CN206564121U - It is a kind of to overlap test device automatically and overlap test equipment automatically - Google Patents
It is a kind of to overlap test device automatically and overlap test equipment automatically Download PDFInfo
- Publication number
- CN206564121U CN206564121U CN201720198225.1U CN201720198225U CN206564121U CN 206564121 U CN206564121 U CN 206564121U CN 201720198225 U CN201720198225 U CN 201720198225U CN 206564121 U CN206564121 U CN 206564121U
- Authority
- CN
- China
- Prior art keywords
- overlap
- conductive
- overlap joint
- test
- automatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model provides a kind of automatic overlap joint test device and overlaps test equipment automatically, wherein overlap joint test device includes test circuit plate, briquetting and limited block automatically, wherein:Test circuit plate is provided with conductive overlap, and conductive overlap is located in limited block;The conductive overlap of measured panel is overlapped with the conductive overlap of test circuit plate;Briquetting is provided with above limited block, briquetting is located on elevating mechanism;Elevating mechanism drives briquetting to move up and down.The automatic overlap joint test device that the utility model is provided is simple in construction, and display screen test mode is changed into plug-in type test mode, reduces the abrasion of test contact area, increases the service life of device;Meanwhile, limited block is set in secondary test board, accuracy of detection is improved, makes testing efficiency higher.The automatic overlap joint test equipment of one kind that the utility model is provided in addition, using automatic overlap joint test device as noted earlier, measuring accuracy is high, service life is long.
Description
Technical field
The utility model embodiment is related to display screen testing field, more particularly to a kind of to overlap test device automatically and automatic
Overlap test equipment.
Background technology
The construction of liquid crystal display is to place to set on liquid crystal cell, lower baseplate glass among the parallel glass substrate of two panels
Colored filter is set on thin film transistor (TFT), upper substrate glass, changes to control with voltage by the signal on thin film transistor (TFT)
The rotation direction of liquid crystal molecule, thus reach each pixel polarised light outgoing of control whether and reach display purpose.Liquid crystal
Show device due to possessing frivolous, power saving, it is radiationless the advantages of and gradually replace cathode-ray tube display, as display develop
Main trend.
Qualified dispatch from the factory of lcd products is needed by strict detection.At present, the detection mode of liquid crystal display
It is that product to be measured is tested with test circuit plate by the connected mode of grafting, in the production of modernization pipeline system, surveys
Circuit board is tried with product to be measured due to multiple plug, the contact surface of test circuit plate easily weares and teares, reduce detection device
Service life;Also, the accuracy of detection of traditional detection device is low.In the market needs a service life long, accuracy of detection
High test device and equipment.
Utility model content
The problem of to solve to mention in above-mentioned background technology, the utility model provides a kind of automatic overlap joint test test dress
Put, including test circuit plate, briquetting and limited block, wherein:
The test circuit plate is provided with conductive overlap, and the conductive overlap is located in the limited block;Tested surface
The conductive overlap of plate is overlapped with the conductive overlap of test circuit plate;The briquetting, the pressure are provided with above the limited block
Block is located on elevating mechanism;The elevating mechanism drives the briquetting to move up and down.
Further, in addition to transit plate, the transit plate two ends are provided with conductive overlap;The test circuit plate is led
The conductive overlap of electrical bonding area and the measured panel is overlapped with the conductive overlap at transit plate two ends respectively.
Further, the transit plate is FPC plates.
Further, the test circuit plate is located on the first testboard;First testboard is provided with limited post.
Further, the measured panel is located in secondary test board;The secondary test board is provided with screwed hole.
Further, the limited block is located in the secondary test board;The limited block is provided with rectangle along its length
Groove, its bottom is provided with through hole;Chamfering is provided with above the side of the rectangular channel.
Further, the elevating mechanism is provided with slide rail;The briquetting is moved along the slide rail.
Further, the conductive overlap is golden finger.
The automatic overlap joint test device that the utility model is provided is simple in construction, and display screen test mode is changed into plug-in type
Test mode, reduces the abrasion of test contact area, increases the service life of device;Meanwhile, set in secondary test board
Limited block, improves accuracy of detection, makes testing efficiency higher.
The utility model also provides a kind of automatic overlap joint test equipment, is tested using the automatic overlap joint described in as above Arbitrary Term
Device.
The automatic overlap joint test equipment that the utility model is provided, measuring accuracy is high, service life is long, it is adaptable to which industry is raw
Production.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the accompanying drawing used required in description of the prior art is briefly described, it should be apparent that, drawings in the following description are
Some embodiments of the present utility model, for those of ordinary skill in the art, are not paying the premise of creative labor
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
The automatic overlap joint test device schematic diagram that Fig. 1 provides for the utility model;
Fig. 2 is the first testboard and secondary test board's schematic diagram;
Fig. 3 is secondary test board's schematic diagram;
Fig. 4 is limited block schematic diagram;
Fig. 5 is transit plate schematic diagram;
Fig. 6 is elevating mechanism schematic diagram.
Reference:
The limited post of 10 first testboard, 11 test circuit plate 12
The screwed hole of 20 secondary test board, 21 measured panel 22
The slide rail of 30 elevating mechanism, 31 briquetting 32
The limited block of 40 transit plate, 41 golden finger 50
51 through holes
Embodiment
It is new below in conjunction with this practicality to make the purpose, technical scheme and advantage of the utility model embodiment clearer
Accompanying drawing in type embodiment, the technical scheme in the utility model embodiment is clearly and completely described, it is clear that retouched
The embodiment stated is a part of embodiment of the utility model, rather than whole embodiments.Based on the implementation in the utility model
Example, the every other embodiment that those of ordinary skill in the art are obtained under the premise of creative work is not made is belonged to
The scope of the utility model protection.
As shown in figure 1, the automatic overlap joint test device that the utility model is provided, including test circuit plate 11, the and of briquetting 31
Limited block 50, wherein:
The test circuit plate 11 is provided with conductive overlap, and the conductive overlap is located in the limited block 50;Treat
The conductive overlap of the conductive overlap and test circuit plate 11 of surveying panel 21 is overlapped;The top of limited block 50 is provided with the pressure
Block 31, the briquetting 31 is located on elevating mechanism 30;The elevating mechanism 30 drives the briquetting 31 to move up and down.
When it is implemented, limited block 50 is located in secondary test board 20 (as shown in Figure 3), limited block 50 (as shown in Figure 4)
By the precise positioning of measured panel 21 on briquetting 31, the conductive overlap of measured panel 21 and the conductive overlap joint of test circuit plate 11
Area is overlapped, and the regulation briquetting 31 of elevating mechanism 30 is moved downward, and briquetting 31 takes the conduction of the test circuit plate 11 of measured panel 21
The overlapping regions for connecing area's overlap joint and the conductive overlap of test circuit plate 11 is compressed, and both is fully electrically connected.
The automatic overlap joint test device that the utility model is provided is simple in construction, and the test mode of display screen panel is changed into
Plug-in type test mode, reduces the abrasion of test contact area, increases the service life of device;Meanwhile, in secondary test board
Upper setting limited block, improves accuracy of detection, makes testing efficiency higher.
Preferably, in addition to transit plate 40, the two ends of transit plate 40 are provided with conductive overlap;The test circuit plate 11
Conductive overlap and the conductive overlap of the measured panel 21 overlapped respectively with the conductive overlap at the two ends of transit plate 40.
When it is implemented, test circuit plate 11 conductive overlap and measured panel 21 conductive overlap respectively with transfer
The conductive overlap overlap joint at plate 40 (as shown in Figure 5) two ends, can be suitably used for the measurement of different size measured panels 21.
Preferably, the transit plate 40 is FPC plates.
Preferably, the test circuit plate 11 is located on the first testboard 10;First testboard 10 sets limited location
Post 12.
Preferably, the measured panel 21 is located in secondary test board 20;The secondary test board 20 is provided with screwed hole
22。
Preferably, the limited block 50 is located in the secondary test board 20;The limited block 50 is provided with along its length
Rectangular channel, its bottom is provided with through hole 51;Chamfering is provided with above the side of the rectangular channel.
When it is implemented, limited block 50 is fixed in secondary test board 20 by bolt through through hole 51 and screwed hole 22, treat
Panel 21 is surveyed by the chamfering above the rectangular channel of limited block 50 and rectangular channel side, measured panel 21 is accurately positioned at the
On two testboards 20, the precision of test is improved, false failure rate is reduced;The inclined design of rectangular channel enables measured panel 21 quick
In the rectangular channel for being accurately placed limited block 50, production efficiency is improved.
Preferably, the elevating mechanism 30 is provided with slide rail 32;The briquetting 31 is moved along the slide rail 32.
When it is implemented, the control slide rail 32 (as shown in Figure 6) of elevating mechanism 30 is moved up and down, briquetting 31 is transported along slide rail 32
It is dynamic so that briquetting 31 can guide electrical bonding area apply pressure, test circuit plate 11 and measured panel 21 is closely overlapped, protect
Both conductive unobstructed and measuring accuracies of card.
Preferably, the conductive overlap is golden finger 41.
The utility model also provides a kind of automatic overlap joint test equipment, is tested using the automatic overlap joint described in as above Arbitrary Term
Device.
The automatic overlap joint test equipment of one kind that the utility model is provided in addition, is tested using automatic overlap joint as noted earlier and filled
Put, measuring accuracy is high, service life is long.
Although herein it is more used such as testboard, limited post, screwed hole, elevating mechanism, briquetting, transit plate,
The terms such as limited block, through hole, but it is not precluded from the possibility using other terms.Using these terms just for the sake of more convenient
Ground describes and explains essence of the present utility model;Being construed as any additional limitation is all and the utility model essence
What god disagreed.
Finally it should be noted that:Various embodiments above is only limited to illustrate the technical solution of the utility model, rather than to it
System;Although the utility model is described in detail with reference to foregoing embodiments, one of ordinary skill in the art should
Understand:It can still modify to the technical scheme described in foregoing embodiments, or to which part or whole
Technical characteristic carries out equivalent substitution;And these modifications or replacement, the essence of appropriate technical solution is departed from this practicality newly
The scope of each embodiment technical scheme of type.
Claims (9)
1. a kind of automatic overlap joint test device, it is characterised in that:Including test circuit plate (11), briquetting (31) and limited block
(50), wherein:
The test circuit plate (11) is provided with conductive overlap, and the conductive overlap is located in the limited block (50);Treat
The conductive overlap of the conductive overlap and test circuit plate (11) of surveying panel (21) is overlapped;It is provided with above the limited block (50)
The briquetting (31), the briquetting (31) is located on elevating mechanism (30);The elevating mechanism (30) drives the briquetting (31)
Move up and down.
2. automatic overlap joint test device according to claim 1, it is characterised in that:Also include transit plate (40), it is described in
Flap (40) two ends are provided with conductive overlap;The conductive overlap of the test circuit plate (11) and the measured panel (21)
Conductive overlap is overlapped with the conductive overlap at transit plate (40) two ends respectively.
3. automatic overlap joint test device according to claim 2, it is characterised in that:The transit plate (40) is FPC plates.
4. automatic overlap joint test device according to claim 1, it is characterised in that:The test circuit plate (11) is located at the
On one testboard (10);First testboard (10) is provided with limited post (12).
5. automatic overlap joint test device according to claim 1, it is characterised in that:The measured panel (21) is located at second
On testboard (20);The secondary test board (20) is provided with screwed hole (22).
6. automatic overlap joint test device according to claim 5, it is characterised in that:The limited block (50) is located at described the
On two testboards (20);The limited block (50) is provided with rectangular channel along its length, and its bottom is provided with through hole (51);The rectangle
Chamfering is provided with above the side of groove.
7. automatic overlap joint test device according to claim 1, it is characterised in that:The elevating mechanism (30) is provided with cunning
Rail (32);The briquetting (31) is moved along the slide rail (32).
8. the automatic overlap joint test device according to any one of claim 1~7, it is characterised in that:The conductive overlap
For golden finger (41).
9. a kind of automatic overlap joint test equipment, it is characterised in that:Using the automatic overlap joint as described in any one of claim 1~8
Test device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720198225.1U CN206564121U (en) | 2017-03-02 | 2017-03-02 | It is a kind of to overlap test device automatically and overlap test equipment automatically |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201720198225.1U CN206564121U (en) | 2017-03-02 | 2017-03-02 | It is a kind of to overlap test device automatically and overlap test equipment automatically |
Publications (1)
Publication Number | Publication Date |
---|---|
CN206564121U true CN206564121U (en) | 2017-10-17 |
Family
ID=60031580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201720198225.1U Active CN206564121U (en) | 2017-03-02 | 2017-03-02 | It is a kind of to overlap test device automatically and overlap test equipment automatically |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN206564121U (en) |
-
2017
- 2017-03-02 CN CN201720198225.1U patent/CN206564121U/en active Active
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN103135268B (en) | Detection device of liquid crystal display panel | |
CN101999095B (en) | Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device | |
CN104360509B (en) | Lighting test method and device | |
CN106057112A (en) | Box forming test circuit and liquid crystal display substrate | |
CN103578357A (en) | Plastic panel and flat panel display device using the same | |
CN106409199B (en) | The test method of test system for display panel and display panel | |
CN101965606A (en) | Active matrix substrate, display device, method for inspecting active matrix substrate and method for inspecting display device | |
CN102681227A (en) | Detection method for liquid crystal display panel | |
CN109559667A (en) | A kind of array substrate, its test method and display panel, display device | |
CN105445972A (en) | Probe movement device | |
CN204758967U (en) | Detection device lights a lamp | |
CN206564121U (en) | It is a kind of to overlap test device automatically and overlap test equipment automatically | |
CN205992038U (en) | A kind of test system of display floater and display device | |
US10983376B2 (en) | Measuring device and a measuring system | |
US10733923B2 (en) | Display panel test detection method and device for storing a picture for detection in a source driver circuit board | |
CN101349826B (en) | Display and method for measuring contraposition set vertical bias of the display | |
CN107515484B (en) | Frame sealing glue detection system, devices contained in system and detection method | |
CN100578328C (en) | Array substrate tending measuring TFT features | |
CN104791671A (en) | Backlight source, testing system and method and display device | |
CN107064773B (en) | ATE voltage testing system and ATE voltage test method | |
CN109061952A (en) | Liquid crystal display panel alignment system and liquid crystal display panel alignment method | |
CN103499894A (en) | Signal line connector and display panel detection device and method | |
CN104317081A (en) | Lighting device | |
CN201314985Y (en) | LCD device | |
US9080865B2 (en) | Orthogonality compensation method for length measurement device and length measurement device using same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GR01 | Patent grant | ||
GR01 | Patent grant |