CN205545267U - Light module testing circuit and testing arrangement - Google Patents
Light module testing circuit and testing arrangement Download PDFInfo
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- CN205545267U CN205545267U CN201620040022.5U CN201620040022U CN205545267U CN 205545267 U CN205545267 U CN 205545267U CN 201620040022 U CN201620040022 U CN 201620040022U CN 205545267 U CN205545267 U CN 205545267U
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Abstract
The utility model provides a light module testing circuit and testing arrangement belongs to light module testing field. The utility model discloses testing arrangement is including test seat, anchor clamps, linking module, test circuit, propelling module and buckle press fitting die piece, be equipped with switch and recess on the test seat, be equipped with the constant head tank on the anchor clamps, linking module with anchor clamps fixed connection, propelling module be used for with the optical module pushes the constant head tank and fixes in the test seat, buckle press fitting die piece is used for being in the location the buckle of the optical module panel beating cover in the test seat is pushed down, linking module is used for connecting optical module and test circuit, test circuit respectively with buckle press fitting die piece and propelling module link to each other. The beneficial effects of the utility model are that: realize the automatic fixed position of optical module, cover buckle pressfitting function with shell short -circuit test and automatic panel beating automatically with going on, simplify production processes, reduce the loss of turnaround time between the process.
Description
Technical field
This utility model relates to a kind of optical module field tests, particularly relates to a kind of optical module test circuit and test device.
Background technology
In industry, speed writes code at below 3G optical module, buckle pressed by panel beating cover and ground is divided into three different operatings with shell short-circuit test.Optical module writes code for optical module is inserted on test bench, and handheld scan gun is by optical module serial number typing software；Panel beating cover pressure buckle is to use the mode such as needle-nose pliers or quick clip manually by the buckle pressing of optical module panel beating cover；Ground is tested for manually optical module being inserted test bench with shell short-circuit test.
Prior art has following several deficiency:
(1) when above-mentioned several fixtures/instrument that prior art uses use, the position of pressing is not easy to fix, and easily causes optical module panel beating and is covered with cut or pressing phenomenon not in place.
(2) between three different operations of prior art, the turnaround time is long, and is manually pressed together and easily makes operator tired, reduces production efficiency.
(3) it is metal or alloy material due to existing fixture/instrument, contacts generation relative displacement with panel beating cover and easily cause the hood-shaped change of panel beating.
Utility model content
For solving the problems of the prior art, this utility model provides a kind of optical module test circuit and the test device containing this test circuit.
This utility model optical module test circuit includes direct-flow voltage regulation unit, power control unit, external switch interface unit, short-circuit alarming unit, optical module interface unit, described direct-flow voltage regulation unit is that optical module tests circuit and optical module is powered, described power control unit is connected with described direct-flow voltage regulation unit and external switch interface unit respectively, and described short-circuit alarming unit is connected with described external switch interface unit and optical module interface unit respectively.
This utility model is further improved, and also includes writing yard unit and computer interface unit, described in write yard unit and be connected with described computer interface unit, optical module interface unit and direct-flow voltage regulation unit respectively.
This utility model is further improved, described power control unit includes single-chip microcomputer, the first relay, the second relay and the 3rd relay, and the outfan of described single-chip microcomputer input with described first relay, the second relay and the 3rd relay respectively is connected.
This utility model additionally provides a kind of test device comprising above-mentioned test circuit, including test bench, fixture, link block, propulsion die and buckle pressing module, described test bench is provided with switch and the groove matched with described fixture overall dimensions, described fixture is provided with the locating slot for positioning optical module, described link block is fixing with described fixture to be connected, described propulsion die for pushing locating slot and being fixed in described test bench by described optical module, described buckle pressing module is for will be located into the buckle pressure of the optical module panel beating cover in described test bench, described link block is for connecting described optical module and the optical module interface unit of test circuit, described test circuit is connected with described buckle pressing module and propulsion die respectively.
This utility model is further improved, and described fixture is wholely set with described test bench.
This utility model is further improved, and described propulsion die is revolution clamping cylinder, and described revolution clamping cylinder includes a mechanical arm.
This utility model is further improved, described locating slot material be plastic cement or excellent power glue.
This utility model is further improved, and described optical module passes through the described locating slot left and right sides rear side corresponding with locating slot opening, four sides, bottom surface contacts location.
This utility model is further improved, and described buckle pressing module includes that cylinder and thimble, described thimble are arranged on described cylinder, and described cylinder can promote described thimble to be depressed by the buckle of optical module panel beating cover.
This utility model is further improved, and described cylinder and thimble are two groups, are symmetrically arranged at the both sides of described test bench.
Compared with prior art, the beneficial effects of the utility model are: use the test automatic fixed position of circuit realiration optical module, automatically carry out with shell short-circuit test and automatic panel beating cover buckle pressing function, simplify production process, reduce the loss of inter process turnaround time；Using excellent power glue is the locating slot of material, and panel beating cover is substantially reduced by the probability scratching damage；Use revolution to step up cylinder and fix position before and after optical module, it is to avoid prior art presses defect not in place when panel beating cover buckle pressing due to inaccurate the causing in fixture location；Add the buckle pressing mode of thimble with cylinder and avoid the fatigue strength of human users；Substantially increase testing efficiency.
Accompanying drawing explanation
Fig. 1 is that optical module tests circuit diagram；
Fig. 2 is clamp structure schematic diagram；
Fig. 3 is link block circuit diagram；
Fig. 4 is test device decomposition texture schematic diagram；
Fig. 5 is test device mounting structure schematic diagram；
Fig. 6 is for writing a yard test system structure schematic diagram.
Detailed description of the invention
With embodiment, this utility model is described in further details below in conjunction with the accompanying drawings.
As shown in Figure 1, this utility model optical module test circuit includes direct-flow voltage regulation unit 701, power control unit 702, external switch interface unit 703, short-circuit alarming unit 704, optical module interface unit 705, write yard unit 706 and computer interface unit 707, described direct-flow voltage regulation unit 701 is powered for optical module test circuit and optical module 2, described power control unit 702 is connected with described direct-flow voltage regulation unit 701 and external switch interface unit 703 respectively, described short-circuit alarming unit 704 is connected with described external switch interface unit 703 and optical module interface unit 705 respectively, described write yard unit 706 respectively with described computer interface unit 707, optical module interface unit 705 is connected with direct-flow voltage regulation unit 701.
Wherein, the DC voltage transformation that external transformer is inputted by described direct-flow voltage regulation unit 701 becomes+5V and+3.3V DC voltage, powers for test circuit and optical module 2.
Described power control unit 702 includes single-chip microcomputer, the first relay, the second relay and the 3rd relay, and the outfan of described single-chip microcomputer input with described first relay, the second relay and the 3rd relay respectively is connected.Described single-chip microcomputer uses 80C2052 single-chip microcomputer, receive the data of external switch interface unit 703 conveying, through single-chip microcomputer internal processes, the signal of control single chip computer pin output controls three relay status, to reach to control propulsion die and the purpose of buckle pressing module work in test device.
Described external switch interface unit 703 is connected with the switch on described test device by data wire, receives the signal of external switch and is delivered to power control unit 702.
Described short-circuit alarming unit 704 includes buzzer and display lamp, is used for receiving optical module 2 ground and the shell shorting data of optical module interface unit 705 conveying, if data are 0, then the buzzer in short-circuit alarming module can be reported to the police, and LED light is bright；Not reporting to the police, lamp does not works.It is of course also possible to only indicate optical module 2 ground the most qualified with shell shorting data by bi-colour LED or buzzer.
Described optical module interface unit 705 is DB9 data-interface, is connected with the link block 6 on fixture 5 by test circuit by data wire, powers for link block 6, sends the data writing yard unit 706 to link block 6, and then transmits to optical module 2；Meanwhile, the signal receiving optical module 2 ground short-circuit with shell is delivered to short-circuit alarming unit 704.
Described yard unit 706 of writing receives the data of computer interface unit 707, is delivered to DB9 data-interface after carrying out relevant treatment.
Described computer interface unit 707 is DB25 data-interface, is connected with computer by data wire, and the data that reception computer sends are delivered to write in yard unit 706 and carry out relevant treatment.
nullAs shown in Figure 2-5，This example additionally provides a kind of optical module comprising above-mentioned test circuit test device，Including test bench 7、Fixture 5、Link block 6、Propulsion die and buckle pressing module，Described test bench 7 is provided with switch and the groove 71 matched with described fixture 5 overall dimensions，Described fixture 5 is provided with the locating slot 51 for positioning optical module 2，Described link block 6 is fixing with described fixture 5 to be connected，Described propulsion die for pushing locating slot 51 and being fixed in described test bench 7 by described optical module 2，Described buckle pressing module is for will be located into the buckle pressure of the optical module 2 panel beating cover in described test bench 7，Described link block 6 is for connecting described optical module 2 and the optical module interface unit 705 of test circuit，Described test circuit is connected with described buckle pressing module and propulsion die respectively，For controlling described buckle pressing module and propulsion die action.The link block of this example is connecting plate, and the circuit structure in connecting plate is as shown in Figure 3.
Certainly, described fixture 5 can also be wholely set with described test bench 7, arranges a locating slot, and described connecting plate is set directly in described test bench 7, connects described optical module 2 and described test circuit in described test bench 7.
The propulsion die of this example is revolution clamping cylinder 1, described revolution clamping cylinder 1 includes a mechanical arm 11, the buckle pressing module of this example includes two groups of cylinders 4,8 and thimble 3,9, described two groups of cylinders and thimble are symmetrically arranged at the both sides of described test bench 7, described thimble 3 is connected end with cylinder 4 and is provided with screw thread, described cylinder 4 is provided with female thread, and described thimble 3 is connected, equally by screw thread is fixing with described cylinder 4, described thimble 9 is threaded on described cylinder 8, described cylinder 4,8 can promote described thimble 3,9 to be depressed by the buckle of optical module 2 panel beating cover.
The first Control cylinder 4 in described power control unit 702, the second Control revolution clamping cylinder 1, the 3rd Control cylinder 8.
The concrete control process of described power control unit 702 is: by the switch of lower outer portion, internal processes control single chip computer 80C2051 in described power control unit 702 outputs control signals to the second relay, second relay Guan Bi, the electromagnetic valve controlling revolution clamping cylinder 1 leads to high pressure gas to revolution clamping cylinder 1, pushes optical module 2 to test bench 7 after mechanical arm 11 half-twist counterclockwise of revolution clamping cylinder 1.After time delay 0.5S, internal processes control single chip computer 80C2051 in power control unit 702 outputs control signals to the first relay and the 3rd relay, control electromagnetic valve and lead to high pressure gas to cylinder 4 and cylinder 8, push thimble 3 and thimble 9 to optical module 2 panel beating cover, by optical module 2 panel beating cover buckle pressing.
Press switch again, internal processes control single chip computer 80C2051 in power control unit 702 outputs control signals to the first relay, the second relay and the 3rd relay, described first relay, the second relay and the 3rd relay disconnect, and then control cylinder 4, revolution clamping cylinder 1, the electromagnetic valve of cylinder 8 respectively, close the transfer passage of high pressure gas, make cylinder 4, revolution clamping cylinder 1, cylinder 8 restPose.
Revolution clamping cylinder 1 is used to fix position before and after optical module 2, avoid prior art when optical module 2 panel beating cover buckle pressing due to the inaccurate defect causing pressure not in place in fixture location, adding the buckle pressing mode of thimble with cylinder and avoid the fatigue strength of human users, detection efficiency is greatly improved.
Mobile in locating slot 51 scratched damage in order to avoid the panel beating of described optical module 2 covers on, described locating slot material be plastic cement or excellent power glue, the most excellent power glue.Excellent power glue, also known as polyurethane PU elastomer, it is good to be that one has intensity, and compression is little.A kind of new material between plastics and rubber, has the rigidity of plastics, has again the elasticity of rubber.
Described optical module 2 passes through described locating slot 51 left and right sides rear side corresponding with locating slot 51 opening, four sides, bottom surface contacts location, and location is firm, firm, it is ensured that optical module 2 can insert test bench 7 smoothly and optical module 2 panel beating cover does not have cut.
As shown in Figure 6, this utility model can also be connected to form with computer write code test system realize coding automatic function, described code test system of writing includes computer, scanner, it is provided with in described computer and writes a yard software, described computer is connected with the computer interface unit 707 of described test circuit by data wire, the serial number input computer of optical module is write in yard software by described scanner, described in write yard software by test circuit in yard unit 706 of writing automatically write code for described optical module.
This example specific works flow process is:
(1) same for this test device computer, power supply are connected, optical module 2 to be operated is inserted from fixture locating slot 51 front end；
(2) operator press switch, Single-chip Controlling be positioned at the mechanical arm 11 of locating slot 51 revolution clamping cylinder 1 below by level half-twist counterclockwise, push optical module 2 to test bench 7 and fix；
(3) after optical module being fixed on precalculated position, Single-chip Controlling test circuit power on to optical module 2, and start with shell short-circuit test；
(4) now with scanner, the serial number input computer of optical module 2 is write in yard software, write yard software and automatically write code to optical module 2, and the cylinder at locating slot 51 two ends promotes thimble to be depressed by the buckle of the panel beating cover of optical module 2；
(5) optical module write code, complete with shell short-circuit test and panel beating cover buckle pressing after, press " end " switch, the cylinder of Single-chip Controlling test bench 7 both sides will press the thimble automatic rebounding of buckle to initial position, mechanical arm 11 is separated with optical module 2 and returns back to initial position by control revolution clamping cylinder 1, and work completes.
This utility model use the mode of Automatic Control realize the automatic fixed position of optical module, automatically carry out with shell short-circuit test, coding automatic and automatic panel beating cover buckle pressing function, simplify production process, reduce the loss of inter process turnaround time, substantially increase work efficiency.
The detailed description of the invention of the above is better embodiment of the present utility model; not limit with this and of the present utility model be embodied as scope; scope of the present utility model includes being not limited to this detailed description of the invention, and all equivalences made according to this utility model change all in protection domain of the present utility model.
Claims (10)
1. an optical module test circuit, it is characterized in that: include direct-flow voltage regulation unit, power control unit, external switch interface unit, short-circuit alarming unit, optical module interface unit, described direct-flow voltage regulation unit is that optical module tests circuit and optical module is powered, described power control unit is connected with described direct-flow voltage regulation unit and external switch interface unit respectively, and described short-circuit alarming unit is connected with described external switch interface unit and optical module interface unit respectively.
Optical module the most according to claim 1 test circuit, it is characterised in that: also include writing yard unit and computer interface unit, described in write yard unit and be connected with described computer interface unit, optical module interface unit and direct-flow voltage regulation unit respectively.
Optical module the most according to claim 1 and 2 test circuit, it is characterized in that: described power control unit includes single-chip microcomputer, the first relay, the second relay and the 3rd relay, the outfan of described single-chip microcomputer input with described first relay, the second relay and the 3rd relay respectively is connected.
4. the test device testing circuit containing optical module described in any one of claim 1-3, it is characterized in that: include test bench, fixture, link block, propulsion die and buckle pressing module, described test bench is provided with switch and the groove matched with described fixture overall dimensions, described fixture is provided with the locating slot for positioning optical module, described link block is fixing with described fixture to be connected, described propulsion die for pushing locating slot and being fixed in described test bench by described optical module, described buckle pressing module is for will be located into the buckle pressure of the optical module panel beating cover in described test bench, described link block is for connecting described optical module and the optical module interface unit of test circuit, described test circuit is connected with described buckle pressing module and propulsion die respectively.
Test device the most according to claim 4, it is characterised in that: described fixture is wholely set with described test bench.
6. according to the test device described in claim 4 or 5, it is characterised in that: described propulsion die is revolution clamping cylinder, and described revolution clamping cylinder includes a mechanical arm.
7. according to the test device described in claim 4 or 5, it is characterised in that: described locating slot material be plastic cement or excellent power glue.
Test device the most according to claim 7, it is characterised in that: described optical module passes through the described locating slot left and right sides rear side corresponding with locating slot opening, four sides, bottom surface contacts location.
9. according to the test device described in claim 4 or 5, it is characterised in that: described buckle pressing module includes that cylinder and thimble, described thimble are arranged on described cylinder, and described cylinder can promote described thimble to be depressed by the buckle of optical module panel beating cover.
Test device the most according to claim 9, it is characterised in that: described cylinder and thimble are two groups, are symmetrically arranged at the both sides of described test bench.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620040022.5U CN205545267U (en) | 2016-01-15 | 2016-01-15 | Light module testing circuit and testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620040022.5U CN205545267U (en) | 2016-01-15 | 2016-01-15 | Light module testing circuit and testing arrangement |
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| CN205545267U true CN205545267U (en) | 2016-08-31 |
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| CN201620040022.5U Active CN205545267U (en) | 2016-01-15 | 2016-01-15 | Light module testing circuit and testing arrangement |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105530045A (en) * | 2016-01-15 | 2016-04-27 | 深圳市恒宝通光电子股份有限公司 | Optical module test circuit, test device and coding test system |
| CN107101803A (en) * | 2017-03-07 | 2017-08-29 | 深南电路股份有限公司 | A kind of optical module automatic testing equipment |
| CN110873637A (en) * | 2020-01-19 | 2020-03-10 | 江西迅特通信技术有限公司 | Optical module testing device and method |
-
2016
- 2016-01-15 CN CN201620040022.5U patent/CN205545267U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105530045A (en) * | 2016-01-15 | 2016-04-27 | 深圳市恒宝通光电子股份有限公司 | Optical module test circuit, test device and coding test system |
| CN105530045B (en) * | 2016-01-15 | 2018-01-23 | 深圳市恒宝通光电子股份有限公司 | A kind of optical module test circuit, test device and write a yard test system |
| CN107101803A (en) * | 2017-03-07 | 2017-08-29 | 深南电路股份有限公司 | A kind of optical module automatic testing equipment |
| CN110873637A (en) * | 2020-01-19 | 2020-03-10 | 江西迅特通信技术有限公司 | Optical module testing device and method |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder |
Address after: 518000 809, 810, 811, block B, building 6, Shenzhen International Innovation Valley, Dali community, Xili street, Nanshan District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN HI-OPTEL TECHNOLOGY Co.,Ltd. Address before: 518000 East, 4th, 5th and 6th floors of Gaofa No.2 factory building, maotoushan Gaofa Industrial Zone, Beihuan Road, Nanshan District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HI-OPTEL TECHNOLOGY Co.,Ltd. |
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| CP02 | Change in the address of a patent holder |