CN207965053U - It is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit - Google Patents
It is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit Download PDFInfo
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- CN207965053U CN207965053U CN201820079934.2U CN201820079934U CN207965053U CN 207965053 U CN207965053 U CN 207965053U CN 201820079934 U CN201820079934 U CN 201820079934U CN 207965053 U CN207965053 U CN 207965053U
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- slot
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- integrated circuit
- matched
- pattern generator
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Abstract
The utility model discloses a kind of based on the arrangement for testing integrated circuit that high-grade microprocessor is pattern generator,Its structure includes tester host,Display panel,Indicator light,Display screen,Handle,Control button,Control panel,Positive slot,Cathode slot,Holder,Display panel insertion is installed on the front of tester host and is electrically connected by conducting wire,The utility model is a kind of based on the arrangement for testing integrated circuit that high-grade microprocessor is pattern generator,Holder is fixed to installation in place,Detection line is separately inserted positive slot and cathode slot,Detector is placed on the circuit of integrated circuit,Display screen shows related data,Detection line is after use,Rocking bar is turned left and is stirred,Using shaft as origin,Buckle is turned right and is stirred by rocking bar,Spring pops up article slot,Wheel reduces the frictional force of article slot sliding,Detection line is put into article slot,It is internal that detection line is placed on tester point,Detection line is not easy to lose,Practicability is higher.
Description
Technical field
The utility model is a kind of arrangement for testing integrated circuit based on high-grade microprocessor for pattern generator, belongs to collection
At circuit test device field.
Background technology
Currently, advanced arrangement for testing integrated circuit in the world, although with high speed, multi-pipe pin, high-precision, multi-functional
The advantages that, but it is expensive, it slightly improves grade, it is necessary to millions of dollar, domestic many progress super large-scale integration products
The producer of exploitation powerlessly buys, and has seriously affected the development and application to IC products.
Prior art discloses application No. is：02246738.6 a kind of based on high-grade microprocessor is pattern generator
Arrangement for testing integrated circuit includes computer, pattern generator, the pin circuit controlled entire test device, wherein figure
Generator is high-grade microprocessor, and computer, pattern generator, pin circuit are connected with bus respectively, and pattern generator is logical
It crosses pin circuit with tested integrated circuit to be connected, but the prior art detection line and tester are separately put, and detection line is caused
Easy to be lost, practicability is relatively low.
Utility model content
In view of the deficienciess of the prior art, it is figure that the utility model aim, which is to provide one kind based on high-grade microprocessor,
The arrangement for testing integrated circuit of generator is separately put with solving prior art detection line and tester, causes detection line easy to be lost,
The relatively low problem of practicability.
To achieve the goals above, the utility model is to realize by the following technical solutions：One kind is based on high-grade micro-
Processor is the arrangement for testing integrated circuit of pattern generator, and structure includes tester host, display panel, indicator light, shows
Display screen, handle, control button, control panel, positive slot, cathode slot, holder, the display panel insertion are installed on test
It the front of instrument host and is electrically connected by conducting wire, the outer surface of the indicator light is installed on the inner surface of display panel and leads to
Conducting wire electrical connection is crossed, the display screen insertion is installed on the front of display panel and is gap-matched, under the handle
Surface is installed on the upper surface of tester host and is connected by screw, and the control button insertion is installed on control panel
Front and be electrically connected by conducting wire, the outer surface of the control panel is installed on the interior table of tester host and by leading
Line is electrically connected, and the outer surface of the anode slot is installed on the inner surface of tester host and is gap-matched, the survey
Examination instrument host includes test main frame shell, spring, buckle, sliding rail, wheel, article slot, baffle, rocking bar, shaft, outside the host
The lower surface of shell is connected with the upper surface of spring, and the lower surface and the upper surface of article slot of the spring fit, the card
Button insertion is installed on the lower surface of test main frame shell and is gap-matched, and the sliding rail outer surface is installed on test main frame
It the inner surface of shell and is gap-matched, the wheel insertion is installed on the right surface of article slot and is matched using gap
It closes, the lower surface of the article slot is installed on the upper surface of baffle and uses vertical glue joint, under the test main frame shell
Surface and the upper surface of baffle fit, and the inner surface of the rocking bar is installed on the outer surface of shaft and is gap-matched,
Shaft insertion is installed on the front of test main frame shell and is gap-matched, the inner surface of the sliding rail and wheel
Outer surface fits.
Further, the holder insertion is installed on the lower surface of tester host and is gap-matched.
Further, the cathode slot insertion is installed on the front of tester host and is electrically connected by conducting wire.
Further, the lower surface of the handle is installed on the upper surface of test main frame shell and is connected by screw
It connects, the holder insertion is installed on the lower surface of test main frame shell and is gap-matched.
Further, the indicator light is the cylindrical structure of diameter 2CM, high 3CM.
Further, the handle uses rubber material, and the material is soft, the less injury to human body.
Further, the control button is plastic material, and no electric conductivity is not easy to get an electric shock.
Advantageous effect
The utility model is a kind of based on the arrangement for testing integrated circuit that high-grade microprocessor is pattern generator, and holder is existed
Installation is fixed in suitable position, and detection line is separately inserted positive slot and cathode slot, and detector is placed on integrated circuit
Circuit on, display screen show related data, detection line after use, rocking bar is turned left and is stirred, using shaft as origin, rocking bar will
Buckle, which is turned right, to be stirred, and spring pops up article slot, and wheel reduces the frictional force of article slot sliding, and detection line is put into article slot i.e.
Can, detection line is placed on tester point inside, and detection line is not easy to lose, and practicability is higher.
Description of the drawings
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other spies of the utility model
Sign, objects and advantages will become more apparent upon：
Fig. 1 is a kind of knot based on the arrangement for testing integrated circuit that high-grade microprocessor is pattern generator of the utility model
Structure schematic diagram；
Fig. 2 is the cross-sectional view of the utility model tester host.
In figure：Tester host -1, display panel -2, indicator light -3, display screen -4, handle -5, control button -6, control
Panel -7, positive slot -8, cathode slot -9, holder -10, test main frame shell -101, spring -102, buckle -103, sliding rail -
104, wheel -105, article slot -106, baffle -107, rocking bar -108, shaft -109.
Specific implementation mode
To make the technical means, creative features, achievement of purpose, and effectiveness of the utility model be easy to understand, below
In conjunction with specific implementation mode, the utility model is expanded on further.
It please refers to Fig.1, Fig. 2, the utility model provides a kind of based on the integrated electricity that high-grade microprocessor is pattern generator
Road test device technical solution：Its structure includes tester host 1, display panel 2, indicator light 3, display screen 4, handle 5, control
Button 6, control panel 7, positive slot 8, cathode slot 9, holder 10, the insertion of the display panel 2 are installed on tester host 1
Front and be electrically connected by conducting wire, the outer surface of the indicator light 3 is installed on the inner surface of display panel 2 and by leading
Line is electrically connected, and the display screen 4 is embedded in the front for being installed on display panel 2 and is gap-matched, the following table of the handle 5
Face is installed on the upper surface of tester host 1 and is connected by screw, and the insertion of the control button 6 is installed on control panel
It 7 front and is electrically connected by conducting wire, the outer surface of the control panel 7 is installed on the interior table of tester host 1 and leads to
Conducting wire electrical connection is crossed, the outer surface of the anode slot 8 is installed on the inner surface of tester host 1 and is gap-matched,
The tester host 1 include test main frame shell 101, spring 102, buckle 103, sliding rail 104, wheel 105, article slot 106,
The lower surface of baffle 107, rocking bar 108, shaft 109, the host housing 101 is connected with the upper surface of spring 102, the bullet
The lower surface of spring 102 and the upper surface of article slot 106 fit, and 103 insertion of the buckle is installed on test main frame shell 101
It lower surface and is gap-matched, 104 outer surface of the sliding rail is installed on inner surface and the use of test main frame shell 101
Clearance fit, the wheel 105 are embedded in the right surface for being installed on article slot 106 and are gap-matched, the article slot 106
Lower surface be installed on baffle 107 upper surface and use vertical glue joint, the lower surface of the test main frame shell 101 and gear
The upper surface of plate 107 fits, and the inner surface of the rocking bar 108 is installed on the outer surface of shaft 109 and is gap-matched,
The shaft 109 is embedded in the front for being installed on test main frame shell 101 and is gap-matched, the interior table of the sliding rail 104
Face and the outer surface of wheel 105 fit, and the holder 10 is embedded in the lower surface for being installed on tester host 1 and uses gap
Cooperation, the cathode slot 9 is embedded in the front for being installed on tester host 1 and is electrically connected by conducting wire, under the handle 5
Surface is installed on the upper surface of test main frame shell 101 and is connected by screw, and the insertion of the holder 10 is installed on test
It the lower surface of host housing 101 and is gap-matched, the indicator light 3 is the cylindrical structure of diameter 2CM, high 3CM, institute
It states handle 5 and uses rubber material, the material is soft, the less injury to human body, and the control button 6 is plastic material, no conduction
Property, it is not easy to get an electric shock.
The light monitoring circuit of indicator light 3 described in this patent and the device of electrical equipment work or location status, instruction
Lamp is commonly used in reflecting that the working condition of circuit has electricity or the working condition without electricity, electrical equipment runs, stops transport or tests and position
Set state closure or disconnect etc., the display screen 4 is also generally referred to as monitor, and display is the equipment for belonging to computer, i.e., defeated
Enter output equipment, it is that a kind of being shown to certain electronic document on screen by specific transmission device is re-reflected into human eye
Show tools.
Installation is fixed in holder 10 in place when being used, detection line is separately inserted positive slot 8
With cathode slot 9, detector is placed on the circuit of integrated circuit, display screen 4 show related data, detection line after use,
Rocking bar 108 is turned left and is stirred, is origin with shaft 109, rocking bar 108, which will buckle 103, turns right and stir, and spring 102 is by article slot 106
Pop-up, wheel 105 reduce the frictional force of 106 sliding of article slot, detection line are put into article slot 106.
The utility model solves prior art detection line and tester is separately put, and causes detection line easy to be lost, practicability
Relatively low problem, the utility model are combined with each other by above-mentioned component, and the utility model one kind being based on high-grade microprocessor and is
Holder, is fixed installation by the arrangement for testing integrated circuit of pattern generator in place, and detection line is separately inserted just
Pole slot and cathode slot, detector is placed on the circuit of integrated circuit, and display screen shows that related data, detection line have used
Afterwards, rocking bar is turned left and is stirred, using shaft as origin, buckle is turned right and stirred by rocking bar, and spring pops up article slot, and wheel reduces object
Detection line is put into article slot by the frictional force of product slot sliding, and detection line is placed on tester point inside, and detection line is not easy to lose
It loses, practicability is higher.
The advantages of basic principles and main features and the utility model of the utility model have been shown and described above, for
For those skilled in the art, it is clear that the present invention is not limited to the details of the above exemplary embodiments, and without departing substantially from this
In the case of the spirit or essential attributes of utility model, the utility model can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the utility model is by institute
Attached claim rather than above description limit, it is intended that will fall within the meaning and scope of the equivalent requirements of the claims
All changes are embraced therein.Any reference numeral in claim should not be considered as to the involved right of limitation
It is required that.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped
Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should
It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art
The other embodiment being appreciated that.
Claims (5)
1. a kind of based on the arrangement for testing integrated circuit that high-grade microprocessor is pattern generator, it is characterised in that：Its structure packet
Include tester host (1), display panel (2), indicator light (3), display screen (4), handle (5), control button (6), control panel
(7), positive slot (8), cathode slot (9), holder (10), display panel (2) insertion are installed on tester host (1)
Front and be electrically connected by conducting wire, the outer surface of the indicator light (3) is installed on the inner surface of display panel (2) and passes through
Conducting wire is electrically connected, and display screen (4) insertion is installed on the front of display panel (2) and is gap-matched, the handle
(5) lower surface is installed on the upper surface of tester host (1) and is connected by screw, and the control button (6) is embedded
It is installed on the front of control panel (7) and is electrically connected by conducting wire, the outer surface of the control panel (7) is installed on tester
It the interior table of host (1) and is electrically connected by conducting wire, the outer surface of the anode slot (8) is installed on tester host (1)
It inner surface and is gap-matched, the tester host (1) includes test main frame shell (101), spring (102), buckle
(103), sliding rail (104), wheel (105), article slot (106), baffle (107), rocking bar (108), shaft (109), the host
The lower surface of shell (101) is connected with the upper surface of spring (102), lower surface and the article slot (106) of the spring (102)
Upper surface fit, the embedded lower surface for being installed on test main frame shell (101) of the buckle (103) and matched using gap
It closes, sliding rail (104) outer surface is installed on the inner surface of test main frame shell (101) and is gap-matched, the vehicle
Wheel (105) insertion is installed on the right surface of article slot (106) and is gap-matched, the lower surface of the article slot (106)
It is installed on the upper surface of baffle (107) and uses vertical glue joint, the lower surface of the test main frame shell (101) and baffle
(107) upper surface fits, and the inner surface of the rocking bar (108) is installed on the outer surface of shaft (109) and uses gap
Cooperation, shaft (109) insertion are installed on the front of test main frame shell (101) and are gap-matched, the sliding rail
(104) inner surface and the outer surface of wheel (105) fit.
2. it is according to claim 1 it is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit,
It is characterized in that：Holder (10) insertion is installed on the lower surface of tester host (1) and is gap-matched.
3. it is according to claim 1 it is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit,
It is characterized in that：Cathode slot (9) insertion is installed on the front of tester host (1) and is electrically connected by conducting wire.
4. it is according to claim 1 it is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit,
It is characterized in that：The lower surface of the handle (5) is installed on the upper surface of test main frame shell (101) and is connected by screw
It connects, holder (10) insertion is installed on the lower surface of test main frame shell (101) and is gap-matched.
5. it is according to claim 1 it is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit,
It is characterized in that：The indicator light (3) is the cylindrical structure of diameter 2CM, high 3CM.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820079934.2U CN207965053U (en) | 2018-01-17 | 2018-01-17 | It is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820079934.2U CN207965053U (en) | 2018-01-17 | 2018-01-17 | It is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207965053U true CN207965053U (en) | 2018-10-12 |
Family
ID=63733698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820079934.2U Expired - Fee Related CN207965053U (en) | 2018-01-17 | 2018-01-17 | It is a kind of based on high-grade microprocessor be pattern generator arrangement for testing integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207965053U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110780184A (en) * | 2019-10-21 | 2020-02-11 | 长江存储科技有限责任公司 | Integrated circuit test system and test method |
| CN112462210A (en) * | 2020-11-19 | 2021-03-09 | 哈尔滨诺信工大测控技术有限公司 | Pop out portable firer device tester that can put on shelf |
| CN112834154A (en) * | 2021-01-19 | 2021-05-25 | 潍坊歌尔微电子有限公司 | Product impact resistance testing device |
-
2018
- 2018-01-17 CN CN201820079934.2U patent/CN207965053U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110780184A (en) * | 2019-10-21 | 2020-02-11 | 长江存储科技有限责任公司 | Integrated circuit test system and test method |
| CN112462210A (en) * | 2020-11-19 | 2021-03-09 | 哈尔滨诺信工大测控技术有限公司 | Pop out portable firer device tester that can put on shelf |
| CN112834154A (en) * | 2021-01-19 | 2021-05-25 | 潍坊歌尔微电子有限公司 | Product impact resistance testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181012 Termination date: 20190117 |