CN207650285U - Electronic component low temperature electrical performance testing device - Google Patents
Electronic component low temperature electrical performance testing device Download PDFInfo
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- CN207650285U CN207650285U CN201721350534.2U CN201721350534U CN207650285U CN 207650285 U CN207650285 U CN 207650285U CN 201721350534 U CN201721350534 U CN 201721350534U CN 207650285 U CN207650285 U CN 207650285U
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Abstract
The utility model discloses a kind of electronic component low temperature electrical performance testing devices, including：Low-temperature test bar, is equipped with away spool, walks and is equipped with seal assembly among spool；Measuring circuit device one end sets electronic component attachment device to be measured, the other end sets measuring instrument connector, electronic component attachment device to be measured is located at low-temperature test bar bottom end, measuring instrument connector is located at low-temperature test bar top, electronic component attachment device to be measured is electrically connected with measuring instrument connector through being threaded through the cable of low-temperature test bar walked in spool, and electronic component attachment device to be measured is equipped with the interface for connecting electronic component to be measured；Measuring instrument is electrically connected with the measuring instrument connector for being located at low-temperature test bar top.Not only wiring is simple for the test device, is fixed convenient for electronic component to be measured, also can guarantee that tie point is more firm, is also convenient for the sealing of test liquid nitrogen low temperature environment and being isolated for test lead and test equipment connecting pin, ensures test effect, promotion testing efficiency.
Description
Technical field
The utility model is related to electronic component electrical performance testing field more particularly to a kind of electronic component low temperature electrics
Learn performance testing device.
Background technology
In PRODUCTION TRAITS, it is often necessary to measure the electrology characteristic of some electronic components under extremely low temperature, test device external demand
Want external various test equipments (such as voltage source, current source, signal source, multimeter, characteristic of semiconductor tester).Test device
It is connected with element under test by enameled wire etc., carries out the performance test of component, obtains resistance, capacitance, element under cryogenic conditions
The electric properties such as characteristic curve.
That there are wiring is complicated for above-mentioned this existing test device, element under test is not fixed easily, measurement process is cumbersome, signal
The problems such as transmission loss, rosin joint sealing, a kind of low temperature is described in the patent application of Chinese Patent Application No. CN104820116A
It is good to ensure that electrode contacts using shrapnel and bolt, uses winding displacement for lower measurement semiconductor devices attachment device and measurement method
It is attached.But this test device is not directed to sealing problem, need to individually process attachment device and fine structure and need to have one
Fixed experience is operated.
Utility model content
Based on the problems of prior art, the purpose of this utility model is to provide a kind of electronic component low temperature electricity
Performance testing device can solve the problems, such as existing electronic component to be measured and test equipment bad connection, reduce in test process
Welding frequency, avoid high frequency from replacing electronic component to be measured, improve the efficiency to be measured of tester, reduce the work of low-temperature test
Make difficulty and requirement.
The purpose of this utility model is achieved through the following technical solutions：
The utility model embodiment provides a kind of electronic component low temperature electrical performance testing device, including：
Low-temperature test bar, measuring circuit device and measuring instrument；Wherein,
The low-temperature test bar, is equipped with away spool, it is described walk spool intermediate position be equipped with seal assembly；
Measuring circuit device one end is equipped with electronic component attachment device to be measured, and the other end is connected equipped with measuring instrument
Head, the electronic component attachment device to be measured are located at the bottom end of the low-temperature test bar, and the measuring instrument connector is located at
The top of the low-temperature test bar, the electronic component attachment device to be measured are described low through being threaded through with measuring instrument connector
The cable electrical connection of warm reference test bar walked in spool, the electronic component attachment device to be measured, which is equipped with, connects electronics member to be measured
The interface of device；
The measuring instrument is located at the measuring instrument connector on low-temperature test bar top with the measuring circuit device
Electrical connection.
The electronics member device that the utility model embodiment provides it can be seen from above-mentioned technical solution provided by the utility model
Part low temperature electrical performance testing device, advantage are：
By the low-temperature test bar for being provided with away spool and seal assembly so that the electronics to be measured member of measuring circuit device
Device attachment device and measuring instrument connector can set up separately at low-temperature test bar both ends, and the connection cables of the two are threaded through away spool
Interior, not only wiring is simple, is convenient for the fixation of electronic component to be measured, also can guarantee that tie point is more firm, has been also convenient for test fluid
The sealing of nitrogen low temperature environment and test lead are isolated with test equipment connecting pin, are ensured test effect, are promoted testing efficiency.
Description of the drawings
It is required in being described below to embodiment in order to illustrate more clearly of the technical solution of the utility model embodiment
The attached drawing used is briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the utility model
Example, for those of ordinary skill in the art for, without creative efforts, can also be according to these attached drawings
Obtain other accompanying drawings.
Fig. 1 is the structural schematic diagram of the low-temperature test bar for the test device that the utility model embodiment provides；
Fig. 2 is the structural schematic diagram of the IC locking beds for the test device that the utility model embodiment provides；
Fig. 3 is the side structure schematic view of the IC locking beds for the test device that the utility model embodiment provides；
In figure：1- tank walls；2- walks spool；3- case lids；4- sealing-plugs；5- pressing sleeves.
Specific implementation mode
With reference to the particular content of the utility model, to the technical scheme in the embodiment of the utility model carry out it is clear,
It is fully described by, it is clear that the described embodiments are only a part of the embodiments of the utility model, rather than whole implementation
Example.Based on the embodiments of the present invention, those of ordinary skill in the art are obtained without making creative work
Every other embodiment, belong to the scope of protection of the utility model.It is not described in detail in the utility model embodiment
Content belongs to the prior art well known to professional and technical personnel in the field.
As shown in Figures 1 to 3, the utility model embodiment provides a kind of electronic component low temperature electrical performance testing device,
The electric property that electronic component can conveniently be measured at low temperature, solves the connection of existing electronic component to be measured and test equipment
Bad problem reduces the welding frequency in test process, avoids high frequency from replacing electronic component to be measured, improves waiting for for tester
Efficiency is surveyed, work difficulty and the requirement of low-temperature test are reduced, including：
Low-temperature test bar, measuring circuit device and measuring instrument；Wherein,
Low-temperature test bar, is equipped with away spool, and the intermediate position for walking spool is equipped with seal assembly；
Measuring circuit device one end is equipped with electronic component attachment device to be measured, and the other end is equipped with measuring instrument connector,
Electronic component attachment device to be measured is located at the bottom end of low-temperature test bar, and measuring instrument connector is located at the top of low-temperature test bar
End, electronic component attachment device to be measured and the cable walked spool in of the measuring instrument connector through being threaded through low-temperature test bar are electric
Gas connects, and electronic component attachment device to be measured is equipped with the interface for connecting electronic component to be measured；
Measuring instrument, the measuring instrument connector that low-temperature test bar top is located at measuring circuit device are electrically connected.
In above-mentioned test device, cable both ends pass through respectively with electronic component attachment device to be measured and measuring instrument connector
It is welded and fixed electrical connection.
In above-mentioned test device, low-temperature test bar includes：
Top canister walks spool and seal assembly；Wherein,
Top canister is formed by connecting by four tank walls and two case lids, and two case lids are equipped with setting measuring instrument connector
Several holes；The bottom of tank wall is equipped with the interface for being tightly connected spool；
Interface of the cabling tube top end through tank wall bottom is tightly connected with tank wall；
Seal assembly is made of pressing sleeve and sealing-plug and the rubber ring being located between the two, is adopted between pressing sleeve and sealing-plug
It is threadedly coupled.
In above-mentioned test device, tank wall and the case lid of top canister are all made of corrosion-resistant, low temperature resistant metal alloy and are made
Tank wall and case lid；
Sealing-plug is using sealing-plug made of low-temperature resistant plastic, and outer diameter matches with Dewar tank tank mouth bore；
It is using pipeline made of corrosion-resistant, low temperature resistant metal alloy to walk spool；
Pressing sleeve is using pressing sleeve made of corrosion-resistant, low temperature resistant metal alloy.
In above-mentioned test device, in measuring circuit device,
Electronic component attachment device to be measured is made of IC locking beds and pinboard；
Measuring instrument connector uses BNC females；
Cable uses enameled wire and BNC cables.
In above-mentioned test device, measuring instrument connector further includes：BNC turns banana head.
In above-mentioned test device, measuring instrument includes：
It various measuring instrumentss and is electrically connected with each measuring instrument, controls the operation labview control system of each measuring instrumentss
The computer of system.
In above-mentioned test device, various measuring instrumentss include：One kind in signal source, oscillograph, ammeter, multimeter or
It is a variety of.
The utility model embodiment also provides a kind of electronic component low temperature electrical performance test method, which is characterized in that
Using above-mentioned test device, include the following steps：
Electronic component to be measured is connected to the electronic component attachment device to be measured of the measuring circuit device of test device
On；
The electronic component attachment device to be measured of the low-temperature test bar bottom end of test device and electronic component to be measured are put
Enter in the Dewar tank equipped with liquid nitrogen, Dewar tank tank mouth is sealed by the seal assembly of low-temperature test bar, and by seal assembly
Support keeps low-temperature test bar upright state to be located in Dewar tank tank mouth；
The measuring instrument connector on low-temperature test bar top and measuring instrument are electrically connected, measuring instrument and electricity to be measured are made
Sub- component electrical connection, surveys the electric parameter of the electronic component to be measured under liquid nitrogen cryogenics environment by measuring instrument
Amount, determines the low temperature electric property of electronic component to be measured.
The test device of the utility model is by being provided with away the low-temperature test bar of spool and seal assembly so that measures
The electronic component attachment device to be measured and measuring instrument connector of circuit device can set up separately at low-temperature test bar both ends, the two
Connection cables are threaded through away in spool, and not only wiring is simple, are convenient for the fixation of electronic component to be measured, also be can guarantee tie point more
It is firm, it has been also convenient for the sealing of test liquid nitrogen low temperature environment and being isolated for test lead and test equipment connecting pin, has ensured to test
Effect promotes testing efficiency.
The utility model embodiment is specifically described in further detail below.
As shown in Figures 1 to 3, the present embodiment provides the test device that electronic component electric property is measured under a kind of low temperature, packets
It includes：Low-temperature test bar, measuring circuit device and test equipment；Wherein, electronic component to be measured is put into low-temperature test bar lower end
Measuring circuit device IC locking beds, test equipment passes through the survey of the measuring circuit device on BNC cables and low-temperature test bar
Test instrument connector connects, and realizes the interconnection of electronic component and test equipment to be measured, and can environment to be measured be put into liquid nitrogen
Environment, it is external that the control test equipment completion measurement of labview control systems is run by PC machine.
In above-mentioned test device, low-temperature test bar includes：Walk spool, pressing sleeve, sealing-plug and top canister；Wherein, cabling
Pipe, pressing sleeve play the role of support connection and place enameled wire, and the metal alloy that use is corrosion-resistant, low temperature resistant makes, such as 304
Stainless steel alloy, aluminium alloy.
Sealing-plug is made according to Dewar tank opening bore using low-temperature resistant plastic, such as polytetrafluoroethylene (PTFE), sealing-plug and pressure
Set uses thread connection.
The top canister of low-temperature test bar is made of tank wall case lid, and the metal alloy that use is corrosion-resistant, low temperature resistant makes.Case
There are screw hole, two case lids can place multiple females there are the hole for placing BNC females for wall case lid fixed position.Tank wall bottom
There are cabling interface tubes in portion.
The measuring circuit device includes：IC locking beds, pinboard, BNC females, enameled wire, BNC cables and BNC turn perfume
Any of several broadleaf plants head, wherein IC locking beds can be one or more.
The test equipment includes：Various measuring instrumentss and the PC machine operation labview controls system for controlling each measuring instrumentss
System carries out power supply supply, signal input and digital independent processing.
Specifically, in above-mentioned test device, low-temperature test rod structure is concordantly put into case as shown in Figure 1,2 one end of spool will be walked
Wall 1 is reserved aperture and is welded so that tank wall 1 is tightly connected with spool 2 is walked；Pressing sleeve 5, sealing-plug 4 are from walking 2 another end cap of spool
Enter, a sizeable rubber ring is placed between pressing sleeve 5 and sealing-plug 4, sealing fixed function is played, by pressing sleeve 5, rubber
Circle and sealing-plug 4 are pushed to suitable position on walking spool 2 and are assembled.BNC females are placed on the hole that case lid 3 is reserved,
BNC females are numbered；More enameled wires are penetrated into away spool 2, enameled wire one end is welded with BNC female binding posts, enamel-cover
The line other end is pierced by walking 2 lower part of spool, pin welding corresponding with IC locking beds, realize Unified number BNC females and
IC locking bed pins interconnect, and the tank wall 1 of top canister and case lid 3 are screwed.
Electronic component to be measured can be directly placed on IC locking beds, such as the component of dual-in-line package, straight cutting
Formula resistance etc. places it in fixed on IC locking beds；Record each pin of electronic component to be measured and IC locking bed pins
The connection relation of (BNC females).
IC locking beds and low-temperature test bar bottom are put into liquid nitrogen environment, sealing-plug 4 is put into Dewar tank tank mouth and is sealed,
5 component of pressing sleeve contacts at the top of tank mouth simultaneously, plays the role of sealing support, keeps low-temperature test bar upright state.
BNC cables one end is connected, such as the instruments such as signal source, oscillograph, ammeter, multimeter with measuring instrument, is believed
The connection of BNC cables can be used directly in number source oscillograph etc., and the equipment such as ammeter multimeter can not be directly connected to, and can use BNC
Turn banana head to be attached；The other end is connected needed for corresponding BNC females, realizes test equipment and electronic component to be measured
The interconnection of each pin.
After electronic component cools down at low ambient temperatures, measured using test equipment.
Power supply supply is carried out using labview programmed controller devices in PC machine, signal input, measures and reads data etc..
Electronic component to be measured can not be directly placed on IC locking beds, such as first device that paster type encapsulation, PLCC are encapsulated
Component is welded on pinboard by part, and then pinboard is fixed on IC locking beds, and it is each to record electronic component to be measured
The connection relation of pin and IC locking beds pin (BNC females).Test method has been described in detail above, no longer superfluous here
It states.
In above-mentioned test device, in sealing-plug and walk between spool there are certain gap, also there are skies on top canister
Gap is convenient for the discharge of nitrogen so that Dewar tank internal pressure is not excessively high, ensures the personal safety of tester.Low temperature when test
The exposed aerial portion temperature of reference test bar within the scope of human body receives, accidentally touch and will not cause to freeze by tester's short time
Wound.
In the component for measuring multiple less pins, it can be placed on IC locking beds simultaneously, record pin and BNC
The correspondence of female；It, can be in the external connection for replacing BNC cables, without retrieving IC lockings when needing to change testing element
Seat, improves the working efficiency of tester, reduces the loss of the energy, while ensure that the consistent of low-temperature test environment.
Outside uses BNC coaxial cables, reduces signal transmission attenuation and interference.
The test device has certain scalability, can increase or decrease the quantity and IC locks of BNC females on demand
The pin number of tight seat.When such as needing the more electronic component of test pin number, it can be made on top canister corresponding
Bnc interface, cabling bottom of the tube arrange additional IC locking beds, realize Function Extension.
The various measuring instrumentss of measuring instrument use the labview control systems that computer is run, and may be implemented remotely to control
System.Labview control systems can very easily increase and decrease instrument control procedure, and changeable tester is realized convenient for tester
It draws.
The preferable specific implementation mode of the above, only the utility model, but the scope of protection of the utility model is not
It is confined to this, any one skilled in the art can readily occur in the technical scope that the utility model discloses
Change or replacement, should be covered within the scope of the utility model.Therefore, the scope of protection of the utility model should
Subject to the scope of protection of the claims.
Claims (8)
1. a kind of electronic component low temperature electrical performance testing device, which is characterized in that including：
Low-temperature test bar, measuring circuit device and measuring instrument；Wherein,
The low-temperature test bar, is equipped with away spool, it is described walk spool intermediate position be equipped with seal assembly；
Measuring circuit device one end is equipped with electronic component attachment device to be measured, and the other end is equipped with measuring instrument connector,
The electronic component attachment device to be measured is located at the bottom end of the low-temperature test bar, and the measuring instrument connector is located at described
The top of low-temperature test bar, the electronic component attachment device to be measured are surveyed with measuring instrument connector through being threaded through the low temperature
The cable electrical connection of test bar walked in spool, the electronic component attachment device to be measured, which is equipped with, connects electronic component to be measured
Interface；
The measuring instrument, the measuring instrument connector that low-temperature test bar top is located at the measuring circuit device are electrical
Connection.
2. electronic component low temperature electrical performance testing device according to claim 1, which is characterized in that the cable two
Distinguish welded holding electrical with electronic component attachment device to be measured and measuring instrument connector and connect in end.
3. electronic component low temperature electrical performance testing device according to claim 1, which is characterized in that the low temperature is surveyed
Test bar includes：
Top canister, it is described walk spool and the seal assembly；Wherein,
The top canister is formed by connecting by four tank walls and two case lids, and described two case lids, which are equipped with, is arranged the measuring instrument
Several holes of connector；The bottom of the tank wall is equipped with the interface that spool is walked described in sealed connection；
Interface of the cabling tube top end through the tank wall bottom is tightly connected with the tank wall；
The seal assembly is made of pressing sleeve and sealing-plug and the rubber ring being located between the two, is adopted between pressing sleeve and sealing-plug
It is threadedly coupled.
4. electronic component low temperature electrical performance testing device according to claim 3, which is characterized in that
The tank wall of the top canister is all made of tank wall and case lid made of corrosion-resistant, low temperature resistant metal alloy with case lid；
The sealing-plug is using sealing-plug made of low-temperature resistant plastic, and outer diameter matches with Dewar tank tank mouth bore；
It is described walk spool be using pipeline made of corrosion-resistant, low temperature resistant metal alloy；
The pressing sleeve is using pressing sleeve made of corrosion-resistant, low temperature resistant metal alloy.
5. electronic component low temperature electrical performance testing device according to any one of claims 1 to 3, which is characterized in that
In the measuring circuit device,
The electronic component attachment device to be measured is made of IC locking beds and pinboard；
The measuring instrument connector uses BNC females；
The cable uses enameled wire and BNC cables.
6. electronic component low temperature electrical performance testing device according to claim 5, which is characterized in that the measuring instrument
Device connector further includes：BNC turns banana head.
7. electronic component low temperature electrical performance testing device according to any one of claims 1 to 3, which is characterized in that
The measuring instrument includes：
It various measuring instrumentss and is electrically connected with each measuring instrument, controls the operation labview control systems of each measuring instrumentss
Computer.
8. electronic component low temperature electrical performance testing device according to claim 7, which is characterized in that the various surveys
Measuring instrument includes：It is one or more in signal source, oscillograph, ammeter, multimeter.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201721350534.2U CN207650285U (en) | 2017-10-19 | 2017-10-19 | Electronic component low temperature electrical performance testing device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201721350534.2U CN207650285U (en) | 2017-10-19 | 2017-10-19 | Electronic component low temperature electrical performance testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107589333A (en) * | 2017-10-19 | 2018-01-16 | 中国科学技术大学 | Electronic component low temperature electrical performance testing device and method |
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2017
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107589333A (en) * | 2017-10-19 | 2018-01-16 | 中国科学技术大学 | Electronic component low temperature electrical performance testing device and method |
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