CN207866867U - TF card test bench - Google Patents

Abstract

The utility model provides a kind of TF card test bench, including pedestal, the measurement circuit plate being arranged on pedestal, test probe, TF card placing groove and press mechanism and the TF card compression bar in TF card placing groove both sides is set, test probe connecting test wiring board, TF card placing groove is horizontally disposed, it tests probe to be arranged below the TF card placing groove, the syringe needle for testing probe stretches into TF card placing groove；Each TF card compression bar includes the compression end stretched into TF card placing groove and the hinged end being hinged on press mechanism, the limit slot hole extended in the middle part of TF card compression bar near compression end is offered on each TF card compression bar, it is both provided with limit shaft positioned at the both sides of TF card placing groove on pedestal, two limit shafts are threaded through correspondingly in two limit slot holes；Vertical spacing mechanism and resetting-mechanism are provided between pedestal and press mechanism.

Description

TF card test bench

Technical field

The utility model is related to a kind of electronic product test devices, specifically, relate to a kind of TF card test bench.

Background technology

T-FLASH storage card abbreviation TF cards are a kind of flash memory cards that appearance is very small and exquisite, are used for cell phone apparatus earliest On, nowadays with the rapid development of science and technology, TF card is widely used in smart home, slr camera, tablet computer etc. and intelligently sets It is standby upper.With the requirement in TF card product market, while promoting TF card properties of product, the testing requirement of TF card is also gradually increased More, TF card test bench can complete the test to the electric property and function of TF card, therefore TF card is surveyed as a kind of load bearing component The quality of examination seat can directly influence the accuracy and reliability of TF card test.

However, existing TF card test bench is primarily present problems with：On the one hand, traditional TF card test bench is to be measured During TF card is tested, when TF card to be measured is placed on the corresponding position of TF card test bench, TF card to be measured is easy hair Raw displacement causes to be susceptible to phenomena such as TF card to be measured is with probe poor contact, unstable or signal fault in test process； On the other hand, existing TF card test bench is mostly the test bench of artificial cover-lifting type, when testing high-volume TF card to be measured, It is difficult to flexibly be adapted to the automatic test that automation equipment realizes TF card to be measured, be substantially reduced so as to cause testing efficiency； Further, since existing TF card test bench is complicated, when there are parts damages, it has not been convenient to be replaced or be safeguarded.

In order to solve the above problems, people are seeking always a kind of ideal technical solution.

Invention content

The purpose of this utility model is that in view of the deficiencies of the prior art, to provide, a kind of design science, reliability be high, behaviour Make TF card test bench that is convenient, easy to maintain, being applicable to high-volume automatic test.

To achieve the goals above, technical solution used by the utility model is：A kind of TF card test bench, including base Seat, the measurement circuit plate being arranged on the pedestal, test probe, TF card placing groove and press mechanism and setting are in the TF The TF card compression bar of card placing groove both sides, the test probe are mounted on the measurement circuit plate, the syringe needle of the test probe It stretches into the TF card placing groove；

The TF card compression bar includes the compression end stretched into the TF card placing groove and is hinged on the press mechanism Hinged end offers the limit extended near the compression end in the middle part of the TF card compression bar on the TF card compression bar and grows Hole corresponds to the limit slot hole on the pedestal and is provided with limit shaft, and the moving up and down of the press mechanism can drive described TF card compression bar is overturn within the scope of the restriction of the limit slot hole；

It is provided with vertical spacing mechanism and resetting-mechanism between the pedestal and the press mechanism, under original state, institute It states press mechanism described in resetting-mechanism top pressure and the compression end of the TF card compression bar is driven to compress the bottom surface of the TF card placing groove； Under storage/access card-like state, the press mechanism moves down the compressing resetting-mechanism and the TF card compression bar is driven to overturn to leaving State TF card placing groove.

Based on above-mentioned, the pedestal includes pedestal and TF card seat, mounting groove is offered on the pedestal, the TF card seat can It being placed on to vertical motion in the mounting groove, the lateral wall that the mounting groove corresponds to the TF card seat is provided with guiding inner wall, Elastic mechanism is provided between TF card seat bottom and the mounting groove, the TF card placing groove is opened in the TF card seat Interior, the test probe passes through the pedestal and the TF card seat, and two limit shafts are respectively provided on the base, described The active force of resetting-mechanism is more than the active force of the elastic mechanism.

Based on above-mentioned, the resetting-mechanism includes four be arranged between the pedestal quadrangle and the press mechanism quadrangle A first compression spring, the elastic mechanism include two the second compression springs.

Based on above-mentioned, the pedestal quadrangle and the press mechanism quadrangle correspond to first compression spring, the mounting groove and TF card seat bottom corresponds to second compression spring and is respectively arranged with compression spring installation shrinkage pool.

Based on above-mentioned, the vertical spacing mechanism includes setting stroke slot hole on the base and is arranged under described Stroke limit pin on press mechanism.

Based on above-mentioned, the test probe includes test needle stand and probe, and the test needle stand is fixed on the pedestal, Probe installing hole is provided on the test needle stand, the probe is removably mounted in the probe installing hole, the bottom The probe, which is corresponded to, on seat and the TF card seat offers probe through-hole respectively.

Based on above-mentioned, the probe includes test needle tubing and test syringe needle, and needle spring is provided in the test needle tubing, The bottom of the test syringe needle is inserted into the test needle tubing, and the bottom end of the test syringe needle connects the needle spring.

Based on above-mentioned, the top of the test syringe needle is in round end shape.

Based on above-mentioned, it is bolted between the measurement circuit plate and the pedestal.

The utility model has substantive features and progress compared with the prior art, and specifically, the utility model provides A kind of completely new technical solution is provided with the press mechanism and the TF card compression bar, is by pressing the press mechanism The hinged end motion that the TF card compression bar can be driven, it is described by guiding and the limit of the limit slot hole and the limit shaft The compression end of TF card compression bar can implement compress and release action to the TF card being placed in the TF card placing groove, pass through the pressure The pushing tightly held is avoided shifting during the test, reliability is improved, by described, it can be achieved that be fixedly secured to TF card The setting of resetting-mechanism realizes the self-return of the press mechanism, simplifies operation.

Further, by the setting of the elastic mechanism, make the compression end when compressing TF card, the TF card seat energy It is enough to apply a upward reaction force to the compression end, it realizes the flexible docking of the two, is not only able to avoid the compression The stiff resistance being subject in pushing process is held, locking is made to be easier, and can be fixedly more secured by TF card.

Further, since the elastic force of four first compression springs is more than the elastic force of two second compression springs, to make The hinged end stress for obtaining the TF card compression bar is more than compression end stress, then, under default conditions, the compression end of the TF card compression bar It will be tightly pressed against in TF card, and be in locking state, only by pressing the press mechanism, the compression end could be unclamped.

Further, the setting of compression spring installation shrinkage pool facilitates tearing open for first compression spring and second compression spring Dress.

Further, the probe is removably mounted in the probe installing hole, in the tissue damage, side Just it is individually replaced.

Further, the setting of the needle spring is, it can be achieved that the flexible contact tested between syringe needle and TF card, is protected Demonstrate,prove the close contact of the test syringe needle and TF card.

Further, it sets the top of the test syringe needle to round end shape, ensure that and contacted with the uniform of TF card, in institute Under the action of stating needle spring elastic force, it is existing to avoid the occurrence of TF card to be measured and probe poor contact, unstable or signal fault etc. As to improve accuracy and the reliability of TF card test to be measured.

Further, it is bolted between the measurement circuit plate and the pedestal, facilitates the measurement circuit The repair and dismounting of plate.

Finally, which can flexibly be adapted to oneself filling to TF card progress high-volume test or information Dynamicization equipment avoids being only capable of by manually filling solely to complete TF card test or TF card information, to greatly improve TF Card testing efficiency or the filling efficiency of TF card information.

It is with design science, reliability is high, it is easy to operate, easy to maintain, be applicable to high-volume automatic test Advantage.

Description of the drawings

Fig. 1 is the original state figure of TF card test bench in the utility model.

Fig. 2 is the pressed status figure of TF card test bench in the utility model.

Fig. 3 is the structural exploded view of TF card test bench in the utility model.

Fig. 4 is the sectional view that TF card test bench is splitted along TF card compression bar in the utility model.

Fig. 5 is the sectional view that TF card test bench is splitted along test probe in the utility model.

Fig. 6 is the structural schematic diagram of the utility model in the base.

Fig. 7 is the structural schematic diagram of TF card seat in the utility model.

Fig. 8 is the bottom view of TF card seat in the utility model.

The structural schematic diagram of press mechanism in Fig. 9 the utility model.

Figure 10 is the bottom view of press mechanism in the utility model.

Figure 11 is the structural schematic diagram of TF card compression bar in the utility model.

Figure 12 is the structural schematic diagram of test needle stand in the utility model.

Figure 13 is the structural schematic diagram of the utility model middle probe.

Figure 14 is the utility model in the base, the first compression spring, the second compression spring and the installation diagram for testing probe.

Figure 15 is the structural schematic diagram by the installation of TF card seat in fig. 14.

Figure 16 is the structural schematic diagram by press mechanism and the installation of TF card compression bar in fig.15.

In figure：1. measurement circuit plate；2. TF card seat；3. test needle stand；4. testing needle tubing；5. testing syringe needle；6. Pedestal；7. TF card compression bar；8. press mechanism；9. limit shaft；10. the first compression spring；11. stroke limit pin；12. bolt； 13. articulated shaft；14. the second compression spring；15. stroke slot hole；201. probe through-hole I；202. compression springs install shrinkage pool I；601. Probe through-hole II；602. compression spring installs shrinkage pool II；603. compression springs install shrinkage pool III；701. compression end；702. hinged end； 703. limit slot holes；801. compression springs install shrinkage pool IV.

Specific implementation mode

Below by specific implementation mode, the technical solution of the utility model is described in further detail.

As illustrated in figs. 1-16, a kind of TF card test bench, it is characterised in that：Including pedestal, the survey being arranged on the pedestal Examination wiring board tests probe, TF card placing groove and press mechanism 8 and the TF card compression bar in TF card placing groove both sides is arranged 7, the test probe connects the measurement circuit plate, and the TF card placing groove is horizontally disposed, and the test probe is arranged in institute It states below TF card placing groove, the syringe needle of the test probe stretches into the TF card placing groove；It is used in the TF card placing groove TF card is placed, when TF card is put into the TF card placing groove, the test probe is contacted with TF card region to be measured, so as to it It is tested for the property.

Each TF card compression bar 7 includes the compression end 701 stretched into the TF card placing groove（Inner end）Be hinged on Hinged end 702 on the press mechanism 8（Outer end）, wherein hinged end 702 is hinged on by articulated shaft 13 on press mechanism 8, The limit extended to from the middle part of the TF card compression bar 7 near the compression end 701 is offered on each TF card compression bar 7 Slot hole 703, the both sides that the TF card placing groove is located on the pedestal are both provided with limit shaft 9, and two limit shafts 9 are one by one It is accordingly threaded through in two limit slot holes 703；By the vertical motion of press mechanism 8, the vertical of hinged end 702 is driven Movement, and then compression end 701 is driven to touch and moved near limit shaft 9 from placing groove bottom with TF card.

Vertical spacing mechanism and resetting-mechanism, the vertical spacing mechanism are provided between the pedestal and press mechanism 8 For limiting stroke of the press mechanism 8 relative to the pedestal, the resetting-mechanism is for driving press mechanism 8 to return to initial bit It sets；Under original state, press mechanism 8 described in the resetting-mechanism top pressure simultaneously drives the compression end 701 of the TF card compression bar 7 to compress The bottom surface of the TF card placing groove；Under storage/access card-like state, the press mechanism 8 moves down the compressing resetting-mechanism and drives institute The overturning of TF card compression bar 7 is stated to leaving the TF card placing groove.

For preferably fixed TF card, the pedestal includes pedestal 6 and TF card seat 2, and installation is offered on the pedestal 6 Slot, the TF card seat 2 can be placed on to vertical motion in the mounting groove, and the mounting groove corresponds to the outside of the TF card seat 2 Wall is provided with guiding inner wall, is shaken during the motion to avoid TF card seat 2；2 bottom of TF card seat and the mounting groove it Between be provided with elastic mechanism, the elastic mechanism is used for the flexible contact of TF card seat 2 and compression end 701；The TF card placing groove It is opened in the TF card seat 2, the test probe passes through the pedestal 6 and the TF card seat 2, two limit shafts 9 equal It is arranged on the pedestal 6.In use, when compression end 701 and the TF card are placed groove bottom and contacted, under the TF card seat 2 The elastic mechanism is dropped and is compressed, meanwhile, the elastic mechanism applies a upward reaction force to TF card seat 2, to keep away Exempt from the stiff resistance that compression end 701 is subject to, locking process is made to be more prone to, and since TF card is by the pressure on two sides, it is fixed It obtains also more secured.

Resetting-mechanism described in the present embodiment, which specifically includes, to be arranged in 8 four jiaos of 6 four jiaos of the pedestal and the press mechanism Between four the first compression springs 10, the elastic mechanism include two the second compression springs 14；In use, due to four first pressures The elastic force of spring 10 is greater than the elastic force of two second compression springs 14, so that 702 stress of hinged end of the TF card compression bar 7 More than 701 stress of compression end, then, under default conditions, the compression end 701 of the TF card compression bar 7 will be tightly pressed against in TF card, place In locking state, only by pressing the press mechanism 8, the compression end 701 could be unclamped, be realized " locking of loosing one's grip " Mode of operation.

The dismounting of first compression spring 10 and second compression spring 14 for convenience, 6 four jiaos of the pedestal and the pushing 8 four jiaos of mechanism corresponds to first compression spring 10, the mounting groove and 2 bottom of TF card seat and corresponds to the difference of the second compression spring 14 It is provided with compression spring installation shrinkage pool（Respectively compression spring installation shrinkage pool I202, compression spring installation shrinkage pool II602, compression spring install shrinkage pool III603, compression spring installation shrinkage pool IV801）；In use, the pressure is filled at the both ends of the first compression spring 10 and the second compression spring 14 respectively Installation can be completed in spring installation shrinkage pool.

The vertical spacing mechanism specifically includes the stroke slot hole 15 being arranged on the pedestal 6 and sets in the present embodiment Set the stroke limit pin 11 on the press mechanism 8；In use, stroke limit pin 11 is threaded through in stroke slot hole 15, realize Limitation to the stroke in the vertical direction of press mechanism 8.

The test probe is repaired for convenience, the test probe includes test needle stand 3 and probe, the testing needle Seat 3 is fixed on the pedestal, probe installing hole is provided on the test needle stand 3, the probe is removably mounted on institute It states in probe installing hole, correspond to the probe on the pedestal 6 and the TF card seat 2 offers probe through-hole respectively（Respectively Probe through-hole I201, probe through-hole II601）, so as to passing through for the probe.In use, dismountable mode, it is convenient to by Being individually replaced for damage probe, reduces maintenance cost.

The probe includes test needle tubing 4 and test syringe needle 5, in order to avoid testing the contact between syringe needle 5 and TF card not It is good, needle spring is provided in the test needle tubing 4, the bottom of the test syringe needle 5 is inserted into the test needle tubing 4, described The bottom end for testing syringe needle 5 connects the needle spring；In use, the elastic force of the needle spring, can ensure to test syringe needle 5 with TF card is in close contact state always.

In order to make test syringe needle 5 and TF card better contact with, the top of the test syringe needle 5 is in round end shape；In use, circle The contact surface of head ensure that and be contacted with the uniform of TF card, under the action of the needle spring elastic force, avoids the occurrence of TF to be measured Phenomena such as card is with probe poor contact, unstable or signal fault, to improve the accuracy of TF card to be measured test and reliable Property.

In order to facilitate the repair and dismounting of measurement circuit plate 1, pass through spiral shell between the measurement circuit plate 1 and the pedestal 6 Bolt 12 is fixed.

In another embodiment, which can be applied in automation equipment, is set by automation After the standby press mechanism 8 by TF card test bench is depressed automatically, then TF card to be measured is automatically put into TF card seat 2 in TF card test bench Corresponding position then automatically resets the press mechanism 8 of TF card test bench, makes two TF card compression bars 7 of TF test benches will be to be measured TF card is fixed, to realize the high-volume, high-precision and automatic test of TF card.

Finally it should be noted that:Above example is only to illustrate the technical solution of the utility model rather than limits it System；Although the utility model is described in detail with reference to preferred embodiment, those of ordinary skill in the art should Understand：It can still modify to specific embodiment of the present utility model or some technical characteristics are equally replaced It changes；Without departing from the spirit of technical solutions of the utility model, should all cover in the claimed technical solution of the utility model In range.

Claims (10)

1. a kind of TF card test bench, it is characterised in that：It is visited including pedestal, the measurement circuit plate being arranged on the pedestal, test Needle, TF card placing groove and press mechanism and the TF card compression bar in TF card placing groove both sides is set, the test probe peace On the measurement circuit plate, the syringe needle of the test probe stretches into the TF card placing groove；

The TF card compression bar includes the compression end stretched into the TF card placing groove and is hinged on being hinged on the press mechanism It holds, the limit slot hole extended in the middle part of the TF card compression bar near the compression end, institute is offered on the TF card compression bar It states and corresponds to the limit slot hole on pedestal and be provided with limit shaft, moving up and down for the press mechanism can drive the TF card pressure Bar is overturn within the scope of the restriction of the limit slot hole；

It is provided with vertical spacing mechanism and resetting-mechanism between the pedestal and the press mechanism, it is described multiple under original state Press mechanism described in the mechanism top pressure of position simultaneously drives the compression end of the TF card compression bar to compress the bottom surface of the TF card placing groove；Deposit/ Under card taking state, the press mechanism moves down the compressing resetting-mechanism and the TF card compression bar is driven to overturn to leaving the TF Card placing groove.

2. TF card test bench according to claim 1, it is characterised in that：The pedestal includes pedestal and TF card seat, described Mounting groove is offered on pedestal, the TF card seat can be placed on to vertical motion in the mounting groove, and the mounting groove corresponds to institute The lateral wall for stating TF card seat is provided with guiding inner wall, and elastic mechanism is provided between TF card seat bottom and the mounting groove, The TF card placing groove is opened in the TF card seat, and the test probe passes through the pedestal and the TF card seat, two institutes It states limit shaft to be respectively provided on the base, the active force of the resetting-mechanism is more than the active force of the elastic mechanism.

3. TF card test bench according to claim 2, it is characterised in that：The resetting-mechanism includes being arranged in the pedestal Four the first compression springs between quadrangle and the press mechanism quadrangle, the elastic mechanism include two the second compression springs.

4. TF card test bench according to claim 3, it is characterised in that：The pedestal quadrangle and the press mechanism quadrangle Corresponding first compression spring, the mounting groove and TF card seat bottom correspond to second compression spring and are respectively arranged with compression spring installation Shrinkage pool.

5. according to claim 2-4 any one of them TF card test benches, it is characterised in that：The vertical spacing mechanism includes setting The stroke limit pin set stroke slot hole on the base and be arranged on the press mechanism.

6. according to claim 2-4 any one of them TF card test benches, it is characterised in that：The test probe includes testing needle Seat and probe, the test needle stand are fixed on the pedestal, and probe installing hole, the probe are provided on the test needle stand It is removably mounted in the probe installing hole, correspond to the probe on the pedestal and the TF card seat offers spy respectively Needle through-hole.

7. TF card test bench according to claim 6, it is characterised in that：The probe includes test needle tubing and testing needle Head is provided with needle spring in the test needle tubing, and the bottom of the test syringe needle is inserted into the test needle tubing, the test The bottom end of syringe needle connects the needle spring.

8. TF card test bench according to claim 7, it is characterised in that：The top of the test syringe needle is in round end shape.

9. TF card test bench according to claim 5, it is characterised in that：The test probe includes test needle stand and spy Needle, the test needle stand are fixed on the pedestal, and probe installing hole is provided on the test needle stand, and the probe is detachable Ground be mounted on the probe installing hole in, correspond on the pedestal and the TF card seat probe offer respectively probe lead to Hole.

10. according to claim 2,3,4,7,8 or 9 any one of them TF card test benches, it is characterised in that：The measurement circuit It is bolted between plate and the pedestal.