CN207586370U - Fingerprint chip test system based on chroma3360P - Google Patents
Fingerprint chip test system based on chroma3360P Download PDFInfo
- Publication number
- CN207586370U CN207586370U CN201721682663.1U CN201721682663U CN207586370U CN 207586370 U CN207586370 U CN 207586370U CN 201721682663 U CN201721682663 U CN 201721682663U CN 207586370 U CN207586370 U CN 207586370U
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- China
- Prior art keywords
- test
- test device
- chip
- computer
- fingerprint chip
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses the fingerprint chip test systems based on Chroma3360P,Including test device,Display computer is provided at the top of the test device,The test device is internally provided with test box,Translucent cover is provided on the outside of the test box,The bottom of the test device is provided with test device under casing,The bottom of the test device under casing is provided with anti-skidding pillar,Universal wheel is provided on the inside of the anti-skidding pillar,The surface of the test device is provided with starting switch,Connection button is provided at the top of the starting switch,The protection shroud is internally provided with indicator light,So as to make the parameters of each chip normal and the consistency adjustment of each parameter is to optimal,Show that computer can be secured firmly to by spring hitch in the groove at the top of test device simultaneously,Anti-slip rubber layer inside machinery folder can play the role of protecting chip while preventing chip from sliding.
Description
Technical field
The utility model belongs to fingerprint chip test system technical field, and in particular to the fingerprint based on Chroma3360P
Chip test system.
Background technology
Fingerprint chip test system mainly provides testing service for fingerprint chip, and test machine and test circuit pass through DUT
Chip to be measured is connected to, it can be achieved that test to multiple chips, after test machine connects manipulator, fingerprint chip can be carried out from
Dynamicization volume production is tested, and test result test machine tested after electrical parameter preserves, while by the defective products in chip
It screens, defective products is recorded, and shown in MAP chart at this end of manipulator.Chroma3360P tests system energy
High-accuracy voltage, electric current are enough provided, and measurement function is provided, high-frequency digital signal excitation can be also provided.
Existing fingerprint apparatus for testing chip the parameters of each chip can not be made normal and each parameter it is consistent
Property be adjusted to optimal, display computer is placed on the top of test device, and fixation is insecure, it is likely that slides damage, indicates simultaneously
Lamp is collided due to being fixed by connecting rod and is likely to fracture or slide damage, and machinery folder is internal due to being metal construction, can
The breakage of chip can be caused when gripping chip, while also without non-skid feature fixed chip, chip may be out of machinery folder
The problem of portion slides, thus it is proposed that the fingerprint chip test system based on Chroma3360P.
Utility model content
It is above-mentioned to solve the purpose of this utility model is to provide the fingerprint chip test system based on Chroma3360P
The parameters of each chip can not be made normal for the existing fingerprint apparatus for testing chip proposed in background technology and each ginseng
For several consistency adjustments to optimal, display computer is placed on the top of test device, and fixation is insecure, it is likely that damage is slid,
Indicator light is collided due to being fixed by connecting rod and is likely to fracture or slide damage simultaneously, and machinery folder is internal due to being gold
Belong to construction, the breakage of chip may be caused when gripping chip, while also without non-skid feature fixed chip, chip may slave
The problem of inside of tool folder slides.
To achieve the above object, the utility model provides following technical solution：Fingerprint chip based on Chroma3360P is surveyed
Test system including test device, is provided with display computer at the top of the test device, the test device is internally provided with
Test box is provided with translucent cover on the outside of the test box, and the bottom of the test device is provided with test device under casing, described
The bottom of test device under casing is provided with anti-skidding pillar, and universal wheel, the test device are provided on the inside of the anti-skidding pillar
Surface be provided with starting switch, be provided with connection button at the top of the starting switch, the side setting of the display computer
There is protection shroud, the protection shroud is internally provided with indicator light, and the test box is internally provided with non-defective unit placement plate, institute
The side for stating non-defective unit placement plate is provided with defective products placement plate, and the side of the defective products placement plate is provided with manipulator, described
One end of manipulator is provided with mechanical folder, and the side of the manipulator is provided with test DUT, the side setting of the test DUT
There is test machine, the upper surface of the test device is provided with computer placing groove, spring is provided on the outside of the computer placing groove
Bolt, the outside of the machinery folder are provided with anti-slip rubber layer.
Preferably, the machinery folder is fixedly connected with anti-slip rubber layer by chimeric mode.
Preferably, the display computer is fixed with test device by computer placing groove with spring hitch connect.
Preferably, the test device is fixedly connected with protection shroud by way of welding and moulding.
Preferably, the protection shroud is a kind of round envelope surface structure.
Compared with prior art, the beneficial effects of the utility model are：The actual working environment of analog chip, to chip
DC parameter and alternating-current parameter are tested, so as to make the parameters of each chip normal and the consistency tune of each parameter
It is whole while to show that computer is secured firmly to by spring hitch in the groove at the top of test device to optimal, avoid computer
Landing, and have envelope surface protection on the outside of indicator light, prevent connecting rod from fractureing or sliding, the anti-slip rubber layer inside machinery folder
It can play the role of protecting chip while preventing chip from sliding.
Description of the drawings
Fig. 1 is the test device positive structure schematic of the utility model；
Fig. 2 is the test box inside top structure diagram of the utility model；
Fig. 3 is the test device overlooking the structure diagram of the utility model；
Fig. 4 is the machinery folder layered structure schematic diagram of the utility model；
In figure：1- shows computer, 2- translucent covers, 3- test boxs, 4- test devices, 5- test devices under casing, 6- anti-skid supports
Column, 7- universal wheels, 8- starting switches, 9- connections button, 10- protection shroud, 11- indicator lights, 12- machineries folder, 13- non-defective units are placed
Plate, 14- defective products placement plate, 15- manipulators, 16- test machines, 17- test DUT, 18- computers placing groove, 19- spring hitch, 20-
Anti-slip rubber layer.
Specific embodiment
The following is a combination of the drawings in the embodiments of the present utility model, and the technical scheme in the embodiment of the utility model is carried out
It clearly and completely describes, it is clear that the described embodiments are only a part of the embodiments of the utility model rather than whole
Embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are without making creative work
All other embodiments obtained shall fall within the protection scope of the present invention.
It please refers to Fig.1, Fig. 2, Fig. 3 and Fig. 4, the utility model provides a kind of technical solution：Finger based on Chroma3360P
Line chip test system, including test device 4, the top of test device 4 is provided with display computer 1, and the inside of test device 4 is set
Test box 3 is equipped with, the outside of test box 3 is provided with translucent cover 2, and the bottom of test device 4 is provided with test device under casing 5, surveys
The bottom of trial assembly bottom set case 5 is provided with anti-skidding pillar 6, and the inside of anti-skidding pillar 6 is provided with universal wheel 7, the surface of test device 4
Starting switch 8 is provided with, the top of starting switch 8 is provided with connection button 9, and the side of display computer 1 is provided with protection shroud
10, protection shroud 10 is internally provided with indicator light 11, and test box 3 is internally provided with non-defective unit placement plate 13, non-defective unit placement plate
13 side is provided with defective products placement plate 14, and the side of defective products placement plate 14 is provided with manipulator 15, and the one of manipulator 15
End is provided with machinery folder 12, and the side of manipulator 15 is provided with test DUT17, and the side for testing DUT17 is provided with test machine 16,
The upper surface of test device 4 is provided with computer placing groove 18, and the outside of computer placing groove 18 is provided with spring hitch 19, machinery folder 12
Outside be provided with anti-slip rubber layer 20.
In order to make 12 close and firms that are combined with anti-slip rubber layer 20 of machinery folder, in the present embodiment, it is preferred that mechanical to press from both sides 12
It is fixedly connected with anti-slip rubber layer 20 by chimeric mode.
In order to make display computer 1 and test device 4 fixed more securely, in the present embodiment, it is preferred that display computer 1 with
Test device 4 is fixed with spring hitch 19 by computer placing groove 18 and connect.
In order to make test device 4 and protect the fixed more close and firm of shroud 10, in the present embodiment, it is preferred that test dress
4 are put to be fixedly connected by way of welding and moulding with protection shroud 10.
In order to protect indicator light 11 well, in the present embodiment, it is preferred that protection shroud 10 is a kind of round envelope surface knot
Structure.
The operation principle and process for using of the utility model：Sliding latch 19 outward, then the pedestal display computer 1
Computer placing groove 18 is put into, spring hitch 19 shows electricity in the side channel of inserted base under the elastic force of spring so as to fixed after unclamping hand
Brain 1, protection shroud 10 protect indicator light 11 not to be broken off and slide because of collision, connecting test machine 16, test 17DUT and machinery
Hand 15 opens test machine software, and test machine 16 enters Chroma3360P and tests system, corresponding test software is transferred, into survey
Interface is tried, connection button 9, the communication of connecting test machine and manipulator 15, by starting switch 8, manipulator are operated in test interface
15 start 12 gripping chip of rotation machinery folder, prevent chip from surprisingly sliding in the anti-slip rubber layer 20 of machinery 12 interior surfaces of folder
With protection chip, after gripping chip, it is placed at test DUT17, is tested by test machine 16, the electricity of the +/- 100uA of test mechanical irrigation
Protection diode characteristic of the pin of current test chip to power supply and over the ground, judges chip by reading diode turn-on voltage
Pin open short circuit it is whether normal, read fingerprint chip internal image, for detection chip inside ADC functions whether just
Often, image is acquired, and is corrected, calculates the various fingerprint collectings such as image mean value, flatness, bright spot, bad point, penetration power
Can, the interruption performance of test chip, the SPI that test machine 16 passes through the interface testings chip such as the MISO of chip, MOSI, CSN, SCLK
Transmission performance, test chip AVDD_CP voltages, test chip VDDIO voltages, test chip ADVREF voltages, test machine 16 are logical
It crosses the interfaces such as the MISO of chip, MOSI, CSN, SCLK and sends work order, the electric current of test chip, test machine 16 passes through chip
MISO, MOSI, CSN, the interfaces such as SCLK send sense command, the detection electric current of test chip, and test machine 16 passes through chip
The interfaces such as MISO, MOSI, CSN, SCLK send sleep command, and the quiescent current of test chip, manipulator 12 is according to test result
Signal carries out non-defective unit and defective products classifies.
While there has been shown and described that the embodiment of the utility model, for the ordinary skill in the art,
It is appreciated that can these embodiments be carried out with a variety of variations in the case of the principle and spirit for not departing from the utility model, repaiied
Change, replace and modification, the scope of the utility model are defined by the appended claims and the equivalents thereof.
Claims (5)
1. the fingerprint chip test system based on Chroma3360P, including test device (4), it is characterised in that：The test dress
It puts and display computer (1) is provided at the top of (4), the test device (4) is internally provided with test box (3), the test box
(3) translucent cover (2) is provided on the outside of, the bottom of the test device (4) is provided with test device under casing (5), the test
The bottom of device under casing (5) is provided with anti-skidding pillar (6), and universal wheel (7) is provided on the inside of the anti-skidding pillar (6), described
The surface of test device (4) is provided with starting switch (8), and connection button (9), institute are provided at the top of the starting switch (8)
The side for stating display computer (1) is provided with protection shroud (10), and the protection shroud (10) is internally provided with indicator light (11),
The test box (3) is internally provided with non-defective unit placement plate (13), and the side of the non-defective unit placement plate (13) is provided with defective products
Placement plate (14), the side of the defective products placement plate (14) are provided with manipulator (15), and one end of the manipulator (15) is set
Machinery folder (12) is equipped with, the side of the manipulator (15) is provided with test DUT (17), and the side of the test DUT (17) is set
Test machine (16) is equipped with, the upper surface of the test device (4) is provided with computer placing groove (18), the computer placing groove (18)
Outside be provided with spring hitch (19), be provided with anti-slip rubber layer (20) on the outside of the machinery folder (12).
2. the fingerprint chip test system according to claim 1 based on Chroma3360P, it is characterised in that：The machine
Tool folder (12) is fixedly connected with anti-slip rubber layer (20) by chimeric mode.
3. the fingerprint chip test system according to claim 1 based on Chroma3360P, it is characterised in that：It is described aobvious
Show that computer (1) is fixed with test device (4) by computer placing groove (18) with spring hitch (19) to connect.
4. the fingerprint chip test system according to claim 1 based on Chroma3360P, it is characterised in that：The survey
Trial assembly is put (4) and is fixedly connected by way of welding and moulding with protection shroud (10).
5. the fingerprint chip test system according to claim 1 based on Chroma3360P, it is characterised in that：It is described anti-
Encirclement cover (10) is a kind of round envelope surface structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721682663.1U CN207586370U (en) | 2017-12-06 | 2017-12-06 | Fingerprint chip test system based on chroma3360P |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721682663.1U CN207586370U (en) | 2017-12-06 | 2017-12-06 | Fingerprint chip test system based on chroma3360P |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207586370U true CN207586370U (en) | 2018-07-06 |
Family
ID=62735792
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721682663.1U Expired - Fee Related CN207586370U (en) | 2017-12-06 | 2017-12-06 | Fingerprint chip test system based on chroma3360P |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207586370U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933638A (en) * | 2021-11-01 | 2022-01-14 | 豪威科技(北京)股份有限公司 | Test equipment of fingerprint image module |
-
2017
- 2017-12-06 CN CN201721682663.1U patent/CN207586370U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933638A (en) * | 2021-11-01 | 2022-01-14 | 豪威科技(北京)股份有限公司 | Test equipment of fingerprint image module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180706 Termination date: 20191206 |