CN208092191U - A kind of semiconductor cooler tester - Google Patents
A kind of semiconductor cooler tester Download PDFInfo
- Publication number
- CN208092191U CN208092191U CN201820650345.5U CN201820650345U CN208092191U CN 208092191 U CN208092191 U CN 208092191U CN 201820650345 U CN201820650345 U CN 201820650345U CN 208092191 U CN208092191 U CN 208092191U
- Authority
- CN
- China
- Prior art keywords
- semiconductor cooler
- alternating current
- switch
- acquisition controller
- output end
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a kind of semiconductor cooler testers,Including DC power supply U,Acquisition controller,Display,Input terminal with the DC power supply U alternating current switching circuits connecting and DC switch circuit,The output end of alternating current switching circuit and DC switch circuit is connect with semiconductor cooler,Alternating current switching circuit includes inverter,First switch K1,And the resistance R1 on circuit after inverter output end,Transmitter is also exchanged with one for the output end of alternating current switching circuit and acquisition controller is sequentially connected,DC switch circuit includes current-limiting resistance R2,Second switch K2 and sampling resistor R3,The both ends of sampling resistor R3,The output end of DC switch circuit is also connect with acquisition controller,Acquisition controller is connect with display,The semiconductor cooler tester,It is simple in structure,The merit figue of semiconductor cooler can quickly be measured,Maximum temperature difference,For the quality condition for the semiconductor cooler that people get information about.
Description
Technical field
The utility model is related to semiconductor devices measuring device technical fields, particularly relate to a kind of semiconductor cooler survey
Try instrument.
Background technology
Merit figue and maximum temperature difference become to characterize producible maximum temperature in the case of semiconductor cooler is powered
Change, is the intuitive embodiment of semiconductor device quality as the important parameter of semiconductor devices.Existing semiconductor cooler it is excellent
Matter coefficient and maximum temperature difference do not have specific survey calculation standard, although the test equipment of each producer, test method are different, also
It is to assert that the merit figue of semiconductor cooler is related with the thermoelectromotive force of the semiconductor cooler, resistance, and partly lead
The maximum temperature difference of body cooler is even more to depend on merit figue.
Invention content
The purpose of this utility model is to provide a kind of semiconductor cooler testers.
A kind of semiconductor cooler tester, including DC power supply U, acquisition controller, display, input terminal with directly
The output end of the alternating current switching circuit and DC switch circuit of galvanic electricity source U connections, alternating current switching circuit and DC switch circuit is equal
It is connect with semiconductor cooler, after alternating current switching circuit includes inverter, first switch K1 and is located at inverter output end
Transmitter is also exchanged with one for the output end of resistance R1 on circuit, alternating current switching circuit and acquisition controller is sequentially connected, direct current
Switching circuit includes current-limiting resistance R2, second switch K2 and sampling resistor R3, and both ends and the acquisition controller of sampling resistor R3 connect
It connects, the output end of DC switch circuit is also connect with acquisition controller, and acquisition controller is connect with display.
The utility model semiconductor cooler tester, it is simple in structure, it can quickly measure semiconductor cooler
Merit figue, maximum temperature difference, for the quality condition for the semiconductor cooler that people get information about, and it uses acquisition to control
Intermediate measured value in device record measurement process processed, and the merit figue of semiconductor cooler, maximum temperature difference are calculated, it avoids
Artificial data record and calculating, greatly improves the rate and efficiency of test, complies with industrialization high-speed production condition.
Description of the drawings
Fig. 1 is the structural schematic diagram of the utility model semiconductor cooler tester.
Specific implementation mode
The specific implementation mode of the utility model semiconductor cooler tester is made specifically below in conjunction with the accompanying drawings
It is bright：
As shown in Figure 1, a kind of semiconductor cooler tester, including DC power supply U, acquisition controller 3, display 4,
The alternating current switching circuit 1 and DC switch circuit 2 that input terminal is connect with DC power supply U, alternating current switching circuit 1 and dc switch
The output end of circuit 2 is connect with semiconductor cooler 10, alternating current switching circuit 1 include inverter 11, first switch K1, with
And the resistance R1 on circuit after 11 output end of inverter, the output end of alternating current switching circuit 1 also exchange transmitter 12 with one
It is sequentially connected with acquisition controller 3, DC switch circuit 2 includes current-limiting resistance R2, second switch K2 and sampling resistor R3, sampling
The both ends of resistance R3 are connect with acquisition controller 3, and the output end of DC switch circuit 2 is also connect with acquisition controller 3, acquisition control
Device 3 processed is connect with display 4.
The utility model semiconductor cooler tester, current-limiting resistance R2 are used to carry out current limliting to circuit, prevent from measuring
Electric current is excessive in circuit, and leads to the damage of tester；Display 4 is for the aobvious of each intermediate measured value or all final measured value
Show.
The utility model semiconductor cooler tester, measuring process are as follows：
1）First switch K1 is closed, DC power supply U is powered back with alternating current switching circuit 1, the formation of semiconductor cooler 10
The direct current on road, DC power supply U outputs becomes the alternating current that voltage is V1 after inverter 11, and acquisition controller 3 is calculated
Alternating current I1=V1/R1 on power circuit, the output end with alternating current switching circuit 1（Or 10 both ends of semiconductor cooler）
The alternating current voltage V2 at 10 both ends of semiconductor cooler is transformed into DC voltage V3, acquisition control by the exchange transmitter 12 of connection
Device 3 processed acquires DC voltage V3, and according to collected DC voltage V3, calculates the alternating voltage V2 before conversion, count simultaneously
Calculate resistance Rr=V2/ I1 of semiconductor cooler 10；
2）First switch K1 is disconnected, second switch K2, DC power supply U and DC switch circuit 2, semiconductor cooler are closed
Part 10 forms power circuit, and semiconductor cooler 10 generates temperature change, front and back formation temperature in the case where being passed through direct current
Difference, while thermoelectromotive force E is generated, 32 output ends of circle collection DC switch circuit of acquisition controller, that is, semiconductor cooler
The voltage V5 at the both ends voltage V4 and sampling resistor R3 at 10 both ends is observed the electricity at 10 both ends of semiconductor cooler by display 4
The numerical value of V4 is pressed it is found that the voltage V4 at 10 both ends of semiconductor cooler is increased with the temperature of semiconductor cooler 10 and increased
Greatly；
3）After the voltage V4 at 10 both ends of semiconductor cooler is constant, the record of acquisition controller 3 collected at this time half
The voltage V5 at the both ends voltage V4 and sampling resistor R3 at 10 both ends of conductor cooler, and calculate the direct current on power circuit
Flow thermoelectromotive force E=V4-I2*Rr of I2=V5/R3 and semiconductor cooler 10；
4）According to the thermoelectromotive force E and resistance Rr of semiconductor cooler 10, calculate and the semiconductor cooler
Thermoelectromotive force, the related merit figue of resistance and the maximum temperature difference depending on merit figue, to intuitively to react
Go out the quality of the semiconductor cooler 10.
The utility model semiconductor cooler tester, it is simple in structure, it can quickly measure semiconductor cooler 10
Merit figue, maximum temperature difference, for the quality condition for the semiconductor cooler 10 that people get information about, and it is used
Collect the intermediate measured value in the record measurement process of controller 3, and calculates the merit figue of semiconductor cooler 10, maximum temperature
Difference avoids artificial data record and calculating, greatly improves the rate and efficiency of test, complies with industrialization high-speed production
Condition.
Claims (1)
1. a kind of semiconductor cooler tester, it is characterised in that：Including DC power supply U, acquisition controller, display, defeated
Enter end with the DC power supply U alternating current switching circuits connecting and DC switch circuit, alternating current switching circuit and DC switch circuit
Output end connect with semiconductor cooler, alternating current switching circuit include inverter, first switch K1 and be located at inversion
The output end of resistance R1 after device output end on circuit, alternating current switching circuit also exchange transmitter and acquisition controller with one successively
Connection, DC switch circuit include current-limiting resistance R2, second switch K2 and sampling resistor R3, the both ends of sampling resistor R3 and acquisition
Controller connects, and the output end of DC switch circuit is also connect with acquisition controller, and acquisition controller is connect with display.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820650345.5U CN208092191U (en) | 2018-05-03 | 2018-05-03 | A kind of semiconductor cooler tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820650345.5U CN208092191U (en) | 2018-05-03 | 2018-05-03 | A kind of semiconductor cooler tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208092191U true CN208092191U (en) | 2018-11-13 |
Family
ID=64052115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820650345.5U Expired - Fee Related CN208092191U (en) | 2018-05-03 | 2018-05-03 | A kind of semiconductor cooler tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208092191U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109490742A (en) * | 2018-12-05 | 2019-03-19 | 泉州市依科达半导体致冷科技有限公司 | A kind of semiconductor cooler tester |
-
2018
- 2018-05-03 CN CN201820650345.5U patent/CN208092191U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109490742A (en) * | 2018-12-05 | 2019-03-19 | 泉州市依科达半导体致冷科技有限公司 | A kind of semiconductor cooler tester |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181113 |