CN207799022U - Integrated circuit test system - Google Patents
Integrated circuit test system Download PDFInfo
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- CN207799022U CN207799022U CN201721921792.1U CN201721921792U CN207799022U CN 207799022 U CN207799022 U CN 207799022U CN 201721921792 U CN201721921792 U CN 201721921792U CN 207799022 U CN207799022 U CN 207799022U
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Abstract
The utility model discloses a kind of integrated circuit test systems.Wherein, which includes：Test system host；Kernel control module is connected by data connection controller with the test system host；Program-controlled voltage current source is connected by address data bus with the kernel control module, and output current is used for；User test card is connected with the program-controlled voltage current source, for storing test parameter and test condition；Device under test, it is connected to the output end of the user test card, and it is connected with the kernel control module, wherein, the test system host by the kernel control module according in the user test card the test parameter and the test condition automatic test is executed to the device under test.The utility model solves the technical issues of having a single function of existing integrated circuit test system.
Description
Technical field
The utility model is related to testing fields, in particular to a kind of integrated circuit test system.
Background technology
With the increase of integrated circuit function, application is also more and more extensive, the testing requirement to integrated circuit and requirement
Also more and more.It must integrate relevant test resource by special test machine, currently, external test machine function is neat
Entirely, the product that can be directed to various different function is tested, but expensive.And domestic test machine is having a single function,
Performance is unsatisfactory.
And the test machine instrument of a lot of chip testing and Chevron Research Company (CRC), it cannot be tested automatically, these instruments are all not busy
It sets.And if company must put into a large amount of fund in purchase new equipment, fail to agree with testing cost is saved.
For above-mentioned problem, currently no effective solution has been proposed.
Utility model content
The utility model embodiment provides a kind of integrated circuit test system, is surveyed at least solving existing integrated circuit
The technical issues of having a single function of test system.
According to the one side of the utility model embodiment, a kind of integrated circuit test system is provided, including：Test system
System host；Kernel control module connects controller by number and is connected with the test system host；Program-controlled voltage electric current
Source is connected by address data bus with the kernel control module, and output current is used for；User test card, with the journey
Control voltage and current source is connected, for storing test parameter and test condition；Device under test is connected to the user test card
Output end, and be connected with the kernel control module, wherein the test system host passes through the kernel control module
According in the user test card the test parameter and the test condition automatic test is executed to the device under test.
Optionally, the integrated circuit test system includes load bearing equipment, is connected to the output end of the user test card,
And it is connected with the kernel control module, it is automatic to be executed to the device under test for carrying the device under test
Test.
Optionally, the load bearing equipment includes sorting machine or probe station.
Optionally, the integrated circuit test system includes signal source, and the signal source is connected to the user test card
Input terminal, and be connected with the test system host, the signal pair of different frequency exported for controlling the signal source
The device under test is tested.
Optionally, the integrated circuit test system includes electronic metering equipment, is connected to the defeated of the user test card
Outlet, and be connected with the test system host, the parameter obtained when being tested the device under test for acquiring.
Optionally, the electronic metering equipment includes at least at least one of：Oscillograph, multimeter and power analysis
Instrument.
Optionally, the integrated circuit test system further includes：Power supply and alarm module pass through described address data/address bus
It is connect with the program-controlled voltage current source, for providing electric current to the program-controlled voltage current source.
Optionally, the integrated circuit test system further includes：Arbitrary waveform generator passes through described address data/address bus
Be connected between the kernel control module and the output interface module, wherein the arbitrary waveform generator by power supply and
Alarm module is powered.
Optionally, the program-controlled voltage current source is multiple.
Optionally, the electronic metering equipment is connected by general purpose interface bus GPIB with the test system host.
In the utility model embodiment, device under test is connected with user test card, includes treating for test card
The condition and test parameter that device is tested are surveyed, by kernel control module and test system host according in user test card
Test condition and test parameter device under test execute automatic test, the test condition and test adjusted in user test card is joined
Number can carry out different device under test the test of different function, to solve the test system of existing integrated circuit
The relatively simple technical problem of function.
Description of the drawings
Attached drawing described herein is used to provide a further understanding of the present invention, and is constituted part of this application,
The exemplary embodiment of the utility model and the description thereof are used to explain the utility model, does not constitute to the improper of the utility model
It limits.In the accompanying drawings：
Fig. 1 is the schematic diagram according to a kind of integrated circuit test system of the utility model embodiment.
Specific implementation mode
In order to make those skilled in the art more fully understand the utility model, below in conjunction with the utility model reality
The attached drawing in example is applied, the technical scheme in the utility model embodiment is clearly and completely described, it is clear that described
Embodiment is only the embodiment of the utility model part, instead of all the embodiments.Based on the reality in the utility model
Example is applied, every other embodiment obtained by those of ordinary skill in the art without making creative efforts is all answered
When the range for belonging to the utility model protection.
The utility model provides a kind of integrated circuit test system.
As shown in Figure 1, the IC system includes：
Test system host 10.
Kernel control module 20 connects controller 30 by number and is connected with the test system host 10.The data
It can be USB controller to connect controller.
Program-controlled voltage current source 40 is connected by address data bus 50 with the kernel control module 20, for defeated
Go out electric current.
User test card 60 is connected with the program-controlled voltage current source 40, for storing test parameter and test condition.
Different test conditions and test parameter can be set for different test events, for example, when the power consumption of test device under test
Power consumption relevant parameter can be set, test parameter can be adjusted to gain relevant parameter when testing the gain of device under test.To not
Same test event is adjusted, and is no longer illustrated one by one herein.
Device under test is connected to the output end of the user test card 60, and is connected with the kernel control module 20
It connects, wherein the test system host 10 is by the kernel control module 20 according to described in the user test card 60
Test parameter and the test condition execute automatic test to the device under test.Device under test can be simulation class component,
For example, voltage-stabilizing device, amplifier device, frequency modulation device and reference circuit etc..
Through this embodiment, device under test is connected with user test card, for test card include device under test into
The condition and test parameter of row test, by kernel control module and test system host according to the test-strips in user test card
Part and test parameter device under test execute automatic test, adjust test condition and test parameter in user test card
The test of different function is carried out to different device under test, the test system function to solve existing integrated circuit compares
Single technical problem.
Optionally, the integrated circuit test system includes load bearing equipment 100, is connected to the output of the user test card
End, and be connected with the kernel control module, for carrying the device under test, to be executed certainly to the device under test
Dynamic test.
Load bearing equipment can be sorting machine or probe station.Chip is carried out certainly for example, chip is placed on probe station
Dynamic test, tests chip alternatively, being placed on after chip package is got well on probe station automatically.It should be noted that this implementation
Example can be directed to different Devices to test selection sorting machines either probe station or other load bearing equipments.
Optionally, the integrated circuit test system includes signal source, and the signal source 80 is connected to the user test
The input terminal of card 60, and be connected with the test system host, the letter of different frequency is exported for controlling the signal source
Number the device under test is tested.The signal source can be intermediate-freuqncy signal source.
Such as：Frequency modulation intermediate frequency integrated circuit LA1235, the frequency to be used is 10.7M or so when test, and general test
The frequency that can be provided of machine is all in 100KHz or less.Intermediate-freuqncy signal source is thus used, frequency modulation intermediate frequency integrated circuit LA1235
It is called with 4 secondary frequencies when test, test condition is respectively：1., frequency modulation rate：10.7M frequency deviation：100K, power：0dB；2., frequency
Rate：10.7M frequency deviation：100K, power：35dB；3., frequency：10.7M frequency deviation：100K, power：70dB；4., frequency：10.7M,
Frequency deviation：100K, power：100dB；From its Pin1 input the signal, and it exports that the voltage of Pin13 can there are one from 0V to 5V
Variation.General chip Chevron Research Company (CRC) is to test by hand, when test in intermediate-freuqncy signal source first with different buttons store more than 4
A different condition, when test, can load these condition tests by these buttons manually, and entire test process is time-consuming and laborious.
And the utility model controls the calling of intermediate-freuqncy signal by software, to realize the automatic test of the kind.
Optionally, the integrated circuit test system includes electronic metering equipment 90, is connected to the user test card
Output end, and be connected with the test system host, the parameter obtained when being tested the device under test for acquiring.
The electronic metering equipment includes at least at least one of：Oscillograph, multimeter and power analyzer.
The electronic metering equipment of the present embodiment includes but not limited to oscillograph, multimeter and power analyzer, signal source and
Electronic metering equipment is connected by general purpose interface bus GPIB with the test system host respectively, also, the signal source
It is connected respectively with the user test card by general purpose interface bus GPIB with the electronic metering equipment.
General purpose interface bus (General-Purpose Interface Bus, GPIB) is that a kind of equipment and computer connect
The bus connect.
Test system host in the present embodiment controls entire test process.It can integrate common test equipment,
Including signal source, oscillograph and High Precision Multimeter etc..
Optionally, the integrated circuit test system further includes：Power supply and alarm module 120, pass through described address data
Bus is connect with the program-controlled voltage current source, for providing voltage to the program-controlled voltage current source.
Optionally, the integrated circuit test system further includes：Arbitrary waveform generator 110 (abbreviation AWG), by described
Address data bus is connected between the kernel control module 20 and output interface module 70, wherein the random waveform hair
Raw device is powered by power supply and alarm module.The integrated circuit test system includes one or more program-controlled voltage current source.
Its instrument used of the system that the utility model is applied is connected simple and at low cost while can be realized and profession
The test effect of instrument identical function.In the case of the single narrow application range of existing test system performance, it is based on test system
Host integrates common test equipment on the market：Signal source, oscillograph, High Precision Multimeter etc. reduce testing cost, are promoted and are surveyed
The technical capability of examination.Meanwhile chip testing or Chevron Research Company (CRC) can directly be tested using idle instrument automatically, it can be with
Testing efficiency is improved, testing cost is reduced.
The above is only the preferred embodiment of the utility model, it is noted that for the common skill of the art
For art personnel, without departing from the principle of this utility model, several improvements and modifications can also be made, these improve and
Retouching also should be regarded as the scope of protection of the utility model.
Claims (10)
1. a kind of integrated circuit test system, which is characterized in that including：
Test system host；
Kernel control module is connected by data connection controller with the test system host；
Program-controlled voltage current source is connected by address data bus with the kernel control module, and output current is used for；
User test card is connected with the program-controlled voltage current source, for storing test parameter and test condition；
Device under test is connected to the output end of the user test card, and is connected with the kernel control module,
Wherein, the test system host is joined by the kernel control module according to the test in the user test card
Number and the test condition execute automatic test to the device under test.
2. integrated circuit test system according to claim 1, which is characterized in that the integrated circuit test system includes
Load bearing equipment is connected to the output end of the user test card, and is connected with the kernel control module, for carrying
Device under test is stated, to execute automatic test to the device under test.
3. integrated circuit test system according to claim 2, which is characterized in that the load bearing equipment include sorting machine or
Person's probe station.
4. integrated circuit test system according to claim 1, which is characterized in that the integrated circuit test system includes
Signal source, the signal source is connected to the input terminal of the user test card, and is connected with the test system host, uses
The device under test is tested in the signal for controlling the signal source output different frequency.
5. integrated circuit test system according to claim 1, which is characterized in that the integrated circuit test system includes
Electronic metering equipment is connected to the output end of the user test card, and is connected with the test system host, for acquiring
The parameter obtained when testing the device under test.
6. integrated circuit test system according to claim 5, which is characterized in that the electronic metering equipment includes at least
At least one of：
Oscillograph, multimeter and power analyzer.
7. integrated circuit test system according to claim 1, which is characterized in that the integrated circuit test system is also wrapped
It includes：
Power supply and alarm module are connect by described address data/address bus with the program-controlled voltage current source, are used for the journey
It controls voltage and current source and electric current is provided.
8. integrated circuit test system according to claim 1, which is characterized in that the integrated circuit test system is also wrapped
It includes：
Arbitrary waveform generator, by described address data/address bus be connected to the kernel control module and output interface module it
Between, wherein the arbitrary waveform generator is powered by power supply and alarm module, and the output interface module connects the user and surveys
Examination card.
9. integrated circuit test system according to claim 1, which is characterized in that the program-controlled voltage current source is more
It is a.
10. integrated circuit test system according to claim 5, which is characterized in that the electronic metering equipment passes through logical
It is connected with interface bus GPIB with the test system host.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721921792.1U CN207799022U (en) | 2017-12-29 | 2017-12-29 | Integrated circuit test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721921792.1U CN207799022U (en) | 2017-12-29 | 2017-12-29 | Integrated circuit test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207799022U true CN207799022U (en) | 2018-08-31 |
Family
ID=63277345
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721921792.1U Active CN207799022U (en) | 2017-12-29 | 2017-12-29 | Integrated circuit test system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110488176A (en) * | 2019-08-02 | 2019-11-22 | 上海芯旺微电子技术有限公司 | A kind of integrated circuit testing plate and its application method |
| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
-
2017
- 2017-12-29 CN CN201721921792.1U patent/CN207799022U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110488176A (en) * | 2019-08-02 | 2019-11-22 | 上海芯旺微电子技术有限公司 | A kind of integrated circuit testing plate and its application method |
| CN114236363A (en) * | 2022-01-04 | 2022-03-25 | 深圳凯瑞通电子有限公司 | Stability testing method and system based on integrated circuit chip |
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