CN206161581U - Apple inside quality apparatus - Google Patents
Apple inside quality apparatus Download PDFInfo
- Publication number
- CN206161581U CN206161581U CN201621077782.XU CN201621077782U CN206161581U CN 206161581 U CN206161581 U CN 206161581U CN 201621077782 U CN201621077782 U CN 201621077782U CN 206161581 U CN206161581 U CN 206161581U
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- CN
- China
- Prior art keywords
- apple
- pressure sensor
- computer
- pole plate
- internal quality
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The utility model provides an electric performance parameters that apple inside quality apparatus is by survey frame, LCR data acquisition instrument and computer organization, can get the apple under a plurality of frequencies from dynamic testing to confirm malic inside quality or grade according to these electric performance parameters. Being equipped with pressure sensor, lower pressure sensor, height measurement device and control circuit on the survey frame, can controlling plate electrode automatic decline, stop motion and lift, the automatic measurement of apple quality is measured in the realization. The height measurement device can record malic height or diameter.
Description
Technical field
The utility model is related to a kind of apple internal quality analyzer, belongs to fruit quality and determines field.
Background technology
Patent Office of the People's Republic of China's September in 2014 discloses a patent application (CN104062248A) on the 24th, discloses a kind of inspection
The method for surveying apple mechanical damage, it can be determined that whether apple has damage, but can not differentiate the quality of apple.
If apple is placed between two battery lead plates, to battery lead plate plus the electric field of different frequency, apple can be measured
Dielectric property, and the different apple dielectric property of quality is also different.The purpose of this utility model is just to provide a kind of based on Jie
The apple internal quality analyzer of electrical characteristics.
The content of the invention
Apple internal quality analyzer in the utility model is made up of mensuration frame, LCR data collecting instruments and computer；
LCR data collecting instruments are connected with mensuration frame, can automatically measure apple electrical characteristic parameter at multiple frequencies, and will measure
Electrical characteristic parameter sends computer to；Computer determines the inside quality of apple according to these electrical characteristic parameters.
The beneficial effects of the utility model can be the electrical characteristics ginseng for measuring apple automatically under 3 or more different frequencies
Number, and the quality of apple is determined according to the electrical characteristic parameter for measuring or apple is classified.
Further, the mensuration frame by electric pole plate, bottom electrode plate, support, upper pressure sensor, lower pressure sensor,
Height measuring device and control circuit are constituted, and upper pressure sensor and height measuring device are connected with control circuit；Upper pressure is passed
Sensor is arranged on below electric pole plate；Electric pole plate can move up and down along support, when the upper pressure sensor installed thereon is touched
And to motion can be automatically stopped during apple；Now, height measuring device can measure the height or diameter of apple.
Further, the bottom electrode plate is installed above lower pressure sensor, and the lower pressure sensor and control circuit
It is connected；After apple is put, control circuit can automatically control electric pole plate and move downward.
Further, the LCR data collecting instruments are by wave filter, single-chip microcomputer, impedance voltage converter, buffer amplifier, phase
Quick wave detector etc. is constituted；Impedance voltage converter is connected with buffer amplifier；Buffer amplifier is connected with phase-sensitive detector；Monolithic
Machine is connected respectively with phase-sensitive detector, wave filter and computer.Single-chip microcomputer produces square wave, and after filtered device sine wave is become, and leads to
Cross battery lead plate to be added on apple.
Further, the computer adopts embedded computer, thereon equipped with display, it may be determined that, record and show
The inside quality of tested apple.
Further, the embedded computer and LCR data collecting instruments are made of one, and are convenient for carrying and use.
Further, the mensuration frame is arranged in a metal box.
Description of the drawings
Fig. 1 is a kind of frame diagram of apple internal quality analyzer.
Fig. 2 is the hardware frame figure of LCR data collecting instruments.
In figure：1. computer, 2.LCR data collecting instruments, 3. test probe, 4. electric pole plate, 5. apple, 6. bottom electrode
Plate, 7. goes up pressure sensor, 8. lower pressure sensor, 9. support, 10. wave filter, 11. single-chip microcomputers, the conversion of 12. impedance voltages
Device, 13. buffer amplifiers, 14. phase-sensitive detectors.
Specific embodiment
Below, a specific embodiment is provided with reference to accompanying drawing 1, accompanying drawing 2.
Electric pole plate 4 is initially in lifting status.Apple 5 is put down after battery lead plate 6, and control circuit is upper by what is installed thereon
Pressure sensor 7 can detect corresponding signal, and control electric pole plate 4 is moved downward.When electric pole plate 4 touches apple 5,
Control circuit can detect corresponding signal by the lower pressure sensor 8 installed below, and control electric pole plate 4 stops fortune
It is dynamic, the height or diameter of height measuring device measurement apple 5 are controlled, and notify that LCR data collecting instruments 2 start to measure apple 5
Electrical characteristic parameter.
LCR data collecting instruments 2 are connected to after the notice for starting to measure, and the control wave filter 10 of single-chip microcomputer 11 produces first frequency
Test signal.Test signal is transferred to the two ends of measurement object 5 by electrode and upper and lower two battery lead plates, and by the electricity for obtaining
Pressure signal is converted to impedance signal by impedance voltage converter 12, isolates the impedance component of needs.Impedance component is through slow
Rush after amplifier 13 amplifies and give phase-sensitive detector 14, isolate the real part and imaginary part of complex impedance, and be through AD conversion and one
Corresponding electrical characteristic parameter value is obtained after column count, and it is by RS-232 serial line interfaces or other communication interfaces that the electricity for obtaining is special
Property parameter value sends computer 1 to.
After electrical characteristic parameter value under first frequency is measured, control second frequency of generation of wave filter 10 of single-chip microcomputer 11
Test signal, obtains corresponding electrical characteristic parameter value, and is transferred to computer 1.Then, the control of single-chip microcomputer 11 wave filter 10
The test signal of the 3rd frequency is produced, corresponding electrical characteristic parameter value is obtained, and is transferred to computer 1；Until obtaining
Electrical characteristic parameter value under required all frequencies, and it is transferred to computer 1.
Computer 1 is received after the electrical characteristic parameter value under required all frequencies, according to corresponding electrical characteristic parameter
Relational model between value and the quality of apple 5 or classification determines the quality or grade of the apple 5.
Claims (6)
1. a kind of apple internal quality analyzer, including computer (1), LCR data collecting instruments (2), test probe (3), upper electricity
Pole plate (4), apple (5), bottom electrode plate (6), upper pressure sensor (7), lower pressure sensor (8), support (9), wave filter
(10), single-chip microcomputer (11), impedance voltage converter (12), buffer amplifier (13), phase-sensitive detector (14), it is characterised in that it
It is made up of mensuration frame, LCR data collecting instruments (2) and computer (1)；LCR data collecting instruments (2) are connected with mensuration frame, can survey
Apple (5) electrical characteristic parameter at multiple frequencies is obtained, and sends the electrical characteristic parameter for measuring to computer (1)；Computer
(1) inside quality of apple (5) is determined according to these electrical characteristic parameters.
2. a kind of apple internal quality analyzer according to claim 1, it is characterised in that mensuration frame is by electric pole plate
(4), bottom electrode plate (6), support (9), upper pressure sensor (7), lower pressure sensor (8), height measuring device and control electricity
Road constitutes, and upper pressure sensor (7) is common with lower pressure sensor (8) and height measuring device is connected with control circuit；Upper pressure
Force snesor (7) installed in electric pole plate (4) below；Electric pole plate (4) can move up and down along support (9), install when thereon
Upper pressure sensor (7) motion can be automatically stopped when touching apple (5)；Now, height measuring device can measure apple
(5) height or diameter.
3. a kind of apple internal quality analyzer according to claim 1, it is characterised in that bottom electrode plate (6) is installed above
There is lower pressure sensor (8), and the lower pressure sensor (8) is connected with control circuit；After apple (5) is put, control circuit
Electric pole plate (4) can be automatically controlled to move downward.
4. a kind of apple internal quality analyzer according to claim 1, it is characterised in that LCR data collecting instruments (2) by
Wave filter (10), single-chip microcomputer (11), impedance voltage converter (12), buffer amplifier (13), phase-sensitive detector (14) composition；Resistance
Reactance voltage converter (12) is connected with buffer amplifier (13)；Buffer amplifier (13) is connected with phase-sensitive detector (14)；Monolithic
Machine (11) is connected respectively with phase-sensitive detector (14), wave filter (10) and computer (1).
5. a kind of apple internal quality analyzer according to claim 1, it is characterised in that computer (1) is using embedded
Computer, thereon equipped with display, it may be determined that, record and show the inside quality of tested apple (5).
6. a kind of apple internal quality analyzer according to claim 1, it is characterised in that mensuration frame is arranged on a gold
In category box.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621077782.XU CN206161581U (en) | 2016-09-20 | 2016-09-20 | Apple inside quality apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621077782.XU CN206161581U (en) | 2016-09-20 | 2016-09-20 | Apple inside quality apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206161581U true CN206161581U (en) | 2017-05-10 |
Family
ID=58651759
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621077782.XU Expired - Fee Related CN206161581U (en) | 2016-09-20 | 2016-09-20 | Apple inside quality apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206161581U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110749503A (en) * | 2019-11-14 | 2020-02-04 | 浙江大学 | Method for simulating mechanical damage of citrus fruits and application |
-
2016
- 2016-09-20 CN CN201621077782.XU patent/CN206161581U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110749503A (en) * | 2019-11-14 | 2020-02-04 | 浙江大学 | Method for simulating mechanical damage of citrus fruits and application |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170510 Termination date: 20170920 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |