CN207351959U - A kind of pulsed eddy-current nondestructive test system based on ZigBee technology - Google Patents

A kind of pulsed eddy-current nondestructive test system based on ZigBee technology Download PDF

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Publication number
CN207351959U
CN207351959U CN201720869379.9U CN201720869379U CN207351959U CN 207351959 U CN207351959 U CN 207351959U CN 201720869379 U CN201720869379 U CN 201720869379U CN 207351959 U CN207351959 U CN 207351959U
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chips
circuit
zigbee
stm32f407
control chips
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吴建德
毕野
包俊
叶波
王晓东
黄国勇
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Kunming University of Science and Technology
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Kunming University of Science and Technology
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Abstract

A kind of pulsed eddy-current nondestructive test system based on ZigBee technology is the utility model is related to, belongs to Non-Destructive Testing and assessment technology field.The system is by probe, signal conditioning circuit, power amplifier, controller, routing node, coordinator node and host computer.The detecting system produces pulse width modulated waveform by controller, pulse width modulated waveform drives excitation coil by power amplifier amplification, Sensor section gathers the resultant magnetic field of secondary magnetic field and primary magnetic field and is converted into electric signal, carries out analog-to-digital conversion in the controller after signal conditioning circuit.Controller is connected with routing node, and routing node and coordinator node communicate, coordinator node the resultant magnetic field data message collected is transferred to host computer storage by serial communication analysis shows that.The utility model can on-line checking test specimen the defects of and degree of impairment;Due to using wireless communication technique, simplifying workshop to the complicated line between host computer, reducing cost.

Description

A kind of pulsed eddy-current nondestructive test system based on ZigBee technology
Technical field
The utility model is related to a kind of pulsed eddy-current nondestructive test system based on ZigBee technology, belong to Non-Destructive Testing with Assessment technology field.
Background technology
A large amount of parts are produced on workshop assembly line daily, wherein mixing some substandard products.It is main at present Detection mode be that the parts for just having produced these are put together, take detection department detection, such detection mode takes Effort, efficiency are low.With the fast development of computer technology, microelectric technique and information management technique, test technique automatic Decentralized, networking, intelligence and integrated are progressively moved towards by concentration.
Wireless sensing network system is important component in industrial processes, can not only realize remote monitoring, also It is able to ensure that the security of equipment in production process, is the important symbol of development of modern industry, embodies industrial development and interconnection Net is closely connected.At present it has been proposed that using GPRS wireless transmission methods remotely obtain in workshop produce parts the defects of and Damage data, although overcoming the complicated wiring issue of wire communication, GPRS presses flow charging, and terminal scale is big, for a long time Use cost is inevitable higher.
The content of the invention
The technical problem to be solved by the present invention is to provide a kind of impulse eddy current Non-Destructive Testing based on ZigBee technology System, it is therefore an objective to solve the problems, such as present in existing detection technique.Using eddy detection technology, test specimen internal magnetic field can be passed through Mutation analysis the defects of going out test specimen and degree of impairment;Multipoint acquisition can be carried out using the array type detector of special shape Feature, whole test specimen internal flaw and degree of impairment can be collected when test specimen passes through array type detector;Passed using wireless Transferring technology, can in time by the data collected pass to host computer storage analysis shows that, and simplify workshop to host computer it Between complicated line, save cost.This detection mode not only increases detection efficiency, has saved cost, also improves pipe Efficiency is managed, the detection to test specimen brings great convenience.Its is compact-sized, can carry out wireless low-power consumption to test specimen and examine online Survey;Extension is convenient, applied widely, securely and reliably also saves manpower at the same time, once and equipment successful connection, its is easy to operate Thus usability is strong, and generalization is strong.
The technical solution adopted in the utility model:A kind of pulsed eddy-current nondestructive test system based on ZigBee technology, bag Include array type detector, signal conditioning circuit 6, power amplifier 7, controller 1, routing node 2, coordinator node 3 and host computer 4, the array type detector is several 5 semicylinders for surrounding of probe, and shape is in tunnel-like, frame on assembly line not with The movement of assembly line and move, the probe 5 include enameled wire, manganese-zinc ferrite core, Hall magnetic sensor circuit, enamel-cover Line, which is wound on manganese-zinc ferrite core, forms excitation coil, and the circuit board of Hall magnetic sensor circuit is close to manganese-zinc ferrite core Bottom and placed parallel to horizontal plane, the controller 1 includes the first stm32f407 control chips, and routing node 2 includes the One ZigBee chip CC2430, coordinator node 3 include the 2nd stm32f407 control chips 1111, the 2nd ZigBee chips CC24301010;
The probe 5 is used to detect the test specimen by below, the output terminal of its input terminal and power amplifier 7 Connection, output terminal are connected with the input terminal of signal conditioning circuit 6, the output terminal of signal conditioning circuit 6 and the input terminal of controller 1 Connection, the output terminal of controller 1 input terminal with power amplifier 7, the first ZigBee chips in routing node 2 respectively CC2430 connections, controller 1 produce PWM ripples, PWM by the general purpose timer carried inside the first stm32f407 control chips Ripple is by the amplification driving excitation coil of power amplifier 7, and the first ZigBee chips CC2430 is by wireless radio frequency antenna with coordinating The 2nd ZigBee chip CC243010 wireless communications in node 3, the 2nd ZigBee chips CC243010 and the 2nd stm32f407 Control chip 11 connects, and the 2nd stm32f407 control chips 11 are connected with host computer 4.
The enameled wire of a diameter of 0.3mm is wound on manganese-zinc ferrite core, forms internal diameter 5mm, outside diameter 25mm, high The excitation coil of 20mm, Hall sensor circuit use patch type linear hall element HAL49E.
The signal conditioning circuit includes:Filtering, amplifying circuit and output port, wherein filter circuit use Order RC Active low-pass filter, R14 and C3 form first-order low-pass wave circuit, and R15 and C4 form second-order low-pass filter circuit, after filtering Circuit enter UA741CD amplifying circuits in, two first-order low-pass wave circuits and UA741CD operational amplifiers series connection, The output port of UA741CD operational amplifiers is connected with controller 1, and amplifying circuit is made of three amplifier differential amplifier circuits, and two A OPA335 chips form differential amplifying part, then a UA741CD amplifying circuit of connecting, pop one's head in 5 two output terminals difference The positive and negative terminal for being connected to two OPA335 amplifiers carries out differential amplification.
The 2nd stm32f407 control chips 11, the 2nd ZigBee chips CC243010 pass through in the coordinator node 3 USART serial communications.
Serial ports the pin TX and RX of the first stm32f407 control chips respectively with the first ZigBee chips CC2430 Serial ports pin RX connected with TX, serial ports the pin TX and RX of the 2nd stm32f407 control chips 11 are respectively with second The serial ports pin RX of stm32f407 control chips 11 is connected with TX.
The controller 1 further includes crystal oscillator, reset circuit 9, USB circuit, reserve battery, jtag circuit, FLASH storages Device circuit and electric power management circuit 8, USB circuit are used for downloading into chip, and USB circuit uses CH340G chips, USB electricity Road is carried out data transmission with the first stm32f407 control chips by USART1, TX the and RX pins of CH340G chips respectively with U1_TX with the U1_RX pins of first stm32f407 control chips connect, the U1_TX of the first stm32f407 control chips and U1_RX pins are connected on the common input/output port PA10 and PA11 of the first stm32f407 control chips, i.e.,:First The common input/output port PA10 and PA11 of stm32f407 control chips by software initialization can multiplexed port for serial ports 1 Pin i.e. U1_TX and U1_RX are received and dispatched, electric power management circuit 8 includes 5V DC voltages input circuit and 5V turns 3.3V electricity Road, 5V DC voltages input circuit use MP2359 chips, and 5V turns 3.3V circuits and uses AMS1117 chips, FLASH memory Circuit uses W25Q128 chips, and W25Q128 chips are communicated with the first stm32f407 control chips by SPI serial modes, CLK pin, SI pins and the SO pins of W25Q128 chips be connected to the first stm32f407 control chips SPI1_SCK, On SPI1_MOSI and SPI1_MISO pins, jtag circuit is used for the on-line debugging of program, and the first stm32f407 control chips are certainly Band jtag port.
The power amplifier 7 uses LM386 modules, and maximum gain reaches the-INPUT pins of 200, LM386 modules Ground connection ,+INPUT pins are received to be connected from the first stm32f407 control chip PE13 pins, for receiving first The pulse width modulated waveform that stm32f407 controllers produce, Vout pins export amplified pulse width modulated waveform warp Excitation coil after crossing decoupling and filtering on connection probe 5.
The operation principle of the utility model is:Controller 1 is general by being carried inside the first stm32f407 control chips Timer produces pulse width modulated waveform i.e. PWM ripples, and PWM ripples are by the amplification driving excitation coil of power amplifier 7;Suddenly You collect the resultant magnetic field of secondary magnetic field and primary magnetic field and are converted into electric signal sensor, if test specimen is defective or damages The defects of test specimen is then included in resultant magnetic field or damage information;The electric signal of this resultant magnetic field conversion passes through first After 12 A/D converters carried inside stm32f407 control chips are converted into digital signal, numeral is believed by routing node 2 Number coordinator node 3 is transferred to by wireless sensing mode, then is passed signal by USART serial ports by coordinator node 3 It is defeated to arrive host computer 4;Communicated between routing node 2 and coordinator node 3 by ZigBee-network.
The beneficial effects of the utility model:ZigBee wireless communications are used in workshop, save the trouble of wiring, Easily scalable maintenance;Timely and effectively can remotely it obtain in workshop on assembly line the defects of test specimen and degree of impairment;No Cost is only saved, has avoided the damage probability of wireline equipment, also improved the efficiency of management, the detection to production test specimen is brought Great convenience, saves human cost;Small, easy to operate, generalization is preferable, has certain application value.
Brief description of the drawings
Fig. 1 is the implementation integral layout schematic diagram of the utility model;
Fig. 2 is the system construction drawing of the utility model;
Fig. 3 is the circuit diagram of the utility model controller 1;
Fig. 4 is 8 figure of Tthe utility model system power supply electric power management circuit;
Fig. 5 is the circuit diagram of the utility model power amplifier 7;
Fig. 6 is the circuit diagram of the utility model Hall magnetic sensor;
Fig. 7 is the circuit diagram of the utility model Signal-regulated kinase 6;
Fig. 8 is the circuit diagram of the utility model ZigBee chips CC2430;
Fig. 9 is the communication schematic diagram of the utility model ZigBee chips CC2430 and stm32f407 control chips.
In figure respectively marked as:1- controllers, 2- routing nodes, 3- coordinator nodes, 4- host computers, 5- probes, 6- signal tune Manage circuit, 7- power amplifiers, 8- electric power management circuits, 9- reset circuits 9,10- the 2nd ZigBee chip CC2430,11- the Two stm32f407 control chips.
Embodiment
With reference to the accompanying drawings and detailed description, the utility model is described further.
Embodiment 1:As shown in figs 1-9, a kind of pulsed eddy-current nondestructive test system based on ZigBee technology, including array Formula detector, signal conditioning circuit 6, power amplifier 7, controller 1, routing node 2, coordinator node 3 and host computer 4, it is described Array type detector be several 5 semicylinders for surrounding of probe, shape is in tunnel-like, and frame is on assembly line not with assembly line Movement and move, the probe 5 includes enameled wire, manganese-zinc ferrite core, Hall magnetic sensor circuit, and enameled wire is wound on Form excitation coil on manganese-zinc ferrite core, the circuit board of Hall magnetic sensor circuit be close to manganese-zinc ferrite core bottom and Placed parallel to horizontal plane, the controller 1 includes the first stm32f407 control chips, and routing node 2 includes first ZigBee chip CC2430, coordinator node 3 include the 2nd stm32f407 control chips 11, the 2nd ZigBee chips CC243010;
The probe 5 is used to detect the test specimen by below, the output terminal of its input terminal and power amplifier 7 Connection, output terminal are connected with the input terminal of signal conditioning circuit 6, the output terminal of signal conditioning circuit 6 and the input terminal of controller 1 Connection, the output terminal of controller 1 input terminal with power amplifier 7, the first ZigBee chips in routing node 2 respectively CC2430 connections, controller 1 produce PWM ripples, PWM by the general purpose timer carried inside the first stm32f407 control chips Ripple is by the amplification driving excitation coil of power amplifier 7, and the first ZigBee chips CC2430 is by wireless radio frequency antenna with coordinating The 2nd ZigBee chip CC243010 wireless communications in node 3, the 2nd ZigBee chips CC243010 and the 2nd stm32f407 Control chip 11 connects, and the 2nd stm32f407 control chips 11 are connected with host computer 4.First ZigBee cores in the utility model Piece is identical with the structure of the 2nd ZigBee chips CC243010, and the first stm32f407 control chips and the 2nd stm32f407 are controlled The structure of chip 11 is identical.
Several probes 5, forming array formula detector are placed on the assembly line of workshop according to actual conditions.Array detects Semi-cylindrical is presented in device, and outer likeness in form one sample rack of tunnel is on assembly line, and array type detector is fixed, not with the shifting of assembly line Move and move.When test specimen passes through below detector, it is possible to the defects of very easily detecting inside whole test specimen and damage Situation.Because there is the A/D converter controller of 3 12 inside stm32f407, each A/D converter controller has 16 to lead to Road, each passage correspond to an input/output port, so the output terminal of each probe 5 very easily can be connected to letter On number modulate circuit 6, then each output terminal of signal conditioning circuit 6 is connected in each mould of the first stm32f407 control chips respectively On number ALT-CH alternate channel.
Further, the enameled wire of a diameter of 0.3mm is wound on manganese-zinc ferrite core, forms internal diameter 5mm, outside Footpath 25mm, the excitation coil of high 20mm, Hall sensor circuit use patch type linear hall element HAL49E.Specific making side Method be by the enameled wire that line footpath is 0.3mm be wound on manganese-zinc ferrite formed internal diameter be 5mm, outside diameter 25mm, a height of 20mm Cylindrical excitation coil lain in a horizontal plane in around, linear patch linear Hall magnetic sensor circuit below ferrite.Linear patch Hall sensor circuit input end adds shunt capacitance and decoupling capacitor to reduce power supply noise, and a small electricity is placed in output terminal Hinder to feed back and reduce noise;According to the output characteristics of Hall element, a slide rheostat is installed around Hall element, is adjusted The output voltage that section slide rheostat makes probe carve at the beginning is zero.
Further, the signal conditioning circuit includes:Filtering, amplifying circuit and output port, wherein filter circuit Using two stage RC active lowpass filter, R14 and C3 form first-order low-pass wave circuit, and R15 and C4 form second-order low-pass filter Circuit, filtered circuit enter in UA741CD amplifying circuits, two first-order low-pass wave circuits and UA741CD operation amplifiers Device is connected, and the output port of UA741CD operational amplifiers is connected with controller 1, and UA741CD amplifying circuits have defeated in wave filter Enter the characteristics of impedance is high, and output impedance is low, circuit is amplified useful signal frequency while filtering;Filtering Feedback network is have also been devised in device circuit, its effect is that output voltage can be adjusted amplifying circuit automatically by feedback element It is whole, so as to pin down the change of output voltage, finally reach output stable equilibrium, the wave filter the advantages of be:It is small, again Amount is light, magnetic screen is not required, and signal is exactly filtered, amplifies by its effect, teletransmission, is used cooperatively with sensor, Neng Gouti The fitness and environmental reliability of high system;Amplifying circuit is made of three amplifier differential amplifier circuits, two OPA335 chip structures Into differential amplifying part, then a UA741CD amplifying circuit of connecting, 5 two output terminals of popping one's head in are connected to two The positive and negative terminals of OPA335 amplifiers carries out differential amplification, using the symmetry and negative feedback of differential amplifier circuit, effectively Stablize quiescent point.
The 2nd stm32f407 control chips 11, the 2nd ZigBee chips CC243010 pass through in the coordinator node 3 USART serial communications, are communicated wirelessly between routing node 2 and coordinator node 3 by radio-frequency antenna, and the of coordinator node 3 Two stm32f407 control chips 11 receive the signal sent by routing node 2, and signal transmission then is entered coordinator node 3 In the memory of 2nd stm32f407 control chips 11, then sent to host computer by the 2nd stm32f407 control chips 11.
Serial ports the pin TX and RX of the first stm32f407 control chips respectively with the first ZigBee chips CC2430 Serial ports pin RX connected with TX, serial ports the pin TX and RX of the 2nd stm32f407 control chips 11 are respectively with second The serial ports pin RX of stm32f407 control chips 11 is connected with TX.
As shown in Figure 3:The controller 1 further includes crystal oscillator, reset circuit 9, USB circuit, reserve battery, JTAG electricity Road, FLASH memory circuit and electric power management circuit 8, USB circuit are used for downloading into chip, and USB circuit uses CH340G chips, USB circuit are carried out data transmission with the first stm32f407 control chips by USART1, CH340G chips U1_TX and U1_RX pin of the TX and RX pins respectively with the first stm32f407 control chips is connected, the first stm32f407 controls U1_TX the and U1_RX pins of coremaking piece are connected to the common input/output port PA10 of the first stm32f407 control chips On PA11, i.e.,:The common input/output port PA10 and PA11 of first stm32f407 control chips can by software initialization Multiplexed port is the transmitting-receiving pin i.e. U1_TX and U1_RX of serial ports 1, and electric power management circuit 8 is inputted including 5V DC voltages Circuit and 5V turn 3.3V circuits, and 5V DC voltages input circuit uses MP2359 chips, and 5V turns 3.3V circuits and uses AMS1117 cores Piece, accesses 12 104 capacitances in parallel between power supply and ground, FLASH memory circuit uses W25Q128 chips, W25Q128 Chip is communicated with the first stm32f407 control chips by SPI serial modes, the CLK pins of W25Q128 chips, SI pins and SO pins are connected on SPI1_SCK, SPI1_MOSI and SPI1_MISO pin of the first stm32f407 control chips, Jtag circuit is used for the on-line debugging of program, and the first stm32f407 control chips carry jtag port.
Further, as shown in figure 5, the power amplifier 7 uses LM386 modules, maximum gain reaches 200, - INPUT pins the ground connection of LM386 modules, it is wide that+INPUT pins receive the pulse from the generation of the first stm32f407 control chips Modulation waveform is spent, the connection of output port Vout pins filter capacitor c33 and decoupling capacitance c34, filter capacitor c33 are used to filter out defeated Go out the alternating component of signal, then connect excitation coil, decoupling capacitance c34 is used for the high-frequency defects of compensation filter capacitance, makes defeated Go out the linear more preferable of signal.
As shown in Figure 4:The electric power management circuit 8 includes 5V DC voltages input circuit and 5V turns 3.3V circuits.5V DC voltage input circuit uses MP2359 chips, and 5V turns 3.3V circuits and uses AMS1117 chips, accessed simultaneously between power supply and ground 12 104 capacitances of connection.It is very convenient by the switch by BUTTON key control circuit power supplys.First stm32f407 is controlled Chip and the 2nd stm32f407 control chips are respectively connected with electric power management circuit 8 and reset circuit 9, and electric power management circuit 8 is institute Some chip power supplies.
As shown in Figure 6:Linear Hall magnetic sensor circuit is by patch type linear hall element HAL49E and output electricity Road is formed.Linear patch Hall sensor circuit input end adds shunt capacitance and decoupling capacitor to reduce power supply noise, defeated Outlet places a small resistor to feed back and reduce noise;According to the output characteristics of Hall element, in the input terminal of Hall element One slide rheostat is installed, the output voltage that adjusting slide rheostat makes probe carve at the beginning is zero.
As shown in Figure 8:The cc2430 radio-frequency modules of CC2430 low-power consumption are formed using the cc2430 chips of TI companies, should Module can be widely used in close range wireless communication field, and order control can be used in this module, passes through serial ports handover module Role, configures serial port baud rate, changes ZigBee-network parameter.Pass through USART between ZigBee module and stm32f407 chips Serial communication, P0.2 the and P0.3 pins of ZigBee module are RXD the and TXD pins of serial ports USART, are connected respectively in the system Stm32f407 chips PA9 and PA10 because on foot because the two pins are the TX of stm32f407 chip USART1 serial ports Pin and RX pins;RF_p with the RF_n pins of ZigBee chips connect radio-frequency antenna, and two are realized by radio-frequency antenna The wireless telecommunications of ZigBee chips.
In real work, according to the actual conditions of factory floor, place what several probes 5 were formed on the assembly line of workshop Semi-cylindrical is presented in array type detector, array type detector, and outer likeness in form one sample rack of tunnel is on assembly line, to make probe Fully wrapped around firmly test specimen.Array type detector is fixed, is not moved with the movement of assembly line.When test specimen is below detector When passing through, it is possible to the defects of very easily detecting inside whole test specimen and degree of impairment.Test specimen is transported on the belt of assembly line It is defeated by array type detector, array type detector is inswept test specimen is to detect whole test specimen internal flaw and degree of impairment.Cause For stm32f407 chip internals except general purpose timer 9-14, remaining general purpose timer all include four passages, wherein a-road-through Road can be by setting corresponding registers to produce pulse width modulating signal i.e. PWM waveform, and each passage of timer is all corresponding One I/O mouthfuls, it is possible to be connected the I/O mouths for exporting PWM waveform with the input port+INPUT of power amplifier, power is put - INPUT pins the ground connection of big device, PWM waveform are amplified in power amplifier;The Vout output pins of power amplifier 7 It is connected with the excitation coil end of probe 5, makes amplified PWM ripples driving excitation coil;Amplified PWM ripples drive excitation coil Afterwards, the electromagnetic field produced around excitation coil is formed by stacking by two parts:A part is one be directly coupled out from coil Secondary electromagnetic field is also referred to as primary magnetic field, and another part is that secondary electromagnetic field caused by the vortex field induced in test specimen is also known as secondary Magnetisation field.The resultant magnetic field in each Sensor section collection secondary magnetic field of probe matrix and primary magnetic field is simultaneously converted into electric signal;Visit The both ends of the integrated differential amplifying part of head output terminal and signal conditioning circuit connect, and are amplified in signal conditioning circuit 6 Low-pass filtering twice;Because stm32f407 chip internals have the ADC controllers of 3 12, each controller includes 16 Passage, each passage correspond to an I/O pin, so making the output port of each signal conditioning circuit 6 respectively with first Each passage connection of A/D controllers of stm32f407 control chips, makes the filtered analog signal of amplification from signal conditioning circuit Output port is transferred to the first stm32f407 control chips, in 12 A/D conversions that the first stm32f407 control chips carry Analog-to-digital conversion is carried out in device.Transformed digital signal controls by controller 1 and is transferred to coordinator node 3 by routing node 2, Host computer 4 is transferred signals to by coordinator node 3 again.
Coordinator node 3 establishes ZigBee wireless self-networkings automatically after start, and each probe 5 is automatically added to network, completes networking. It is first to use, button selection can be led on coordinator node 3 and enters setting interface, inputs threshold value, sample frequency, transmission according to demand The parameters such as frequency.Set it is errorless after, controller 1 produce rectangular pulse signal act on excitation coil by power amplifier 7, spy Head cycle collection workshop test specimen parameter, and coordinator node 3 is sent to by routing node 2, coordinator node 3 integrates all data Afterwards, by the defects of test specimen and damage information send to host computer 4 store analysis shows that.Reached when having the defects of test specimen and degree of injury The maximum required to us, controller 1 can send alarm command automatically.Operator can remotely be obtained in time by upper computer software Take Devices in Workshop situation, and can by way of key commands remote control, monitoring system.
ZigBee technology is the high bidirectional wireless communication of a kind of low-power consumption, low cost and the data reliability of rising in recent years Technology, is mainly used for automatic, remote control field.According to the actual conditions of factory floor, placed on the assembly line of workshop some A probe, forming array formula detector.Array type detector present semi-cylindrical, it is outer likeness in form one sample rack of tunnel on assembly line, Do not moved with the movement of assembly line.When test specimen passes through below array type detector, it is possible to which very easily detection is whole The defects of inside test specimen and degree of impairment, solve the problems, such as present in current detection technology well.In factory floor flowing water On line place array type detector realize on-line monitoring, and use ZigBee Radio Transmission Technologys, not only increase detection efficiency, Save cost, avoided the damage probability of wireline equipment, also improve the efficiency of management.
Specific embodiment of the present utility model is explained in detail above in association with attached drawing, but the utility model is not It is limited to the above embodiment, within the knowledge of a person skilled in the art, this practicality can also be not being departed from Various changes can be made on the premise of new objective.

Claims (7)

  1. A kind of 1. pulsed eddy-current nondestructive test system based on ZigBee technology, it is characterised in that:Including array type detector, letter Number modulate circuit(6), power amplifier(7), controller(1), routing node(2), coordinator node(3)And host computer(4), it is described Array type detector be several probe(5)The semicylinder surrounded, shape are in tunnel-like, and frame is on assembly line not with flowing water The movement of line and move, the probe(5)Including enameled wire, manganese-zinc ferrite core, Hall magnetic sensor circuit, enameled wire It is wound on manganese-zinc ferrite core and forms excitation coil, the circuit board of Hall magnetic sensor circuit is close to manganese-zinc ferrite core bottom Portion and parallel to horizontal plane place, the controller(1)Including the first stm32f407 control chips, routing node(2)Including First ZigBee chip CC2430, coordinator node(3)Including the 2nd stm32f407 control chips(11), the 2nd ZigBee chips CC243010(10);
    The probe(5)For detecting by test specimen below, its input terminal and power amplifier(7)Output terminal Connection, output terminal and signal conditioning circuit(6)Input terminal connection, signal conditioning circuit(6)Output terminal and controller(1)'s Input terminal connects, controller(1)Output terminal respectively with power amplifier(7)Input terminal, routing node(2)In first The CC2430 connections of ZigBee chips, controller(1)Produced by the general purpose timer carried inside the first stm32f407 control chips Raw PWM ripples, PWM ripples pass through power amplifier(7)Amplification driving excitation coil, the first ZigBee chips CC2430 is by wirelessly penetrating Frequency antenna and coordinator node(3)In the 2nd ZigBee chips CC243010(10)Wireless communication, the 2nd ZigBee chips CC243010(10)With the 2nd stm32f407 control chips(11)Connection, the 2nd stm32f407 control chips(11)With host computer (4)Connection.
  2. 2. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described Enameled wire a diameter of 0.3mm, enameled wire is wound on manganese-zinc ferrite core, forms internal diameter 5mm, outside diameter 25mm, high 20mm Excitation coil, Hall sensor circuit uses patch type linear hall element HAL49E.
  3. 3. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described Signal conditioning circuit include:Filtering, amplifying circuit and output port, wherein filter circuit use Order RC active low-pass filter Device, R14 and C3 form first-order low-pass wave circuit, and R15 and C4 form second-order low-pass filter circuit, and filtered circuit enters In UA741CD amplifying circuits, two first-order low-pass wave circuits and the series connection of UA741CD operational amplifiers, UA741CD operation amplifiers The output port of device is connected with controller 1, and amplifying circuit is made of three amplifier differential amplifier circuits, and two OPA335 chips are formed Differential amplifying part, then a UA741CD amplifying circuit of connecting, probe(5)Two output terminals be connected to two The positive and negative terminal of OPA335 amplifiers carries out differential amplification.
  4. 4. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described Coordinator node(3)In the 2nd stm32f407 control chips(11), the 2nd ZigBee chips CC243010(10)Pass through USART Serial communication.
  5. 5. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described The first stm32f407 control chips serial ports pin TX and RX the serial ports pin RX with the first ZigBee chips CC2430 respectively Connected with TX, the 2nd stm32f407 control chips(11)Serial ports pin TX and RX respectively with the 2nd stm32f407 control chips (11)Serial ports pin RX connected with TX.
  6. 6. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described Controller 1 further include crystal oscillator, reset circuit(9), USB circuit, reserve battery, jtag circuit, FLASH memory circuit and electricity Power management circuits(8), for USB circuit for downloading into chip, USB circuit uses CH340G chips, USB circuit and first Stm32f407 control chips are carried out data transmission by USART1, and TX the and RX pins of CH340G chips are respectively with first U1_TX with the U1_RX pins of stm32f407 control chips connect, the U1_TX and U1_RX of the first stm32f407 control chips Pin is connected on the common input/output port PA10 and PA11 of the first stm32f407 control chips, electric power management circuit (8)Turn 3.3V circuits including 5V DC voltages input circuit and 5V, 5V DC voltages input circuit uses MP2359 chips, and 5V turns 3.3V circuits use AMS1117 chips, and FLASH memory circuit uses W25Q128 chips, W25Q128 chips and first Stm32f407 control chips are communicated by SPI serial modes, CLK pin, SI pins and the SO pins difference of W25Q128 chips It is connected on SPI1_SCK, SPI1_MOSI and SPI1_MISO pin of the first stm32f407 control chips, jtag circuit is used for The on-line debugging of program, the first stm32f407 control chips carry jtag port.
  7. 7. the pulsed eddy-current nondestructive test system according to claim 1 based on ZigBee technology, it is characterised in that:It is described Power amplifier(7)Using LM386 modules, maximum gain reaches the-INPUT pins ground connection of 200, LM386 modules ,+INPUT Pin is received to be connected from the first stm32f407 control chip PE13 pins, is produced for receiving the first stm32f407 controllers Pulse width modulated waveform, Vout pins, which export amplified pulse width modulated waveform and connected after decoupling and filtering, to be visited Head(5)On excitation coil.
CN201720869379.9U 2017-07-18 2017-07-18 A kind of pulsed eddy-current nondestructive test system based on ZigBee technology Expired - Fee Related CN207351959U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107271544A (en) * 2017-07-18 2017-10-20 昆明理工大学 A kind of pulsed eddy-current nondestructive test system based on ZigBee technology

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107271544A (en) * 2017-07-18 2017-10-20 昆明理工大学 A kind of pulsed eddy-current nondestructive test system based on ZigBee technology

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