CN206726068U - Suppress the control system of infrared focus plane temperature anomaly - Google Patents
Suppress the control system of infrared focus plane temperature anomaly Download PDFInfo
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- CN206726068U CN206726068U CN201720524087.1U CN201720524087U CN206726068U CN 206726068 U CN206726068 U CN 206726068U CN 201720524087 U CN201720524087 U CN 201720524087U CN 206726068 U CN206726068 U CN 206726068U
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Abstract
This application discloses a kind of control system for suppressing infrared focus plane temperature anomaly, belong to infrared thermal imaging technique field.The system includes infrared focal plane detector, semiconductor thermoelectric refrigeration device TEC controllers, TEC power supply circuits, processor and system power supply, system power supply is connected with TEC power supply circuits and processor respectively, the Enable Pin of processor and TEC power supply circuits is electrically connected with, TEC power supply circuits are connected with the Enable Pin of TEC controllers, processor is connected with the input of TEC controllers, and TEC controllers are connected with infrared focal plane detector.The opportunity that processor control TEC power supply circuits are powered to TEC controllers in the application, ensure infrared acquisition equipment during preparation of starting shooting, starup current is stable, detector focal plane temperature is constant, too fast, temperature oscillation of infrared focus plane transient temperature rise etc. is not caused to cause infrared image quality to decline extremely, so as to export the higher graphic images of quality.
Description
Technical field
The present invention relates to infrared thermal imaging technique field, more particularly to a kind of control for suppressing infrared focus plane temperature anomaly
System.
Background technology
With the continuous maturation of domestic infrared detector manufacturing process, increasing domestic infrared detector civilian and
Military markets are used widely.Infrared detector has been internally integrated semiconductor thermoelectric refrigeration device in shell(English:Thermo
Electric Cooler, referred to as:TEC), the outside TEC controllers of infrared detector needs are on infrared detector focal plane
Pixel is freezed or heated, so that infrared detector internal sensor maintains a stable temperature spot, to infrared
The TEC control strategies of detector directly affect infrared detector focal plane response sensitivity and image output quality.Infrared spy
Equipment is surveyed due to its special imaging mechanism, in starting up in the presence of certain start time, is during this period
System is in initialization procedure, and the TEC controls of infrared detector focal plane are in a kind of nondeterministic statement, so as to cause infrared spy
Survey that device focal plane transient temperature rise is too fast, and temperature is shaken repeatedly, causes focal plane caloric value huge, directly affects follow-up heat into
As quality.
The infrared detector being mentioned herein refer to using domestic vanadium oxide detector individual soldier portable uncooled ir equipment,
Vehicle-mounted uncooled ir equipment and various air forces, naval's uncooled ir equipment.The characteristics of domestic infrared detector:Core device
Part uses domestic vanadium oxide detector, and the detector needs outside TEC circuits to control.
Existing domestic infrared detector is required to outside TEC controllers and carries out temperature control to detector focal plane, makes spy
Survey each pixel of device and be maintained at a stationary temperature state, so as to can guarantee that the image of detector output can keep good uniform
Property.At this stage, TEC controllers mainly cooperate with processing with processor using special TEC control chips and TEC control chips
Mode is realized.TEC controllers and TEC software controlling strategies directly affect the image quality of infrared detector equipment
It is good and bad.
And at present, the temperature rise of detector focal plane is too fast during domestic infrared acquisition equipment starting up, stabilization process of starting shooting
Middle focal plane temperature is shaken repeatedly, and start stabilization time is long, and it is poor to directly result in detector output image heterogeneity, heat into
As image quality decrease.
The content of the invention
The present invention provides a kind of control system for suppressing infrared focus plane temperature anomaly, and the purpose is to filled for infrared acquisition
Suppress infrared focus plane temperature anomaly during standby starting up, avoid infrared focus plane because temperature rise is too high and temperature oscillation etc. causes
Infrared image output abnormality.The technical scheme is as follows:
First aspect, there is provided a kind of control system for suppressing infrared focus plane temperature anomaly, the control system include red
Outer focus planar detector, semiconductor thermoelectric refrigeration device TEC controllers, TEC power supply circuits, processor and system power supply, wherein:
The system power supply is electrically connected with the TEC power supply circuits and the processor respectively, and the processor is powered with the TEC
The Enable Pin of circuit is electrically connected with, and the Enable Pin of the TEC power supply circuits and the TEC controllers is electrically connected with, the processor also with
The input of the TEC controllers is electrically connected with, and the TEC controllers are electrically connected with the infrared focal plane detector.
Optionally, control system also includes being used for the environment temperature and infrared focus plane for sensing infrared focal plane detector
The temperature sensor of the temperature of detector, temperature sensor are electrically connected with processor.
Pass through above-mentioned technical proposal, the technique effect that the application can realize comprise at least:By the way that processor and TEC are supplied
The Enable Pin of circuit is electrically connected, the Enable Pin of TEC power supply circuits and TEC controllers is electrically connected, so that processing
On the opportunity that device is powered according to predetermined control strategy control TEC power supply circuits to TEC controllers, ensure that infrared acquisition equipment is being started shooting
During preparation, starup current is stable, and detector focal plane temperature is constant, ensure that each pixel of detector is maintained at a perseverance
Fixed state of temperature, too fast, temperature oscillation of infrared focus plane transient temperature rise etc. is not caused to cause infrared image quality to decline extremely,
So as to export the higher graphic images of quality.
It should be appreciated that the general description and following detailed description of the above are only exemplary, this can not be limited
Invention.
Brief description of the drawings
Accompanying drawing herein is merged in specification and forms the part of this specification, shows the implementation for meeting the present invention
Example, and for explaining principle of the invention together with specification.
Fig. 1 is a kind of control system for suppression infrared focus plane temperature anomaly that the present invention provides according to an exemplary embodiment
The structural representation of system.
Embodiment
Here exemplary embodiment will be illustrated in detail, its example is illustrated in the accompanying drawings.Following description is related to
During accompanying drawing, unless otherwise indicated, the same numbers in different accompanying drawings represent same or analogous key element.Following exemplary embodiment
Described in embodiment do not represent and the consistent all embodiments of the present invention.On the contrary, they be only with it is such as appended
The example of the consistent apparatus and method of some aspects being described in detail in claims, of the invention.
For existing domestic infrared acquisition equipment when starting shooting work, start transient current is excessive, and detector focal plane has hair
Heat is excessive, the situation of temperature anomaly, causes the too fast output image quality variation of detector temperature rise of starting shooting.
This is directed to, the invention provides a kind of control method for suppressing infrared focus plane temperature anomaly, it can realize state
It is stable to produce infrared acquisition equipment starup current when starting shooting work, it is too fast to prevent that detector focal plane temperature from rising, so as to ensure
The stable clearly graphic images of detector output.
Shown in Figure 1, it is a kind of suppression infrared focus plane temperature that the present invention provides according to an exemplary embodiment
The structural representation of abnormal control system is spent, the control system of the suppression infrared focus plane temperature anomaly includes infrared focus plane
Detector 110, TEC controllers 120, TEC power supply circuits 130, processor 140, system power supply 150 and temperature sensor 160, its
In:
System power supply 150 is electrically connected with TEC power supply circuits 130 and processor 140 respectively, respectively TEC power supply electricity
Road 130 and processor 140 are powered.
The Enable Pin of processor 140 and TEC power supply circuits 130 is electrically connected with, the work of control TEC power supply circuits 130 when
Machine.
The Enable Pin of TEC power supply circuits 130 and TEC controllers 120 is electrically connected with, the work of control TEC controllers 120 when
Machine.
Processor 140 is also electrically connected with the input of TEC controllers 120, and control TEC controllers 120 perform corresponding behaviour
Make.
TEC controllers 120 are electrically connected with infrared focal plane detector 110, are the picture on infrared focal plane detector 110
Member heating or refrigeration.
Temperature sensor 160 is electrically connected with processor 140, and temperature sensor 160 is used to sense infrared focus plane detection
The ambient temperature information of device and the temperature information of infrared focal plane detector, and by the ambient temperature information sensed and temperature
Information is sent to temperature sensor 160.
In a kind of possible implementation, TEC controllers can select the ADN8830 of ADI companies, and ADN8830 is one
Kind of TEC controllers with height output efficiency, using half switch output, the mode H bridge modes of half linear convergent rate can be with for it
Control TEC senses of current and size simultaneously, it is often more important that it has an output Enable Pin, and Enable Pin is exported by controlling
Voltage supply can effectively control ADN8830 output to enable.The MOSFET selections of TEC controllers hinder with relatively low switch
It is anti-, it can effectively prevent the loss of power supply and improve switch efficiency.Here metal-oxide-semiconductor can select Fairchild companies
FDW2520C, is the metal-oxide-semiconductor of N-channel, maximum permissible current 6A, and hindrance only has 18m Ω.
TEC power supply circuits can use the LDO chips with multiple-channel output, and the selection requirements of LDO chips should have each
Road power supply can be enabled independently.Here what TEC power supply circuits were selected is the TPS65251 chips of TI companies, and the chip has three
Road voltage output, and per can independently enable all the way, so as to ensure to cooperate with processing with software algorithm.
Processor uses Cyclone IV EP3C40 chips, and this is the FPGA process chips of a low-power consumption,
The TPS65251 voltage-controlled Enable Pin access fpga chip pins of TEC.
The selection of above-mentioned TEC controllers, TEC power supply circuits and processor is only a kind of illustrative examples, actually should
In, other models can also be selected, the present embodiment is to this without limiting.
With reference to the control system shown in Fig. 1, the control of the suppression infrared focus plane temperature anomaly provided the application
Method is illustrated.
The control method of the suppression infrared focus plane temperature anomaly is applied in the control system shown in Fig. 1, this method bag
Include following steps:
First, suppress infrared focus plane temperature anomaly control system start on it is electric when, processor carries out initialization behaviour
Make, the Enable Pin being connected on TEC power supply circuits with processor is pulled low, the enabled electricity that TEC power supply circuits export to TEC controllers
Pressure is zero.
Processor can include the initialization to multiple modules in processor during initialization operation is carried out, than
Such as include following initialization operation process:
FPGA module in S1, processor first carries out power-on initialization operation;
S2, after the completion of FPGA module initialization, power-up initializing is carried out to the soft core of NIOS II inside processor
Operation;
S3, after the completion of the soft core power-up initializings of the NIOS II, the operation control centre to the infrared focal plane detector
OCC configuration datas are carried, carry out initialization operation to synchronous DRAM SDRAM.
In general, in the control system start for suppress infrared focus plane temperature anomaly after electricity, Jiao of infrared detector
Plane, FPGA are in power up initialization process, and the Enable Pin of TEC power supply circuits is by access FPGA, power up initialization process
In be pulled low, the enabled voltage of now TEC power supply circuits output is zero.
In system electrification, FPGA first carries out initialization operation(FPGA initialization, NIOS initialization and data are carried
Deng), because the voltage output Enable Pin of TEC power supply circuits accesses FPGA, Enable Pin is pulled low in initialization procedure, and TEC is supplied
Circuit is zero to the voltage output of TEC controllers(This voltage is that the output of TEC controllers enables voltage), now TEC controls
Device does not carry out temperature control to detector focal plane, and now the temperature of detector should be consistent substantially with environment temperature.
Second, when processor initialization after the completion of, processor draw high be connected on the TEC power supply circuits with processor enable
The voltage at end, TEC power supply circuits start to export enabled voltage to TEC controllers, and TEC controllers start to visit the infrared focus plane
Survey device and carry out temperature control.
After the completion of processor initialization, processor draws high the Enable Pin being connected on the TEC power supply circuits with the processor
Voltage.That is, after the completion of processor initialization, and receive the environment of the infrared focal plane detector in processor
After the temperature information of temperature information and infrared focal plane detector, according to ambient temperature information and infrared focal plane detector
Temperature information select corresponding TEC control strategies, after TEC control strategies come into force, processor draws high the TEC power supply circuits
Enable Pin.Here the ambient temperature information for the infrared focal plane detector that processor receives and infrared focal plane detector
Temperature information is by being sent to processor after temperature sensor senses.
After FPGA initializes completion and reads detector environment temperature and detector temperature, internal TEC control strategies
Come into force, now draw high the Enable Pin of TEC power supply circuits, TEC controllers start to carry out temperature control to detector focal plane, added
It is relative at one at temperature within the extremely short time with the processing that cooperates with of the mos pipes of outside low switch impedance, detector focal plane
In constant state(Temperature spot specified in TEC control strategies), effectively avoid the too fast rising of detection focal plane temperature
And shake repeatedly, so as to ensure that detector has preferable output image quality.
After TEC controllers start to carry out temperature control to infrared focal plane detector, this method also includes at image
The process of output is managed, such as, after the temperature stabilization of infrared focal plane detector, controller starts to detect the infrared focus plane
Device carries out Timing driver, and the original image exported to infrared focal plane detector is acquired, the original image progress to collection
Predetermined process, the image after predetermined process is encoded and exported.
In summary, the control system provided in an embodiment of the present invention for suppressing infrared focus plane temperature anomaly, by ingenious
Make use of the enabled output of TEC controllers in hardware circuit to select, the enabled selection of TEC power supply circuits and with software TEC control
The strategy combination of algorithm processed, so as to ensure that focal plane temperature is quickly in a relatively steady state.
Those skilled in the art will readily occur to the present invention its after considering specification and putting into practice the invention invented here
Its embodiment.The application be intended to the present invention any modification, purposes or adaptations, these modifications, purposes or
Person's adaptations follow the general principle of the present invention and the common knowledge in the art do not invented including the present invention
Or conventional techniques.Description and embodiments are considered only as exemplary, and true scope and spirit of the invention are by following
Claim is pointed out.
It should be appreciated that the invention is not limited in the precision architecture for being described above and being shown in the drawings, and
And various modifications and changes can be being carried out without departing from the scope.The scope of the present invention is only limited by appended claim.
Claims (2)
1. a kind of control system for suppressing infrared focus plane temperature anomaly, it is characterised in that the control system includes infrared Jiao
Planar detector, semiconductor thermoelectric refrigeration device TEC controllers, TEC power supply circuits, processor and system power supply, wherein:
The system power supply is electrically connected with the TEC power supply circuits and the processor respectively, the processor with it is described
The Enable Pin of TEC power supply circuits is electrically connected with, and the Enable Pin of the TEC power supply circuits and the TEC controllers is electrically connected with, institute
State input of the processor also with the TEC controllers to be electrically connected with, the TEC controllers and the infrared focal plane detector
It is electrically connected with.
2. control system according to claim 1, it is characterised in that the control system also includes described red for sensing
The temperature sensor of the environment temperature of outer focus planar detector and the temperature of the infrared focal plane detector, the temperature pass
Sensor is electrically connected with the processor.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106959711A (en) * | 2017-05-11 | 2017-07-18 | 江苏北方湖光光电有限公司 | Suppress the control system and method for infrared focus plane temperature anomaly |
CN110262589A (en) * | 2019-05-23 | 2019-09-20 | 南京牧镭激光科技有限公司 | A kind of TEC temperature control driving circuit and its control strategy |
-
2017
- 2017-05-11 CN CN201720524087.1U patent/CN206726068U/en active Active
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106959711A (en) * | 2017-05-11 | 2017-07-18 | 江苏北方湖光光电有限公司 | Suppress the control system and method for infrared focus plane temperature anomaly |
CN106959711B (en) * | 2017-05-11 | 2018-12-25 | 江苏北方湖光光电有限公司 | Inhibit the control system and method for infrared focus plane temperature anomaly |
CN110262589A (en) * | 2019-05-23 | 2019-09-20 | 南京牧镭激光科技有限公司 | A kind of TEC temperature control driving circuit and its control strategy |
CN110262589B (en) * | 2019-05-23 | 2020-11-10 | 南京牧镭激光科技有限公司 | TEC temperature control driving circuit and control strategy thereof |
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