screw rod strings into two drilling positions of rectangle fine copper block
Screw portion out respectively covers a spring, upper layer of this device as fixture；The butterfly screw rod alignment jig lower layer on fixture upper layer
Drilling position, and tighten butterfly screw rod；Butterfly screw rod is tightened the top drilling of T-shape fine copper block.Make multiple above institutes
Tell fixture, a set of positive pole and cathode point that point is tested as high current grading system one of two compositions.
The above is only the preferred embodiment to the utility model, is not made in any form to the utility model
Limitation, it is all according to the technical essence of the utility model any simple modification made to the above embodiment, equivalent variations with
Modification, is all within the scope of the technical scheme of the utility model.
Claims (5)
1. a kind of device of high current grading system Universal test clamping apparatus, which is characterized in that high current grading system universal test folder
The device of tool includes bakelite plate, lower layer of the setting T-type fine copper block as fixture on bakelite plate；The "-" part of T-type fine copper block it is upper
Upper layer of side's setting rectangle fine copper block as fixture；Butterfly screw rod covers in the upper layer of fixture, the hole of lower layer；Upper layer, lower layer
Spring is set on the butterfly screw rod of fixture.
2. the device of high current grading system Universal test clamping apparatus as described in claim 1, which is characterized in that the T-type is pure
Copper billet is uniformly mounted on bakelite plate by the principle for being two-by-two one group.
3. the device of high current grading system Universal test clamping apparatus as described in claim 1, which is characterized in that the T-type is pure
Three overhead turn holes of copper billet.
4. the device of high current grading system Universal test clamping apparatus as described in claim 1, which is characterized in that the bakelite plate
With T-type fine copper block turn hole corresponding position turn hole and nut is installed.
5. the device of high current grading system Universal test clamping apparatus as described in claim 1, which is characterized in that the rectangle
Fine copper block both ends turn hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820998774.1U CN208314025U (en) | 2018-06-27 | 2018-06-27 | A kind of device of high current grading system Universal test clamping apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820998774.1U CN208314025U (en) | 2018-06-27 | 2018-06-27 | A kind of device of high current grading system Universal test clamping apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208314025U true CN208314025U (en) | 2019-01-01 |
Family
ID=64717727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820998774.1U Expired - Fee Related CN208314025U (en) | 2018-06-27 | 2018-06-27 | A kind of device of high current grading system Universal test clamping apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208314025U (en) |
-
2018
- 2018-06-27 CN CN201820998774.1U patent/CN208314025U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190101 Termination date: 20210627 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |