CN206259607U

CN206259607U - A kind of laser feedback sampling apparatus of structure light maker

Info

Publication number: CN206259607U
Application number: CN201621439413.0U
Authority: CN
Inventors: 刘栋; 杜先鹏; 郭俊兴; 代启强; 丁大海; 郭会芹; 李显龙; 刘艳
Original assignee: Qingdao Xiaoyou Intelligent Technology Co Ltd
Current assignee: Qingdao Xiaoyou Intelligent Technology Co Ltd
Priority date: 2016-12-26
Filing date: 2016-12-26
Publication date: 2017-06-16
Anticipated expiration: 2026-12-26

Abstract

The utility model discloses a kind of laser feedback sampling apparatus of structure light maker, belong to 3D imaging fields.Its technical scheme is：Including optics module and hardware control circuit, hardware control circuit includes FPGA module, and ARM modules, MEMS galvanometers drive module, the laser drive module being connected with FPGA module, MEMS galvanometers drive module connects and composes control loop with MEMS galvanometers, laser drive module connects and composes control loop with LD lasers, photodetector is provided with LD lasers, photodetector connects sample circuit, sample circuit is connected with ARM modules, and sample circuit is the circuit composed in parallel by divider resistance and filter capacitor.The beneficial effects of the utility model are：Can monitor in real time by the electric current of LD lasers, and modulated, so as to get the suitable laser grating of brightness, have good application during structure light scan and 3D modeling.

Description

A kind of laser feedback sampling apparatus of structure light maker

Technical field

The utility model belongs to 3D imaging fields, and in particular to a kind of laser feedback sampling cartridge of structure light maker Put.

Background technology

Semiconductor laser is more fragile in itself, and the longest-lived of current laser was up to 100,000 hours.Semiconductor laser The tube core of device is small, and working current density and optical power density are high, and material itself easily occurs defect, in the course of the work the hair of itself Heat, working long hours etc. can all cause the degeneration of semiconductor laser.These factors have a strong impact on the application of semiconductor laser, So that the threshold current of semiconductor laser changes, cause the luminous intensity variations of semiconductor laser, so that obtaining Laser grating brightness it is inadequate so that its 3D imaging and structure light scan during application be restricted.

Utility model content

To solve the deficiency of above-mentioned prior art, the purpose of this utility model is to provide a kind of laser of structure light maker Device feedback sample device.

Invention thinking of the present utility model shows as：A kind of LD laser feedbacks circuit is devised, stream can be in real time measured The size of current of laser is crossed, laser is constantly in normal luminous state by modulated in real time, obtained brightness and suitably swash Light grating.

The technical solution of the utility model is, a kind of laser feedback sampling apparatus of structure light maker, including optics Module and hardware control circuit, the optics module include the LD lasers, two-sided lens and the MEMS galvanometers that are sequentially connected；It is described Hardware control circuit includes FPGA module, and ARM modules, MEMS galvanometers drive module, the laser drive being connected with FPGA module Dynamic model block, the MEMS galvanometers drive module connects and composes control loop, the laser drive module and institute with MEMS galvanometers State LD lasers and connect and compose control loop, photodetector, the photodetector connection are provided with the LD lasers Sample circuit, the sample circuit is connected with ARM modules, and the sample circuit is to be composed in parallel with filter capacitor by divider resistance Circuit.

In optics module, laser facula is gone out using high-power LD laser emittings, the one side of two-sided lens is focused on, another Face collimates, and laser facula turns into laser beam, and uniform laser lines are scattering into the deflection of MEMS galvanometers；LD laser Device is high-power semiconductor laser.

Preferably, photodetector, light of the photodetector according to LD lasers are provided with the LD lasers Back facet current is produced according to intensity；The sample circuit is connected with the DAC passages of ARM modules；By the electric current of the divider resistance It is the real-time back facet current produced by the photodetector, the ARM modules will be gathered by IIC interfaces from sample circuit Data transfer gives the FPGA module.The hair of the backlight circuit real-time detection LD lasers that ARM modules are gathered by sample circuit Brightness, it is ensured that by the electric current of LD lasers all the time in the lasing threshold point of LD lasers；

The photodetector produces different back facet currents in real time according to the difference of the backlight intensity of LD lasers；LD swashs The size of the back facet current of light device and the proportional linear relationship of the size of forward current.

By the DAC passages of ARM modules come collection voltages value, by ceaselessly judging the electric current for collecting and setting threshold It is worth the difference of electric current, these data is processed, pass to FPGA module, FPGA module controls LD to swash by tabling look-up in real time The brightness of light device.

Preferably, the plane of incidence of the two-sided lens is focusing surface, and exit facet is collimation plane.

Preferably, the MEMS galvanometers are electrostatic MEMS galvanometers, and the galvanometer drive module is by described in high drive MEMS galvanometers, the laser beam of the LD laser emittings modulated through two-sided lens after by MEMS galvanometers scattering for and Laser lines.

Preferably, the ARM modules calculate the light extraction moment point of the LD lasers, are passed to by communication interface described FPGA module, the FPGA module controls the deflection of the break-make and the MEMS galvanometers of the LD lasers.

By experiment, the beneficial effects of the utility model are that simple structure is reasonable in design, can monitor in real time pass through LD The electric current of laser, and modulated, so as to get the suitable laser grating of brightness, have during structure light scan and 3D modeling Good application.

Brief description of the drawings

Fig. 1 is the theory diagram of the utility model embodiment.

Fig. 2 realizes flow chart for the utility model embodiment.

Fig. 3 is the ARM chip circuit figures of the utility model embodiment.

Fig. 4 illustrates interface circuit figure for the data between the FPGA and ARM of the utility model embodiment.

Fig. 5 is the power supply circuit of the ARM chips of the utility model embodiment.

Fig. 6 is the sample circuit figure of the utility model embodiment.

Specific embodiment

In order that the purpose of this utility model, technical scheme and advantage become more apparent, below in conjunction with accompanying drawing and implementation Example, is further elaborated to the utility model.Certainly, specific embodiment described herein is only used to explain this practicality It is new, it is not used to limit the utility model.

Embodiment 1

Referring to Fig. 1 and Fig. 6, the utility model is a kind of laser feedback sampling apparatus of structure light maker, including light Module and hardware control circuit are learned, optics module includes the LD lasers, two-sided lens and the MEMS galvanometers that are sequentially connected；Hardware control Circuit processed includes FPGA module, and ARM modules, MEMS galvanometers drive module, the laser drive module being connected with FPGA module, MEMS galvanometers drive module connects and composes control loop with MEMS galvanometers, and laser drive module connects and composes control with LD lasers Loop processed, photodetector connection sample circuit, sample circuit is connected with ARM modules, and sample circuit is by divider resistance and filter The circuit that ripple electric capacity is composed in parallel.

Photodetector is provided with LD lasers, photodetector produces backlight electricity according to the intensity of illumination of LD lasers Stream；Sample circuit is connected with the DAC passages of ARM modules；Electric current by divider resistance is by the real-time of photodetector generation Back facet current, the data transfer that ARM modules will be gathered by communication interface from sample circuit is used to FPGA module, communication interface IIC/Uart/SPI interfaces.The backlight circuit real-time detection LD lasers that ARM modules are gathered by sample circuit it is luminous Brightness, it is ensured that by the electric current of LD lasers all the time in the lasing threshold point of LD lasers；

Photodetector produces different back facet currents in real time according to the difference of the backlight intensity of LD lasers；LD lasers Back facet current size and the proportional linear relationship of size of forward current.

The plane of incidence of two-sided lens is focusing surface, and exit facet is collimation plane.

MEMS galvanometers are electrostatic MEMS galvanometers, and galvanometer drive module is gone out by high drive MEMS galvanometers, LD lasers The laser beam penetrated through two-sided lens modulate after by MEMS galvanometers scattering for and laser lines.

ARM modules calculate the light extraction moment point of LD lasers, and FPGA module, FPGA module control are passed to by communication interface The deflection of the break-make and MEMS galvanometers of LD lasers processed.

Job step of the present utility model is as follows：

On the one hand step one, ARM modules are calculated by certain algorithm and equidistantly wait brightness or sine energy distribution Laser grating LD lasers light extraction moment point, by communication interface (Uart/SPI) FPGA module is passed to control LD The deflection of the break-make and MEMS galvanometers of laser；

Step 2, in optics module, laser facula is gone out using high-power LD laser emittings, and the one side of two-sided lens is gathered Jiao, another side collimation, laser facula turns into laser beam, uniform laser rays is scattering into the deflection of MEMS galvanometers Bar；

Step 3, galvanometer drive circuit module drives electrostatic MEMS galvanometers by producing a high pressure, be allowed to according to Certain track motion under resonant condition；Laser beam is scattering into uniform laser lines under the deflection of MEMS galvanometers；

Step 4, the infrared laser (built-in photodetector) of reference power 200mW, setting the threshold size is 50mA.Full screen display laser grating, the now brightness of screen is the threshold size of the setting；

Step 5, sample circuit is directly connected to ARM modules, and the DAC passages of ARM modules carry out Real-time Collection magnitude of voltage, should On the other hand collection, by the back facet current of LD lasers, carrys out the luminosity of real-time detection LD lasers to block；

Step 6, ARM modules by each Real-time Collection to value and the threshold value of original start compare, judge what this was obtained Whether value is more than the threshold value of the setting；If big, the threshold value is just subtracted, obtain difference and pass to FPGA module；If small, just subtract The threshold value is gone, FPGA module is passed it to；The central idea of result is：Remain that this threshold size is constant.

Step 7, FPGA module receives the current information of the treated LD lasers that ARM modules are passed over, and comes real-time The brightness of LD lasers is controlled, it is remained threshold luminance.

The utility model without description technical characteristic can by or using prior art realize, will not be repeated here, Certainly, described above is not that, to limitation of the present utility model, the utility model is also not limited to the example above, this technology neck Change, remodeling, addition or replacement that the those of ordinary skill in domain is made in essential scope of the present utility model, should also belong to Protection domain of the present utility model.

Claims

1. a kind of laser feedback sampling apparatus of structure light maker, including optics module and hardware control circuit, the light Learning module includes the LD lasers, two-sided lens and the MEMS galvanometers that are sequentially connected；The hardware control circuit includes FPGA module, And ARM modules, MEMS galvanometers drive module, the laser drive module being connected with FPGA module, the MEMS galvanometers driving mould Block connects and composes control loop with MEMS galvanometers, and the laser drive module is connected and composed with the LD lasers and controlled back Road, it is characterised in that photodetector is provided with the LD lasers, the photodetector connects sample circuit, described Sample circuit is connected with ARM modules, and the sample circuit is the circuit composed in parallel by divider resistance and filter capacitor.

2. the laser feedback sampling apparatus of structure light maker according to claim 1, it is characterised in that the sampling Circuit is connected with the DAC passages of the ARM modules；The ARM modules are connected by IIC interfaces with the FPGA module.

3. the laser feedback sampling apparatus of structure light maker according to claim 1, it is characterised in that described two-sided The plane of incidence of lens is focusing surface, and exit facet is collimation plane.

4. the laser feedback sampling apparatus of structure light maker according to claim 1, it is characterised in that the MEMS Galvanometer is electrostatic MEMS galvanometers.