CN205562731U - Diode breakdown voltage test circuit - Google Patents
Diode breakdown voltage test circuit Download PDFInfo
- Publication number
- CN205562731U CN205562731U CN201620321256.7U CN201620321256U CN205562731U CN 205562731 U CN205562731 U CN 205562731U CN 201620321256 U CN201620321256 U CN 201620321256U CN 205562731 U CN205562731 U CN 205562731U
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- Prior art keywords
- diode
- rectifier bridge
- connects
- winding
- port
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
Description
Claims (2)
- null1. a diode breakdown voltage test circuit,Including diode D2、Transformator W、Rectifier bridge T and voltmeter V,It is characterized in that,The two ends of the winding N1 of described transformator W connect the two ends of 220V alternating current respectively,The two ends of the winding N1 of transformator W connect the port 1 of rectifier bridge T and the port 3 of rectifier bridge T respectively,The port 2 of rectifier bridge T connects resistance R1 and electric capacity C2,The other end of resistance R1 connects the negative electrode of diode D1 to be measured、Voltmeter V and the colelctor electrode of audion V1,The port 4 of rectifier bridge T connects the other end the ground connection of electric capacity C2,One end of the winding N3 of transformator W connects the anode of diode D2,The negative electrode of diode D2 connects resistance R2 and electric capacity C1,The other end of resistance R2 connects a fixing end and the base stage of audion V1 of potentiometer RP1,The other end of electric capacity C1 connects another fixing end of potentiometer RP1、The sliding end of potentiometer RP1、The emitter stage of audion V1、Ammeter A、The other end of voltmeter V and the other end of the winding N3 of transformator W,The anode of diode D1 to be measured connects the other end of ammeter A.
- Diode breakdown voltage the most according to claim 1 test circuit, it is characterised in that the turn ratio of winding N1, N2, N3 of described transformator W is 220:500:6.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201620321256.7U CN205562731U (en) | 2016-04-15 | 2016-04-15 | Diode breakdown voltage test circuit |
Applications Claiming Priority (1)
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CN201620321256.7U CN205562731U (en) | 2016-04-15 | 2016-04-15 | Diode breakdown voltage test circuit |
Publications (1)
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CN205562731U true CN205562731U (en) | 2016-09-07 |
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Family Applications (1)
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CN201620321256.7U Expired - Fee Related CN205562731U (en) | 2016-04-15 | 2016-04-15 | Diode breakdown voltage test circuit |
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CN (1) | CN205562731U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106646176A (en) * | 2016-10-19 | 2017-05-10 | 珠海格力电器股份有限公司 | Method and apparatus of screening transistor |
-
2016
- 2016-04-15 CN CN201620321256.7U patent/CN205562731U/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106646176A (en) * | 2016-10-19 | 2017-05-10 | 珠海格力电器股份有限公司 | Method and apparatus of screening transistor |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
CB03 | Change of inventor or designer information |
Inventor after: Yang Yigen Inventor before: Li Jun |
|
COR | Change of bibliographic data | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170120 Address after: 528308 Guangdong Province, Foshan city Shunde District Lunjiao nepheline new Xi four northbound No. 2 B block four Patentee after: Foshan City Han Chi Electronics Co. Ltd. Address before: 315700 Ningbo, Xiangshan Province Economic Development Zone, Park Road, No. 98 Patentee before: Xiangshan Al Wouter Intelligent Technology Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160907 Termination date: 20190415 |