CN206038181U - Thermistor and electronic equipment - Google Patents
Thermistor and electronic equipment Download PDFInfo
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- CN206038181U CN206038181U CN201621056466.4U CN201621056466U CN206038181U CN 206038181 U CN206038181 U CN 206038181U CN 201621056466 U CN201621056466 U CN 201621056466U CN 206038181 U CN206038181 U CN 206038181U
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- critesistor
- interval
- connecting portion
- detecting part
- base substrate
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Abstract
The utility model provides a thermistor and the electronic equipment that can be connected with external circuit through simple structure. The utility model relates to a thermistor's characterized in that, including the body of compliance has and set up in the filiform signal line of body, the signal line contains and is used for signal line and external circuit's the 1st connecting portion of being connected and the 2nd connecting portion and the 1st connecting portion with walk line portion and sensing portion according to the 1st of this order series electrically connected between the 2nd connecting portion, the average value of the live width of sensing portion is less than the 1st average value of walking the live width of line portion.
Description
Technical field
This utility model is related to possess the critesistor with flexual base substrate and electronic equipment.
Background technology
As the existing invention related to critesistor, it is known to the cell apparatus that for example patent documentation 1 is recorded.Fig. 9
It is the sectional structure chart of the cell apparatus 500 and equipment 509 described in patent documentation 1.
Cell apparatus 500 are as shown in figure 9, including battery main body 502, substrate 503, critesistor 504 and through hole 511.Electricity
Tank main body 502 is in rectangular-shape.Substrate 503 is arranged at the upper surface of battery main body 502.Critesistor 504 is arranged at substrate 503
Upper surface, be the conductor layer of the wire for example formed as shape of crawling.Critesistor 504 is provided for determining battery main body
502 temperature.Through hole 511 runs through substrate 503 in the vertical direction, and one end of critesistor 504 is connected with battery main body 502
Connect.Cell apparatus 500 are installed in equipment 509, and are provided with the contact 510 being connected with the other end of critesistor 504.
In the cell apparatus 500 that patent documentation 1 is recorded, critesistor 504 passes through contact 510 and is arranged at critesistor
The equipment 509 of 504 surface is connected.However, in order to by one end of critesistor 504 be located remotely from cell apparatus 500
The circuit substrate of position be connected, it is impossible to using contact 510, and need to be provided for connecting critesistor 504 and circuit base
The wiring of plate.But in cell apparatus 500, critesistor 504 is formed on relatively hard substrate 503.Accordingly, it would be desirable in substrate
Connecting elements as 503 configuration such as adapters, and wiring is connected to into the connecting elements.Its result causes cell apparatus
In 500, for the connection for being connected up, need to arrange part as connecting elements, so as to structure becomes complicated.
Prior art literature
Patent documentation
Patent documentation 1：Japanese Patent Laid-Open 2003-331926 publication
Utility model content
Utility model technical problem to be solved
Therefore, the purpose of this utility model is to provide one kind to be connected with external circuit by simple structure
The critesistor for connecing and electronic equipment.
Solve the technical scheme adopted by technical problem
Critesistor involved by an embodiment of the present utility model is characterised by, including：Base substrate, the base substrate have
Pliability；And signal line, the signal line is wire, and is arranged at the base substrate, and the signal line is included：1st connects
Socket part and the 2nd connecting portion, the 1st connecting portion and the 2nd connecting portion are used for the connection of the signal line and external circuit；And the
1 cabling portion and detecting part, the 1st cabling portion and detecting part between the 1st connecting portion and the 2nd connecting portion in the order
It is electrically connected in series, the meansigma methodss of the live width of the detecting part are less than the meansigma methodss of the live width in the 1st cabling portion.
Electronic equipment involved by an embodiment of the present utility model is characterised by, including：Critesistor；And thing
Product, the critesistor include：Base substrate, the base substrate have pliability；And signal line, the signal line is wire, and is set
The base substrate is placed in, the signal line is included：1st connecting portion and the 2nd connecting portion, the 1st connecting portion and the 2nd connecting portion are used for
The connection of the signal line and external circuit；And the 1st cabling portion and detecting part, the 1st cabling portion and detecting part are described
It is electrically connected in series between 1st connecting portion and the 2nd connecting portion in the order, the detecting part is configured at and can determine the thing
The position of the temperature of product, the meansigma methodss of the live width of the detecting part are less than the meansigma methodss of the live width in the 1st cabling portion.
Utility model effect
According to this utility model, critesistor and external circuit can be connected by simple structure.
Description of the drawings
Fig. 1 is the stereoscopic figure of critesistor 10.
Fig. 2 is the exploded perspective view of the base substrate 12 of the critesistor 10 of Fig. 1.
Fig. 3 A are the figures obtained from front side Transmission electron equipment 200.
Fig. 3 B are the figures obtained from upside Transmission electron equipment 200.
Fig. 4 is the equivalent circuit diagram for the part for extracting the circuit in electronic equipment 200.
Fig. 5 A are the stereoscopic figures of critesistor 10a.
Fig. 5 B are the exploded perspective views of the base substrate 12 of the critesistor 10a involved by variation 1.
Fig. 6 is the exploded perspective view of the base substrate 12 of the critesistor 10b involved by variation 2.
Fig. 7 A are the figures obtained from front side Transmission electron equipment 200a.
Fig. 7 B are the figures obtained from upside Transmission electron equipment 200a.
Fig. 8 is to have an X-rayed the figure that the electronic equipment 200b involved by other embodiment is obtained from upside.
Fig. 9 is the sectional structure chart of the cell apparatus 500 and equipment 509 described in patent documentation 1.
Specific embodiment
Hereinafter, referring to the drawings the critesistor and electronic equipment involved by embodiment of the present utility model is said
It is bright.
(structure of critesistor and electronic equipment)
Below, referring to the drawings, the structure of the critesistor 10 involved by an embodiment of the present utility model is carried out
Explanation.Fig. 1 is the stereoscopic figure of critesistor 10.Fig. 2 is the exploded perspective view of the base substrate 12 of the critesistor 10 of Fig. 1.Fig. 1
In Fig. 2, the stacked direction of critesistor 10 is defined as into above-below direction.The long side direction of critesistor 10 is defined as into left and right
The direction orthogonal with above-below direction and left and right directions is defined as fore-and-aft direction by direction.
Critesistor 10 is arranged on mobile electricity for example in order to determine the temperature of the article (hereinafter referred to as heater) of heating
In the electronic equipments such as words.Critesistor 10 as depicted in figs. 1 and 2, including base substrate 12, adhesive linkage 13, signal line 18 and connection
Device 100a, 100b.
Base substrate 12 is created as the flexual ribbon-shaped members of square U-shaped, includes dielectric layer 14 and protective layer 15.
When observing from upside, dielectric layer 14 is with base substrate 12 again it is being formed as the flexual ribbon-shaped members of square U-shaped.Electricity is situated between
Matter layer 14 there is flexual thermoplastic resin to constitute by polyimides, liquid crystal polymer etc..Hereinafter, by base substrate 12 and electricity Jie
The upside interarea of matter layer 14 is referred to as surface, and the downside interarea of base substrate 12 and dielectric layer 14 is referred to as the back side.
As shown in Fig. 2 signal line 18 is arranged on the surface of base substrate 12, it is the conductor of the wire extended along base substrate 12
Layer.Therefore, when observing from upside, signal line 18 is identically formed as square U-shaped with base substrate 12.Signal line 18 be copper,
The metal formings such as silver, are pasted on the surface of base substrate 12.Signal line 18 includes cabling portion 20a, 20b, detecting part 22 and connecting portion
24a、24b。
Connecting portion 24a (one of the 1st connecting portion) is formed as rectangle, is arranged on the end of left rear side in the surface of base substrate 12
Portion.Connecting portion 24a constitutes the end of the left rear side of signal line 18, for being attached with external circuit.Connecting portion 24b the (the 2nd
One of connecting portion) be formed as rectangle, it is arranged on the end of front left side in the surface of base substrate 12.Connecting portion 24b constitutes holding wire
The end of the front left side on road 18, for being attached with external circuit.Implement gold-plated etc. on the surface of connecting portion 24a, 24b.
Cabling portion 20a, the detecting part 22 and cabling portion 20b company of series connection between connecting portion 24a and connecting portion 24b in the order
Connect.Cabling portion 20a (one of the 1st cabling portion) right directions from connecting portion 24a extend, and then lateral bending is rolled over forward.Cabling portion
The meansigma methodss of the live width of 20a are live width W1.Live width is referred to from upside when observing orthogonal with the bearing of trend of signal line 18
The size of signal line 18 on direction.In addition, cabling portion 20a is as shown in Fig. 2 substantially have impartial live width.
20b right directions from connecting portion 24b in cabling portion extend, and then lateral bending is rolled over backward.The live width of cabling portion 20b it is flat
Average is live width W1.In addition, cabling portion 20b is as shown in Fig. 2 substantially have impartial live width.
Detecting part 22 is arranged to determine the temperature of heater, is formed as curved shape.More specifically, sense
Portion 22 by while from rear side forward skidding enter, while carry out in the lateral direction it is reciprocal in the way of advance tortuously.After detecting part 22
Side end is connected with the forward right side end of cabling portion 20a.The anterior end of detecting part 22 and the right lateral side end of cabling portion 20b
It is connected.The meansigma methodss of the live width of detecting part 22 are live width W2.Live width W2 is less than live width W1.In addition, the such as Fig. 2 institutes of detecting part 22
Show that substantially there is impartial live width.
As described above, by detecting part 22 is formed as curved shape such that it is able to increase the length of detecting part 22.And
And, by the live width of detecting part 22 is set to the live width less than cabling portion 20a, 20b, so as to the per unit length of detecting part 22
Resistance value becomes big.Its result causes the resistance value of detecting part 22 also to become bigger than the resistance value of cabling portion 20a, 20b.Thus,
If the resistance value of detecting part 22 becomes big, the amount of change of the resistance value of the detecting part 22 produced because of the temperature change of detecting part 22
Also become big.Therefore, it is possible to more precisely detect temperature change.
Additionally, base substrate 12 includes interval A1～A5.Interval A1 (one of the 1st interval) is provided with cabling portion 20a's
Interval, L fonts obtained from lateral bending is rolled over further along after being formed as extending to the right.Interval A4 (one of the 3rd interval) is to arrange
There is the interval of connecting portion 24a, be connected with the left end of interval A1.Interval A3 is provided with the interval of cabling portion 20b, is formed
The L fonts obtained from lateral bending is rolled over backward again after extending to the right.Interval A5 is provided with the interval of connecting portion 24b, with interval
The left end of A3 is connected.
Interval A2 (one of the 2nd interval) is provided with the interval of detecting part 22, is formed as rectangle.The rear side end of interval A2
Portion is connected with the end of the forward right side of interval A1.The anterior end of interval A2 is connected with the end of the right lateral side of interval A3.
Herein, the meansigma methodss of the width of interval A1, A3 are less than the meansigma methodss of the width of interval A2.Therefore, with interval A2
Compare, interval A1, A3 easily deform.The width of interval A1～A3 referred to from upside when observing, and is being prolonged with interval A1～A3
Stretch the size of interval A1～A3 on the orthogonal direction in direction.
Protective layer 15 is as shown in figure 1, by covering the substantially whole surface of base substrate 12 come protection signal circuit 18.But even
Socket part 24a, 24b and its nearby it is not protected layer 15 and covers.Protective layer 15 is for example made up of the pliability resin such as anticorrosive additive material.
Adapter 100a is installed on interval A4, is connected with connecting portion 24a.More specifically, under adapter 100a
Surface is provided with outer electrode (not shown).Outer electrode is fixed on connecting portion 24a by solder etc..In the upper table of adapter 100a
Face is provided with the outside terminal (not shown) electrically connected with outer electrode.
Adapter 100b is installed on interval A5, is connected with connecting portion 24b.The structure of adapter 100b and adapter 100a
Structure it is identical, therefore omit the description.
Adhesive linkage 13 (one of fixed part) is the component of the relative position for fixed interval A2 Yu heater, is thin
The layer of bonding agent.In present embodiment, adhesive linkage 13 is arranged at the surface of interval A2, plays and for interval A2 to be pasted on heater simultaneously
The effect being fixed.
Then, the structure of the electronic equipment 200 for possessing critesistor 10 is illustrated.Fig. 3 A are from front side Transmission electron
The figure that equipment 200 is obtained.Fig. 3 B are the figures obtained from upside Transmission electron equipment 200.Fig. 4 is extracted in electronic equipment 200
Circuit a part equivalent circuit diagram.
Electronic equipment 200 includes：Critesistor 10, circuit substrate 202a, 202b, socket 204a, 204b (socket 204b by
In being covered without being illustrated by socket 204a), set of cells (of article) 206 and housing 210.
The storage critesistor 10 of housing 210, circuit substrate 202a, 202b, socket 204a, 204b and set of cells 206.Circuit
Substrate 202a is provided with A/D converter 207, resistor 208 and processor 209.In present embodiment, due to circuit substrate
The structure of 202b is inessential, therefore omits the description.Set of cells 206 is, for example, Li-Ion rechargeable battery, with its surface by metal
The structure that cover plate is covered.Set of cells 206 is the power supply powered to circuit substrate 202a, 202b, be can generate heat when in use send out
Hot body.Circuit substrate 202a as described above, set of cells 206 and circuit substrate 202b are arranged to the right from left side in the order
Row.The upper surface of set of cells 206 is positioned at the upside of the upper surface of circuit substrate 202a, 202b.
Socket 204a, 204b are arranged on the interarea of the upside of circuit substrate 202a.Adapter 100a, 100b respectively with insert
Seat 204a, 204b are connected.For this purpose, critesistor 10 is used towards in the state of downside on surface.
Herein, as shown in Figure 3A, critesistor 10 is bent in interval A1, A3.Thus, critesistor 10 is along set of cells
206 upper surface and the left side.Also, the interval A2 of critesistor 10 is pasted on the surface of set of cells 206 using adhesive linkage 13.
Electronic equipment as described above 200 includes the circuit shown in Fig. 4.Specifically, set of cells (power supply section) 206,
Resistor 208 and critesistor 10 are connected in series between the earth in this order.The input side terminal of A/D converter 207 is connected to
Between resistor 208 and critesistor 10.The outlet side terminal of A/D converter 207 is connected with processor 209.
Then, the circuit operation shown in Fig. 4 is illustrated.Using set of cells 206 to resistor 208 and critesistor 10
Applied voltage.The supply voltage of set of cells 206 is set to into V0, the voltage for putting on resistor 208 is set to V1, puts on temperature-sensitive electricity
The voltage of resistance 10 is set to V2.Now, V0=V1+V2 sets up.The voltage V2 for putting on critesistor 10 is turned by A/D converter 207
Digital signal is changed to, and is exported to processor 209.
Herein, if the temperature of set of cells 206 rises, the resistance value of critesistor 10 rises.Therefore, V2 is uprised, and V1 becomes
It is low.Thus the value for exporting the digital signal to processor 209 from A/D converter 207 also becomes big.Processor 209 is based on numeral letter
Number action of the value to each several part in electronic equipment 200 be controlled.For example, processor 209 is changed into big in the value of digital signal
When setting, reduce the processing speed of processor 209, suppress the temperature of set of cells 206 further up.
(manufacture method of high-frequency signal circuit)
Below, the manufacture method of critesistor 10 is illustrated with reference to Fig. 2.Hereinafter, making a critesistor 10
In case of illustrate, but in fact, by large-sized dielectric layer to be laminated and be cut, can make many simultaneously
Individual critesistor 10.
First, prepare dielectric layer 14, the dielectric layer 14 is by the thermoplastic resin for being formed with Copper Foil in whole surface
Formed.It is for example zinc-plated preventing from getting rusty by the surface embodiment of the Copper Foil to dielectric layer 14, thus smoothed.Electrolyte
Layer 14 is, for example, liquid crystal polymer.
Then, using photo-mask process, the signal line 18 shown in Fig. 2 is formed on the surface of dielectric layer 14.Specifically,
The resist with 18 same shape of signal line shown in Fig. 2 is printed on the Copper Foil of dielectric layer 14.Then, Copper Foil is implemented
Etch processes, so that remove the Copper Foil of the part not being covered by resist.Then, remove resist.Thus, in dielectric layer 14
Surface form signal line 18 as shown in Figure 2.
Then, by coating resin (resist) thickener, protective layer 15 is formed on dielectric layer 14.Also, in interval
The surface mount adhesive linkage 13 of A2.Finally, adapter 100a, 100b are respectively installed on interval A4, A5 by solder.By
This, obtains the critesistor 10 shown in Fig. 1.
(effect)
According to the critesistor 10 for constituting in a manner described, can be connected by simple structure circuit substrate 202a and
Critesistor 10.More specifically, critesistor 10 possess include cabling portion 20a, 20b, detecting part 22 and connecting portion 24a,
The signal line 18 of 24b.Detecting part 22 is the temperature measuring portion in critesistor 10.Therefore, it is provided with the interval of detecting part 22
A2 is fixed in set of cells 206.Cabling portion 20a, 20b extend to the left from the rear end and front end of detecting part 22 respectively.Therefore, exist
In the state of the interval A2 for being provided with detecting part 22 is fixed on set of cells 206, cabling portion 20a, 20b can will be respectively arranged with
Interval A1, A3 lead to the left side of set of cells 206.Therefore, it is possible to connecting portion 24a, 24b are connected to positioned at set of cells 206
Left side circuit substrate 202a.
As described above, in critesistor 10, being provided with the interval A2 of detecting part 22 and being provided with cabling portion 20a, 20b
Interval A1, A3 are directly connected to, and there are no other connecting elements between them.Therefore, by detecting part 22 be located remotely from
When the circuit substrate 202a of the position of detecting part 22 is connected, it is not necessary to other connecting elements are installed to connect cloth in interval A2
Line.Therefore, according to critesistor 10, circuit substrate 202a and critesistor 10 can be connected by simple structure.
Additionally, in critesistor 10, the meansigma methodss of the live width of detecting part 22 are line of live width W2 than cabling portion 20a, 20b
Wide meansigma methodss are that live width W1 is little.Therefore, it is possible to increase the resistance value caused because of the temperature change of set of cells 206 and other items
Change.Thereby, it is possible to carry out high-precision temperature detection.
Additionally, in critesistor 10, the meansigma methodss of the live width of cabling portion 20a, 20b are line of live width W1 than detecting part 22
Wide meansigma methodss are that live width W2 is big.Therefore, the resistance value of cabling portion 20a, 20b is reduced, and the resistance value of critesistor 10 is reduced.
Even if also, cabling portion 20a, 20b are contacted with article or mutually close, it is also possible to which in suppressing cabling portion 20a, 20b, resistance value is sent out
Changing simultaneously produces impact to measurement result.Thereby, it is possible to carry out high-precision temperature detection.
Additionally, in critesistor 10, the meansigma methodss of the width of interval A1, A3 will than the meansigma methodss of the width of interval A2
It is little.Therefore, interval A1, A3 are relatively easily deformed, and interval A2 is relatively difficult to be deformed.Hold as interval A1, A3 are relative
Easily deformed, therefore, easily interval A1, A3 are bent so that its along set of cells 206 upper surface and the left side.By
Deformation is relatively difficult in interval A2, therefore, there is reflex action so as to situation about coming off from set of cells 206 is suppressed in interval A2.
In critesistor 10, cabling portion 20a, the 20b for being formed as linear is provided with interval A1, A3, in interval A2
It is provided with and is formed as forniciform detecting part 22.Therefore, the ratio ratio of the area of the conductor shared by the per unit length of interval A2
The ratio of the area of the conductor shared by the per unit length of interval A1, A3 will height.Therefore, compared with interval A1, A3, interval A2 is more
It is difficult to deform.As interval A2 is relatively difficult to deformation, therefore, there is reflex action so as to situation about coming off from set of cells 206 in interval A2
Further it is inhibited.
(variation 1)
Below, referring to the drawings, the structure of the critesistor 10a involved by variation 1 is illustrated.Fig. 5 A are variations
The stereoscopic figure of the critesistor 10a involved by 1.Fig. 5 B are dividing for the base substrate 12 of the critesistor 10a involved by variation 1
Solution axonometric chart.
In critesistor 10a, the structure of interval A2 is different from critesistor 10.Below, in involved difference being
The heart is illustrating critesistor 10a.
Interval A1, A3～A5 is made up of 1 layer of dielectric layer 14 (of the 1st insulator layer).And interval A2 is by stacking
Multiple dielectric layers 14,14a～14c (one of multiple 2nd insulator layers) are constituting.
Detecting part 22 includes part 22a～22d and via conductor v1～v4.Part 22a～22d is led by Copper Foil etc. respectively
Body material is formed, and is created as the conductor layer of the wire of curved shape, and is arranged at the surface of dielectric layer 14,14a～14c.
More specifically, part 22a, 22c by while from rear side forward skidding enter, while carry out in the lateral direction it is reciprocal in the way of wriggle
Advance.Part 22b, 22d by while from right side to the left advance, while carry out in the longitudinal direction it is reciprocal in the way of advance tortuously.
Wherein, part 22d leads to the side of the rear side of dielectric layer 14c from the position of the end in the left side equivalent to part 22b
Near central authorities.Derivative end in the 22d of part is referred to as into one end, remaining end is referred to as into the other end.Thus, part 22d
One end overlap with the end of the forward right side of cabling portion 20a.
The other end of part 22d is overlapped with the end of the rear side of part 22c.The end of the front side of part 22c and part 22b
Left side end overlap.The end on the right side of part 22b is overlapped with the end of the rear side of part 22a.
Via conductor v1 runs through dielectric layer 14,14a, 14b in the vertical direction, connects the forward right side of cabling portion 20a
End and one end of part 22d.Via conductor v2 runs through dielectric layer 14b, the other end of coupling part 22d in the vertical direction
With the end of the rear side of part 22c.Via conductor v3 runs through dielectric layer 14a, the front side of coupling part 22c in the vertical direction
End and part 22b left side end.Via conductor v4 runs through dielectric layer 14, coupling part 22b in the vertical direction
Right side end and part 22a rear side end.
Additionally, the anterior end of part 22a is connected with the right lateral side end of cabling portion 20b.Thus, in cabling portion 20a
Forward right side end and cabling portion 20b right lateral side end between, be connected in series in order via conductor v1, part 22d,
Via conductor v2, part 22c, via conductor v3, part 22b, via conductor v1, part 22a.
The critesistor 10a for constituting in a manner described is obtained in that and 10 identical action effect of critesistor.
In critesistor 10a, interval A2 is by being laminated multiple dielectric layer 14,14a～14c (of the 2nd insulator layer
Example) constituting.Thus, interval A2 is more difficult to deformation.
In critesistor 10a, the portion being made up of conductor layers such as the Copper Foils harder than multiple dielectric layers 14,14a～14c
22a～22d is divided to be configured to be overlapped in interval A2 in the vertical direction.Thus, interval A2 is more difficult to deformation.
In critesistor 10a, part 22a～22d and via conductor v1～v4 are connected in series, so as to constitute detecting part
22.Thus, due to the length of the signal line of detecting part 22, therefore, it is possible to increase the resistance value of detecting part 22.Thus, energy
High-precision temperature detection is carried out enough.
In addition, in critesistor 10a, interval A1, A3～A5 can also be constituted by being laminated multiple dielectric layers.But
It is that the number of plies of the dielectric layer of interval A1, A3～A5 is preferably less than the number of plies of the dielectric layer of interval A2.Thus, with interval
A2 is compared, and interval A1, A3～A5 easily deforms.
(variation 2)
Below, referring to the drawings, the structure of the critesistor 10b involved by variation 2 is illustrated.Fig. 6 is variation 2
The exploded perspective view of the base substrate 12 of involved critesistor 10b.
In critesistor 10b, the shape of base substrate 12 is different from critesistor 10.More specifically, critesistor 10 is formed
For square U-shaped.And critesistor 10b is as shown in fig. 6, be formed as along the linear of left and right extension.This critesistor 10b is such as
As below illustrating, it is adaptable to connect two circuit substrates.
Then, the structure of the electronic equipment 200a for possessing critesistor 10b is illustrated.Fig. 7 A are from front perspective electricity
The figure that sub- equipment 200a is obtained.Fig. 7 B are the figures obtained from upside Transmission electron equipment 200a.
In electronic equipment 200a, socket 204b is arranged on the interarea of the upside of circuit substrate 202b.Thus, critesistor
10b is electrically connected to circuit substrate 202a and circuit substrate 202b.
The critesistor 10b for constituting in a manner described is obtained in that and 10 identical action effect of critesistor.
Additionally, critesistor 10b can also be played as connecting the cable components of two circuit substrates 202a, 202b
Effect.Now, as shown in figure 7 a, by cabling portion 20a, 20b arrange kink, can absorbing circuit substrate 202a,
Stress produced by the vibration of 202b, attendant position skew, improves the connection reliability of connecting portion.Additionally, it is preferred that for making bending
Portion relaxes, so that the length of cabling portion 20a, 20b has allowance.Thereby, it is possible to shaking for absorbing circuit substrate 202a, 202b
Stress produced by the skew of dynamic, attendant position, further improves the connection reliability of connecting portion.In addition, above-mentioned cabling portion 20a,
20b lax concept refers to that cabling portion 20a, 20b are not the states tightened, but produces the state of certain slackness.
(other embodiment)
Critesistor involved by this utility model is not limited to the critesistor 10,10a, 10b, can be in its main points
In the range of changed.
Furthermore it is possible to carry out combination in any to the structure of critesistor 10,10a, 10b.
In addition, detecting part 22 and part 22a～22d are formed as curved shape, but it is also possible to be formed as spiral-shaped grade its
His shape.
In the respective embodiments described above, with two cabling portions of 20a, 20b, but it is not limited to this, it is possible to have one
Cabling portion.In this case, two connecting portions are set in a cabling portion.
In addition, in critesistor 10,10a, 10b, using the adhesive linkage 13 on the surface for being arranged at interval A2 by interval A2
(detecting part 22) is fixed on set of cells 206.But, the fixing meanss of interval A2 (detecting part 22) are not limited to this.Fig. 8 is from upper
The figure that electronic equipment 200b involved by the perspective other embodiment of side is obtained.
As shown in figure 8, can be by pasting adhesion glue band 13a so as to across interval A2 and the upper surface of set of cells 206,
So as to interval A2 (detecting part 22) is fixed on set of cells 206.
Furthermore, it is possible to the vicinity of interval A2 is fixed on set of cells by using adhesive linkage 13 or adhesion glue with 13a etc.
206, so as to interval A2 (detecting part 22) is fixed on set of cells 206.That is, interval A2 is contained following two kinds of situations by fixed packet
The meaning, i.e.,：Interval A2 is directly fixed on into set of cells 206 using the fixed part such as adhesive linkage 13 or adhesion glue band 13a, and is passed through
Set of cells 206 is fixed on in the vicinity of interval A2 using adhesive linkage 13 or adhesion glue with 13a etc. so that interval A2 relative to
Set of cells 206 will not be moved.
Additionally, in the case of fixed interval A2, arranging kink in adjacent cabling portion 20a, 20b, and making which relax
So that length has allowance, brought stress is offset thus, it is possible to absorbing circuit substrate, the vibration of set of cells, position, improved
The connection reliability of the coupling part of set of cells.
Additionally, interval A2 (detecting part 22) can be not secured to set of cells 206, as long as fixed (configuration) is in housing 210
Optional position enable detecting part 22 to determine the temperature of set of cells 206.Therefore, interval A2 (detecting part 22) can be
Set of cells 206 is nearby fixed on housing 210.
Heater by 22 temperature of the measurement of detecting part can be the article beyond set of cells 206, for example, can be IC, circuit
Substrate etc..
Industrial practicality
As described above, this utility model is useful to critesistor and electronic equipment, can connected by simple structure
On this point of critesistor and external circuit, is particularly excellent.
Label declaration
10、10a、10b：Critesistor
12：Base substrate
13：Adhesive linkage
13a：Adhesion glue band
14th, 14a～14c：Dielectric layer
15：Protective layer
18：Signal line
20a、20b：Cabling portion
22：Detecting part
22a～22d：Part
24a、24b：Connecting portion
100a、100b：Adapter
200、200a、200b：Electronic equipment
202a、202b：Circuit substrate
206：Set of cells
207：A/D converter
208：Resistor
209：Processor
210：Housing
A1～A5：It is interval
Claims (14)
1. a kind of critesistor, it is characterised in that include：
Base substrate, the base substrate have pliability；And
Signal line, the signal line are wire, and are arranged at the base substrate,
The signal line is included：
1st connecting portion and the 2nd connecting portion, the 1st connecting portion and the 2nd connecting portion are used for the company of the signal line and external circuit
Connect；And
1st cabling portion and detecting part, the 1st cabling portion and detecting part are pressed between the 1st connecting portion and the 2nd connecting portion
The sequential series are electrically connected,
Meansigma methodss of the meansigma methodss of the live width of the detecting part less than the live width in the 1st cabling portion.
2. critesistor as claimed in claim 1, it is characterised in that
The detecting part is provided for determining the temperature of article.
3. critesistor as claimed in claim 1 or 2, it is characterised in that
Resistance value of the resistance value of the detecting part more than the 1st cabling portion.
4. critesistor as claimed in claim 1 or 2, it is characterised in that
The base substrate is formed as banding,
The base substrate is included：
Be provided with the 1st cabling portion the 1st is interval；And
Be provided with the detecting part the 2nd is interval.
5. critesistor as claimed in claim 4, it is characterised in that
The detecting part is provided for determining the temperature of article,
The critesistor is also included for fixing the described 2nd interval fixed part with the relative position of the article.
6. critesistor as claimed in claim 4, it is characterised in that
1st interval is more interval than the described 2nd easily to be deformed.
7. critesistor as claimed in claim 4, it is characterised in that
Meansigma methodss of the meansigma methodss of the width in the 1st interval less than the width in the 2nd interval.
8. critesistor as claimed in claim 4, it is characterised in that
2nd interval is constituted by being laminated multiple 2nd insulator layers,
The detecting part is respectively arranged at multiple 2nd insulator layers.
9. critesistor as claimed in claim 8, it is characterised in that
1st interval is constituted by being laminated the 1st insulator layer of more than 1,
The number of plies of the number of plies of the 1st insulator layer less than the 2nd insulator layer.
10. critesistor as claimed in claim 4, it is characterised in that
The critesistor is bent in the 1st interval.
11. critesistor as claimed in claim 10, it is characterised in that
The critesistor is bent in the state of the described 1st interval is lax.
12. critesistor as claimed in claim 4, it is characterised in that
The base substrate is also interval comprising be provided with the 1st connecting portion the 3rd,
The critesistor also includes being installed on the described 3rd interval, and the adapter that is connected with the 1st connecting portion.
13. a kind of electronic equipment, it is characterised in that include：
Critesistor；And
Article,
The critesistor includes：
Base substrate, the base substrate have pliability；And
Signal line, the signal line are wire, and are arranged at the base substrate,
The signal line is included：
1st connecting portion and the 2nd connecting portion, the 1st connecting portion and the 2nd connecting portion are used for the company of the signal line and external circuit
Connect；And
1st cabling portion and detecting part, the 1st cabling portion and detecting part are pressed between the 1st connecting portion and the 2nd connecting portion
The sequential series are electrically connected,
The detecting part is configured at the position of the temperature that can determine the article,
Meansigma methodss of the meansigma methodss of the live width of the detecting part less than the live width in the 1st cabling portion.
14. electronic equipments as claimed in claim 13, it is characterised in that
The electronic equipment also includes fixed part,
The base substrate is included：
Be provided with the 1st cabling portion the 1st is interval；And
Be provided with the detecting part the 2nd is interval,
The fixed part is fixed to the described 2nd interval relative position with the article, so that the detecting part can
Determine the temperature of the article.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015-184593 | 2015-09-18 | ||
| JP2015184593A JP2017059731A (en) | 2015-09-18 | 2015-09-18 | Thermistor and electronic apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206038181U true CN206038181U (en) | 2017-03-22 |
Family
ID=58297402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201621056466.4U Active CN206038181U (en) | 2015-09-18 | 2016-09-14 | Thermistor and electronic equipment |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2017059731A (en) |
| CN (1) | CN206038181U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110945857A (en) * | 2017-07-18 | 2020-03-31 | 三星电子株式会社 | Structure for detecting temperature of electronic device |
-
2015
- 2015-09-18 JP JP2015184593A patent/JP2017059731A/en active Pending
-
2016
- 2016-09-14 CN CN201621056466.4U patent/CN206038181U/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110945857A (en) * | 2017-07-18 | 2020-03-31 | 三星电子株式会社 | Structure for detecting temperature of electronic device |
| US10955298B2 (en) | 2017-07-18 | 2021-03-23 | Samsung Electronics Co., Ltd. | Structure for detecting temperature of electronic device |
| CN110945857B (en) * | 2017-07-18 | 2021-11-16 | 三星电子株式会社 | Electronic device |
| US11585704B2 (en) | 2017-07-18 | 2023-02-21 | Samsung Electronics Co., Ltd. | Structure for detecting temperature of electronic device |
| US11668610B2 (en) | 2017-07-18 | 2023-06-06 | Samsung Electronics Co., Ltd. | Structure for detecting temperature of electronic device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2017059731A (en) | 2017-03-23 |
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