CN207198068U - A kind of Portable X-ray analysis device - Google Patents

A kind of Portable X-ray analysis device Download PDF

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Publication number
CN207198068U
CN207198068U CN201720888376.XU CN201720888376U CN207198068U CN 207198068 U CN207198068 U CN 207198068U CN 201720888376 U CN201720888376 U CN 201720888376U CN 207198068 U CN207198068 U CN 207198068U
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China
Prior art keywords
ray
diffraction
base
module
analysis
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Expired - Fee Related
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CN201720888376.XU
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Chinese (zh)
Inventor
倪效勇
徐朝玉
杨勇奇
龚芳
程卓
宋俊磊
王典洪
罗林波
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China University of Geosciences
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China University of Geosciences
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Priority to CN201720888376.XU priority Critical patent/CN207198068U/en
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Abstract

The utility model provides a kind of Portable X-ray analysis device, including X-ray emitter, x-ray fluorescence analysis unit, X-ray diffraction analysis unit and spectral analysis module, x-ray fluorescence analysis unit includes being used for the fluorescent samples platform for placing fluorescent samples, fluorescent samples platform include horizontally disposed and tool first base jaggy and it is slidable located at breach and dress sample sloping platform with inclined plane, inclined plane is arranged with resettlement groove, one first micro slide for carrying fluorescent samples is placed in resettlement groove, and a first through hole is located at resettlement groove and through dress sample sloping platform;X-ray diffraction analysis unit includes the X ray collimation adjustment module immediately below first through hole, the diffraction sample platform being connected with the lower end of X ray collimation adjustment module and the CCD detection module being connected with spectral analysis module below diffraction sample platform.The beneficial effects of the utility model:Effectively shorten analysis time and small volume, light weight, cost are low, are easy to be operated in site environment.

Description

A kind of Portable X-ray analysis device
Technical field
It the utility model is related to X-ray analysis technical field, more particularly to a kind of Portable X-ray analysis device.
Background technology
X-ray fluorescence analysis (X-Ray Fluorescence, abbreviation XRF) and X-ray diffraction analysis (X-Ray Diffraction, abbreviation XRD) it is the two methods that material composition analysis is carried out using X ray different qualities.Work as beam of x-rays When being radiated at material surface, it may occur that the scattering of X ray and absorbing phenomenon.Under certain condition, the coherent scattering of X ray, which is formed, spreads out Penetrate striped, different diffraction fringe represents the different structures of matter, therefore XRD survey meters be mainly used in analyzing material thing phase and Crystal parameter, it is widely used in the fields such as material, metallurgy, cement, mineral products.The energy that X ray carries is inhaled by material internal electron Receive, produce electron transition and discharge fluorescent X-ray.The energy and quantity and material element composition and content phase of fluorescent X-ray Close, so XRF survey meter is mainly used in obtaining element composition and the quantitative analysis of testing sample, in mineral exploration, survey Well, Marine Environmental Geology investigation etc. are used widely.
At present, in an analytical instrument, two kinds of analytic functions of XRF and XRD is provided simultaneously with and are had been carried out.The structure of use It is broadly divided into two kinds:
(1) combining structure pattern, exactly XRF and XRD main functional modules are assembled, radiographic source, light path and spy It is independent to survey most of device, can ensure analytical effect to the full extent.Chinese patent CN200880007232 proposes a kind of The integrated mode of X-ray tube is shared, XRD analysis use the method based on angular instrument.Chinese patent CN201010569788 then gives A kind of combining structure of shared X-ray tube is gone out, XRD uses energy dispersion type measuring method, and detector uses one-dimensional energy type; Above-mentioned two patent is all to use simple sample, i.e. XRD and XRF share sample.
(2) single structure pattern, due to the minimizing of XRF, portable highly developed, and XRD portable research Also it is confined to partial analysis instrument producer.Using single structure pattern, XRF points are mainly realized during XRD analysis Analyse function.But because the two X ray demand to incidence is different, and during XRD analysis, the fluorescent effect of X ray It is interference signal, XRD analysis effect can be reduced, therefore using XRF the and XRD compositive instruments of single structure pattern, it is main prominent Analytic function go out or XRD.
In recent years, the minimizing of XRD analysis instrument, the portable emphasis for being designed to industry concern.Some are large-scale XRD analysis apparatus manufacture is proposed Table top type, miniaturization XRD, but directly applies at the scene also fewer.Limit portable The major obstacle that XRD is developed is that the weight, volume and the inherent of instrument performance index of instrument constrain.Although such as angular instrument so that XRD analysis precision is high, measurement angle scope is big, but due to belonging to precision optical machinery rotating device, is not easy to work at the scene Environment.
Utility model content
In view of this, embodiment of the present utility model provide one kind can shorten analysis time and small volume, light weight, Cost is low, is easy to be operated in Portable X-ray analysis device in site environment.
A kind of Portable X-ray analysis device of embodiment offer of the present utility model, including X-ray emitter, X ray are glimmering Light analytic unit, X-ray diffraction analysis unit and with the x-ray fluorescence analysis unit and the X-ray diffraction analysis unit The spectral analysis module of connection, the x-ray fluorescence analysis unit include being used for the fluorescence sample for being placed for fluorescence spectrum collection The fluorescent samples platform of product, the fluorescent samples platform include horizontally disposed and tool first base jaggy and are slidably located at The breach and with inclined plane dress sample sloping platform, it is described dress sample sloping platform inclined plane be arranged with resettlement groove, for carrying One first micro slide for stating fluorescent samples is removably placed in the resettlement groove, and a first through hole is located at the resettlement groove and passed through Wear the upper and lower surface of the dress sample sloping platform;The X-ray diffraction analysis unit includes the X immediately below the first through hole Ray collimation adjustment module, the diffraction sample platform being connected with the lower end of the X ray collimation adjustment module and positioned at the diffraction The CCD detection module being connected with the spectral analysis module below sample stage.
Further, the x-ray fluorescence analysis unit also includes being used to gather irradiation of the fluorescent samples in X ray Fluorescent photon caused by lower secondary excitation and the fluorescent photon for being gathered it are converted into the fluorescence detection of fluorescence spectrum information Device, and the fluorescence control panel for being used to read the fluorescence spectrum information being connected with the fluorescent probe, the spectrum analysis Module is connected with the fluorescence control panel to carry out fluorescence analysis.
Further, the angle between the inclined plane of the dress sample sloping platform and the first base is 45 °, and the dress sample is oblique The side opposite with the fluorescent probe is provided with the convenient pulling dress sample sloping platform relatively described first in the side surface of platform The handle that base slides, the centre of first micro slide is circular depressed, and the fluorescent samples are positioned over the circular depressed In.
Further, the Portable X-ray analysis device also includes supporting construction, and the supporting construction is included positioned at upper End be used for install the fluorescent probe and the fluorescent samples platform installation top plate, positioned at lower end be used for install described in The mounting base of CCD detection module and the shell for connecting the installation top plate and the mounting base.
Further, the spectral analysis module is located in PC, and storage card is additionally provided with the PC, and the CCD is visited Survey module to be connected with the spectral analysis module by diffraction control panel, the diffraction control panel includes being used to drive the CCD The CCD drive modules of detecting module running and each frame spectrum picture sent for receiving and handling the CCD detection module Diffraction pretreatment module, the diffraction pretreatment module is connected with the storage card so that the spectrum picture after processing to be sent to The storage card storage, the diffraction pretreatment module are connected with the spectral analysis module so that the spectrum picture after processing to be passed Deliver to the spectral analysis module and carry out Sample crystals structural analysis.
Further, the CCD detection module includes beryllium window flange, base flange and the connection beryllium window flange and institute Base flange and the adapter flange of inner hollow are stated, the center of the beryllium window flange is provided with the beryllium window that X ray can pass through, The side wall of the adapter flange, the base flange and the beryllium window surround a vacuum chamber jointly, and the CCD detection module is also wrapped Ccd detector is included, the ccd detector is located at the vacuum chamber and is connected with radiator structure, and the pin of the ccd detector leads to The aviation socket crossed on the base flange is connected with the diffraction control panel.
Further, the radiator structure includes what is be connected in the vacuum chamber and with the inwall of the adapter flange Copper base, and red copper frame and indium sheet positioned at the vacuum chamber, the back side of the ccd detector pass sequentially through the indium sheet and The red copper frame is connected with the base flange, and radiator fan, the copper base and the CCD are provided with outside the base flange The pin of detector is connected by the heat transfer on the ccd detector to the cavity of the vacuum chamber and to pass through the chamber Body distributes heat to the external world.
Further, the diffraction sample platform includes horizontally disposed second base and is slidably located at second bottom The dovetail groove profile flat board of seat, the second base connection X ray collimation adjustment module and its upper surface are arranged with downwards recessed Groove, one second through hole are located at the groove and through the upper and lower surfaces of the second base, and one second micro slide is installed on described Groove, the upper and lower surface of second micro slide are respectively covered with layer of metal lamella, led on second micro slide with described second Position corresponding to hole is provided with the perforation of the diffraction sample for the collection for being used to be placed for difraction spectrum, is pasted with the perforation anti- The organic film that only diffraction sample spills and allows X ray to pass through.
Further, the X-ray emitter includes X-ray tube, is connected with the X-ray tube so that the X-ray tube Internal target inspires the high voltage power supply of the X ray of continuous spectrum, and for reducing the X-ray energy spectral width and irradiation The output controller of angle.
Further, the X ray collimation adjustment module includes having circular hole and upper lead flake setting up and down and lower lead flake, The circular hole of the upper lead flake and the lower lead flake is mutually aligned.
The beneficial effect that the technical scheme that embodiment of the present utility model provides is brought is:Portable X of the present utility model Ray analysis device, (1) are saved angular instrument, within the same time, can be obtained one using the CCD detection module of two dimension Diffraction information in section angular range, shortens analysis time, alleviates device own wt, have portable feature, profit In field application.(2) X-ray diffraction analysis (XRD analysis) and X-ray diffraction analysis (XRF analysis) share a set of X ray and occurred Device, equipment instrument is not only reduced, saved cost, and designed beneficial to apparatus structure, reduce the radiation of X ray.(3) X is penetrated The light path of line diffraction analysis (XRD analysis) and X-ray diffraction analysis (XRF analysis) is separate, in the absence of interfering, ensures The analytical effect of device.
Brief description of the drawings
Fig. 1 is the overall structure diagram of the utility model Portable X-ray analysis device;
Fig. 2 is the front view of the fluorescent samples platform of the utility model Portable X-ray analysis device;
Fig. 3 is Fig. 2 top view;
Fig. 4 is the upward view of the diffraction sample platform of the utility model Portable X-ray analysis device;
Fig. 5 is the structural representation of the CCD detection module of the utility model Portable X-ray analysis device.
Embodiment
It is new to this practicality below in conjunction with accompanying drawing to make the purpose of this utility model, technical scheme and advantage clearer Type embodiment is further described.
Fig. 1 is refer to, embodiment of the present utility model provides a kind of Portable X-ray analysis device, including X ray hair Raw device 1, x-ray fluorescence analysis unit, X-ray diffraction analysis unit and with the x-ray fluorescence analysis unit and the X ray The spectral analysis module of diffraction analysis unit connection.
Fig. 1 is refer to, the Portable X-ray analysis device also includes supporting construction, and the supporting construction includes being located at Installation top plate 41, the mounting base 40 positioned at lower end and the connection installation top plate 41 of upper end and the mounting base 40 it is outer Shell 8.Installation top plate 41, the mounting base 40 and the shell 8 collectively constitute the confined space for being isolated from the outside, The confined space can prevent the X ray that the light in the external world is injected inside internal interference, and the X ray for being also possible to prevent inside is penetrated Go out to cause radiation pollution.
The X-ray emitter 1 includes X-ray tube, the target so that inside the X-ray tube is connected with the X-ray tube Material excites and sends the high voltage power supply of the X ray of continuous spectrum, and for reducing the X-ray energy spectral width and irradiating angle Output controller.The input of the high voltage power supply is connected with the low-voltage dc power supply of outside, the output of the high voltage power supply The electric current held the voltage of output and exported is lasting and adjustable.The X-ray tube is excited and provided under the excitation of the high voltage power supply There is the X ray of continuous spectrum, but the photon energy of X ray spectrum is wider, is unfavorable for XRD analysis, is adjusted by the output Section device filters out the photon that part energy is higher in the X ray, meanwhile, make the x-ray bombardment converging angular less to one Scope, so as to meet the needs of XRD analysis.
Fig. 1, Fig. 2 and Fig. 3 are refer to, the x-ray fluorescence analysis unit is used for XRF analysis, including for being placed for The fluorescent samples platform 2 of the fluorescent samples of fluorescence spectrum collection, the fluorescent samples platform 2 include the horizontally disposed He of first base 11 Dress sample sloping platform 12 with inclined plane, the angle between the dress sample sloping platform 12 and the first base 11 are 45 °, described first Base 11 has breach, and the opposite sides of the breach offers the first chute, and the dress sample sloping platform 12 is arranged in described first Chute, a side surface of the dress sample sloping platform 12 are provided with the convenient pulling 12 relatively described first base 11 of dress sample sloping platform and slided Handle 14, the dress sample sloping platform 12 can be along first slide in the presence of external force, and as needed, it can be skidded off The first base 11, to be convenient for changing the fluorescent samples.The inclined plane of the dress sample sloping platform 12 is concavely provided with resettlement groove, uses The resettlement groove is removably placed in one first micro slide 13 for carrying the fluorescent samples, first micro slide 13 Centre is circular depressed 19, and the fluorescent samples are positioned in the circular depressed 19, in the inclined plane of the dress sample sloping platform 12 Provided with some fixing holes 17, first micro slide 13 is coordinated to fix by some fixed screws and some fixing holes 17 In the inclined plane of the dress sample sloping platform 12, the fluorescent samples are powdered samples.One first through hole 18 is located at the resettlement groove And through the upper and lower surface of the dress sample sloping platform 12, the upper surface of the dress sample sloping platform 12 is the inclined plane.Described first The upper surface of base 11 be additionally provided with some first mounting holes 15 be used for install shield the housing of X ray light path, and the fluorescence Sample stage 2 is fixed on the installation top plate 41 of the supporting construction by the housing.
The x-ray fluorescence analysis unit also includes secondary sharp under x-ray bombardment for gathering the fluorescent samples Fluorescent photon caused by hair and the fluorescent photon for being gathered it are converted into the fluorescent probe 7 of fluorescence spectrum information, and with institute State the fluorescence control panel 9 for being used to read the fluorescence spectrum information of the connection of fluorescent probe 7, the spectral analysis module and institute Fluorescence control panel 9 is stated to connect to carry out fluorescence analysis.The fluorescent probe 7 is installed on the installation top plate of the supporting construction 41, the fluorescence control panel 9 is located at the outside of the confined space.
Fig. 1 and Fig. 4 are refer to, the X-ray diffraction analysis unit is used for XRD analysis, including positioned at the first through hole X ray collimation adjustment module 3 immediately below 18, some second mounting holes 16 are additionally provided with the first base 11 and are used to install The X ray collimation adjustment module 3, the X ray collimation adjustment module 3 include with circular hole and upper lead flake setting up and down and The circular hole of lower lead flake, the upper lead flake and the lower lead flake is mutually aligned.The photon that the circular hole of superposition forms X ray leads to Road, the aperture of the circular hole is smaller, i.e., the aperture of described passage is smaller, and the angle between movement locus and the passage is larger X-ray photon can be beaten on described on lead flake or the lower lead flake, it is impossible to projected from the passage, therefore be radiated at diffraction sample X-ray photon number on product is few, meets the single-photon counting mode required for XRD analysis.By making the upper lead flake and described The circular hole of the lower lead flake suitable distance that staggers can further reduce the effective aperture of the passage, make the X projected from the passage Angle between ray photons and the passage is smaller, plays a part of collimation.
Fig. 1 and Fig. 4 are refer to, the X-ray diffraction analysis unit also includes being located at the X ray collimation adjustment module 3 Lower section and the diffraction sample platform 4 that is connected with the X ray collimation adjustment module 3 and positioned at the lower section of diffraction sample platform 4 with The CCD detection module 5 of the spectral analysis module connection.The diffraction sample platform 4 includes horizontally disposed second base and swallow Stern notch type flat board 38, the second base are provided with the second chute, and the dovetail groove profile flat board 38 is arranged in second chute, One end of the dovetail groove profile flat board 38 is connected with a baffle plate 36, and the outside of the baffle plate 36 is provided with handle 37, is pulled in external force In the presence of the handle 37, the dovetail groove profile flat board 38 can along second slide, in the case where meeting needs, The dovetail groove profile flat board 38 can skid off the second base, to be convenient for changing sample.The second base connects the X and penetrated Line collimation adjustment module 3, the central area of the lower surface of the dovetail groove profile flat board 38 is concave up to be provided with a groove, and one second carries Thing piece 22 is installed on the groove by the cooperation of screw and the screw 24 of the groove, one second through hole be located at the groove and Upwardly extend through the upper and lower surface of the second base, the upper and lower surface of second micro slide 22 is respectively covered with layer of metal Lamella, position corresponding with second through hole is provided with the collection for being used for being placed for difraction spectrum on second micro slide 22 Diffraction sample perforation 23, being pasted with the perforation 23 prevents the diffraction sample from spilling and allows what X ray passed through to have Machine film.The perforation 23 among second micro slide 22 aligns with the axis of second through hole, is advantageous to diffraction Light passes through.When filling sample, the metal plate layer positioned at the upper surface of the second micro slide 22 is removed first, spread out described Penetrate after sample is put into the perforation 23, the metal plate layer positioned at upper surface is installed again, which makes it be covered in described second, carries The upper surface of thing piece 22.
The spectral analysis module is located in PC, and storage card is additionally provided with the PC.The CCD detection module 5 is logical Cross diffraction control panel 6 to be connected with the spectral analysis module, the diffraction control panel 6 includes being used to drive the CCD detection mould Block 5 operate CCD drive modules and for receiving and handling each frame spectrum picture sent by the CCD detection module 5 Diffraction pretreatment module, the diffraction pretreatment module are connected with the storage card so that the spectrum picture after processing is sent into institute Storage card storage is stated, while the diffraction pretreatment module is connected with the spectral analysis module with by the spectrum picture after processing It is sent to the spectral analysis module and carries out Sample crystals structural analysis.
Fig. 5 is refer to, the CCD detection module 5 includes beryllium window flange 25, base flange 27, and the connection beryllium window Flange 25 and the base flange 27 and the adapter flange of inner hollow 26, the center of the beryllium window flange 25 are penetrated provided with X The beryllium window 28 that line can pass through, the beryllium window 28 are made of metallic beryllium, have good X ray projectiveness.The switching method Orchid 26, the base flange 27, the beryllium window 28 and/or the beryllium window flange 25 surround a vacuum chamber, the CCD detection jointly Module 5 also includes ccd detector 29, and the ccd detector 29 is located at the vacuum chamber and is connected with radiator structure.The radiating Structure includes the copper base 31 being connected in the vacuum chamber and with the inwall of the adapter flange 26, and positioned at described true The red copper frame 32 and indium sheet 30 of cavity, the back side of the ccd detector 29 pass sequentially through the indium sheet 30 and the red copper frame 32 It is connected with the base flange 27, the outside of base flange 27 is provided with radiator fan, the indium sheet 30 and the red copper frame 32 All there is good thermal conductivity, the indium sheet 30 plays hot cushioning effect.The pin of the copper base 31 and the ccd detector 29 Connect the cavity of the heat transfer on the ccd detector 29 to the vacuum chamber to be distributed heat by the cavity To the external world, the pin of the ccd detector 29 passes through the copper base 31 and some wires 34 for being welded in the copper base 31 Connection, then be connected by some wires 34 with the aviation socket 33 on the base flange 27, the base flange Aviation socket 33 on 27 is connected with the diffraction control panel 6, finally realizes the ccd detector 29 and the diffraction control panel 6 connections.
When needing to carry out x-ray fluorescence analysis, first micro slide 13 is placed in the resettlement groove, made described First micro slide 13 shelters from the first through hole 18, prevents X ray from injecting the following X by the first through hole 18 and penetrates Line collimation adjustment module 3 and its subsequent element, the fluorescent samples on first micro slide 13 produce fluorescence in the irradiation of X ray Effect, and secondary excitation produces fluorescent photon, and the fluorescent probe 7 gathers the fluorescent photon, and it is gathered Fluorescent photon is converted into fluorescence spectrum information, the fluorescence control panel 9 reads the fluorescence spectrum information, and by and its read The fluorescence spectrum information reaches the spectral analysis module, is then believed by the spectral analysis module according to the fluorescence spectrum Breath carries out x-ray fluorescence analysis.
When needing to carry out X-ray diffraction analysis, first micro slide 13 on the fluorescent samples platform 2 is removed, is made The first through hole 18 is exposed, and X ray passes through the first through hole 18, is irradiated to the X ray collimation adjustment module 3 and thereafter Continuous element, after the X ray collimation adjustment module 3 collimation, the diffraction sample is irradiated to, is then visited through the CCD Survey the sub-pixels unit that module 5 is detected transmitted through the X ray of the diffraction sample and change into electric charge, the diffraction control panel 6 After the exposure cycle of CCD detection module 5 terminates, the electric charge of each pixel is read, the spectrum analysis is sent to after processing Module carries out X-ray diffraction analysis.
The beneficial effect that the technical scheme that embodiment of the present utility model provides is brought is:Portable X of the present utility model Ray analysis device, (1) are saved angular instrument, within the same time, can be obtained one using the CCD detection module 5 of two dimension Diffraction information in section angular range, shortens analysis time, alleviates device own wt, have portable feature, profit In field application.(2) X-ray diffraction analysis (XRD analysis) and X-ray diffraction analysis (XRF analysis) share a set of X ray and occurred Device 1, not only reduces equipment instrument, has saved cost, and is designed beneficial to apparatus structure, reduces the radiation of X ray.(3) X is penetrated The light path of line diffraction analysis (XRD analysis) and X-ray diffraction analysis (XRF analysis) is separate, in the absence of interfering, ensures The analytical effect of device.
Herein, the involved noun of locality such as forward and backward, upper and lower is to be located at parts in accompanying drawing in figure and zero The mutual position of part is intended merely to the clear of expression technology scheme and conveniently come what is defined.It should be appreciated that the noun of locality Use should not limit the claimed scope of the application.
In the case where not conflicting, the feature in embodiment and embodiment herein-above set forth can be combined with each other.
Preferred embodiment of the present utility model is the foregoing is only, it is all in this practicality not to limit the utility model Within new spirit and principle, any modification, equivalent substitution and improvements made etc., guarantor of the present utility model should be included in Within the scope of shield.

Claims (10)

1. a kind of Portable X-ray analysis device, including X-ray emitter, x-ray fluorescence analysis unit, X-ray diffraction analysis Unit and the spectral analysis module being connected with the x-ray fluorescence analysis unit and the X-ray diffraction analysis unit, its feature It is:The x-ray fluorescence analysis unit includes the fluorescent samples platform for being used to be placed for the fluorescent samples of fluorescence spectrum collection, The fluorescent samples platform include horizontally disposed and tool first base jaggy and slidably located at the breach and tool There is the dress sample sloping platform of inclined plane, the inclined plane of the dress sample sloping platform is arranged with resettlement groove, for carrying the one of the fluorescent samples First micro slide is removably placed in the resettlement groove, and a first through hole is located at the resettlement groove and through the dress sample sloping platform Upper and lower surface;The X-ray diffraction analysis unit includes the X ray collimation adjustment mould immediately below the first through hole Block, the diffraction sample platform being connected with the lower end of the X ray collimation adjustment module and below the diffraction sample platform with The CCD detection module of the spectral analysis module connection.
2. Portable X-ray analysis device as claimed in claim 1, it is characterised in that:The x-ray fluorescence analysis unit is also Including fluorescent photon caused by secondary excitation and it being gathered under x-ray bombardment for gathering the fluorescent samples Fluorescent photon is converted into the fluorescent probe of fluorescence spectrum information, and is connected with the fluorescent probe described glimmering for reading The fluorescence control panel of light spectral information, the spectral analysis module are connected with the fluorescence control panel to carry out fluorescence analysis.
3. Portable X-ray analysis device as claimed in claim 2, it is characterised in that:It is described dress sample sloping platform inclined plane with Angle between the first base is 45 °, and in the side surface of the dress sample sloping platform side opposite with the fluorescent probe The convenient handle for pulling the relatively described first base of dress sample sloping platform to slide is provided with, the centre of first micro slide is circle Shape is recessed, and the fluorescent samples are positioned in the circular depressed.
4. Portable X-ray analysis device as claimed in claim 2, it is characterised in that:The Portable X-ray analysis device Also include supporting construction, the supporting construction is included positioned at upper end for installing the fluorescent probe and the fluorescent samples The installation top plate of platform, positioned at lower end be used for install the CCD detection module mounting base and connection it is described installation top plate and The shell of the mounting base.
5. Portable X-ray analysis device as claimed in claim 1, it is characterised in that:The spectral analysis module is located at PC In machine, storage card is additionally provided with the PC, the CCD detection module is connected by diffraction control panel and the spectral analysis module Connect, the diffraction control panel drives the CCD drive modules of the CCD detection module running and for receiving and handling including being used for The diffraction pretreatment module for each frame spectrum picture that the CCD detection module is sent, the diffraction pretreatment module with it is described Storage card connection is stored so that the spectrum picture after processing is sent into the storage card, the diffraction pretreatment module and the light The connection of spectrum analysis module carries out Sample crystals structural analysis so that the spectrum picture after processing is sent into the spectral analysis module.
6. Portable X-ray analysis device as claimed in claim 5, it is characterised in that:The CCD detection module includes beryllium window Flange, base flange and the connection beryllium window flange and the base flange and the adapter flange of inner hollow, the beryllium window The center of flange is provided with the beryllium window that X ray can pass through, the side wall of the adapter flange, the base flange and the beryllium Window surrounds a vacuum chamber jointly, and the CCD detection module also includes ccd detector, and the ccd detector is located at the vacuum chamber And be connected with radiator structure, the pin of the ccd detector is spread out by the aviation socket on the base flange with described Penetrate control panel connection.
7. Portable X-ray analysis device as claimed in claim 6, it is characterised in that:The radiator structure includes being located at institute State the copper base being connected in vacuum chamber and with the inwall of the adapter flange, and red copper frame and indium positioned at the vacuum chamber Piece, the back side of the ccd detector passes sequentially through the indium sheet and the red copper frame is connected with the base flange, the base Radiator fan is provided with outside flange, the copper base is connected with the pin of the ccd detector to by the ccd detector Heat transfer to the vacuum chamber cavity and heat is distributed to the external world by the cavity.
8. Portable X-ray analysis device as claimed in claim 1, it is characterised in that:The diffraction sample platform includes level The second base of setting and the dovetail groove profile flat board for being slidably located at the second base, the second base connect the X Ray collimation adjustment module, the lower surface of the dovetail groove profile flat board is concave up to be provided with groove, and one second through hole is positioned at described recessed Groove and upwardly extend through the upper and lower surface of the second base, one second micro slide is installed on the groove, and described second carries The upper and lower surface of thing piece is respectively covered with layer of metal lamella, and position corresponding with second through hole is set on second micro slide There is the perforation for being placed for the diffraction sample of the collection of difraction spectrum, being pasted with the perforation prevents the diffraction sample The organic film for spilling and allowing X ray to pass through.
9. Portable X-ray analysis device as claimed in claim 1, it is characterised in that:The X-ray emitter is penetrated including X Spool, it is connected so that the target inside the X-ray tube inspires the high-tension electricity of the X ray of continuous spectrum with the X-ray tube Source, and for reducing the output controller of the X-ray energy spectral width and irradiating angle.
10. Portable X-ray analysis device as claimed in claim 1, it is characterised in that:The X ray collimation adjustment module Including with circular hole and upper lead flake setting up and down and lower lead flake, the circular hole of the upper lead flake and the lower lead flake is mutually aligned.
CN201720888376.XU 2017-07-21 2017-07-21 A kind of Portable X-ray analysis device Expired - Fee Related CN207198068U (en)

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CN201720888376.XU CN207198068U (en) 2017-07-21 2017-07-21 A kind of Portable X-ray analysis device

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107228871A (en) * 2017-07-21 2017-10-03 中国地质大学(武汉) A kind of Portable X-ray analysis device
CN109323653A (en) * 2018-11-14 2019-02-12 江苏六仪器有限公司 A kind of X-ray spot location instrument and its localization method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107228871A (en) * 2017-07-21 2017-10-03 中国地质大学(武汉) A kind of Portable X-ray analysis device
CN109323653A (en) * 2018-11-14 2019-02-12 江苏六仪器有限公司 A kind of X-ray spot location instrument and its localization method
CN109323653B (en) * 2018-11-14 2024-03-08 江苏一六仪器有限公司 X-ray facula positioning instrument and positioning method thereof

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