CN206161788U - Slow -witted device is prevented to DIP test multistation - Google Patents
Slow -witted device is prevented to DIP test multistation Download PDFInfo
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- CN206161788U CN206161788U CN201621231278.0U CN201621231278U CN206161788U CN 206161788 U CN206161788 U CN 206161788U CN 201621231278 U CN201621231278 U CN 201621231278U CN 206161788 U CN206161788 U CN 206161788U
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- multistation
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- locating support
- dip
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Abstract
The utility model discloses a slow -witted device is prevented to DIP test multistation belongs to the semiconductor test technology field. The utility model discloses a slow -witted device is prevented to DIP test multistation, including the testboard mesa, the front end of DUT board connection station is equipped with to fix a position and prevents slow -witted stop device on the testboard mesa, and this location prevents that slow -witted stop device includes the locating support that is fixed in on the testboard mesa and corresponds continuous locating plate with different station DUT boards respectively, wherein, the locating plate on all processing have a positioning channel section, and positioning channel section's position is different on the different locating plates, be equipped with on the locating support with each locating plate on the locating pin ability that corresponds respectively of positioning channel section. Through using the utility model discloses a slow -witted device is prevented to DIP test multistation can effectively avoid different station DUT boards alternately to connect the emergence of wrong phenomenon to guarantee the normal test of chip performance.
Description
Technical field
This utility model belongs to semiconductor test technical field, more particularly, it relates to a kind of DIP test multistation fool proofs
Device.
Background technology
Semiconductor reliability test is one important procedure in semiconductor manufacturing, its objective is the semiconductor device for detecting manufacture
Whether part is electrically qualified, so as to weed out underproof product.It is first that testing sample is (logical when carrying out semiconductor reliability test
It is often the chip through simplified package) it is inserted on DUT (device under test, DUT) plate, then DUT board is connected to into test machine
On platform, corresponding test data is obtained by the test of tester table, it can be seen that, the quality of DUT board quality is directly influenced
The test result of semiconductor reliability test.
TI test main frames are VLCT, and separator is middle skill gravity type selective separator, and on-line communication is RS232 patterns, due to logical
News pattern is RS232 patterns, is the online line (including+24V/0V/ signals) of single three cores, there is no intersection between station and connects
Wrong problem occurs, but multistation DUT board has station and intersects the possibility of wrong when being connected with testing, sorting machine.Prior art
In typically label is respectively adopted and is marked in different DUT board and corresponding board link position, consequently facilitating maintenance connection
Machine recognizes and the current check of inspection personnel, but its still inevitably different station intersects the possibility of wrong, especially
When Jing after maintenance or cleaning, the label in DUT board may be damaged or smudgy.
Such as, Chinese Patent Application No. 201510246093.0 discloses a kind of chip testing method for separating, this application case bag
Include step, S1：Tester and multistation separator are provided；S2：The communication interface of tester and separator is connected by cable
Connect, the test port of tester is connected with the station of separator；S3：Retain a station for not yet passing test of separator
And close other stations of separator；S4：Whether the cable connection relation of the current station for retaining of test is correct, if annexation
The correct then current station for retaining passes through test, and S3 steps are carried out again, until all stations are all by test；If the company of testing out
The incorrect cable connection relation for then adjusting the current station for retaining of relation is connect, then proceedes to repeat S4 steps；S5：Open sorting
All stations of machine, carry out the batch testing sorting of chip.This application case can be effectively prevented from because of multiplexing to a certain extent
Position separator cabling error and caused misclassification problem, but its complex operation is relatively inefficient.
Utility model content
1. the utility model technical problem to be solved
The purpose of this utility model is to overcome in prior art generally by the way of label labelling to different DUT boards
Connection station is identified and difference, so as to lead to not the deficiency for avoiding going out different station from intersecting wrong phenomenon, there is provided
A kind of DIP tests multistation anti-misoperation device.Can effectively be kept away by using DIP of the present utility model test multistation anti-misoperation devices
Exempt from the generation that different station DUT board intersects wrong phenomenon, so as to ensure the proper testing of chip performance.
2. technical scheme
To reach above-mentioned purpose, the technical scheme that this utility model is provided is：
A kind of DIP of the present utility model tests multistation anti-misoperation device, including testboard table top, on the testboard table top
The front end of DUT board connection station is provided with positioning fool proof stopping means, and the positioning fool proof stopping means include being fixed on testboard platform
Locating support on face and respectively connected location-plate corresponding with different station DUT board, wherein, process on described location-plate
Have a locating groove, and on different location-plates locating groove position it is different, the locating support is provided with and each location-plate
Upper locating groove distinguishes corresponding alignment pin, and by the cooperation of locating groove and alignment pin the wrong of different station DUT board is realized
Foolproof function.
Further, the two ends of the locating support are fixed on testboard table top by leg.
Further, described leg is the L-shaped structure being made up of with vertical supporting part horizontal mounting portion, wherein, water
Flat installation portion is fixedly linked with testboard table top, and vertical supporting part is fixedly linked with locating support.
Further, hole is threaded on the vertical supporting part of the L-shaped leg, the two ends of locating support are machined with
First fixing hole corresponding with screwed hole, is carried out to locating support by the bolt in screwed hole and the first fixing hole with leg
It is fixed.
Further, the first described fixing hole is waist-shaped hole.
Further, described locating groove is processed as U-shaped fluting.
Further, described locating support is provided with dowel hole, and described alignment pin is fixed in dowel hole.
Further, described DUT board is fixed on the top of location-plate by screw.
3. beneficial effect
The technical scheme provided using this utility model, compared with prior art, is had the advantages that：This practicality is new
A kind of DIP test multistation anti-misoperation devices of type, the front end of DUT board connection station is provided with positioning fool proof limit on its testboard table top
Position device, the positioning fool proof stopping means include the locating support that is fixed on testboard table top and respectively with different station DUT
The connected location-plate of plate correspondence, can effectively be prevented by alignment pin on locating support from the cooperation of locating groove on different location-plates
The only wrong of different station DUT board circuit, with good wrong function of dead prevention, so as to substantially increase testing efficiency.
Description of the drawings
Fig. 1 is the structural representation that a kind of DIP of the present utility model tests multistation anti-misoperation device；
Fig. 2 is the structural representation of location-plate of the present utility model；
Fig. 3 is the structural representation of locating support of the present utility model；
Fig. 4 is the structural representation of leg of the present utility model；
Fig. 5 is the schematic top plan view of leg in Fig. 4.
Label declaration in schematic diagram：
1st, testboard table top；2nd, locating support；201st, the first fixing hole；202nd, dowel hole；203rd, alignment pin；3rd, prop up
Foot；301st, horizontal mounting portion；302nd, vertical supporting part；303rd, the second fixing hole；304th, screwed hole；4th, location-plate；401st, position
Draw-in groove；5th, DUT board.
Specific embodiment
To further appreciate that content of the present utility model, detailed is made to this utility model in conjunction with the drawings and specific embodiments
Description.
Embodiment 1
As shown in figure 1, a kind of DIP test multistation anti-misoperation devices of the present embodiment, including testboard table top 1, the survey
The front end of DUT board connection station is provided with positioning fool proof stopping means on test stand table top 1, and the positioning fool proof stopping means include fixing
Locating support 2 on testboard table top 1 and respectively connected location-plate 4 corresponding with different station DUT board 5.Wherein, as Fig. 1-
Shown in Fig. 3, the position that locating groove 401 on locating groove 401, and different location-plates 4 is machined with described location-plate 4 is mutual
Differ, different DUT boards 5 are fixed on the top of different location-plates 4 by screw.The locating support 2 is provided with fixed with each
Locating groove 401 distinguishes corresponding alignment pin 203 on the plate 4 of position, the dowel hole 202 that alignment pin 203 is fixed on locating support 2
It is interior, the wrong of the circuit of different station DUT board 5 can effectively be prevented by the cooperation of locating groove 401 and alignment pin 203, have
Good wrong function of dead prevention, so as to substantially increase testing reliability.
Embodiment 2
As shown in figure 1, a kind of DIP test multistation anti-misoperation devices of the present embodiment, including testboard table top 1, the survey
The front end of DUT board connection station is provided with positioning fool proof stopping means on test stand table top 1, and the positioning fool proof stopping means include fixing
Locating support 2 on testboard table top 1 and respectively connected location-plate 4 corresponding with different station DUT board 5.Wherein, as Fig. 1-
Shown in Fig. 3, the position that locating groove 401 on locating groove 401, and different location-plates 4 is machined with described location-plate 4 is mutual
Differ, different DUT boards 5 are fixed on the top of different location-plates 4 by screw.The locating support 2 is provided with fixed with each
Locating groove 401 distinguishes corresponding alignment pin 203 on the plate 4 of position, the dowel hole 202 that alignment pin 203 is fixed on locating support 2
It is interior.Locating groove 401 is processed as U-shaped fluting in the present embodiment.
In the present embodiment, the two ends of locating support 2 are fixed on testboard table top 1 by leg 3, as shown in Figure 4, Figure 5,
Described leg 3 is the L-shaped structure being made up of with vertical supporting part 302 horizontal mounting portion 301, wherein, horizontal mounting portion 301 with
Testboard table top 1 is fixedly linked, and vertical supporting part 302 is fixedly linked with locating support 2.Specifically, the horizontal mounting portion 301
On be machined with the second fixing hole 303, second fixing hole 303 is kidney-shaped pore structure, will by bolt in the second fixing hole 303
Leg 3 is fixed on testboard table top 1.Hole 304, positioning are threaded on the vertical supporting part 302 of the L-shaped leg 3
The two ends of frame 2 are machined with first fixing hole 201 corresponding with screwed hole 304, and the first fixing hole 201 is also processed as waist-shaped hole knot
Structure, is fixed to locating support 2 by the bolt in the fixing hole 201 of screwed hole 304 and first with leg 3.
Below schematically this utility model and embodiments thereof be described, the description does not have restricted, accompanying drawing
Shown in be also one of embodiment of the present utility model, actual structure is not limited thereto.So, if this area
Those of ordinary skill enlightened by it, in the case where objective is created without departing from this utility model, design without creative
The frame mode similar to the technical scheme and embodiment, all should belong to protection domain of the present utility model.
Claims (8)
1. a kind of DIP tests multistation anti-misoperation device, including testboard table top (1), it is characterised in that：The testboard table top
(1) front end of DUT board connection station is provided with positioning fool proof stopping means on, and the positioning fool proof stopping means include being fixed on test
Locating support (2) on platform table top (1) and respectively connected location-plate (4) corresponding with different station DUT board (5), wherein, it is described
Location-plate (4) on be machined with locating groove (401), and on different location-plates (4) locating groove (401) the mutual not phase in position
Together, the locating support (2) is provided with alignment pin (203) corresponding with locating groove (401) difference on each location-plate (4), leads to
Cross locating groove (401) and realize the wrong foolproof function of different station DUT board (5) with the cooperation of alignment pin (203).
2. a kind of DIP according to claim 1 tests multistation anti-misoperation device, it is characterised in that：The locating support (2)
Two ends be fixed on testboard table top (1) by leg (3).
3. a kind of DIP according to claim 2 tests multistation anti-misoperation device, it is characterised in that：Described leg (3) is
The L-shaped structure being made up of with vertical supporting part (302) horizontal mounting portion (301), wherein, horizontal mounting portion (301) and testboard
Table top (1) is fixedly linked, and vertical supporting part (302) is fixedly linked with locating support (2).
4. a kind of DIP according to claim 3 tests multistation anti-misoperation device, it is characterised in that：The L-shaped leg (3)
Vertical supporting part (302) on be threaded hole (304), the two ends of locating support (2) are machined with relative with screwed hole (304)
The first fixing hole (201) answered, by the way that the bolt in screwed hole (304) and the first fixing hole (201) is to locating support (2) and props up
Foot (3) is fixed.
5. a kind of DIP according to claim 4 tests multistation anti-misoperation device, it is characterised in that：The first described fixation
Hole (201) is waist-shaped hole.
6. a kind of DIP according to any one of claim 1-5 tests multistation anti-misoperation device, it is characterised in that：It is described
Locating groove (401) be processed as U-shaped fluting.
7. a kind of DIP according to claim 6 tests multistation anti-misoperation device, it is characterised in that：Described locating support
(2) dowel hole (202) is provided with, described alignment pin (203) is fixed in dowel hole (202).
8. a kind of DIP according to claim 7 tests multistation anti-misoperation device, it is characterised in that：Described DUT board (5)
The top of location-plate (4) is fixed on by screw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621231278.0U CN206161788U (en) | 2016-11-15 | 2016-11-15 | Slow -witted device is prevented to DIP test multistation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621231278.0U CN206161788U (en) | 2016-11-15 | 2016-11-15 | Slow -witted device is prevented to DIP test multistation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206161788U true CN206161788U (en) | 2017-05-10 |
Family
ID=58660009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621231278.0U Active CN206161788U (en) | 2016-11-15 | 2016-11-15 | Slow -witted device is prevented to DIP test multistation |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206161788U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111965521A (en) * | 2020-08-11 | 2020-11-20 | 广东利扬芯片测试股份有限公司 | Anti-reverse-insertion structure of test board for radio frequency chip and radio frequency chip testing device |
| CN112488254A (en) * | 2020-11-02 | 2021-03-12 | 昆山丘钛生物识别科技有限公司 | Fool-proof test machine table |
-
2016
- 2016-11-15 CN CN201621231278.0U patent/CN206161788U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111965521A (en) * | 2020-08-11 | 2020-11-20 | 广东利扬芯片测试股份有限公司 | Anti-reverse-insertion structure of test board for radio frequency chip and radio frequency chip testing device |
| CN111965521B (en) * | 2020-08-11 | 2022-08-05 | 广东利扬芯片测试股份有限公司 | Anti-reverse-insertion structure of test board for radio frequency chip and radio frequency chip testing device |
| CN112488254A (en) * | 2020-11-02 | 2021-03-12 | 昆山丘钛生物识别科技有限公司 | Fool-proof test machine table |
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