CN106409199B - The test method of test system for display panel and display panel - Google Patents
The test method of test system for display panel and display panel Download PDFInfo
- Publication number
- CN106409199B CN106409199B CN201611058873.3A CN201611058873A CN106409199B CN 106409199 B CN106409199 B CN 106409199B CN 201611058873 A CN201611058873 A CN 201611058873A CN 106409199 B CN106409199 B CN 106409199B
- Authority
- CN
- China
- Prior art keywords
- signal
- display panel
- film transistor
- tft
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The present invention provides the test method of a kind of test system for display panel and display panel, the system includes pinboard, pressure head, and display panel, had additional in the display panel the first loci and and with the first loci be electrically connected the second loci, and the corresponding first contraposition probe of the first loci and the second contraposition probe corresponding with the second loci is had additional on pressure head, it is used to control the transmission of test signal in pinboard equipped with thin film transistor (TFT), when the first loci and accurate the second loci contraposition, thin film transistor (TFT) in pinboard will be opened, test signal can be just transferred in display panel, and the first loci and the contraposition of the second loci be not punctual, thin film transistor (TFT) in pinboard will keep ending, test signal is not transmitted in display panel, it can be avoided display panel to light in test because of pressure head pair Short circuit problem caused by position is inaccurate reduces position aligning time, improves testing efficiency.
Description
Technical field
The present invention relates to field of display technology more particularly to the test sides of a kind of test system for display panel and display panel
Method.
Background technique
With the development of display technology, liquid crystal display (Liquid Crystal Display, LCD) and organic light emission two
The flat display apparatus such as pole pipe display (Organic Light Emitting Display, OLED) are because having high image quality, saving
Electricity, fuselage are thin and the advantages that have a wide range of application, and be widely used in mobile phone, TV, personal digital assistant, digital camera,
The various consumer electrical products such as laptop, desktop computer, become the mainstream in display device.
Multiple testing processs usually can be set in process of production in display panel, to guarantee the quality of display panel,
Improving production efficiency, wherein after display panel is at box (Cell), display panel can be carried out to light test, pass through display letter
Single picture detects the display quality of display panel.Currently, detecting for convenience, one can have been designed on the glass of display panel
The test point (Test Pad) of series, corresponding test signal is inputted in these test points can generate simple picture,
To carry out lighting test.
In the prior art, it lights test process to generally include: display panel being first fixed to display panel fixed station (JIG)
On, then the pressure head with probe is pressed on display panel, so that probe and test point contact, and then signal one will be tested
One contact is input to inside display panel.
Wherein, pressure head is in pressing, needs probe and the corresponding test point accurate contraposition of probe to together, with realization
The transmission of signal is tested, currently, probe and test point is aligned by tester's naked eyes, easily occurs aligning not
Quasi- situation, short-circuit conditions frequent occurrence, leverage the efficiency of product development.
Summary of the invention
The purpose of the present invention is to provide a kind of test system for display panel, can be avoided display panel light in test because
Short circuit problem caused by pressure head contraposition is inaccurate, reduces position aligning time, improves testing efficiency.
The object of the invention is also to provide a kind of test methods of display panel, can be avoided display panel and light test
It is middle because pressure head contraposition it is inaccurate caused by short circuit problem, reduce position aligning time, improve testing efficiency.
To achieve the above object, the present invention provides a kind of test system for display panel, comprising: display panel, corresponding institute
The pinboard stating the pressure head of display panel setting and being electrically connected with the pressure head；
What is be arranged successively on the pressure head has one first contraposition probe, several test signal probes, one second contraposition probe；
The display panel is equipped with the first loci of the corresponding first contraposition probe setting, corresponds to described second pair
The second loci and the several and one-to-one test point of the test signal probe of position probe setting, described first pair
The cabling that site and second loci are set on the display panel is electrically connected；
Signal converting circuit is equipped in the pinboard, the signal converting circuit includes: a resistance and several films
The quantity of transistor, the test signal probe is identical as the quantity of thin film transistor (TFT)；
Thin film transistor (TFT) shutdown signal is accessed in described resistance one end, and the other end is electrically connected the first contraposition via first node
Probe；The grid of several thin film transistor (TFT)s is electrically connected first node, and source electrode is respectively connected to a test signal, drain electrode point
It electricity Xing Lianjie not a test signal probe；The second contraposition probe accesses thin film transistor (TFT) open signal via pinboard；Institute
It is opposite with the current potential of the thin film transistor (TFT) shutdown signal to state thin film transistor (TFT) open signal；
When test, the pressure head is pressed on display panel, so that the first contraposition probe and first contraposition
Point contraposition contact, the second contraposition probe and second loci, which aligns, to be contacted, several test signal probes respectively with several surveys
Pilot aligns contact one by one, and the thin film transistor (TFT) open signal is transferred to first node, each thin film transistor (TFT) via cabling
It opens, test signal write-in display panel shows test pictures.
The pressure head is equipped with 4 test signal probes, and the display panel is equipped with 4 test points, the signal converting
Circuit includes 4 thin film transistor (TFT)s；
The test signal of the source electrode access of 4 thin film transistor (TFT)s is respectively as follows: that high potential lights signal, low potential is lighted
Signal, constant pressure high potential signal and constant pressure low-potential signal.
4 thin film transistor (TFT)s are N-type TFT, and the thin film transistor (TFT) open signal is constant pressure high potential
Signal, the thin film transistor (TFT) shutdown signal are constant pressure low-potential signal.
4 thin film transistor (TFT)s are P-type TFT, and the thin film transistor (TFT) shutdown signal is constant pressure high potential
Signal, the thin film transistor (TFT) open signal are constant pressure low-potential signal.
Further include: display panel fixed station, when test, the display panel is fixed on the display panel fixed station.
The present invention also provides a kind of test methods of display panel, include the following steps:
Step S1, a test system for display panel is provided, comprising: the pressure that display panel, the corresponding display panel are arranged
Head and the pinboard being electrically connected with the pressure head；
One first contraposition probe, several test signal probes and one second contraposition is arranged in sequence on the pressure head to visit
Needle；
The display panel is equipped with the first loci of the corresponding first contraposition probe setting, corresponds to described second pair
Second loci of position probe setting and several one-to-one test points with the test signal probe, described first
The cabling that loci and second loci are set on the display panel is electrically connected；
Signal converting circuit is equipped in the pinboard, the signal converting circuit includes: a resistance and several films
The quantity of transistor, the test signal probe is identical as the quantity of thin film transistor (TFT)；
Thin film transistor (TFT) shutdown signal is accessed in described resistance one end, and the other end is electrically connected the first contraposition via first node
Probe；The grid of several thin film transistor (TFT)s is electrically connected first node, and source electrode is respectively connected to a test signal, drain electrode point
It electricity Xing Lianjie not a test signal probe；The second contraposition probe accesses thin film transistor (TFT) open signal via pinboard；Institute
It is opposite with the current potential of the thin film transistor (TFT) shutdown signal to state thin film transistor (TFT) open signal；
Step S2, the pressure head is pressed into display panel, so that the first contraposition probe and first loci
Contraposition contact, the second contraposition probe and second loci, which aligns, to be contacted, several test signal probes respectively with several tests
Point contraposition contact one by one；
Step S3, the display panel is lighted, contraposition is judged whether there is partially according to the situation of lighting of the display panel
Difference；
If display panel lights exception, determine that there are contraposition deviations, and return step 2S is re-registrated；
If display panel is lighted normally, determines that contraposition is accurate, carry out step S4；
Step S4, the test pictures shown after being lighted according to display panel determine the quality of display panel.
The pressure head is equipped with 4 test signal probes, and the display panel is equipped with 4 test points, the signal converting
Circuit includes 4 thin film transistor (TFT)s；
The test signal of the source electrode access of 4 thin film transistor (TFT)s is respectively as follows: that high potential lights signal, low potential is lighted
Signal, constant pressure high potential signal, constant pressure low-potential signal.
4 thin film transistor (TFT)s are N-type TFT, and the thin film transistor (TFT) open signal is constant pressure high potential
Signal, the thin film transistor (TFT) shutdown signal are constant pressure low-potential signal.
4 thin film transistor (TFT)s are P-type TFT, and the thin film transistor (TFT) shutdown signal is constant pressure high potential
Signal, the thin film transistor (TFT) open signal are constant pressure low-potential signal.
The step S2 further include: a display panel fixed station is provided, and the display panel is fixed on the display
On panel fixed station.
Beneficial effects of the present invention: the present invention provides a kind of test system for display panel, which includes pinboard, pressure
Head and display panel have additional the first loci and and the with the electric connection of the first loci in the display panel
Two locis, have additional on pressure head and the corresponding first contraposition probe of the first loci and second pair corresponding with the second loci
Position probe, the interior transmission for being used to control test signal equipped with thin film transistor (TFT) of pinboard, when the first loci and the second loci
When aligning accurate, the thin film transistor (TFT) in pinboard will be opened, and test signal can be just transferred in display panel, and first pair
Site and the contraposition of the second loci be not punctual, and the thin film transistor (TFT) in pinboard will keep ending, and test signal is not transmitted to
In display panel, can be avoided display panel light in test because pressure head contraposition it is inaccurate caused by short circuit problem, when reducing contraposition
Between, improve testing efficiency.The present invention also provides a kind of test methods of display panel, can be avoided display panel and light in test
Short circuit problem caused by being not allowed because of pressure head contraposition, reduces position aligning time, improves testing efficiency.
Detailed description of the invention
For further understanding of the features and technical contents of the present invention, it please refers to below in connection with of the invention detailed
Illustrate and attached drawing, however, the drawings only provide reference and explanation, is not intended to limit the present invention.
In attached drawing,
Fig. 1 is the structure chart of test system for display panel of the invention；
Fig. 2 is the circuit diagram of the signal converting circuit of the first embodiment of test system for display panel of the invention；
Fig. 3 is the circuit diagram of the signal converting circuit of the second embodiment of test system for display panel of the invention；
Fig. 4 is the flow chart of the test method of display panel of the invention.
Specific embodiment
Further to illustrate technological means and its effect adopted by the present invention, below in conjunction with preferred implementation of the invention
Example and its attached drawing are described in detail.
Referring to Fig. 1, the present invention provides a kind of test system for display panel, comprising: display panel 1, the corresponding display
The pressure head 2 that panel 1 is arranged and the pinboard 3 being electrically connected with the pressure head.
Specifically, be arranged in sequence on the pressure head 2 one first contraposition probe 21, several test signal probes 23 and
One second contraposition probe 22；The display panel 1 is equipped with the first loci that the corresponding first contraposition probe 21 is arranged
The second loci TP2 that TP1, the corresponding second contraposition probe 22 are arranged and several with the test signal probe 23
One-to-one test point CT, the first loci TP1 and the second loci TP2 are set on the display panel 1
Cabling 11 is electrically connected.
It should be noted that being equipped with signal converting circuit in the pinboard 3, the signal converting circuit includes: an electricity
R and several thin film transistor (TFT) T is hindered, the quantity of the test signal probe 23 is identical as the quantity of thin film transistor (TFT) T；It is described
Thin film transistor (TFT) shutdown signal is accessed in the one end resistance R, and the other end is electrically connected the first contraposition probe 21 via first node A；Institute
The grid for stating several thin film transistor (TFT) T is electrically connected first node A, and source electrode is respectively connected to a test signal, and drain electrode is electric respectively
Property connection one test signal probe 23；The second contraposition probe 22 accesses thin film transistor (TFT) open signal via pinboard 3；Institute
It is opposite with the current potential of the thin film transistor (TFT) shutdown signal to state thin film transistor (TFT) open signal.
Further, the test signal is provided by outside source.The test system for display panel further include: display
Panel fixed station 4, when test, the display panel 1 is fixed on the display panel fixed station 4, the pressure head 2 with it is described aobvious
Show that panel fixed station 4 can integrate together, forms a tester table.
As shown in Fig. 2, the pressure head 2 is equipped with 4 test signal probes, institute in the first embodiment of the present invention
Display panel 1 is stated equipped with 4 test point CT, the signal converting circuit includes 4 thin film transistor (TFT) T, 4 film crystals
Pipe T is P-type TFT, and the test signal of the source electrode access of 4 thin film transistor (TFT) T is respectively as follows: high potential and lights
Signal ELH, low potential light signal ELL, constant pressure high potential signal VGH, constant pressure low-potential signal VGL, at the same time, the perseverance
High potential signal VGH and constant pressure low-potential signal VGL is pressed also to close letter respectively as the thin film transistor (TFT) of 4 thin film transistor (TFT) T
Number and thin film transistor (TFT) open signal, for align it is unpunctual, close thin film transistor (TFT) T, align it is accurate when, open it is thin
Film transistor T.
As shown in figure 3, the pressure head 2 is equipped with 4 test signal probes, described in the second embodiment of the present invention
Display panel 1 is equipped with 4 test point CT, and the signal converting circuit includes 4 thin film transistor (TFT) T, 4 thin film transistor (TFT)s
T is N-type TFT, and the test signal of the source electrode access of 4 thin film transistor (TFT) T is respectively as follows: high potential and lights letter
Number ELH, low potential light signal ELL, constant pressure high potential signal VGH, constant pressure low-potential signal VGL, at the same time, the constant pressure
The thin film transistor (TFT) open signal of high potential signal VGH and constant pressure low-potential signal VGL also respectively as 4 thin film transistor (TFT) T
With the shutdown signal of thin film transistor (TFT), for unpunctual in contraposition, closing thin film transistor (TFT) T opens film when aligning accurate
Transistor T.
Although it is understood that being all made of 4 thin film transistor (TFT) T, 4 in the first and second embodiments of the invention
The technical solution of 23,4 test point CT of signal probe and 4 different test signals are tested, but the present invention can also basis
Need to increase or decrease thin film transistor (TFT), test signal probe, test point and test signal quantity, the present invention to this not
It is limited.
Further, the non-switching test probe not being electrically connected with pinboard 3 usually can be also set on the pressure head 2,
Those non-switching test probes are directly accessed corresponding test signal, and by with the corresponding test that is arranged on display panel 1
Point contact will test signal write-in test panel accordingly, these test signals are usually that will not generate larger current, not need
The test signal of short-circuit protection is carried out, and the test signal that can generate larger current then needs to access via pinboard 3, to carry out
Short-circuit protection.
Specifically, by taking first embodiment as an example, the present invention provides a kind of working principle of test system for display panel are as follows: first
The pressure head 2 is pressed into display panel 1, is tentatively aligned, so that the first contraposition probe 21 and first contraposition
Point TP1 contraposition contact, the second contraposition probe 22 are contacted with the second loci TP2 contraposition, and several test signal probes 23 divide
It does not align and contacts one by one with several test point CT, if contraposition is accurate at this time, thin film transistor (TFT) open signal (constant pressure low potential letter
Number VGL) it is transferred to the second loci TP2, then it is transferred to first node A via cabling 11, the current potential of first node A is dragged down, is made
Each thin film transistor (TFT) T is opened, high potential lights signal ELH, low potential lights signal ELL, constant pressure high potential signal VGH,
And display panel 1 is written in constant pressure low-potential signal VGL, display panel 1 normally shows test pictures, if contraposition is inaccurate at this time
Really, then thin film transistor (TFT) open signal (constant pressure low-potential signal VGL) cannot be transferred to via the second loci TP2 and cabling 11
First node A, first node A will persistently be kept under the influence of thin film transistor (TFT) shutdown signal (constant pressure high potential signal VGH)
High potential, each thin film transistor (TFT) T are remained turned-off, and high potential lights signal ELH, low potential lights signal ELL, the high electricity of constant pressure
Display panel 1 can not be written in position signal VGH and constant pressure low-potential signal VGL, and display panel 1 can not normally show test
Picture after tester observes that display panel 1 lights exception at this time, readjusts contraposition, until display panel 1 can be just
Often display test pictures, during adjustment, unpunctual due to aligning, thin film transistor (TFT) T would not be opened, each test letter
Number display panel 1 will not be written, thus effectively avoid display panel light in test because pressure head contraposition it is inaccurate caused by short circuit
Problem reduces position aligning time, improves testing efficiency.
Referring to Fig. 4, including the following steps: the present invention also provides a kind of test method of display panel
Step S1, a test system for display panel is provided, comprising: display panel 1, the corresponding display panel 1 are arranged
Pressure head 2 and the pinboard 3 being electrically connected with the pressure head 2；
One first contraposition probe 21, several test signal probes 23 and one second is arranged in sequence on the pressure head 2
Align probe；
The display panel 1 be equipped with the first loci TP1 that the corresponding first contraposition probe 21 is arranged, it is corresponding described in
The the second loci TP2 and several one-to-one surveys with the test signal probe 23 that second contraposition probe 22 is arranged
The cabling 11 that pilot CT, the first loci TP1 and the second loci TP2 are set on the display panel 1 electrically connects
It connects；
It is equipped with signal converting circuit in the pinboard 3, the signal converting circuit includes: a resistance R and several thin
Film transistor T, the quantity of the test signal probe 23 are identical as the quantity of thin film transistor (TFT) T；
Thin film transistor (TFT) shutdown signal is accessed in the one end the resistance R, and the other end is electrically connected first pair via first node A
Position probe；The grid of several thin film transistor (TFT) T is electrically connected first node A, and source electrode is respectively connected to a test signal, leakage
A test signal probe 23 is electrically connected in pole；The second contraposition probe accesses thin film transistor (TFT) via pinboard 3 and opens
Signal；The thin film transistor (TFT) open signal is opposite with the current potential of the thin film transistor (TFT) shutdown signal.
Optionally, as shown in Fig. 2, in the first embodiment of the present invention, the pressure head 2 is equipped with 4 test signals
Probe 23, the display panel 1 are equipped with 4 test points, and the signal converting circuit includes 4 thin film transistor (TFT) T, and described 4
Thin film transistor (TFT) T is P-type TFT, and the test signal of the source electrode access of 4 thin film transistor (TFT) T is respectively as follows: height
Current potential lights signal ELH, low potential lights signal ELL, constant pressure high potential signal VGH, constant pressure low-potential signal VGL, same with this
When, the film crystal of the constant pressure high potential signal VGH and constant pressure low-potential signal VGL also respectively as 4 thin film transistor (TFT) T
The open signal of pipe shutdown signal and thin film transistor (TFT), it is accurate in contraposition for aligning unpunctual, closing thin film transistor (TFT) T
When, open thin film transistor (TFT) T.
Optionally, as shown in figure 3, in the second embodiment of the present invention, the pressure head 2 is equipped with 4 test signals and visits
Needle 23, the display panel 1 are equipped with 4 test points, and the signal converting circuit includes 4 thin film transistor (TFT) T, described 4 thin
Film transistor T is N-type TFT, and the test signal of the source electrode access of 4 thin film transistor (TFT) T is respectively as follows: high electricity
The bright signal ELH in site, low potential light signal ELL, constant pressure high potential signal VGH, constant pressure low-potential signal VGL, at the same time,
The thin film transistor (TFT) of the constant pressure high potential signal VGH and constant pressure low-potential signal VGL also respectively as 4 thin film transistor (TFT) T
The shutdown signal of open signal and thin film transistor (TFT), for aligning unpunctual, closing thin film transistor (TFT) T, when aligning accurate,
Open thin film transistor (TFT) T.
Further, the test signal is provided by outside source.The test system for display panel further include: display
Panel fixed station 4, when test, the display panel 1 is fixed on the display panel fixed station 4, the pressure head 2 with it is described aobvious
Show that panel fixed station 4 can integrate together, forms a tester table.
Although it is understood that being all made of 4 thin film transistor (TFT) T, 4 in the first and second embodiments of the invention
The technical solution of signal probe, 4 test points and 4 different test signals is tested, but the present invention can also be as needed
Thin film transistor (TFT), test signal probe, test point and the quantity for testing signal, the present invention is increased or decreased not limit this
System.
In addition, the non-switching test probe not being electrically connected with pinboard 3 usually can be also set on the pressure head 2, those
Non- switching test probe is directly accessed corresponding test signal, and by connecing with the corresponding test point being arranged on display panel 1
Touching will test signal write-in test panel accordingly, these test signals are usually that will not generate larger current, not need to carry out
The test signal of short-circuit protection, and the test signal that can generate larger current then needs to access via pinboard 3, to carry out short circuit
Protection.
Step S2, the pressure head 2 is pressed into display panel 1, so that the first contraposition probe 21 and described first pair
Site TP1 contraposition contact, the second contraposition probe 22 are contacted with the second loci TP2 contraposition, several test signal probes 23
It aligns and contacts one by one with several test point CT respectively.
Specifically, the contraposition in the step S2 is preliminary contraposition, it is also necessary to lighting situation and determine according to step S3
Whether align accurate.
Step S3, the display panel 1 is lighted, contraposition is judged whether there is according to the situation of lighting of the display panel 1
Deviation；
If display panel 1 lights exception, determine that there are contraposition deviations, and return step S2 is re-registrated；
If display panel 1 is lighted normally, determines that contraposition is accurate, carry out step S4.
Specifically, by taking first embodiment as an example, the specific work process of the step S3 is illustrated: if aligning at this time
Accurately, then thin film transistor (TFT) open signal (constant pressure low-potential signal VGL) can be transferred to the second loci TP2, then via cabling
11 are transferred to first node A, drag down the current potential of first node A, so that each thin film transistor (TFT) T is opened, high potential lights signal
ELH, low potential light signal ELL, constant pressure high potential signal VGH and constant pressure low-potential signal VGL write-in display panel 1, show
Show the normally display test pictures of panel 1, if contraposition inaccuracy at this time, thin film transistor (TFT) open signal (constant pressure low-potential signal
VGL) it cannot be transferred to first node A via the second loci TP2 and cabling 11, first node A will be closed in thin film transistor (TFT)
High potential is persistently kept under the influence of signal (constant pressure high potential signal VGH), each thin film transistor (TFT) T is remained turned-off, high electricity
The bright signal ELH in site, low potential light signal ELL, constant pressure high potential signal VGH and constant pressure low-potential signal VGL can not
Display panel 1 is written, display panel 1 can not normally show test pictures, and it is different to observe that display panel 1 is lighted by tester at this time
After often, contraposition is readjusted, until display panel 1 can normally show test pictures, during adjustment, due to contraposition
Unpunctual, thin film transistor (TFT) T would not be opened, and display panel 1 will not be written in each test signal, to effectively avoid showing
Panel light in test because pressure head contraposition it is inaccurate caused by short circuit problem, reduce position aligning time, improve testing efficiency.
Step S4, the test pictures shown after being lighted according to display panel 1 determine the quality of display panel 1.
In conclusion the present invention provides a kind of test system for display panel, which includes pinboard, pressure head, Yi Jixian
Show panel, had additional in the display panel the first loci and and with the first loci be electrically connected the second loci,
And the corresponding first contraposition probe of the first loci and the second contraposition probe corresponding with the second loci is had additional on pressure head, is turned
It is used to control the transmission of test signal in fishplate bar equipped with thin film transistor (TFT), when the first loci and the contraposition of the second loci are accurate
When, the thin film transistor (TFT) in pinboard will be opened, and test signal can be just transferred in display panel, and the first loci and the
The contraposition of two locis is not punctual, and the thin film transistor (TFT) in pinboard will keep ending, and test signal is not transmitted to display panel
In, can be avoided display panel light in test because pressure head contraposition it is inaccurate caused by short circuit problem, reduce position aligning time, improve and survey
Try efficiency.The present invention also provides a kind of test methods of display panel, can be avoided display panel and light in test because of pressure head pair
Short circuit problem caused by position is inaccurate reduces position aligning time, improves testing efficiency.
The above for those of ordinary skill in the art can according to the technique and scheme of the present invention and technology
Other various corresponding changes and modifications are made in design, and all these change and modification all should belong to the claims in the present invention
Protection scope.
Claims (10)
1. a kind of test system for display panel characterized by comprising display panel (1), the corresponding display panel (1) set
The pressure head (2) set and the pinboard (3) being electrically connected with the pressure head；
What is be arranged successively on the pressure head (2) has one first contraposition probe (21), several test signal probes (23), one second pair
Position probe (22)；
The display panel (1) is equipped with the first loci (TP1) of corresponding first contraposition probe (21) setting, corresponding institute
The second loci (TP2) and the several and described test signal probe (23) one for stating the setting of the second contraposition probe (22) are a pair of
The test point (CT) answered, first loci (TP1) and second loci (TP2) are set on the display panel (1)
Cabling (11) be electrically connected；
It is equipped with signal converting circuit in the pinboard (3), the signal converting circuit includes: a resistance (R) and several thin
The quantity of film transistor (T), test signal probe (23) is identical as the quantity of thin film transistor (TFT) (T)；
Thin film transistor (TFT) shutdown signal is accessed in described resistance one end (R), and the other end is electrically connected first pair via first node (A)
Position probe (21)；The grid of several thin film transistor (TFT)s (T) is electrically connected first node (A), and source electrode is respectively connected to a survey
A test signal probe (23) is electrically connected in trial signal, drain electrode；Second contraposition probe (22) connects via pinboard (3)
Enter thin film transistor (TFT) open signal；The current potential phase of the thin film transistor (TFT) open signal and the thin film transistor (TFT) shutdown signal
Instead；
When test, the pressure head (2) is pressed on display panel (1), so that first contraposition probe (21) and described the
One loci (TP1) contraposition contact, the second contraposition probe (22) are contacted with second loci (TP2) contraposition, several tests
Signal probe (23) aligns one by one with several test points (CT) contact respectively, and the thin film transistor (TFT) open signal is via cabling
(11) it is transferred to first node (A), each thin film transistor (TFT) (T) is opened, test signal write-in display panel (1) display test
Picture.
2. test system for display panel as described in claim 1, which is characterized in that the pressure head (2) is equipped with 4 test letters
Number probe (23), the display panel (1) are equipped with 4 test points (CT), and the signal converting circuit includes 4 thin film transistor (TFT)s
(T)；
The test signal of the source electrode access of 4 thin film transistor (TFT)s (T) is respectively as follows: high potential and lights signal (ELH), low potential
Light signal (ELL), constant pressure high potential signal (VGH), constant pressure low-potential signal (VGL).
3. test system for display panel as claimed in claim 2, which is characterized in that 4 thin film transistor (TFT)s are that N-type is thin
Film transistor, the thin film transistor (TFT) open signal are constant pressure high potential signal (VGH), and the thin film transistor (TFT) shutdown signal is
Constant pressure low-potential signal (VGL).
4. test system for display panel as claimed in claim 2, which is characterized in that 4 thin film transistor (TFT)s are that p-type is thin
Film transistor, the thin film transistor (TFT) shutdown signal are constant pressure high potential signal (VGH), and the thin film transistor (TFT) open signal is
Constant pressure low-potential signal (VGL).
5. test system for display panel as described in claim 1, which is characterized in that further include: display panel fixed station (4),
When test, the display panel (1) is fixed on the display panel fixed station (4).
6. a kind of test method of display panel, which comprises the steps of:
Step S1, a test system for display panel is provided, comprising: display panel (1), the corresponding display panel (1) are arranged
Pressure head (2) and the pinboard (3) being electrically connected with the pressure head；
What is be arranged successively on the pressure head (2) has one first contraposition probe (21), several test signal probes (23), one second pair
Position probe (22)；
The display panel (1) is equipped with the first loci (TP1) of corresponding first contraposition probe (21) setting, corresponding institute
The second loci (TP2) and the several and described test signal probe (23) one for stating the setting of the second contraposition probe (22) are a pair of
The test point (CT) answered, first loci (TP1) and second loci (TP2) are set on the display panel (1)
Cabling (11) be electrically connected；
It is equipped with signal converting circuit in the pinboard (3), the signal converting circuit includes: a resistance (R) and several thin
The quantity of film transistor (T), test signal probe (23) is identical as the quantity of thin film transistor (TFT) (T)；
Thin film transistor (TFT) shutdown signal is accessed in described resistance one end (R), and the other end is electrically connected first pair via first node (A)
Position probe (21)；The grid of several thin film transistor (TFT)s (T) is electrically connected first node (A), and source electrode is respectively connected to a survey
A test signal probe (23) is electrically connected in trial signal, drain electrode；Second contraposition probe (22) connects via pinboard (3)
Enter thin film transistor (TFT) open signal；The current potential phase of the thin film transistor (TFT) open signal and the thin film transistor (TFT) shutdown signal
Instead；
Step S2, the pressure head (2) is pressed into display panel (1), so that first contraposition probe (21) and described first
Loci (TP1) contraposition contact, the second contraposition probe (22) are contacted with second loci (TP2) contraposition, several test letters
Number probe (23) is aligned with several test points (CT) one by one respectively to be contacted；
Step S3, the display panel (1) is lighted, contraposition is judged whether there is according to the situation of lighting of the display panel (1)
Deviation；
If display panel (1) lights exception, determine that there are contraposition deviations, and return step S2 is re-registrated；
If display panel (1) is lighted normally, determines that contraposition is accurate, carry out step S4；
Step S4, the test pictures shown after being lighted according to display panel (1) determine the quality of display panel (1).
7. the test method of display panel as claimed in claim 6, which is characterized in that the pressure head (2) is equipped with 4 tests
Signal probe (23), the display panel (1) are equipped with 4 test points, and the signal converting circuit includes 4 thin film transistor (TFT)s
(T)；
The test signal of the source electrode access of 4 thin film transistor (TFT)s (T) is respectively as follows: high potential and lights signal (ELH), low potential
Light signal (ELL), constant pressure high potential signal (VGH), constant pressure low-potential signal (VGL).
8. the test method of display panel as claimed in claim 7, which is characterized in that 4 thin film transistor (TFT)s are N-type
Thin film transistor (TFT), the thin film transistor (TFT) open signal are constant pressure high potential signal (VGH), the thin film transistor (TFT) shutdown signal
For constant pressure low-potential signal (VGL).
9. the test method of display panel as claimed in claim 7, which is characterized in that 4 thin film transistor (TFT)s are p-type
Thin film transistor (TFT), the thin film transistor (TFT) shutdown signal are constant pressure high potential signal (VGH), the thin film transistor (TFT) open signal
For constant pressure low-potential signal (VGL).
10. the test method of display panel as claimed in claim 6, which is characterized in that the step S2 further include: provide one
Display panel fixed station (4), and the display panel (1) is fixed on the display panel fixed station (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611058873.3A CN106409199B (en) | 2016-11-25 | 2016-11-25 | The test method of test system for display panel and display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611058873.3A CN106409199B (en) | 2016-11-25 | 2016-11-25 | The test method of test system for display panel and display panel |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106409199A CN106409199A (en) | 2017-02-15 |
| CN106409199B true CN106409199B (en) | 2019-07-02 |
Family
ID=58081786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611058873.3A Active CN106409199B (en) | 2016-11-25 | 2016-11-25 | The test method of test system for display panel and display panel |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106409199B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108513629A (en) * | 2017-07-26 | 2018-09-07 | 深圳市柔宇科技有限公司 | The localization method and testing element group of testing element group |
| CN107591117A (en) * | 2017-09-26 | 2018-01-16 | 武汉华星光电技术有限公司 | The method of testing and test system of display panel |
| CN108597425B (en) * | 2018-03-20 | 2021-07-23 | 武汉华星光电半导体显示技术有限公司 | Testing device and testing method for OLED display panel |
| CN109166507A (en) * | 2018-11-01 | 2019-01-08 | 京东方科技集团股份有限公司 | Testing element group, electrical performance test method, array substrate, display device |
| CN110491318B (en) * | 2019-07-24 | 2020-11-24 | 武汉华星光电半导体显示技术有限公司 | Array substrate |
| CN111081179B (en) * | 2019-12-18 | 2021-05-07 | 深圳市华星光电半导体显示技术有限公司 | Probe detection device and panel lighting test device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007271313A (en) * | 2006-03-30 | 2007-10-18 | Toshiba Matsushita Display Technology Co Ltd | Substrate inspection device |
| CN202533678U (en) * | 2012-04-28 | 2012-11-14 | 合肥京东方光电科技有限公司 | Liquid crystal display panel and liquid crystal display |
| CN204214983U (en) * | 2014-11-24 | 2015-03-18 | 昆山龙腾光电有限公司 | A kind of proving installation and comprise its test macro |
| CN205566980U (en) * | 2016-02-23 | 2016-09-07 | 飞天诚信科技股份有限公司 | Detecting system |
-
2016
- 2016-11-25 CN CN201611058873.3A patent/CN106409199B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN106409199A (en) | 2017-02-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106409199B (en) | The test method of test system for display panel and display panel | |
| WO2017041480A1 (en) | Display substrate, testing method therefor and display apparatus | |
| CN104183225B (en) | A kind of drive device, array base palte and display device | |
| CN105810136B (en) | Array substrate tests circuit, display panel and flat display apparatus | |
| CN103926767B (en) | Liquid crystal display and detection method thereof | |
| WO2016011781A1 (en) | Display device | |
| CN101813835B (en) | Liquid crystal panel detection device and liquid crystal panel detection method | |
| US9947253B2 (en) | Display device and method of inspecting the same | |
| CN104464673B (en) | Display device and its control method, circuit | |
| US11145231B2 (en) | Test circuit and display device | |
| CN102621721A (en) | Liquid crystal panel, liquid crystal module and method for clarifying reasons resulting in poor screen images thereof | |
| CN105807518A (en) | Liquid crystal display panel | |
| CN103412427B (en) | A kind of display panels | |
| CN103513484A (en) | Liquid crystal array substrate and liquid crystal array substrate testing method | |
| CN110211517A (en) | Display base plate and its detection method, display device | |
| US20120162182A1 (en) | Flat panel display device and operating voltage adjusting method thereof | |
| CN106128351A (en) | A kind of display device | |
| CN106773174A (en) | The method of testing and test device of display panel | |
| CN105609073A (en) | Drive circuit, drive method, and display apparatus | |
| CN110085189A (en) | A kind of display base plate, display device, picture display process | |
| CN104460152A (en) | Array substrate and display device | |
| CN106647082A (en) | Circuit and method for testing gate line of array substrate | |
| CN106773412B (en) | A kind of display base plate, display device and driving method | |
| CN103698915A (en) | Array substrate | |
| WO2017049714A1 (en) | Method and device for reducing leaked current of in-cell touch liquid crystal panel |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |