CN206057380U - Both sides pin package burning chip test station structure - Google Patents
Both sides pin package burning chip test station structure Download PDFInfo
- Publication number
- CN206057380U CN206057380U CN201621035776.8U CN201621035776U CN206057380U CN 206057380 U CN206057380 U CN 206057380U CN 201621035776 U CN201621035776 U CN 201621035776U CN 206057380 U CN206057380 U CN 206057380U
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- China
- Prior art keywords
- chip
- overhead gage
- pressure bar
- pan feeding
- base pressure
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Abstract
This utility model is related to a kind of both sides pin package burning chip test station structure, it is characterized in that:Including pan feeding track, the base pressure bar that can make rise and fall action is arranged in pan feeding rail base, directly over base pressure bar, enters discharge position for chip in pan feeding track;Overhead gage is set above the pan feeding track, multiple guide rods in overhead gage, are worn, guide rod is slidably matched with overhead gage, the top of guide rod arranges limited cap, and spring is arranged between limited cap and overhead gage;Golden finger is respectively provided with above the both sides of the chip.On front side of the base pressure bar it is provided for blocking the chip baffle plate of chip.The plurality of guide rod is centrosymmetric setting with the center of base pressure bar.This utility model simple structure, ensure that both sides pin uniform force.
Description
Technical field
This utility model is related to a kind of both sides pin package burning chip test station structure, belongs to burning chip equipment skill
Art field.
Background technology
When chip of the pin positioned at plastic-sealed body two ends carries out burning or test in automatization or semi-automatic board, it is logical
Cross golden finger or acupuncture needle is contacted with chip pin, realize the connection of chip and cd-rom recorder, so that burning test is carried out to chip.
Traditional die burning test station structure makes golden finger bending and chip both sides pin order by pressing golden finger
Contact.The problem that this structure is present is that golden finger is difficult to ensure that uniform force when pressing to pin both sides, if burning test rail
Road produces leaky as pin discontinuity causes pin easily to touch track using during metal material;And use non-gold
Category insulant, is all difficult to keep because frequently making work, the mechanical strength of track and life-span.Meanwhile, it is to ensure burning test
Quality, traditional station structure are higher to the requirement on machining accuracy of track, cause production cost high, and track be also limited to it is right
The burning test of the both sides pin package chip of different size thickness.
The content of the invention
The purpose of this utility model is to overcome the deficiencies in the prior art, there is provided a kind of both sides pin package chip burns
Record test station structure, simple structure ensure that both sides pin uniform force.
According to this utility model provide technical scheme, the both sides pin package burning chip test station structure, its
It is characterized in that:Including pan feeding track, the base pressure bar that can make rise and fall action is arranged in pan feeding rail base, directly over base pressure bar
Be chip in pan feeding track enters discharge position;Overhead gage is set above the pan feeding track, multiple leading in overhead gage, is worn
Bar, guide rod are slidably matched with overhead gage, and the top of guide rod arranges limited cap, and spring is arranged between limited cap and overhead gage;Institute
State.
Further, it is provided for blocking the chip baffle plate of chip on front side of the base pressure bar.
Further, the plurality of guide rod is centrosymmetric setting with the center of base pressure bar.
This utility model pan feeding track bottom be arranged installation base pressure bar, by base pressure bar drive chip on move and with gold
Finger is contacted, and can fundamentally avoid the generation of metal material track leaky caused by chip pin unbalance stress;This
Utility model is also by being symmetrical arranged spring retainer bar on the upside of overhead gage, it is ensured that chip be with transposing contact golden finger in level,
Uniform force when chip pin can be made to press to golden finger, both benign contacts improve the burning detection quality of chip;This reality
The thickness specification of the machining accuracy and chip of track is not limited to new structure, simple structure can largely reduce life
Produce cost.
Description of the drawings
Fig. 1 is the front view of both sides pin package burning chip test station structure described in the utility model.
Fig. 2 is the side view of both sides pin package burning chip test station structure described in the utility model.
Fig. 3 is the top view of both sides pin package burning chip test station structure described in the utility model.
Fig. 4 is pan position state diagram on the base pressure bar.
Specific embodiment
With reference to concrete accompanying drawing, the utility model is described in further detail.
As shown in Figure 1 to 4:The both sides pin package burning chip test station structure include limited cap 1, guide rod 2,
Spring 3, overhead gage 4, golden finger 5, chip 6, base pressure bar 7, chip baffle plate 8, pan feeding track 9 etc..
As shown in FIG. 1 to 3, both sides pin package burning chip test station structure described in the utility model, including entering
Material track 9, is arranged installation base pressure bar 7 in 9 bottom of pan feeding track, is the entering in pan feeding track 9 of chip 6 directly over base pressure bar 7
Discharge position;Overhead gage 4 is set above the pan feeding track 9, and the left-right and front-back of overhead gage 4 wears guide rod 2 respectively, guide rod 2 with
Overhead gage 4 is slidably matched, and the top of guide rod 2 arranges limited cap 1, and spring 3 is arranged between limited cap 1 and overhead gage 4;In the core
Golden finger 5 is respectively provided with above the both sides of piece 6;It is provided for blocking the chip baffle plate 8 of chip 6 in the front side of the base pressure bar 7.
Operation principle of the present utility model:Chip 6 is slipped to the golden finger 5 of pan feeding track 9 by chip by pan feeding track
Baffle plate 8 is blocked, and is then moved on base pressure bar 7, is made 6 upper surface of chip be close to overhead gage 4(As shown in Figure 4), when chip 6 and overhead gage
After 4 contacts, move in the continuation of base pressure bar 7, chip 6 and overhead gage 4 is moved on the whole, be now placed in the spring 3 on the upside of overhead gage 4 and open
Begin to compress, make 4 upper surface of overhead gage be subject to 3 pressure of uniform spring, so that moving in 4 holding level of chip 6 and overhead gage straight
To chip 6 both sides pin contact with golden finger 5 after stop the upper mobile of base pressure bar 7 and make, now, pin is with golden finger 5
Smoothly connect, start burning test job.
This utility model pan feeding track bottom be arranged installation base pressure bar, by base pressure bar drive chip on move and with gold
Finger is contacted, and can fundamentally avoid the generation of metal material track leaky caused by chip pin unbalance stress;This
Utility model is also by being symmetrical arranged spring retainer bar on the upside of overhead gage, it is ensured that chip be with transposing contact golden finger in level,
Uniform force when chip pin can be made to press to golden finger, both benign contacts improve the burning detection quality of chip;This reality
The thickness specification of the machining accuracy and chip of track is not limited to new structure, simple structure can largely reduce life
Produce cost.
Claims (3)
1. a kind of both sides pin package burning chip test station structure, is characterized in that:Including pan feeding track(9), in pan feeding rail
Road(9)Bottom is arranged the base pressure bar that can make rise and fall action(7), base pressure bar(7)Surface is chip(6)In pan feeding track
(9)In enter discharge position;In the pan feeding track(9)Top arranges overhead gage(4), overhead gage(4)In wear multiple guide rods
(2), guide rod(2)With overhead gage(4)It is slidably matched, guide rod(2)Top arrange limited cap(1), limited cap(1)And overhead gage
(4)Between spring is set(3);In the chip(6)Both sides above be respectively provided with golden finger(5).
2. both sides pin package burning chip test station structure as claimed in claim 1, is characterized in that:In the base pressure bar
(7)Front side be provided for blocking chip(6)Chip baffle plate(8).
3. both sides pin package burning chip test station structure as claimed in claim 1, is characterized in that:The plurality of guide rod
(2)With base pressure bar(7)Center be centrosymmetric setting.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201621035776.8U CN206057380U (en) | 2016-08-31 | 2016-08-31 | Both sides pin package burning chip test station structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201621035776.8U CN206057380U (en) | 2016-08-31 | 2016-08-31 | Both sides pin package burning chip test station structure |
Publications (1)
Publication Number | Publication Date |
---|---|
CN206057380U true CN206057380U (en) | 2017-03-29 |
Family
ID=58375216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201621035776.8U Active CN206057380U (en) | 2016-08-31 | 2016-08-31 | Both sides pin package burning chip test station structure |
Country Status (1)
Country | Link |
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CN (1) | CN206057380U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107607859A (en) * | 2017-10-24 | 2018-01-19 | 长电科技(滁州)有限公司 | A kind of chip testing and sealing device and its technique |
-
2016
- 2016-08-31 CN CN201621035776.8U patent/CN206057380U/en active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107607859A (en) * | 2017-10-24 | 2018-01-19 | 长电科技(滁州)有限公司 | A kind of chip testing and sealing device and its technique |
CN107607859B (en) * | 2017-10-24 | 2023-04-11 | 长电科技(滁州)有限公司 | Chip testing and sealing device and process thereof |
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