CN207779348U - A kind of big visual field crater surface topography imaging system - Google Patents
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Abstract
The utility model discloses a kind of big visual field crater surface topography imaging systems, system includes synchronous control system, structure light projection system, photoelectric detecting system, photoelectricity door control system and signal processing system, palette sample is projected using the digital micromirror array of hadamard matrix modulation, since initial resolution image, target scene is gradually obtained by low resolution to high-resolution detailed information, for reconstructing final resolution three dimensional images.The present invention has adaptivity to target scene, effectively reduces sampling number, shortens imaging time, is suitable for fast hi-resolution three-dimensional imaging application；Computing cost is reduced, the time needed for reconstruct is reduced.
Description
Technical field
The utility model belongs to laser three-dimensional imaging technical field, especially a kind of big visual field crater surface topography imaging system
System.
Background technology
Currently, traditional 3-D imaging system mainly uses fringe projection method and spot scan method, ([1] is based on orthogonal space item
More resolution three-dimension digital imaging methods of line projection, a kind of 3-D scannings based on TOF camera of CN200410019972.1. [2]
System and scan method, CN201510868410.2.).Wherein, fringe projection method three-dimensional measurement process can be divided into three steps：
It is fringe projection first, computer generates standard sine candy strip and by projector projects to body surface, fringe structure light
The stripe pattern of deformation is collected by camera after body surface is modulated；Followed by phase calculation, from these deforming stripe figures
Phase modulation is calculated as in；It is finally three-dimensional reconstruction, reconstructs the three of body surface from phase modulation by system calibrating
Tie up pattern.Such as：Yang Fu person of outstanding talent et al. ([3] 3D shape measurement of discontinuous objects based
on single frequency fringe projection in 4-step phase shifting profilemetry)
Propose the discontinuous objects 3 D measuring method based on single-frequency four-step phase-shifting fringe projection.Computer generates phase shift first
Step-length is 4 width sine streak images of pi/2, testee surface is projected to using liquid crystal projection apparatus, by CCD camera synchronous acquisition
It obtains the distortion bar graph containing topographical information and preserves in a computer, fringe phase letter is obtained by four-step phase-shifting algorithm
Breath.For the discontinuous object of surface topography, distorted bar graph gray scale arithmetic sum operation and to carry out binary conversion treatment fixed by 4 width
Position shade or dark background, using the phase of bianry image amendment demodulation to obtain correct phase.
Spot scan method measurement process is scanned pixel-by-pixel by laser pulse, obtains the TOF of each pixel to calculate
While obtaining the range information of single pixel, the control of beam direction is realized by scanning means, determines detection for pixel distance
The X deflection angle and pitching deflection angle of point repeat this process to realize the space orientation of single-point to scanning area,
Finally obtain the three-dimensional appearance of entire sampling area.
Due to requiring striped accurate, computational methods complexity causes to rebuild inefficiency above-mentioned fringe projection method, is not suitable for needing
The shortcomings that wanting the occasion of fast imaging, and being easily disturbed keeps it limited in the effect of practical application.Spot scan method is although technology
Maturation calculates simply, but since the sampling time is long, image taking speed is slow, is imaged when acquiring high-definition picture and slowly lacks
Point is particularly evident, therefore is not suitable for fast imaging.
Current surface topography fast imaging method has：AC3DI ([4] Adaptive that Dai Huidong et al. are proposed
compressed 3D imaging based on wavelet trees and Hadamard multiplexing with a
single photon counting detector,arXiv:[1709.05961v1 cs.CV] 15Sep 2017), Sun
Mingjie et al. propose single pixel three-D imaging method (5] Single-pixel three-dimensional imaging
with time-based depth resolution,Nature Communications,2016,7:12010) etc..Due to
AC3DI is imaged using the method for photon counting, and in order to ensure that the when of measuring can receive enough photons, the single measurement time needs foot
It is enough long, thus image taking speed is limited.In addition, the method that document [5] proposes since sampling number is more, causes to sample total time
It is long, it is also difficult to meet the requirement of fast imaging.
Utility model content
The purpose of this utility model is to provide it is a kind of it is simple, reliable, quickly, accurate, high resolution, can be adaptive it is big
Visual field crater surface topography imaging system solves conventional surface pattern imaging method and is limited to calculate complexity, imaging time length
Problem.
Realize that the technical solution of the utility model aim is：A kind of big visual field crater surface topography imaging system, packet
Synchronous control system, structure light projection system, photoelectric detecting system, photoelectricity door control system and signal processing system are included, it is described
Synchronous control system is made of synchronous generator, exports synchronizing signal to Long Pulse LASER light source and short-pulse laser light
Source；
Structure light projection system includes Long Pulse LASER light source, beam splitter, beam expanding lens, Digital Micromirror Device DMD and projection
Lens, Long Pulse LASER light source receive emission pulse laser after synchronizing signal, and pulse laser illuminates DMD after beam expanding lens, warp
The pulse laser for crossing DMD modulation is irradiated to by projecting lens in target scene region；
Photoelectric detecting system includes collecting mirror, spike filter and being cascaded by photoelectricity avalanche diode APD and amplifier
The single pixel detecting module of composition, return laser beam are collected in the case where collecting mirror effect, are detected by single pixel after spike filter
Mould APD detections in the block, transmit a signal to photoelectricity door control system after amplifier；
Photoelectricity door control system includes short-pulse laser, time delay module and photoelectricity gating module, wherein time delay
It is connected by multimode fibre between module and photoelectricity gating module；
Signal processing system is made of capture card and computer PC, and capture card is connect with photoelectricity gating module, PC and acquisition
Card connection.
The utility model compared with prior art, remarkable advantage：(1) it avoids a large amount of needed for the imaging of fringe projection method
Computing cost, while avoiding and needing to accurately control the requirement of beam direction in spot scan formula surface topography scanning system, make to set
It is standby simple reliable, the good feature of stability.(2) it is important adaptively to acquire target scene for the multiresolution wavelet approach method used
Depth information effectively reduces pendulous frequency, shortens imaging time, realizes quick measurement.(3) according to measurement in a closed series original
Reason, is modulated DMD projection patterns with hadamard matrix, increases the signal-to-noise ratio of image, improve the accurate of measurement result
Degree.(4) since the unitary sampling time is short, and without adjusting threshold value, reduce time of measuring.(5) total sampling number is few, calculation amount
Small, total time-consuming is short, therefore is more suitable for fast imaging.(6) sampling time can be adjusted according to target area depth, to target field
Scape has adaptivity, improves collecting efficiency.
The utility model is described in further detail below in conjunction with the accompanying drawings.
Description of the drawings
Fig. 1 is the big visual field crater surface topography imaging system structure total figure of the utility model.
Fig. 2 is the big visual field crater surface topography imaging system images time delay function structure chart of the utility model.
Fig. 3 is the big visual field crater surface topography imaging system images photoelectricity gate function structure chart of the utility model.
Fig. 4 is that the big visual field crater surface topography imaging system images method of the utility model calculates modulation image/intensity map
As flow chart.
Fig. 5 is the big visual field crater surface topography imaging method flow chart of the utility model.
Specific implementation mode
As shown in Figure 1, the big visual field crater surface topography imaging system of the utility model uses photoelectricity avalanche diode sum number
The single pixel camera structure of word micro mirror element combination is imaged crater, obtains the surface topography in crater, including synchronous control system,
Structure light projection system, photoelectric detecting system, photoelectricity door control system and signal processing system.Synchronous control system is by synchronizing letter
Number generator h compositions, export synchronizing signal to Long Pulse LASER light source a and short-pulse laser source i.Structure light projection system packet
It includes Long Pulse LASER light source a, beam expanding lens b, Digital Micromirror Device c (digital micromirror device, DMD) and throws
Shadow lens d.Long Pulse LASER light source receives emission pulse laser after synchronizing signal, and pulse laser illuminates DMD after beam expanding lens.
It is irradiated in target scene region by projecting lens by the DMD pulse lasers modulated.Photoelectric detecting system includes collecting mirror
E, spike filter f and by photoelectricity avalanche diode g (avalanche photodiode, APD) and amplifier cascade constitute
Single pixel detecting module.Return laser beam is collected in the case where collecting mirror effect, by single pixel detecting module after spike filter
In APD detection, photoelectricity door control system is transmitted a signal to after amplifier.Photoelectricity door control system includes short-pulse laser
I, time delay module j and photoelectricity gating module k.Wherein pass through multimode fibre between time delay module and photoelectricity gating module
Connection, internal structure difference are as shown in Figures 2 and 3.Signal processing system is made of capture card l and computer PCm, capture card l
The output waveform of photoelectricity gating module is sampled, PCm handles these sampled values, generates DMD patterns and completes table
Face pattern imaging.
As shown in Fig. 2, the time delay module includes spike filter a2, displacement-reflection microscope group b2, fiber optic collimator mirror
C2, laser-fiber coupler d2, short-pulse laser i launch the short laser that pulsewidth is hundreds of ps after receiving synchronizing signal
Pulse after the spike filter a2 of short laser pulse entry time Postponement module, is displaced by speculum group b2 reflections, by optical fiber
Collimating mirror c2 finally enters optical fiber from laser-fiber coupler d2.Wherein displacement-reflection microscope group b2 is by two sides displacement-reflection microscope group
At can the black arrow direction vertical displacement in Fig. 2 under motor control.
As shown in figure 3, the photoelectricity gating module includes fiberport couplers a3, beam expanding lens b3, photodiode
C3, resistance d3 pass through fiberport couplers after the output light of time delay module enters photoelectricity gating module by optical fiber
A3 is by the laser coupled in optical fiber at laser beam, and laser beam impinges upon after being expanded by beam expanding lens b3 on photodiode c3, photoelectricity two
Pole pipe c3 forms photoelectric door under bias voltage and laser pulse effect, and detector signal enters resistance d3 after photoelectric door,
Finally signal processing system is transmitted to using resistance d3 both end voltage peak values as output valve.
The big visual field crater surface topography imaging system course of work used by the utility model is as follows：
For Polaroid process, it is necessary first to acquire scene under low resolution using hadamard matrix.Then basis
Wavelet coefficient Relationship Prediction simultaneously marks fringe region in scene.Further according to label on fringe region under higher resolution ratio
It samples, and calculates the depth value of each pixel by inverse Hadamard transform.For smooth region, without acquiring again.Meanwhile root
The displacement section of displacement speculum group is redistributed according to the most value in depth value.It repeats prediction and acquires this process again until reaching
Target resolution.The depth image and three-dimensional appearance of scene are finally recovered according to the data of acquisition.
For a sampling process, synchronizing signal, Long Pulse LASER light source and short arteries and veins are first generated by synchronous generator
Impulse radiant while emission pulse laser.Light from Long Pulse LASER light source a enters beam expanding lens b and expands, and it is micro- to illuminate number
Mirror device d planes.According to the modulation pattern that PCm is generated, Digital Micromirror Device d swashs the pulse from Long Pulse LASER light source a
Light carries out spatial modulation, irradiates target scene through projecting lens d.Target scene reflection modulation pulse laser through collecting mirror e and
After spike filter f filters out stray light, continuous echo-signal is obtained by photoelectricity avalanche diode g measurements, and by amplifier
It is amplified to obtain detector signal.
After light entry time Postponement module j from short-pulse laser source a, irradiated in place after spike filter a2
It moves on speculum group b2.Displacement-reflection microscope group can vertically faint displacement be prolonged to change the time in black tip direction along Fig. 2
The light path of laser in slow module j.Laser collects after leaving displacement-reflection microscope group b2 by fiber optic collimator mirror c2, passes through laser-light
Fine coupler d2 enters optical fiber and is transferred to photoelectricity gating module k.The laser transmitted from time delay module j enters photoelectricity gate
After module k, it is coupled as laser beam under the a3 effects of fiberport couplers, and expanded by beam expanding lens b3, is finally radiated at photoelectricity
On diode c3.
When the modulation pulse laser light path phase that the laser pulse light path of short-pulse laser source a transmittings is reflected with target scene
Whens equal, photodiode c3 conductings.Since the laser pulse pulsewidth of short-pulse laser source a transmittings is reflected much smaller than target scene
Modulation pulse, and its light path can be according to the location determination of displacement-reflection microscope group b2, therefore can obtain photodiode c3
The light path of the modulation pulse laser of target scene reflection is corresponded to when conducting.Capture card l is added in electricity when photodiode c3 is connected
The voltage value at the both ends resistance d3 measures to obtain the result of measurement in a closed series under the light path.It is anti-that displacement is varied multiple times under PCm controls
The position for penetrating microscope group is acquired the measurement in a closed series result that can be obtained under different light paths.
PCm obtains each sampled value corresponding flight time by the position of displacement-reflection microscope group.By the sampled value of different TOF
Synthesis obtains TOF histograms.All sampled value ordinates are added to obtain the combination sampled value of intensity image in histogram.Each sampling
Value ordinate and corresponding abscissa are multiplied the combination sampled value of the modulation image for obtaining this projection of summing again.The utility model institute
The big visual field crater surface topography imaging method used recovers target scene three-dimensional information and life according to these measurement results
At the DMD projection patterns of next stage.PCm use software Labview control systems, generate DMD projection patterns, final result by
Matlab is generated.
The utility model uses big visual field crater surface topography imaging method, using hadamard matrix to projection pattern into
Row modulation approaches the depth gradually obtained in target scene using multiresolution wavelet since initial resolution depth image
Image resolution ratio is gradually increased in detailed information, and high resolution graphics is obtained eventually by detailed information and low resolution depth image
Picture is as follows in conjunction with Fig. 5：
The first step, Digital Micromirror Device d use hadamard matrix modulation pattern, are combined measurement to target scene, obtain
To initial resolution depth image.In order to keep system simple, the utility model replaces conventional H-type using S type hadamard matrixs
Hadamard matrix is modulated pattern.H-type hadamard matrix generating mode is：
Wherein：
S types hadamard matrix is made of 0 and 1 element, can be by H-type hadamard matrix transition structure.Remove H-type Hadamard square
Battle array the first row and first row, -1 element in new square formation are replaced with 0 element, you can obtain S type hadamard matrixs.
If initial resolution isAccording to S type hadamard matrix characteristics, last in matrix is needed to arrange later again
Mending 0 vector of a row makes being projected by DMD for matrix, and the pixel number measured every time is (m/2) -1, for each pattern, m
Constant element at a pixel is 0.According to measurement in a closed series principle and S type hadamard matrix characteristics, required DMD modulation patterns are measured
Number is m-1.Also, the flight time discrete signal obtained in each DMD modulation pattern times of integration has recorded each in pattern
Pixel reaches scene and is reflected back the flight time of detector and corresponding intensity.It, can be by Hadamard contravariant after measurement
It changes and finds out modulation image and intensity image, be divided by available depth image by modulation image and intensity image respective pixel, figure
The value of m-th of pixel of picture finally obtains the initial resolution depth of first stage in Fig. 2 by the depth Interpolation of neighborhood pixels
Spend image.
Second step selects the depth map of a upper resolution ratio since depth image has more sparsity in wavelet field
As the foundation as the estimation of current resolution details location of pixels, it is possible to reduce required sampling number.Specifically, first to upper one
The depth image or fringe region of resolution acquisition carry out single layer wavelet decomposition, obtain its matrix of wavelet coefficients and (generate and indicate to work as
The label matrix of preceding resolution ratio sampling location).The wavelet coefficient of the wherein detailed information such as correspondence image edge, texture is referred to as important
The absolute value of wavelet coefficient, these coefficients is larger compared to smooth region, only accounts in natural image matrix of wavelet coefficients seldom one
Point.Using a small amount of significant wavelet coefficients can under the premise of not changing visual effect reconstruction image.It is small according to a upper resolution ratio
The relationship of wave system number and threshold value can estimate the location of pixels of significant coefficient under current resolution, i.e. edge labelling area in Fig. 2
Domain.
The selection of wherein estimation procedure and threshold value is as follows：After upper depth of resolution image single layer wavelet decomposition, gained
Matrix of wavelet coefficients be divided into low frequency sub-band (LL), vertical high frequency subband (LH), horizontal high-frequent subband (HL), diagonal high-frequency sub-band
(HH).According to Weber('s)law, if
Then brain can experience the variation of the stimulation.K is weber fraction in formula, and I is primitive stimulus intensity, and Δ I is
Stimulate changing value.Therefore, by weber constant keyeAs threshold value, whenAbsolute value be more than weber constant
keyeWhen, then the corresponding position of the coefficient appears to be marginal position in human eye.WhenLess than weber constant keyeWhen, ifMeet its absolute value and is more than keye, then the pixel of corresponding position
It is marginal position.
Third walks, and PC generates DMD modulation patterns, specific side according to second step estimated result, in conjunction with S type hadamard matrixs
Method is as follows：
If by the depth map D of a upper resolution ratio1The obtained material particular location of pixels matrix of wavelet decomposition result is M
(n).The position that matrix intermediate value is 1 indicates that the position is image detail, needs to be acquired again；The position that value is 0 indicates the position
It sets and is in smooth region, without acquiring again.If it is M ' to need the pixel position matrix acquired under current resolution m × m
(n), then there are following relationships by M (n) and M ' (n)：
M'=U (M)
Wherein,It is Kronecker product operation.
After obtaining location matrix M ' (n) through the above steps, you can in current resolution to the k pixel positions containing details
Sampling is set, k should meetFirstly generate L rank S type hadamard matrixs HL, and matrix HLIn -1 conversion
It is 0, whereinThen according to M ' (n) to matrix HLIt is k × m's to be rearranged into a size in order line by line
The perception matrix H measured for the current generationj, then H be represented by：
Wherein, there are following relationships by x, y and n：
X=[n/m]+1
Y=n mod m
Matrix HjEvery a line take out and be rearranged to the matrix of m × m size after, as DMD next stages sample
Projection pattern.
4th step, single pixel detecting module measures the DMD projection patterns being reflected, and measurement result is output to
Photoelectric detection module, capture card export photoelectric detection module and sample.In sampling process, displacement-reflection microscope group is repeatedly moved
It is dynamic, a series of sampled values finally can be obtained.PC can calculate TOF according to sampled value, to rebuild depth image, mistake by TOF
Journey is as shown in figure 4, the specific method is as follows：
In sampling process, synchronous control system h can generate identical according to total mobile number of displacement-reflection microscope group b2
The lock-out pulse of quantity.A lock-out pulse is often generated, capture card l will obtain a sampled value, simultaneous displacement speculum group
B2 generates the displacement of a step-length.This process is repeated until generating quantity identical as total movement number of displacement-reflection microscope group b2
Lock-out pulse, TOF histograms are finally obtained according to each sampled value and corresponding time.By each point ordinate phase in TOF histograms
Add, finally obtains the intensity image vector Y of the expression current generation measurement result of M × 1I：
X in formulaIIndicate that size is the intensity image of the vectorization of N × 1.hmnIt is calculation matrix HjThe member that m rows n-th arrange
Element indicates the state (' 0 ' or ' 1 ') of DMD corresponding templates corresponding positions.ηmnIt is when being measured using m-th of template, to reach on DMD
Nth pixel incidence scene, the laser intensity of the arrival detector after scene reflectivity.
Because being non-linear relation between depth image and measurement result, the concept for introducing modulation image is needed, it will
Depth image is associated with intensity image.Modulation image XQBy intensity image XIWith depth image XDCorresponding element is multiplied to obtain, and indicates
The modulation image vector Y at edgeQFlight time when can then be acquired by measuring is come to depth progress line acquisition, expression
Formula is：
XQIt is the modulation image vector of N × 1, TmnIt it is the flight time, C is a constant, when for characterizing flight
Between be transformed into the ratio of depth.The then intensity image of marginal informationIt can be by YIInverse Hadamard transform is done to be restored
Out.Then, the edge strength image for sampling and recovering by being incorporated in the current generationWith it is strong what is obtained on last stage
Spend image XIAfter can be obtained the sampling of jth stage, the intensity image X under corresponding resolution ratioI, i.e.,：
Similarly, the method for restoring depth image is：
XD=Nz (a) iH (YQ)·/iH(YI)+U(X′D)·(1-M)
Above formula Nz (a) is 01 matrixes, for iH (YI) in value be 0 position, Nz (a) corresponding positions be 0, it is no
Be then 1 the case where (in order to avoid denominator being 0 occur).X′DFor the depth image acquired on last stage, XDAs recover
Current generation depth image, such as the depth image in second and third stage in Fig. 2.Meanwhile according in current generation depth image most
Big value and minimum value, calculate the shift number i needed for next stage displacement-reflection microscope group：
X in formulaDmaxFor depth image maximum value, XDminFor depth image minimum value, step is displacement-reflection microscope group step-length.
5th step repeats second step to the 4th step, obtains higher resolution depth image, deep until obtaining final resolution ratio
Spend image.Finally, PC generates crater surface topography threedimensional model using software matlab according to depth image, i.e. and three in Fig. 5
Tie up pattern.
The Long Pulse LASER light source and short-pulse laser source frequency of imaging system described in the utility model are 40MHz,
Long Pulse LASER light source pulsewidth is 10ns, and short-pulse laser source pulsewidth is 300ps.DMD used is 4.2 systems of Vialux ALP
Row have 1024 × 768 resolution ratio and 4G on piece memories, and micro mirror highest toggle frequency is about 22.7kHz.It projecting lens and collects
Mirror selects 50mm and 35mm Nikon standard lens respectively.The DET-100A silicon biasing detection that single pixel detector selects Soret rich
Device.Spike filter is 10nm through wavelength width.
Claims (3)
1. a kind of big visual field crater surface topography imaging system, it is characterised in that including synchronous control system, structured light projection system
System, photoelectric detecting system, photoelectricity door control system and signal processing system, the synchronous control system is by synchronous generator
(h) it forms, exports synchronizing signal to Long Pulse LASER light source (a) and short-pulse laser source (i)；
Structure light projection system includes Long Pulse LASER light source (a), beam splitter (b), beam expanding lens (c), Digital Micromirror Device DMD
(d) and projecting lens (e), Long Pulse LASER light source (a) receive emission pulse laser after synchronizing signal, and pulse laser is by expanding
DMD (d) is illuminated after mirror (c), and target scene region is irradiated to by projecting lens (e) by DMD (d) pulse lasers modulated
It is interior；
Photoelectric detecting system includes collecting mirror (f), spike filter (g) and by photoelectricity avalanche diode APD (h) and amplifier
The single pixel detecting module constituted is cascaded, return laser beam is collected in the case where collecting mirror (f) effect, the quilt after spike filter (g)
APD (h) detections in single pixel detecting module, transmit a signal to photoelectricity door control system after amplifier；
Photoelectricity door control system includes short-pulse laser (i), time delay module (j) and photoelectricity gating module (k), wherein time
It is connected by multimode fibre between Postponement module (j) and photoelectricity gating module (k)；
Signal processing system is made of capture card (l) and computer PC (m), and capture card (l) is connect with photoelectricity gating module (k),
PC (m) is connect with capture card (l).
2. big visual field crater surface topography imaging system according to claim 1, it is characterised in that the time delay
Module includes spike filter (a2), displacement-reflection microscope group (b2), fiber optic collimator mirror (c2), laser-fiber coupler (d2), short
Pulse laser (i) receives the short laser pulse for launching that pulsewidth is hundreds of ps after synchronizing signal, and short laser pulse is into fashionable
Between Postponement module spike filter (a2) after, be displaced by speculum group (b2) reflection, by fiber optic collimator mirror (c2), finally from
Laser-fiber coupler (d2) enters optical fiber.
3. big visual field crater surface topography imaging system according to claim 1 or 2, it is characterised in that the photoelectric door
It includes fiberport couplers (a3), beam expanding lens (b3), photodiode (c3), resistance (d3), time delay module to control module
Output light photoelectricity gating module is entered by optical fiber after, by fiberport couplers (a3) by the laser coupled in optical fiber
At laser beam, laser beam impinges upon after being expanded by beam expanding lens (b3) on photodiode (c3), and photodiode (c3) is in biased electrical
Photoelectric door is formed under pressure and laser pulse effect, detector signal enters resistance (d3) after photoelectric door, finally by resistance
(d3) both end voltage peak value is transmitted to signal processing system as output valve.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108007385A (en) * | 2017-12-31 | 2018-05-08 | 中国人民解放军陆军工程大学 | A kind of big visual field crater surface topography imaging system and method |
| CN108881732A (en) * | 2018-08-29 | 2018-11-23 | 哈尔滨工业大学（深圳） | Single pixel camera high-quality video imaging system based on double Scale Matrixes algorithms |
| WO2022110947A1 (en) * | 2020-11-25 | 2022-06-02 | Oppo广东移动通信有限公司 | Control method for electronic device, electronic device, and computer-readable storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108007385A (en) * | 2017-12-31 | 2018-05-08 | 中国人民解放军陆军工程大学 | A kind of big visual field crater surface topography imaging system and method |
| CN108007385B (en) * | 2017-12-31 | 2023-11-14 | 中国人民解放军陆军工程大学 | Large-view-field pit surface morphology imaging system and method |
| CN108881732A (en) * | 2018-08-29 | 2018-11-23 | 哈尔滨工业大学（深圳） | Single pixel camera high-quality video imaging system based on double Scale Matrixes algorithms |
| WO2022110947A1 (en) * | 2020-11-25 | 2022-06-02 | Oppo广东移动通信有限公司 | Control method for electronic device, electronic device, and computer-readable storage medium |
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Inventor after: Qiu Yanyu Inventor after: Wang Mingyang Inventor after: Li Jie Inventor after: Song Chunming Inventor after: Cheng Yihao Inventor after: Li Gan Inventor after: Zhao Zhangyong Inventor after: Zhang Zhongwei Inventor before: Qiu Yanyu Inventor before: Zhang Zhongwei Inventor before: Wang Mingyang Inventor before: Li Haibo Inventor before: Deng Guoqiang Inventor before: Li Jie Inventor before: Song Chunming Inventor before: Cheng Yihao Inventor before: Li Gan Inventor before: Zhao Zhangyong |