CN205748260U - Flatness electric-examination tool - Google Patents
Flatness electric-examination tool Download PDFInfo
- Publication number
- CN205748260U CN205748260U CN201620546972.5U CN201620546972U CN205748260U CN 205748260 U CN205748260 U CN 205748260U CN 201620546972 U CN201620546972 U CN 201620546972U CN 205748260 U CN205748260 U CN 205748260U
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- China
- Prior art keywords
- electric
- examination
- infrabasal plate
- upper substrate
- flatness
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Abstract
The utility model discloses a kind of flatness electric-examination tool, for detecting the flatness of workpiece, described flatness electric-examination tool include infrabasal plate with can the upper substrate that moves up and down of relative described infrabasal plate, form the storing screens for putting workpiece between described upper substrate and described infrabasal plate；Described upper substrate and described infrabasal plate are respectively arranged with some electric-examination probes towards the side of described storing screens, the electric-examination probe being arranged at described upper substrate and the electric-examination probe current loop in series with display lamp respectively being arranged at described infrabasal plate.It is arranged at the electric-examination probe current loop in series with display lamp respectively of upper substrate and infrabasal plate, thus upper substrate and infrabasal plate are detected respectively and export result, it is thus possible to the harmful trend of workpiece is judged, in order to improve production and processing technology.
Description
Technical field
This utility model relates to a kind of electric-examination tool, particularly relates to a kind of flatness electric-examination tool.
Background technology
For the workpiece that mobile phone shell etc. has plate-like structure, the flatness of workpiece is the important quality mark of workpiece
Standard, has vital impact to final product quality.And in process of production, large batch of flat work is put down
The detection of face degree, it is relatively big to measure work, and measure inefficient, it is impossible to meet Production requirement.
Accordingly, it would be desirable to the detection tool of a kind of flatness that can accurately detect flat work, to improve detection efficiency,
Meet the demand produced in enormous quantities.
Utility model content
The purpose of this utility model is to provide the tool of a kind of flatness that can detect plate-like structure workpiece, to improve
Detection efficiency, meets the demand produced in enormous quantities.
To achieve these goals, the utility model discloses a kind of flatness electric-examination tool, for detecting the flat of workpiece
Face degree, described flatness electric-examination tool include infrabasal plate with can the upper substrate that moves up and down of relative described infrabasal plate, described upper base
The storing screens for putting workpiece is formed between plate and described infrabasal plate；Described upper substrate and described infrabasal plate are put towards described
The side putting screens is respectively arranged with some electric-examination probes, is arranged at the electric-examination probe of described upper substrate and is arranged at described lower base
The electric-examination probe of plate current loop in series with display lamp respectively.
Compared with prior art, the flatness electric-examination tool that this utility model provides, upper by can relatively move up and down
Substrate and infrabasal plate involutory, it is achieved carry out spacing to being positioned over the workpiece putting screens；It is arranged at upper substrate and infrabasal plate
Electric-examination probe current loop in series with display lamp respectively, thus when be arranged at the electric-examination probe in detecting of upper substrate to NG or
It is arranged at the electricity of infrabasal plate when building probe in detecting to NG, respectively by making lighting or extinguishing of display lamp connected in series, with
Testing result is carried out visual indication, and due to upper substrate and the detection respectively of infrabasal plate and output result, it is thus possible to right
The harmful trend of workpiece is judged, in order to improve production and processing technology.
It is also preferred that the left some described electric-examination probes are respectively conductive material；Now, the electric-examination probe connecing electricity is relied on to lead with having
Whether the contact of the workpiece of electrical property, controls lighting or extinguish, with quick judged result of display lamp.
In one embodiment, described upper substrate and described infrabasal plate are non-conductive material, the upper substrate of non-conductive material and
Infrabasal plate is only location electric-examination probe and the positioner of workpiece, and the upper substrate of non-conductive material and infrabasal plate are to electric-examination probe
Work with the workpiece with electric conductivity does not have any impact.
In another embodiment, described upper substrate and described infrabasal plate are conductive material, and some described electric-examination probes with
Respectively in insulated setting between described upper substrate, described infrabasal plate；Its principle is same as described above, be so that upper substrate and under
Substrate, while location electric-examination probe and workpiece, will not have any impact to electric-examination probe and the workpiece with electric conductivity.
It is also preferred that the left some described electric-examination probes expose described upper substrate or described lower base towards one end of described storing screens
Plate towards the side of described storing screens, and be arranged at the some described electric-examination probe of described upper substrate or described infrabasal plate towards
One end of described storing screens lays respectively in same plane；It is arranged at some electric-examination probes of upper substrate or infrabasal plate towards putting
Place, one end plane putting screens is detection correcting plane, arranges according to system, and this correcting plane can be and workpiece theory table
Face is that gap, slight ground is arranged, and when surface of the work protrudes out to lead to, by lighting with arbitrary electric-examination probe conduction to correcting plane
Or the display lamp that series is connected with electric-examination probe, export judged result.
Specifically, described electric-examination probe can be arranged at described upper substrate or described infrabasal plate up or down, and described flat
Face degree electric-examination tool also includes so that described electric-examination probe perseverance is in the elastic component in a plane.
Specifically, described upper substrate and described infrabasal plate are separately provided for location at the outer rim of described storing screens
The locating flange of described workpiece；The some described electric-examination probe being arranged at described upper substrate is rectified towards the one of described storing screens
Upper surface to workpiece, the some described electric-examination probe being arranged at described infrabasal plate is rectified work towards the one of described storing screens
The lower surface of part.
Accompanying drawing explanation
Fig. 1 is the decomposing schematic representation of this utility model flatness electric-examination tool.
Fig. 2 is the view under this utility model flatness electric-examination tool the first use state.
Fig. 3 is the view under this utility model flatness electric-examination tool the second use state.
Fig. 4 is the enlarged drawing in A portion in Fig. 3.
Detailed description of the invention
By describing technology contents of the present utility model, structural feature in detail, being realized purpose and effect, below in conjunction with enforcement
Mode also coordinates accompanying drawing to be explained in detail.
As it is shown in figure 1, a kind of flatness electric-examination tool that this utility model provides, for detecting the flatness of workpiece 800,
Flatness electric-examination tool include infrabasal plate 200 with can the upper substrate 100 that moves up and down of relative infrabasal plate 200, upper substrate 100 and under
The storing screens 300 for putting workpiece 800 is formed between substrate 200；Upper substrate 100 and infrabasal plate 200 are towards putting screens
The side of 300 is respectively arranged with some electric-examination probes 400, is arranged at the electric-examination probe 400 of upper substrate 100 and is arranged at infrabasal plate
The electric-examination probe 400 of 200 current loop in series with display lamp 500 respectively.Shown in Fig. 2-Fig. 4, more specifically:
As it is shown in figure 1, the flatness electric-examination tool that this utility model provides, including upper substrate 100 and infrabasal plate 200, and
Upper substrate 100 can relative move up and down with infrabasal plate 200, and when upper substrate 100 and infrabasal plate 200 are moved away to pick and place
Workpiece 800, when upper substrate 100 and infrabasal plate 200 move towards to position workpiece 800.It should be understood that upper substrate 100
And several guide posts 600 between infrabasal plate 200, can be provided with, bar 600 one end can be directed to and be fixedly connected on upper substrate
100 and the one of which of infrabasal plate 200, the other end of guide post 600 is plugged in upper substrate 100 and the another one of infrabasal plate 200,
Guide with the relative movement to both；Certainly, bar 600 correspondence can also be directed to and be connected to upper substrate 100 and infrabasal plate
200, equally realize the relative movement of upper substrate 100 and infrabasal plate 200 is guided.
Shown in Fig. 1-Fig. 3, between upper substrate 100 and infrabasal plate 200, form the storing screens for putting workpiece 800
300.Specifically, the shape of upper substrate 100 and the corresponding workpiece 800 of infrabasal plate 200 offers detent 310 respectively, and when upper
When substrate 100 and infrabasal plate 200 move towards to detecting position, relative detent 310 is formed for putting that workpiece 800 is put
Put screens 300.Further, as shown in Figure 4, upper substrate 100 and infrabasal plate 200 set at the outer rim putting screens 300 respectively
It is equipped with the locating flange 320 for positioning workpiece 800, the setting of this locating flange 320, for clamping position workpiece 800, so that
The bottom surface of the upper side of the workpiece 800 that must be positioned and downside and detent 310 is in arranging with gap.
Again incorporated by reference to shown in Fig. 1-Fig. 3, upper substrate 100 and infrabasal plate 200 are respectively provided with towards the side putting screens 300
There are some electric-examination probes 400, are arranged at the electric-examination probe 400 of upper substrate 100 and are arranged at the electric-examination probe 400 of infrabasal plate 200
Current loop in series with display lamp 500 respectively.Specifically, some electric-examination probes 400 are towards one end dew putting screens 300
Go out upper substrate 100 or infrabasal plate 200 towards putting the side of screens 300, and if being arranged at upper substrate 100 or infrabasal plate 200
Dry electric-examination probe 400 lays respectively in same plane towards the one end putting screens 300；It is arranged at upper substrate 100 or infrabasal plate
Some electric-examination probes 400 of 200 are detection correcting plane towards place, one end plane putting screens 300, arrange according to system,
This correcting plane can be with workpiece 800 theoretical surface be gap, slight ground arrange, and when workpiece 800 surface convex to correcting plane
Extending and conduct with arbitrary electric-examination probe 400, by the display lamp 500 lighted or series is connected with electric-examination probe 400, output is sentenced
Disconnected result.
Further, for avoiding workpiece 800 local deformation, protruding excessively towards side electric-examination probe 400 direction and cause
The impaired electric-examination effect that affects in the end of electric-examination probe 400, adoptable mode is: as shown in Figures 2 and 3, and electric-examination probe 400 can
It is arranged at upper substrate 100 or infrabasal plate 200 up or down, and flatness electric-examination tool also includes so that electric-examination probe 400 is permanent
The elastic component (not shown) being in a plane.It will of course be understood that, electric-examination probe 400 can also use elastic electric-examination
Probe 400, same it can be avoided that the impaired situation in electric-examination probe 400 end occurs.
Of course, it is to be understood that, some electric-examination probes 400 are respectively conductive material, rely on the electric-examination probe 400 connecing electricity with
There is the contact of workpiece 800 of electric conductivity whether, control lighting or extinguish, with quick judged result of display lamp 500.
It is also preferred that the left some electric-examination probes 400 are respectively conductive material；Now, rely on the electric-examination probe 400 connecing electricity and have
Whether the contact of the workpiece 800 of electric conductivity, controls lighting or extinguish, with quick judged result of display lamp 500.Implement one
In example, upper substrate 100 and infrabasal plate 200 are non-conductive material, and upper substrate 100 and the infrabasal plate 200 of non-conductive material are only fixed
Position electric-examination probe 400 and the positioner of workpiece 800, and the upper substrate 100 of non-conductive material and infrabasal plate 200 are to electric-examination spy
Pin 400 does not have any impact with the work of the workpiece 800 with electric conductivity.In another embodiment, upper substrate 100 and under
Substrate 200 is conductive material, and respectively in insulated setting between some electric-examination probes 400 and upper substrate 100, infrabasal plate 200；
Its principle is same as described above, is so that same at location electric-examination probe 400 and workpiece 800 of upper substrate 100 and infrabasal plate 200
Time, electric-examination probe 400 and the workpiece 800 with electric conductivity will not there be is any impact.
Shown in Fig. 1-Fig. 4, the work process of the flatness electric-examination tool that this utility model provides is done one specifically
Bright:
Upper substrate 100 and infrabasal plate 200 are moved away from, are exposed by detent 310；Workpiece 800 is put into detent
In 310, and the edge side of workpiece 800 is positioned flange 320 and is positioned；Upper substrate 100 and infrabasal plate 200 move towards to detection
Position, is now placed in putting the locating flange 320 that the edge side of the workpiece 800 in screens 300 is respectively on the upside of both sides and is positioned, and
Make the upper side of the workpiece 800 being positioned and the downside bottom surface with detent 310 in arranging with gap；
Respectively and the two sides up and down of workpiece 800 are between trace to be respectively protruding into the electric-examination probe 400 put in screens 300
Gap is arranged, and when workpiece 800 flatness is inadequate, workpiece 800 upwards protrudes out, the electric-examination probe 400 being positioned at upper substrate 100 is led
Lead to or be blocked so that corresponding with the display lamp 500 of the electric-examination probe 400 of this upper substrate 100 series connection lights or extinguish to refer to
Show the abnormality detection result protruded out on the upside of workpiece 800；When workpiece 800 flatness is inadequate, workpiece 800 protrudes out downwards, under being positioned at
The electric-examination probe 400 of substrate 200 is switched on or is blocked so that the display lamp connected with the electric-examination probe 400 of this infrabasal plate 200
The lighting or extinguish with the abnormality detection result that protrudes out on the downside of instruction of 500 correspondences.
Compared with prior art, the flatness electric-examination tool that this utility model provides, upper by can relatively move up and down
Substrate 100 and infrabasal plate 200 involutory, it is achieved carry out spacing to being positioned over the workpiece 800 putting screens 300；It is arranged at base
The electric-examination probe 400 of plate 100 and infrabasal plate 200 current loop in series with display lamp 500 respectively, thus when being arranged at base
The electric-examination probe 400 of plate 100 detects NG or is arranged at the electricity of infrabasal plate 200 when building probe in detecting to NG, respectively by making
The lighting or extinguish, testing result to be carried out visual indication, and due to upper substrate 100 He of display lamp 500 connected in series
The detection respectively of infrabasal plate 200 and output result, it is thus possible to the harmful trend of workpiece 800 is judged, in order to improve
Production and processing technology.
Above disclosed only preferred embodiment of the present utility model, can not limit this practicality with this new certainly
The interest field of type, the equivalent variations therefore made according to this utility model claim, still belong to this utility model and contained
Scope.
Claims (7)
1. a flatness electric-examination tool, for detecting the flatness of workpiece, it is characterised in that: described flatness electric-examination tool bag
Include infrabasal plate with can the upper substrate that moves up and down of relative described infrabasal plate, formed between described upper substrate and described infrabasal plate and be used for
Put the storing screens of workpiece；Described upper substrate and described infrabasal plate are respectively arranged with some towards the side of described storing screens
Electric-examination probe, the electric-examination probe being arranged at described upper substrate and be arranged at described infrabasal plate electric-examination probe respectively with display lamp string
Connection constitutes current loop.
2. flatness electric-examination tool as claimed in claim 1, it is characterised in that: some described electric-examination probes respectively conduct electricity material
Matter.
3. flatness electric-examination tool as claimed in claim 2, it is characterised in that: described upper substrate and described infrabasal plate are non-leading
Electricity material.
4. flatness electric-examination tool as claimed in claim 2, it is characterised in that: described upper substrate and described infrabasal plate are conduction
Respectively in insulated setting between material, and some described electric-examination probes and described upper substrate, described infrabasal plate.
5. flatness electric-examination tool as claimed in claim 1, it is characterised in that: some described electric-examination probes are towards described storing
Described upper substrate or the described infrabasal plate side towards described storing screens is exposed in one end of screens, and is arranged at described upper substrate
Or the some described electric-examination probe of described infrabasal plate lays respectively in same plane towards one end of described storing screens.
6. flatness electric-examination tool as claimed in claim 5, it is characterised in that: described electric-examination probe can be arranged up or down
In described upper substrate or described infrabasal plate, and described flatness electric-examination tool also includes that to be in one flat so that described electric-examination probe perseverance
Elastic component in face.
7. flatness electric-examination tool as claimed in claim 5, it is characterised in that: described upper substrate and described infrabasal plate are in described
Put and be separately provided for positioning the locating flange of described workpiece at the outer rim of screens；It is arranged at some institutes of described upper substrate
State electric-examination probe and rectify the upper surface to workpiece towards the one of described storing screens, be arranged at the some described electricity of described infrabasal plate
Inspection probe rectifies the lower surface to workpiece towards the one of described storing screens.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620546972.5U CN205748260U (en) | 2016-06-07 | 2016-06-07 | Flatness electric-examination tool |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620546972.5U CN205748260U (en) | 2016-06-07 | 2016-06-07 | Flatness electric-examination tool |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205748260U true CN205748260U (en) | 2016-11-30 |
Family
ID=57360734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620546972.5U Active CN205748260U (en) | 2016-06-07 | 2016-06-07 | Flatness electric-examination tool |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205748260U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107607038A (en) * | 2017-09-22 | 2018-01-19 | 铜陵泽辉电子有限责任公司 | A kind of metallized film precision intelligent Detection of capacitor |
| CN107664727A (en) * | 2017-09-22 | 2018-02-06 | 铜陵市三盛电子有限公司 | A kind of thin film capacitor intelligent checking system |
| CN108507451A (en) * | 2017-05-22 | 2018-09-07 | 太仓市伦凯自动化设备有限公司 | A kind of flatness automatic checkout equipment |
-
2016
- 2016-06-07 CN CN201620546972.5U patent/CN205748260U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108507451A (en) * | 2017-05-22 | 2018-09-07 | 太仓市伦凯自动化设备有限公司 | A kind of flatness automatic checkout equipment |
| CN107607038A (en) * | 2017-09-22 | 2018-01-19 | 铜陵泽辉电子有限责任公司 | A kind of metallized film precision intelligent Detection of capacitor |
| CN107664727A (en) * | 2017-09-22 | 2018-02-06 | 铜陵市三盛电子有限公司 | A kind of thin film capacitor intelligent checking system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 523000, No. 89, Tong Tong Industrial Zone, Lin village, Tangxia Town, Guangdong, Dongguan Patentee after: Dongguan fast Precision Technology Co., Ltd Address before: 523000, No. 89, Tong Tong Industrial Zone, Lin village, Tangxia Town, Guangdong, Dongguan Patentee before: DONGGUAN FAST PRECISION HARDWARE Co.,Ltd. |