CN205809110U - A kind of tool for measuring quartz crystal wafer - Google Patents
A kind of tool for measuring quartz crystal wafer Download PDFInfo
- Publication number
- CN205809110U CN205809110U CN201620674914.0U CN201620674914U CN205809110U CN 205809110 U CN205809110 U CN 205809110U CN 201620674914 U CN201620674914 U CN 201620674914U CN 205809110 U CN205809110 U CN 205809110U
- Authority
- CN
- China
- Prior art keywords
- slide block
- locating slot
- swing arm
- quartz crystal
- rotary switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
A kind of tool for measuring quartz crystal wafer, including base, it is characterized in that: on described base, be provided with locating slot, the opposite side of locating slot is provided with movable clamp, movable clamp includes that rotary switch, swing arm and slide block, rotary switch and two swing arms are connected, and is provided with spring between swing arm, swing arm is connected with slide block respectively, and slide block is provided with measurement shell fragment near the both sides of locating slot.This utility model simple in construction, easy to use, parameter measurement is accurate.
Description
Technical field
This utility model relates to the field tests of quartz crystal, particularly refers to a kind of for measuring quartz crystal wafer
Tool.
Background technology
At small-sized quartz crystal production field, wafer, after sputter coating, need to confirm its characterisitic parameter, such as frequency, resistance
Deng.Traditional detection mode is to be measured by the upper and lower detection mode of probe, wastes time and energy, inefficiency；It addition, because of wafer
Thinner thickness, side coating conduction is the best, uses when measuring side composite coating properties parameter probe to be not easily formed conducting, needs
Indirectly will be measured by the overlay coating of crystal, the accuracy of parameter can not be guaranteed.
Summary of the invention
The purpose of this utility model be overcome in prior art above-mentioned present in quartz crystal parameter of crystal sheets measurement process
Shortcoming and defect, it is provided that a kind of simple in construction, easy to use, parameter measurement are accurately for measuring controlling of quartz crystal wafer
Tool.
For realizing object above, technical solution of the present utility model is: a kind of for measuring quartz crystal wafer
Tool, including base, it is characterised in that: being provided with locating slot on described base, the opposite side of locating slot is provided with mobile folder
Tool, movable clamp includes that rotary switch, swing arm and slide block, rotary switch and two swing arms are connected, is provided with spring between swing arm,
Swing arm is connected with slide block respectively, and slide block is provided with measurement shell fragment near the both sides of locating slot.
The beneficial effects of the utility model are:
1, the design comprises locating slot and movable clamp, and wherein movable clamp includes rotary switch, swing arm and slide block,
Rotary switch and two swing arms are connected, and are provided with spring between swing arm, and swing arm is connected with slide block respectively, and slide block is close
The both sides of locating slot are provided with measurement shell fragment, during measurement, turning knob switch, swing arm yearn for swing, with drive two side slides and
The measurement shell fragment of both sides opens, and is then placed in locating slot by wafer to be measured, is rotated further by rotary switch and makes measurement shell fragment
The side coating of clamped wafer, makes to be formed between the two contact closely, to complete the measurement of wafer characteristics parameter.
2, the design is provided with spring between two swing arms, can give when testing the side coating of shell fragment clamped wafer
Slide block inward pressure so that staying close that measurement shell fragment contacts with the side coating of wafer is close；During reset under the drive of spring
Slide block can homing more easily.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
In figure: base 1, locating slot 2, movable clamp 3, rotary switch 4, swing arm 5, slide block 6, spring 7, measure shell fragment 8.
Detailed description of the invention
Illustrate with detailed description of the invention, this utility model to be described in further detail below in conjunction with accompanying drawing.
Seeing Fig. 1, a kind of tool for measuring quartz crystal wafer, including base 1, it is characterised in that: described base 1
On be provided with locating slot 2, the opposite side of locating slot 2 is provided with movable clamp 3, and movable clamp 3 includes rotary switch 4, swing arm 5
With slide block 6, rotary switch 4 is connected with two swing arms 5, is provided with spring 7 between swing arm 5, and swing arm 5 is connected with slide block 6 respectively, sliding
Block 6 is provided with measurement shell fragment 8 near the both sides of locating slot 2.
The design comprises locating slot 2 and movable clamp 3, and wherein movable clamp 3 includes rotary switch 4, swing arm 5 and slide block 6,
Rotary switch 4 is connected with two swing arms 5, is provided with spring 7 between swing arm 5, and swing arm 5 is connected with slide block 6 respectively, and slide block 6 is close
The both sides of locating slot 2 are provided with measurement shell fragment 8, and during measurement, turning knob switch 4, swing is yearned in swing arm 5, to drive two sideslips
The measurement shell fragment 8 of block 6 and both sides opens, and is then placed in locating slot 2 by wafer to be measured, is rotated further by rotary switch 4 and makes
Measure the side coating of shell fragment 8 clamped wafer, make to be formed between the two contact closely, to complete the survey of wafer characteristics parameter
Amount.The design is provided with spring 7 between two swing arms 5, slide block can be given when measuring the side coating of shell fragment 8 clamped wafer
6 inward pressures so that test shell fragment 8 is tightr with what the side coating of wafer contacted；During reset, the drive at spring 7 is glided
Block 6 can homing more easily.In the design, locating slot 2 plays support and location wafer effect, is available for putting of full-scale wafer
Put.Measure about 8 points two, shell fragment, be separately mounted on the slide block 6 of the left and right sides.This utility model simple in construction, user
Just, parameter measurement is accurate.
Claims (1)
1. for measuring a tool for quartz crystal wafer, including base (1), it is characterised in that: described base sets on (1)
Being equipped with locating slot (2), the opposite side of locating slot (2) is provided with movable clamp (3), movable clamp (3) include rotary switch (4),
Swing arm (5) and slide block (6), rotary switch (4) is connected with two swing arms (5), is provided with spring (7), swing arm between swing arm (5)
(5) being connected with slide block (6) respectively, slide block (6) is provided with measurement shell fragment (8) near the both sides of locating slot (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620674914.0U CN205809110U (en) | 2016-06-30 | 2016-06-30 | A kind of tool for measuring quartz crystal wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620674914.0U CN205809110U (en) | 2016-06-30 | 2016-06-30 | A kind of tool for measuring quartz crystal wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205809110U true CN205809110U (en) | 2016-12-14 |
Family
ID=57513077
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620674914.0U Active CN205809110U (en) | 2016-06-30 | 2016-06-30 | A kind of tool for measuring quartz crystal wafer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205809110U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105974165A (en) * | 2016-06-30 | 2016-09-28 | 随州泰华电子科技有限公司 | Jig for measuring quartz crystal wafer |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
| CN109725178A (en) * | 2017-10-27 | 2019-05-07 | 江苏维福特科技发展股份有限公司 | Crystal collet |
-
2016
- 2016-06-30 CN CN201620674914.0U patent/CN205809110U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105974165A (en) * | 2016-06-30 | 2016-09-28 | 随州泰华电子科技有限公司 | Jig for measuring quartz crystal wafer |
| CN109725178A (en) * | 2017-10-27 | 2019-05-07 | 江苏维福特科技发展股份有限公司 | Crystal collet |
| CN109490586A (en) * | 2018-11-01 | 2019-03-19 | 北京无线电计量测试研究所 | A kind of π network fixture and test method for quartz crystal parameter test system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN205809110U (en) | A kind of tool for measuring quartz crystal wafer | |
| CN204666086U (en) | A kind of cigarette bobbin paper end face flatness determinator | |
| CN204718526U (en) | The detection mould of vehicle oil filler wicket assembly | |
| CN105067174A (en) | Isolation switch contact pressure measuring device | |
| CN205090901U (en) | Utensil is surveyed to fan stator finish forge blade listrium profile | |
| CN102539978A (en) | Three-dimensional low-frequency receiving antenna comprehensive detection device | |
| CN203688598U (en) | Sensor for measuring electrical parameters of plant leaf | |
| CN202947571U (en) | Inspection device of full indicator movement | |
| CN204788230U (en) | Multiunit micro -gap switch highly uniform nature decision maker among automotive combined switch | |
| CN105974165A (en) | Jig for measuring quartz crystal wafer | |
| CN201965189U (en) | Testing tool for testing non-conducting performance of coated mobile phone shell | |
| CN206208144U (en) | A kind of friction ring for synchronizer device for fast detecting | |
| CN204666778U (en) | The accurate proving installation of a kind of quartz-crystal resonator | |
| CN204855089U (en) | Pressure sensor probe testing arrangement | |
| CN210268463U (en) | Automobile parts thickness detection device | |
| CN208606700U (en) | A kind of workpiece qualification detecting tool | |
| CN103308219B (en) | Electric appliance reed elasticity value measuring device and electric appliance reed elasticity value measuring method | |
| CN203337055U (en) | Length measuring tool | |
| CN207232308U (en) | A kind of electric tool detects work station | |
| CN206339211U (en) | A kind of lithium battery hardness determination fixture | |
| CN206556560U (en) | Elongated member Pore Diameter Detection component | |
| CN202433025U (en) | Fixture structure with finely adjustable angle | |
| CN206223057U (en) | A kind of concentric press fit device | |
| CN204903062U (en) | Isolating switch contact pressure measuring equipment | |
| CN205607368U (en) | Automatic portable digital display flatness detection appearance |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |