CN205506359U - Optical wave piece delay degree detection device - Google Patents
Optical wave piece delay degree detection device Download PDFInfo
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- CN205506359U CN205506359U CN201620293625.6U CN201620293625U CN205506359U CN 205506359 U CN205506359 U CN 205506359U CN 201620293625 U CN201620293625 U CN 201620293625U CN 205506359 U CN205506359 U CN 205506359U
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- wave plate
- revolving stage
- test
- fine setting
- turntable
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Abstract
The utility model discloses an optical wave piece delay degree detection device, including a test rack, the last from the bottom up of test rack is equipped with the incident light source module in proper order, the platform is placed to the polarizer, the wave plate revolving stage awaits measuring, the platform is placed to the standard wave plate, analyser revolving stage and the test probe of connecting wave plate test power meter, be equipped with the transmitting illuminant in the incident light source module and turn to the prism, it is equipped with a hollow fine setting revolving stage in the wave plate revolving stage to await measuring, be equipped with the microscope carrier of placing the wave plate that awaits measuring on the fine setting revolving stage, the fine setting revolving stage is connected with the fine setting knob, be equipped with a hollow accurate revolving stage in the analyser revolving stage, be equipped with the microscope carrier of placing the analyser on the accurate revolving stage, it is connected with worm gear adjustment mechanism to state accurate revolving stage, the utility model discloses rotation regulation fine setting revolving stage and accurate revolving stage that can be convenient during the test, the linearly polarized light's of process wave plate polarization deflects in succession, and wave plate measurement operation is convenient, and the fast enough speed adjusting of ability puts in order the test, and efficiency of software testing height, test accuracy are reliably.
Description
Technical field
This utility model relates to field of optical device technology, particularly relates to a kind of optical wave plate degree of delay detection device.
Background technology
Light wave has different polarization states, optical system it is frequently necessary to change the polarization state of light wave or the polarization state of detection light wave, owing to the polarization state of light wave is to be determined with phase contrast by the amplitude ratio of its orthogonal vibration, therefore changing the two parameter and just can change the polarization state of light wave, the class optics utilizing light to be made by the feature of the phase contrast of crystal change incident illumination is known as wave plate.
During optical wave plate part processing and manufacturing, needing grinding repeatedly, polishing, wave plate part needs to detect according to its performance parameter, it is ensured that the wave plate part of processing meets the requirements.During detection wave plate part, need constantly to adjust the polarizer, position, plane included angle between wave plate part to be detected and analyzer, periodically changed by the intensity of the light of analyzer and detect, prior art needs artificial constantly going to adjust test instrunment when detection, adjustment test and comparison is slow, it is relatively difficult to quickly adjust test, it is therefore desirable to improve further.
Summary of the invention
For overcoming the deficiencies in the prior art, this utility model provide a kind of easy to operate, testing efficiency is high, test the device of optical wave plate degree of delay detection accurately and reliably.
nullThis utility model be the technical scheme is that a kind of optical wave plate degree of delay detection device by reaching above-mentioned technical purpose，Including a test chassis，Incident light source assembly it is sequentially provided with from top to bottom in described test chassis、Polarizer mounting table、Wave plate turntable to be measured、Standard wave plate mounting table、Analyzer turntable and the test probe of connection wave plate measured power meter，Described incident light source assembly is provided with a horizontally disposed transmitting light source and an incident illumination turns to prism，Described wave plate turntable to be measured is provided with the fine setting turntable of a hollow，Described fine setting turntable is provided with the microscope carrier placing wave plate to be measured，Described fine setting turntable connects vernier knob，Described analyzer turntable is provided with the precision rotation platform of a hollow，Described precision rotation platform is provided with the microscope carrier placing analyzer，Described precision rotation platform connects worm and gear governor motion.
Described standard wave plate mounting table is provided with standard wave plate.
Described test chassis is provided with floor light light source.
The beneficial effects of the utility model are: use said structure, by arranging the fine setting turntable that can place wave plate to be measured and the precision rotation platform that analyzer can be placed, fine setting turntable is provided with vernier knob, precision rotation platform is provided with worm and gear governor motion, regulation fine setting turntable and precision rotation platform can be rotated easily during test, when wave plate rotates continuously, the polarization of line polarized light through wave plate deflects continuously, wave plate is measured easy to operate, can quickly adjust test, testing efficiency height, test are accurately and reliably.
Accompanying drawing explanation
The utility model is described in further detail with embodiment below in conjunction with the accompanying drawings.Wherein:
Fig. 1 is the structural representation of this utility model optical wave plate degree of delay detection device.
Detailed description of the invention
By describing technology contents of the present utility model, structural feature in detail, being realized purpose and effect, below in conjunction with embodiment and coordinate accompanying drawing to describe in detail.
nullRefer to shown in Fig. 1，This utility model optical wave plate degree of delay detection device includes a test chassis 1，Incident light source assembly 2 it is sequentially provided with from top to bottom in described test chassis 1、Polarizer mounting table 3、Wave plate turntable 4 to be measured、Standard wave plate mounting table 5、Analyzer turntable 6 and the test probe 7 of connection wave plate measured power meter，Described incident light source assembly 2 is provided with a horizontally disposed transmitting light source 21 and an incident illumination turns to prism 22，Described wave plate turntable 4 to be measured is provided with the fine setting turntable 41 of a hollow，Described fine setting turntable 41 is provided with the microscope carrier 42 placing wave plate to be measured，Described fine setting turntable 41 connects vernier knob 43，Described analyzer turntable 6 is provided with the precision rotation platform 61 of a hollow，Described precision rotation platform 61 is provided with the microscope carrier 62 placing analyzer，Described precision rotation platform 61 connects worm and gear governor motion 63.
Described standard wave plate mounting table 5 is provided with standard wave plate 51.
Described test chassis 1 is provided with floor light light source 8.
The foregoing is only embodiment of the present utility model; not thereby the scope of the claims of the present utility model is limited; every equivalent structure transformation utilizing this utility model description and accompanying drawing content to be made; or directly or indirectly it is used in other relevant technical fields, the most in like manner it is included in scope of patent protection of the present utility model.
Claims (3)
1. an optical wave plate degree of delay detection device, it is characterized in that: include a test chassis, incident light source assembly it is sequentially provided with from top to bottom in described test chassis, polarizer mounting table, wave plate turntable to be measured, standard wave plate mounting table, analyzer turntable and the test probe of connection wave plate measured power meter, described incident light source assembly is provided with a horizontally disposed transmitting light source and an incident illumination turns to prism, described wave plate turntable to be measured is provided with the fine setting turntable of a hollow, described fine setting turntable is provided with the microscope carrier placing wave plate to be measured, described fine setting turntable connects vernier knob, described analyzer turntable is provided with the precision rotation platform of a hollow, described precision rotation platform is provided with the microscope carrier placing analyzer, described precision rotation platform connects worm and gear governor motion.
A kind of optical wave plate degree of delay detection device the most according to claim 1, it is characterised in that: described standard wave plate mounting table is provided with standard wave plate.
A kind of optical wave plate degree of delay detection device the most according to claim 1, it is characterised in that: described test chassis is provided with floor light light source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620293625.6U CN205506359U (en) | 2016-04-09 | 2016-04-09 | Optical wave piece delay degree detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620293625.6U CN205506359U (en) | 2016-04-09 | 2016-04-09 | Optical wave piece delay degree detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205506359U true CN205506359U (en) | 2016-08-24 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620293625.6U Active CN205506359U (en) | 2016-04-09 | 2016-04-09 | Optical wave piece delay degree detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205506359U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111060288A (en) * | 2019-12-20 | 2020-04-24 | 苏州索拉科技有限公司 | Polaroid optical performance detection system and detection method thereof |
-
2016
- 2016-04-09 CN CN201620293625.6U patent/CN205506359U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111060288A (en) * | 2019-12-20 | 2020-04-24 | 苏州索拉科技有限公司 | Polaroid optical performance detection system and detection method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20200609 Address after: 350100 27th floor, Chuangye building, Haixi hi tech Industrial Park, hi tech Zone, Fuzhou City, Fujian Province Patentee after: FUJIAN HAICHUANG PHOTOELECTRIC Co.,Ltd. Address before: Cangshan District of Fuzhou City, Fujian province 350000 to build a new town, Jin Yan Road 171 No. 2 No. Patentee before: FUZHOU CRYSOR OPTICS Co.,Ltd. |
|
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 350100 floor 5, building 19, phase II, innovation park, No. 7, middle wulongjiang Avenue, Shangjie Town, Minhou County, Fuzhou City, Fujian Province Patentee after: Fujian Haichuang Photoelectric Technology Co.,Ltd. Address before: 350100 27th floor, Pioneer Building, Haixi hi tech Industrial Park, high tech Zone, Fuzhou City, Fujian Province Patentee before: FUJIAN HAICHUANG PHOTOELECTRIC CO.,LTD. |