CN207163928U - Glass substrate inspection system - Google Patents
Glass substrate inspection system Download PDFInfo
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- CN207163928U CN207163928U CN201721275637.7U CN201721275637U CN207163928U CN 207163928 U CN207163928 U CN 207163928U CN 201721275637 U CN201721275637 U CN 201721275637U CN 207163928 U CN207163928 U CN 207163928U
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- glass substrate
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- harvester
- collecting device
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Abstract
A kind of this disclosure relates to glass substrate inspection system.The glass substrate carries out horizontal transmission with vertical state by conveyer, and the system includes：Image collecting device, for gathering the image of the glass substrate；Image processing apparatus, it is connected with described image harvester, for receiving described image and described image being handled, information the defects of to obtain the glass substrate；Adjusting apparatus, be connected with described image harvester, for being horizontally advanced in the glass substrate during adjust described image harvester position, described image harvester is vertically reciprocated.Thus, it is possible to the quick detection to glass substrate defect is realized while glass substrate defects detection accuracy is ensured.
Description
Technical field
This disclosure relates to glass substrate manufacture field, in particular it relates to a kind of glass substrate inspection system.
Background technology
One of the key foundation material of glass substrate as FPD industry, application is quite varied.In glass substrate
In production process, due to the influence of production process and production environment, glass substrate there may be defect, and such as abrasion, surface are split
Line, surface dust, internal flaw etc..Therefore, it is necessary to check glass substrate.In the prior art, for glass substrate
Defect inspection mode is relatively simple, and accuracy is relatively low, and defect can not check simultaneously.Also, in some inspection operations
In, it is not high to the control accuracy of check device, easily cause raw material and the time wastes.
Utility model content
The purpose of the disclosure is to provide a kind of glass substrate inspection system, to realize the quick inspection comprehensively to glass substrate
Look into.
To achieve these goals, the disclosure provides a kind of glass substrate inspection system, and the glass substrate is with vertical shape
State carries out horizontal transmission by conveyer, and the system includes：Image collecting device, for gathering the figure of the glass substrate
Picture；Image processing apparatus, it is connected with described image harvester, for receiving described image and described image being handled,
The defects of to obtain the glass substrate information；Adjusting apparatus, it is connected with described image harvester, in the glass base
Plate level adjusts the position of described image harvester during advancing, described image harvester is vertically come and gone
It is mobile
Alternatively, the adjusting apparatus includes：Adjustment mechanism, it is connected with described image harvester, it is described for adjusting
The position of image collecting device；Vertically continuously arranged multiple sensors, for detecting the glass substrate along vertically
The position range in direction；Control module, it is connected with the adjustment mechanism and the multiple sensor, for according to the position model
The system adjustment mechanism is contained, it is adjusted described image harvester and shifting is come and gone in the position range of vertical direction
It is dynamic.
Alternatively, described image harvester is CCD camera.
Alternatively, the system also includes radiation source, for gathering the glass substrate in described image harvester
Image when irradiate the glass substrate.
Alternatively, the radiation source is LED illuminator.
Alternatively, the system also includes：Alarm set, it is connected with described image processing unit, for according to the figure
As the defect information that processing unit obtains is reminded.
Alternatively, the alarm set include it is following at least one：Electronic display, light prompting device, voice reminder
Device.
Alternatively, the system also includes base, for supporting the adjusting apparatus.
Pass through above-mentioned technical proposal, it can be realized while glass substrate defects detection accuracy is ensured to glass substrate
The quick detection of defect.
Other feature and advantage of the disclosure will be described in detail in subsequent specific embodiment part.
Brief description of the drawings
Accompanying drawing is for providing further understanding of the disclosure, and a part for constitution instruction, with following tool
Body embodiment is used to explain the disclosure together, but does not form the limitation to the disclosure.In the accompanying drawings：
Fig. 1 is the schematic diagram of the glass substrate inspection system provided according to a kind of embodiment of the disclosure.
Fig. 2 is a kind of example arrangement signal of adjusting apparatus in the glass substrate inspection system provided according to the disclosure
Figure.
In the glass substrate inspection system that Fig. 3 is provided according to the disclosure, the schematic diagram of a scenario of adjusting apparatus at work.
Fig. 4 is the signal of the motion track of image collecting device in the glass substrate inspection system provided according to the disclosure
Figure.
Description of reference numerals
The image processing apparatus of 101 image collecting device 102
The adjustment mechanism of 103 adjusting apparatus 104
The control module of 105 sensor 106
3 glass substrates
Embodiment
The embodiment of the disclosure is described in detail below in conjunction with accompanying drawing.It should be appreciated that this place is retouched
The embodiment stated is merely to illustrate and explained the disclosure, is not limited to the disclosure.
Fig. 1 is the schematic diagram of the glass substrate inspection system provided according to a kind of embodiment of the disclosure.Such as Fig. 1 institutes
Show, the glass substrate inspection system can include：
Image collecting device 101, for gathering the image of glass substrate；
Image processing apparatus 102, it is connected with image collecting device 101, collects for receiving image collecting device 101
Image is simultaneously handled image, information the defects of to obtain glass substrate；
Adjusting apparatus 103, be connected with image collecting device 101, for being horizontally advanced in glass substrate during adjust
The position of image collecting device 101, makes it vertically reciprocate.
Image collecting device 101 can be high precision image collecting device, to ensure the essence to glass substrate IMAQ
True property.Illustratively, image collecting device can be CCD (charge coupling device) camera, CCD camera candid photograph speed is fast, effect is good,
The precision of images is high, can obtain the image of very high quality, be advantageous to follow-up glass substrate inspection.
The image collecting device 101 can be arranged in adjusting apparatus 103, and the adjustment of adjusted device 103 can be realized
The reciprocating vertically of image collecting device 101.
In one embodiment, the structure of adjusting apparatus 103 can be with as shown in Fig. 2 adjusting apparatus 103 can include：
Adjustment mechanism 104, multiple sensors 105 (including 1051~105N) and control module 106.
Sensor 1051~105NCan vertically continuous arrangement, to detect glass substrate when glass substrate reaches
Position range vertically.Illustratively, sensor 1051~105NIt can be infrared ray sensor.
In a kind of exemplary embodiment, it is single that control module 106 can include receiving unit, computing unit and control
Member.Wherein, receiving unit can be with above-mentioned vertically continuously arranged sensor 1051~105NIt is connected, to receive detection
As a result, i.e. the location of glass substrate scope.Computing unit can be connected with receiving unit, to be received according to receiving unit
Position range determine the goal activities scope of image collecting device.Illustratively, as shown in figure 3, when glass substrate 3 is sent to
Sensor 1051~105NDuring present position, sensor 1051~105NThe position of glass substrate vertically can be detected
Scope, as shown in AB in figure, receiving unit can receive the position range, accordingly, the target location that computing unit determines
Scope can be as shown in CD in figure.Control unit can be connected with computing unit, and the mesh that can be determined according to computing unit
Cursor position scope control adjustment mechanism 104.Adjustment mechanism 104 can be connected with image collecting device 101, can be adopted with control figure picture
Acquisition means 101 reciprocate in the target location scope.
In one embodiment, the track of image acquisition device glass substrate image can with as shown in figure 4, its
In, glass substrate 3 is moved in the horizontal direction with vertical state under the transmission of conveyer, as shown in horizontal arrow in Fig. 4.Figure
As harvester 101 is vertically reciprocated to gather the image of glass substrate.Illustratively, such as vertical direction in Fig. 4
Shown in arrow, image collecting device 101 by coming and going the IMAQ that can be completed to glass substrate 3 twice.
With reference to horizontal transmission of the conveyer to glass substrate and image collecting device vertically in target zone
Interior reciprocates, and can save the time with the picture rich in detail of Quick Acquisition to glass substrate, also, by image collector
Abrasion between adjusting apparatus and image collecting device can also be reduced by putting the control of scope of activities.
Image processing apparatus 102 can be connected with image collecting device 101.When image collecting device 101 collects image
Afterwards, image processing apparatus 102 can receive the image and image is handled.Illustratively, can be with image processing apparatus
The defects of being previously stored with glass substrate characteristics of image, the defects of defect image feature can be glass substrate all types, are special
The set of sign.The image that is collected according to image collecting device 101 and characteristics of image the defects of prestore, can obtain glass base
The defects of plate information.Illustratively, when the image of the glass substrate collected meets the characteristics of image of surface abrasion, image procossing
The result that device obtains is that glass substrate has the defects of surface abrasion.For another example when the image symbol of the glass substrate collected
Close surface dust and the internal result that when characteristics of image of bubble be present, image processing apparatus obtains is has inside glass substrate
Bubble and surface attachment has dust.
Above-mentioned to determine that defect type belongs to prior art using image characteristics extraction, those skilled in the art can realize,
Herein without being described in detail.
In one embodiment, image processing apparatus 102 can gather glass substrate image in image collecting device 101
During carry out image procossing.In another embodiment, image processing apparatus 102 can be in image collecting device 101
Complete to carrying out image procossing after the IMAQ of glass substrate.
By such scheme, can be realized while glass substrate defects detection accuracy is ensured to glass substrate defect
Quick detection.
Because image collecting device 101 is during glass substrate image is gathered, the image collected can be by surrounding
The influence of light, therefore, radiation source is also provided with the glass substrate inspection system that the disclosure provides, is adopted in image
Acquisition means 101 irradiate glass substrate during gathering glass substrate image, the illumination-constant for being subject to glass substrate, reduce it
His influence of the light to IMAQ.Illustratively, radiation source can be LED illuminator.Also, the radiation source can be set
In the homonymy of image collecting device, or, the radiation source can be located at glass substrate not respectively with image collecting device 101
Homonymy.
In another embodiment, the glass substrate inspection system that the disclosure provides can also include alarm set, carry
Awake device can be connected with image processing apparatus 102, for being entered according to the result of image processing apparatus 102 to defect information
Row is reminded.Alarm set can include but is not limited at least one of following：Electronic display, light prompting device, voice
Alarm set.Illustratively, can be by showing word, image etc. on the electronic display screen if alarm set is electronic display
Mode is reminded defect information.For another example if alarm set is light prompting device, the instruction of different colours can be passed through
The modes such as the combination of lamp or indicator lamp are reminded defect information., can be with for another example if alarm set is speech prompting device
Defect information is reminded by modes such as voice broadcast, buzzers.Alternatively, above-mentioned alarm set can also be utilized not
The prompting to defect information is realized with combination.
In addition, the glass substrate inspection system that the disclosure provides can also include base, for supporting and adjusting device 103,
Adjusting apparatus 103 is set to keep stable when carrying out position adjustment to image collecting device 101.
The preferred embodiment of the disclosure is described in detail above in association with accompanying drawing, still, the disclosure is not limited to above-mentioned reality
The detail in mode is applied, in the range of the technology design of the disclosure, a variety of letters can be carried out to the technical scheme of the disclosure
Monotropic type, these simple variants belong to the protection domain of the disclosure.
It is further to note that each particular technique feature described in above-mentioned embodiment, in not lance
In the case of shield, it can be combined by any suitable means.In order to avoid unnecessary repetition, the disclosure to it is various can
The combination of energy no longer separately illustrates.
In addition, it can also be combined between a variety of embodiments of the disclosure, as long as it is without prejudice to originally
Disclosed thought, it should equally be considered as disclosure disclosure of that.
Claims (8)
1. a kind of glass substrate inspection system, the glass substrate carry out horizontal transmission with vertical state by conveyer, it is special
Sign is that the system includes：
Image collecting device, for gathering the image of the glass substrate；
Image processing apparatus, it is connected with described image harvester, for receiving described image and described image being handled,
The defects of to obtain the glass substrate information；
Adjusting apparatus, be connected with described image harvester, for being horizontally advanced in the glass substrate during adjust institute
The position of image collecting device is stated, described image harvester is vertically reciprocated.
2. system according to claim 1, it is characterised in that the adjusting apparatus includes：
Adjustment mechanism, it is connected with described image harvester, for adjusting the position of described image harvester；
Vertically continuously arranged multiple sensors, for detecting the position range of the glass substrate vertically；
Control module, it is connected with the adjustment mechanism and the multiple sensor, for according to position range control
Adjustment mechanism, it is adjusted described image harvester and reciprocated in the position range of vertical direction.
3. system according to claim 1, it is characterised in that described image harvester is CCD camera.
4. system according to claim 1, it is characterised in that the system also includes radiation source, in the figure
The glass substrate is irradiated when gathering the image of the glass substrate as harvester.
5. system according to claim 4, it is characterised in that the radiation source is LED illuminator.
6. system according to claim 1, it is characterised in that the system also includes：
Alarm set, it is connected with described image processing unit, for the defect letter obtained according to described image processing unit
Breath is reminded.
7. system according to claim 6, it is characterised in that the alarm set include it is following at least one：Electronic display
Display screen, light prompting device, speech prompting device.
8. system according to claim 1, it is characterised in that the system also includes base, for supporting the adjustment
Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721275637.7U CN207163928U (en) | 2017-09-29 | 2017-09-29 | Glass substrate inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721275637.7U CN207163928U (en) | 2017-09-29 | 2017-09-29 | Glass substrate inspection system |
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| Publication Number | Publication Date |
|---|---|
| CN207163928U true CN207163928U (en) | 2018-03-30 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201721275637.7U Active CN207163928U (en) | 2017-09-29 | 2017-09-29 | Glass substrate inspection system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108872256A (en) * | 2018-09-13 | 2018-11-23 | 广东中航特种玻璃技术有限公司 | A kind of method of on-line checking original sheet glass impurity |
-
2017
- 2017-09-29 CN CN201721275637.7U patent/CN207163928U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108872256A (en) * | 2018-09-13 | 2018-11-23 | 广东中航特种玻璃技术有限公司 | A kind of method of on-line checking original sheet glass impurity |
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Denomination of utility model: Glass substrate inspection system and manufacturing method of glass substrate Effective date of registration: 20200710 Granted publication date: 20180330 Pledgee: Beijing State Owned Financial Leasing Co., Ltd Pledgor: WUHU DONGXU OPTOELECTRONIC EQUIPMENT TECHNOLOGY Co.,Ltd. Registration number: Y2020990000735 |