CN205785162U - Silicon box testing stand - Google Patents
Silicon box testing stand Download PDFInfo
- Publication number
- CN205785162U CN205785162U CN201620506869.8U CN201620506869U CN205785162U CN 205785162 U CN205785162 U CN 205785162U CN 201620506869 U CN201620506869 U CN 201620506869U CN 205785162 U CN205785162 U CN 205785162U
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- CN
- China
- Prior art keywords
- silicon
- silicon chip
- sliding support
- lead
- chip template
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
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Abstract
The utility model discloses a kind of silicon box testing stand, including: sliding support, sliding support connects and has silicon chip template, and drive silicon chip template to move up and down；Lead, lead is inserted on sliding support, and the motion guide to sliding support；For connecting the location-plate of silicon box to be detected, location-plate is fixed on the end of lead, and location-plate has corresponding with silicon chip template position and for the through hole by silicon chip template, sliding support slides along lead so that silicon chip template through above-mentioned through hole and inserts silicon box to be detected.This utility model can quickly check the deformation point of every track of each silicon box, in order to repairs in time or changes, and greatly reduces the bad breakage of silicon chip, improves the finished product yield of silicon chip.
Description
Technical field
This utility model relates to a kind of silicon box testing stand, belongs to photovoltaic manufacturing technology field, is mainly used in photovoltaic industry
Deformation detection in the silicon chip insert box of silicon chip manufacture end.
Background technology
The production capacity of silicon chip cutting now is the biggest, and common artificial inserted sheet has not caught up with the cleaning rhythm of machine, so silicon
Sheet manufacturing enterprise progressively uses automatic slice inserting machine to replace common artificial inserted sheet.Use automatic slice inserting machine then to currently using
Film magazine also been proposed new requirement, and general film magazine can insert 25 silicon chips, and manual inserted sheet can pass through manual adjustment slice, thin piece
Turnover speed and adjust dislocation, to protect silicon chip not damage；But automatic slice inserting machine speed ratio is the fastest by about one time,
Slice, thin piece is inserted directly in track, and once to may result in slice, thin piece damaged for film magazine internal modification, so the film magazine of deformation cannot be
Use on automatic slice inserting machine, it is necessary to choose the film magazine of deformation.Therefore a kind of silicon box of design detection device is to improve inserted sheet effect
Rate and inserted sheet quality institute problem demanding prompt solution.
Summary of the invention
Of the present utility model to be solved technical problem is that: overcome the deficiencies in the prior art, it is provided that a kind of silicon box detection
Frame, to solve whether detection silicon box exists the technical problem of deformation.
In order to solve above-mentioned technical problem, the technical solution of the utility model is, a kind of silicon box testing stand, including:
Sliding support, sliding support connects and has silicon chip template, and drive silicon chip template to move up and down；
Lead, lead is inserted on sliding support, and the motion guide to sliding support；
For connecting the location-plate of silicon box to be detected, location-plate is fixed on the end of lead, and location-plate has and silicon
Sheet template position is corresponding and is used for the through hole by silicon chip template, and sliding support slides so that silicon chip template is worn along lead
Cross above-mentioned through hole and insert silicon box to be detected.
Further for film magazine, the groove number of deformation and the degree of depth of deformation of fine detection deformation, the top of described silicon chip template
Connecting has spring, described sliding support to be provided with spring interface, and silicon chip template is arranged on described slip by described spring and props up
On the spring interface of frame.
Further providing for the attachment structure of a kind of silicon chip template and spring, an intermediate plate block is passed through at the top of described silicon chip template
Being connected with described spring, intermediate plate block has the fluting matched with silicon chip template, and silicon chip template is fixed in above-mentioned fluting,
The top of intermediate plate block is fixing with spring to be connected.
Further for increasing stability, described lead is provided with two, and it is logical that the two ends of described sliding support have slip
Hole, lead passes above-mentioned slip through hole, in order to sliding support moves up and down along lead.
Further, described silicon box testing stand also includes the actuating unit for driving sliding support to move up and down.
Further, the top of described sliding support is provided with handle.
Further for spacing to sliding support and lock, the top of described lead is provided with limiting plate, on limiting plate
It is provided with locking pin.
Further for facilitating location-plate to be connected with silicon box to be detected, described location-plate sets with silicon box junction to be detected
There is the locating piece for matching with the hole, location in silicon box to be detected.
After have employed technique scheme, this utility model has the advantages that
1) silicon box to be detected being arranged on location-plate, sliding support moves down, and drives silicon chip template through location
Through hole on plate, and enter in silicon box to be detected, by the shape of each silicon chip every track of template detection；If silicon
There is crimp in the spring of sheet die head, then illustrate that this silicon box is internal and there is deformation, and the track of deformation be i.e. with
The track corresponding to silicon chip template of deformation, thus the deformation position of positioning transformations silicon box rapidly, in order to reject in time and repair
Multiple；
2) silicon chip die head of the present utility model is connected with sliding support by spring, and the track of deformation makes correspondence position
Silicon chip template be squeezed and compression spring, the crimp of silicon chip template is converted into the flexible of spring, it is thus possible to more straight
The deformation of the observation silicon box seen；
3) this utility model can quickly check the deformation point of every track of each silicon box, in order to repairs in time or more
Change, greatly reduce the bad breakage of silicon chip, improve the finished product yield of silicon chip.
Accompanying drawing explanation
Fig. 1 is perspective view of the present utility model；
Fig. 2 is perspective view of the present utility model；
Fig. 3 is the perspective view of location-plate of the present utility model；
Fig. 4 is the schematic front view of location-plate of the present utility model；
Fig. 5 is the schematic front view of sliding support of the present utility model；
Fig. 6 is the perspective view of silicon chip template of the present utility model；
Fig. 7 is this utility model installation diagram when being provided with silicon box to be detected；
In figure, 1, locking pin, 2, limiting plate, 3, handle, 4, sliding support, 5, lead, 6, location-plate,
6-1, through hole, 6-2, locating piece, 7, silicon chip template, 8, spring interface, 9, spring, 10, silicon box to be detected.
Detailed description of the invention
In order to make content of the present utility model be easier to be clearly understood, below according to specific embodiment and combine accompanying drawing,
This utility model is described in further detail.
Embodiment one:
As shown in Figure 1 and Figure 2, a kind of silicon box testing stand, including:
Sliding support 4, sliding support 4 connects and has silicon chip template 7, and drive silicon chip template 7 to move up and down；
Lead 5, lead 5 is inserted on sliding support 4, and the motion guide to sliding support 4；
For connecting the location-plate 6 of silicon box 10 to be detected, location-plate 6 is fixed on the end of lead 5, and location-plate
6 are provided with corresponding with silicon chip template 7 position and for by the through hole 6-1 of silicon chip template 7, and sliding support 4 is along leading
Slide to post 5 so that silicon chip template 7 through above-mentioned through hole 6-1 and inserts silicon box 10 to be detected.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 5, Fig. 6, in order to observe the crimp of silicon chip template 7 intuitively,
The top of silicon chip template 7 connects has spring 9, sliding support 4 to be provided with spring interface 8, and silicon chip template 7 is by described
Spring 9 is arranged on the spring interface 8 of described sliding support 4.
If there is the track of deformation in silicon box 10 to be detected, then the track deformed makes the silicon chip template 7 of correspondence position be subject to
Extruding compression spring 9, be converted into the crimp of silicon chip template 7 the flexible of spring 9, thus observe more intuitively
The deformation of silicon box.
Alternatively, as shown in Figure 1, Figure 2, Figure 6 shows, the top of silicon chip template 7 is by an intermediate plate block and described spring 9
Connecting, intermediate plate block has the fluting matched with silicon chip template 7, and silicon chip template 7 is fixed in above-mentioned fluting, intermediate plate block
Top and spring 9 fixing be connected.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 7, lead 5 is provided with two, and the two ends of described sliding support 4 are opened
Having slip through hole, lead 5 is through above-mentioned slip through hole, in order to sliding support 4 moves up and down along lead 5.
Alternatively, the top of sliding support 4 is provided with handle 3, when moving up and down sliding support 4, lives to slide by hand steered
Handle 3 on support 4, the most down presses or pulls up and make silicon chip template 7 pass in and out silicon box 10 to be detected.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 7, the top of lead 5 is provided with limiting plate 2, and limiting plate 2 sets
Having a locking pin 1, limiting plate 2 is the spacing and locking that resets for the entirety of support, and locking pin 1 is for the integral locking of support.
Further, as it is shown on figure 3, location-plate 6 and silicon box 10 junction to be detected be provided with for silicon chip to be detected
The locating piece 6-2 matched in hole, location on box 10.
Embodiment two:
As shown in Figure 1 and Figure 2, a kind of silicon box testing stand, including:
Sliding support 4, sliding support 4 connects and has silicon chip template 7, and drive silicon chip template 7 to move up and down；
Lead 5, lead 5 is inserted on sliding support 4, and the motion guide to sliding support 4；
For connecting the location-plate 6 of silicon box 10 to be detected, location-plate 6 is fixed on the end of lead 5, and location-plate
6 are provided with corresponding with silicon chip template 7 position and for by the through hole 6-1 of silicon chip template 7, and sliding support 4 is along leading
Slide to post 5 so that silicon chip template 7 through above-mentioned through hole 6-1 and inserts silicon box 10 to be detected.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 5, Fig. 6, in order to observe the crimp of silicon chip template 7 intuitively,
The top of silicon chip template 7 connects has spring 9, sliding support 4 to be provided with spring interface 8, and silicon chip template 7 is by described
Spring 9 is arranged on the spring interface 8 of described sliding support 4.
If there is the track of deformation in silicon box 10 to be detected, then the track deformed makes the silicon chip template 7 of correspondence position be subject to
Extruding compression spring 9, be converted into the crimp of silicon chip template 7 the flexible of spring 9, thus observe more intuitively
The deformation of silicon box.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 7, lead 5 is provided with two, and the two ends of described sliding support 4 are opened
Having slip through hole, lead 5 is through above-mentioned slip through hole, in order to sliding support 4 moves up and down along lead 5.
Alternatively, described silicon box testing stand also includes actuating unit, and actuating unit drives sliding support 4 to move up and down,
Not only save manpower, and detection efficiency can be improved.
Alternatively, the top of sliding support 4 is provided with handle 3, when moving up and down sliding support 4, lives to slide by hand steered
Handle 3 on support 4, the most down presses or pulls up and make silicon chip template 7 pass in and out silicon box 10 to be detected.
Preferably, as shown in Figure 1, Figure 2, shown in Fig. 7, the top of lead 5 is provided with limiting plate 2, and limiting plate 2 sets
Having a locking pin 1, limiting plate 2 is the spacing and locking that resets for the entirety of support, and locking pin 1 is for the integral locking of support.
Operation principle of the present utility model is as follows:
The locating piece 6-2 of location-plate 6 of the present utility model is connected with the hole, location of silicon box 10 to be detected, opens lock
Tight pin 1, the handle 3 of hand steered firmly sliding support 4, the most down pressure silicon chip template 7 makes silicon chip template 7 through location-plate 6
On through hole 6-1 enter in silicon box 10 to be detected, detected the shape of every track by each silicon chip template 7；
If there is the track of deformation in silicon box to be detected 10, the track of deformation then can extrude silicon chip template 7 so that spring 9
Dilatation, and the track of deformation is i.e. track corresponding to spring 9 with deformation, and then judge the film magazine of deformation, change
The track number of shape and the degree of depth of deformation, in order to reject in time and repair.
Silicon chip template 7 top of the present utility model is connected with sliding support 4 by spring 9, and the track of deformation makes corresponding position
The silicon chip template 7 put is squeezed and compression spring 9, and the crimp of silicon chip template 7 is converted into the flexible of spring 9,
It is thus possible to observe the deformation of silicon box more intuitively.
This utility model can quickly check the deformation point of every track of each silicon box, in order to repairs in time or changes,
Greatly reduce the bad breakage of silicon chip, improve the finished product yield of silicon chip.
Particular embodiments described above, solves the technical problem that this utility model, technical scheme and beneficial effect are carried out
Further describe, be it should be understood that and the foregoing is only specific embodiment of the utility model, not
For limiting this utility model, all within spirit of the present utility model and principle, any amendment of being made, equivalent,
Improve, within should be included in protection domain of the present utility model.
Claims (8)
1. a silicon box testing stand, it is characterised in that including:
Sliding support (4), the upper connection of sliding support (4) has silicon chip template (7), and drives silicon chip template (7) upper and lower
Mobile；
Lead (5), lead (5) is inserted on sliding support (4), and the motion guide to sliding support (4)；
For connecting the location-plate (6) of silicon box to be detected (10), location-plate (6) is fixed on the end of lead (5)
Hold, and location-plate (6) is provided with corresponding with silicon chip template (7) position and is used for leading to by silicon chip template (7)
Hole (6-1), sliding support (4) slides along lead (5) so that silicon chip template (7) is through above-mentioned through hole (6-1)
And insert silicon box to be detected (10).
Silicon box testing stand the most according to claim 1, it is characterised in that: the top of described silicon chip template (7)
Connecting has spring (9), described sliding support (4) to be provided with spring interface (8), and silicon chip template (7) passes through described bullet
Spring (9) is arranged on the spring interface (8) of described sliding support (4).
Silicon box testing stand the most according to claim 2, it is characterised in that: the top of described silicon chip template (7)
Portion is connected with described spring (9) by an intermediate plate block, and intermediate plate block has the fluting matched with silicon chip template (7), silicon
Sheet template (7) is fixed in above-mentioned fluting, and the top of intermediate plate block is fixing with spring (9) to be connected.
Silicon box testing stand the most according to claim 3, it is characterised in that: described lead (5) is provided with two
Individual, the two ends of described sliding support (4) have slip through hole, and lead (5) passes above-mentioned slip through hole, in order to sliding
Dynamic support (4) moves up and down along lead (5).
Silicon box testing stand the most according to claim 4, it is characterised in that: described silicon box testing stand also includes
For the actuating unit driving sliding support (4) to move up and down.
Silicon box testing stand the most according to claim 5, it is characterised in that: the top of described sliding support (4)
It is provided with handle (3).
Silicon box testing stand the most according to claim 6, it is characterised in that: the top of described lead (5)
Being provided with limiting plate (2), limiting plate (2) is provided with locking pin (1).
8. according to the silicon box testing stand described in any one of claim 1 to 7, it is characterised in that: described location-plate (6)
The location for matching it is provided with the hole, location in silicon box to be detected (10) with silicon box to be detected (10) junction
Block (6-2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620506869.8U CN205785162U (en) | 2016-05-30 | 2016-05-30 | Silicon box testing stand |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620506869.8U CN205785162U (en) | 2016-05-30 | 2016-05-30 | Silicon box testing stand |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205785162U true CN205785162U (en) | 2016-12-07 |
Family
ID=59979749
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620506869.8U Withdrawn - After Issue CN205785162U (en) | 2016-05-30 | 2016-05-30 | Silicon box testing stand |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205785162U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105865402A (en) * | 2016-05-30 | 2016-08-17 | 江苏有则科技集团有限公司 | Silicon wafer box detection frame |
| CN111928748A (en) * | 2019-05-13 | 2020-11-13 | 安徽科瑞特模塑有限公司 | General detection tool for machining vehicle air guide sleeve |
-
2016
- 2016-05-30 CN CN201620506869.8U patent/CN205785162U/en not_active Withdrawn - After Issue
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105865402A (en) * | 2016-05-30 | 2016-08-17 | 江苏有则科技集团有限公司 | Silicon wafer box detection frame |
| CN105865402B (en) * | 2016-05-30 | 2018-04-17 | 江苏有则科技集团有限公司 | Silicon box testing stand |
| CN111928748A (en) * | 2019-05-13 | 2020-11-13 | 安徽科瑞特模塑有限公司 | General detection tool for machining vehicle air guide sleeve |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20161207 Effective date of abandoning: 20180417 |
|
| AV01 | Patent right actively abandoned |